JPH0560789A - Coaxial probe - Google Patents

Coaxial probe

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Publication number
JPH0560789A
JPH0560789A JP21911091A JP21911091A JPH0560789A JP H0560789 A JPH0560789 A JP H0560789A JP 21911091 A JP21911091 A JP 21911091A JP 21911091 A JP21911091 A JP 21911091A JP H0560789 A JPH0560789 A JP H0560789A
Authority
JP
Japan
Prior art keywords
coaxial
probe
coaxial cable
terminal
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21911091A
Other languages
Japanese (ja)
Inventor
Takafumi Matsunaga
隆文 松永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Miyachi Systems Co Ltd
Original Assignee
Miyachi Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Miyachi Systems Co Ltd filed Critical Miyachi Systems Co Ltd
Priority to JP21911091A priority Critical patent/JPH0560789A/en
Publication of JPH0560789A publication Critical patent/JPH0560789A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To make it possible to perform highly accurate measurement in a broad range by expanding applicability for bodies under tests with respect to the constitution of a coaxial cable. CONSTITUTION:A connecting pin 5 is connected to an inner conductor 16 of a coaxial cable 2 and brought into contact with the first signal terminal of a body under test. The connecting pin 5 is made to protrude to the outside. A connecting plate 19 is connected to an outer conductor 17 of the coaxial cable 2 and brought into contact with the grounding terminal or the second signal terminal of the body under test. The connecting plate 19 is made to extend to the outside of the connecting pin 5. This probe is constituted in this way. The connecting plate 19 is formed in a disk shape, which is coaxial with the connecting pin 5. The connecting plate 19 is slid in the longitudinal direction of the connecting pin 5, and the surface of the plate 19 is in contact with the grounding terminal or the second signal terminal. A rubber-state buffer material for backing up the contact is provided at the rear surface of the connecting plate 19 in this constitution.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電送路の電送特性及び
電子回路部品の特性を測定する際、被試験体に接触させ
る同軸プローブに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a coaxial probe which is brought into contact with a device under test when measuring the transmission characteristics of a transmission path and the characteristics of electronic circuit components.

【0002】[0002]

【従来の技術】図8(イ) は従来の同軸用プローブを示す
外観図であり、一端に同軸コネクタ1を接続した同軸ケ
ーブル2の他端に信号プローブ3を接続し、端子7を介
して信号プローブ3にアースプローブ4を接続する。
2. Description of the Related Art FIG. 8 (a) is an external view showing a conventional coaxial probe, in which a signal probe 3 is connected to the other end of a coaxial cable 2 in which a coaxial connector 1 is connected to one end, and a terminal 7 is used. The ground probe 4 is connected to the signal probe 3.

【0003】信号プローブ3の先端には、同軸ケーブル
2の内部導体に接続する接続ピン5が突出し、同軸ケー
ブル2の外部導体に接続する信号プローブ3の外筒部6
に、端子7を介してアースプローブ4の接続ピン8が接
続する。接続ピン5及び8は、プローブ3又は4の長さ
方向に摺動可能である。
A connecting pin 5 for connecting to the inner conductor of the coaxial cable 2 projects at the tip of the signal probe 3 and an outer cylindrical portion 6 of the signal probe 3 for connecting to the outer conductor of the coaxial cable 2.
To the connection pin 8 of the earth probe 4 via the terminal 7. The connection pins 5 and 8 are slidable in the length direction of the probe 3 or 4.

【0004】9は信号プローブ3の把手部、10はアース
プローブ4の把手部であり、信号プローブ3及びアース
プローブ4は、それらの把手部9又は10は手に持って、
被試験体の接続相手端子に接触させることになる。
Reference numeral 9 denotes a handle portion of the signal probe 3, 10 denotes a handle portion of the earth probe 4, and the signal probe 3 and the earth probe 4 hold those handle portions 9 or 10 in their hands.
It comes into contact with the connection partner terminal of the DUT.

【0005】図8(ロ) は従来の同軸プローブを示す外観
図であり、同軸プローブ11は、一端に同軸コネクタ1を
接続した同軸ケーブル2の他端に接続する。同軸ケーブ
ル2の内部導体に接続する接続ピン5と、同軸ケーブル
2の外部導体に接続するアース接続ピン12とは、同軸プ
ローブ11の長さ方向に摺動可能である。
FIG. 8B is an external view showing a conventional coaxial probe. The coaxial probe 11 is connected to the other end of the coaxial cable 2 having the coaxial connector 1 connected to one end. The connection pin 5 connected to the inner conductor of the coaxial cable 2 and the ground connection pin 12 connected to the outer conductor of the coaxial cable 2 are slidable in the length direction of the coaxial probe 11.

【0006】接続ピン12の先端の一部には、被試験体の
アース端子との接触確保のため、鋸歯状の凹凸(ギザギ
ザ)が形成されており、かかる同軸プローブ11は、把手
部13を手に持って被試験体の接続相手端子に接触させる
ことになる。
In order to secure contact with the ground terminal of the device under test, a part of the tip of the connecting pin 12 is provided with sawtooth-shaped irregularities (jagged). Hold it in your hand and make contact with the mating terminal of the DUT.

【0007】[0007]

【発明が解決しようとする課題】信号プローブ3とアー
スプローブ4とに分離された従来のプローブは、被試験
体の信号端子とアース端子との間隔と無関係に、接続ピ
ン5と8の接触が可能となる。しかし、その手操作には
両手が必要となり、アース用接続ピン8は端子7を介し
て同軸ケーブル2の外部導体に接続しているため、イン
ピーダンスが平衡でなくなり、精密測定ができないとい
う問題点があった。
In the conventional probe separated into the signal probe 3 and the earth probe 4, the contact between the connection pins 5 and 8 is independent of the distance between the signal terminal of the DUT and the earth terminal. It will be possible. However, both hands are required for the manual operation, and since the grounding connection pin 8 is connected to the outer conductor of the coaxial cable 2 through the terminal 7, the impedance becomes unbalanced and precision measurement cannot be performed. there were.

【0008】他方、同軸プローブ11は片手操作で、接触
ピン5と12とを被試験体の信号端子とアース端子とに接
続可能であり、平衡インピーダンスが確保されることに
なるが、被試験体の信号端子とアース端子との間隔が一
定でなければならず、該間隔が異なる被試験体に対応し
専用となるため、複数本用意しなければならないという
問題点があった。
On the other hand, the coaxial probe 11 can be operated by one hand to connect the contact pins 5 and 12 to the signal terminal and the ground terminal of the device under test, and the balanced impedance will be secured. Since the distance between the signal terminal and the ground terminal must be constant, and it is dedicated for the DUTs having different distances, there is a problem in that a plurality of them must be prepared.

【0009】[0009]

【課題を解決するための手段】図1は本発明の基本構成
図であり、絶縁体(誘電体)15を介して内部導体16と外
部導体17とが同軸である同軸ケーブル2の一端に接続す
る同軸プローブ21は、被試験体の信号端子(第1の端
子)に接触される接続ピン5と、被試験体のアース端子
又は他の信号端子(第2の端子)に接触される接続プレ
ート19を有する。
FIG. 1 is a basic configuration diagram of the present invention, in which an inner conductor 16 and an outer conductor 17 are coaxially connected to one end of an coaxial cable 2 through an insulator (dielectric body) 15. The coaxial probe 21 includes a connection pin 5 that contacts the signal terminal (first terminal) of the DUT, and a connection plate that contacts the ground terminal or another signal terminal (second terminal) of the DUT. Has 19.

【0010】接続ピン5は、同軸ケーブル2の内部導体
16に接続する。接続プレート19は、同軸ケーブル2の外
部導体17に接続し、かつ、接続ピン5の少なくとも一方
の外方に延在する。
The connection pin 5 is an inner conductor of the coaxial cable 2.
Connect to 16. The connection plate 19 connects to the outer conductor 17 of the coaxial cable 2 and extends outside at least one of the connection pins 5.

