JPH0560811A - Insulation resistance measuring instrument - Google Patents

Insulation resistance measuring instrument

Info

Publication number
JPH0560811A
JPH0560811A JP24502391A JP24502391A JPH0560811A JP H0560811 A JPH0560811 A JP H0560811A JP 24502391 A JP24502391 A JP 24502391A JP 24502391 A JP24502391 A JP 24502391A JP H0560811 A JPH0560811 A JP H0560811A
Authority
JP
Japan
Prior art keywords
sample
measured
insulation resistance
circuit
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24502391A
Other languages
Japanese (ja)
Inventor
Motoo Hatakeyama
司男 畠山
Tomotoshi Kushiyama
智敏 串山
Toshiharu Ouchi
俊治 大内
Masatoshi Ichi
正年 位地
Chiharu Ishisaki
千春 石先
Yuji Ikuta
優司 生田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP24502391A priority Critical patent/JPH0560811A/en
Publication of JPH0560811A publication Critical patent/JPH0560811A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To select a sample to be measured which becomes an object to be measured out of a plurality of samples to be measured and to stably and highly reliably measure high insulation resistance values by increasing the insulation of the cases of an applied voltage switching circuit and sample select circuit for selecting samples and providing a driving guard switching means. CONSTITUTION:This insulation resistance measuring instrument is constituted of a plurality of measuring samples 12, constant voltage power source 1 for supplying voltages, a switching circuit 2 provided with a switch 7 for switching applied voltages and protective resistance 11, sample select circuit 4 provided with switches 8, 9, and 10 for selecting samples to be measured and switching driving guards, and insulation resistance meter 5 for measurement. In order to increase the insulation resistances of the circuits 2 and 4, the circuits 2 and 4 are connected to each other while the circuits 2 and 4 are separately housed in different cases. Therefore, high insulation resistances can be measured, because the leakage of a current flowing to a detected signal can be prevented and external inducting actions, noise action, etc., which give influences to the detected signal can be removed by the driving guard switching function.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、複数の被測定試料を順
次切り換えて絶縁抵抗を測定する絶縁抵抗測定装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an insulation resistance measuring apparatus for measuring insulation resistance by sequentially switching a plurality of samples to be measured.

【0002】[0002]

【従来の技術】この種の絶縁抵抗測定装置は、特公平0
2−264871号公報等に提案されているように、絶
縁抵抗測定装置本体に印加電圧用定電圧電源と、印加電
圧切り換え用の切換え回路と、試料ボックス内における
複数の被測定試料を選択するための試料セレクト回路
と、測定用絶縁抵抗計からなる構成を有し、被測定試料
の絶縁抵抗値を測定するものである。
2. Description of the Related Art This type of insulation resistance measuring device
In order to select a plurality of samples to be measured in a sample box, a constant voltage power supply for applied voltage, a switching circuit for switching the applied voltage to the insulation resistance measuring device main body, as proposed in Japanese Patent Laid-Open No. 2-264871. The sample select circuit and the insulation resistance meter for measurement are used to measure the insulation resistance value of the sample to be measured.

【0003】図3は、従来の絶縁抵抗測定装置によっ
て、被測定試料間の絶縁抵抗値を測定しているときの回
路構成を示す。
FIG. 3 shows a circuit configuration when an insulation resistance value between samples to be measured is measured by a conventional insulation resistance measuring device.

【0004】従来の絶縁抵抗測定装置は、被測定試料へ
の印加電圧供給用の定電圧電源1と、印加電圧切断用の
スイッチ6と電圧の常時印加と測定時印加の切換えスイ
ッチ7及び保護抵抗11を有する切換え回路2と、試料
ボックス3内の複数による被測定試料12の選択用スイ
ッチ8を有する試料セレクト回路4と、測定用の絶縁抵
抗計5とから構成される。
The conventional insulation resistance measuring apparatus comprises a constant voltage power source 1 for supplying an applied voltage to a sample to be measured, a switch 6 for disconnecting the applied voltage, a switch 7 for constantly applying a voltage and a voltage applied during measurement, and a protective resistance. It comprises a switching circuit 2 having 11, a sample selecting circuit 4 having a switch 8 for selecting a sample 12 to be measured by a plurality of samples in a sample box 3, and an insulation resistance meter 5 for measurement.

