JPH0610610Y2 - electronic microscope - Google Patents

electronic microscope

Info

Publication number
JPH0610610Y2
JPH0610610Y2 JP1987185126U JP18512687U JPH0610610Y2 JP H0610610 Y2 JPH0610610 Y2 JP H0610610Y2 JP 1987185126 U JP1987185126 U JP 1987185126U JP 18512687 U JP18512687 U JP 18512687U JP H0610610 Y2 JPH0610610 Y2 JP H0610610Y2
Authority
JP
Japan
Prior art keywords
dust
chamber
silica gel
voltage
exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987185126U
Other languages
Japanese (ja)
Other versions
JPH0189452U (en
Inventor
義弘 平田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP1987185126U priority Critical patent/JPH0610610Y2/en
Publication of JPH0189452U publication Critical patent/JPH0189452U/ja
Application granted granted Critical
Publication of JPH0610610Y2 publication Critical patent/JPH0610610Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 [産業上の利用分野] 本案は電子顕微鏡の排気系の改良に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to improvement of an exhaust system of an electron microscope.

[従来技術] 電子顕微鏡等の排気系においては、鏡筒等の被排気室を
大気圧に戻す場合に、大気導入経路にシリカゲル(Si
licagel)やメッシュ状のフィルターを配置して
大気中の水分や塵の導入を防止している。
[Prior Art] In an exhaust system such as an electron microscope, when returning an exhausted chamber such as a lens barrel to atmospheric pressure, silica gel (Si
li-cage) and a mesh filter are placed to prevent the introduction of moisture and dust in the atmosphere.

[考案が解決しようとする問題点] ところで、前述したシリカゲルは多孔質であるため少量
でもその表面積が大きく吸着性に富んでいるが、粉末あ
るいは粒状であるため大気導入の際に壊れると水分や塵
を含んだ粉末等が流入して被排気室内を汚染してしま
う。これを防止するため細かいメッシュ状のフィルター
を併用することも考えられるが、このようなフィルター
はすぐ目詰りを起こし頻繁にクリーニングしなければな
らず作業が繁雑である。
[Problems to be solved by the invention] By the way, since the above-mentioned silica gel is porous and has a large surface area even with a small amount and is highly adsorbable, if it breaks when introduced into the atmosphere due to its powdery or granular form, it may absorb moisture and water. Dust-containing powder, etc. will flow in and pollute the exhaust chamber. In order to prevent this, it is possible to use a fine mesh filter together, but such a filter causes clogging immediately and must be frequently cleaned, and the work is complicated.

本考案は以上の点に鑑みなされたもので、電子顕微鏡等
の被排気室内を大気圧に戻す場合に水分や塵を含んだ粉
末状のシリカゲルの流入を防止した装置を提供すること
を目的としている。
The present invention has been made in view of the above points, and an object thereof is to provide a device that prevents the inflow of powdery silica gel containing water and dust when returning the inside of an exhaust chamber such as an electron microscope to atmospheric pressure. There is.

[問題点を解決するための手段] 上記目的を達成するための本考案は、被排気室と、該被
排気室を真空に排気するための排気ポンプと、前記被排
気室の大気導入経路に設けられたシリカゲル容器とを備
えた電子顕微鏡において、前記シリカゲル容器より被排
気室側の前記大気導入経路に高電圧吸塵手段を備えて成
り、該高電圧吸塵手段はジグザグ状の大気導入経路が形
成されるように交互に位置を異にして配置された複数の
吸塵電極を備えている。
[Means for Solving the Problems] The present invention for achieving the above-mentioned object provides an exhausted chamber, an exhaust pump for exhausting the exhausted chamber to a vacuum, and an atmosphere introduction path of the exhausted chamber. In an electron microscope provided with a silica gel container provided, a high-voltage dust suction means is provided in the atmosphere introduction path on the exhausted chamber side of the silica gel container, and the high-voltage dust suction means forms a zigzag air introduction path. As described above, the plurality of dust absorption electrodes are alternately arranged at different positions.

[実施例] 以下図面を参照して本考案を詳細に説明する。第1図は
本考案の一実施例の概略構成図で、第2図は後述する高
電圧吸着筒を説明するための図である。図において、1
は鏡筒等の被排気室、該被排気室1は排気管2を介して
排気ポンプ3に接続され、排気管2には排気バルブ4が
配置されている。5は排気管2に接続されたリーク管
で、該リーク管5にはリークバルブ6が設けられてい
る。7は第2図に示すように吸塵電極7a,7b……7
eが設けられ高電圧吸塵筒である。8は該高電圧吸塵筒
7より大気側に設けられたシリカゲル容器である。9は
リーク管5と高電圧吸塵筒7とを電気的に絶縁して接続
するための絶縁部材で、10は保護容器、11はリーク
スイッチ、12は高電圧電源、13は高圧導入端子であ
る。
[Embodiment] Hereinafter, the present invention will be described in detail with reference to the drawings. FIG. 1 is a schematic configuration diagram of an embodiment of the present invention, and FIG. 2 is a diagram for explaining a high voltage adsorption cylinder described later. In the figure, 1
Is an exhausted chamber such as a lens barrel, the exhausted chamber 1 is connected to an exhaust pump 3 via an exhaust pipe 2, and an exhaust valve 4 is disposed in the exhaust pipe 2. Reference numeral 5 is a leak pipe connected to the exhaust pipe 2, and the leak pipe 5 is provided with a leak valve 6. 7 is a dust collecting electrode 7a, 7b ... 7 as shown in FIG.
e is a high-voltage dust collecting cylinder. Reference numeral 8 is a silica gel container provided on the atmosphere side of the high-voltage dust suction cylinder 7. Reference numeral 9 is an insulating member for electrically insulating and connecting the leak pipe 5 and the high-voltage dust suction cylinder 7, 10 is a protective container, 11 is a leak switch, 12 is a high-voltage power supply, and 13 is a high-voltage introduction terminal. .

この様な構成において、被排気室1内に大気を導入する
場合は、排気バルブ4を閉状態にして、リークバルブ6
を開状態にする。リークバルブ6を開状態にすると、こ
の操作に連動してリークスイッチ11がON状態にな
り、高電圧吸塵筒7には高電圧電源12より例えば20
KVが印加される。ここで、大気はリーク管5を介して
被排気室1内に導入されるが、この大気中の水分や塵は
まずシリカゲル容器8で大部分が吸着され、次にここを
通過した極く僅かの水分や塵が高電圧吸塵筒7の各吸塵
電極間を通過する際に吸着される。又、この様な装置で
はシリカゲル容器8内のシリカゲルが大気導入の際に壊
れた場合でも、水分や塵を含んだ粉末状のシリカゲルは
前述した高電圧吸塵筒7の各吸塵電極間を通過する際に
吸着されるため被排気室1内を汚染することはなく、従
って、被排気室1内の構造物に付着することは無い。
又、この様に構成された装置では、従来のように細かい
メッシュ状のフィルターを使用していないため、フィル
ターをクリーニングするなどの作業を行う必要はない。
With such a configuration, when introducing air into the exhaust chamber 1, the exhaust valve 4 is closed and the leak valve 6 is closed.
To open. When the leak valve 6 is opened, the leak switch 11 is turned on in conjunction with this operation, and the high-voltage dust collecting cylinder 7 receives, for example, 20
KV is applied. Here, the atmosphere is introduced into the exhausted chamber 1 through the leak pipe 5, but most of the moisture and dust in the atmosphere are first adsorbed by the silica gel container 8 and then only a very small amount of water and dust passing therethrough. Of water and dust are adsorbed when passing between the dust-collecting electrodes of the high-voltage dust-collecting cylinder 7. Further, in such an apparatus, even if the silica gel in the silica gel container 8 is broken when introduced into the atmosphere, the powdery silica gel containing water and dust passes between the dust collecting electrodes of the high voltage dust collecting cylinder 7 described above. Since it is adsorbed at that time, it does not pollute the interior of the exhaust chamber 1, and therefore does not adhere to the structure inside the exhaust chamber 1.
Further, in the apparatus configured as described above, since a fine mesh filter is not used as in the prior art, it is not necessary to perform work such as cleaning the filter.