【0011】[0011]

【作用】一般的に同軸線路は、図2(イ) に示す如き平行
平面の導体21と22を環状に接続し、図2(ロ) に示す如
く、筒状の内部導体16と外部導体17とを同軸に対向させ
たものと考えられる。そこで、図2に示すように直行す
るX,Y,Z軸を選定すると、導体21,22 間をZ軸方向
(内部導体16と外部導体17の長さ方向)に伝送する平面
波は、Y軸方向の電界をEy,Z軸方向の磁界をHz,導体
間 (絶縁体) の誘電率をε, 導体間 (絶縁体) の透磁率
をμとしたとき、 Ey =E0 ・exp [jwt−γZ] −Hz =H0 ・exp [jwt−γZ] E0/H0 =(μ/ε)1/2,γ=jw(εμ)1/2 で表される。
In general, a coaxial line is formed by connecting parallel plane conductors 21 and 22 in an annular shape as shown in FIG. 2 (a), and as shown in FIG. 2 (b), a cylindrical inner conductor 16 and outer conductor 17 It is thought that they are coaxially opposed to each other. Therefore, if the orthogonal X, Y, and Z axes are selected as shown in FIG. 2, the plane wave transmitted between the conductors 21 and 22 in the Z axis direction (the length direction of the inner conductor 16 and the outer conductor 17) is Where the electric field in the direction is Ey, the magnetic field in the Z-axis direction is Hz, the permittivity between conductors (insulators) is ε, and the permeability between conductors (insulators) is μ, Ey = E 0 · exp [jwt− γZ] −Hz = H 0 · exp [jwt−γZ] E 0 / H 0 = (μ / ε) 1/2 , γ = jw (εμ) 1/2

【0012】これより、マクスウェルの方程式及び導体
面の境界条件を満足する定在波(伝送波)電界Er,Eθ
は、 Er =(μ/ε)1/2・H0/ r・exp [jwt−γZ] Eθ=H0/r ・exp [jwt−γZ] となる。
From this, the standing wave (transmitted wave) electric fields Er and Eθ satisfying the Maxwell equation and the boundary condition of the conductor surface.
Is a Er = (μ / ε) 1/2 · H 0 / r · exp [jwt-γZ] Eθ = H 0 / r · exp [jwt-γZ].

【0013】従って、図2(ロ) より導体間の電位差V
は、 V=∫Er dr =(μ/ε)1/2・H 0・log (D/d) ・exp [jwt−γZ] (但し、積分はd/2からD/2まで) となり、内部導体16を流れる全電流Iは、内部導体16の
直径をd,外部導体17の内径をDとしたとき、 I=2πrH0 =2πrH0 ・exp [jwt−γZ] となる。
Therefore, from FIG. 2B, the potential difference V between the conductors is
Is V = ∫Er dr = (μ / ε) 1/2 · H 0 · log (D / d) · exp [jwt-γZ] (However, the integral is from d / 2 to D / 2) The total current I flowing through the conductor 16 is I = 2πrH 0 = 2πrH 0 · exp [jwt-γZ], where d is the diameter of the inner conductor 16 and D is the inner diameter of the outer conductor 17.

【0014】これにより、同軸線路の特性インピーダン
スZ0 は、 Z0 =V/I =(1/2π)・(μ/ε)1/2・log(D/d) =60・(μs /εs )1/2・log(D/d) で定義される。
As a result, the characteristic impedance Z 0 of the coaxial line is Z 0 = V / I = (1 / 2π)  (μ / ε) 1 / 2log (D / d) = 60 (μ s / ε s ) 1/2 · log (D / d).

【0015】以上の原理により同軸線路のインピーダン
スは、内部導体16と外部導体17との間の絶縁体の誘電率
と、内部導体16から外部導体17迄の距離で決定する。従
って、同軸状態を崩さなければ平衡インピーダンスとな
り、外方に延在する平板状接続プレート19を外部導体17
に設けてもその部分は前記原理を満たしているため、平
衡インピーダンスが維持されることになる。
On the basis of the above principle, the impedance of the coaxial line is determined by the dielectric constant of the insulator between the inner conductor 16 and the outer conductor 17 and the distance from the inner conductor 16 to the outer conductor 17. Therefore, if the coaxial state is not broken, the impedance becomes balanced, and the flat connecting plate 19 extending outward is connected to the outer conductor 17.
Even if it is provided, the portion satisfies the above-mentioned principle, so that the balanced impedance is maintained.

【0016】本発明の同軸プローブ21は、同軸ケーブル
の内部導体に導体に接続する接続ピンと、前記平面状ア
ース接続用プレートとを備え、基本的に図1の如く構成
したものであり、平衡インピーダンスを確保して片手操
作が可能であり、かつ、被試験体に対し信号端子とアー
ス端子 (他の信号端子) との間隔が異なるも共通使用を
可能とする。
The coaxial probe 21 of the present invention is basically configured as shown in FIG. 1 and includes a connecting pin for connecting the inner conductor of the coaxial cable to the conductor and the plate for grounding the ground, and has a balanced impedance. It is possible to operate with one hand by ensuring that the distance between the signal terminal and the ground terminal (other signal terminal) is different for the DUT.

【0017】[0017]

【実施例】図3は本発明の第1の実施例による同軸プロ
ーブの側面図(イ) と正面図(ロ) 、図4は本発明の第2の
実施例による同軸プローブの側面図(イ) とそれを被試験
体に接触させた説明図(ロ) 、図5は本発明の第3の実施
例による同軸プローブの一部分を破断した側面図(イ) と
そのA矢視図(ロ) とアースプレートの斜視図(ハ) 、図6
は本発明の第4の実施例による同軸プローブの側面図
(イ) とそのA矢視図(ロ) 、図7は本発明の第5の実施例
による同軸プローブの側面図である。
FIG. 3 is a side view (a) and a front view (b) of a coaxial probe according to a first embodiment of the present invention, and FIG. 4 is a side view (a) of a coaxial probe according to a second embodiment of the present invention. ) And an explanatory view (B) in which it is brought into contact with the device under test, and FIG. 5 is a side view (A) in which a part of the coaxial probe according to the third embodiment of the present invention is cut away and (A) its arrow view. And perspective view of the earth plate (C), Fig. 6
FIG. 6 is a side view of a coaxial probe according to a fourth embodiment of the present invention.
FIG. 7B is a side view of the coaxial probe according to the fifth embodiment of the present invention.

【0018】図3において、同軸ケーブル2を接続した
同軸プローブ25は、従来の同軸プローブ11のアース用接
続端子12の先端に円板状のアースプレート(接続プレー
ト)26を設けた構成であり、右端より突出し被試験体の
信号端子(第1の信号端子)に接触する接続ピン5と、
被試験体のアース端子または他の信号端子(第2の信号
端子)に接触するアースプレート26は、従来の接続ピン
5および接続端子12と同様に、同軸プローブ25の長さ方
向に摺動可能である。
In FIG. 3, the coaxial probe 25 to which the coaxial cable 2 is connected has a structure in which a disk-shaped ground plate (connection plate) 26 is provided at the tip of the grounding connection terminal 12 of the conventional coaxial probe 11. A connecting pin 5 protruding from the right end and contacting the signal terminal (first signal terminal) of the device under test;
The ground plate 26 that contacts the ground terminal of the DUT or another signal terminal (second signal terminal) can slide in the length direction of the coaxial probe 25, like the conventional connection pin 5 and the connection terminal 12. Is.

【0019】かかる同軸プローブ25は、把手部9を適当
なホルダーに固定または手に持って操作し、接続ピン5
を被試験体の所定の信号端子に接触せしめると共に、被
試験体のアース端子または他の信号端子にアースプレー
ト26を接触せしめる。
The coaxial probe 25 is operated by fixing the handle portion 9 to an appropriate holder or holding it in the hand and operating it.
Is brought into contact with a predetermined signal terminal of the device under test, and the earth plate 26 is brought into contact with the earth terminal of the device under test or another signal terminal.

【0020】図4に示す如く、同軸ケーブル2を接続し
た同軸プローブ30において、31は上方に延在し適当な角
度で屈曲する把手部、32は本体部、33はゴム等にてなる
緩衝板、34は本体部32に接合し緩衝板33を介してアース
プレート26をバックアップするバックアップ部材であ
り、同軸ケーブル2の外部導体に接続した円板状アース
プレート26の中心部より接続ピン5が突出する。
As shown in FIG. 4, in the coaxial probe 30 to which the coaxial cable 2 is connected, 31 is a handle portion extending upward and bent at an appropriate angle, 32 is a main body portion, and 33 is a buffer plate made of rubber or the like. , 34 are backup members that are joined to the main body 32 and back up the earth plate 26 via the buffer plate 33, and the connecting pin 5 projects from the center of the disk-shaped earth plate 26 connected to the outer conductor of the coaxial cable 2. To do.

