JPH0614154A - One-dimensional ccd image pickup device - Google Patents

Abstract

PURPOSE:To easily perform the image pickup alignment of a subject to be measured, when it is measured by a one-dimensional CCD image pickup device. CONSTITUTION:The one-dimensional CCD image pickup device 8 puts on plural high luminance light emitting diodes 2 arranged in the periphery of a one- dimensional CCD sensor on a sensor board 4. The illuminance of the high luminance light emitting diode is projected at the position of the subject (subject to be measured) as a luminescent spot 19 via a lens 9. The alignment of the subject 18 to be measured is performed in an area enclosed with plural luminescent spots and on a line (axis) connecting the luminescent spots of two high luminance light emitting diodes arranged on the right and left sides on the axis of the one-dimensional CCD sensor.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a one-dimensional CCD image pickup device, and more particularly to a function of adjusting a positional relationship between the image pickup device and an object to be measured.

[0002]

2. Description of the Related Art In the case of a two-dimensional CCD image pickup device, the position of an object to be measured can be relatively easily adjusted to the image pickup device while displaying a video signal output from the image pickup device on a video monitor. On the other hand, in the case of the one-dimensional CCD image pickup device,
A two-dimensional image is obtained by picking up an image of either the object to be measured or the image pickup device while moving in a direction perpendicular to a one-dimensional CCD sensor arranged in a horizontal line. Usually one-dimensional CCD
As a means for adjusting the positional relationship between the imaging device and the object to be measured, a finder 6 is used as shown in FIG. 3, and the object to be measured is seen through the half mirror 7 except the eyepiece 5 with scale, It is possible to confirm the actual visual field of the image pickup device and the position where the line sensor (one-dimensional CCD sensor) picks up the image. As another method not using the half mirror, as shown in FIG. 4, a method of adjusting and confirming the position of the image pickup device 8, that is, the line sensor 1 by projecting a scale on the object to be measured by the push-in projection adapter 15. There is. In FIG. 4, the halogen lamp 14
Since the scale plate 13 is projected onto the object to be measured through the lens 12, the mirror 11 and the lens 9, the confirmation of the camera field of view can be clearly seen when viewing the object to be measured.

[0003]

These conventional one-dimensional CCD image pickup devices require mechanical parts such as a finder with a scale and a push-in type projection adapter, resulting in high cost. Further, when a half mirror is used, the optical loss becomes large, and if the positional relationship between the finder or projection adapter and the one-dimensional CCD sensor is to be set accurately, the accuracy required of the components constituting the image pickup device must be high. Therefore, these scales are usually used as a guide, and fine adjustment of the positions of the actual object to be measured and the one-dimensional CCD sensor is performed while observing the waveform of the output signal of the one-dimensional CCD sensor with an oscilloscope. There is a problem that adjustment takes time.

It is an object of the present invention to provide a one-dimensional CCD image pickup device which facilitates the alignment of the object to be measured.

[0005]

A one-dimensional CCD image pickup device of the present invention is provided with a plurality of high-intensity light-emitting devices around a one-dimensional CCD sensor arranged on a horizontal line, at least two of which are the one-dimensional CCD. Each of which is located on the left and right outside on the same axis as the sensor, has means for turning on / off the plurality of high-intensity light-emitting devices individually or simultaneously, and means for increasing or decreasing the illuminance when the high-intensity light-emitting devices are turned on, During measurement, within the range of the high-intensity point projected from the one-dimensional CCD image pickup device, and on the horizontal axis connecting the two high-intensity points of the high-intensity light-emitting device provided outside the left and right of the one-dimensional CCD sensor. Align objects.

