JPH0585778A - Optical parts with antireflection film - Google Patents

Optical parts with antireflection film

Info

Publication number
JPH0585778A
JPH0585778A JP3249510A JP24951091A JPH0585778A JP H0585778 A JPH0585778 A JP H0585778A JP 3249510 A JP3249510 A JP 3249510A JP 24951091 A JP24951091 A JP 24951091A JP H0585778 A JPH0585778 A JP H0585778A
Authority
JP
Japan
Prior art keywords
layer
film
optical component
substrate
antireflection film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3249510A
Other languages
Japanese (ja)
Inventor
Setsuo Tokuhiro
節夫 徳弘
Tomohito Nakano
智史 中野
Tatsuo Ota
達男 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP3249510A priority Critical patent/JPH0585778A/en
Publication of JPH0585778A publication Critical patent/JPH0585778A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To unnecessitate a polishing process for removing the yellowed or scratched part of the surface of the substrate of each of optical parts before forming an antireflection film on the surface of the substrate. CONSTITUTION:When an antireflection film is formed on the surface of the substrate of each of optical parts, the 1st layer of the antireflection film closest to the surface of the substrate is made of an SiOx film and the thickness nd is regulated to nd >=0.25lambda0. (lambda0 is designed wavelength). Since the yellowed or scratched part of the surface of the substrate can be made inconspicuous when the surface of the substrate is seen through the SiO2 film, a polishing process for removing the yellowed or scratched part can be omitted.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、反射防止膜を有する光
学部品に関し、特に、光学部品基板表面上に形成する反
射防止膜構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical component having an antireflection film, and more particularly to an antireflection film structure formed on the surface of an optical component substrate.

【0002】[0002]

【従来の技術】一般に、光は屈折率の異なる境界面に入
射した時、その境界面両側の屈折率比に応じて入射した
光の一部は反射する。そして、前記境界面の屈折率の比
が大きい程その境界面で反射する光の光量は増大する。
例えば、光学部品として使用する光学ガラスは屈折率が
約1.5 〜1.8 の範囲であるので、空気等の媒質より光が
入射した場合、その入射光の4〜8%は反射することに
なる。
2. Description of the Related Art Generally, when light is incident on a boundary surface having a different refractive index, a part of the incident light is reflected according to the refractive index ratio on both sides of the boundary surface. Then, the larger the ratio of the refractive indices of the boundary surface, the larger the amount of light reflected by the boundary surface.
For example, since the optical glass used as an optical component has a refractive index in the range of about 1.5 to 1.8, when light enters from a medium such as air, 4 to 8% of the incident light is reflected.

【0003】この表面反射現象は、単に透過する光量が
減少するということのみならず、このような光学部品を
そのままカメラレンズ等に用いれば、ゴーストやフレア
ー等の大きな原因となり問題である。そこで、この表面
反射を低減するために、光学部品表面上に光の波長オー
ダーの薄い誘電体膜(光の波長をλとして0.25λの膜厚
が一般的)を反射防止膜として設けて、膜内での光の干
渉効果により反射光を低減させるということがよく行わ
れている。そして、高性能な反射防止膜構造として、2
種類以上の誘電体膜を数層積層して広い波長域で低反射
率を実現するものが数多く提案されている。
This surface reflection phenomenon is not only a problem that the amount of light that passes through is reduced, but if such an optical component is used as it is for a camera lens or the like, it becomes a major cause of ghost and flare, and is a problem. Therefore, in order to reduce this surface reflection, a thin dielectric film having a wavelength order of light (generally a film thickness of 0.25 λ where λ is the wavelength of light) is provided on the surface of the optical component as an anti-reflection film. It is often practiced to reduce reflected light due to the interference effect of light inside. And as a high-performance antireflection film structure, 2
Many proposals have been made to realize low reflectance in a wide wavelength range by laminating several layers of dielectric films of various types or more.