【0021】接続ピン5とアースプレート26とは本体部
32の長さ方向に摺動可能であり、把手部31を手に持って
図4(ロ) に示す如く、接続ピン5を被試験体35の信号端
子36に接触せしめると共に、アースプレート26を被試験
体35のアース端子37に接触せしめる。その際、例えばゴ
ムにてなる緩衝材33は、アースプレート26をアース端子
37に向けて押圧する。その結果、アースプレート26はア
ース端子37の凹凸に対応し、かつ、アース端子37と均一
に接触するようになる。
The connecting pin 5 and the earth plate 26 are the main body
It is slidable in the length direction of 32, and while holding the grip portion 31 in the hand, the connecting pin 5 is brought into contact with the signal terminal 36 of the DUT 35 and the earth plate 26 is held as shown in FIG. 4B. Contact the ground terminal 37 of the DUT 35. At this time, the cushioning material 33 made of rubber, for example, connects the earth plate 26 to the earth terminal.
Press toward 37. As a result, the ground plate 26 corresponds to the unevenness of the ground terminal 37 and comes into uniform contact with the ground terminal 37.

【0022】図5において、同軸ケーブル2を接続した
同軸プローブ40は、同軸ケーブル2の内部導体に接続さ
れた接続ピン5が本体部41の下端より突出する。接続ピ
ン5は従来のそれと同様に本体部41の長さ方向に摺動可
能であり、本体部41の中間部には把手部42を固着する。
5, in the coaxial probe 40 to which the coaxial cable 2 is connected, the connection pin 5 connected to the inner conductor of the coaxial cable 2 projects from the lower end of the main body 41. The connection pin 5 is slidable in the longitudinal direction of the main body 41 as in the conventional case, and the grip 42 is fixed to the middle of the main body 41.

【0023】緩衝板43はアースプレート44の上面に接着
し、アースプレート44をバックアップするため緩衝板43
の上面に接着したバックアップ部材45と把手部42との間
には複数個のコイルばね46を挿着し、コイルばね46によ
って吊着されたバックアップ部材45に植設した一対のピ
ン47は、把手部42に設けた貫通孔と摺動自在に嵌合す
る。
The buffer plate 43 is adhered to the upper surface of the ground plate 44 and is used to back up the ground plate 44.
A plurality of coil springs 46 are inserted between the backup member 45 adhered to the upper surface of the and the grip portion 42, and the pair of pins 47 planted in the backup member 45 suspended by the coil springs 46 are grips. It is slidably fitted in a through hole provided in the portion 42.

【0024】同軸ケーブル2の外部導体に接続され、従
来のアース用接続端子12と同様に本体部41の長さ方向に
摺動可能なアースプレート44は、接続ピン5の外方に向
かう2方向に延在する長方形であり、緩衝板43及びバッ
クアップ部材45もアースプレート44に適応する角形状で
あり、把手部42を持って同軸プローブ40を被試験体に接
触させる。
The earth plate 44, which is connected to the outer conductor of the coaxial cable 2 and is slidable in the longitudinal direction of the main body 41 in the same manner as the conventional earth connecting terminal 12, has two directions toward the outside of the connecting pin 5. Is a rectangular shape that extends to the base plate, and the buffer plate 43 and the backup member 45 are also square shapes adapted to the ground plate 44, and the coaxial probe 40 is brought into contact with the DUT by holding the grip portion 42.

【0025】図6において、同軸ケーブル2を接続した
同軸プローブ50は、被試験体の自動検査機に装着するた
めの構成であり、プローブ本体部41の中間部を固着した
ホルダー51はL字形状である。緩衝板43はアースプレー
ト44の上面に接着し、アースプレート44をバックアップ
するため緩衝板43の上面に接着したバックアップ部材45
と把手部42との間には複数個のコイルばね46を挿着し、
コイルばね46によって吊着されたバックアップ部材45に
植設した一対のピン47は、垂直片部に装着用の孔52を設
けたホルダー51の水平片部に設けた貫通孔と摺動自在に
嵌合する。
In FIG. 6, the coaxial probe 50 to which the coaxial cable 2 is connected is configured to be mounted on an automatic inspecting machine of the DUT, and the holder 51 to which the middle portion of the probe main body 41 is fixed is L-shaped. Is. The buffer plate 43 is adhered to the upper surface of the earth plate 44, and the backup member 45 adhered to the upper surface of the buffer plate 43 for backing up the earth plate 44.
And a plurality of coil springs 46 are inserted between the handle portion 42 and the handle portion 42,
The pair of pins 47 planted in the backup member 45 suspended by the coil spring 46 is slidably fitted in the through hole provided in the horizontal piece of the holder 51 having the hole 52 for mounting in the vertical piece. To meet.

