JPH0120685Y2 - - Google Patents
Info
- Publication number
- JPH0120685Y2 JPH0120685Y2 JP1983052828U JP5282883U JPH0120685Y2 JP H0120685 Y2 JPH0120685 Y2 JP H0120685Y2 JP 1983052828 U JP1983052828 U JP 1983052828U JP 5282883 U JP5282883 U JP 5282883U JP H0120685 Y2 JPH0120685 Y2 JP H0120685Y2
- Authority
- JP
- Japan
- Prior art keywords
- insulator
- molten metal
- hole
- sampling
- temperature sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005070 sampling Methods 0.000 claims description 30
- 239000002184 metal Substances 0.000 claims description 29
- 239000012212 insulator Substances 0.000 claims description 18
- 239000000523 sample Substances 0.000 claims description 17
- 239000003779 heat-resistant material Substances 0.000 claims description 3
- 229910052755 nonmetal Inorganic materials 0.000 claims 1
- 230000008023 solidification Effects 0.000 claims 1
- 238000007711 solidification Methods 0.000 claims 1
- 238000003756 stirring Methods 0.000 claims 1
- 239000004568 cement Substances 0.000 description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 3
- 238000004611 spectroscopical analysis Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
Landscapes
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
Description
【考案の詳細な説明】
本考案は溶融金属、特に溶鋼の測温並びに分光
分析試料を採取する測温兼試料採取装置に関する
ものである。[Detailed Description of the Invention] The present invention relates to a temperature measuring and sampling device for measuring the temperature of molten metal, particularly molten steel, and collecting samples for spectroscopic analysis.
従来において分光分析用の試料採取装置とし
て、デイスク状採取容器(従つて試料はデイスク
状)を用いるものが公知である。 BACKGROUND ART Conventionally, as a sample collection device for spectroscopic analysis, one using a disk-shaped collection container (therefore, the sample is disk-shaped) is known.
この様な装置は採取量がわずかですみ、又溶融
金属は採取容器内で均一且つ迅速に冷却するため
分光分析にて適した試料を提供する点において現
場で広く使用されて来た。 Such devices have been widely used in the field because they require only a small amount to be sampled, and the molten metal cools uniformly and quickly within the sample container, thereby providing a sample suitable for spectroscopic analysis.
ところが、従来においては例えば特公昭53−
10477号等に見られる様に採取容器をプローブ本
体の中心に位置せしめる必要(外部からの熱の遮
断)から、測温センサーと兼用した場合プローブ
径が大きくならざるを得なかつた。 However, in the past, for example,
As seen in No. 10477, etc., the diameter of the probe had to be large if it was used as a temperature sensor due to the need to position the collection container in the center of the probe body (blocking heat from the outside).
本考案は以上の従来の問題を解決し、プローブ
径を小さく出来る溶融金属の測温兼試料採取装置
の提供を目的とする。 The purpose of the present invention is to solve the above-mentioned conventional problems and provide a molten metal temperature measurement/sampling device that can reduce the probe diameter.
以下本考案の溶融金属の測温兼試料採取装置
(以下本考案の装置という)を図面に示す実施例
に従い説明する。 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The molten metal temperature measuring and sampling device of the present invention (hereinafter referred to as the device of the present invention) will be described below with reference to embodiments shown in the drawings.
第1図は本考案の装置を示し、該装置1は紙管
等からなるプローブ本体2を有する。 FIG. 1 shows an apparatus according to the present invention, and the apparatus 1 has a probe body 2 made of a paper tube or the like.
プローブ本体2の先端(第1図左端)には耐熱
性材料の碍子5が装着され、該碍子5にはサンプ
ラーA及び測温センサー12が固定されている。 An insulator 5 made of a heat-resistant material is attached to the tip of the probe body 2 (left end in FIG. 1), and a sampler A and a temperature sensor 12 are fixed to the insulator 5.
測温センサー12はたとえば熱電対が用いら
れ、このリード線13はコネクター3に導かれて
いる。 For example, a thermocouple is used as the temperature sensor 12, and a lead wire 13 is led to the connector 3.
コネクター3は装置1がサブランスに装着され
る際に外部装置に電気的に接続するものである。 The connector 3 is used to electrically connect the device 1 to an external device when the device 1 is attached to a sub-lance.
