JPH0613656A - Light emitting diode array - Google Patents

Light emitting diode array

Info

Publication number
JPH0613656A
JPH0613656A JP16632192A JP16632192A JPH0613656A JP H0613656 A JPH0613656 A JP H0613656A JP 16632192 A JP16632192 A JP 16632192A JP 16632192 A JP16632192 A JP 16632192A JP H0613656 A JPH0613656 A JP H0613656A
Authority
JP
Japan
Prior art keywords
light emitting
emitting region
electrode
diode array
compound semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16632192A
Other languages
Japanese (ja)
Inventor
Shoji Inaba
稲葉  昌治
Hiromi Takasu
高須  広海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Original Assignee
Tokyo Sanyo Electric Co Ltd
Tottori Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Sanyo Electric Co Ltd, Tottori Sanyo Electric Co Ltd, Sanyo Electric Co Ltd filed Critical Tokyo Sanyo Electric Co Ltd
Priority to JP16632192A priority Critical patent/JPH0613656A/en
Publication of JPH0613656A publication Critical patent/JPH0613656A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide a light emitting diode array of high resolution by making luminance characteristic in an alignment direction of a light emitting region uniform. CONSTITUTION:A plurality of light emitting regions 4 are formed on a surface of a compound semiconductor 1 and an insulation layer 2 is formed on a surface of the compound semiconductor 1 to expose the light emitting region 4. The light emitting region 4 is divided into about two and a surface electrode 5 is formed close to a center of the light emitting region 4 in a stripe with one end in ohmic contact and the other end positioned on the insulation layer 2. A stripe electrode 8 having approximately the same width as the front electrode 5 on the light emitting region 4 is formed on the insulation layer 2 between adjacent light emitting regions 4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は光プリンタヘッドに用い
る発光ダイオードアレイに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light emitting diode array used in an optical printer head.

【0002】[0002]

【従来の技術】近年、選択拡散法により高密度に発光領
域を形成した発光ダイオードアレイは特開昭60−66
273号公報等に開示されている。この公報を示す図3
に於て化合物半導体21の表面に複数の発光領域22が
形成されている。その発光領域22を露出する様に化合
物半導体21の上に絶縁層23が形成されている。そし
て発光領域22の略中央にストライプ状にオーミック接
触して表面電極24が形成されている。
2. Description of the Related Art In recent years, a light emitting diode array in which light emitting regions are formed with high density by a selective diffusion method is disclosed in JP-A-60-66.
No. 273, etc. FIG. 3 showing this publication
At this point, a plurality of light emitting regions 22 are formed on the surface of the compound semiconductor 21. An insulating layer 23 is formed on the compound semiconductor 21 so as to expose the light emitting region 22. A surface electrode 24 is formed in ohmic contact in a stripe shape at approximately the center of the light emitting region 22.

【0003】[0003]

【発明が解決しようとする課題】しかしてこの様な発光
ダイオードアレイでは、発光領域22の整列方向に於け
る輝度特性が図4の25に示す様に、隣接する発光領域
22の境界26で輝度が低下する。その理由は隣接する
発光領域22の間が非発光領域となるため、その領域に
対応した位置26で極端に輝度が低下するからである。
この不均一な輝度特性のために高解像度が得られない。
故に、本発明は上述の従来のアレイの欠点に鑑みてなさ
れたものであり、発光領域の整列方向に於ける輝度特性
を均一化することによって、高解像度の発光ダイオード
アレイを提供するものである。
However, in such a light emitting diode array, the luminance characteristics in the alignment direction of the light emitting regions 22 are as shown in 25 of FIG. Is reduced. The reason for this is that the area between adjacent light emitting areas 22 is a non-light emitting area, and the brightness is extremely reduced at the position 26 corresponding to that area.
Due to this non-uniform brightness characteristic, high resolution cannot be obtained.
Therefore, the present invention has been made in view of the above-mentioned drawbacks of the conventional array, and provides a high resolution light emitting diode array by uniformizing the brightness characteristics in the alignment direction of the light emitting regions. .