【0004】[0004]

【発明が解決しようとする課題】ところで、光学部品と
して用いる光学ガラスの表面には、製造過程等において
ヤケや傷等ができる。ヤケ現象には、光学ガラスが大気
中に放置された場合、ガラス表面への水滴の結露又は研
摩工程中における水との接触等により、ガラス中の塩基
性成分が溶出し薄い膜が形成される青ヤケ現象と、溶出
した成分が何らかの化学反応を起こして白い斑点状の粒
子として析出する白ヤケ現象とがある。そして、ガラス
の硝種によりヤケの発生程度は異なるが、SK系,La
系,SF系等のガラスはヤケが発生し易い。
By the way, the surface of the optical glass used as the optical component may be burnt or scratched during the manufacturing process. For the burnt phenomenon, when the optical glass is left in the atmosphere, dew condensation of water drops on the glass surface or contact with water during the polishing process elutes the basic component in the glass to form a thin film. There are a blue burn phenomenon and a white burn phenomenon in which the eluted components cause some chemical reaction to deposit as white spot-like particles. And, the degree of occurrence of burns differs depending on the glass type, but it is SK system, La
Burns are likely to occur in the glass of SF type and SF type.

【0005】また、ガラス表面上の傷の発生原因は、研
摩中、比較的大きな研摩剤の存在により引っ掻き傷が付
けられるものと思われ、この研摩工程中で生じた引っ掻
き傷が表面洗浄工程で拡大されるものと思われる。そし
て、特に、硬さの弱いガラスではこのような傷が多く発
生する。このようなヤケや傷の発生した光学ガラス表面
に、従来の積層構造の反射防止膜を設けた場合、ヤケや
傷等がより強調されて見えてしまい外観上問題となるこ
とが多い。このため、従来の反射防止膜を有する光学部
品では、反射防止膜を形成する前に光学部品基板表面の
ヤケや傷を除去する必要があり、比較的柔らかい研摩剤
を用いてヤケや傷を取り除くための研摩工程を必要とし
ていた。従って、従来の反射防止膜を有する光学部品の
製造においては、本来不必要な工程であるヤケや傷取り
用の研摩の工程が加わり、コストアップの原因となって
いる。
The cause of scratches on the glass surface is considered to be scratches caused by the presence of a relatively large abrasive during polishing, and the scratches generated during this polishing step are caused by the surface cleaning step. It is expected to be expanded. In particular, such a scratch is often generated in glass having low hardness. When an antireflection film having a conventional laminated structure is provided on the surface of the optical glass where such burns and scratches occur, the burns and scratches are more emphasized and visible, which often causes a problem in appearance. Therefore, in the conventional optical component having the antireflection film, it is necessary to remove the burns and scratches on the surface of the optical component substrate before forming the antireflection film, and the burns and scratches are removed using a relatively soft abrasive. A polishing process was required. Therefore, in the conventional production of an optical component having an antireflection film, a polishing process for removing burns and scratches, which is an essentially unnecessary process, is added, which causes a cost increase.

【0006】本発明は上記の事情に鑑みなされたもの
で、光学部品基板表面上のヤケや傷を除去するための研
摩工程を不要とする反射防止膜を有する光学部品を提供
することを目的とする。
The present invention has been made in view of the above circumstances, and an object thereof is to provide an optical component having an antireflection film which does not require a polishing step for removing a burn or a scratch on the surface of an optical component substrate. To do.

【0007】[0007]

【課題を解決するための手段】このため本発明は、光透
過性の光学部品基板の表面に、複数の誘電体膜を積層し
て反射防止膜を形成し、該反射防止膜の最も基板側に近
い第1層の組成を酸化ケイ素(SiOx ,x:1≦x≦
2)とし、その膜厚ndを、0.25λ0 ≦nd(λ0 は設
計波長)とした。
Therefore, according to the present invention, an antireflection film is formed by laminating a plurality of dielectric films on the surface of a light-transmitting optical component substrate, and the antireflection film is closest to the substrate. The composition of the first layer close to that of silicon oxide (SiO x , x: 1 ≦ x ≦
2), and the film thickness nd was set to 0.25λ 0 ≦ nd (λ 0 is a design wavelength).