【0005】一般に定電圧電源1は、絶縁抵抗計5に内
蔵されていることが多い。また、図3に示す回路構成図
において、回路内に破線で示したスイッチ接点7と8と
は連動動作となっている。さらに、切換え回路2と試料
セレクト回路4とは、同一のケース18内に実装配置さ
れている。
In general, the constant voltage power supply 1 is often built in the insulation resistance meter 5. Further, in the circuit configuration diagram shown in FIG. 3, the switch contacts 7 and 8 indicated by broken lines in the circuit are in an interlocking operation. Further, the switching circuit 2 and the sample selection circuit 4 are mounted and arranged in the same case 18.

【0006】以上のような構成において、先ず被測定試
料12の常時印加電圧の場合、定電圧電源1からのVs
出力は、切換え回路2に供給される。切換え回路2のス
イッチ6が閉状態で、スイッチ7がb接点側にあるとき
には保護抵抗11を通じた回路経路となり、被測定試料
12の一端に電圧が加わる。
In the above configuration, first, in the case of the constant applied voltage to the sample 12 to be measured, Vs from the constant voltage power source 1
The output is supplied to the switching circuit 2. When the switch 6 of the switching circuit 2 is in the closed state and the switch 7 is on the b contact side, it forms a circuit path through the protective resistor 11 and a voltage is applied to one end of the measured sample 12.

【0007】また、被測定試料12の他端は、同軸ケー
ブルを用いた測定ケーブル13を通じ、試料セレクト回
路4の試料切換えスイッチ8に接続される。前記スイッ
チ8は、b接点側にあり、定電圧電源1のLo端子に接
続されて被測定試料12に印加電圧が加わり、電流が流
れる。
The other end of the sample 12 to be measured is connected to the sample changeover switch 8 of the sample select circuit 4 through the measurement cable 13 using a coaxial cable. The switch 8 is located on the b-contact side and is connected to the Lo terminal of the constant voltage power source 1 to apply an applied voltage to the sample 12 to be measured, so that a current flows.

【0008】次に、測定時の場合、切換え回路2のスイ
ッチ7と、試料セレクト回路4のスイッチ8は、a接点
側に接続し、定電圧電源1からのVsは、保護抵抗11
をバイパスした経路となり、被測定試料12の一端に加
わる。一方、先に述べたスイッチ8は、a接点側にあ
り、被測定試料12の他端は、測定ケーブル13を通じ
測定ケーブル14を介して絶縁抵抗計5のIin端子に
接続される。
Next, at the time of measurement, the switch 7 of the changeover circuit 2 and the switch 8 of the sample selection circuit 4 are connected to the contact a side, and Vs from the constant voltage power source 1 is protected by the protective resistor 11.
Is a bypassed route, and is added to one end of the measured sample 12. On the other hand, the switch 8 described above is on the a contact side, and the other end of the sample 12 to be measured is connected to the Iin terminal of the insulation resistance meter 5 through the measurement cable 13 and the measurement cable 14.

【0009】絶縁抵抗計5のLo端子と定電圧電源1の
Lo端子とが接続されているので、絶縁抵抗計5を通じ
て被測定試料12に印加電圧が加わり、電流が流れる。
この電流を絶縁抵抗計5内の電流計で検知し、オームの
法則により絶縁抵抗値を求める。
Since the Lo terminal of the insulation resistance meter 5 and the Lo terminal of the constant voltage power supply 1 are connected, an applied voltage is applied to the sample 12 to be measured through the insulation resistance meter 5 and a current flows.
This current is detected by the ammeter in the insulation resistance meter 5, and the insulation resistance value is obtained according to Ohm's law.

【0010】[0010]

【発明が解決しようとする課題】従来の絶縁抵抗測定装
置は、切換え回路2の切換えスイッチ7と、試料セレク
ト回路4のスイッチ8とは、同一スイッチ内の連動した
接点で構成され、切換え回路2と試料セレクト回路4と
は同一ケース18内で実装配置している。
In the conventional insulation resistance measuring apparatus, the changeover switch 7 of the changeover circuit 2 and the switch 8 of the sample selection circuit 4 are constituted by interlocking contacts in the same switch. The sample selection circuit 4 and the sample selection circuit 4 are mounted and arranged in the same case 18.

