JPH0563232A - Superluminescent diode - Google Patents

Superluminescent diode

Info

Publication number
JPH0563232A
JPH0563232A JP22283191A JP22283191A JPH0563232A JP H0563232 A JPH0563232 A JP H0563232A JP 22283191 A JP22283191 A JP 22283191A JP 22283191 A JP22283191 A JP 22283191A JP H0563232 A JPH0563232 A JP H0563232A
Authority
JP
Japan
Prior art keywords
layer
region
substrate
active layer
step region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22283191A
Other languages
Japanese (ja)
Other versions
JP2806094B2 (en
Inventor
Yutaka Nagai
豊 永井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP22283191A priority Critical patent/JP2806094B2/en
Publication of JPH0563232A publication Critical patent/JPH0563232A/en
Application granted granted Critical
Publication of JP2806094B2 publication Critical patent/JP2806094B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To obtain an SLD element which performs a stable SLD operation even when operating with a high output power. CONSTITUTION:On a substrate 11, provided is a step region 17, which forms an angle in the scope of 0-90 deg. with an optical axis, in the course extending to the rear end face side which is opposed to the end face of emitting a beam. Then, on the substrate 11, formed are in succession a lower clad layer 12, an active layer 13, an upper clad layer 14, and a current blocking layer 15. Further, a Zn-diffused region 16 is formed, and the state of making the active layer 13 interrupted in the step region 17 is generated, and the active layer 13 is made to contact with the lower clad 12 in the step region 17. Since the beam progressing to the rear end face side is bent from the direction of the optical axis by the difference of refractivity between the active layer 13 and the lower clad layer 12, the beam is not returned to the active region, and a laser oscillation is made hard to occur. Therefore, an SLD element, which is operated stably even when operating with a high output power, can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、スーパ・ルミネッセン
ト・ダイオードに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a super luminescent diode.

【0002】[0002]

【従来の技術】近年、半導体レーザと発光ダイオードの
中間に位置づけられるであろうスーパ・ルミネッセント
・ダイオード(SLD)ガ注目されている。この発光デ
バイスは、発光ダイオードのようなブロードなスペクト
ルの広がりを持ち、半導体レーザと同程度の高い出力を
持つ光を出射することが可能である。したがって、SL
Dは高出力でインコヒーレントな光を指向性よく取り出
すことができるという利点がある。この利点を生かして
現在、ファイバ・ジャイロ用光源等の利用が進められて
いる。SLDの構造および製造のポイントは、如何にレ
ーザ発振を抑え、自然放出光のスペクトル幅を広げ、そ
の光出力を高くするかである。
2. Description of the Related Art In recent years, attention has been paid to a super luminescent diode (SLD) gas which may be positioned between a semiconductor laser and a light emitting diode. This light emitting device has a broad spectrum spread like a light emitting diode and can emit light having a high output comparable to that of a semiconductor laser. Therefore, SL
D has an advantage that high-power and incoherent light can be extracted with good directivity. Utilizing this advantage, the use of a light source for a fiber gyro, etc. is currently being promoted. The structure and manufacturing point of the SLD are how to suppress laser oscillation, widen the spectral width of spontaneous emission light, and increase its optical output.

【0003】以下、図2(a),(b)により従来のS
LDについて説明する。図2において、1はn−GaA
s基板(以下、単に基板という。その他の符号について
も繰り返す場合は同様とする。)、2はn−AlGaA
s下クラッド層、3はアンドープAlGaAs活性層、
4はp−AlGaAs上クラッド層、5はn−GaAs
電流ブロック層、6はZn拡散領域である。なお、電極
は省略してある。
Hereinafter, referring to FIGS. 2 (a) and 2 (b), the conventional S
The LD will be described. In FIG. 2, 1 is n-GaA
s substrate (hereinafter, simply referred to as a substrate. The same applies when other symbols are repeated), 2 is n-AlGaA
s lower cladding layer, 3 is an undoped AlGaAs active layer,
4 is a p-AlGaAs upper cladding layer, 5 is n-GaAs
The current block layer 6 is a Zn diffusion region. The electrodes are omitted.

