JPH0612960U - Holder for pin sampler - Google Patents

Abstract

(57) [Summary] [Purpose] Both the sample inflow timing to the pin sampler and the sample coagulation timing in the pin sampler can be accurately known, so that a healthy sample can always be taken and the sampling position can be confirmed. It is intended to provide a pin sampler holder. [Structure] A pin sampler holder to which a probe equipped with a pin sampler at its tip is removably inserted, characterized in that a light detection sensor is arranged at a position close to the pin sampler when the probe is mounted. .

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a pin sampler holder equipped with a pin sampler probe used for collecting molten metal such as molten steel or hot metal in a smelting and steelmaking process.

[0002]

[Prior art]

 In the smelting and steelmaking process, in order to know the alloy components and gas components in the molten metal, a probe equipped with an English glass pin sampler is immersed in the molten metal and the molten metal is allowed to flow into the pin sampler. , The solidified sample is collected and the component is analyzed.

FIG. 7 shows an example of a probe used for this type of application. The probe P has a structure in which a pin sampler 1 having a vacuum inside and a tip end sealed with low melting point glass is fixed to a tip of a paper tube or an exterior tube 3 made of a heat-resistant material through a housing 2. . The pin sampler 1 is provided with a tip cap 4 made of metal such as iron, copper, aluminum or paper or the like to prevent slag from flowing in when passing through the slag layer.

Such a probe P is mounted in the iron holder H shown in FIG. 8 in the state shown in FIG. 9, and then immersed in the molten metal manually or by an automatic pouring machine for a certain period of time. Samples are collected by pulling up later. Then, the immersion time of the probe is set empirically with reference to the time when the most healthy sample is taken while actually sampling.

[0005]

[Problems to be solved by the device]

 By the way, it is presumed that the situation before and after the probe is immersed and the sample is taken is as shown in FIG. The probe tip passes through the slag layer (S). The tip of the probe enters the metal layer (M), and the tip cap melts away. The low melting point glass at the tip of the pin sampler melts. Molten metal flows into the pin sampler. The molten metal flowing into the pin sampler solidifies. When it is further dipped, the pin sampler is heated and the sample inside is gradually redissolved.

If the probe is pulled up at any one of the above steps (1) to (4), there is a problem that the molten metal flows into the pin sampler insufficiently, and since the molten metal does not solidify, the molten metal flows out during the pulling process. Also, even if the probe is pulled up at this stage, there is a problem that the molten metal in the pin sampler flows out and a sufficient amount of sample cannot be collected. The timing immediately after the solidification stage () is desired. However, since the pulling timing is conventionally controlled only by the immersion time, it is not possible to match the timing of pulling up the probe immediately after the molten metal solidifies. That is, various conditions such as the molten metal temperature, the molten metal composition, and the slag thickness change from time to time, and therefore the inflow timing is deviated each time due to the difference in the immersion conditions. It was almost impossible to pull up the probe to cover the gap and catch the timing immediately after the molten metal solidified. Therefore, it was extremely difficult to always take a healthy sample.

Further, it is sometimes desired to collect a sample at a predetermined depth (h) position as shown in FIG. 11, but in that case, in order to prevent the sample from flowing in before reaching the target position. , Conventionally, the thickness of the tip cap 4 was set to be thick to delay the dissolution timing as much as possible, and once the target position was reached, the sample would be stopped for a sufficient time and the sample would have completely flowed in. We deal with it by looking up and raising. For this reason, the timing of pulling up tends to be late, and it becomes more difficult to collect a healthy sample because re-dissolution of the sample begins. Moreover, even if the inflowing sample could be pulled up immediately after it solidified, there is no assurance that the sample was truly sampled at the intended location.

The present invention has been made in view of the current situation, and it is an object of the present invention to provide a means capable of always collecting a healthy sample and confirming the sampling position.

[0009]

[Means for Solving the Problems]

 The present invention, which has solved the above-mentioned problems, was made by paying attention to the fact that molten metal has a considerably large illuminance, and the illuminance is significantly reduced during solidification, and based on this idea. The pin sampler holder thus made is characterized by arranging a light detection sensor capable of detecting a change in illuminance at a position close to the pin sampler when the probe is attached.

As a specific arrangement position of the light detection sensor, it is preferable that the light detection sensor is arranged at the tip of the long support rod inserted into the probe.

