JPH06118039A - Thermal analyzing device - Google Patents

Abstract

PURPOSE:To examine and analyze a sample for the effect by temperature by a transmitted electromagnetic rays (X-rays, ultraviolet ray). CONSTITUTION:A through-hole is provided on the symmetrical axis of a H- shaped rotationally symmetric heat sink 3, and a sample 1 is placed to block the through-hole. A through-hole is provided from the upper surface of the sample 1 concentrically to the through-hole of the heat sink 3, and the sample is held in a determined position by a sample holding tool of the same material as the heat sink 3. An electromagnetic wave is passed to the through-hole of the heat sink 3 to irradiate the sample 1. The electromagnetic wave emitted to the sample 1 is diffracted or transmitted by the sample 1 and released from the through-hole of a sample screw tool. The released electromagnetic wave is detected by a detector. The heat sink 3 has temperature detectors arranged near the sample and in a position slightly separated from the sample 1, respectively, to detect the differential heat and the temperatures of the sample and the sink.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal analysis device. In particular, the present invention relates to an apparatus for transmitting an electromagnetic wave through a sample while controlling the temperature of the sample such as heating and cooling, and measuring the diffraction, scattering, and absorption of the electromagnetic wave caused by transmitting the sample and at the same time performing thermal analysis. The present invention also relates to an apparatus for measuring the diffraction, scattering and absorption characteristics of electromagnetic waves of a sample at a predetermined temperature.

[0002]

2. Description of the Related Art A conventional device of this type is shown in "Thermal Analysis Guidebook (1) -Centering on DTA-" (published May 1, 1971) published by Rigaku Denki Co., Ltd. X is
There is a high temperature X-ray diffraction-DTA simultaneous measurement apparatus that simultaneously performs line diffraction and differential thermal analysis (DTA). It is shown in FIG. The disk-shaped heat sink 3 is provided with depressions 3a on the upper and lower surfaces thereof, and the sample 1 is placed in one depression 3a and the standard sample 1a is placed in the other depression 1a. A heater 5 is arranged around the heat sink 3, and the temperature of the heater 5 is controlled by a temperature controller 20. A second thermocouple 8 for measuring and controlling the temperature of the sample 1 is provided on the heat sink 3.

Further, a first thermocouple 4 is provided on each of the sample 1 and the standard sample 1a for differential thermal measurement. An X-ray tube 24b is provided for irradiating the surface of the sample 2 with X-rays, and an X-ray detector 25 for irradiating X-rays and detecting the X-rays diffracted by the sample 1 is provided. It is provided on the same side with respect to the surface. That is, X from the sample side
It is configured to irradiate a ray and detect the reflected and diffracted X-ray ray on the sample side. Further, in order to measure the reflection of X-rays, the X-ray irradiation and detection side of the sample 1 is open so that X-rays can pass through.

Further, as a differential scanning calorimeter (DSC) and infrared absorption spectroscopic measurement, and an apparatus for observing a change in the state of a sample with a microscope by transmitting visible light, an FP84 DSC measurement hot stage sold by METTLER CORPORATION. There is an apparatus in which a microscope and a Fourier transform infrared absorption spectroscope with a microscope (FT-IR with a microscope) are combined. The FP84DSC measurement hot stage manufactured by METTLER CORPORATION is provided with temperature detectors at symmetrical positions on a disk-shaped heat sink with a heater, and a sample and a standard sample are placed on each temperature detector. A through hole is provided in the sample mounting portion of the heat sink so that light can pass therethrough. The light passing through the through hole of the heat sink irradiates the sample, transmits the sample, and is observed or detected by a microscope or an FT-RI equipped with a microscope.

[0005]

It is widely practiced to irradiate a sample with an electromagnetic wave and detect phenomena such as diffraction, scattering and absorption of the electromagnetic wave by the sample at that time with a detector to investigate the structure of the sample and its change. ing. Typical examples of this type of measurement include X-ray diffraction measurement and infrared absorption spectroscopy measurement. Since the internal structure of the sample generally changes depending on the temperature of the sample, the measurement of X-ray diffraction or infrared absorption spectroscopy is performed while changing the temperature of the sample.