【0008】また、前記反射防止膜は、誘電体膜を5層
に積層して形成し、前記光学部品基板側に近いものから
順次第1層,第2層,第3層,第4層及び第5層とした
時、第1層〜第5層の屈折率n1 〜n5 及び膜厚n1
1 〜n5 5 を、 0.25λ0 ≦n1 1 ≦0.50λ0 , 1.45≦n1 ≦1.47 0.03λ0 ≦n2 2 ≦0.07λ0 , 1.90≦n2 ≦2.20 0.03λ0 ≦n3 3 ≦0.15λ0 , 1.36≦n3 ≦1.65 0.45λ0 ≦n4 4 ≦0.54λ0 , 1.90≦n4 ≦2.20 0.24λ0 ≦n5 5 ≦0.26λ0 , 1.36≦n5 ≦1.40 の範囲内とした。
The antireflection film is formed by laminating five layers of dielectric films, and the first layer, the second layer, the third layer, the fourth layer and the layers closer to the optical component substrate side in this order. When the fifth layer is used, the refractive indices n 1 to n 5 and the film thickness n 1 d of the first to fifth layers are set.
1 to n 5 d 5 , 0.25λ 0 ≦ n 1 d 1 ≦ 0.50λ 0 , 1.45 ≦ n 1 ≦ 1.47 0.03λ 0 ≦ n 2 d 2 ≦ 0.07λ 0 , 1.90 ≦ n 2 ≦ 2.20 0.03λ 0 ≦ n 3 d 3 ≦ 0.15λ 0 , 1.36 ≦ n 3 ≦ 1.65 0.45λ 0 ≦ n 4 d 4 ≦ 0.54λ 0 , 1.90 ≦ n 4 ≦ 2.20 0.24λ 0 ≦ n 5 d 5 ≦ 0.26λ 0 , 1.36 ≦ n It was set within the range of 5 ≤ 1.40.

【0009】また、第2層及び第4層の誘電体膜の組成
を、酸化ジルコニウムと酸化チタンの混合物,酸化プラ
セオジウムと酸化チタンの混合物及び酸化タンタルのい
ずれか1つとし、第3層の誘電体膜の組成を、酸化ケイ
素,フッ化マグネシウム及び酸化アルミニウムのいずれ
か1つとし、第5層の誘電体膜の組成を、フッ化マグネ
シウムとした。
Further, the composition of the dielectric films of the second layer and the fourth layer is any one of a mixture of zirconium oxide and titanium oxide, a mixture of praseodymium oxide and titanium oxide, and tantalum oxide. The composition of the body film was any one of silicon oxide, magnesium fluoride and aluminum oxide, and the composition of the dielectric film of the fifth layer was magnesium fluoride.

【0010】[0010]

【作用】かかる構成によれば、複数の誘電体膜を積層し
て形成した反射防止膜の、光学基板側に最も近い第1層
の組成を酸化ケイ素(SiOx ,x:1≦x≦2)と
し、その膜厚ndを、0.25λ0 ≦nd(λ0 は設計波
長)とすることで、光学部品基板表面上にヤケや傷等が
存在しても、これらが目立たないくなる。
According to such a construction, the composition of the first layer closest to the optical substrate side of the antireflection film formed by laminating a plurality of dielectric films is silicon oxide (SiO x , x: 1 ≦ x ≦ 2). ), And the film thickness nd is set to 0.25λ 0 ≦ nd (λ 0 is a design wavelength), even if there are burns or scratches on the surface of the optical component substrate, these become inconspicuous.

