JPH0613475Y2 - 構造物表面の付着物サンプリング及び分析測定装置 - Google Patents

構造物表面の付着物サンプリング及び分析測定装置

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Publication number
JPH0613475Y2
JPH0613475Y2 JP11332587U JP11332587U JPH0613475Y2 JP H0613475 Y2 JPH0613475 Y2 JP H0613475Y2 JP 11332587 U JP11332587 U JP 11332587U JP 11332587 U JP11332587 U JP 11332587U JP H0613475 Y2 JPH0613475 Y2 JP H0613475Y2
Authority
JP
Japan
Prior art keywords
chamber
hole
sampling
end side
deposits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11332587U
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English (en)
Japanese (ja)
Other versions
JPS6375843U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
昌春 山里
Original Assignee
東亜電波工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東亜電波工業株式会社 filed Critical 東亜電波工業株式会社
Priority to JP11332587U priority Critical patent/JPH0613475Y2/ja
Publication of JPS6375843U publication Critical patent/JPS6375843U/ja
Application granted granted Critical
Publication of JPH0613475Y2 publication Critical patent/JPH0613475Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Landscapes

  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP11332587U 1987-07-23 1987-07-23 構造物表面の付着物サンプリング及び分析測定装置 Expired - Lifetime JPH0613475Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11332587U JPH0613475Y2 (ja) 1987-07-23 1987-07-23 構造物表面の付着物サンプリング及び分析測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11332587U JPH0613475Y2 (ja) 1987-07-23 1987-07-23 構造物表面の付着物サンプリング及び分析測定装置

Publications (2)

Publication Number Publication Date
JPS6375843U JPS6375843U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-05-20
JPH0613475Y2 true JPH0613475Y2 (ja) 1994-04-06

Family

ID=30995025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11332587U Expired - Lifetime JPH0613475Y2 (ja) 1987-07-23 1987-07-23 構造物表面の付着物サンプリング及び分析測定装置

Country Status (1)

Country Link
JP (1) JPH0613475Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010151465A (ja) * 2008-12-24 2010-07-08 Dkk Toa Corp 構造物表面の塩分測定装置
CN102859348B (zh) * 2010-03-16 2014-11-26 东亚Dkk株式会社 表面附着成分测定装置

Also Published As

Publication number Publication date
JPS6375843U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-05-20

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