On the other hand, thermal analysis is generally used as a method for measuring changes in the physical properties of a sample while changing the temperature of the sample. In particular, differential thermal analysis (DTA) and differential scanning calorimeter (DSC) are often used to measure the phase transition of a sample due to the structural change of the sample. Therefore, simultaneous measurement of these X-ray diffraction and infrared absorption and thermal analysis such as DTA and DSC is useful for analyzing the structure of the sample and the structural change associated with the temperature change.

In the conventional example shown in FIG. 5, X-ray diffraction is configured to detect diffracted X-rays reflected on the surface of the sample 1.
That is, since the measurement is performed by the reflection type, the surface of the sample 1 irradiated with the X-ray is largely open, and there is a drawback that a temperature difference is likely to occur between the front surface and the back surface of the sample. Further, the liquid sample 1 has a drawback that it cannot be measured in the conventional example of FIG.

Further, in an apparatus in which a FP-84DSC hot stage manufactured by METTLER CORPORATION is combined with a microscope or an infrared absorption spectroscopy apparatus with a microscope, the sample and the standard sample are arranged from the center on a disc-shaped heat sink because they are constructed as a DSC. They are arranged at symmetrical positions apart from each other. A through hole is provided at each position on the heat sink so that the sample is irradiated with light through the through hole on the sample side. The sample is stored in a sample container made of a transparent material. The material of the sample container is a transparent material and generally has very poor thermal conductivity, and since the sample container is mounted on a temperature detector having a thermal resistance, the heat from the heat sink to the sample itself is not transferred. The migration is much less than for a typical calorimeter.

That is, the temperature difference between the sample and the heat sink becomes large, and the accuracy of calorimetric analysis (DSC) deteriorates. Furthermore, when light passes through the sample, the temperature of the sample rises due to the absorption of light by the sample itself. On the contrary, the high heat resistance substance existing between the sample and the heat sink makes it difficult for the heat to escape to the heat sink. ing. Therefore,
The heat associated with the rise in the sample temperature is not immediately absorbed by the heat sink, and the thermal characteristics of the sample itself are not exhibited. That is, there was a problem in reliability as a thermal analysis device.

[0010]

In order to solve the above problems, the present invention provides a heat sink having a substantially rotationally symmetrical shape, a heater wound around the outer periphery of the heat sink, and the heat sink for energizing the heater. A temperature controller for controlling the temperature of, the sample is placed on the rotational symmetry axis of the heat sink, the sample is surrounded by the heat sink, electromagnetic waves pass on the rotational symmetry axis provided in the heat sink, Then, a through hole for transmitting the sample, an electromagnetic wave generation source provided on the rotational symmetry axis for irradiating the sample with the electromagnetic wave, and provided on the opposite side of the sample from the electromagnetic wave generation source. Electromagnetic wave detector, a first temperature detector fixed in the heat sink near the sample for measuring the temperature of the sample, the sample and the front A second temperature detector provided in the heat sink at a position away from the first detector, and an output difference between the first temperature detector and the second temperature detector. A thermal analysis device comprising: a thermal analysis signal detector for detecting.

[0011]

The present invention has the above-mentioned structure for reducing the temperature distribution in the sample while allowing the sample to transmit electromagnetic waves. First, when the temperature of the heat sink is controlled by heating the heat sink of the rotationally symmetrical body with a heater uniformly wound around the outer circumference, the temperature distribution (temperature gradient) is the smallest on the rotational symmetrical axis in the heat sink.
In the device of the present invention, since the sample is placed on the axis of symmetry of the heat sink, which is a substantially rotationally symmetric body,
It is placed in a position where the temperature distribution (gradient) is the smallest in the heat sink. In addition, since the structure around the sample is directly surrounded by the heat sink, the heat flow into the sample is also directly from the heat sink, and the temperature distribution (non-uniformity) in the sample is minimized. A through hole is formed on the rotation symmetry axis of the heat sink to allow electromagnetic waves to pass through, but the effect of this hole on the temperature distribution inside the sample is axisymmetric with respect to the sample. It is the most ideal of all cases with holes.

The temperature detector of the first temperature detector is installed for the purpose of measuring the temperature of the sample, and is located very close to the sample position in the heat sink. And
The second temperature detector detects the temperature inside the heat sink at a position slightly away from the sample. When a high-purity metal with a well-known transition temperature is used as the sample and the temperature is raised, the temperature difference between the first temperature detector and the second temperature detector becomes large during the melting of the metal, and the steady state resumes after the melting. Return to a different temperature.
Therefore, it becomes possible to calibrate the sample temperature measurement of the first temperature detector using this temperature difference signal. Considering the heat sink in the vicinity detected by the second temperature detector as a reference sample, the temperature difference signal between the first temperature detector and the second temperature detector should be regarded as a signal equivalent to a so-called DTA signal. You can Therefore, by outputting this temperature difference signal as a signal for thermal analysis, it functions as a DTA.

[0013]

1 (a) and 1 (b) respectively show a side sectional view and a front sectional view of a furnace part for heating and cooling a sample according to a first embodiment of the apparatus according to the present invention. 1 is the sample,
2 is a washer-shaped sample holder for supporting the sample,
3 is a heat sink. The heat sink 3 is a rotationally symmetrical body (cylindrical) having an H-shaped cross section, and is made of a material having good heat conduction (copper in the embodiment). This shape is disclosed in JP-A-62-1955.
As disclosed in Japanese Patent Publication No. 49 and Japanese Utility Model Publication No. 3-2847, it has substantially the same shape as the heat sink structure of a well-known differential scanning calorimeter (DSC).

The second temperature detector for detecting the temperature of the heat sink 3 and controlling the temperature is the second temperature detector in the embodiment.
The thermocouple 8 of is used. The second which is the second temperature detector
The thermocouple 8 is fixed to the heat sink 3 by brazing so that the tip end, which is the temperature detecting portion, is in good thermal contact with the heat sink 3. A heater wire 5 is wound around the surface of the heat sink 3 so that the heat sink 3 can be heated. As disclosed in Japanese Patent Application Laid-Open No. 2-105046, the temperature controller 20 is connected to the heater wire 5 and the temperature control thermocouple 8 as in the well-known thermal analysis device, and the heat sink 3 is used. Is temperature controlled according to a temperature program set by the temperature controller 20. With this configuration, the heat sink 3 functions as a heating furnace that is heated and cooled while the temperature is controlled.

The sample 1 is inserted into a central hole of a washer-shaped sample holder 2, and depending on the sample 1, the front and back of the sample holder 2 are sandwiched by aluminum foil or the like. The material of the sample holder 2 is a heat-resistant material such as a fluororesin or a metal material having good thermal conductivity (copper, silver, etc.) for holding samples of various shapes.
Further, in particular, when analyzing a liquid or until it becomes liquid by heating the sample, the front and back of the sample holder 2 in which the sample 1 is inserted are sandwiched by aluminum or a transparent film. In the example, the shape of the sample 1 is 6 mm in diameter and 1 mm in thickness. In the sample holder, the outer diameter of the heat sink 3 is engaged with the inner diameter of the recess. When the sample holder 2 with the sample 1 set is set on the bottom surface of the recess of the heat sink 3, the center of the sample 1 is the heat sink. It coincides with the rotational symmetry axis of 3. In addition, the shape of the concave portion of the heat sink 3 on the side where the sample 1 is placed is further provided with a circular concave portion (recess) centered on the rotational symmetry axis of the heat sink 3 and set directly in the concave portion or in the sample holder 2. Alternatively, the sample 1 may be placed.

The sample holder 2 thus set
Is put in the central flat portion of the heat sink 3 from the right side of the cross-sectional view of FIG. Furthermore, it is made of the same material as the heat sink 3,
The sample fixture 7 having a screw thread formed on the outer periphery is screwed into the screw hole provided on the side surface of the concave portion of the heat sink 3, and the sample 1 and the sample holder 2 are pressed against the heat sink central flat portion (recess portion) and fixed. To do. Sample fixture 7
Since is made of the same material as the heat sink 3, it functions as a part of the heat sink when the sample 1 is fixed. That is, the sample 1 is surrounded by the heat sink, and the temperature of the sample 1 can be varied by controlling the temperature of the heat sink 3. The sample 1 can be detached from the heat sink 3 by detaching the sample fixture 7. The sample fixture 7 can be fixed to the heat sink by screwing or the like instead of the structure described above.

A ring 10 for circulating a refrigerant gas is provided on the outer periphery of the heater 5 wound around the heat sink 3. This structure is similar to that disclosed in Japanese Patent Laid-Open No. 2-116744. The refrigerant gas distribution ring 10 has a space between the outer diameter of the heat sink 3 and the inner diameter of the refrigerant gas distribution ring 10 so that the refrigerant gas 22 passes through the outer circumference of the heat sink 3. The distribution ring 10 is a refrigerant gas introduction hole 21.
It is formed airtight except for a and the refrigerant gas discharge hole 21b. By flowing the refrigerant gas into the cooling gas flow ring 10, it is possible to cool the heat sink 3 (fall the temperature) or raise the temperature from room temperature or lower.