[0006]

The present invention will be described below with reference to the drawings. FIG. 1A is a plan view of a sensor board showing an embodiment of the present invention. The one-dimensional CCD sensor 1 is arranged on the horizontal line in the center of the line sensor board 4, and the one-dimensional CCD
A total of six high-intensity light emitting diodes 2 are arranged, two each above and below the sensor 1 and one on the left and right on the extension of the line of the line sensor (of the one-dimensional CCD sensor 1). FIG. 1B is a side view of FIG. 1A, in which a protective glass 3 is attached directly above the one-dimensional CCD sensor 1, and the one-dimensional CCD sensor 1 and the high-intensity light emitting diode 2 are the same. The height is adjusted.

The high-intensity light emitting diode 2 can be turned on and off by an independent switch, and the light amount can be adjusted by an adjuster, and the high brightness light emitting diode 2 is turned on and adjusted as necessary. FIG. 2 is a one-dimensional CC incorporating the sensor board of FIG.
3 is an example of a D imaging device. When confirming or adjusting the position of the one-dimensional CCD sensor 1 and the object to be measured 18, the high-intensity light emitting diode 2 is turned on and the bright spots of the six high-intensity light emitting diodes are projected around the object to be measured 18. The position of the one-dimensional CCD image pickup device 8 can be easily adjusted. Further, after the position confirmation and adjustment are completed, the light amount of the high-intensity light emitting diode 2 can be adjusted and used as an illumination system of the object to be measured. By irradiating the object to be measured 18 through the lens 9, It is possible to increase the scanning speed of the one-dimensional CCD sensor 1 and obtain a uniform image.

Although an example using six high brightness light emitting diodes has been described above, the present invention is not limited to this number. Needless to say, the same effect can be obtained by using a light emitting device other than the high brightness light emitting diode.

[0009]

As described above, according to the present invention, the one-dimensional C
Since a plurality of high-intensity light emitting diodes are arranged on the same plane as the CD sensor and irradiate, the alignment with the object to be measured is performed.
No mechanical system such as a viewfinder with scale or push-in projection adapter is required, and it can also be used as an illumination system. Moreover, there is an effect that there is no optical loss and the alignment can be easily performed. By using a high-intensity light-emitting diode for auxiliary illumination of the measured object, a two-dimensional CCD
This has the effects of increasing the scanning speed of the imaging device and obtaining a uniform (clear) image in a dark place.

[Brief description of drawings]

FIG. 1 is a diagram showing a sensor board according to an embodiment of the present invention, in which (a) is a plan view and (b) is a side view.

FIG. 2 is a one-dimensional CCD incorporating the sensor board of FIG.
It is a figure which shows an imaging device.

3A and 3B are diagrams showing a conventional one-dimensional CCD image pickup device with a finder, wherein FIG. 3A is a configuration diagram and FIG. 3B is a diagram showing a field of view when viewed from the finder.

4A and 4B are diagrams showing a conventional one-dimensional CCD image pickup device with a projection adapter, in which FIG. 4A is a diagram showing a state before pushing the adapter, and FIG. 4B is a diagram showing a state after pushing the adapter.

[Explanation of symbols]

 1 One-dimensional CCD sensor 2 High-intensity light-emitting diode 3 Protective glass 4 Sensor board 5 Eyepiece with scale 6 Finder 7 Half mirror 8 One-dimensional CCD imager 9, 12 Lens 10 Scale seen from the viewfinder 13 Scale plate 14 Halogen lamp 15 Push-in type Projection adapter 16 Field of view of actual imaging device 17 Projected scale

Claims (1)

[Claims] 1. In a one-dimensional CCD image pickup device, a plurality of high-intensity light emitting devices are provided around a one-dimensional CCD sensor arranged on a horizontal line, at least two of which are on the same axis as the one-dimensional CCD sensor. One-dimensional CCD imaging device at the time of measurement, which has means for individually or simultaneously turning on / off the plurality of high-intensity light-emitting devices and means for increasing / decreasing the illuminance when the high-intensity light-emitting devices are lit, each of which is located outside. The object to be measured is aligned on the horizontal axis connecting the two high-intensity points of the high-intensity light-emitting device provided in the range of the high-intensity points projected from A one-dimensional CCD image pickup device.