JPH0589823A - Mass-spectrometer - Google Patents

Mass-spectrometer

Info

Publication number
JPH0589823A
JPH0589823A JP3250890A JP25089091A JPH0589823A JP H0589823 A JPH0589823 A JP H0589823A JP 3250890 A JP3250890 A JP 3250890A JP 25089091 A JP25089091 A JP 25089091A JP H0589823 A JPH0589823 A JP H0589823A
Authority
JP
Japan
Prior art keywords
sample
ion
specimen
mass
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3250890A
Other languages
Japanese (ja)
Inventor
Yumi Sakamoto
由美 坂本
Hirokatsu Yamaguchi
裕功 山口
Kinya Eguchi
欣也 江口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3250890A priority Critical patent/JPH0589823A/en
Publication of JPH0589823A publication Critical patent/JPH0589823A/en
Pending legal-status Critical Current

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To converge a laser beam onto a specimen and send ions generated thereby effectively to a mass-spectrometric part by installing one or two objective lenses inclined between the specimen and an electrode to accelerate or deflect the ions. CONSTITUTION:When mass-spectrometry is executed, a laser beam 7a emitted by a laser beam source 6a is reflected by a mirror 24c and converged onto a specimen by an objective lens 22a installed aslant. Laser beam 7b from another laser beam source 6b is converged on the central part of the specimen 2 by another lens 22b installed aslant, and an ion beam 21b excited is put incident to a mass-spectrometric part 1, reflected by an ion reflector 30, and cast onto an ion sensor 34. The ion flying time can be determined by measuring the time from irradiation with the laser beam 7 till the ion attaining the sensor 34. Thereby the mass of the ion can be analyzed. When the specimen is to be observed, the beam from a light source 8 for illuminating the specimen, is cast onto the specimen using an illumination lens 23, and the image of the specimen is observed using a TV camera 10.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体等の電子部品に
付着(汚染)する微量有機物の分析を行なう装置に係
り、特に、レーザを用いてイオン化を行なう質量分析計
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for analyzing a trace amount of organic substances adhering (contaminating) to electronic parts such as semiconductors, and more particularly to a mass spectrometer for ionizing using a laser.

【0002】[0002]

【従来の技術】従来の質量分析計は特開昭63−146
339号公報に記載のように、図4の系統図に示すよう
になっていた。1は質量分析部、2は試料、6はレーザ
光源、8は観察照明用光源、12は光導入手段、18は
真空室、22は集光レンズ、24は光反射ミラー、24
aはイオン通過孔、26は試料台、28はイオン引出電
極、30はイオンリフレクタ、34はイオン検出器、3
4aはイオン通過孔である。レーザ光源6から発生した
レーザ光は、集光レンズ22と光反射ミラー24によ
り、試料2上に集光される。このレーザ光で励起された
イオンは光反射ミラー24中央のイオン通過孔24aを
通り、質量分析部1で質量分析される。
2. Description of the Related Art A conventional mass spectrometer is disclosed in JP-A-63-146.
As described in Japanese Unexamined Patent Publication No. 339, it was as shown in the system diagram of FIG. 1 is a mass spectrometric unit, 2 is a sample, 6 is a laser light source, 8 is a light source for observation illumination, 12 is a light introducing means, 18 is a vacuum chamber, 22 is a condenser lens, 24 is a light reflecting mirror, 24
a is an ion passage hole, 26 is a sample stage, 28 is an ion extraction electrode, 30 is an ion reflector, 34 is an ion detector, 3
4a is an ion passage hole. The laser light generated from the laser light source 6 is condensed on the sample 2 by the condenser lens 22 and the light reflection mirror 24. The ions excited by the laser light pass through the ion passage hole 24a in the center of the light reflection mirror 24, and are mass analyzed by the mass analysis unit 1.