The entire apparatus described above is supported by a support base 23 which supports the ring 10 for circulating the refrigerant gas. Through holes 6 and 6 (diameter 2 mm in the embodiment) through which electromagnetic waves (X-rays 24 in the embodiment) can pass are formed in the center of the heat sink 3 (axis of rotational symmetry) and the center of the sample fixture 7, respectively. As shown in the side sectional view of FIG. 1, the X-rays enter from the left side, irradiate the sample 1 through the through hole 6 of the heat sink 3 and pass through the sample 1, and exit rightward through the through hole 6 of the sample fixture 7. The through hole 6 of the sample fixture 7 on the emission side is a hole having a solid angle so that the X-rays 24a that have passed through the sample and diffracted and scattered can be emitted. The emitted X-rays 24a are properly
By detecting with the line detector 25, X-ray diffraction and absorption by the sample 1 can be measured. When detecting the diffracted X-ray, the position of the X-ray detector 25 is moved to a predetermined position, or the diffracted X-ray 24a is detected.

When detecting X-rays transmitted through the sample 1, the X-ray detector 25 is installed on the rotationally symmetrical axis of the heat sink 3 on the X-ray emission side. A sheath type thermocouple 4 as a first temperature detector for measuring the temperature of the sample 1 is embedded in a substantially central portion of the heat sink 3 in the immediate vicinity of the position where the sample 1 is installed. In the embodiment, four sheath-type thermocouples 4 are arranged on a concentric circle having a diameter of 4 mm from the axial center of the heat sink 3 when viewed from the X-ray incident direction. Each thermocouple is fixed by brazing so as not to move in the heat sink 3. The four first thermocouples 4 for measuring the sample temperature are connected in parallel, and the average temperature of the measured temperatures at the four points is output.

Since the temperature of the sample temperature is calibrated and used as a thermal analysis signal, the difference between the output of the first thermocouple 4 for measuring the sample temperature and the output of the second thermocouple 8 for controlling the temperature. (That is, each temperature difference) is detected by a thermal analysis signal detector (not shown). This can be achieved by connecting the first thermocouple 4 for measuring the sample temperature and the second thermocouple 8 for controlling the temperature in series and detecting the output.

Next, the measurement procedure in this embodiment will be described. First of all, the sample temperature measurement, that is, the first temperature detector (first
Calibrate the temperature of thermocouple 4). For this, a method according to a method that is often used in thermal analysis, in particular, differential scanning calorimeter (DSC), differential thermal analysis (DTA) and the like is used. This is a method in which a substance having a well-known transition temperature, such as a high-purity metal, is used as a sample, the transition such as melting of the sample is detected, and the measured temperature at that time is adjusted to the transition temperature of the sample used.
Specifically, it is performed as follows.

As the sample 1, for example, high-purity indium (In) is used and placed in the sample holder 2 and set on the central flat portion of the heat sink 3 as described above. Next, the temperature controller 20 is used to raise the temperature of the heat sink 3 at a constant rate. At this time, as described above, the temperature near the sample is output from the first thermocouple 4 for measuring the sample temperature, and the temperature of the heat sink 3 is output from the second thermocouple 8 for temperature control. Further, the temperature difference between the first thermocouple 4 for measuring the sample temperature and the second thermocouple 8 for temperature control is simultaneously output and detected.

FIG. 2 shows the output of the second thermocouple 8 for temperature control, the output of the first thermocouple 4 for measuring the sample temperature and the first thermocouple for measuring the sample temperature when the heat sink 3 is heated at a constant rate of temperature increase. It is the figure which showed the change with respect to the time of the difference (temperature difference) of the output of the thermocouple 4 of 1 and the 2nd thermocouple 8 for temperature control. As can be seen from FIG. 2, when the temperature of the sample 1 (here, In) rises and reaches its melting point, the sample In melts,
The temperature measured by the first thermocouple 4 for measuring the sample temperature is I
Due to the latent heat of fusion of n, the temperature rises slightly away from the constant temperature rise curve. When the melting of the sample In is completed, the original constant temperature rising curve is restored again. On the other hand, the output of the second thermocouple 8 for temperature control continues to rise at a constant temperature during the melting of the sample In. Therefore, the temperature difference between the first thermocouple 4 for measuring the sample temperature and the second thermocouple 8 for controlling the temperature has a peak due to melting of the sample In, as shown in FIG. This temperature difference signal is similar to the well-known differential thermal analysis (DTA) signal.

In DTA, the temperature at the onset position of the peak is generally taken as the melting point of the sample In. And when the measured temperature at that time is different from the known melting point,
Correct the output of the sample temperature measurement to match the known melting point. In this way, the temperature of the DTA device is calibrated.
Therefore, also in the case of the present embodiment, the temperature at the peak rising onset of the temperature difference signal can be judged as the melting point of the sample In, and if the output of the first thermocouple 4 for measuring the sample temperature at that time is the sample In DT if different from melting point
As in the case of A, the temperature can be calibrated by correcting the output. After the temperature is calibrated in this way, the output of the first thermocouple 4 for measuring the sample temperature indicates the sample temperature.

Next, the sample to be actually measured by X-ray diffraction or the like is replaced as the sample 1 and set on the central flat portion of the heat sink 3. The X-ray 24 is made incident on the through hole 6 of the heat sink 3 from the left direction, and the appropriate (X-ray) detector 2 is made to the right direction.
5 is arranged to measure X-ray diffraction and absorption by the sample. Then, the temperature controller 20 is used while measuring with X-rays.
Controls the temperature of the heat sink 3 according to the temperature program. As a result, when the temperature of the sample is changed in accordance with the temperature program, the temperature signal of the sample, the difference between the sample temperature and the heat sink temperature (a signal corresponding to the DTA signal), and the X-ray diffraction and absorption signals by the sample can be simultaneously measured. it can. For example, when the crystal structure of the sample changes with the change of the temperature of the sample, a change of the X-ray diffraction data due to the crystal change corresponding to the temperature of the sample can be seen. In addition, it is possible to detect the heat input and output due to this crystal change with the temperature difference signal.

In the structure of this embodiment, since the sample temperature is measured and the temperature calibration method is similar to that of DSC and DTA, the sample temperature measurement accuracy is standard DSC and DT.
Guaranteed as A. Moreover, since the sample 1 is located at the center of symmetry of the temperature distribution in the heat sink and is surrounded by the heat sink 3 having good thermal conductivity except for the minimum hole through which X-rays pass, The temperature distribution can also be kept in a discretionary state. Therefore, it becomes possible to obtain the temperature signal, the temperature difference signal, and the X-ray diffraction data at the same time.

In the present embodiment, the method of detecting the temperature difference signal is explained by taking out the difference between the outputs of the first thermocouple 4 for measuring the sample temperature and the second thermocouple 8 for controlling the temperature. The second embodiment is an example in which a temperature difference signal is extracted by another method. In this example, of the four sample temperature measuring thermocouples 4 in the above-described embodiment, two are fixed near the sample, and the other two are concentrically fixed at positions further away from the sample 1. The difference between the two outputs and the latter two outputs is taken out as a temperature difference signal. In other words, one pair of second thermocouples 4 diagonally included in the second pair of second temperature detectors, which are embedded at an equal distance from the rotational symmetry axis of the heat sink 3 in the vicinity of the sample 1, are connected to the other second thermocouples 4. The thermocouple 4 is arranged farther from the surface of the sample 1.

Here, the two thermocouples closer to the sample side are referred to as the first thermocouple 4 for sample temperature measurement (this serves as the first temperature detector), and the two thermocouples farther from the sample side. A third thermocouple 4a (which serves as a second temperature detector) is used for temperature measurement. Except for the arrangement of thermocouples and their wiring, other configurations are the same as in the first embodiment. In this configuration, for example, when indium is used as the sample to raise the temperature, the first thermocouple 4 for measuring the sample temperature (first temperature detector) and the third thermocouple 4a for measuring the reference temperature (second temperature) The output of the detector) and the difference between those outputs are as shown in FIG. 4, and the temperature difference signal shows a peak due to melting of indium, and the temperature at the peak rising onset position can be regarded as the melting point of indium. . As a result, the temperature can be calibrated, and the temperature difference signal is less disturbed by heating fluctuations due to the turning on / off of the heater 5, and the output signal of the difference becomes smaller, but it becomes a more accurate signal as the thermal analysis signal.
That is, the thermal analysis signal corresponds to a more accurate DTA.

