JPH0596461A - Cutting method by multiwire saw - Google Patents

Cutting method by multiwire saw

Info

Publication number
JPH0596461A
JPH0596461A JP28352091A JP28352091A JPH0596461A JP H0596461 A JPH0596461 A JP H0596461A JP 28352091 A JP28352091 A JP 28352091A JP 28352091 A JP28352091 A JP 28352091A JP H0596461 A JPH0596461 A JP H0596461A
Authority
JP
Japan
Prior art keywords
work
dummy member
wire
cutting
cut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28352091A
Other languages
Japanese (ja)
Other versions
JP2765307B2 (en
Inventor
Masayasu Kojima
正康 小嶋
Takashi Kuboki
孝 久保木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP3283520A priority Critical patent/JP2765307B2/en
Publication of JPH0596461A publication Critical patent/JPH0596461A/en
Application granted granted Critical
Publication of JP2765307B2 publication Critical patent/JP2765307B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/04Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
    • B28D5/045Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools by cutting with wires or closed-loop blades

Abstract

PURPOSE:To provide a means for simplifying a workpiece set and facilitating a wafer taken out in a multiwire saw. CONSTITUTION:A dummy member 20 of L-shaped section is fixed onto a base 9 mounted to a workpiece press-up base 10 of a multiwire saw of one-way running type. A work piece is loaded, so that its side surface part 6-4 is brought into contact with a side plate part 20-2, on a bottom plate part 20-1 of this L-shaped dummy member 20. At the time of cutting by a wire of running in a direction of one way, while grinding resistance acting on the workpiece is supported by the side plate part 20-2 of the dummy member, the workpiece is cut into the dummy member bottom plate part. After cutting, a wafer placed on the dummy member is taken out. In this way, setting of the workpiece to the multiwire saw is simplified. Taking out the wafer is facilitated. A rate of operation of the multiwire saw is increased. The wafer of high quality with no saw mark is obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、半導体材料、磁性材
料、セラミックス等の脆性材料をワイヤにより薄厚の多
数のウエハに同時切断するマルチワイヤソーに係り、被
切断物(以下ワークと称する)の切断終了後にウエハを
簡易迅速に能率よく取り出せるようにするための切断方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multi-wire saw for simultaneously cutting brittle materials such as semiconductor materials, magnetic materials and ceramics into a large number of thin wafers by wires, and cutting an object to be cut (hereinafter referred to as a work). The present invention relates to a cutting method for easily, quickly and efficiently taking out a wafer after completion.

【0002】[0002]

【従来の技術】例えば、半導体材料のシリコンインゴッ
トをウエハ状に切断するのに用いられるマルチワイヤソ
ーは、所定ピッチで多条掛けされたワイヤ列にワークを
押しつけ、砥粒を含む研削液(砥液と称する)を注いで
砥粒をワイヤ列とワークの間に介在させ、ワイヤとワー
クを相対運動させ研削作用によって切断する装置であ
る。ワイヤソーをワイヤの走行方式で分類すれば、一方
向式と往復式があり、前者は基本的には切断完了までワ
イヤを一方向に走行させる方式であり、後者はワイヤを
ワークに対して往復走行させる方式である。この発明は
前者に適用されるが、後者の片道のみで切断する場合に
は後者にも適用できる。
2. Description of the Related Art For example, a multi-wire saw used to cut a silicon ingot of a semiconductor material into a wafer shape presses a work against a row of wires which are multi-threaded at a predetermined pitch, and a grinding liquid containing abrasive grains (abrasive liquid). (Hereinafter referred to as ") and pouring abrasive grains between the wire row and the work to relatively move the wire and the work to cut by the grinding action. If the wire saw is classified by the wire traveling method, it can be classified into a one-way type and a reciprocating type.The former is basically a method of traveling the wire in one direction until the cutting is completed, and the latter is the method of traveling the wire back and forth with respect to the workpiece. It is a method to let. The present invention is applied to the former, but can also be applied to the latter when cutting only the one way of the latter.

【0003】図8は一般的なマルチワイヤソーの切断部
を例示したもので、回転自在に保持された3個の溝ロー
ラ1、2、3の外周に刻設された多数の溝に一本のワイ
ヤ4が巻き付けられて所定ピッチのワイヤ列5が形成さ
れ、ワーク6に砥液を注ぎながらワイヤ列5を走行させ
るとともにワーク押上台10を徐々に押上げながら切断
していく方式である。ここで、ワーク6は脆性材料製の
ダミー板8に、ダミー板8は金属製のベース9にそれぞ
れ接着されており、ベース9はワーク押上台10に締付
けねじ11にて着脱自在に装着されている。この種のワ
イヤソーの場合、ワーク6の押上は、ワイヤ列5がダミ
ー板8の部分に切り込むまで続けられる。図9はその状
態を示し、(A)はワーク全体の斜視図、(B)はワー
クの一部を拡大して示す側面図で、ワーク6はワーク両
端の余長部6−2を残して多数のウエハ6−1に切断さ
れている。この時、製品ウエハ6−1および余長部6−
2はダミー板8との接着部分が残っているので直立した
ままの状態にあり、ウエハとウエハの間には砥粒12が
充満している。
FIG. 8 exemplifies a cutting portion of a general multi-wire saw, in which a large number of grooves engraved on the outer periphery of three groove rollers 1, 2 and 3 which are rotatably held are provided. This is a method in which the wires 4 are wound to form the wire rows 5 of a predetermined pitch, the wire rows 5 are made to travel while pouring the abrasive liquid onto the work 6, and the work lifting table 10 is gradually pushed up and cut. Here, the work 6 is adhered to a dummy plate 8 made of a brittle material, and the dummy plate 8 is adhered to a metal base 9, and the base 9 is detachably attached to the work push-up base 10 with a tightening screw 11. There is. In the case of this type of wire saw, the pushing up of the work 6 is continued until the wire row 5 is cut into the dummy plate 8. FIG. 9 shows the state, (A) is a perspective view of the entire work, (B) is a side view showing a part of the work in an enlarged manner, and the work 6 is left with extra length portions 6-2 at both ends of the work. It is cut into a large number of wafers 6-1. At this time, the product wafer 6-1 and the extra length portion 6-
No. 2 remains in an upright state because the bonding portion with the dummy plate 8 remains, and the abrasive grains 12 are filled between the wafers.

【0004】上記マルチワイヤソーにて切断された製品
ウエハ6−1の取出しは、従来以下の方法で行われてい
る。第1の方法は、図9において、ワイヤ列5をワーク
6の両側で切断し、締付けねじ11を緩めてベース9を
押上台10から取外し、ワーク6内に残ったワイヤ一本
ずつ抜き取った後、端部の余長部6−2から順にダミー
板8の切込み溝底部で折り取っていく方法である。第2
の方法は、押上台10を停止したままワイヤ4を走行さ
せ、ワイヤ巻取リール(図示せず)にワイヤをすべて巻
取り、しかる後前記第1の方法と同様にして製品ウエハ
6−1を採取する方法である。第3の方法は、ワイヤ列
5を低速で走行させながら押上台10を降下させ、ワイ
ヤ列5をワーク6の上方に抜き取った後、前記第1の方
法と同様にして製品ウエハ6−1を採取する方法であ
る。第4の方法は、特開昭61−12576号公報に示
されるように、ワイヤ列5をダミー板8内に残したま
ま、ウエハ間に充満している砥粒12を洗浄除去し、端
部の余長部から順に吸着パッドで折取っていく方法であ
る。第5の方法は、特開昭61−182761号公報に
示されるように、ワーク6の両サイド側面を全長にわた
って把持し、締付けねじ11を緩め、ワイヤ列5を走行
させながら、別設の駆動装置によりベース9を徐々にス
ライドさせ、ダミー板8をワイヤ列5で横切り分断し、
全ウエハを一括して取出す方法である。
The product wafer 6-1 cut by the above multi-wire saw is conventionally taken out by the following method. The first method is to cut the wire row 5 on both sides of the work 6 in FIG. 9, loosen the tightening screws 11 to remove the base 9 from the push-up base 10, and pull out the wires remaining in the work 6 one by one. In this method, the excess length portion 6-2 at the end is sequentially cut off at the bottom of the cut groove of the dummy plate 8. Second
In this method, the wire 4 is run while the push-up table 10 is stopped, all the wire is wound on a wire winding reel (not shown), and then the product wafer 6-1 is processed in the same manner as the first method. It is a method of collecting. In the third method, the push-up table 10 is lowered while the wire row 5 is traveling at a low speed, the wire row 5 is pulled out above the work 6, and then the product wafer 6-1 is obtained in the same manner as in the first method. It is a method of collecting. In the fourth method, as shown in Japanese Patent Laid-Open No. 61-12576, the abrasive grains 12 filled between the wafers are washed and removed while leaving the wire rows 5 in the dummy plate 8, and the end portions are removed. It is a method of breaking off with an adsorption pad in order from the extra length of. In the fifth method, as shown in Japanese Patent Laid-Open No. 61-182761, the side surfaces of the work 6 are gripped over their entire lengths, the tightening screws 11 are loosened, and the wire row 5 is run, while separately driving. The base 9 is gradually slid by the device, the dummy plate 8 is cut across the wire row 5, and
This is a method of collectively taking out all the wafers.

【0005】[0005]

【発明が解決しようとする課題】しかし、前記第1〜第
5のウエハ取出方法には、以下に記載する問題点があっ
た。第1の方法は、1回の切断でワイヤを廃却する場合
には簡便であるが、ワイヤの損傷が少なくて再使用でき
る場合には大きな損失となる。また、ワイヤを再びワイ
ヤソーにセッティングするのに工数がかかる。第2の方
法は、ワイヤを再使用できるが、切断完了時点でのワイ
ヤの残り量が多い場合には巻取に時間がかかる。第3の
方法は、ワイヤ列がそのままワイヤソー内に残るので、
引き続いて別のワークの切断を行うことができ、ワイヤ
ソーを効率的に稼働させることができるという利点があ
るが、ワークを降下させる過程でウエハの表面にソーマ
ークが入るおそれがある。すなわち、ウエハの切断面が
平坦でない場合には、ワイヤ列が切断面をこすりながら
ワークを降下させることになり、ソーマークが発生する
のである。ソーマークの程度によっては、ウエハを不良
品として廃却せざるを得ないこともあり得る。第4の方
法は、ワークの材質が特に脆い場合には、ダミー板の切
込み溝底部で折れずにウエハ自体が折れる可能性があ
る。また、ウエハの取出しはワイヤソーを停機して行う
ため、ウエハの枚数が多い場合にはワイヤソーの停機時
間が長くなり稼働率が低下する。なお、前記第1〜第3
の方法においても、ワイヤソーから取出したダミー板の
部分から製品ウエハを折取っていく際に、第4の方法と
同様、ウエハの折損のおそれがあることはいうまでもな
い。第5の方法は、全ウエハを一括して取出すので効率
的ではあるが、横切り分断のための装置が複雑で製作費
がかさむ。
However, the first to fifth wafer extraction methods have the following problems. The first method is convenient when the wire is discarded by cutting once, but it causes a large loss when the wire is less damaged and can be reused. Further, it takes a lot of time to set the wire on the wire saw again. In the second method, the wire can be reused, but if the remaining amount of the wire at the time of completion of cutting is large, winding takes time. In the third method, the wire row remains in the wire saw, so
Although another work can be subsequently cut and the wire saw can be efficiently operated, a saw mark may be formed on the surface of the wafer in the process of lowering the work. That is, when the cut surface of the wafer is not flat, the wire array lowers the work while rubbing the cut surface, and a saw mark is generated. Depending on the degree of the saw mark, the wafer may have to be discarded as a defective product. In the fourth method, when the material of the work is particularly brittle, the wafer itself may be broken without being broken at the bottom of the cut groove of the dummy plate. Further, since the taking-out of the wafer is performed by stopping the wire saw, when the number of wafers is large, the stopping time of the wire saw becomes long and the operation rate decreases. The first to third
It goes without saying that in the method (3) as well, when the product wafer is broken from the portion of the dummy plate taken out from the wire saw, the wafer may be broken as in the case of the fourth method. The fifth method is efficient because all the wafers are taken out at one time, but the device for cross cutting is complicated and the manufacturing cost is high.

【0006】この発明は、マルチワイヤソーにおける切
断後の製品ウエハの取出しにかかわる前記の問題点を解
決するもので、簡易な手段で切断後の製品ウエハを能率
的に回収でき、しかも次の切断の準備が簡単で、ワイヤ
ソーの稼働率を大幅に向上できる切断方法を提案しよう
とするものである。
The present invention solves the above-mentioned problems relating to the taking out of the product wafer after cutting in a multi-wire saw, and the product wafer after cutting can be efficiently collected by a simple means, and the next cutting It aims to propose a cutting method that is easy to prepare and that can significantly improve the operating rate of the wire saw.

【0007】[0007]

【課題を解決するための手段】この発明は、ワイヤ走行
による研削加工が一方向に限定されたマルチワイヤソー
において、ワーク押上台に装着されたベースに底板部と
側板部とからなるL字形断面のダミー部材を固定し、該
L字形ダミー部材の上にワークを載置し、該ワークに作
用する研削抵抗をこのダミー部材の側板部で支持しつつ
切断を行い、ダミー部材底板部までワイヤにて切込み切
断した後、ウエハをダミー部材から取り出すことを特徴
とする切断方法を要旨とするものである。
According to the present invention, in a multi-wire saw in which grinding by wire running is limited to one direction, an L-shaped cross section consisting of a bottom plate and a side plate is attached to a base mounted on a work lifting table. A dummy member is fixed, a work is placed on the L-shaped dummy member, cutting is performed while supporting the grinding resistance acting on the work by the side plate portion of the dummy member, and the dummy member bottom plate portion is cut with a wire. A gist of the cutting method is that the wafer is taken out from the dummy member after cutting and cutting.

【0008】[0008]

【作用】この発明におけるL字形ダミー部材はベースに
接着等の方法で固定する。ワークはこのL字形ダミー部
材の上に該部材の底板部と側板部に当接するごとく載置
する。ワイヤは研削加工に際してワークに対して一方向
に走行するので、ワークに作用するワイヤ通線方向の研
削力はワイヤ走行方向のみであり、L字形ダミー部材の
側板部でこの研削力を受けとめることにより、該ダミー
部材の底板上のワークを接着することなしに静止安定さ
せることができる。また、ワイヤがワークをウエハ状に
切り進んだ段階においても、ウエハ間には砥粒が充満し
ているのでウエハが倒れることはない。切断が完了した
ウエハは、前記ダミー部材の底板上に乗っているだけで
あり、ウエハは数枚から数十枚の単位で簡単にワイヤソ
ーから取出すことができる。1回使用したダミー部材は
底板部の厚さ途中までワイヤにて切り込まれているが、
同一ワイヤピッチでの切断であれば、繰り返して使用す
ることができ、ダミー部材へのワークのセットも単に乗
せるだけであるから極めて能率的である。
The L-shaped dummy member of the present invention is fixed to the base by a method such as adhesion. The work is placed on the L-shaped dummy member so as to abut the bottom plate and the side plate of the member. Since the wire travels in one direction with respect to the work during grinding, the grinding force acting on the work in the wire passing direction is only in the wire travel direction, and the side plate of the L-shaped dummy member receives this grinding force. It is possible to stabilize the work on the bottom plate of the dummy member without adhering the work. Further, even when the wire cuts the work into a wafer shape, the abrasive grains are filled between the wafers so that the wafer does not fall. The cut wafer is simply placed on the bottom plate of the dummy member, and the wafer can be easily taken out from the wire saw in units of several to several tens. The dummy member used once is cut with a wire up to the middle of the thickness of the bottom plate,
If the cutting is performed at the same wire pitch, it can be repeatedly used, and the work set on the dummy member is simply placed, which is extremely efficient.