【0004】次に、動作について説明する。活性層3の
pn接合に対して順方向に電圧を印加すると、電流はZ
n拡散領域6のみを流れる。他の所では、電流ブロック
層5と上クラッド層4が印加電圧に対して逆バイアスに
なるからである。一方、Zn拡散領域6はp型になるの
で上記のような逆バイアスとはならない。Zn拡散領域
6直下の活性領域で発光再結合が生じ、光が発生する。
このSLDにおいては、レーザ発振を抑えるため、図中
では省略されているが、出射端面には無反射コーティン
グが施され、後方ではZn拡散領域6のストライプがと
ぎれている領域が電流非注入領域となり、光を吸収する
機能を有するため、実効的な反射が減少し、レーザ発振
が抑えられる。
Next, the operation will be described. When a voltage is applied in the forward direction to the pn junction of the active layer 3, the current is Z
Only the n diffusion region 6 flows. This is because the current blocking layer 5 and the upper cladding layer 4 are reverse biased with respect to the applied voltage in other places. On the other hand, since the Zn diffusion region 6 is p-type, the reverse bias as described above does not occur. Emission recombination occurs in the active region immediately below the Zn diffusion region 6 to generate light.
In this SLD, in order to suppress laser oscillation, although not shown in the drawing, a non-reflection coating is applied to the emission end face, and the region where the stripe of the Zn diffusion region 6 is interrupted is a current non-injection region in the rear. Since it has a function of absorbing light, effective reflection is reduced and laser oscillation is suppressed.

【0005】[0005]

【発明が解決しようとする課題】従来のSLDは、以上
のように構成されているので、光出力を大きくすると後
面の電流非注入領域での吸収が飽和し、実効的な反射率
が増大し、レーザ発振が生じてしまうという問題点があ
った。
Since the conventional SLD is constructed as described above, when the light output is increased, the absorption in the current non-injection region on the rear surface is saturated and the effective reflectance is increased. However, there is a problem that laser oscillation occurs.

【0006】本発明は、上記のような問題点を解消する
ためになされたもので、高光出力時でも安定にSLDの
モードで動作するSLDを得ることを目的としている。
The present invention has been made to solve the above problems, and an object thereof is to obtain an SLD that operates stably in the SLD mode even at high light output.

【0007】[0007]

【課題を解決するための手段】本発明に係るSLDは、
光の出射端面に対して反対側の後端面側に至る途中に、
光軸に対して0〜90°の角度をなす段差領域を設けた
基板上に下クラッド層,活性層,上クラッド層,および
電流ブリック層の各結晶層を成長させ、前記上クラッド
層の厚み方向に一部が臨み、かつ前記段差領域には達し
ない不純物拡散領域を形成したものである。
The SLD according to the present invention comprises:
On the way to the rear end face side opposite to the light emission end face,
The crystal layers of the lower clad layer, the active layer, the upper clad layer, and the current brick layer are grown on a substrate provided with a step region forming an angle of 0 to 90 ° with respect to the optical axis, and the thickness of the upper clad layer is increased. The impurity diffusion region is formed so as to partially face in the direction and not reach the step region.

【0008】[0008]

【作用】本発明のSLDは、基板の途中に形成された段
差領域で光が屈折するため、後端面で反射しても再び活
性領域に光は戻らないため、実効的な反射率は減少し、
レーザ発振には至らない。
In the SLD of the present invention, since the light is refracted in the step region formed in the middle of the substrate, the light does not return to the active region even when reflected by the rear end face, so the effective reflectance is reduced. ,
It does not reach laser oscillation.

【0009】[0009]

【実施例】以下、本発明の一実施例を図について説明す
る。図1(a)〜(c)は本発明のSLDの一実施例を
示す図で、図1(a)はSLDのエピタキシャル成長前
の基板の斜視図、図1(b)はエピタキシャル成長後の
素子断面図、図1(c)は、図1(b)の上面図であ
る。図1において、11は、段差領域17が形成された
基板で、この段差領域17は、基板11上の光出射端面
に対して反対側の後端面側に至る途中に、光軸に対して
0〜90°の角度をなして形成される。したがって、こ
の段差領域17を境にして基板11に高低差が付けられ
ている。12は下クラッド層、13は活性層、14は上
クラッド層、15は電流ブロック層で、これらの各エピ
タキシャル層は前記高低差の付けられた基板11上に段
差領域17を境にして各層が基板厚方向にずれた状態で
積層されており、活性層13が段差領域17でとぎれた
状態となっている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. 1 (a) to 1 (c) are views showing an embodiment of an SLD of the present invention, FIG. 1 (a) is a perspective view of a substrate of an SLD before epitaxial growth, and FIG. 1 (b) is a device cross section after epitaxial growth. FIG. 1 (c) is a top view of FIG. 1 (b). In FIG. 1, reference numeral 11 denotes a substrate on which a step region 17 is formed, and the step region 17 is 0 relative to the optical axis on the way to the rear end face side opposite to the light emitting end face on the substrate 11. Formed at an angle of ~ 90 °. Therefore, there is a height difference on the substrate 11 with the step region 17 as a boundary. Reference numeral 12 is a lower clad layer, 13 is an active layer, 14 is an upper clad layer, and 15 is a current blocking layer. Each of these epitaxial layers is formed on the substrate 11 having the height difference, with each step layer 17 as a boundary. The layers are stacked in a state of being displaced in the substrate thickness direction, and the active layer 13 is in a state of being interrupted by the step region 17.