Although the present embodiment has been described in combination with an X-ray diffraction apparatus, infrared rays, for example, as electromagnetic waves are incident from the left side of the sectional view of FIG. 1 (a) with the configuration shown in this embodiment. It is clear that the infrared absorption of the sample, the sample temperature, and the thermal analysis signal as the temperature difference signal can be measured at the same time by installing an appropriate ultraviolet detector on the emission side. Further, with the configuration of this embodiment as it is, the left side of the cross-sectional view is directed downward, and visible light is incident from below, and a microscope is placed on the exit side. Clearly, the thermal analysis signals can be measured simultaneously.

[0030]

According to the present invention, in the apparatus for simultaneously measuring thermal analysis and electromagnetic wave diffraction, absorption or transmission, the temperature of the sample is measured and the electromagnetic wave can be transmitted through the sample so that the sample has the most temperature distribution of the heat sink. Since it is installed in a good position and surrounded by a heat sink, the temperature distribution of the sample can be minimized and the simultaneous measurement with improved reliability of sample temperature measurement can be performed. Also, the sample temperature calibration
There is also an effect that can be performed by the same method as SC and DTA. Also X
Also in the line diffraction measurement, since it is a transmission type measurement, there is an effect that a liquid sample can be measured.

[Brief description of drawings]

1A and 1B are a side sectional view and a front sectional view, respectively, of a first embodiment according to the present invention.

FIG. 2 shows a second thermocouple 8 for temperature control, a second thermocouple 4 for measuring a sample temperature, and changes in respective temperature differences with time when indium is measured in the first embodiment. It is a graph figure.

FIG. 3 shows a side sectional view of a second embodiment in which the temperature difference signal is extracted by another method.

FIG. 4 is a first thermocouple 4 for measuring sample temperature and a third thermocouple 4 for measuring reference temperature in the second embodiment shown in FIG.
It is a graph which showed a and those temperature difference signals.

FIG. 5 is a schematic block diagram of a conventional thermal analysis device with a reflection type X-ray diffraction device.

[Explanation of symbols]

 1 sample 2 washer-shaped sample holder 3 heat sink 4 first thermocouple 4a for sample temperature measurement 3rd thermocouple for reference temperature measurement 5 heater 6 through hole through which electromagnetic wave passes 7 sample fixture 8 second thermoelectric for temperature control versus

Claims (5)

[Claims] 1. A heat sink, which is substantially in the shape of a rotationally symmetric body, and which is made of a good thermal conductor for mounting a sample on the axis of symmetry of the rotationally symmetric body, a heater wound around the outer periphery of the heat sink, and the heater. A temperature controller for energizing and controlling the temperature of the heat sink, a sample fixture for sandwiching the sample between the sample and the heat sink at a predetermined position of the sample, and fixing and supporting the sample; An electromagnetic wave passes on the rotational symmetry axis, and a heat sink through hole provided in the heat sink for transmitting the sample, and a fixing provided in the sample fixture for passing the electromagnetic wave passing through the sample A tool through hole, an electromagnetic wave generation source for irradiating the sample with the electromagnetic wave, the electromagnetic wave generation source being provided on the rotational symmetry axis; An electromagnetic wave detector provided on the opposite side of the magnetic wave generation source, a first temperature detector fixed in the heat sink near the sample for measuring the temperature of the sample, the sample and the first Detecting a difference in output between the second temperature detector and the second temperature detector provided in the heat sink at a position away from the detector. A thermal analysis device comprising a thermal analysis signal detector. 2. The thermal analysis device according to claim 1, wherein the second temperature detector is a temperature detector for controlling the temperature of the heat sink. 3. The thermal analysis apparatus according to claim 1, wherein the heat sink is a rotationally symmetrical body having a substantially H-shaped cross section. 4. The thermal analyzer according to claim 1, wherein the electromagnetic wave is X-ray, and the detector passes X-ray passing through the sample.
A thermal analysis device that is an X-ray detector that detects X-rays. 5. The thermal analysis device according to claim 1, wherein the electromagnetic wave is a light beam, and the detector is a photodetector that detects a light beam that has passed through the sample.