JPH0557170A - Vacuum treatment apparatus - Google Patents

Vacuum treatment apparatus

Info

Publication number
JPH0557170A
JPH0557170A JP21766391A JP21766391A JPH0557170A JP H0557170 A JPH0557170 A JP H0557170A JP 21766391 A JP21766391 A JP 21766391A JP 21766391 A JP21766391 A JP 21766391A JP H0557170 A JPH0557170 A JP H0557170A
Authority
JP
Japan
Prior art keywords
chamber
vacuum
substrate
reaction chamber
sluice valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21766391A
Other languages
Japanese (ja)
Inventor
Atsushi Kaido
厚志 海藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21766391A priority Critical patent/JPH0557170A/en
Publication of JPH0557170A publication Critical patent/JPH0557170A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent dust deposition on a substrate to be treated due to the flow of a large amount of gas at the instant of the opening of a gate valve by decreasing the pressure difference between a reaction chamber and a prepara tion chamber when the substrate to be treated is delivered between the chambers. CONSTITUTION:In a vacuum treatment apparatus in which a reaction chamber 2 for vacuum treatment of a substrate to be treated 1 and a preparation chamber 4 are connected by a gate valve 3 admitting delivery of the substrate to be treated 1, a second gate valve 11 having smaller conductance than that of the gate valve 3 is installed in parallel with the gate valve 3.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は真空処理装置に関し、特
に気相成長装置等において被処理基板を処理すべく反応
室と予備室の両室が仕切弁により仕切られた構造の真空
処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vacuum processing apparatus, and more particularly to a vacuum processing apparatus having a structure in which both a reaction chamber and a preliminary chamber are partitioned by a sluice valve to process a substrate to be processed in a vapor phase growth apparatus or the like. ..

【0002】[0002]

【従来の技術】従来この種の真空処理装置は、図3の構
成図に示す様に、被処理基板1を処理する反応室2、仕
切弁3により反応室2と接続される予備室4、前記各室
の圧力を測定する圧力センサー5,6及び前記各室を所
望の真空度にする為の真空ポンプ7,8を有している。
本装置において、反応室2の真空を破壊せずに被処理基
板1を予備室4との間で授受する際には、予備室4を真
空ポンプ8で真空引きし、圧力センサー6により、予備
室4がある所定の圧力下になった時点で前記仕切弁3を
開けるという方法を用いていた。ここで所定の圧力と
は、真空ポンプ8による予備室4の到達真空度よりも若
干低真空度の値を設定するのが一般である。
2. Description of the Related Art Conventionally, a vacuum processing apparatus of this type has a reaction chamber 2 for processing a substrate 1 to be processed, a preparatory chamber 4 connected to the reaction chamber 2 by a sluice valve 3, as shown in FIG. It has pressure sensors 5 and 6 for measuring the pressure of each chamber and vacuum pumps 7 and 8 for making each chamber a desired degree of vacuum.
In this apparatus, when the substrate 1 to be processed is transferred to and from the preparatory chamber 4 without breaking the vacuum of the reaction chamber 2, the preparatory chamber 4 is evacuated by the vacuum pump 8 and the preparatory chamber 4 is operated by the pressure sensor 6. The method of opening the sluice valve 3 when the chamber 4 is under a predetermined pressure is used. Here, the predetermined pressure is generally set to a value that is slightly lower than the ultimate vacuum of the auxiliary chamber 4 by the vacuum pump 8.

【0003】[0003]

【発明が解決しようとする課題】しかしながら上述した
従来の真空処理装置において、予備室4に用いる真空ポ
ンプ8は、予備室4の容積が反応室2に比し小さい為、
反応室2用真空ポンプ7,8に比べ排気能力の劣るポン
プを用いるのが一般的であり、真空ポンプの性能及び各
室の容積の違いから、両室の到達真空度には必然的に差
異が生じた。又、仮に各室の容積が同じで同性能の真空
ポンプを使用した場合でも、真空ポンプの劣化の度合や
真空配管9のコンダクタンスの違いにより、両室の到達
真空度は異なってくる。
However, in the above-mentioned conventional vacuum processing apparatus, the vacuum pump 8 used for the preliminary chamber 4 has a smaller volume than that of the reaction chamber 2.
It is general to use a pump having an exhausting capacity inferior to the vacuum pumps 7 and 8 for the reaction chamber 2. Due to the difference in the performance of the vacuum pump and the volume of each chamber, the ultimate vacuum degree of both chambers inevitably differs. Has occurred. Further, even if vacuum chambers having the same volume and the same performance are used, the ultimate vacuum degree of both chambers varies depending on the degree of deterioration of the vacuum pump and the difference in conductance of the vacuum pipe 9.

【0004】上述の理由により、予備室4の真空度がほ
ぼ到達真空度に達した状態で仕切弁3を開けるという方
法では、両室の真空度の違いから生ずる圧力差により、
反応室2と予備室4の間に気体の流れが発生してしま
う。又、被処理基板1の支障なき運搬を可能とする為
に、仕切弁3を開いた状態での両室の接続開口部は広く
設けられており、従ってコンダクタンスは非常に大きく
単位時間当りの前述の気体の流れる体積は非常に大きい
ものである。この瞬時における大量の気体の流れは、真
空処理工程の際に発生し且つ反応室2の下部に沈澱もし
くは反応室内壁に付着していた塵埃を浮遊させ、被処理
基板に再付着させることになり、前記塵埃が次の真空処
理に悪影響を及ぼすという欠点となっていた。
For the above-mentioned reason, in the method of opening the sluice valve 3 in a state where the degree of vacuum in the auxiliary chamber 4 has almost reached the ultimate level, the pressure difference caused by the difference in the degree of vacuum in both chambers causes
A gas flow is generated between the reaction chamber 2 and the auxiliary chamber 4. Further, in order to enable the transport of the substrate 1 to be processed without any hindrance, the connection opening portions of both chambers with the sluice valve 3 opened are widely provided, and therefore the conductance is very large and the above-mentioned per unit time is large. The flow volume of the gas is very large. The large amount of gas flow at this moment causes the dust generated in the vacuum processing step and settled in the lower part of the reaction chamber 2 or floating on the inner wall of the reaction chamber to be reattached to the substrate to be processed. However, there is a drawback that the dust has an adverse effect on the next vacuum processing.

【0005】[0005]

【課題を解決するための手段】本発明は、被処理基板を
真空処理する反応室と、予備室とが前記被処理基板を授
受可能な仕切弁にて接続され、且つ前記各室を所望の真
空度にするための真空ポンプを各々独立に具備する真空
処理装置において、前記反応室と予備室とを接続する前
記仕切弁のほかに、この仕切弁よりも小さいコンダクタ
ンスを有する第2の仕切弁を並列接続した構造を備えて
いる。
According to the present invention, a reaction chamber for vacuum-treating a substrate to be processed and a preparatory chamber are connected by a sluice valve capable of transferring the substrate to be processed, and each chamber is provided with a desired chamber. In a vacuum processing apparatus each independently equipped with a vacuum pump for achieving a vacuum degree, in addition to the sluice valve connecting the reaction chamber and the auxiliary chamber, a second sluice valve having a conductance smaller than that of the sluice valve. It has a structure in which are connected in parallel.

【0006】[0006]

【実施例】次に本発明について図面を参照して説明す
る。図1は本発明の実施例1の真空処理装置を示す構成
図である。本実施例の真空処理装置は特に減圧気相成長
を行なうものであり、被処理基板1に気相成長を行なう
反応室2,仕切弁3によって反応室2と接続した予備室
4,各室の圧力を測定する圧力センサー5,6,各室を
真空にする真空ポンプ7,8,真空ポンプと各室を接続
する為の真空配管9及びメインバルブ10,さらに本実
施例の特徴である第2の仕切弁11を仕切弁3と並列接
続している。
The present invention will be described below with reference to the drawings. 1 is a configuration diagram showing a vacuum processing apparatus according to a first embodiment of the present invention. The vacuum processing apparatus of the present embodiment is particularly for performing reduced pressure vapor phase growth, and includes a reaction chamber 2 for performing vapor phase growth on the substrate 1 to be processed 2, a preparatory chamber 4 connected to the reaction chamber 2 by a gate valve 3, and 4 Pressure sensors 5 and 6 for measuring pressure, vacuum pumps 7 and 8 for evacuating each chamber, a vacuum pipe 9 and a main valve 10 for connecting the vacuum pump and each chamber, and a second feature of this embodiment. The sluice valve 11 is connected in parallel with the sluice valve 3.

【0007】また同図において、12は被処理基板1を
加熱する加熱源13は気相成長に必要となるSiH4 ,
NH3 等の反応ガス供給口,14は予備室内を大気圧に
戻す不活性ガス(N2 等)供給口,15は装置外部と予
備室4との間の仕切弁である。本実施例において、第2
の仕切弁11には、CV 値が0.3程度のエアーオペレ
イトバルブを使用し、反応室2及び予備室4と前記エア
ーオペレイトバルブの接続には内径が1/4インチ程度
のステンレス配管を用いている。
In the figure, reference numeral 12 denotes a heating source 13 for heating the substrate 1 to be processed, which is SiH4 necessary for vapor phase growth,
A reaction gas supply port for NH3 or the like, 14 is an inert gas (N2 or the like) supply port for returning the pressure inside the auxiliary chamber to atmospheric pressure, and 15 is a sluice valve between the outside of the apparatus and the auxiliary chamber 4. In this embodiment, the second
An air-operated valve having a CV value of about 0.3 is used for the sluice valve 11, and a stainless pipe having an inner diameter of about 1/4 inch is used to connect the reaction chamber 2 and the auxiliary chamber 4 to the air-operated valve. Is used.

【0008】次に動作を説明する。被処理基板1は、ま
ず外部より仕切弁15を介して予備室4に導入される。
尚、ここで反応室2は真空ポンプ7,8により既に減圧
状態となっている。非処理基板導入後、予備室4は真空
ポンプ8にて減圧状態となり、所定の真空度下になった
ことを圧力センサー6で検知した後、まずコンダクタン
スの小さい第2の仕切弁11を開ける。第2の仕切弁1
1を通して反応室2と予備室4の圧力差は緩やかに緩和
し、圧力センサー5,6がほぼ同値になったことを確認
後、仕切弁3を開けて被処理基板1を反応室2に運搬す
る。
Next, the operation will be described. The substrate 1 to be processed is first introduced into the preliminary chamber 4 from the outside via the sluice valve 15.
Here, the reaction chamber 2 has already been depressurized by the vacuum pumps 7 and 8. After the introduction of the non-processed substrate, the preparatory chamber 4 is depressurized by the vacuum pump 8 and the pressure sensor 6 detects that the predetermined vacuum degree is reached, and then the second sluice valve 11 having a small conductance is opened. Second sluice valve 1
After confirming that the pressure difference between the reaction chamber 2 and the preparatory chamber 4 is gradually relaxed through 1 and the pressure sensors 5 and 6 have almost the same value, the sluice valve 3 is opened and the substrate 1 to be processed is transported to the reaction chamber 2. To do.

【0009】上述した実施例1を用いることで、反応室
2と予備室4との間に生ずる瞬時で大量な気体の流れを
抑止出来、気相成長によって反応室に付着又は反応室下
部に沈澱した塵埃の再浮遊,被処理基板への再付着を防
止することが可能である。従来技術を用いた気相成長に
おいては、0.3μm以上の塵埃が数百〜数千個という
レベルで被処理基板に付着していたが、本実施例によれ
ば数個〜数十個に抑制することが出来る。
By using the above-described Example 1, a large amount of gas flow that occurs between the reaction chamber 2 and the auxiliary chamber 4 can be suppressed instantaneously, and adheres to the reaction chamber or precipitates in the lower portion of the reaction chamber by vapor phase growth. It is possible to prevent the re-floating of the dust and the re-adhesion to the substrate to be processed. In the vapor phase growth using the conventional technique, dust of 0.3 μm or more was attached to the substrate to be processed at a level of hundreds to thousands, but according to the present embodiment, it is reduced to several to several tens. Can be suppressed.

【0010】次に実施例2について説明する。図2の構
成図に示す如く、第2の仕切弁がバタフライバルブ16
を用いたものであってもよい。本実施例では、バタフラ
イバルブ16を用いることで、コンダクタンスを自在に
可変出来、実施例1に比べさらに効率の良い圧力差緩和
が期待出来る。
Next, a second embodiment will be described. As shown in the configuration diagram of FIG. 2, the second sluice valve is the butterfly valve 16
May be used. In the present embodiment, by using the butterfly valve 16, the conductance can be freely changed, and more efficient pressure difference relaxation can be expected as compared with the first embodiment.

【0011】[0011]

【発明の効果】以上説明したように本発明は、被処理基
板を真空処理すべく反応室が予備室と前記被処理基板を
授受可能な仕切弁にて接続され、且つ、前記各室を所望
の真空度にするための真空ポンプを各々独立に具備する
真空処理装置において、前記反応室と予備室とを前記仕
切弁よりもはるかに小さいコンダクタンスを有する第2
の仕切弁を用いて接続したことで、反応室と予備室間の
被処理基板の授受の前に前記第2の仕切弁を開けること
により、両室の圧力差による瞬時で且つ大量の気体の流
れを抑止することが可能である。よって真空処理工程の
際に発生し反応室下部に沈澱もしくは反応室内壁に付着
していた塵埃の再浮遊,被処理基板への再付着を防止出
来るという効果を有する。
As described above, according to the present invention, the reaction chamber is connected to the preparatory chamber by the sluice valve capable of transferring the substrate to be processed in order to vacuum-process the substrate to be processed, and each chamber is desired. In a vacuum processing apparatus, each of which is independently equipped with a vacuum pump for adjusting the degree of vacuum to the second chamber, wherein the reaction chamber and the auxiliary chamber have a conductance much smaller than that of the gate valve.
By connecting using the sluice valve, the second sluice valve is opened before the transfer of the substrate to be processed between the reaction chamber and the preliminary chamber, so that a large amount of gas is instantaneously generated due to the pressure difference between the two chambers. It is possible to suppress the flow. Therefore, there is an effect that it is possible to prevent re-floating of the dust generated in the vacuum processing step in the lower part of the reaction chamber or adhered to the inner wall of the reaction chamber and re-adhesion to the substrate to be processed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1の構成図である。FIG. 1 is a configuration diagram of a first embodiment of the present invention.

【図2】本発明の実施例2の構成図である。FIG. 2 is a configuration diagram of a second embodiment of the present invention.

【図3】従来の真空処理装置の構成図である。FIG. 3 is a configuration diagram of a conventional vacuum processing apparatus.

【符号の説明】[Explanation of symbols]

1 被処理基板 2 反応室 3 仕切弁 4 予備室 5,6 圧力センサー 7,8 真空ポンプ 9 真空配管 10 メインバルブ 11 第2の仕切弁 12 加熱源 13 反応ガス供給口 14 不活性ガス供給口 15 仕切弁 16 バタフライバルブ 1 substrate to be processed 2 reaction chamber 3 sluice valve 4 preparatory chamber 5,6 pressure sensor 7,8 vacuum pump 9 vacuum piping 10 main valve 11 second sluice valve 12 heating source 13 reaction gas supply port 14 inert gas supply port 15 Gate valve 16 Butterfly valve

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 被処理基板を真空処理する反応室と予備
室とが前記被処理基板を授受可能な仕切弁にて接続さ
れ、且つ前記各室を所望の真空度にするための真空ポン
プを各々独立に具備する真空処理装置において、前記反
応室と予備室とを接続する前記仕切弁のほかに、この仕
切弁よりも小さいコンダクタンスを有する第2の仕切弁
を並列接続したことを特徴とする真空処理装置。
1. A reaction chamber for vacuum-processing a substrate to be processed and a preparatory chamber are connected by a sluice valve capable of transferring the substrate to be processed, and a vacuum pump for bringing each chamber to a desired degree of vacuum is provided. In a vacuum processing apparatus independently provided, in addition to the sluice valve connecting the reaction chamber and the auxiliary chamber, a second sluice valve having a conductance smaller than that of the sluice valve is connected in parallel. Vacuum processing equipment.
JP21766391A 1991-08-29 1991-08-29 Vacuum treatment apparatus Pending JPH0557170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21766391A JPH0557170A (en) 1991-08-29 1991-08-29 Vacuum treatment apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21766391A JPH0557170A (en) 1991-08-29 1991-08-29 Vacuum treatment apparatus

Publications (1)

Publication Number Publication Date
JPH0557170A true JPH0557170A (en) 1993-03-09

Family

ID=16707773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21766391A Pending JPH0557170A (en) 1991-08-29 1991-08-29 Vacuum treatment apparatus

Country Status (1)

Country Link
JP (1) JPH0557170A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008124481A (en) * 2007-11-26 2008-05-29 Canon Anelva Corp Method for conveying object to be processed in vacuum processor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63137169A (en) * 1986-11-27 1988-06-09 Nec Corp Vacuum treatment apparatus
JPH0377254A (en) * 1989-08-18 1991-04-02 Nikon Corp Vacuum air discharging apparatus
JPH04276074A (en) * 1991-03-05 1992-10-01 Fujitsu Ltd Vacuum treatment equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63137169A (en) * 1986-11-27 1988-06-09 Nec Corp Vacuum treatment apparatus
JPH0377254A (en) * 1989-08-18 1991-04-02 Nikon Corp Vacuum air discharging apparatus
JPH04276074A (en) * 1991-03-05 1992-10-01 Fujitsu Ltd Vacuum treatment equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008124481A (en) * 2007-11-26 2008-05-29 Canon Anelva Corp Method for conveying object to be processed in vacuum processor

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