【0011】この場合、スイッチ自身の絶縁抵抗と、ケ
ース内の絶縁抵抗が問題となる。つまり被測定試料の絶
縁抵抗値より、前記スイッチとケースの絶縁抵抗が低い
時、前記スイッチとケースの絶縁抵抗の影響で漏れ電流
が生じる。それによって真値を測定することができない
という欠点がある。
In this case, the insulation resistance of the switch itself and the insulation resistance inside the case pose a problem. That is, when the insulation resistance between the switch and the case is lower than the insulation resistance value of the sample to be measured, a leakage current occurs due to the insulation resistance between the switch and the case. This has the disadvantage that the true value cannot be measured.

【0012】また、比較的低い絶縁抵抗測定の場合は問
題とならないが、高絶縁抵抗の場合は、被測定試料に流
れる電流が外部誘導作用及び外部ノイズ等で影響され、
被測定試料の測定値に大きなバラツキと誤差が生じる欠
点がある。よって測定値の信頼性及び安定性等が問題と
なる。
Further, although there is no problem in the case of measuring a relatively low insulation resistance, in the case of a high insulation resistance, the current flowing through the sample to be measured is affected by external inductive action, external noise, etc.
There is a drawback that large variations and errors occur in the measured values of the sample to be measured. Therefore, the reliability and stability of the measured value become a problem.

【0013】本発明の目的は、複数の被測定試料から測
定対象となる被測定試料を選択して高絶縁抵抗値の安
定、かつ信頼度の高い測定を可能とした絶縁抵抗測定装
置を提供することにある。
An object of the present invention is to provide an insulation resistance measuring device capable of stable and highly reliable measurement of a high insulation resistance value by selecting a measurement sample to be measured from a plurality of measurement samples. Especially.

【0014】[0014]

【課題を解決するための手段】上記目的を達成するた
め、本発明による絶縁抵抗測定装置においては、絶縁抵
抗計と、複数の被測定試料から測定対象となる被測定試
料を選択して前記絶縁抵抗計に接続する試料セレクト回
路と、測定電圧印加用の定電圧電源と、定電圧電源から
の測定電圧を被測定試料に直接印加するか、又は保護抵
抗を介して印加するかを切り換える切換え回路と、被測
定試料選択手段とを有し、複数の被測定試料を順次選択
して該被測定試料の絶縁抵抗値を求める絶縁抵抗測定装
置であって、前記切換え回路と試料セレクト回路とは、
別々の絶縁されたケース内に実装配置され、互いに絶縁
された構造手段を備え、被測定試料と試料セレクト回路
間及び試料セレクト回路と絶縁抵抗計間は、二重シール
ド同軸線を用いて接続され、被測定試料選択手段は、被
測定試料の選択時に前記二重シールド同軸線の検出信号
線と、ドライビングガード線を同時動作に切り換えるも
のである。
In order to achieve the above object, in the insulation resistance measuring apparatus according to the present invention, the insulation resistance meter and a sample to be measured to be measured are selected from a plurality of samples to be measured, and the insulation is measured. A sample select circuit connected to an ohmmeter, a constant voltage power supply for applying the measurement voltage, and a switching circuit that switches between applying the measurement voltage from the constant voltage power supply directly to the DUT or through a protective resistor. An insulation resistance measuring apparatus that has a sample-to-be-measured selection unit and sequentially selects a plurality of samples-to-be-measured to obtain an insulation resistance value of the sample-to-be-measured, wherein the switching circuit and the sample select circuit are:
Equipped with structural means that are mounted in separate insulated cases and insulated from each other, the DUT and the sample select circuit, and the sample select circuit and the insulation resistance meter are connected using double shielded coaxial lines. The sample-to-be-measured selecting means switches the detection signal line of the double shielded coaxial line and the driving guard line to the simultaneous operation when selecting the sample to be measured.