【0009】[0009]

【実施例1】図1はこの発明の一実施例を示すもので、
(A)はワーク切断部の正面図、(B)は同上側面図で
あり、20はL字形ダミー部材である。ここでは、ワイ
ヤ4が矢印イ方向(図Aの左方向)に走行して研削する
場合を示す。
Embodiment 1 FIG. 1 shows an embodiment of the present invention.
(A) is a front view of the work cutting part, (B) is a side view of the same, and 20 is an L-shaped dummy member. Here, a case is shown in which the wire 4 travels in the direction of arrow A (leftward in FIG. A) and grinds.

【0010】L字形ダミー部材20は、底板部20−1
と側板部20−2とからなり、ワイヤソーのワーク押上
台10に締付けねじ11で固定された鋼製のベース9上
に、例えば接着により固定されている。ワーク6は、例
えば単結晶シリコンインゴットのごとく一部に平坦面6
−3を有する円柱形状であり、セットに際しては安定性
の点から平坦面6−3を下にしてL字形ダミー部材20
の底板部20−1上に載置するとともに、ワーク6の一
方の側面6−4を側板部20−2に全長にわたって当接
させる。ワーク6の平坦面6−3の幅wが小さく安定し
ない場合や、平坦面が全くない円柱形状のワークの場合
には、例えばクサビ21を使用してワークが右方向に転
がるのを防止すればよい。この場合、クサビ21はダミ
ー部材に必ずしも接着する必要はない。L字形ダミー部
材20およびクサビ21の材質は、特に限定するもので
はないが、例えばガラスあるいはセラミックスのごと
く、砥粒による切断が容易な脆性材料で製作するのが好
ましい。砥液は、ワーク6およびダミー部材20、さら
にはクサビ21に対してワイヤ列5の入側となる位置に
配置されたスリットノズル22によって供給されるよう
になっている。
The L-shaped dummy member 20 includes a bottom plate portion 20-1.
And a side plate portion 20-2, and is fixed, for example, by adhesion, on a steel base 9 fixed to the work lifting table 10 of the wire saw with a tightening screw 11. The work 6 has a flat surface 6 on a part thereof, such as a single crystal silicon ingot.
-3 has a cylindrical shape, and when set, the L-shaped dummy member 20 with the flat surface 6-3 facing downward from the viewpoint of stability.
Is placed on the bottom plate portion 20-1 and the one side surface 6-4 of the work 6 is brought into contact with the side plate portion 20-2 over the entire length. When the width w of the flat surface 6-3 of the work 6 is small and unstable, or in the case of a cylindrical work having no flat surface, for example, a wedge 21 is used to prevent the work from rolling to the right. Good. In this case, the wedge 21 does not necessarily have to be bonded to the dummy member. The material of the L-shaped dummy member 20 and the wedge 21 is not particularly limited, but is preferably made of a brittle material such as glass or ceramics that can be easily cut by abrasive grains. The polishing liquid is supplied by a slit nozzle 22 which is arranged at a position on the entry side of the wire row 5 with respect to the work 6, the dummy member 20, and the wedge 21.

【0011】ワーク6の研削に際しては、矢印イ方向に
走行するワイヤ列5にスリットノズル22より砥液が供
給されながらワーク押上台10が徐々に上昇し、ワイヤ
列5がワーク6の頂上部に接触し始めた時点から切断が
行われていく。図2は切断途中の状態を示す。すなわ
ち、走行するワイヤ列5によって砥液23はワーク6の
切断部に持ち込まれ、切断部には矢印ロ方向に研削力が
作用するが、ワーク6はL字形ダミー部材20の側板部
20−2で支持されているので、研削力によりワーク6
が左方向に動くことはなく、静止した状態が保たれる。
また、ワーク6が平坦面6−1のない円柱形状であって
も、矢印ロ方向の研削力は極めて小さいので、ワークが
ダミー部材の上で転動することもない。
When grinding the work 6, the work pushing-up base 10 gradually rises while the abrasive liquid is supplied from the slit nozzle 22 to the wire train 5 traveling in the direction of arrow A, and the wire train 5 is brought to the top of the work 6. Cutting is performed from the time when the contact is started. FIG. 2 shows a state in the middle of cutting. That is, the abrasive wire 23 is brought into the cutting portion of the work 6 by the traveling wire row 5, and a grinding force acts on the cutting portion in the direction of arrow B, but the work 6 causes the side plate portion 20-2 of the L-shaped dummy member 20 to work. The workpiece 6 is supported by the grinding force.
Does not move to the left and remains stationary.
Further, even if the work 6 has a cylindrical shape without the flat surface 6-1, the work is not rolled on the dummy member because the grinding force in the arrow B direction is extremely small.

【0012】図2の状態からワーク押上台10がさらに
上昇していくと、ワーク6と同時にダミー部材の側板部
20−2も切断され、クサビ21も同時に切断される。
そして、ワイヤによる切り込みがL字形ダミー部材20
の底板部20−1に達してワーク6が完全に切断されワ
イヤ列5が底板部20−1まで切り込んだ時点でワーク
押上台10の上昇とワイヤの走行を停止する。図3はこ
の時点の状態を示すもので、(A)はワーク切断部の正
面図、(B)は図(A)のbーb線上の縦断側面図、
(C)は図(B)の一部拡大側面図である。すなわち、
ワイヤ列がL字形ダミー部材の底板部20−1まで切り
込まれると、ワーク6は多数の製品ウエハ6−1と両端
の余長部6−2に切断分離されている。このとき各切断
溝24には研削液と砥粒が詰まっており、その吸着力に
よって製品ウエハ6−1および余長部6−2は倒れずに
あたかも一体物のごとく直立したままの状態を保ってい
る。
When the work lifting platform 10 further rises from the state of FIG. 2, the side plate portion 20-2 of the dummy member is cut at the same time as the work 6, and the wedge 21 is cut at the same time.
Then, the L-shaped dummy member 20 is cut by the wire.
When the work 6 is completely cut to reach the bottom plate portion 20-1 and the wire row 5 is cut to the bottom plate portion 20-1, the lifting of the work lifting platform 10 and the traveling of the wire are stopped. FIG. 3 shows the state at this time, (A) is a front view of the work cutting portion, (B) is a vertical side view taken along line bb of FIG.
FIG. 6C is a partially enlarged side view of FIG. That is,
When the wire row is cut into the bottom plate portion 20-1 of the L-shaped dummy member, the work 6 is cut and separated into a large number of product wafers 6-1 and extra length portions 6-2 at both ends. At this time, each cutting groove 24 is filled with a grinding liquid and abrasive grains, and the suction force keeps the product wafer 6-1 and the extra length portion 6-2 from standing upright as if they were one piece without falling. ing.

【0013】このL字形ダミー部材20上の製品ウエハ
6−1および余長部6−2の取出しは、もとよりワーク
自体がL字形ダミー部材上に接着されていないため簡単
である。例えば、端部から数十枚ずつまとめて手作業で
取外す方法、あるいは図4に示すごとく二股状の治具2
5を用いて全ウエハを一括して持ち上げて取出す方法等
により簡単に取出すことができる。
The removal of the product wafer 6-1 and the extra length portion 6-2 on the L-shaped dummy member 20 is easy because the work itself is not bonded to the L-shaped dummy member. For example, a method of manually removing dozens of pieces from the end part by hand or a bifurcated jig 2 as shown in FIG.
5, all the wafers can be easily taken out by a method such as lifting and taking out all the wafers at once.

【0014】全ウエハをダミー部材から取外した後は、
ワーク押上台10を降下させてワイヤ列5をダミー部材
20から離脱させる。その後、前回と同様の切断を行う
場合は、新たなワークを使用済みのL字形ダミー部材2
0にセットすればよい。使用済みのL字形ダミー部材2
0には初回の切断で多数の切込み溝が形成されている
が、ワイヤ列5はその切込み溝に入り込むので全く支障
はなく、何回も繰り返して使用することができる。ま
た、初回の切断でクサビ21をダミー部材底板部20−
1に接着して使用した場合には、ワーク6の寸法が変わ
らなければそのまま使用することができる。なお、L字
形ダミー部材20の前記切込み溝は初回の切断で形成さ
れるが、同じ溝を事前に該ダミー部材に形成しておくこ
とも可能である。
After removing all the wafers from the dummy member,
The work lifting platform 10 is lowered to separate the wire row 5 from the dummy member 20. After that, when performing the same cutting as the previous time, a new work is used and the L-shaped dummy member 2
You can set it to 0. Used L-shaped dummy member 2
A large number of cut grooves are formed in 0 at the first cutting, but since the wire row 5 is inserted into the cut groove, there is no problem at all and it can be repeatedly used many times. Further, the wedge 21 is removed by the first cutting to remove the dummy member bottom plate portion 20-.
When used by adhering to No. 1, the work 6 can be used as it is as long as the dimensions of the work 6 are not changed. The cut groove of the L-shaped dummy member 20 is formed by the first cutting, but the same groove can be formed in the dummy member in advance.

【0015】L字形ダミー部材20は底板部20−1と
側板部20−2が一体物に限らず、例えば図5に示すよ
うに、底板部20−1と側板部20−2を分離し、それ
ぞれをベース9に接着してもよく、また一体構造とする
場合には図6に示すように底板部20−1と側板部20
−2を接着して組み立てて使用することもできる。ま
た、ワークの安定性をよくするために、図7に示すごと
く底板部20−1と側板部20−2とがなす角度θを9
0度より僅かに小さくしてもよい。すなわちこの場合
は、ワーク6が常に側板部20−2にもたれかかるので
ワーク6が安定し、クサビ21を省略することもでき
る。
In the L-shaped dummy member 20, the bottom plate portion 20-1 and the side plate portion 20-2 are not limited to a single body. For example, as shown in FIG. 5, the bottom plate portion 20-1 and the side plate portion 20-2 are separated, Each of them may be adhered to the base 9, and in the case of an integrated structure, as shown in FIG. 6, the bottom plate portion 20-1 and the side plate portion 20 are
It is also possible to bond and assemble -2 for use. Further, in order to improve the stability of the work, the angle θ formed by the bottom plate portion 20-1 and the side plate portion 20-2 is set to 9 as shown in FIG.
It may be slightly smaller than 0 degrees. That is, in this case, since the work 6 always leans on the side plate portion 20-2, the work 6 is stable, and the wedge 21 can be omitted.