【0004】[0004]

【課題を解決するための手段】本発明は上述の課題を解
決するために、化合物半導体の表面に複数の発光領域を
形成し、発光領域を露出する様に化合物半導体の表面上
に絶縁層を形成する。発光領域を略2等分して発光領域
の略中央にストライプ状に1端をオーミック接触させ、
かつ他端を絶縁層上に位置する様に表面電極を形成す
る。そして、発光領域上の表面電極と略同じ幅を有しか
つ隣接する発光領域の間の絶縁層上にストライプ電極を
形成するものである。
In order to solve the above problems, the present invention forms a plurality of light emitting regions on the surface of a compound semiconductor and forms an insulating layer on the surface of the compound semiconductor so as to expose the light emitting regions. Form. The light emitting region is divided into two approximately equal parts, and one end is ohmic-contacted in a stripe shape at substantially the center of the light emitting region,
A surface electrode is formed so that the other end is located on the insulating layer. Then, a stripe electrode is formed on the insulating layer having the same width as the surface electrode on the light emitting region and between the adjacent light emitting regions.

【0005】[0005]

【作用】本発明は上述の様に、発光領域上の表面電極と
略同じ幅を有しかつ隣接する発光領域の間の絶縁層上に
ストライプ電極を形成する。故に発光領域から出た光は
ストライプ電極に反射して上方に進むので、非発光領域
での輝度の低下が少なくなる。
According to the present invention, as described above, the stripe electrode is formed on the insulating layer having the same width as the surface electrode on the light emitting region and between the adjacent light emitting regions. Therefore, the light emitted from the light emitting region is reflected by the stripe electrode and travels upward, so that the decrease in luminance in the non-light emitting region is reduced.

【0006】[0006]

【実施例】以下に本発明の実施例を図1と図2に従って
説明する。図1は本実施例に係る発光ダイオードアレイ
の要部断面図であり、図2はその発光ダイオードアレイ
の要部平面図である。これらの図に於て、化合物半導体
1は例えばGaAsベース上にn−GaAsP層を気相
エピタキシャル成長させたものである。絶縁層2は化合
物半導体1の表面に設けられ、CVD法による窒化硅素
(Si34)膜等からなる。絶縁層2は化合物半導体1
の長手方向に沿って、複数の透孔部3が所定の間隔で形
成されている。
Embodiments of the present invention will be described below with reference to FIGS. FIG. 1 is a sectional view of a main part of a light emitting diode array according to this embodiment, and FIG. 2 is a plan view of a main part of the light emitting diode array. In these figures, the compound semiconductor 1 is obtained by vapor phase epitaxial growth of an n-GaAsP layer on a GaAs base, for example. The insulating layer 2 is provided on the surface of the compound semiconductor 1 and is made of a silicon nitride (Si 3 N 4 ) film or the like by the CVD method. Insulating layer 2 is compound semiconductor 1
A plurality of through holes 3 are formed at predetermined intervals along the longitudinal direction of the.

【0007】発光領域4は化合物半導体1の表面に設け
られ、絶縁層2をマスクとし亜鉛の選択拡散により形成
されたP型拡散領域であり、その境界にはPn接合が形
成されている。例えば400dpiの発光ダイオードア
レイを製作するには、化合物半導体1の長手方向に沿っ
て発光領域4を46μmの長さに、幅を50μmに、間
隔を63.5μmに形成すればよい。
The light emitting region 4 is a P type diffusion region formed on the surface of the compound semiconductor 1 by selective diffusion of zinc using the insulating layer 2 as a mask, and a Pn junction is formed at the boundary thereof. For example, in order to manufacture a light emitting diode array of 400 dpi, the light emitting regions 4 may be formed to have a length of 46 μm, a width of 50 μm, and an interval of 63.5 μm along the longitudinal direction of the compound semiconductor 1.

【0008】表面電極5は1端が発光領域4とオーミッ
ク接触されたオーミック接触部6と他端が絶縁層2上に
位置する配線部7を有し、アルミニウム蒸着膜等からな
る。オーミック接触部6は発光領域4の整列方向に略直
交して、かつ発光領域4を略2等分する様に発光領域4
の略中央に位置し、その幅は10〜15μmでその厚さ
は1〜5μmである。配線部7はワイヤボンドし易くす
るためにオーミック接触部6よりも幅広に形成されてい
る。
The surface electrode 5 has an ohmic contact portion 6 which is in ohmic contact with the light emitting region 4 at one end and a wiring portion 7 which is located on the insulating layer 2 at the other end, and is made of an aluminum vapor deposition film or the like. The ohmic contact portion 6 is substantially orthogonal to the alignment direction of the light emitting regions 4 and divides the light emitting regions 4 into two substantially equal parts.
Is located approximately at the center, its width is 10 to 15 μm, and its thickness is 1 to 5 μm. The wiring portion 7 is formed wider than the ohmic contact portion 6 to facilitate wire bonding.

【0009】ストライプ電極8は隣接する発光領域4の
間に位置する絶縁層2の非発光領域上にアルミニウム蒸
着等によって形成されている。ストライプ電極8の幅は
オーミック接触部6の幅と略同じ10〜15μmに、厚
さは1〜5μmに形成されている。そしてストライプ電
極8もオーミック接触部6も断面が略台形になる様に側
面が傾斜している。裏面電極9は化合物半導体1の裏面
上に形成され、共通電極としての機能を有する。
The stripe electrode 8 is formed on the non-light emitting area of the insulating layer 2 located between the adjacent light emitting areas 4 by vapor deposition of aluminum or the like. The width of the striped electrode 8 is set to 10 to 15 μm, which is substantially the same as the width of the ohmic contact portion 6, and the thickness thereof is set to 1 to 5 μm. The side surfaces of both the striped electrode 8 and the ohmic contact portion 6 are inclined so that the cross section has a substantially trapezoidal shape. The back surface electrode 9 is formed on the back surface of the compound semiconductor 1 and has a function as a common electrode.

【0010】反射光10は発光領域4から出た後、オー
ミック接触部6の傾斜した側面で反射し上方に進む光で
ある。反射光11は発光領域4から後、非発光領域であ
る絶縁層2上のストライプ電極8の傾斜した側面で反射
し上方に進む光である。
The reflected light 10 is the light which is emitted from the light emitting region 4 and then reflected by the inclined side surface of the ohmic contact portion 6 to travel upward. The reflected light 11 is light that is reflected by the inclined side surface of the stripe electrode 8 on the insulating layer 2, which is a non-light emitting area, after the light emitting area 4 and travels upward.

【0011】次に本実施例に係る発光ダイオードアレイ
の整列方向に於ける輝度特性を図4の12に示す。この
図に於て、輝度低下部分13はオーミック接触部6に対
応し輝度低下部分14はストライプ電極8に対応する。
本発明は従来に比べて、非発光領域上の輝度低下が極め
て少ないことが判る。これは本発明のストライプ電極8
の側面により反射された光が非発光領域上の輝度低下を
少なくしているからである。
Next, the luminance characteristic in the alignment direction of the light emitting diode array according to the present embodiment is shown at 12 in FIG. In this figure, the brightness lowering portion 13 corresponds to the ohmic contact portion 6, and the brightness lowering portion 14 corresponds to the stripe electrode 8.
It can be seen that the present invention causes an extremely small decrease in luminance on the non-light emitting area as compared with the conventional art. This is the stripe electrode 8 of the present invention.
This is because the light reflected by the side surface of the light reduces the decrease in brightness on the non-light emitting area.

【0012】[0012]

【発明の効果】本発明は上述の様に、隣接する発光領域
の間の絶縁層上にストライプ電極を形成する。故に発光
領域から出た光はストライプ電極に反射して上方に進む
ので、非発光領域での輝度の低下が少なくなる。更に発
光領域上の表面電極、すなわちオーミック接触部の幅と
ストライプ電極の幅を略同じに形成する。故にオーミッ
ク接触部とストライプ電極によるそれぞれの反射光の輝
度を略同じに設定することにより、ストライプ電極上の
輝度低下をオーミック接触部上の輝度低下と略同じ程度
に小さくすることができる。その結果、発光領域の整列
方向に於ける輝度が均一化される。そして発光領域の略
中央にオーミック接触部を設けるので、オーミック接触
部を中心として輝度特性は対称的な形状をなす。従っ
て、オーミック接触部上の輝度特性とストライプ電極上
の輝度特性が略同じになるので、解像度が2倍になり、
高解像度の発光ダイオードアレイが得られる。
As described above, the present invention forms the stripe electrode on the insulating layer between the adjacent light emitting regions. Therefore, the light emitted from the light emitting region is reflected by the stripe electrode and travels upward, so that the decrease in luminance in the non-light emitting region is reduced. Further, the surface electrode on the light emitting region, that is, the width of the ohmic contact portion and the width of the stripe electrode are formed substantially the same. Therefore, by setting the brightness of the reflected light by the ohmic contact portion and the brightness of the reflected light by the stripe electrode to be substantially the same, the decrease in brightness on the stripe electrode can be made substantially the same as the decrease in brightness on the ohmic contact part. As a result, the brightness in the alignment direction of the light emitting regions is made uniform. Since the ohmic contact portion is provided substantially in the center of the light emitting region, the luminance characteristic is symmetrical with respect to the ohmic contact portion. Therefore, since the luminance characteristic on the ohmic contact portion and the luminance characteristic on the stripe electrode are substantially the same, the resolution is doubled,
A high resolution light emitting diode array is obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係る発光ダイオードアレイの
要部断面図である。
FIG. 1 is a sectional view of an essential part of a light emitting diode array according to an embodiment of the present invention.

【図2】本発明の実施例に係る発光ダイオードアレイの
要部平面図である。
FIG. 2 is a plan view of an essential part of a light emitting diode array according to an embodiment of the present invention.

【図3】従来の発光ダイオードアレイの断面図である。FIG. 3 is a cross-sectional view of a conventional light emitting diode array.

【図4】発光ダイオードアレイの整列方向に於ける輝度
特性図である。
FIG. 4 is a luminance characteristic diagram in the alignment direction of the light emitting diode array.

【符号の説明】[Explanation of symbols]

1 化合物半導体 2 絶縁層 4 発光領域 5 表面電極 8 ストライプ電極 1 Compound Semiconductor 2 Insulating Layer 4 Light Emitting Area 5 Surface Electrode 8 Stripe Electrode

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 化合物半導体の表面に形成された複数の
発光領域と、その発光領域を露出する様に前記化合物半
導体の表面上に形成された絶縁層と、前記発光領域を略
2等分する様に前記発光領域の略中央にストライプ状に
オーミック接触され前記絶縁層上に形成された表面電極
と、前記発光領域上の前記表面電極と略同じ幅を有しか
つ隣接する前記発光領域の間の前記絶縁層上に形成され
たストライプ電極とを具備した事を特徴とする発光ダイ
オードアレイ。
1. A plurality of light emitting regions formed on the surface of a compound semiconductor, an insulating layer formed on the surface of the compound semiconductor so as to expose the light emitting regions, and the light emitting region are divided into two substantially equal parts. Between the surface electrode formed on the insulating layer in ohmic contact in a stripe shape substantially in the center of the light emitting region and the adjacent light emitting region having substantially the same width as the surface electrode on the light emitting region. And a stripe electrode formed on the insulating layer.
JP16632192A 1992-06-24 1992-06-24 Light emitting diode array Pending JPH0613656A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16632192A JPH0613656A (en) 1992-06-24 1992-06-24 Light emitting diode array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16632192A JPH0613656A (en) 1992-06-24 1992-06-24 Light emitting diode array

Publications (1)

Publication Number Publication Date
JPH0613656A true JPH0613656A (en) 1994-01-21

Family

ID=15829193

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16632192A Pending JPH0613656A (en) 1992-06-24 1992-06-24 Light emitting diode array

Country Status (1)

Country Link
JP (1) JPH0613656A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5849833A (en) * 1995-07-21 1998-12-15 Rohm And Haas Company Method for improving drying speed in printing process and fast dry printing ink used therein

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5849833A (en) * 1995-07-21 1998-12-15 Rohm And Haas Company Method for improving drying speed in printing process and fast dry printing ink used therein

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