【0015】[0015]

【作用】本発明の絶縁抵抗測定装置は切換え回路内のス
イッチと試料セレクト回路内のスイッチを別々のスイッ
チ構成とし、前記切換え回路と試料セレクト回路は、別
々のケース内に実装配置され、これらの回路は、互いに
絶縁されており、被測定試料と試料セレクト回路間及び
試料セレクト回路と絶縁抵抗計間を二重シールドの同軸
ケーブル線を用い、二重シールドのうち一方を絶縁抵抗
計からのドライビングガードとし、他方をシールドとし
て検出信号線とドライビングガード線を同時動作に切換
えるものである。
In the insulation resistance measuring apparatus of the present invention, the switch in the switching circuit and the switch in the sample selection circuit have different switch configurations, and the switching circuit and the sample selection circuit are mounted and arranged in different cases. The circuits are insulated from each other.Double shielded coaxial cable wires are used between the DUT and the sample select circuit, and between the sample select circuit and the insulation resistance tester, and one of the double shields is driven by the insulation resistance tester. The guard signal and the other shield are used to switch the detection signal line and the driving guard line to the simultaneous operation.

【0016】本発明の絶縁抵抗測定装置によれば、電圧
供給用の切換え回路と、試料選択用の試料セレクト回路
とを分離して配置接続することにより、前記切換え回路
と前記試料セレクト回路との絶縁抵抗が高まり、検出信
号の電流漏れ防止効果が得られる。また、ドライビング
ガードの切換え機能により、検出信号に影響する外部誘
導作用及び外部ノイズ作用等が除去され、高絶縁抵抗の
測定が可能となる。
According to the insulation resistance measuring apparatus of the present invention, the switching circuit for supplying voltage and the sample selecting circuit for selecting the sample are separately arranged and connected, so that the switching circuit and the sample selecting circuit are connected. The insulation resistance is increased, and the effect of preventing current leakage of the detection signal is obtained. Further, the switching function of the driving guard removes the external inductive effect and the external noise effect that affect the detection signal, and enables the measurement of high insulation resistance.

【0017】[0017]

【実施例】次に、本発明の実施例について図面を参照し
詳細に説明する。図1は、本発明の絶縁抵抗測定装置の
他の実施例を示す構成図である。
Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a configuration diagram showing another embodiment of the insulation resistance measuring apparatus of the present invention.

【0018】図において、本測定装置は、試料ボックス
3内の被測定試料12への印加電圧供給用定電圧電源
1、被測定試料12の印加電圧切断用スイッチ6と電圧
の常時印加と測定時印加の切換え用スイッチ7及びショ
ート防止用保護抵抗11を有する切換え回路2と、被測
定試料12の選択用スイッチ8とドライビングガード用
スイッチ9及び定電圧電源1のLo端子接続用スイッチ
10を有する試料セレクト回路4及び測定用の絶縁抵抗
計5で構成される。
In the figure, the present measuring apparatus comprises a constant voltage power supply 1 for supplying an applied voltage to a sample 12 to be measured in a sample box 3, a switch 6 for disconnecting an applied voltage of the sample 12 to be measured, and a constant voltage application and measurement time. A sample having a switching circuit 2 having an application switching switch 7 and a protection resistor 11 for preventing short circuit, a selection switch 8 for a sample 12 to be measured, a driving guard switch 9, and a Lo terminal connecting switch 10 for a constant voltage power supply 1. It is composed of a select circuit 4 and an insulation resistance meter 5 for measurement.

【0019】また、被測定試料12と試料セレクト回路
4間は、測定ケーブル13を通じ、試料セレクト回路4
のスイッチ8とスイッチ10の一端に検出信号線15が
共通に接続され、スイッチ9の一端には、ドライビング
ガード線16を接続している。
Further, between the sample to be measured 12 and the sample selection circuit 4, a sample selection circuit 4 is connected through a measurement cable 13.
The detection signal line 15 is commonly connected to one ends of the switches 8 and 10, and the driving guard line 16 is connected to one end of the switch 9.

【0020】さらに試料セレクト回路4と絶縁抵抗計5
間では、前記スイッチ8とスイッチ9の他端より、検出
信号線15とドライビングガード線16を測定ケーブル
14を通じて絶縁抵抗計5に接続され、スイッチ10の
他端からは前記絶縁抵抗計5と定電圧電源1のLo端子
にそれぞれ接続している。
Further, the sample selection circuit 4 and the insulation resistance meter 5
In between, the detection signal line 15 and the driving guard line 16 are connected to the insulation resistance meter 5 through the measurement cable 14 from the other ends of the switches 8 and 9, and the insulation resistance meter 5 is connected from the other end of the switch 10. Each is connected to the Lo terminal of the voltage power supply 1.