【0011】また、反射防止膜を、5層の誘電体膜を積
層して形成し、光学部品基板側に近いものから順次第1
層,第2層,第3層,第4層及び第5層とした時、第1
層〜第5層の屈折率n1 〜n5 及び膜厚n1 1 〜n5
5 を、 0.25λ0 ≦n1 1 ≦0.50λ0 , 1.45≦n1 ≦1.47 0.03λ0 ≦n2 2 ≦0.07λ0 , 1.90≦n2 ≦2.20 0.03λ0 ≦n3 3 ≦0.15λ0 , 1.36≦n3 ≦1.65 0.45λ0 ≦n4 4 ≦0.54λ0 , 1.90≦n4 ≦2.20 0.24λ0 ≦n5 5 ≦0.26λ0 , 1.36≦n5 ≦1.40 の範囲内とすれば、可視光領域の光(波長が400nm 〜70
0nm)に対して、その反射率が1%以下に安定するという
優れた反射防止性能を有するようになる。
Further, the antireflection film is formed by laminating five layers of dielectric films, and the first one is arranged in order from the one closer to the optical component substrate side.
Layer 1, 2nd layer, 3rd layer, 4th layer and 5th layer
Refractive index of the layer-fifth layer n 1 ~n 5 and the thickness n 1 d 1 ~n 5
d 5 is 0.25λ 0 ≦ n 1 d 1 ≦ 0.50λ 0 , 1.45 ≦ n 1 ≦ 1.47 0.03λ 0 ≦ n 2 d 2 ≦ 0.07λ 0 , 1.90 ≦ n 2 ≦ 2.20 0.03λ 0 ≦ n 3 d 3 ≤0.15 λ 0 , 1.36 ≤ n 3 ≤ 1.65 0.45 λ 0 ≤ n 4 d 4 ≤ 0.54 λ 0 , 1.90 ≤ n 4 ≤ 2.20 0.24 λ 0 ≤ n 5 d 5 ≤ 0.26 λ 0 , 1.36 ≤ n 5 ≤ 1.40 Within the range, light in the visible light range (wavelengths between 400 nm and 70 nm
(0 nm), it has an excellent antireflection property that its reflectance is stable at 1% or less.

【0012】更に、第2層及び第4層の誘電体膜の組成
を、酸化ジルコニウムと酸化チタンの混合物,酸化プラ
セオジウムと酸化チタンの混合物及び酸化タンタルのい
ずれか1つとし、第3層の誘電体膜の組成を、酸化ケイ
素,フッ化マグネシウム及び酸化アルミニウムのいずれ
か1つとし、第5層の誘電体膜の組成を、フッ化マグネ
シウムとした場合には、より一層反射率を低減でき反射
防止性能を向上させることができるようになる。
Further, the composition of the dielectric films of the second layer and the fourth layer is any one of a mixture of zirconium oxide and titanium oxide, a mixture of praseodymium oxide and titanium oxide, and tantalum oxide. When the composition of the body film is any one of silicon oxide, magnesium fluoride and aluminum oxide and the composition of the dielectric film of the fifth layer is magnesium fluoride, the reflectance can be further reduced. The prevention performance can be improved.

【0013】[0013]

【実施例】以下、本発明の実施例について説明する。ま
ず、ヤケ,傷等がある光学部品基板表面に、酸化ケイ素
SiOx (1≦x≦2)の誘電体膜を設けた場合と従来
の誘電体膜との比較について示す。光学部品基板となる
ガラスとして、ヤケ,傷等の発生し易いSK15を選び、
直径30mm, 厚さ3mmの形状に加工し、ピッチ研摩を行っ
たものを基板試料とする。この基板試料を、アルコー
ル, エーテル等で洗浄後、室温下で相対湿度100 %の容
器に入れ5日間保存する。このようにして高湿保存を行
った後の基板試料表面を観察すると、白い斑点状の白ヤ
ケ及びピッチ研摩の時についた細かい傷が見られた。こ
の白ヤケや傷等の発生している基板試料表面に、酸化ケ
イ素SiOx (1≦x≦2),フッ化マグネシウムMg
x (1≦x≦2)及びOH−5((株)オプトロンの
製品名,酸化チタンと酸化ジルコニウムの混合物)の各
組成で適当な厚さの誘電体膜を形成してその表面を観察
した。その結果を表1に示す。
EXAMPLES Examples of the present invention will be described below. First, a comparison will be made between the case where a dielectric film of silicon oxide SiO x (1 ≦ x ≦ 2) is provided on the surface of an optical component substrate having a burn or a scratch, and a conventional dielectric film. As the glass for the optical component substrate, select SK15, which is prone to burns and scratches,
A substrate sample is processed into a shape with a diameter of 30 mm and a thickness of 3 mm and subjected to pitch polishing. After washing this substrate sample with alcohol, ether, etc., it is stored at room temperature in a container with a relative humidity of 100% for 5 days. When the surface of the substrate sample after the high humidity storage was observed in this manner, white spots were observed, and fine scratches were observed during pitch polishing. Silicon oxide SiO x (1 ≦ x ≦ 2), magnesium fluoride Mg was formed on the surface of the substrate sample where the whitening and scratches were generated.
F x (1 ≦ x ≦ 2 ) and OH-5 ((Ltd.) OPTRON product names, and titanium oxide mixtures zirconium oxide) observing a dielectric film formed by the surface of a suitable thickness for each composition did. The results are shown in Table 1.