碍子5部分の詳細を第2図に示し、該碍子5に
はサンプラーAを構成するサンプリング容器6が
接着剤等で固定される。 The details of the insulator 5 are shown in FIG. 2, and a sampling container 6 constituting the sampler A is fixed to the insulator 5 with adhesive or the like.
サンプリング容器6はデイスク状の採取室7
と、該採取室7の下方において偏心して位置決め
され採取室7に連通する流入路8とを有する。 The sampling container 6 is a disk-shaped collection chamber 7
and an inflow path 8 that is eccentrically positioned below the collection chamber 7 and communicates with the collection chamber 7.
サンプリング容器6は金属で作られ、図示の実
施例では第3図及び第4図に示す様に1対の半体
6a,6bを重ねて形成される。 The sampling container 6 is made of metal and in the illustrated embodiment is formed by a pair of overlapping halves 6a, 6b as shown in FIGS. 3 and 4.
サンプリング容器6の上端近くには穴9が設け
られ、該穴9は溶融金属が採取室7に流入する際
残存空気を排除するものである。 A hole 9 is provided near the top of the sampling vessel 6, which excludes residual air as the molten metal flows into the sampling chamber 7.
一方碍子5であるが第5図、第6図、第7図及
び第8図に詳細を示す様に、穴14及び中心から
偏心した位置において正面から背面に貫通して設
けられた穴16を有する。 On the other hand, as shown in detail in FIGS. 5, 6, 7 and 8, the insulator 5 has a hole 14 and a hole 16 provided penetrating from the front to the back at a position eccentric from the center. have
穴14は碍子5の正面に設けられ、底部におい
て背面に貫通する細穴15に連通される。 The hole 14 is provided on the front side of the insulator 5, and is communicated at the bottom with a narrow hole 15 penetrating through the back side.
穴16には第2図に示す様にサンプリング容器
6が流入路8において固定される。 A sampling container 6 is fixed in the hole 16 in the inlet channel 8 as shown in FIG.
穴16は偏心しているためサンプリング容器6
はその採取室7をプローブ本体1のほぼ中心に位
置決め可能にされている。 Since the hole 16 is eccentric, the sampling container 6
The sampling chamber 7 can be positioned approximately at the center of the probe body 1.
又穴16には石英管等の非金属耐熱性材料の流
入管10が流入路8に連通して装着される(耐火
セメント18により固定される)。 Further, an inflow pipe 10 made of a non-metallic heat-resistant material such as a quartz tube is installed in the hole 16 so as to communicate with the inflow path 8 (fixed with refractory cement 18).
一方穴14には測温センサー12(図示のもの
はU字管に収納された熱電対)が耐火セメント1
8により固定される。 On the other hand, in the hole 14, a temperature sensor 12 (the one shown is a thermocouple housed in a U-shaped tube) is connected to the refractory cement 1.
8.
測温センサー12のリード線13は細穴15を
通つてプローブ本体2を走り、コネクター3に至
る。 A lead wire 13 of the temperature sensor 12 runs through the probe body 2 through a thin hole 15 and reaches a connector 3.
碍子5は第6図に示される様に外周に突起17
を有し、該突起17においてプローブ本体2の先
端に押込み固定される。 The insulator 5 has a protrusion 17 on the outer periphery as shown in FIG.
The protrusion 17 is pushed into the tip of the probe body 2 and fixed thereto.
第1図及び第2図に示される様に流入管10及
び測温センサー12は碍子5の先端に突出してい
ることになるが、この状態で金属のキヤツプ19
によりカバーされている。 As shown in FIGS. 1 and 2, the inflow pipe 10 and the temperature sensor 12 protrude from the tip of the insulator 5. In this state, the metal cap 19
covered by.
以上の実施例に示した本考案の装置の使用方法
を次に設明する。 A method of using the apparatus of the present invention shown in the above embodiments will be explained next.
すなわち装置1はサブランスに装着されてコネ
クター3において外部装置に電気的に接続され
る。 That is, the device 1 is attached to a sub-lance and electrically connected to an external device at the connector 3.
この状態で装置1は炉内に挿入され溶融金属中
に浸漬される。 In this state, the device 1 is inserted into the furnace and immersed in the molten metal.
