JPH058789B2 - - Google Patents
Info
- Publication number
- JPH058789B2 JPH058789B2 JP17708284A JP17708284A JPH058789B2 JP H058789 B2 JPH058789 B2 JP H058789B2 JP 17708284 A JP17708284 A JP 17708284A JP 17708284 A JP17708284 A JP 17708284A JP H058789 B2 JPH058789 B2 JP H058789B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- signal
- output
- amplifier
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005855 radiation Effects 0.000 claims description 43
- 230000002441 reversible effect Effects 0.000 claims description 17
- 238000005259 measurement Methods 0.000 description 41
- 238000006243 chemical reaction Methods 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17708284A JPS6154487A (ja) | 1984-08-25 | 1984-08-25 | 放射線測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17708284A JPS6154487A (ja) | 1984-08-25 | 1984-08-25 | 放射線測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6154487A JPS6154487A (ja) | 1986-03-18 |
JPH058789B2 true JPH058789B2 (de) | 1993-02-03 |
Family
ID=16024807
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17708284A Granted JPS6154487A (ja) | 1984-08-25 | 1984-08-25 | 放射線測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6154487A (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4509489B2 (ja) * | 2003-04-14 | 2010-07-21 | 株式会社東芝 | 安全保護用放射線測定監視装置 |
JP4814775B2 (ja) * | 2006-12-11 | 2011-11-16 | 日立アロカメディカル株式会社 | 放射線測定装置 |
US8767903B2 (en) * | 2011-01-07 | 2014-07-01 | Westinghouse Electric Company Llc | Wireless in-core neutron monitor |
US9411056B2 (en) * | 2013-01-31 | 2016-08-09 | General Electric Company | Wide dynamic range bidirectional integrating electrometer with low leakage solid-state reset and range change operating over an extended temperature range |
-
1984
- 1984-08-25 JP JP17708284A patent/JPS6154487A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6154487A (ja) | 1986-03-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |