JPH0588501B2 - - Google Patents

Info

Publication number
JPH0588501B2
JPH0588501B2 JP59170471A JP17047184A JPH0588501B2 JP H0588501 B2 JPH0588501 B2 JP H0588501B2 JP 59170471 A JP59170471 A JP 59170471A JP 17047184 A JP17047184 A JP 17047184A JP H0588501 B2 JPH0588501 B2 JP H0588501B2
Authority
JP
Japan
Prior art keywords
image
television
sample
electron beam
wobbler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59170471A
Other languages
Japanese (ja)
Other versions
JPS6149362A (en
Inventor
Sadao Nomura
Shigeto Isagozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17047184A priority Critical patent/JPS6149362A/en
Priority to US06/766,272 priority patent/US4680469A/en
Publication of JPS6149362A publication Critical patent/JPS6149362A/en
Publication of JPH0588501B2 publication Critical patent/JPH0588501B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はテレビジヨンで像を観察する透過形電
子顕微鏡の焦点合わせ装置および焦点合わせ方向
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a focusing device and a focusing direction for a transmission electron microscope for observing images on a television.

〔発明の背景〕[Background of the invention]

一般の透過形電子顕微鏡の焦点合わせ装置とし
ては、従来から、通称ワブラーという装置が使用
されている(特開昭53−15738<特公昭58−24899
>)。このワブラー装置は試料を照射する電子線
が試料に対する入射角を時間的に変化させる装置
であり、もし上記電子顕微鏡の焦点が合つていな
ければ結像面に拡大されている試料の像が揺れて
見える。したがつて観察者はワブラー装置を動作
させながら螢光板上の試料像の動きを観察し、そ
の動きが認められなくなるように、透過形電子顕
微鏡の対物レンズの電流を変化させて焦点合わせ
を行うものである。この装置による方法は簡便な
焦点合わせの方法として広く利用されているが、
焦点からずれる量が少なくなつてくると、像の動
きがいわば像のぼけのようになつて見えるため、
十分な精度で焦点合わせができないという問題点
があつた。
Conventionally, a device commonly called a wobbler has been used as a focusing device for general transmission electron microscopes.
>). This wobbler device is a device that changes the incident angle of the electron beam on the sample over time, and if the electron microscope is out of focus, the image of the sample magnified on the imaging plane will waver. It looks like that. Therefore, the observer observes the movement of the sample image on the fluorescent plate while operating the wobbler device, and adjusts the focus by changing the current in the objective lens of the transmission electron microscope so that the movement is no longer recognized. It is something. The method using this device is widely used as a simple focusing method, but
As the amount of deviation from focus decreases, the movement of the image appears to be blurred, so
There was a problem that focusing could not be done with sufficient precision.

〔発明の目的〕[Purpose of the invention]

本発明はテレビジヨン電子顕微鏡における電子
線の入射角の変化による像の変化を、明瞭に示
し、精度よく焦点合わせができる装置および方法
を得ることを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide an apparatus and method that clearly shows changes in an image due to changes in the incident angle of an electron beam in a television electron microscope and allows accurate focusing.

〔発明の概要〕[Summary of the invention]

上記の目的を達成するために本発明によるテレ
ビジヨン電子顕微鏡の焦点合わせ装置は、電子線
像を得るための試料と、該試料に入射する電子線
の入射角を交互に変化させるワブラーと、上記試
料を透過した電子線を結像させる電子レンズと、
上記結像を撮影するテレビジヨンカメラと、上記
撮影した結像をテレビジヨン画面に表示する表示
手段と、上記ワブラーと上記テレビジヨンカメラ
とに接続した同期信号発生器とを備えたテレビジ
ヨン電子顕微鏡の焦点合わせ装置において、上記
同期信号発生器はその発生信号により、上記テレ
ビジヨンカメラの垂直走査波形のブランキング期
間に上記ワブラーを動作させるとともに、上記テ
レビジヨンカメラの垂直信号周波数の整数分の1
の周波数で上記ワブラーを動作させることによ
り、電子線の入射角の変化による像の変化を明瞭
に示すことができるようにしたものである。
In order to achieve the above object, the focusing device for a television electron microscope according to the present invention includes a sample for obtaining an electron beam image, a wobbler that alternately changes the incident angle of the electron beam incident on the sample, and the above-mentioned wobbler. an electron lens that forms an image of the electron beam that has passed through the sample;
A television electron microscope comprising a television camera for photographing the image, display means for displaying the photographed image on a television screen, and a synchronization signal generator connected to the wobbler and the television camera. In the focusing device, the synchronizing signal generator operates the wobbler during the blanking period of the vertical scanning waveform of the television camera using the generated signal, and operates the wobbler at an integer fraction of the frequency of the vertical signal of the television camera.
By operating the wobbler at a frequency of , it is possible to clearly show changes in the image due to changes in the incident angle of the electron beam.

