JPH06120618A - Semiconductor light emitting element - Google Patents

Semiconductor light emitting element

Info

Publication number
JPH06120618A
JPH06120618A JP26591392A JP26591392A JPH06120618A JP H06120618 A JPH06120618 A JP H06120618A JP 26591392 A JP26591392 A JP 26591392A JP 26591392 A JP26591392 A JP 26591392A JP H06120618 A JPH06120618 A JP H06120618A
Authority
JP
Japan
Prior art keywords
layer
light emitting
current
gaas
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26591392A
Other languages
Japanese (ja)
Inventor
Hiroaki Ishii
宏明 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Aviation Electronics Industry Ltd
Original Assignee
Japan Aviation Electronics Industry Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Aviation Electronics Industry Ltd filed Critical Japan Aviation Electronics Industry Ltd
Priority to JP26591392A priority Critical patent/JPH06120618A/en
Publication of JPH06120618A publication Critical patent/JPH06120618A/en
Pending legal-status Critical Current

Links

Landscapes

  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To manufacture a semiconductor light emitting element by the first crystal growth by putting it in current constriction structure without recrystallized interface. CONSTITUTION:A projection 21 triangular in cross section is formed over the overall length on the center of one face of an n-GaAs substrate 20 by etching. A p-GaAs current block layer 22 is grown, as far as the vicinity of the top of the projection 21, at the face where the projection 21 is formed, and further subsequently the first clad layer 23 of n-GaAlAs, the light emitting layer 24 of GaAs, the second clad layer 25 of GaAlAs, and the contact layer 26 of p<+>- GaAs are grown in order. An electrode 27, on the contact layer 26, and an electrode 28, on the bottom of the substrate 20, are formed. The flow of a current is narrowed at the top of the projection 21 by the block layer 22, and a light is confined in by the curvature of a light emitting layer 24 based on the projection 21.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は電流狭さく構造をもつ
屈折率導波形の半導体発光素子に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a refractive index guided semiconductor light emitting device having a current narrowing structure.

【0002】[0002]

【従来の技術】従来この種の半導体発光素子を図2に示
す。n形のGaAs10の平らな面上にn形のGaAl
Asの第1クラッド層11が結晶成長で形成され、その
上にGaAsの発光層12が結晶成長され、その上にp
形のGaAlAsの薄い第2クラッド層の一部13が形
成され、その後、n形のGaAsの電流ブロック層14
が形成される。次に電流ブロック層14の中心部がエッ
チング除去されてスリット15が全長にわたって形成さ
れる。その後、電流ブロック層14上及び溝15内にp
形のGaAlAsの第2クラッド層の他端16が結晶成
長されて、第2クラッド層の一部13とスリット15を
通じて連結される。その第2クラッド層16上にp+
GaAsのコンタクト層17が結晶成長される。その上
に電極18が形成され、基板10の第1クラッド層11
と反対の面に電極19が形成される。
2. Description of the Related Art A conventional semiconductor light emitting device of this type is shown in FIG. n-type GaAl on the flat surface of n-type GaAs 10
A first clad layer 11 of As is formed by crystal growth, and a light emitting layer 12 of GaAs is crystal-grown on the first clad layer 11.
-Shaped GaAlAs thin second cladding layer portion 13 is formed, followed by n-type GaAs current blocking layer 14.
Is formed. Next, the central portion of the current blocking layer 14 is removed by etching to form the slit 15 over the entire length. After that, p is formed on the current blocking layer 14 and in the groove 15.
The other end 16 of the second cladding layer of GaAlAs is crystal-grown and connected to the part 13 of the second cladding layer through the slit 15. A p + GaAs contact layer 17 is crystal-grown on the second cladding layer 16. An electrode 18 is formed on the first cladding layer 11 of the substrate 10.
An electrode 19 is formed on the surface opposite to the surface.

【0003】電極18,19間に電流を流すと、その電
流は電流ブロック層14によりスリット15に狭さくさ
れて、発光層12の中心付近のみ流れ、この部分で発光
が生じる。第2クラッド層13を非常に薄い構造とする
ことにより、発光層12で励起された光は、発光層12
のスリット15と対応した中心部に閉じ込められ、屈折
率導波形の発光素子となる。
When a current is passed between the electrodes 18 and 19, the current is narrowed by the current blocking layer 14 in the slit 15 and flows only near the center of the light emitting layer 12, and light emission occurs in this portion. By making the second clad layer 13 have a very thin structure, the light excited in the light emitting layer 12 can emit light.
It is confined in the central portion corresponding to the slit 15 and becomes a refractive index waveguide type light emitting element.

【0004】[0004]

【発明が解決しようとする課題】従来の屈折率導波形の
半導体発光素子においては電流を狭さくさせるためにス
リット15をエッチングにより形成しているため、第1
クラッド層11、発光層12、第2クラッド層13、電
流ブロック層14を順次結晶成長させる工程と、第2ク
ラッド層16、コンタクト層17を順次結晶成長させる
工程とに結晶成長を2回に分けて行う必要があった。
In the conventional refractive index waveguide type semiconductor light emitting device, the slit 15 is formed by etching in order to narrow the current.
Crystal growth is divided into two steps: a step of sequentially growing the clad layer 11, the light emitting layer 12, the second clad layer 13, and the current blocking layer 14 and a step of sequentially growing the second clad layer 16 and the contact layer 17. I had to do it.