【0026】同軸ケーブル2の内部導体に接続した接続
ピン5及び、同軸ケーブル2の外部導体に接続したアー
スプレート44は、プローブ本体部41の長さ方向に摺動可
能であり、バックアップ部材45とホルダー51との間に
は、複数個のコイルばね46を挿着し、バックアップ部材
45に植設した一対のピン47は、ホルダー51に設けた貫通
孔と摺動自在に嵌合する。
The connecting pin 5 connected to the inner conductor of the coaxial cable 2 and the earth plate 44 connected to the outer conductor of the coaxial cable 2 are slidable in the length direction of the probe main body 41, and are connected to the backup member 45. A plurality of coil springs 46 are inserted between the holder 51 and the backup member.
The pair of pins 47 planted in the 45 are slidably fitted into the through holes provided in the holder 51.

【0027】かかる同軸プローブ50は、ホルダー51を上
下動させることによって、接続ピン5とアースプレート
44が被試験体にの所定部に接触する。図7は複数個所
(図は7個所)の測定を同時に行う同軸プローブ55の構
成であり、適当な構成部材に装着し上下動するホルダー
56に複数本 (図は7本)のプローブ本体部41を固着し、
各プローブ本体部41には同軸ケーブル2を接続する。
In the coaxial probe 50, the holder 51 is moved up and down to connect the connecting pin 5 and the earth plate.
44 contacts a predetermined portion of the DUT. FIG. 7 shows a structure of a coaxial probe 55 that simultaneously measures at a plurality of locations (seven locations in the figure), and is a holder which is mounted on an appropriate component and moves up and down.
Attach multiple probe body parts 41 (seven in the figure) to 56,
The coaxial cable 2 is connected to each probe body 41.

【0028】各プローブ本体部41からは、同軸ケーブル
2の内部導体に接続する接続ピン5が突出し、複数のプ
ローブ本体部41に対し共通のアースプレート57は、各同
軸ケーブル2の外部導体に接続し上下動可能であり、ア
ースプレート57と同形状の緩衝板58を介してアースプレ
ート57をバックアップするバックアップ部材59には一対
のピン47を植設し、一対のピン47はホルダー56に設けた
貫通孔に嵌合して上下方向に摺動可能であり、ホルダー
56とバックアップ部材59との間には、バックアップ部材
59を吊着する複数個のコイルばね46が挿着されている。
A connecting pin 5 for connecting to the inner conductor of the coaxial cable 2 projects from each probe body 41, and a common ground plate 57 for a plurality of probe bodies 41 connects to the outer conductor of each coaxial cable 2. A pair of pins 47 are planted in the backup member 59 that backs up the ground plate 57 via a buffer plate 58 having the same shape as the ground plate 57, and the pair of pins 47 are provided in the holder 56. It fits into the through hole and can slide up and down.
Between 56 and backup member 59, backup member
A plurality of coil springs 46 for hanging 59 are inserted.

【0029】[0029]

【発明の効果】以上説明したように構成した本発明の同
軸プローブは、信号端子とアース端子との間隔が異なる
被試験体に対し、平衡インピーダンスを損なうことなく
共通に使用可能であり、実験室レベルのマニュアル測定
から自動測定システムまでの広範囲に渡り、かつ、抵
抗,容量,インダクタンス,インピーダンスの高精度測
定が可能であるという応用性に優れた効果がある。
The coaxial probe of the present invention configured as described above can be commonly used for DUTs having different distances between the signal terminal and the ground terminal without damaging the balanced impedance. It has a wide range of applications from manual measurement of level to automatic measurement system, and it is possible to measure resistance, capacitance, inductance, and impedance with high precision, which is an excellent application.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の基本構成図である。FIG. 1 is a basic configuration diagram of the present invention.

【図2】 同軸ケーブルの特性インピーダンスを説明す
るための図である。
FIG. 2 is a diagram for explaining a characteristic impedance of a coaxial cable.

【図3】 本発明の第1の実施例による同軸プローブの
説明図である。
FIG. 3 is an explanatory diagram of a coaxial probe according to a first embodiment of the present invention.

【図4】 本発明の第2の実施例による同軸プローブの
説明図である。
FIG. 4 is an explanatory diagram of a coaxial probe according to a second embodiment of the present invention.

【図5】 本発明の第3の実施例による同軸プローブの
説明図である。
FIG. 5 is an explanatory diagram of a coaxial probe according to a third embodiment of the present invention.

【図6】 本発明の第4の実施例による同軸プローブの
説明図である。
FIG. 6 is an explanatory diagram of a coaxial probe according to a fourth embodiment of the present invention.

【図7】 本発明の第5の実施例による同軸プローブの
説明図である。
FIG. 7 is an explanatory diagram of a coaxial probe according to a fifth embodiment of the present invention.

【図8】 従来の同軸用プローブの外観図である。FIG. 8 is an external view of a conventional coaxial probe.

【符号の説明】[Explanation of symbols]

2は同軸ケーブル 5は第1の信号端子に接触する接続ピン 16は同軸ケーブルの内部導体 17は同軸ケーブルの外部導体 19,26,44,57 は接続プレート (アースプレート) 21,25,30,40,50は同軸プローブ 33,43,58はゴム状緩衝材 36は第1の信号端子 37はアース端子(又は第2の信号端子) 2 is a coaxial cable 5 is a contact pin that contacts the first signal terminal 16 is an inner conductor of the coaxial cable 17 is an outer conductor of the coaxial cable 19,26,44,57 is a connection plate (earth plate) 21,25,30, 40 and 50 are coaxial probes 33, 43 and 58 are rubber-like cushioning materials 36 are first signal terminals 37 are ground terminals (or second signal terminals)

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 同軸ケーブル(2) の内部導体に接続し被
試験体の第1の信号端子(36)に接触する接続ピン(5) が
突出し、該同軸ケーブル(2) の外部導体に接続し該被試
験体のアース端子(37)又は第2の信号端子と接触する接
続プレート(19)が該接続ピン(5) の外方に延在すること
を特徴とする同軸プローブ。
1. A connecting pin (5), which is connected to the inner conductor of the coaxial cable (2) and is in contact with the first signal terminal (36) of the device under test, projects and is connected to the outer conductor of the coaxial cable (2). A coaxial probe characterized in that a connection plate (19) contacting the ground terminal (37) or the second signal terminal of the device under test extends outside the connection pin (5).
【請求項2】 前記接続プレート(19)が前記接続ピン
(5) と同軸の円板状であることを特徴とする請求項1記
載の同軸プローブ。
2. The connection plate (19) is the connection pin.
The coaxial probe according to claim 1, wherein the coaxial probe has a disk shape coaxial with (5).
【請求項3】 前記接続ピン(5) の長さ方向に摺動し表
面が前記アース端子(37)又は第2の信号端子と接触する
前記接続プレート(19)の裏面に、該接触をバックアップ
するゴム状緩衝材(33,43,58)を設けたことを特徴とする
請求項1記載の同軸プローブ。
3. The contact pin is backed up on the back surface of the connection plate (19) whose surface slides in the length direction of the connection pin (5) and contacts the ground terminal (37) or the second signal terminal. The coaxial probe according to claim 1, further comprising a rubber-like cushioning material (33, 43, 58) which is provided.
JP21911091A 1991-08-30 1991-08-30 Coaxial probe Pending JPH0560789A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21911091A JPH0560789A (en) 1991-08-30 1991-08-30 Coaxial probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21911091A JPH0560789A (en) 1991-08-30 1991-08-30 Coaxial probe

Publications (1)

Publication Number Publication Date
JPH0560789A true JPH0560789A (en) 1993-03-12

Family

ID=16730411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21911091A Pending JPH0560789A (en) 1991-08-30 1991-08-30 Coaxial probe

Country Status (1)

Country Link
JP (1) JPH0560789A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002025298A1 (en) * 2000-09-25 2002-03-28 Oht Inc. Inspection unit and method of manufacturing substrate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002025298A1 (en) * 2000-09-25 2002-03-28 Oht Inc. Inspection unit and method of manufacturing substrate
US6894515B2 (en) 2000-09-25 2005-05-17 Oht, Inc. Inspection unit and method of manufacturing substrate

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