【0021】測定開始により、定電圧電源1に被測定試
料へ印加するための測定電圧が設定される。前記定電圧
電源1のVs−Lo端子から出力される電圧は、通常時
には保護抵抗11を介して被測定試料に対し、常に加え
続け、測定するときのみ保護抵抗11を介さずに直接印
加する。
When the measurement is started, the measurement voltage to be applied to the sample to be measured is set in the constant voltage power source 1. The voltage output from the Vs-Lo terminal of the constant voltage power supply 1 is always continuously applied to the sample to be measured via the protective resistance 11 and is directly applied only during measurement without using the protective resistance 11.

【0022】先ず、通常時の場合、切換え回路2のスイ
ッチ6は、閉状態、スイッチ7は、b接点側とし、保護
抵抗11を通じ、被測定試料12の一端に電圧を加え
る。被測定試料12の他端側では、試料セレクト回路4
のスイッチ8とスイッチ9とは開状態、スイッチ10
は、閉状態にし、前記スイッチ10により被測定試料1
2の他端を定電圧電源1のLo端子に接続し、被測定試
料12に電圧を印加して電流が流れる。この場合、被測
定試料12のマイグレーション現象により、ショート状
態が発生した際も保護抵抗11により回路は保護され
る。
First, in the normal state, the switch 6 of the switching circuit 2 is in the closed state, the switch 7 is on the b contact side, and a voltage is applied to one end of the sample 12 to be measured through the protective resistor 11. On the other end side of the measured sample 12, the sample selection circuit 4
Switch 8 and switch 9 are open, switch 10
Is closed, and the switch 10 is used to
The other end of 2 is connected to the Lo terminal of the constant voltage power supply 1, a voltage is applied to the measured sample 12, and a current flows. In this case, the circuit is protected by the protective resistor 11 even when a short-circuit state occurs due to the migration phenomenon of the measured sample 12.

【0023】次に測定時の場合、切換え回路2のスイッ
チ7をa接点側にして保護抵抗11をバイパスした経路
で被測定試料12の一端に印加電圧を加える。前記被測
定試料12の他端側では、スイッチ8とスイッチ9とは
閉状態とし、スイッチ10は、開状態で絶縁抵抗計5の
Iin端子に測定ケーブル14を通じて接続される。
Next, at the time of measurement, an applied voltage is applied to one end of the sample 12 to be measured through a path bypassing the protective resistance 11 with the switch 7 of the switching circuit 2 set to the a contact side. On the other end side of the sample to be measured 12, the switch 8 and the switch 9 are closed, and the switch 10 is connected to the Iin terminal of the insulation resistance meter 5 through the measurement cable 14 in the open state.

【0024】これによって、前記絶縁抵抗計5と定電圧
電源1とのLo端子同士が接続されて前記被測定試料1
2に印加電圧が加わり、電流は、絶縁抵抗計5を通じ、
被測定試料12に流れる。その電流を検出し、絶縁抵抗
計5で絶縁抵抗値を求める。
As a result, the Lo terminals of the insulation resistance meter 5 and the constant voltage power source 1 are connected to each other, and the sample to be measured 1 is measured.
The applied voltage is applied to 2, and the current flows through the insulation resistance tester 5.
It flows into the measured sample 12. The current is detected and the insulation resistance value is obtained by the insulation resistance meter 5.

【0025】また、前記ショート状態を検出する方法と
しては、上記の測定時の場合と同様の操作により、被測
定試料12に電圧を印加し、流れる電流を絶縁抵抗計5
により測定し、所定値以上になった時に切換え回路2の
スイッチ6により閉状態とし、前記被測定試料12への
印加電圧を停止する。
As a method for detecting the short-circuited state, a voltage is applied to the sample to be measured 12 and the flowing current is measured by the insulation resistance tester 5 by the same operation as in the above measurement.
The voltage applied to the sample 12 to be measured is stopped by closing the switch 6 of the switching circuit 2 when the measured value exceeds a predetermined value.

【0026】図2は、本発明の他の実施例をブロック図
に示したものである。切換え回路2と、試料セレクト回
路4内の各スイッチをそれぞれリレー等の外部から制御
可能なスイッチで構成し、コンントローラ・システム1
7を設けて、これらのスイッチ及び定電圧電源1の出力
電圧を制御し、絶縁抵抗計5の測定値を読み込むことに
よって、複数の被測定試料12の高絶縁抵抗を安定した
値で自動的に測定することができる。なお、図1,図2
において、定電圧電源1は、絶縁抵抗計5内に内蔵され
ていても差し支えない。
FIG. 2 is a block diagram showing another embodiment of the present invention. The switching circuit 2 and each switch in the sample selection circuit 4 are configured by switches that can be controlled from the outside, such as a relay, respectively.
7 is provided to control the output voltage of these switches and the constant voltage power supply 1, and the measured value of the insulation resistance meter 5 is read, so that the high insulation resistance of the plurality of DUTs 12 to be measured is automatically stabilized. Can be measured. 1 and 2
In the above, the constant voltage power supply 1 may be built in the insulation resistance meter 5.

【0027】[0027]

【発明の効果】以上説明したとおり本発明によれば、印
加電圧供給用切換え回路と、被測定試料の試料セレクト
回路の高絶縁化と、検出信号線とドライビングガード線
を同時に切換えることによって、従来の測定装置の信頼
性及び安定性の欠点が改善され、高絶縁抵抗の測定が可
能になる。また、高絶縁抵抗の自動測定も可能になると
いう効果を有する。
As described above, according to the present invention, the switching circuit for supplying the applied voltage, the high insulation of the sample selection circuit of the sample to be measured, and the switching of the detection signal line and the driving guard line are performed simultaneously. The drawbacks of reliability and stability of the measuring device are improved, and high insulation resistance can be measured. Further, there is an effect that automatic measurement of high insulation resistance becomes possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による絶縁抵抗測定装置の回路構成図で
ある。
FIG. 1 is a circuit configuration diagram of an insulation resistance measuring device according to the present invention.

【図2】本発明の他の実施例を示すブロック図である。FIG. 2 is a block diagram showing another embodiment of the present invention.

【図3】従来の方法による絶縁抵抗測定装置の回路構成
図である。
FIG. 3 is a circuit configuration diagram of an insulation resistance measuring device according to a conventional method.

【符号の説明】[Explanation of symbols]

1 定電圧電源 2 切換え回路 4 試料セレクト回路 5 絶縁抵抗計 12 被測定試料 17 コントローラ・システム 1 constant voltage power supply 2 switching circuit 4 sample selection circuit 5 insulation resistance tester 12 measured sample 17 controller system

───────────────────────────────────────────────────── フロントページの続き (72)発明者 位地 正年 東京都港区芝五丁目7番1号 日本電気株 式会社内 (72)発明者 石先 千春 東京都港区芝五丁目7番1号 日本電気株 式会社内 (72)発明者 生田 優司 東京都港区芝五丁目7番1号 日本電気株 式会社内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor's place New Year 5-7 Shiba, Minato-ku, Tokyo Inside NEC Corporation (72) Inventor Chiharu Ishiue 5-7 Shiba, Minato-ku, Tokyo No. 1 Inside NEC Corporation (72) Inventor Yuji Ikuta 5-7-1 Shiba, Minato-ku, Tokyo Inside NEC Corporation

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 絶縁抵抗計と、複数の被測定試料から測
定対象となる被測定試料を選択して前記絶縁抵抗計に接
続する試料セレクト回路と、測定電圧印加用の定電圧電
源と、定電圧電源からの測定電圧を被測定試料に直接印
加するか、又は保護抵抗を介して印加するかを切り換え
る切換え回路と、被測定試料選択手段とを有し、複数の
被測定試料を順次選択して該被測定試料の絶縁抵抗値を
求める絶縁抵抗測定装置であって、 前記切換え回路と試料セレクト回路とは、別々の絶縁さ
れたケース内に実装配置され、互いに絶縁された構造手
段を備え、 被測定試料と試料セレクト回路間及び試料セレクト回路
と絶縁抵抗計間は、二重シールド同軸線を用いて接続さ
れ、 被測定試料選択手段は、被測定試料の選択時に前記二重
シールド同軸線の検出信号線と、ドライビングガード線
を同時動作に切り換えるものであることを特徴とする絶
縁抵抗測定装置。
1. An insulation resistance meter, a sample selection circuit for selecting a sample to be measured from a plurality of samples to be measured and connecting the sample to the insulation resistance meter, a constant voltage power source for applying a measurement voltage, and a constant voltage source. It has a switching circuit for switching whether to apply the measurement voltage from the voltage source directly to the sample to be measured or to apply it via a protective resistor, and the sample to be measured selecting means, and selects a plurality of samples to be measured in sequence. An insulation resistance measuring device for obtaining an insulation resistance value of the sample to be measured, wherein the switching circuit and the sample selection circuit are mounted and arranged in separate insulated cases, and are provided with structural means insulated from each other, The sample to be measured and the sample select circuit, and the sample select circuit and the insulation resistance meter are connected using a double shielded coaxial line, and the sample to be measured means is connected to the double shielded coaxial line when selecting the sample to be measured. detection An insulation resistance measuring device characterized in that the signal line and the driving guard line are simultaneously switched.
JP24502391A 1991-08-30 1991-08-30 Insulation resistance measuring instrument Pending JPH0560811A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24502391A JPH0560811A (en) 1991-08-30 1991-08-30 Insulation resistance measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24502391A JPH0560811A (en) 1991-08-30 1991-08-30 Insulation resistance measuring instrument

Publications (1)

Publication Number Publication Date
JPH0560811A true JPH0560811A (en) 1993-03-12

Family

ID=17127429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24502391A Pending JPH0560811A (en) 1991-08-30 1991-08-30 Insulation resistance measuring instrument

Country Status (1)

Country Link
JP (1) JPH0560811A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102621455A (en) * 2011-01-27 2012-08-01 三星电机株式会社 Insulating detecting apparatus
JP2018112566A (en) * 2018-04-26 2018-07-19 株式会社アドバンテスト Measuring apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4931721A (en) * 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4931721A (en) * 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102621455A (en) * 2011-01-27 2012-08-01 三星电机株式会社 Insulating detecting apparatus
JP2012154914A (en) * 2011-01-27 2012-08-16 Samsung Electro-Mechanics Co Ltd Insulation checker
JP2018112566A (en) * 2018-04-26 2018-07-19 株式会社アドバンテスト Measuring apparatus

Similar Documents

Publication Publication Date Title
US4175253A (en) Analyzing electrical circuit boards
US4178543A (en) Analyzing electrical circuit boards
ES8704019A1 (en) Method for detecting and obtaining information about changes in variables.
US4176313A (en) Analyzing electrical circuit boards
CA1144236A (en) Analyzing elctrical circuit boards
EP0927885B1 (en) Apparatus for measuring conductivity, pH and dissolved oxygen
JPH0560811A (en) Insulation resistance measuring instrument
JPH01502391A (en) Cable failure detection device
US4897606A (en) Method and apparatus for undesired ground path detection in a single-point grounded electrical system
US3037161A (en) Method and apparatus for locating faults in transmission lines
JPH07151811A (en) Testing apparatus for withstand voltage
JP3155310B2 (en) Two-terminal circuit element measuring device with contact check function and contact check method for measured object
US3694736A (en) Apparatus for locating conductor discontinuity in semi-conducting shielded cable
GB2076165A (en) Programmable Wiring Tester
JPH0712940Y2 (en) IC test equipment
JPH08170975A (en) Partial discharge detector for electric apparatus
JPH0453581Y2 (en)
JPH033912B2 (en)
JP3622171B2 (en) Earth leakage detection device
RU2029968C1 (en) Electric circuit insulation tester
CA1144238A (en) Analyzing electrical circuit boards
JP2001083203A (en) Method and apparatus for checking disconnection of hot- line deterioration diagnosing device
CA1153424A (en) Analyzing electrical circuit boards
CA1166311A (en) Analyzing electrical circuit boards
JPH0637347Y2 (en) IC test scanner