【0014】尚、表1の各試料の表面状態の評価基準
は、全くヤケや傷等が観察されない状態をAランクと
し、誘電体膜を形成する前の表面状態(研摩,洗浄後、
室温且つ相対湿度100 %の環境下に5日間放置)をCラ
ンクとし、以下観察されるヤケ,傷等の程度によってA
〜Eの5段階とした。また、表中のλ0 は設計波長で、
λ 0 =510nm である。
The evaluation criteria of the surface condition of each sample in Table 1
Is A rank when no discoloration or scratches are observed.
Then, the surface condition before forming the dielectric film (after polishing and cleaning,
Left for 5 days at room temperature and 100% relative humidity)
A, depending on the degree of burns and scratches observed below.
It was set to 5 stages from E to E. Also, λ in the table0Is the design wavelength,
λ 0= 510 nm.

【0015】[0015]

【表1】 [Table 1]

【0016】表1から明らかなように、SiOx 膜で膜
厚が0.25λ0 以上のものは、膜形成前の表面状態よりも
良好となり、ヤケ,傷等の影響を目立たせなくする効果
があることがわかる。MgFx 膜については、膜厚に関
係なく膜形成前の表面状態と観察結果は変わらない。O
H−5膜では、膜厚が増えれば、逆にヤケ,傷等の外観
劣化が強調されて見える。
As is clear from Table 1, a SiO x film having a film thickness of 0.25λ 0 or more is better than the surface condition before film formation, and has the effect of making the effects of burns and scratches inconspicuous. I know there is. The observation result of the MgF x film is the same as the surface state before the film formation, regardless of the film thickness. O
On the other hand, in the H-5 film, as the film thickness increases, the appearance deterioration such as burns and scratches is emphasized.

【0017】従って、膜厚0.25λ0 以上のSiOx 膜を
光学部品基板表面上に設けることにより、光学部品基板
表面にできるヤケ,傷等の外観劣化を目立たせなくする
ことができ、ヤケ,傷等を除去する研摩工程を省略する
ことが可能となる。次に、本発明の反射防止膜による反
射防止効果について示す。光学部品基板として、BK
7,SK15,LaK8の3種類の光学ガラスを使用し、
それぞれ直径30mm, 厚さ3mmの形状に加工し、表面をピ
ッチ研摩を行い、アルコール, エーテル等で洗浄後、室
温下で相対湿度100 %の環境下に5日間放置する。その
後、この3つの基板試料表面に、それぞれ表2に示す実
施例1〜3の異なる反射防止膜を形成する。
Therefore, by providing the SiO x film having a film thickness of 0.25λ 0 or more on the surface of the optical component substrate, it is possible to make the appearance deterioration such as scoring and scratches on the optical component substrate surface inconspicuous. It is possible to omit the polishing step for removing scratches and the like. Next, the antireflection effect of the antireflection film of the present invention will be described. BK as an optical component board
Using three kinds of optical glass of 7, SK15, LaK8,
Each is processed into a shape with a diameter of 30 mm and a thickness of 3 mm, the surface is pitch-polished, washed with alcohol, ether, etc., and then left at room temperature in an environment of 100% relative humidity for 5 days. Thereafter, different antireflection films of Examples 1 to 3 shown in Table 2 are formed on the surfaces of the three substrate samples.