[0011]

[Action]

 In order to use the device having such a configuration, first, the pin sampler probe is mounted on the probe holder, immersed in the molten metal, and the slag layer is passed to position the probe tip at a certain depth. The pin sampler is protected by the tip cap when passing through the slag layer, but when it passes through the slag layer, the tip cap is melted and the pin sampler is exposed. When positioned at a certain depth, the low-melting-point glass portion at the tip of the pin sampler melts, the molten metal flows into the pin sampler, and intense synchrotron radiation emitted by the molten metal is transmitted to the outside through the rear end of the pin sampler. When this intense radiant light exceeding the certain illuminance is detected by the light detection sensor attached to the tip of the holder, a signal is emitted and the appropriate means informs that the molten metal has flowed into the pin sampler. By recording the immersion depth at this time, it is possible to know the depth of the collected sample. Then, as the molten metal that has been deprived of heat by the surroundings begins to solidify after a further lapse of time, the illuminance decreases, and when the illuminance falls below a certain value, the aforementioned signal is interrupted. Therefore, if the probe is pulled up at the timing when the signal is cut off, a healthy sample will be collected.

[0012]

【Example】

 Next, the details of the present invention will be described based on the illustrated embodiment. FIG. 1 shows an embodiment of the pin sampler holder of the present invention. The pin sampler holder H is composed of a long supporting rod 5 and a body portion 6. A light detecting sensor 7 is arranged at the tip of the long supporting rod 5, and a buzzer 8 is arranged at the rear end of the body portion 6. It is a configuration. A detection circuit 9 as shown in FIG. 4, for example, is built in the body 6, and the buzzer 8 is activated when the signal detected by the light detection sensor 7 is a certain value or more. It is configured to ring. As shown in FIG. 2, such a pin sampler holder H is used by mounting a pin sampler probe P having a pin sampler 1 at its tip. In the figure, 10 is a stopper for maintaining the mounted state of the pin sampler probe P.

As the light detection sensor 7, for example, a phototransistor or the like can be used, but other light detection sensors can also be used as appropriate. As shown in FIG. 3, the light detection sensor 7 is incorporated in the holding member 11 at the tip of the long support rod 5 and is positioned so as to receive the light emitted from the rear end of the pin sampler 1. Has been.

FIG. 5 shows another example of the mounted state of the light detection sensor 7, in which a heat insulating glass 12 is arranged on the front surface of the light detection sensor 7 on the light receiving side, and a small hole 13 is opened in the center on the front surface. The aluminum disc 14 is arranged to reduce the amount of received light. The reason why the amount of light received is reduced by arranging the aluminum disk 14 is to prevent the illuminance from being too high and to detect the illuminance change easily. The reason for arranging the heat insulating glass 12 is that the illuminance depends on radiant heat or ambient temperature. This is to prevent the detection sensor 7 from being thermally deteriorated or damaged.

In the above description, the buzzer 8 and the detection circuit 9 are integrated with the holder main body. However, as shown in FIG. 6, the detection circuit 9 is provided in the box 15 that is configured separately from the holder main body. It is also possible to incorporate the buzzer 8 and. It is also possible to use a lamp instead of the buzzer, to use a buzzer and a lamp together, and to control the start and stop of the raising and lowering operation of the holder by the automatic feeder by the detection circuit.

The device having such a configuration is used as follows. First, after mounting the pin sampler probe P on the holder H, the probe P is dipped in the molten metal and passed through the slag layer to position and stop the probe tip at a predetermined depth. The pin sampler 1 is protected by the tip cap 4 when passing through the slag layer, and when the pin sampler 1 enters the metal layer from the slag layer, the tip cap 4 is melted and the pin sampler 1 is exposed.

Next, the low-melting-point glass forming the tip portion of the pin sampler 1 is melted, the molten metal flows into the pin sampler, and the radiated light emitted by the molten metal passes through the rear end of the pin sampler and the long supporting rod of the holder H. 5 Illuminate the light receiving surface of the light detection sensor 7 arranged at the tip. The light detection sensor 7 outputs a signal corresponding to the intensity of the received radiant light, and this signal is processed by the detection circuit 9 and the buzzer 8 is activated when the intensity of the radiated light exceeds a certain value. Ring. By recording the immersion depth at this time, the sampling depth can be accurately grasped.

Next, the sample in the pin sampler is deprived of heat by the pin sampler itself or the housing 2 holding the pin sampler and is gradually cooled and solidified. As a result, the illuminance is lowered. When the illuminance is below a certain value, the buzzer 8 stops ringing, and it can be recognized that the timing is the timing of pulling up the probe P.

At the same time when the buzzer 8 stops sounding, the probe P is pulled up to break the pin sampler 1 and the solidified sample is taken out. Since the sample in the pin sampler is coagulated, the sample does not flow out from the pin sampler when the probe is pulled up, and the sample may have nests because a sufficient amount of sample is collected in the pin sampler. No sound sample is obtained.