【0005】スリット15を形成するためのエッチング
工程の時に、再成長時の界面となる部分が空気中にさら
されるため、その表面が酸化したり、不純物が付着する
などして、第2クラッド層16の結晶成長に対し特異な
界面が形成され、作成された半導体発光素子に悪影響を
与えることがある。特に再成長前の表面で第2クラッド
層13が空気にさらされた場合、その表面を酸化などの
悪影響がないように保護して良好な再成長界面を形成す
ることは大変困難であった。
During the etching process for forming the slits 15, the interface portion at the time of re-growth is exposed to the air, so that the surface is oxidized or impurities are attached to the second cladding layer. A peculiar interface is formed with respect to the crystal growth of 16, which may adversely affect the produced semiconductor light emitting device. In particular, when the second clad layer 13 was exposed to air on the surface before regrowth, it was very difficult to protect the surface so as not to have an adverse effect such as oxidation and form a good regrowth interface.

【0006】この発明の目的は連続した1回の結晶成長
で製法することを可能とし、従って途中に特異な再結晶
界面を持つことがなく良好に動作する電流狭さく構造を
もつ屈折率導波形半導体発光素子を提供することにあ
る。
An object of the present invention is to make it possible to manufacture by a single continuous crystal growth, and therefore, a refractive index guided semiconductor having a current constriction structure which operates well without having a peculiar recrystallizing interface on the way. It is to provide a light emitting element.

【0007】[0007]

【課題を解決するための手段】この発明によれば一導電
形の半導体基板の一面中央部に断面三角状の突条が全長
にわたって形成されてあり、その突条の両側にその頂部
をわずか残して半導体基板の上記一面上に電流を遮断す
る電流ブロックが形成され、これら両電流ブロック及び
突条の頂部を覆って半導体基板と同一導電形の第1クラ
ッド層が形成され、その第1クラッド層上に発光層が形
成され、その発光層上に逆導電形の第2クラッド層が形
成され、その第2クラッド層上に高濃度逆導電形のコン
タクト層が形成されている。
According to the present invention, a ridge having a triangular cross section is formed over the entire length in the center of one surface of a semiconductor substrate of one conductivity type, and the tops of the ridges are slightly left on both sides of the ridge. A current block for interrupting a current is formed on the one surface of the semiconductor substrate, and a first clad layer having the same conductivity type as the semiconductor substrate is formed so as to cover both current blocks and the tops of the ridges. A light emitting layer is formed thereon, a second conductivity type second clad layer is formed on the light emitting layer, and a high-concentration reverse conductivity type contact layer is formed on the second clad layer.

【0008】[0008]

【実施例】図1にこの発明の実施例を示し、これをその
製造方法を説明しながら説明する。n形のGaAs基板
20の一面中央部に断面2等辺三角形の突条(順メサ凸
構造)21をエッチングにより全長にわたって形成す
る。その突条21が形成されたn−GaAs基板20上
にMOCVD等の結晶成長装置によりp−GaAsの電
流ブロック層22を突条21の頂上付近まで成長する。
さらに続けて、n−GaAlAsの第1クラッド層2
3、GaAsの発光層24、p−GaAlAsの第2ク
ラッド層25及びp+ −GaAsのコンタクト層26を
順次成長形成する。その後、コンタクト層26上に電極
27を、n−GaAs基板20の底面に電極28をそれ
ぞれ形成する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an embodiment of the present invention, which will be described by explaining its manufacturing method. A ridge (a regular mesa convex structure) 21 having an isosceles triangular cross section 21 is formed over the entire length in the center of one surface of the n-type GaAs substrate 20 by etching. On the n-GaAs substrate 20 on which the protrusion 21 is formed, a p-GaAs current block layer 22 is grown to near the top of the protrusion 21 by a crystal growth device such as MOCVD.
Continuing further, the first cladding layer 2 of n-GaAlAs
3, a light emitting layer 24 of GaAs, a second cladding layer 25 of p-GaAlAs, and a contact layer 26 of p + -GaAs are sequentially grown. After that, an electrode 27 is formed on the contact layer 26, and an electrode 28 is formed on the bottom surface of the n-GaAs substrate 20.

