JPH0573190B2 - - Google Patents

Info

Publication number
JPH0573190B2
JPH0573190B2 JP31123886A JP31123886A JPH0573190B2 JP H0573190 B2 JPH0573190 B2 JP H0573190B2 JP 31123886 A JP31123886 A JP 31123886A JP 31123886 A JP31123886 A JP 31123886A JP H0573190 B2 JPH0573190 B2 JP H0573190B2
Authority
JP
Japan
Prior art keywords
voltage
anode
electrons
grid electrode
counting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP31123886A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63167255A (ja
Inventor
Masayuki Uda
Hiroshi Ishida
Atsushi Manmoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hochiki Corp
RIKEN
Original Assignee
Hochiki Corp
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hochiki Corp, RIKEN filed Critical Hochiki Corp
Priority to JP31123886A priority Critical patent/JPS63167255A/ja
Publication of JPS63167255A publication Critical patent/JPS63167255A/ja
Publication of JPH0573190B2 publication Critical patent/JPH0573190B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP31123886A 1986-12-27 1986-12-27 電子計数装置 Granted JPS63167255A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31123886A JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31123886A JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Publications (2)

Publication Number Publication Date
JPS63167255A JPS63167255A (ja) 1988-07-11
JPH0573190B2 true JPH0573190B2 (enExample) 1993-10-13

Family

ID=18014753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31123886A Granted JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Country Status (1)

Country Link
JP (1) JPS63167255A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110672001A (zh) * 2019-10-24 2020-01-10 中航通飞华南飞机工业有限公司 一种铁磁性材料表面非铁磁材料厚度测量方法及装置

Also Published As

Publication number Publication date
JPS63167255A (ja) 1988-07-11

Similar Documents

Publication Publication Date Title
Coates The origins of afterpulses in photomultipliers
JPH0581168B2 (enExample)
Anikin et al. Breakdown development at high overvoltage: electric field, electronic level excitation and electron density
Tochikubo et al. Investigation of the high-frequency glow discharge in Ar at 13.56 MHz by spatiotemporal optical emission spectroscopy
US4554455A (en) Potential analyzer
Bhattacharya Measurement of barium loss from a fluorescent lamp electrode by laser‐induced fluorescence
CN106196159B (zh) 火焰检测系统
De Martini et al. Photomultiplier Gate for Stimulated‐Spontaneous Light Scattering Discrimination
JPH0573190B2 (enExample)
US5760594A (en) Contamination monitoring using capacitance measurements on MOS structures
Golden et al. Role of resonances in the electron-impact excitation functions of the C Π u 3 and E Σ g+ 3 states of N 2
Chen et al. Excitation of the B Π g 3 states of N 2 by electron impact
JPH0789148B2 (ja) 電子計数装置
JPH0376841B2 (enExample)
Haydon et al. Time-resolved studies of the electrical breakdown of a gas at radio frequencies
JPH02171644A (ja) 電子計数装置
Fuchs et al. Nanosecond hydrogen flashlamp: Spectral and temporal characteristics from the vacuum ultraviolet to the visible red
RU2134468C1 (ru) Способ и устройство для контроля полупроводниковой структуры
JPH0556459B2 (enExample)
JP2002350552A (ja) 放射線検出装置
JPS63167253A (ja) 電子計数装置
JPH01233325A (ja) シンクロトロン放射光ビーム強度測定装置
JPH0547041B2 (enExample)
JPS63133079A (ja) 電子計数装置
Marghitu et al. Pulsed electron source characterization with the modified three gradient method

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees