JPH055474Y2 - - Google Patents

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Publication number
JPH055474Y2
JPH055474Y2 JP19618087U JP19618087U JPH055474Y2 JP H055474 Y2 JPH055474 Y2 JP H055474Y2 JP 19618087 U JP19618087 U JP 19618087U JP 19618087 U JP19618087 U JP 19618087U JP H055474 Y2 JPH055474 Y2 JP H055474Y2
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Japan
Prior art keywords
sample
passage
constant temperature
temperature section
diluent
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JP19618087U
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Japanese (ja)
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JPH0199045U (en
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Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は、試料分析装置において、周囲の温度
状態にかかわらず、試料の反応を恒温状態にて行
うことのできる試料反応装置に関するものであ
る。
[Detailed description of the invention] [Field of industrial application] The present invention relates to a sample reaction device in a sample analysis device that is capable of performing a sample reaction in a constant temperature state regardless of the ambient temperature state. .

〔従来の技術〕[Conventional technology]

希釈液で希釈された試料、および反応液を反応
槽に混合し所定の反応を行わせる工程において、
希釈液、反応液、反応槽の温度の状態により、反
応が促進されたり抑制されたりすることは従来か
らよく知られている。これらの液、反応槽が周囲
から温度による影響を受けないようにするための
手段が備えられていないと、周囲温度の影響を受
け反応過多となつたり、反応未完になつたりする
ので、正しい分析結果が得られない。
In the process of mixing a sample diluted with a diluent and a reaction solution in a reaction tank to perform a predetermined reaction,
It has been well known that the reaction is promoted or inhibited depending on the temperature of the diluent, the reaction solution, and the reaction tank. If these liquids and reaction vessels are not equipped with a means to prevent them from being affected by the ambient temperature, the reaction may be over-reacted or incomplete due to the influence of the ambient temperature, so correct analysis cannot be carried out. I can't get any results.

そこで、周囲温度の状態にかかわらず、常に安
定して所定の反応を生じせしめ分析精度を高める
ために、 (a) 希釈液、反応液、反応槽を個別に温度制御し
恒温状態を保つこと、あるいは、 (b) これら全体を恒温装置で覆い恒温状態を保つ
こと、 は従来から行われていた。
Therefore, in order to always produce the desired reaction stably and improve analysis accuracy regardless of the ambient temperature, it is necessary to (a) individually control the temperature of the diluent solution, reaction solution, and reaction tank to maintain a constant temperature state; Alternatively, (b) covering the entire area with a constant temperature device to maintain a constant temperature has traditionally been done.

〔考案が解決しようとする問題点〕[Problem that the invention attempts to solve]

しかし、(a)の場合、試料の希釈装置と反応槽が
離れているため、恒温状態の希釈液を試料の希釈
を行う装置に供給しても、希釈液が試料とともに
反応槽に移送される間に、周囲温度からの影響を
受け恒温状態からずれ、安定した反応を行うこと
ができない。
However, in case (a), the sample diluting device and the reaction tank are separated, so even if the constant-temperature diluent is supplied to the sample dilution device, the diluent is transferred to the reaction tank along with the sample. During this time, the reaction deviates from the constant temperature state due to the influence of the ambient temperature, making it impossible to perform a stable reaction.

(b)の場合には、装置が大形となり高価である、
という問題がある。
In the case of (b), the equipment is large and expensive;
There is a problem.

そこで、本考案は簡易な構成により小形で、周
囲温度にかかわらず、常に恒温状態にて試料の反
応過程を実現することができる、試料反応装置の
提供を目的とするものである。
Therefore, an object of the present invention is to provide a small-sized sample reaction device with a simple configuration, which can always carry out the reaction process of a sample in a constant temperature state regardless of the ambient temperature.

〔問題点を解決するための手段〕[Means for solving problems]

本考案の試料反応装置を、図面を参照して説明
すれば、所定の温度になるように温度制御された
恒温部本体10と、希釈液を所定の温度にするた
めに、恒温部本体に密接して取り付けられた希釈
液恒温部30と、試料の吸引・定量、希釈・移送
を行うために、恒温部本体に密接して取り付けら
れた試料定量弁40と、洗浄液を所定の温度にす
るために、恒温部本体に密接して取り付けられた
洗浄液恒温部20とを包含し、 恒温部本体10は、反応槽12と、希釈液恒温
部30と試料定量弁40とを通じさせる希釈液通
路Q1と、試料定量弁40と反応槽12とを通じ
させる試料通路Q2と、恒温部本体10外部と反
応槽12とを通じさせる反応液通路Q3および排
出通路Q5と、洗浄液恒温部20と反応槽12と
を通じさせる洗浄液通路Q4とを有し、 希釈液恒温部30は、希釈液通路Q1と通じる
凹部32と、希釈液恒温部30外部とこの凹部3
2とを通じさせる希釈液流入口34とを有し、 洗浄液恒温部20は、洗浄液通路Q4と通じる
凹部22と、洗浄液恒温部20外部とこの凹部2
2とを通じさせる洗浄液流入口24とを有し、 試料定量弁40は、常に静止状態にある2つの
固定素子42,56と、固定素子に対し一定量移
動可能な1つの可動素子48と、固定素子を固定
するための固定用部材66と、固定素子および可
動素子を所定の位置に配置させて保持するための
保持用部材62と、固定素子および可動素子を密
着させるための密着用部材64と、可動素子と連
結し可動素子を一定量移動させるための駆動源6
8とからなり、 恒温部本体10と密接する一方の固定素子56
には、希釈液通路Q1、試料通路Q2とそれぞれ接
続可能な位置に希釈液供給通路P10、試料移送通
路P13が設けられ、一方の固定素子56または他
方の固定素子42に試料吸入通路P1が設けられ、
一方の固定素子56または他方の固定素子42に
試料吸出通路P5が設けられ、可動素子48に試
料定量通路P2が設けられ、固定素子および可動
素子の互いに面接触する面は精度よく研摩されて
密着配置されており、 試料定量弁40は、駆動源68により可動素子
が一定量移動されることにより、試料吸入通路
P1、試料定量通路P2、試料吸出通路P5が通じる
第1の状態と、希釈液供給通路P10、試料定量通
路P2、試料移送通路P13が通じる第2の状態とを
有するようにして形成されている。
The sample reaction device of the present invention will be described with reference to the drawings. It includes a constant temperature section main body 10 whose temperature is controlled to a predetermined temperature, and a constant temperature section main body 10 that is closely connected to the constant temperature section main body in order to bring the diluted liquid to a predetermined temperature. A diluent constant temperature section 30 is attached to the diluent constant temperature section 30, a sample metering valve 40 is attached closely to the constant temperature section main body in order to aspirate, quantify, dilute and transfer the sample, and a sample metering valve 40 is attached to the main body of the constant temperature section to bring the cleaning liquid to a predetermined temperature. includes a cleaning liquid constant temperature section 20 that is closely attached to the constant temperature section main body, and the constant temperature section main body 10 has a diluent passage Q 1 that communicates the reaction tank 12, the diluted liquid constant temperature section 30, and the sample metering valve 40. , a sample passage Q 2 that connects the sample metering valve 40 and the reaction tank 12 , a reaction liquid passage Q 3 and a discharge passage Q 5 that connect the outside of the constant temperature section main body 10 and the reaction tank 12 , and a cleaning liquid constant temperature section 20 and the reaction tank. The diluent constant temperature section 30 has a recess 32 communicating with the diluent passage Q1 , and a cleaning liquid passage Q4 that communicates with the diluent constant temperature section 30 and the recess 3.
The cleaning liquid constant temperature section 20 has a diluent inlet 34 that communicates with the cleaning liquid passage Q 4 , and a recess 22 that communicates with the cleaning liquid passage Q 4 .
The sample metering valve 40 has two fixed elements 42, 56 that are always in a stationary state, one movable element 48 that can be moved by a fixed amount with respect to the fixed element, and a cleaning liquid inlet 24 that communicates with the fixed element 2. A fixing member 66 for fixing the element, a holding member 62 for arranging and holding the fixed element and the movable element at predetermined positions, and an adhesion member 64 for bringing the fixed element and the movable element into close contact. , a drive source 6 that is connected to the movable element and moves the movable element by a certain amount.
8, and one fixed element 56 that is in close contact with the constant temperature section main body 10.
is provided with a diluent supply passage P 10 and a sample transfer passage P 13 at positions that can be connected to the dilution passage Q 1 and the sample passage Q 2 , respectively. A passage P 1 is provided,
One fixed element 56 or the other fixed element 42 is provided with a sample suction passage P5 , and the movable element 48 is provided with a sample quantitative passage P2 , and the surfaces of the fixed element and the movable element that are in surface contact with each other are polished with high precision. The sample metering valve 40 has a movable element that is moved by a certain amount by the drive source 68, thereby opening the sample suction passage.
P 1 , the sample quantification passage P 2 , and the sample suction passage P 5 are in communication, and the diluent supply passage P 10 , the sample quantification passage P 2 , and the sample transfer passage P 13 are in communication. It is formed as follows.

〔作用〕[Effect]

試料定量弁40が第1の状態にあるとき、試料
吸出通路P5に接続される試料吸引源A1が動作す
ることにより、試料は試料吸入通路P1から試料
吸出通路P5に向つて吸引され、試料定量通路P2
に満たされることにより定量される。
When the sample metering valve 40 is in the first state, the sample suction source A 1 connected to the sample suction passage P 5 operates, so that the sample is suctioned from the sample suction passage P 1 toward the sample suction passage P 5 . sample quantitative passage P 2
is quantified by satisfying .

次に、駆動源68が動作することにより、可動
素子48が固定素子42,56に対し所定量移動
して第2の状態になる。希釈液恒温部30の希釈
液流入口34に接続される希釈液供給源A3が動
作すると、所定量の希釈液が凹部32に供給され
る。凹部34内の恒温状態の希釈液は、供給され
た希釈液に押し出されるようにして、恒温部本体
10の希釈液通路Q1を通り試料定量弁40の希
釈液供給通路P10に供給される。先程、試料定量
通路P2で定量された試料は、その希釈液ととも
に試料移送通路P13から押し出され、恒温部本体
10の試料通路Q2を通り恒温状態にて反応槽1
2へ移送される。また、反応液供給源A4が動作
することにより、所定量の反応液が恒温状態にて
反応槽12に供給される。希釈液、試料、反応液
に恒温状態の反応槽12で混合され、所定時間反
応が行われ、所定の反応が完了すると、これらの
試料は排出通路Q5から測定部へ移送され測定さ
れる。その後、洗浄液恒温部20の洗浄液流入口
24に接続される洗浄液供給源A5が動作すると、
所定量の洗浄液が凹部22に供給される。凹部2
2内の恒温状態の洗浄液は供給された洗浄液に押
し出されるようにして洗浄液通路Q4を通り、恒
温状態にて反応槽12に供給され、反応槽12内
の洗浄を行う。
Next, when the drive source 68 operates, the movable element 48 moves by a predetermined amount with respect to the fixed elements 42 and 56, and enters the second state. When the diluent supply source A 3 connected to the diluent inlet 34 of the diluent constant temperature section 30 is operated, a predetermined amount of diluent is supplied to the recess 32 . The constant temperature diluent in the recess 34 is pushed out by the supplied diluent and is supplied to the diluent supply passage P 10 of the sample metering valve 40 through the diluent passage Q 1 of the constant temperature section main body 10. . The sample previously quantified in the sample quantification passage P 2 is pushed out from the sample transfer passage P 13 together with its diluent, passes through the sample passage Q 2 of the constant temperature section main body 10, and is transferred to the reaction tank 1 in a constant temperature state.
Transferred to 2. Further, by operating the reaction liquid supply source A4 , a predetermined amount of the reaction liquid is supplied to the reaction tank 12 in a constant temperature state. The diluent, sample, and reaction solution are mixed in a constant temperature reaction tank 12 and reacted for a predetermined period of time. When the predetermined reaction is completed, these samples are transferred from the discharge path Q5 to the measuring section and measured. After that, when the cleaning liquid supply source A 5 connected to the cleaning liquid inlet 24 of the cleaning liquid constant temperature section 20 is activated,
A predetermined amount of cleaning liquid is supplied to the recess 22 . Recess 2
The constant-temperature cleaning liquid in the chamber 2 is pushed out by the supplied cleaning liquid, passes through the cleaning liquid passage Q4 , is supplied to the reaction tank 12 in a constant-temperature state, and cleans the inside of the reaction tank 12.

また、試料定量弁40の駆動源68が元に戻る
ことにより、可動素子48も所定量逆移動して第
1の状態に戻る。洗浄液供給源A2が動作して、
試料吸出通路P5から所定量の洗浄液を供給する
ことにより、試料定量弁40の各通路、配管に残
留している試料を試料吸入通路P1へ洗い流すこ
とにより洗浄が行われる。
Further, when the drive source 68 of the sample metering valve 40 returns to its original state, the movable element 48 also moves backward by a predetermined amount and returns to the first state. Cleaning liquid supply source A 2 is activated and
By supplying a predetermined amount of cleaning liquid from the sample suction passage P5 , cleaning is performed by flushing the sample remaining in each passage and piping of the sample metering valve 40 to the sample suction passage P1 .