この際キヤツプ19は熱により溶失し流入管1
0及び測温センサー12が先端に露出する。 At this time, the cap 19 melts due to heat and the inflow pipe 1
0 and temperature sensor 12 are exposed at the tip.
これにより流入管10が溶融金属中に露出して
溶融金属は流入管10及び流入路8を通つて採取
室7に流れ込む。 This exposes the inlet pipe 10 to the molten metal, and the molten metal flows into the collection chamber 7 through the inlet pipe 10 and the inlet channel 8.
この際、サンプリング容器6内の空気は穴9か
らプローブ本体2内に排出される。 At this time, the air in the sampling container 6 is discharged into the probe body 2 through the hole 9.
溶融金属は流入に際して流入路8がデイスク状
の採取室7に対して偏心して位置決めされている
ため、第2図に矢印で示す様に採取室7内に回転
しながら流れ込む。 When the molten metal flows in, since the inflow path 8 is positioned eccentrically with respect to the disk-shaped collection chamber 7, the molten metal flows into the collection chamber 7 while rotating as shown by the arrow in FIG.
溶融金属は渦巻状の採取室7内で回転しながら
金属のサンプリング容器6に熱を奪われ冷却され
凝固しデイスク状の試料となる。 The molten metal rotates in the spiral collection chamber 7, and is removed with heat by the metal sampling container 6, cooled, and solidified to form a disk-shaped sample.
一方溶融金属の温度は測温センサー12により
検出され外部装置に送られる。 On the other hand, the temperature of the molten metal is detected by a temperature sensor 12 and sent to an external device.
以上のサンプリング終了後、装置1は溶融金属
から引上げられる。 After the above sampling is completed, the device 1 is pulled up from the molten metal.
本考案の溶融金属の測温兼試料採取装置は以上
の実施例に示した構成、使用方法において次の効
果を有する。 The molten metal temperature measuring and sampling device of the present invention has the following effects in the configuration and usage method shown in the above embodiments.
(1) 本考案の溶融金属の測温兼試料採取装置は実
用新案登録請求の範囲に記載した構成であり、
特にサンプリング容器の流入路は採取室の下方
において偏心して位置決めされるため碍子の穴
を中心から偏心して位置決め出来、その結果測
温センサーを用いても碍子の外径従つてプロー
ブ本体の外径を小さくすることが出来る。(1) The molten metal temperature measuring and sampling device of the present invention has the configuration described in the scope of the utility model registration claim,
In particular, since the inflow path of the sampling container is eccentrically positioned below the collection chamber, the hole in the insulator can be positioned eccentrically from the center, and as a result, even when using a temperature sensor, the outer diameter of the insulator and therefore the outer diameter of the probe body can be adjusted. It can be made smaller.
(2) 本考案の溶融金属の測温兼試料採取装置は同
上の構成であり、特にサンプリング容器の流入
路は採取室の下方において偏心して位置決めさ
れるため溶融金属は流入路から採取室へ回転し
ながら流れ込み、その結果脱酸材(Al等)と
の混合が充分行なわれる。(2) The molten metal temperature measuring and sampling device of the present invention has the same configuration as above, and in particular, the inflow path of the sampling container is eccentrically positioned below the sampling chamber, so the molten metal rotates from the inflow path to the sampling chamber. As a result, it is sufficiently mixed with the deoxidizing material (Al, etc.).
(3) 本考案の溶融金属の測温兼試料採取装置は同
上の構成であり、特にサンプリング容器は金属
で作られるため流入する溶融金属は迅速に冷却
されるがこの冷却は金属流の回転により促進さ
れ両者の相乗効果により採取時間の短縮化が図
れるのみならず均一な試料を採取出来る。(3) The molten metal temperature measuring and sampling device of the present invention has the same configuration as above, and in particular, since the sampling container is made of metal, the molten metal flowing in is quickly cooled down, and this cooling is done by the rotation of the metal flow. Due to the synergistic effect of the two, not only can the collection time be shortened, but also uniform samples can be collected.