The probe for which the measurement has been completed is discarded, a new probe is attached to the holder, and the procedure similar to the above is repeated and the sampling is appropriately repeated. In this device, the light detection sensor 7, the detection circuit 9, the buzzer 8, etc. are all mounted on the holder side, and these are used continuously without being discarded. Therefore, the installation cost is higher than that of the conventional device. Few. In addition, if the probe structure is such that the emitted light emitted from the rear end of the pin sampler can be received by the light detection sensor 7 attached to the holder side, the probe used conventionally can be followed as it is.

In the above-mentioned case, whether or not the illuminance of the radiated light emitted from the sample exceeds a certain value is detected by the sound of the buzzer 8, but instead of the buzzer, the output from the light detection sensor 7 is monitored. Using a recorder (recorder) for recording, while monitoring the illuminance change of the radiant light recorded in this recorder, by grasping the timing when the value of the recorder changes significantly, it is possible to know the sample inflow time to the pin sampler or the probe. You may find out the timing of raising. Since this method observes changes in illuminance of synchrotron radiation, even if there is some variation in the illuminance level that is the reference when detecting changes in illuminance due to changes in the temperature of molten metal, etc. You can

Further, the present invention can be applied not only to the manual dipping but also to the dipping by the automatic dosing machine. Especially in the case of using an automatic dosing machine, if the raising operation of the automatic dosing machine is directly controlled instead of the buzzer stop operation that notifies the pulling timing, the sampling work will be more efficient.

In order to confirm the operation and effect of the present invention, the present inventor conducted a sampling test using a holder in which a phototransistor was attached to the tip of the long support rod 5 and a buzzer was attached to the rear end of the body. went. For the test, two types (0.3 mm and 1.0 mm) of a normal size pin sampler probe with different thickness of the iron tip cap that protects the tip were prepared, and the inflow timing and pulling timing depending on the difference of these tip caps. It was tested whether the misalignment could be detected accurately.

When the probe was attached to the holder and immersed in molten steel of 8 tons (molten steel temperature 1550 ° C.) to a depth of 500 mm in a laboratory furnace, a thin-walled cap having a thickness of 0.3 mm was measured after 3 seconds. The thick cap with a thickness of 1.0 mm started to beep after 5 seconds, and about 1 second after that, both probes stopped beeping. Immediately after the buzzer stopped ringing, the probe was pulled up and the samples were collected. As a result, sound samples were collected.

[0025]

[Effect of device]

 In the pin sampler holder of the present invention, a light detection sensor is arranged at a position close to the pin sampler of the probe, and the illuminance change of the radiated light emitted from the rear end of the pin sampler is detected to detect the sample to the pin sampler. Since the inflow timing and the sample coagulation timing are detected, the following effects are obtained. Since the coagulation timing of the sample can be accurately known, the probe can be pulled up at the best timing before redissolution, and a healthy sample can always be collected. Since the sample inflow timing can be accurately known, the depth position at which the sample is taken can be accurately specified.

[Brief description of drawings]

FIG. 1 is a front view showing an embodiment of a holder for a pin sampler of the present invention.

FIG. 2 is a partial cross-sectional front view showing a state in which a probe is mounted on the pin sampler holder of the embodiment.

FIG. 3 is a partial cross-sectional explanatory view showing a positional relationship between a pin sampler and a light detection sensor.

FIG. 4 is a simplified circuit diagram showing an example of a detection circuit.

FIG. 5 is a cross-sectional view showing an example of a mounting mode of a light detection sensor.

FIG. 6 is a perspective view showing an example in which a detection circuit and a buzzer are configured separately from the holder body.

FIG. 7 is a partial sectional view showing an example of a conventional pin sampler probe.

FIG. 8 is a front view showing a conventional holder.

FIG. 9 is a partial cross-sectional front view showing a state in which a pin sampler probe is attached to a conventional holder.

FIG. 10 is an explanatory diagram showing a sampling process.

FIG. 11 is an explanatory diagram showing sampling positions.

[Explanation of symbols]

 P Pin sampler probe H Pin sampler holder S Slag layer M Metal layer 1 Pin sampler 2 Housing 3 Outer tube 4 Tip cap 5 Long support rod 6 Body 7 Light detection sensor 8 Buzzer 9 Detection circuit 10 Stopper 11 Holding member 12 Insulation glass 13 Small hole 14 Aluminum disc 15 Box

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Yutaro Sato, 16-16 Minami Beppu Town, Settsu City, Osaka Prefecture Yamasato Electric Knight Co., Ltd. (72) Hiroshi Iwamura 675 Sakata, Kimitsu, Chiba Prefecture Inside the branch office

Claims (2)

[Scope of utility model registration request] 1. A holder for a pin sampler to which a probe equipped with a pin sampler at its tip is removably inserted, wherein a light detecting sensor is arranged at a position close to the pin sampler in a probe mounted state. Holder for pin sampler. 2. A holder for a pin sampler, wherein a sensor for detecting light is arranged at a tip end portion of a long support rod inserted in a probe.