【0016】なお、ここでは円形断面のワークを例にと
り説明したが、円形断面に限らず、他の任意断面形状の
ものにも適用できることはいうまでもない。
Although the work having a circular cross section has been described as an example here, it is needless to say that the present invention is not limited to the circular cross section and can be applied to other arbitrary cross sectional shapes.

【0017】[0017]

【実施例2】図1において、厚さT=20mm、幅W
=180mm、長さL=220mmの底板部20−
1と、厚さT=20mm、高さH=150mmの側
板部20−2を有するガラス製のL字形ダミー部材20
を接着したベース9をワーク押上台10にセットし、直
径200mm、長さ200mm、幅w約60mmの平坦
面6−3を有するシリコンインゴット(ワーク)を、該
ワークの側面6−4がダミー部材の側板部20−2に当
接するごとく底板部20−1上に載置した後、直径0.
18mmのワイヤを1.15mmピッチで張設したワイ
ヤ列5を一方向に毎分400mの速度で走行させなが
ら、グリーンカーボランダムの#600の砥粒を含有す
る研削液をワイヤ入側のワイヤ列5上に供給し、ワーク
押上台10を上昇させてワーク6を厚さ0.9mmのウ
エハ170枚に切断した。切断後、ウエハを30〜40
枚ずつダミー部材から取外したことにより、所要時間1
分で全ウエハをワイヤソーから取出すことができた。勿
論、得られたウエハはすべて切断面にソーマークのない
高品質のものであった。
Example 2 In FIG. 1, thickness T 1 = 20 mm, width W
1 = 180 mm, length L 1 = 220 mm bottom plate portion 20-
1 and a glass L-shaped dummy member 20 having a side plate portion 20-2 having a thickness T 2 = 20 mm and a height H 1 = 150 mm.
The base 9 to which is adhered is set on the work lifting table 10, and a silicon ingot (work) having a flat surface 6-3 having a diameter of 200 mm, a length of 200 mm, and a width w of about 60 mm is provided, and the side surface 6-4 of the work is a dummy member. After being placed on the bottom plate portion 20-1 so as to come into contact with the side plate portion 20-2, the diameter of 0.
While running a wire row 5 in which 18 mm wires are stretched at a pitch of 1.15 mm in one direction at a speed of 400 m / min, a grinding fluid containing green carborundum # 600 abrasive grains is fed into the wire row on the wire entry side. 5, the work push-up table 10 was raised, and the work 6 was cut into 170 wafers having a thickness of 0.9 mm. After cutting, the wafer is 30-40
1 time required by removing from the dummy member one by one
In minutes all wafers could be removed from the wire saw. Of course, all the obtained wafers were of high quality with no saw mark on the cut surface.

【0018】一方、比較のため、図8、図9に示す従来
の切断方法により上記と同じワークを切断した。すなわ
ち、セラミックス製のダミー板8をワーク6に接着し、
該ダミー板8を鋼製ベース9に接着し、上記と同じワイ
ヤソーにて同一切断条件で切断した。その際、ワークの
切断に続いてダミー板の途中まで切込んだ時点でワイヤ
の走行を停止し、しかる後、灯油にてウエハ間の砥粒を
洗浄除去し、端のワーク余長部から順に製品ウエハを吸
着パッドで1枚ずつ吸着して折り取った。このウエハ採
取に要した時間は60分であった。
On the other hand, for comparison, the same work as above was cut by the conventional cutting method shown in FIGS. That is, the ceramic dummy plate 8 is bonded to the work 6,
The dummy plate 8 was bonded to a steel base 9 and cut with the same wire saw as above under the same cutting conditions. At that time, following the cutting of the work, the wire travel is stopped at the time when the dummy plate is cut halfway, and then the abrasive grains between the wafers are removed by washing with kerosene, in order from the work surplus portion at the end. The product wafers were sucked by the suction pads one by one and then broken off. The time required to collect the wafer was 60 minutes.

【0019】[0019]

【実施例3】図1において、厚さT=20mm、幅W
=180mm、長さL=220mmの底板部と、厚
さT=20mm、高さH=50mmの側板部を有す
るガラス製のL字形ダミー部材を接着した鋼製ベースを
ワーク押上台にセットし、100mm角、長さ210m
mの石英インゴット(ワーク)2本をダミー部材の側板
部に当接するごとく並列に密着せしめて底板部上に載置
した後、直径0.18mmのワイヤを2.0mmピッチ
で張設したワイヤ列を一方向に毎分600mの速度で走
行させながら実施例2と同様にして該ワークを厚さ1.
7mmのウエハ206枚に切断し、切断後、そのウエハ
を30枚前後ずつ取出した。この全ウエハの取出しに要
した時間は実施例2と同様、僅か1.5分であった。勿
論、本実施例の場合も、得られた全ウエハは切断面に全
くソーマークのない高品質のものであった。
Third Embodiment In FIG. 1, thickness T 1 = 20 mm, width W
1 = 180 mm, and the bottom plate portion of the length L 1 = 220 mm, thickness T 2 = 20 mm, height H 1 = 50 mm steel base work pushing stand bonding the glass L-shaped dummy member having a side plate portion of the Set to 100 mm square, length 210 m
Wires in which two quartz ingots (workpieces) having a diameter of m are closely attached in parallel so as to be in contact with the side plates of the dummy member and placed on the bottom plate, and then wires having a diameter of 0.18 mm are stretched at a pitch of 2.0 mm. The thickness of the work is 1. in the same manner as in Example 2 while traveling in one direction at a speed of 600 m / min.
The wafer was cut into 206 7 mm wafers, and after cutting, about 30 wafers each were taken out. The time required to take out all the wafers was only 1.5 minutes as in Example 2. Of course, also in the case of this example, all the obtained wafers were of high quality with no saw marks on the cut surface.