(4) 本考案の溶融金属の測温兼試料採取装置は同
上の構成であり、特に流入管が非金属でサンプ
リング容器が金属であるため溶融金属は流入時
には凝固することなく円滑に流入しサンプリン
グ容器において回転しながら均一に凝固し極め
て理想的な試料を採取出来る。(4) The temperature measuring and sampling device for molten metal of the present invention has the same configuration as above, and in particular, since the inflow pipe is non-metallic and the sampling container is metal, the molten metal does not solidify during inflow and can smoothly flow in for sampling. It solidifies uniformly while rotating in the container, making it possible to collect extremely ideal samples.
第1図は本考案の装置の縦断面図、第2図は同
上碍子部分の詳細縦断面図、第3図はサンプリン
グ容器の正面図、第4図は同上半体の平面図、第
5図は本考案の装置の碍子の正面図、第6図は同
上平面図、第7図は第5図7−7断面図、第8図
は第5図8−8断面図。
1:装置、2:プローブ本体、3:コネクタ
ー、5:碍子、6:サンプリング容器、6a,6
b:半体、7:採取室、8:流入路、9:穴、1
0:流入管、12:測温センサー、13:リード
線、14:穴、15:細穴、16:穴、17:突
起、18:耐火セメント、19:キヤツプ、A:
サンプラー。
Fig. 1 is a longitudinal sectional view of the device of the present invention, Fig. 2 is a detailed longitudinal sectional view of the insulator section of the same, Fig. 3 is a front view of the sampling container, Fig. 4 is a plan view of the upper half of the same, and Fig. 5. 6 is a front view of the insulator of the device of the present invention, FIG. 6 is a plan view of the same, FIG. 7 is a cross-sectional view of FIG. 5, 7-7, and FIG. 8 is a cross-sectional view of FIG. 5, 8-8. 1: Device, 2: Probe body, 3: Connector, 5: Insulator, 6: Sampling container, 6a, 6
b: Half body, 7: Collection chamber, 8: Inflow channel, 9: Hole, 1
0: Inflow pipe, 12: Temperature sensor, 13: Lead wire, 14: Hole, 15: Thin hole, 16: Hole, 17: Protrusion, 18: Fireproof cement, 19: Cap, A:
sampler.
Claims (1)
子の中心から偏心した位置の穴に装着された非金
属耐熱性材料の流入管と、そのデイスク状の採取
室の下方に偏心して流入路が設けられ該流入路に
おいて前記流入管に連通して前記碍子の穴に固定
され金属で作られ撹拌及び凝固のための渦巻状の
サンプリング容器と、前記碍子に突出して固定さ
れた測温センサーとからなる溶融金属の測温兼試
料採取装置。 An insulator attached to the tip of the probe body, an inlet pipe made of a non-metal heat-resistant material attached to a hole eccentrically from the center of the insulator, and an inlet path eccentrically provided below the disk-shaped collection chamber. A spiral sampling container made of metal and connected to the inflow pipe in the inflow path and fixed to a hole in the insulator for stirring and solidification, and a temperature sensor fixed to the insulator protruding from the insulator. Molten metal temperature measuring and sampling device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5282883U JPS59158062U (en) | 1983-04-09 | 1983-04-09 | Temperature measuring and sampling device for molten metal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5282883U JPS59158062U (en) | 1983-04-09 | 1983-04-09 | Temperature measuring and sampling device for molten metal |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59158062U JPS59158062U (en) | 1984-10-23 |
JPH0120685Y2 true JPH0120685Y2 (en) | 1989-06-21 |
Family
ID=30183177
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5282883U Granted JPS59158062U (en) | 1983-04-09 | 1983-04-09 | Temperature measuring and sampling device for molten metal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59158062U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5341307B2 (en) * | 1973-05-04 | 1978-11-01 | ||
JPS5439188A (en) * | 1977-04-21 | 1979-03-26 | Mannesmann Ag | Sampling device for molten metal |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5341307U (en) * | 1976-09-16 | 1978-04-10 |
-
1983
- 1983-04-09 JP JP5282883U patent/JPS59158062U/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5341307B2 (en) * | 1973-05-04 | 1978-11-01 | ||
JPS5439188A (en) * | 1977-04-21 | 1979-03-26 | Mannesmann Ag | Sampling device for molten metal |
Also Published As
Publication number | Publication date |
---|---|
JPS59158062U (en) | 1984-10-23 |
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