【0003】この従来装置では、集光レンズ22と試料
2との間に光反射ミラー24があるため、開口数の大き
なレンズを用いることが考慮されておらず、試料を顕微
鏡で観察することや試料上にレーザを小さく絞ることが
できないなどの欠点がある。
In this conventional apparatus, since the light reflecting mirror 24 is provided between the condenser lens 22 and the sample 2, it is not considered to use a lens having a large numerical aperture, and the sample can be observed with a microscope. There is a defect that the laser cannot be narrowed down on the sample.

【0004】[0004]

【発明が解決しようとする課題】従来装置では、試料と
集光レンズとの間に光反射ミラーがあるため開口数が小
さく焦点距離が長いレンズを用いる必要があり、開口数
が大きいレンズを用いることが実質的にできないため、
試料を顕微鏡で観察し、その箇所にレーザを小さく絞る
ことができない。
In the conventional apparatus, since there is a light reflecting mirror between the sample and the condenser lens, it is necessary to use a lens having a small numerical aperture and a long focal length, and a lens having a large numerical aperture is used. Is virtually impossible,
The sample cannot be observed under a microscope and the laser cannot be narrowed to that location.

【0005】また、従来装置では光反射ミラーに孔をあ
けてイオンを通過させており、試料から発生したイオン
を効率よく質量分析部に送ることが考慮されていない。
Further, in the conventional apparatus, the light reflecting mirror is perforated to allow the ions to pass therethrough, and it is not considered to efficiently send the ions generated from the sample to the mass spectrometric section.

【0006】さらに、上記従来装置では複数種のレーザ
光を試料に照射することが考慮されておらず、試料のイ
オン化を最適条件で行なうことができない。
Further, in the above-mentioned conventional apparatus, the irradiation of the sample with plural kinds of laser light is not taken into consideration, and the ionization of the sample cannot be performed under the optimum conditions.

【0007】本発明の目的は、開口数の大きなレンズを
用いて、試料上にレーザを小さく絞るようにすることに
ある。
It is an object of the present invention to use a lens having a large numerical aperture so that a laser can be narrowed down on a sample.

【0008】本発明の他の目的は、試料から発生したイ
オンを効率良く質量分析部に送ることにある。
Another object of the present invention is to efficiently send the ions generated from the sample to the mass spectrometer.

【0009】本発明のさらに他の目的は複数種のレーザ
光を試料に照射し、試料のイオン化を最適条件で行なう
ことにある。
Still another object of the present invention is to irradiate a sample with a plurality of types of laser light to ionize the sample under optimum conditions.

【0010】[0010]

【課題を解決するための手段】上記目的を達成するため
に、本発明はイオンを加速または偏向する複数の電極と
の間に対物レンズを傾斜して設置することにより、対物
レンズの作動距離を短くし、開口数を大きくする。また
他の目的を達成するために、イオンの通過する通路から
外して対物レンズを設置してイオンを効率良く質量分析
計に送るようにした。また、更に他の目的を達成するた
めに、対物レンズを二個以上設置し、二種類以上のレー
ザ光を試料に照射するようにした。
In order to achieve the above object, the present invention sets the working distance of the objective lens by tilting the objective lens between it and a plurality of electrodes for accelerating or deflecting the ions. Shorten and increase numerical aperture. In order to achieve other purposes, the objective lens is installed outside the passage through which the ions pass so that the ions can be efficiently sent to the mass spectrometer. Further, in order to achieve still another object, two or more objective lenses are installed and two or more kinds of laser beams are irradiated on the sample.