【0009】電極27,電極28間に電流を流すと、電
流はその通路がp−GaAs電流ブロック層22によっ
て、突条21の頂上部付近のみに制限され、発光層24
の中央部への電流狭さくが行われる。またGaAs発光
層24は、基板20の持っている凸構造、つまり突条2
1の影響により、中央付近がピークの山状に折れ曲って
いる。その頂上付近左右の発光層24の曲がりにより光
が閉じ込められ、屈折率導波構造となり、光は発光層2
4の頂部付近で発光し、この部分に閉じ込められる。
When a current is made to flow between the electrodes 27 and 28, the passage of the current is limited by the p-GaAs current blocking layer 22 only to the vicinity of the top of the ridge 21 and the light emitting layer 24.
The current is narrowed to the center of the. Further, the GaAs light emitting layer 24 has a convex structure of the substrate 20, that is, the ridge 2
Due to the effect of 1, the area near the center is bent into a peak. The light is confined by the bending of the light emitting layers 24 on the left and right near the top, and the light has a refractive index guiding structure.
Light is emitted near the top of 4 and is confined in this part.

【0010】以上述べたようにこの発明の構造によれ
ば、電流狭さく構造を有する屈折率導波形の半導体発光
素子を、その製作工程の途中に、空気にさらすことなく
1回の結晶成長で、その基本構造を製作することが可能
であり、再成長界面を持たない良質な発光素子が得られ
る。
As described above, according to the structure of the present invention, the index-guided semiconductor light emitting device having the current narrowing structure can be grown once during the manufacturing process without exposing to air. The basic structure can be manufactured, and a high quality light emitting device having no regrowth interface can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施例を示す斜視図。FIG. 1 is a perspective view showing an embodiment of the present invention.

【図2】従来の半導体発光素子を示す斜視図。FIG. 2 is a perspective view showing a conventional semiconductor light emitting device.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 一面に断面三角状の突条を有する一導電
形半導体基板と、 上記突条の両側にその頂部をわずか残して上記半導体基
板の上記一面上に形成され、電流遮断する電流ブロック
層と、 これら両電流ブロック層及びこれより突出した上記突条
の頂部を覆って形成された上記半導体基板と同一導電形
の第1クラッド層と、 その第1クラッド層上に形成された発光層と、 その発光層上に形成され、上記半導体基板と反対導電形
の第2クラッド層と、 を具備する半導体発光素子。
1. A one-conductivity-type semiconductor substrate having a ridge having a triangular cross section on one surface, and a current block formed on the one surface of the semiconductor substrate, leaving a little top portion on both sides of the ridge, for interrupting a current. Layer, a first clad layer of the same conductivity type as the semiconductor substrate formed over both current blocking layers and the tops of the protrusions protruding therefrom, and a light emitting layer formed on the first clad layer And a second clad layer formed on the light emitting layer and having a conductivity type opposite to that of the semiconductor substrate.
JP26591392A 1992-10-05 1992-10-05 Semiconductor light emitting element Pending JPH06120618A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26591392A JPH06120618A (en) 1992-10-05 1992-10-05 Semiconductor light emitting element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26591392A JPH06120618A (en) 1992-10-05 1992-10-05 Semiconductor light emitting element

Publications (1)

Publication Number Publication Date
JPH06120618A true JPH06120618A (en) 1994-04-28

Family

ID=17423844

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26591392A Pending JPH06120618A (en) 1992-10-05 1992-10-05 Semiconductor light emitting element

Country Status (1)

Country Link
JP (1) JPH06120618A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55158689A (en) * 1979-05-30 1980-12-10 Sumitomo Electric Ind Ltd Semiconductor light emitting device and manufacture thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55158689A (en) * 1979-05-30 1980-12-10 Sumitomo Electric Ind Ltd Semiconductor light emitting device and manufacture thereof

Similar Documents

Publication Publication Date Title
US4380861A (en) Method of making a semiconductor laser by liquid phase epitaxial growths
JPH09199790A (en) Semiconductor laser device and its manufacture
US5394421A (en) Semiconductor laser device including a step electrode in a form of eaves
JPH09116222A (en) Manufacture of semiconductor laser and semiconductor laser
EP0321294B1 (en) A semiconductor laser device
JP2863677B2 (en) Semiconductor laser and method of manufacturing the same
US4377865A (en) Semiconductor laser
JPH06120618A (en) Semiconductor light emitting element
JP2629678B2 (en) Semiconductor laser device and method of manufacturing the same
US5182228A (en) Method of manufacturing a semiconductor light-emitting device
JPH06260715A (en) Semiconductor laser and manufacture thereof
US5963786A (en) Method of making semiconductor laser with inverted mesa shaped ridge with cervical surface
JP2006203054A (en) Semiconductor laser device and method for manufacturing the same
KR950008859B1 (en) Semiconductor light emitting device and manufacturing method thereof
JP2564343B2 (en) Semiconductor laser device
KR0179012B1 (en) Method of manufacturing semiconductor laser diode
JPH01162397A (en) Semiconductor laser element
JPS5834988A (en) Manufacture of semiconductor laser
KR100322689B1 (en) Laser diode and method fabricating the same
JPH10163560A (en) Manufacture of semiconductor laser
JPH0558594B2 (en)
JPH0730190A (en) Semiconductor laser and its manufacture
JPS59101886A (en) Semiconductor laser device and manufacture thereof
JPH0548199A (en) Semiconductor light emitting device and manufacture thereof
JPH06326413A (en) Semiconductor laser

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19980728