【0010】次に、動作について説明する。なお、この
実施例のSLDと、従来例のSLDの違いは段差領域1
7を有する基板11上に各エピタキシャル層が形成され
ているかどうかのみなので、この点を中心に説明する。
Next, the operation will be described. The difference between the SLD of this embodiment and the SLD of the conventional example is the step region 1
Since it is only whether or not each epitaxial layer is formed on the substrate 11 having No. 7, the description will be focused on this point.

【0011】まず、製造方法について説明する。図1
(a)に示すように、基板11上の途中に所要角度(0
〜90°)の段差領域17を形成し、基板厚を異ならせ
ておく。次に、図1(b)に示すように、この基板11
上に従来例と同様にして、下クラッド層12,活性層1
3,上クラッド層14,および電流ブロック層15の各
エピタキシャル層を成長する。この時の各エピタキシャ
ル成長層は、段差領域17を境にして基板厚方向にずれ
た状態で形成される。次に、従来例と同じくZn拡散領
域16を設けるが、ストライプは図1(b)に示すよう
に、段差領域17には達しないように形成する。段差領
域17の角度を光軸に対して、例えば45°になるよう
にすると、ウエットエッチングでは、基板11面に対し
て垂直の段差領域17が生じる。
First, the manufacturing method will be described. Figure 1
As shown in (a), the required angle (0
Step regions 17 of 90 °) are formed to make the substrate thickness different. Next, as shown in FIG.
The upper clad layer 12 and the active layer 1 are formed in the same manner as in the conventional example.
3, epitaxial layers of the upper clad layer 14 and the current blocking layer 15 are grown. At this time, the respective epitaxial growth layers are formed in a state of being displaced in the substrate thickness direction with the step region 17 as a boundary. Next, the Zn diffusion region 16 is provided as in the conventional example, but the stripe is formed so as not to reach the step region 17 as shown in FIG. If the angle of the step region 17 is set to, for example, 45 ° with respect to the optical axis, the step region 17 perpendicular to the surface of the substrate 11 is formed in the wet etching.

【0012】上記のようにして各結晶層を成長後は、図
1(b)に示すように、活性層13が段差領域17でと
ぎれて下クラッド層12に接しているような形状を呈す
る。このため、励起領域で生じ、後方に進んだ光は活性
層13と下クラッド層12の屈折率の違いにより、光軸
方向から傾いた角度に曲がる。例えば、活性層13のA
l組成比0.05,下クラッド層12のAl組成比0.
50の場合、光軸から5°ずれた方向に光は進む。
After the growth of the respective crystal layers as described above, the active layer 13 has a shape such that it is interrupted by the step region 17 and in contact with the lower cladding layer 12, as shown in FIG. Therefore, the light generated in the excitation region and traveling backward is bent at an angle inclined from the optical axis direction due to the difference in the refractive index between the active layer 13 and the lower cladding layer 12. For example, A of the active layer 13
l composition ratio of 0.05, Al composition ratio of the lower cladding layer 12 of 0.1.
In the case of 50, the light travels in the direction deviated from the optical axis by 5 °.

【0013】したがって、図1(c)に示すように、た
とえ後端面で反射しても光軸からはそれてしまっている
ので、活性層13には戻らない。したがって、通常の両
端面内での光の往復による光増幅は生じないので、安定
したSLDが高出力動作時でも保たれる。
Therefore, as shown in FIG. 1 (c), even if the light is reflected by the rear end face, it does not return to the active layer 13 because it is off the optical axis. Therefore, since the optical amplification due to the reciprocal movement of light on both end faces is not generated normally, a stable SLD can be maintained even during high output operation.