【0011】[0011]

【作用】図1で本発明の作用を説明する。1は質量分析
部、2は試料、6a,6bはレーザ光源、7a,7bは
レーザ光、8は試料照明用光源、9は試料照明光、10
はTVカメラ、13は切替ミラー、15はカメラレン
ズ、16は光反射ミラー、17aは光路、18は真空
室、19は真空容器、21bはイオンビーム、22a,
22bは対物レンズ、23は照明用レンズ、24cは光
反射ミラー、26は試料台、28a,28bはイオン引
出電極、30はイオンリフレクタ、34はイオン検出器
である。
The operation of the present invention will be described with reference to FIG. 1 is a mass spectrometer, 2 is a sample, 6a and 6b are laser light sources, 7a and 7b are laser lights, 8 is a sample illumination light source, 9 is sample illumination light, 10
Is a TV camera, 13 is a switching mirror, 15 is a camera lens, 16 is a light reflecting mirror, 17a is an optical path, 18 is a vacuum chamber, 19 is a vacuum container, 21b is an ion beam, 22a,
22b is an objective lens, 23 is an illuminating lens, 24c is a light reflecting mirror, 26 is a sample stage, 28a and 28b are ion extraction electrodes, 30 is an ion reflector, and 34 is an ion detector.

【0012】ここで、対物レンズ22a,22bで光を
焦点に絞る場合、光の波動性のため、正確な一点には集
光せず、ある拡がりを持つ微小面となる。この集光径は
レンズの開口数によって決まり、次の式で与えられる。
(集光径)=1.22×(波長)/2(開口数)従来装
置では対物レンズと試料との間に、光反射ミラーがあっ
たため、構造上対物レンズの焦点距離が長くなり、開口
数を大きくすることができず、上式から判るように、集
光径を小さくできなかった。しかし、本発明では対物レ
ンズ22a,22bと試料2との間には障害物がなく、
焦点距離が小さく開口数の大きな対物レンズを用いるこ
とができる。これにより、試料上にレーザ光を小さく絞
ることができる。
Here, when the light is focused by the objective lenses 22a and 22b, due to the wave nature of the light, the light is not focused at one exact point, and the surface becomes a minute surface having a certain spread. This condensing diameter is determined by the numerical aperture of the lens and is given by the following equation.
(Condensing diameter) = 1.22 × (wavelength) / 2 (numerical aperture) In the conventional device, since the light reflecting mirror is provided between the objective lens and the sample, the focal length of the objective lens becomes long due to the structure, and the aperture is increased. The number could not be increased, and as can be seen from the above equation, the focused diameter could not be reduced. However, in the present invention, there is no obstacle between the objective lenses 22a and 22b and the sample 2,
An objective lens having a small focal length and a large numerical aperture can be used. As a result, the laser light can be narrowed down on the sample.

【0013】また、対物レンズの上下につけた二対の電
極により、レーザ光で試料から脱離したイオン粒子を効
率良く飛行時間型質量分析計に導くことができる。さら
に、気体導入管を下部に取付けた円錐状のラッパ管によ
り、分子流を飛行時間型質量分析計の方向につくること
ができるので、効率良く高感度に質量分析ができる。
Further, the two pairs of electrodes provided above and below the objective lens can efficiently guide the ion particles desorbed from the sample by the laser light to the time-of-flight mass spectrometer. Further, since the conical trumpet tube with the gas introduction tube attached to the lower part can generate the molecular flow in the direction of the time-of-flight mass spectrometer, mass analysis can be performed efficiently and with high sensitivity.

【0014】[0014]

【実施例】【Example】

(実施例1)図1及び図2に本発明の一実施例の系統図
を示す。図2は試料へのレーザ照射部の拡大図である。
1は質量分析部、2は試料、6a,6bはレーザ光源、
7a,7bはレーザ光、8は試料照明用光源、9は試料
照明光、10はTVカメラ、13は切替ミラー、15は
カメラレンズ、16は光反射ミラー、17aは光路、1
8は真空室、19は真空容器、21bはイオンビーム、
22a,22bは対物レンズ、23は照明用レンズ、2
4cは光反射ミラー、26は試料台、28a,28bは
イオン引出電極、30はイオンリフレクタ、34はイオ
ン検出器である。
(Embodiment 1) FIGS. 1 and 2 show system diagrams of one embodiment of the present invention. FIG. 2 is an enlarged view of the laser irradiation part on the sample.
1 is a mass spectrometer, 2 is a sample, 6a and 6b are laser light sources,
7a and 7b are laser lights, 8 is a sample illumination light source, 9 is sample illumination light, 10 is a TV camera, 13 is a switching mirror, 15 is a camera lens, 16 is a light reflecting mirror, 17a is an optical path, 1
8 is a vacuum chamber, 19 is a vacuum container, 21b is an ion beam,
22a and 22b are objective lenses, 23 is an illumination lens, 2
4c is a light reflection mirror, 26 is a sample stage, 28a and 28b are ion extraction electrodes, 30 is an ion reflector, and 34 is an ion detector.

【0015】質量分析時にはレーザ光源6aからのレー
ザ光7aは光反射ミラー24cにより反射された後、対
物レンズ22aにより試料2上に集光される。また、レ
ーザ光源6bからのレーザ光7bは対物レンズ22bに
より中央部に集光される。これにより励起されたイオン
ビーム21bは質量分析部1に入射する。イオンビーム
21bはイオンリフレクタ30で反射されてイオン検出
器34に入射する。レーザ光7を照射してからイオンが
イオン検出器34に到達するまでの時間を測定すること
によって、イオンの飛行時間が判る。これにより、イオ
ンの質量が分析できる。
At the time of mass analysis, the laser light 7a from the laser light source 6a is reflected by the light reflecting mirror 24c and then focused on the sample 2 by the objective lens 22a. The laser light 7b from the laser light source 6b is focused on the central portion by the objective lens 22b. The ion beam 21b thus excited enters the mass spectrometric unit 1. The ion beam 21b is reflected by the ion reflector 30 and enters the ion detector 34. The flight time of the ions can be known by measuring the time from the irradiation of the laser beam 7 until the ions reach the ion detector 34. This allows the mass of the ions to be analyzed.

【0016】また、試料観察時には試料照明用光源8か
らの光を照明用レンズ23により試料上に入射させる。
これによる試料の像をTVカメラ10により観察する。
Further, at the time of observing the sample, light from the sample illuminating light source 8 is made incident on the sample by the illuminating lens 23.
The resulting image of the sample is observed by the TV camera 10.

【0017】本実施例では対物レンズ22aが傾斜して
いるため、従来の顕微鏡と同じような像は観察できな
い。しかし、焦点深度が30μmにあるので、30μm
×巾500μmの視野で測定箇所の観察は可能である。
対物レンズ22a,22bと試料2との間には、イオン
引出電極28b以外の障害物がなく、二個の対物レンズ
22a,22bは焦点距離が小さく開口数が大きなもの
を用いることができる。従って、対物レンズ22aによ
って試料2上にレーザ光7aを小さく絞って、試料2上
の測定位置にレーザ光を照射することができる。
In this embodiment, since the objective lens 22a is inclined, an image similar to that of a conventional microscope cannot be observed. However, since the depth of focus is at 30 μm,
× It is possible to observe the measurement location with a visual field of width 500 μm.
There is no obstacle other than the ion extracting electrode 28b between the objective lenses 22a and 22b and the sample 2, and two objective lenses 22a and 22b having a small focal length and a large numerical aperture can be used. Therefore, the laser light 7a can be narrowed down on the sample 2 by the objective lens 22a, and the laser light can be irradiated to the measurement position on the sample 2.

【0018】また、対物レンズ22a,22bの上下に
28aと28bの二枚のイオン引出電極を設け、この電
極間に電圧をかけることにより、レーザ光7で試料2か
ら脱離した物質を効率良く質量分析部1に送ることがで
きる。
Further, two ion extraction electrodes 28a and 28b are provided above and below the objective lenses 22a and 22b, and a voltage is applied between these electrodes to efficiently remove the substance desorbed from the sample 2 by the laser beam 7. It can be sent to the mass spectrometric unit 1.

【0019】また、二個以上の対物レンズ22a,22
bを設けることにより、複数種のレーザ光7a,7bを
試料に簡単に効率良く照射することができ、イオン化効
率を向上することができる。
Also, two or more objective lenses 22a, 22
By providing b, it is possible to easily and efficiently irradiate the sample with a plurality of types of laser beams 7a and 7b, and it is possible to improve the ionization efficiency.

【0020】(実施例2)図3に本発明の実施例2にお
ける試料へのレーザ照射部の拡大図を示す。実施例2で
は実施例1のイオン引出電極28の代わりに、気体導入
管43をもつ円錐状の試料導入管44を設けた。気体導
入管43からのガス流によりレーザ光7aで試料2から
脱離した物質を効率良く質量分析部1に送ることができ
る。レーザ光7bは対物レンズ22bにより中央部に集
光され、中性粒子をイオン化する。また、試料室の真空
度を1×10 ̄3Pa、検出器側の真空度を1×10 ̄
4Pa以上にして、差動排気によりレーザ光7aで試料
2から脱離した物質を質量分析部1に送ることができ
る。このような装置で、質量分析時にはYAGレーザか
らの355nmとエキシマレーザからの193nmのレ
ーザ光をそれぞれ図の7aと7bから入射して光反射ミ
ラー24c及び対物レンズ22a,22bにより試料2
に照射した。本装置でも実施例1と同じ効果が得られ
た。
(Embodiment 2) FIG. 3 shows an enlarged view of a laser irradiation portion for a sample in Embodiment 2 of the present invention. In the second embodiment, a conical sample introducing tube 44 having a gas introducing tube 43 is provided instead of the ion extracting electrode 28 of the first embodiment. The substance desorbed from the sample 2 by the laser beam 7a by the gas flow from the gas introduction tube 43 can be efficiently sent to the mass spectrometric unit 1. The laser light 7b is focused on the central portion by the objective lens 22b and ionizes the neutral particles. In addition, the degree of vacuum in the sample chamber is 1 × 10  ̄ 3 Pa, and the degree of vacuum on the detector side is 1 × 10  ̄
The material desorbed from the sample 2 by the laser light 7a can be sent to the mass spectrometric section 1 at 4 Pa or more by the differential pumping. In such an apparatus, at the time of mass analysis, laser light of 355 nm from a YAG laser and 193 nm from an excimer laser are respectively incident from 7a and 7b in FIG.
Was irradiated. The same effects as in Example 1 were obtained with this device.

【0021】実施例2では気体導入管43からのガス流
と差動排気による二つの試料2から脱離した物質の導入
方法を併用する。
In the second embodiment, the gas flow from the gas introduction pipe 43 and the method of introducing the substance desorbed from the two samples 2 by differential evacuation are used together.

【0022】[0022]

【発明の効果】本発明では対物レンズと試料との間に障
害物がなく、焦点距離が小さく開口数の大きな対物レン
ズを用いることができる。また、試料を顕微鏡で観察
し、レーザ光を測定箇所に小さく絞ることが可能であ
る。
According to the present invention, there is no obstacle between the objective lens and the sample, and the objective lens having a small focal length and a large numerical aperture can be used. Further, it is possible to observe the sample with a microscope and to narrow down the laser light to the measurement location.

【0023】また、対物レンズをイオンの通路から外し
て取付け、さらに分子粒子の流れ及び引出電極を設置す
ることで試料から脱離した物質を効率良く質量分析計に
送ることができ、極微小な箇所を高感度に測定でき、S
/Nのよいマススペクトルを得ることができる。
Further, by attaching the objective lens so as to be removed from the path of the ions and further installing the flow of molecular particles and the extraction electrode, the substance desorbed from the sample can be efficiently sent to the mass spectrometer, and it is very small. The location can be measured with high sensitivity and S
A mass spectrum with a good / N can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の系統図、FIG. 1 is a system diagram of an embodiment of the present invention,

【図2】図1の試料へのレーザ照射部の拡大図、FIG. 2 is an enlarged view of a laser irradiation part on the sample of FIG.