【0018】膜の形成方法としては、真空蒸着法を用
い、真空室内に試料基板をセットし、300 ℃まで加熱を
行い、真空度が1.0 ×10-5mbarになったところで蒸着を
開始した。そして、第1層,第2層及び第4層を蒸着す
る時には、反応ガスとして真空室内に真空度1.5 ×10-4
mbarまで酸素ガスを導入しながら蒸着を行った。また、
各層の膜厚は、光学式膜厚監視法に基づきモニターガラ
ス上の反射率を制御することにより調整した。
As a method for forming a film, a vacuum vapor deposition method was used, a sample substrate was set in a vacuum chamber, heated to 300 ° C., and vapor deposition was started when the degree of vacuum reached 1.0 × 10 −5 mbar. When the first layer, the second layer, and the fourth layer are deposited, a vacuum degree of 1.5 × 10 −4 is used as a reaction gas in the vacuum chamber.
Deposition was carried out while introducing oxygen gas to mbar. Also,
The film thickness of each layer was adjusted by controlling the reflectance on the monitor glass based on the optical film thickness monitoring method.

【0019】[0019]

【表2】 [Table 2]

【0020】尚、表2中の第1層〜第5層は、光学部品
基板側に最も近い層から順次、第1層、第2層,第3
層,第4層及び第5層とした。そして、こうして作成し
た実施例1〜3の光学部品を大気中に取り出し、その表
面の観察を行い、その表面状態の評価(表1の評価方法
と同じ)を行った。その結果を表3に示す。
The first layer to the fifth layer in Table 2 are the first layer, the second layer and the third layer in order from the layer closest to the optical component substrate side.
The layers were the fourth layer and the fifth layer. Then, the optical components of Examples 1 to 3 thus created were taken out into the atmosphere, the surface thereof was observed, and the surface condition was evaluated (same as the evaluation method in Table 1). The results are shown in Table 3.

【0021】[0021]

【表3】 [Table 3]

【0022】尚、表3中の比較例1,2は、実施例2,
3の第1層をSiOx からMgFx に置き換えたもので
ある。表3から明らかなように、第1層としてSiOx
膜を設けた各実施例1〜3が、共に膜蒸着前の表面状態
に比べて膜形成後の表面状態の評価が上がっているのに
対し、第1層としてMgFx 膜を設けた各比較例1,2
では表面状態の評価が同じか又は低下しており、第1層
としてSiOx 膜を設けることにより、基板表面のヤケ
や傷等を目立たせなくすることができる。
Comparative Examples 1 and 2 in Table 3 are the same as Example 2,
The first layer of No. 3 is obtained by replacing SiO x with MgF x . As is clear from Table 3, SiO x is used as the first layer.
In each of Examples 1 to 3 in which the film is provided, the evaluation of the surface state after the film formation is higher than that in the surface state before the film deposition, while each comparison in which the MgF x film is provided as the first layer Examples 1 and 2
The evaluation of the surface state is the same as or lower than that of the above. By providing the SiO x film as the first layer, it is possible to make the surface of the substrate inconspicuous such as burn and scratch.

【0023】また、図1〜3に前記各実施例1〜3の反
射率特性を示す。図1〜3から明らかなように、波長42
0nm 〜680nm の領域において、反射率Rが、R≦0.5 %
という性能を有し、反射率特性としても高性能なものと
なっている。尚、本実施例では、第2層,第4層を酸化
チタンと酸化ジルコニウムの混合物を使用し、第3層を
MgFx を使用したが、これに限らず、第2層と第4層
に、酸化プラセオジウムと酸化チタンの混合物又は酸化
タンタルを使用してもよく、第3層に酸化ケイ素又は酸
化アルミニウムを使用しても、同様な結果を得ることが
できた。
Further, FIGS. 1 to 3 show the reflectance characteristics of the first to third embodiments. As is clear from FIGS.
In the region of 0 nm to 680 nm, the reflectance R is R ≦ 0.5%
And has high performance as a reflectance characteristic. In the present embodiment, the second layer and the fourth layer were made of a mixture of titanium oxide and zirconium oxide, and the third layer was made of MgF x . However, the present invention is not limited to this, and the second layer and the fourth layer may be used. , A mixture of praseodymium oxide and titanium oxide or tantalum oxide may be used, and similar results could be obtained by using silicon oxide or aluminum oxide in the third layer.