【0014】[0014]

【発明の効果】以上説明したように、本発明は、基板の
途中に光軸に対して0〜90°の角度をなす段差領域を
形成し、この段差領域が形成された基板上に下クラッド
層,活性層,上クラッド層および電流ブロック層を形成
し、前記上クラッド層の厚み方向に一部が臨み、かつ前
記段差領域には達しないストライプ状の不純物拡散層を
形成したので、各結晶成長層は段差領域を境にして基板
厚方向にずれて形成され、前記活性層が前記段差領域で
とぎれた状態に形成される。したがって、後端面側に進
んだ光は段差領域で光軸方向から曲げるられるため、活
性層に後端面からの光は戻ってこない。したがって、安
定したSLD動作が得られる。
As described above, according to the present invention, a step region forming an angle of 0 to 90 ° with respect to the optical axis is formed in the middle of the substrate, and the lower clad is formed on the substrate on which the step region is formed. Layers, an active layer, an upper clad layer and a current blocking layer are formed, and a stripe-shaped impurity diffusion layer is formed which partially faces the thickness direction of the upper clad layer and does not reach the step region. The growth layer is formed so as to deviate in the substrate thickness direction with the step region as a boundary, and the active layer is formed in a state of being interrupted in the step region. Therefore, since the light traveling to the rear end face side is bent from the optical axis direction in the step region, the light from the rear end face does not return to the active layer. Therefore, stable SLD operation can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のSLDの製造方法の一実施例の工程を
示す図である。
FIG. 1 is a diagram showing steps of an embodiment of a method for manufacturing an SLD of the present invention.

【図2】従来のSLDの構造を示す図である。FIG. 2 is a diagram showing a structure of a conventional SLD.

【符号の説明】[Explanation of symbols]

11 基板 12 下クラッド層 13 活性層 14 上クラッド層 15 電流ブロック層 16 Zn拡散領域 17 段差領域 11 substrate 12 lower clad layer 13 active layer 14 upper clad layer 15 current blocking layer 16 Zn diffusion region 17 step region

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光の出射端面に対して反対側の後端面側
に至る途中に、光軸に対して0〜90°の角度をなす段
差領域が設けられた基板と、この基板上に形成された下
クラッド層,活性層,上クラッド層および電流ブロック
層と、さらに、前記上クラッド層の厚み方向に一部が臨
み、かつ前記段差領域には達しないストライプ状の不純
物拡散領域とを有することを特徴とするスーパ・ルミネ
ッセント・ダイオード。
1. A substrate provided with a step region forming an angle of 0 to 90 ° with respect to the optical axis on the way to the rear end face side opposite to the light emitting end face, and formed on this substrate. A lower clad layer, an active layer, an upper clad layer, and a current blocking layer, and a stripe-shaped impurity diffusion region that partially faces in the thickness direction of the upper clad layer and does not reach the step region. A super luminescent diode characterized in that.
JP22283191A 1991-09-03 1991-09-03 Super luminescent diode Expired - Lifetime JP2806094B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22283191A JP2806094B2 (en) 1991-09-03 1991-09-03 Super luminescent diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22283191A JP2806094B2 (en) 1991-09-03 1991-09-03 Super luminescent diode

Publications (2)

Publication Number Publication Date
JPH0563232A true JPH0563232A (en) 1993-03-12
JP2806094B2 JP2806094B2 (en) 1998-09-30

Family

ID=16788596

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22283191A Expired - Lifetime JP2806094B2 (en) 1991-09-03 1991-09-03 Super luminescent diode

Country Status (1)

Country Link
JP (1) JP2806094B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100596380B1 (en) * 2002-12-13 2006-07-03 한국전자통신연구원 Semiconductor laser device and method for manufacturing the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63222476A (en) * 1987-03-11 1988-09-16 Nec Corp Manufacture of edge light emitting diode
JPH02218182A (en) * 1989-02-17 1990-08-30 Anritsu Corp Light emitting diode

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63222476A (en) * 1987-03-11 1988-09-16 Nec Corp Manufacture of edge light emitting diode
JPH02218182A (en) * 1989-02-17 1990-08-30 Anritsu Corp Light emitting diode

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100596380B1 (en) * 2002-12-13 2006-07-03 한국전자통신연구원 Semiconductor laser device and method for manufacturing the same

Also Published As

Publication number Publication date
JP2806094B2 (en) 1998-09-30

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