〔発明の実施例〕[Embodiments of the invention]

つぎに本発明の実施例を図面とともに説明す
る。第1図は本発明のテレビジヨン電子顕微鏡の
焦点合わせ装置における一実施例を示す構成図、
第2図はテレビジヨンカメラの垂直走査電流と電
子線偏向コイル電流の波形説明図である。第1図
において、電子顕微鏡鏡体1内の電子銃2から出
た電子線3はワブラー装置の偏向コイル4によつ
て偏向され、試料5に入る入射角を周期fで変化
させる。試料5を透過した電子線3は対物レンズ
6、中間レンズ7、投写レンズ8によつて、ガラ
ス板9上に設けた螢光面10に結像する。この像
は光学レンズ系11によつてテレビジヨンカメラ
(以下TVカメラという)12の撮像管フエース
プレートに結像され、電気信号に変換されてテレ
ビジヨンモニター13に表示される。この際、も
しこの透過形電子顕微鏡の焦点が合つていれば、
入射電子線3の試料への入射角度を変えても螢光
面10上の像は動くことがないが、焦点が合つて
いなければ像は上記の周期fで揺れる。本発明で
は同期信号発生器14から発生した同期信号によ
つてTVカメラ用のカメラ制御器15とワブラー
装置の偏向コイル電流発生器16とが制御される
ようになつている。すなわち、同期信号発生器1
4から周波数fとその整数倍の周波数Nfの同期
信号を発生し、これらの周期信号によつてそれぞ
れ偏向コイル電流とTVカメラの垂直走査電流を
制御する。その結果入射電子線の角度変更をTV
カメラのブランキング時間内に行うことができ
る。
Next, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a configuration diagram showing an embodiment of a focusing device for a television electron microscope according to the present invention;
FIG. 2 is an explanatory diagram of the waveforms of the vertical scanning current and electron beam deflection coil current of the television camera. In FIG. 1, an electron beam 3 emitted from an electron gun 2 in an electron microscope body 1 is deflected by a deflection coil 4 of a wobbler device, and the incident angle of incidence on a sample 5 is changed with a period f. The electron beam 3 transmitted through the sample 5 forms an image on a fluorescent surface 10 provided on a glass plate 9 by an objective lens 6, an intermediate lens 7, and a projection lens 8. This image is formed by an optical lens system 11 on the image pickup tube face plate of a television camera (hereinafter referred to as TV camera) 12, converted into an electrical signal, and displayed on a television monitor 13. At this time, if the transmission electron microscope is in focus,
Even if the angle of incidence of the incident electron beam 3 on the sample is changed, the image on the fluorescent surface 10 does not move, but if it is not focused, the image oscillates at the above-mentioned period f. In the present invention, a camera controller 15 for a TV camera and a deflection coil current generator 16 of a wobbler device are controlled by a synchronizing signal generated from a synchronizing signal generator 14. That is, the synchronization signal generator 1
4 generates synchronizing signals of frequency f and frequency Nf which is an integer multiple thereof, and these periodic signals control the deflection coil current and the vertical scanning current of the TV camera, respectively. As a result, the angle of the incident electron beam changes to TV
This can be done during camera blanking time.

第2図は本発明におけるTVカメラの垂直走査
電流波形と上記ワブラー装置用の偏向コイル電流
波形とを経過時間に対して描いた図である。第2
図に見るとおり、本発明の焦点合わせ装置では、
TVカメラの垂直走査電流波形のブランキング時
間中に上記ワブラー装置の偏向コイルの電流波形
を切換えている。そのためテレビジヨンモニター
13の像には、入射角を変える途中に像の流れに
よつて生じるぼけが全く見られず、透過形電子顕
微鏡の焦点不正合時にはテレビジヨンモニター1
3の像は完全な2重像になる。観察者は上記2重
像が1重像になるように、対物レンズ電流制御器
17を調整すればよい。ワブラー装置を動作させ
てもテレビジヨンモニター13の像が2重になら
ず1重に見えるときは、この透過形電子顕微鏡は
レンズ収差による微小項を除いて焦点が正合状態
にある。
FIG. 2 is a diagram depicting the vertical scanning current waveform of the TV camera and the deflection coil current waveform for the wobbler device according to the present invention with respect to elapsed time. Second
As shown in the figure, in the focusing device of the present invention,
The current waveform of the deflection coil of the wobbler device is switched during the blanking time of the vertical scanning current waveform of the TV camera. Therefore, the image on the television monitor 13 does not show any blur caused by the flow of the image while changing the incident angle, and when the transmission electron microscope is out of focus, the image on the television monitor 1
Image 3 becomes a complete double image. The observer only needs to adjust the objective lens current controller 17 so that the double image becomes a single image. When the image on the television monitor 13 does not become double even when the wobbler device is operated, but appears as a single image, the transmission electron microscope is in a correct focus state, excluding minute terms due to lens aberration.