【図3】第二の実施例の試料へのレーザ照射部の拡大
図、
FIG. 3 is an enlarged view of a laser irradiation part for a sample of the second embodiment,

【図4】従来装置の系統図。FIG. 4 is a system diagram of a conventional device.

【符号の説明】[Explanation of symbols]

1…質量分析部、 2…試料、 8…試料照明用光源、 10…TVカメラ、 13…切替ミラー、 15…カメラレンズ、 16…光反射ミラー、 19a,19b…真空容器、 22…集光レンズ、 22a,22b…対物レンズ、 24…光反射ミラー。 DESCRIPTION OF SYMBOLS 1 ... Mass spectrometry part, 2 ... Sample, 8 ... Sample illumination light source, 10 ... TV camera, 13 ... Switching mirror, 15 ... Camera lens, 16 ... Light reflection mirror, 19a, 19b ... Vacuum container, 22 ... Condensing lens , 22a, 22b ... Objective lens, 24 ... Light reflection mirror.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】試料を励起するレーザ光源と、前記試料の
観察照明用光源と、前記各光源からの光を前記試料に導
く光反射ミラーと、前記試料が配置される試料台と、前
記試料から放出されたイオンを加速または偏向する複数
の電極とこれから飛び出したイオンの飛行時間を検出す
る検出器とを備えた質量分析計において、前後に二枚の
前記電極を配置した傾斜対物レンズを設置したことを特
徴とする質量分析計。
1. A laser light source for exciting a sample, a light source for observing and illuminating the sample, a light reflection mirror for guiding light from each of the light sources to the sample, a sample stage on which the sample is arranged, and the sample In a mass spectrometer equipped with a plurality of electrodes for accelerating or deflecting the ions emitted from the detector and a detector for detecting the flight time of ions ejected from the mass spectrometer, an inclined objective lens having two electrodes arranged before and after is installed. A mass spectrometer characterized in that
【請求項2】請求項1において、気体導入管を下部に取
付けた円錐状の試料導入ラッパ管を設置した質量分析
計。
2. The mass spectrometer according to claim 1, wherein a conical sample introducing trumpet tube having a gas introducing tube attached to the lower part is installed.
JP3250890A 1991-09-30 1991-09-30 Mass-spectrometer Pending JPH0589823A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3250890A JPH0589823A (en) 1991-09-30 1991-09-30 Mass-spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3250890A JPH0589823A (en) 1991-09-30 1991-09-30 Mass-spectrometer

Publications (1)

Publication Number Publication Date
JPH0589823A true JPH0589823A (en) 1993-04-09

Family

ID=17214547

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3250890A Pending JPH0589823A (en) 1991-09-30 1991-09-30 Mass-spectrometer

Country Status (1)

Country Link
JP (1) JPH0589823A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996022525A1 (en) * 1995-01-20 1996-07-25 Hitachi, Ltd. Instrument and method for analyzing sample
CN105957795A (en) * 2016-06-08 2016-09-21 浙江富春江环保科技研究有限公司 Apparatus for realizing beam combination and linear focusing of two laser beams
CN109712862A (en) * 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 Light path system suitable for Matrix-Assisted Laser Desorption Ionization Time of Flight instrument

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996022525A1 (en) * 1995-01-20 1996-07-25 Hitachi, Ltd. Instrument and method for analyzing sample
CN105957795A (en) * 2016-06-08 2016-09-21 浙江富春江环保科技研究有限公司 Apparatus for realizing beam combination and linear focusing of two laser beams
CN109712862A (en) * 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 Light path system suitable for Matrix-Assisted Laser Desorption Ionization Time of Flight instrument

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