【0024】[0024]

【発明の効果】以上説明したように本発明によれば、反
射防止膜の基板側に最も近い第1層として、設計波長λ
0 とした時に、膜厚0.25λ0 以上のSiOx 膜を設ける
ことにより、基板表面のヤケや傷等を目立たせなくでき
るので、反射防止膜形成前に行っていた余分なヤケや傷
等の除去用研摩工程を省くことができ、生産性を向上で
きると共に反射防止膜付光学部品の製造コストの低減を
図ることができる。
As described above, according to the present invention, the design wavelength λ is set as the first layer closest to the substrate side of the antireflection film.
When it is set to 0 , by providing an SiO x film having a film thickness of 0.25λ 0 or more, it is possible to make the burn-off and scratches on the substrate surface inconspicuous. The polishing step for removal can be omitted, the productivity can be improved, and the manufacturing cost of the optical component with the antireflection film can be reduced.

【0025】また、反射防止膜を5層の積層構造とし、
各層の組成,膜厚,屈折率を特定することにより、従来
より反射率特性の良好な高性能な反射防止膜を有する光
学部品を製造することができるようになる。
Further, the antireflection film has a laminated structure of 5 layers,
By specifying the composition, film thickness, and refractive index of each layer, it becomes possible to manufacture an optical component having a high-performance antireflection film having better reflectance characteristics than ever before.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の光学部品の表2に示す実施例1の反射
率特性を示す図
FIG. 1 is a diagram showing the reflectance characteristics of Example 1 shown in Table 2 of the optical component of the present invention.

【図2】同上表2に示す実施例2の反射率特性を示す図FIG. 2 is a diagram showing reflectance characteristics of Example 2 shown in Table 2 above.

【図3】同上表2に示す実施例3の反射率特性を示す図FIG. 3 is a diagram showing reflectance characteristics of Example 3 shown in Table 2 above.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】光透過性の光学部品基板の表面に、複数の
誘電体膜を積層して反射防止膜を形成し、該反射防止膜
の最も基板側に近い第1層の組成を、酸化ケイ素(Si
x ,x:1≦x≦2)とし、その膜厚ndを、0.25λ
0 ≦nd(λ 0 は設計波長)としたことを特徴とする反
射防止膜を有する光学部品。
1. A plurality of light-transmitting optical component substrates are provided on a surface thereof.
An antireflection film is formed by laminating dielectric films, and the antireflection film is formed.
The composition of the first layer closest to the substrate side is silicon oxide (Si
Ox, X: 1 ≦ x ≦ 2) and the film thickness nd is 0.25λ
0≦ nd (λ 0Is the design wavelength)
An optical component having an anti-reflection film.
【請求項2】前記反射防止膜は、誘電体膜を5層に積層
して形成し、前記光学部品基板側に近いものから順次第
1層,第2層,第3層,第4層及び第5層とした時、第
1層〜第5層の屈折率n1 〜n5 及び膜厚n11 〜n
5 5 を、 0.25λ0 ≦n1 1 ≦0.50λ0 , 1.45≦n1 ≦1.47 0.03λ0 ≦n2 2 ≦0.07λ0 , 1.90≦n2 ≦2.20 0.03λ0 ≦n3 3 ≦0.15λ0 , 1.36≦n3 ≦1.65 0.45λ0 ≦n4 4 ≦0.54λ0 , 1.90≦n4 ≦2.20 0.24λ0 ≦n5 5 ≦0.26λ0 , 1.36≦n5 ≦1.40 の範囲内としたことを特徴とする請求項1記載の反射防
止膜を有する光学部品。
2. The antireflection film is formed by laminating 5 layers of dielectric films, and the first layer, the second layer, the third layer, the fourth layer, and the like in order from the side closer to the optical component substrate. When the fifth layer is used, the refractive index n 1 to n 5 and the film thickness n 1 d 1 to n of the first to fifth layers are set.
5 d 5 is 0.25λ 0 ≤n 1 d 1 ≤0.50λ 0 , 1.45 ≤n 1 ≤1.47 0.03λ 0 ≤n 2 d 2 ≤0.07λ 0 , 1.90 ≤n 2 ≤2.20 0.03λ 0 ≤n 3 d 3 ≤0.15 λ 0 , 1.36 ≤ n 3 ≤ 1.65 0.45 λ 0 ≤ n 4 d 4 ≤ 0.54 λ 0 , 1.90 ≤ n 4 ≤ 2.20 0.24 λ 0 ≤ n 5 d 5 ≤ 0.26 λ 0 , 1.36 ≤ n 5 ≤ 1.40 The optical component having the antireflection film according to claim 1, wherein the optical component is within the range.
【請求項3】第2層及び第4層の誘電体膜の組成を、酸
化ジルコニウムと酸化チタンの混合物,酸化プラセオジ
ウムと酸化チタンの混合物及び酸化タンタルのいずれか
1つとし、第3層の誘電体膜の組成を、酸化ケイ素,フ
ッ化マグネシウム及び酸化アルミニウムのいずれか1つ
とし、第5層の誘電体膜の組成を、フッ化マグネシウム
としたことを特徴とする請求項2記載の反射防止膜を有
する光学部品。
3. The composition of the second and fourth dielectric films is any one of a mixture of zirconium oxide and titanium oxide, a mixture of praseodymium oxide and titanium oxide, and tantalum oxide, and a dielectric film of the third layer is formed. The antireflection coating according to claim 2, wherein the composition of the body film is one of silicon oxide, magnesium fluoride and aluminum oxide, and the composition of the dielectric film of the fifth layer is magnesium fluoride. Optical component having a film.
JP3249510A 1991-09-27 1991-09-27 Optical parts with antireflection film Pending JPH0585778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3249510A JPH0585778A (en) 1991-09-27 1991-09-27 Optical parts with antireflection film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3249510A JPH0585778A (en) 1991-09-27 1991-09-27 Optical parts with antireflection film

Publications (1)

Publication Number Publication Date
JPH0585778A true JPH0585778A (en) 1993-04-06

Family

ID=17194049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3249510A Pending JPH0585778A (en) 1991-09-27 1991-09-27 Optical parts with antireflection film

Country Status (1)

Country Link
JP (1) JPH0585778A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0926501A (en) * 1995-07-11 1997-01-28 Konica Corp Synthetic resin optical parts having antireflection film
JPH1164603A (en) * 1997-08-18 1999-03-05 Dainippon Printing Co Ltd Antireflection film, base material with antireflection film and plasma display panel front plate using base material with antireflection film
JP2005302088A (en) * 2004-04-07 2005-10-27 Konica Minolta Opto Inc Objective lens and optical pickup device
JP2011186325A (en) * 2010-03-10 2011-09-22 Fujifilm Corp Method for manufacturing antireflective film, antireflective film, and optical element
US8125714B2 (en) 2008-02-28 2012-02-28 Pentax Ricoh Imaging Company, Ltd. Anti-reflection coating, optical member, exchange lens unit and imaging device
US8199404B2 (en) 2007-12-27 2012-06-12 Pentax Ricoh Imaging Company, Ltd. Anti-reflection coating, optical member, exchange lens unit and imaging device
JPWO2019058825A1 (en) * 2017-09-21 2020-11-05 富士フイルム株式会社 Anti-reflective coating, optics and optics

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0926501A (en) * 1995-07-11 1997-01-28 Konica Corp Synthetic resin optical parts having antireflection film
JPH1164603A (en) * 1997-08-18 1999-03-05 Dainippon Printing Co Ltd Antireflection film, base material with antireflection film and plasma display panel front plate using base material with antireflection film
JP2005302088A (en) * 2004-04-07 2005-10-27 Konica Minolta Opto Inc Objective lens and optical pickup device
US8199404B2 (en) 2007-12-27 2012-06-12 Pentax Ricoh Imaging Company, Ltd. Anti-reflection coating, optical member, exchange lens unit and imaging device
US8125714B2 (en) 2008-02-28 2012-02-28 Pentax Ricoh Imaging Company, Ltd. Anti-reflection coating, optical member, exchange lens unit and imaging device
JP2011186325A (en) * 2010-03-10 2011-09-22 Fujifilm Corp Method for manufacturing antireflective film, antireflective film, and optical element
JPWO2019058825A1 (en) * 2017-09-21 2020-11-05 富士フイルム株式会社 Anti-reflective coating, optics and optics
US11422290B2 (en) 2017-09-21 2022-08-23 Fujifilm Corporation Antireflection film, optical element, and optical system

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