なお、第1図に示す本実施例ではマイクロコン
ピユータ18に対物レンズ電流用微小電流値Δi
が前もつて記憶されている。これはとくに生物試
料などの低コントラストの試料に位相コントラス
トを重ね、コントラストを高めて観察したい場合
などに有用で、上記のようにワブラー装置によつ
て焦点合わせを行つたのち、マイクロコンピユー
タ18の指令により、焦点正合時の対物レンズ電
流i0から上記Δiを減算することによつて対物レン
ズ6を励磁し、適当なコントラストを示す像を得
ることができる。
In this embodiment shown in FIG. 1, the microcomputer 18 has a microcurrent value Δi for objective lens current.
is already remembered. This is particularly useful when you want to superimpose phase contrast on a low-contrast sample such as a biological sample to increase the contrast. By subtracting the above Δi from the objective lens current i 0 at the time of correct focus, the objective lens 6 can be excited and an image showing appropriate contrast can be obtained.

〔発明の効果〕〔Effect of the invention〕

上記のように本発明によるテレビジヨン電子顕
微鏡の焦点合わせ装置は、電子線像を得るための
試料と、該試料に入射する電子線の入射角を交互
に変化させるワブラーと、上記試料を透過した電
子線を結像させる電子レンズと、上記結像を撮影
するテレビジヨンカメラと、上記撮影した結像を
テレビジヨン画面に表示する表示手段と、上記ワ
ブラーと上記テレビジヨンカメラとに接続した同
期信号発生器とを備えたテレビジヨン電子顕微鏡
の焦点合わせ装置において、上記同期信号発生器
はその発生信号により、上記テレビジヨンカメラ
の垂直走査波形のブランキング期間に上記ワブラ
ーを動作させるとともに、上記テレビジヨンカメ
ラの垂直信号周波数の整数分の1の周波数で上記
ワブラーを動作させることにより、上記入射電子
線の入射角度変更をTVカメラのブランキング時
間内に行うため、焦点不正合時における入射電子
線偏向による像の変化をテレビジヨンモニター上
の2重像として明瞭に見ることができ、入射角変
更途中に像の流れによつて生じるぼけがないた
め、容易に高精度の焦点合わせを行うことが可能
である。
As described above, the focusing device for a television electron microscope according to the present invention includes a sample for obtaining an electron beam image, a wobbler that alternately changes the incident angle of the electron beam incident on the sample, and a wobbler that alternately changes the incident angle of the electron beam incident on the sample. an electron lens for forming an image of the electron beam; a television camera for photographing the image; display means for displaying the photographed image on a television screen; and a synchronization signal connected to the wobbler and the television camera. In the focusing device for a television electron microscope, the synchronizing signal generator operates the wobbler during the blanking period of the vertical scanning waveform of the television camera according to the generated signal, and By operating the wobbler at a frequency that is an integer fraction of the vertical signal frequency of the camera, the incident angle of the incident electron beam can be changed within the blanking time of the TV camera. Changes in the image caused by the change in angle of incidence can be clearly seen as a double image on the television monitor, and since there is no blurring caused by image flow while changing the incident angle, it is possible to easily perform high-precision focusing. It is.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のテレビジヨン電子顕微鏡の焦
点合わせ装置における一実施例を示す構成図、第
2図は上記実施例におけるテレビジヨンカメラの
垂直走査電流と電子線偏向コイル電流の波形説明
図である。 3……電子線、4……偏向コイル、5……試
料、6……対物レンズ、12……テレビジヨンカ
メラ、15……テレビジヨンカメラ制御器、16
……偏向コイル電流発生器、17……同期信号発
生器。
FIG. 1 is a configuration diagram showing an embodiment of a focusing device for a television electron microscope according to the present invention, and FIG. 2 is an explanatory diagram of waveforms of the vertical scanning current and electron beam deflection coil current of the television camera in the above embodiment. be. 3... Electron beam, 4... Deflection coil, 5... Sample, 6... Objective lens, 12... Television camera, 15... Television camera controller, 16
...Deflection coil current generator, 17...Synchronization signal generator.

Claims (1)

【特許請求の範囲】 1 電子線像を得るための試料と、該試料に入射
する電子線の入射角を交互に変化させるワブラー
と、上記試料を透過した電子線を結像させる電子
レンズと、上記結像を撮影するテレビジヨンカメ
ラと、上記撮影した結像をテレビジヨン画面に表
示する表示手段と、上記ワブラーと上記テレビジ
ヨンカメラとに接続した同期信号発生器とを備え
たテレビジヨン電子顕微鏡の焦点合わせ装置にお
いて、上記同期信号発生器はその発生信号によ
り、上記テレビジヨンカメラの垂直走査波形のブ
ランキング期間に上記ワブラーを動作させるとと
もに、上記テレビジヨンカメラの垂直信号周波数
の整数分の1の周波数で上記ワブラーを動作させ
ることを特徴とするテレビジヨン電子顕微鏡の焦
点合わせ装置。 2 電子線像を得るための試料と、該試料に入射
する電子線の入射角を交互に変化させる手段と、
上記試料を透過した電子線を結像させる電子レン
ズと、上記結像を撮影するテレビジヨンカメラと
を有するテレビジヨン電子顕微鏡の焦点合わせ方
法において、上記試料に入射する電子線の入射角
を、上記テレビジヨンカメラの垂直走査波形のブ
ランキング期間中に変化させながら、同一画中に
異なる入射角の像を交互に表示させる工程と、上
記像の状態を判断しながら対物レンズを調整する
工程とを、含むことを特徴とするテレビジヨン電
子顕微鏡の焦点合わせ方法。
[Scope of Claims] 1. A sample for obtaining an electron beam image, a wobbler that alternately changes the incident angle of the electron beam incident on the sample, and an electron lens that forms an image of the electron beam that has passed through the sample. A television electron microscope comprising a television camera for photographing the image, display means for displaying the photographed image on a television screen, and a synchronization signal generator connected to the wobbler and the television camera. In the focusing device, the synchronizing signal generator operates the wobbler during the blanking period of the vertical scanning waveform of the television camera using the generated signal, and operates the wobbler at an integer fraction of the vertical signal frequency of the television camera. A focusing device for a television electron microscope, characterized in that the wobbler is operated at a frequency of . 2. a sample for obtaining an electron beam image; a means for alternately changing the incident angle of the electron beam incident on the sample;
In a focusing method for a television electron microscope that has an electron lens that forms an image of the electron beam that has passed through the sample, and a television camera that takes the image, the incident angle of the electron beam that enters the sample is determined as described above. A step of alternately displaying images with different incident angles in the same image while changing the vertical scanning waveform of the television camera during the blanking period, and a step of adjusting the objective lens while determining the state of the image. A method for focusing a television electron microscope, comprising:
JP17047184A 1984-08-17 1984-08-17 Focusion device of television electron microscope Granted JPS6149362A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP17047184A JPS6149362A (en) 1984-08-17 1984-08-17 Focusion device of television electron microscope
US06/766,272 US4680469A (en) 1984-08-17 1985-08-16 Focusing device for a television electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17047184A JPS6149362A (en) 1984-08-17 1984-08-17 Focusion device of television electron microscope

Publications (2)

Publication Number Publication Date
JPS6149362A JPS6149362A (en) 1986-03-11
JPH0588501B2 true JPH0588501B2 (en) 1993-12-22

Family

ID=15905554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17047184A Granted JPS6149362A (en) 1984-08-17 1984-08-17 Focusion device of television electron microscope

Country Status (1)

Country Link
JP (1) JPS6149362A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63128107A (en) * 1986-11-18 1988-05-31 Kobe Steel Ltd Method for preventing leakage from lower part sealed valve for bell-less in blast furnace

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54139458A (en) * 1978-04-17 1979-10-29 Philips Nv Electron microscope

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54139458A (en) * 1978-04-17 1979-10-29 Philips Nv Electron microscope

Also Published As

Publication number Publication date
JPS6149362A (en) 1986-03-11

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