【0020】一方、比較のため、同じワークを図8、図
9に示す従来の方法で切断した。その際、ワークの切断
に続いてダミー板の途中まで切込んだ時点でワークの押
上を停止し、ワイヤ列の走行速度を毎分100mに低下
し、押上台を降下させてワイヤ列をワークから抜取り、
鋼製ベースを押上台から取出し、ウエハを端部から順に
折り取った。この方法は、全ウエハの取出しに2時間要
し非能率的であるばかりでなく、押上台を降下させる過
程でウエハの切断面にソーマークが確認されたものがあ
り、ソーマークが著しいものは廃却せざるを得なかっ
た。
On the other hand, for comparison, the same work was cut by the conventional method shown in FIGS. At that time, following the cutting of the work, the pushing of the work is stopped at the time when the dummy plate is cut halfway, and the traveling speed of the wire row is reduced to 100 m / min. Sampling
The steel base was taken out from the push-up base, and the wafer was folded in order from the end. Not only is this method inefficient because it takes two hours to take out all the wafers, but some saw marks are found on the cut surface of the wafer during the process of lowering the push-up base, and those with significant saw marks are discarded. I had to do it.

【0021】[0021]

【発明の効果】以上説明したごとく、この発明方法によ
れば、ワークをダミー部材の上に載置するだけで切断を
行うことができるので、マルチワイヤソーへのワークの
セッティングおよびワーク切断後のウエハの取出しを極
めて能率的に行うことができるとともに、ソーマーク皆
無の高品質のウエハを得ることができる。また、同じダ
ミー部材でワークの切断を繰返すことも可能であるた
め、ウエハ取出し時間の短縮効果と合わせてマルチワイ
ヤソーの稼働率を著しく向上させることができる。ま
た、この発明のダミー部材は構造が簡単であるから、コ
スト的に高くつくことがない上、既存のマルチワイヤソ
ーに容易に適用できる利点がある等、ウエハの製造に多
大な効果をもたらすものである。
As described above, according to the method of the present invention, the work can be cut simply by placing it on the dummy member. Therefore, the work is set on the multi-wire saw and the wafer after the work is cut. Can be taken out very efficiently, and a high quality wafer without saw marks can be obtained. Further, since it is possible to repeat cutting of the work with the same dummy member, it is possible to remarkably improve the operation rate of the multi-wire saw together with the effect of shortening the wafer take-out time. Further, since the dummy member of the present invention has a simple structure, it is not expensive in cost, and has an advantage that it can be easily applied to the existing multi-wire saw. is there.

【図面の簡単な説明】[Brief description of drawings]

【図1A】この発明の一実施例を示す図で、ワーク切断
部の正面図である。
FIG. 1A is a view showing an embodiment of the present invention and is a front view of a work cutting unit.

【図1B】図1Aの側面図である。FIG. 1B is a side view of FIG. 1A.

【図2】同上実施例におけるワーク切断途中の状態を示
す正面図である。
FIG. 2 is a front view showing a state in which the work is being cut in the above embodiment.

【図3A】同上実施例における切断完了時の状態を示す
図で、ワーク切断部の正面図である。
FIG. 3A is a view showing a state at the time of completion of cutting in the embodiment, which is a front view of a work cutting unit.

【図3B】図2Aのb−b線上の縦断側面図である。FIG. 3B is a vertical sectional side view taken along the line bb of FIG. 2A.

【図3C】図3Bの一部拡大側面図である。FIG. 3C is a partially enlarged side view of FIG. 3B.

【図4】同上実施例における切断後のワーク取出し手段
の一例を示す斜視図である。
FIG. 4 is a perspective view showing an example of a work taking-out means after cutting in the embodiment.

【図5】同上実施例におけるダミー部材の他の例を示す
正面図である。
FIG. 5 is a front view showing another example of the dummy member in the same embodiment.

【図6】同上実施例におけるダミー部材の他の例を示す
斜視図である。
FIG. 6 is a perspective view showing another example of the dummy member in the same embodiment.

【図7】同上実施例におけるダミー部材の他の例を示す
斜視図である。
FIG. 7 is a perspective view showing another example of the dummy member in the same embodiment.

【図8】一般的なマルチワイヤソーの切断部を例示した
斜視図である。
FIG. 8 is a perspective view illustrating a cutting portion of a general multi-wire saw.

【図9A】同上マルチワイヤソーにおける切断完了時の
状態を示す拡大図で、ワーク全体の斜視図である。
FIG. 9A is an enlarged view showing a state at the time of completion of cutting in the above multi-wire saw, and a perspective view of the entire work.

【図9B】図9Aの一部を拡大して示す側面図である。9B is a side view showing an enlarged part of FIG. 9A. FIG.

【符号の説明】[Explanation of symbols]

1、2、3 溝ローラ 4 ワイヤ 5 ワイヤ列 6 ワーク 6−1 製品ウエハ 6−2 余長部 6−3 平坦面 6−4 側面 9 ベース 10 ワーク押上台 20 L字形ダミー部材 20−1 底板部 20−2 側板部 1, 2, 3 Groove Roller 4 Wire 5 Wire Row 6 Work 6-1 Product Wafer 6-2 Extra Length 6-3 Flat Surface 6-4 Side 9 Base 10 Work Pushing Platform 20 L-shaped Dummy Member 20-1 Bottom Plate 20-2 Side plate part

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 走行するワイヤと被切断物の間に砥粒を
含む加工液を供給し、当該ワイヤが形成する所定ピッチ
のワイヤ列に被切断物を押しつけながら研削作用によっ
て多数のウエハに切断するマルチワイヤソーにおいて、
被切断物押上台に装着されたベースに底板部と側板部と
からなるL字形断面のダミー部材を固定し、該L字形ダ
ミー部材の上に前記被切断物を載置し、該被切断物に作
用する研削抵抗をこのダミー部材の側板部で支持しつつ
切断を行い、ダミー部材底板部までワイヤにて切込み切
断した後、ウエハをダミー部材から取出すことを特徴と
するマルチワイヤソーによる切断方法。
1. A cutting fluid is supplied between a traveling wire and an object to be cut, and the object to be cut is ground into a number of wafers by a grinding action while pressing the object to be cut against a wire row of a predetermined pitch formed by the wire. In the multi-wire saw
A dummy member having an L-shaped cross section composed of a bottom plate portion and a side plate portion is fixed to a base mounted on a workpiece push-up base, and the workpiece is placed on the L-shaped dummy member. A method for cutting with a multi-wire saw, characterized in that cutting is performed while supporting a grinding resistance acting on the dummy member by a side plate portion of the dummy member, cutting is performed by cutting to a bottom plate portion of the dummy member with a wire, and then the wafer is taken out from the dummy member.
【請求項2】 底板部と側板部が分離した構造となした
L字形ダミー部材を用いることを特徴とする請求項1記
載のマルチワイヤソーによる切断方法。
2. The method for cutting with a multi-wire saw according to claim 1, wherein an L-shaped dummy member having a structure in which a bottom plate portion and a side plate portion are separated from each other is used.
【請求項3】 底板部と側板部とのなす角度が90度よ
り小さいL字形ダミー部材を用いることを特徴とする請
求項1記載のマルチワイヤソーによる切断方法。
3. The method for cutting with a multi-wire saw according to claim 1, wherein an L-shaped dummy member having an angle between the bottom plate portion and the side plate portion of less than 90 degrees is used.
JP3283520A 1991-10-03 1991-10-03 Cutting method with multi-wire saw Expired - Lifetime JP2765307B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3283520A JP2765307B2 (en) 1991-10-03 1991-10-03 Cutting method with multi-wire saw

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3283520A JP2765307B2 (en) 1991-10-03 1991-10-03 Cutting method with multi-wire saw

Publications (2)

Publication Number Publication Date
JPH0596461A true JPH0596461A (en) 1993-04-20
JP2765307B2 JP2765307B2 (en) 1998-06-11

Family

ID=17666603

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2765307B2 (en)

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US6381830B1 (en) 1998-09-01 2002-05-07 Sumitomo Special Metals Co., Ltd. Method for cutting rare earth alloy, method for manufacturing rare earth alloy plates and method for manufacturing rare earth alloy magnets using wire saw, and voice coil motor
US6408840B2 (en) 1999-12-14 2002-06-25 Sumitomo Special Metals Co., Ltd. Method and apparatus for cutting a rare earth alloy
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JPH0199561U (en) * 1987-12-22 1989-07-04

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JPH0199561U (en) * 1987-12-22 1989-07-04

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6381830B1 (en) 1998-09-01 2002-05-07 Sumitomo Special Metals Co., Ltd. Method for cutting rare earth alloy, method for manufacturing rare earth alloy plates and method for manufacturing rare earth alloy magnets using wire saw, and voice coil motor
US6505394B2 (en) 1998-09-01 2003-01-14 Sumitomo Special Metals Co., Ltd. Method for cutting rare earth alloy, method for manufacturing rare earth alloy plates and method for manufacturing rare earth alloy magnets using wire saw, and voice coil motor
US6408840B2 (en) 1999-12-14 2002-06-25 Sumitomo Special Metals Co., Ltd. Method and apparatus for cutting a rare earth alloy
WO2006061043A1 (en) * 2004-12-10 2006-06-15 Freiberger Compound Materials Gmbh Workpiece holder and method for wire sawing
JP2008522838A (en) * 2004-12-10 2008-07-03 フライベルガー・コンパウンド・マテリアルズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング Work holder and wire sawing method
US8061345B2 (en) 2004-12-10 2011-11-22 Freiberger Compound Materials Gmbh Method for wire sawing
JP4874262B2 (en) * 2004-12-10 2012-02-15 フライベルガー・コンパウンド・マテリアルズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング Wire sawing method
US9950379B2 (en) 2009-09-24 2018-04-24 Mitsubishi Electric Corporation Wire electric discharge machining apparatus
JP2011020261A (en) * 2010-10-28 2011-02-03 Freiberger Compound Materials Gmbh Wire saw and wire sawing method

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