[考案の効果] 本考案によれば、高電圧吸塵手段が、ジグザグ状の大気
導入経路が形成されるように交互に位置を異にして配置
された複数の吸塵電極を備えているので、吸塵電極の面
積を広くとれ、例え水分や塵を含んだ比較的大きな粉末
状のシリカゲルが大気導入側の初段の吸塵電極に吸着さ
れなくてもその後段の吸塵電極に吸着され、前記シリカ
ゲルの被排気室への流入を確実に防止することができ、
被排気室内の汚染を防止することができる。
[Advantage of the Invention] According to the present invention, since the high-voltage dust collecting means is provided with the plurality of dust collecting electrodes which are alternately arranged at different positions so as to form the zigzag-shaped air introduction path, Even if the relatively large powdery silica gel containing water and dust is not adsorbed by the first-stage dust collection electrode on the air introduction side, it is adsorbed by the second-stage dust collection electrode, and the silica gel is evacuated. It is possible to reliably prevent inflow to the room,
It is possible to prevent pollution in the exhaust chamber.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案の一実施例の概略構成図、第2図は高電
圧吸塵筒を説明するための図である。 1:被排気室、2:排気管、3:排気ポンプ、4:排気
バルブ、5:リーク管、6:リークバルブ、7:高電圧
吸塵筒、8:シリカゲル容器、9:絶縁部材、10:保
護容器、11:リークスイッチ、12:高電圧電源、1
3:高圧導入端子。
FIG. 1 is a schematic configuration diagram of an embodiment of the present invention, and FIG. 2 is a diagram for explaining a high voltage dust collecting cylinder. 1: Exhaust chamber, 2: Exhaust pipe, 3: Exhaust pump, 4: Exhaust valve, 5: Leak pipe, 6: Leak valve, 7: High-voltage dust suction tube, 8: Silica gel container, 9: Insulation member, 10: Protective container, 11: Leak switch, 12: High voltage power supply, 1
3: High voltage introduction terminal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】被排気室と、該被排気室を真空に排気する
ための排気ポンプと、前記被排気室の大気導入経路に設
けられたシリカゲル容器とを備えた電子顕微鏡におい
て、前記シリカゲル容器より被排気室側の前記大気導入
経路に高電圧吸塵手段を備えて成り、該高電圧吸塵手段
はジグザグ状の大気導入経路が形成されるように交互に
位置を異にして配置された複数の吸塵電極を備える電子
顕微鏡。
1. An electron microscope comprising: an evacuated chamber; an exhaust pump for evacuating the evacuated chamber to a vacuum; and a silica gel container provided in an air introduction path of the evacuated chamber. The atmosphere introduction path closer to the exhausted chamber is provided with a high-voltage dust suction means, and the high-voltage dust suction means are alternately arranged at different positions so that a zigzag atmosphere introduction path is formed. An electron microscope equipped with a dust collection electrode.
JP1987185126U 1987-12-04 1987-12-04 electronic microscope Expired - Lifetime JPH0610610Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987185126U JPH0610610Y2 (en) 1987-12-04 1987-12-04 electronic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987185126U JPH0610610Y2 (en) 1987-12-04 1987-12-04 electronic microscope

Publications (2)

Publication Number Publication Date
JPH0189452U JPH0189452U (en) 1989-06-13
JPH0610610Y2 true JPH0610610Y2 (en) 1994-03-16

Family

ID=31476454

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987185126U Expired - Lifetime JPH0610610Y2 (en) 1987-12-04 1987-12-04 electronic microscope

Country Status (1)

Country Link
JP (1) JPH0610610Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853829A (en) * 1981-09-26 1983-03-30 Fujitsu Ltd Electron beam exposing device
JPS611485A (en) * 1984-06-13 1986-01-07 Mitsubishi Electric Corp Electron beam welding device

Also Published As

Publication number Publication date
JPH0189452U (en) 1989-06-13

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