〔実施例〕〔Example〕

以下、図面を参照して本考案の好適な実施例を
詳細に説明する。ただしこの実施例に記載されて
いる構成機器の材質、形状、その相対配置など
は、とくに特定的な記載がない限りは、本考案の
範囲をそれらのみに限定する趣旨のものではな
く、単なる説明例にすぎない。
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. However, unless otherwise specifically stated, the materials, shapes, relative positions, etc. of the components described in this example are not intended to limit the scope of the present invention, but are merely illustrative. Just an example.

第1図は試料反応装置の一部分解斜視図であ
り、第2図は同断面概略図である。10はステン
レススチールなどからなる恒温部本体である。恒
温部本体10にはヒータ80、温度センサ82が
中に埋め込まれるように取り付けられ、温度制御
部84により恒温状態に保たれるよう制御されて
いる。もちろんクーラのみあるいはヒータとクー
ラの併用も可能である。
FIG. 1 is a partially exploded perspective view of the sample reaction device, and FIG. 2 is a schematic cross-sectional view of the same. 10 is a constant temperature section main body made of stainless steel or the like. A heater 80 and a temperature sensor 82 are embedded in the constant temperature unit main body 10 and are controlled by a temperature control unit 84 to maintain a constant temperature state. Of course, it is also possible to use only a cooler or a combination of a heater and a cooler.

恒温部本体10には、希釈液を恒温状態にする
ための希釈液恒温部30と、試料を吸引し所定量
定量し所定量の希釈液とともに移送することによ
り、試料の吸引・定量、希釈・移送を行うための
試料定量弁40と、洗浄液を恒温状態にするため
の洗浄液恒温部20が、それぞれシール材38、
シール材14,16、シール材26を介して密接
して取り付けられている。
The constant temperature section main body 10 includes a diluent constant temperature section 30 for keeping the diluent in a constant temperature state, and a diluent constant temperature section 30 for aspirating the sample, measuring a predetermined amount, and transferring it together with a predetermined amount of the diluent. The sample metering valve 40 for transferring and the cleaning liquid constant temperature section 20 for keeping the cleaning liquid in a constant temperature state are connected to the sealing material 38,
They are closely attached via sealants 14, 16 and a sealant 26.

恒温部本体10には、希釈液、試料、反応液を
混合し所定の反応を行わせる反応槽12と、希釈
液を希釈液恒温部30から試料定量弁40に供給
するための希釈液通路Q1と、希釈液および試料
を試料定量弁40から反応槽12に移送するため
の試料通路Q2と、反応液を反応槽12に供給す
るための反応液通路Q3と、洗浄液を洗浄液恒温
部20から反応槽12に供給するための洗浄液通
路Q4と、反応槽12にて所定の反応を完了した
試料を測定部へ移送するための排出通路Q5が設
けられている。
The constant temperature unit body 10 includes a reaction tank 12 in which a diluent, a sample, and a reaction liquid are mixed and a predetermined reaction is performed, and a diluent passage Q for supplying the diluted liquid from the diluent constant temperature unit 30 to the sample metering valve 40. 1 , a sample passage Q 2 for transferring the diluent and sample from the sample metering valve 40 to the reaction tank 12, a reaction liquid passage Q 3 for supplying the reaction liquid to the reaction tank 12, and a cleaning liquid constant temperature section for transferring the cleaning liquid. A cleaning liquid passage Q 4 is provided for supplying the liquid from the reaction tank 20 to the reaction tank 12, and a discharge passage Q 5 is provided for transferring the sample that has undergone a predetermined reaction in the reaction tank 12 to the measuring section.

希釈液恒温部30はたとえば樹脂製であり、一
時的に希釈液を貯めておくための凹部32と、希
釈液を希釈液恒温部外部から凹部32に供給する
ための希釈液流入口34と、凹部32に存在する
気泡を希釈液恒温部外部に排出するための気泡流
出口36が設けられている。希釈液通路Q1は凹
部32と通じている。
The diluted liquid constant temperature section 30 is made of resin, for example, and includes a recess 32 for temporarily storing the diluted liquid, a diluted liquid inlet 34 for supplying the diluted liquid from the outside of the diluted liquid constant temperature section to the recess 32, A bubble outlet 36 is provided for discharging the bubbles existing in the recess 32 to the outside of the diluent constant temperature section. The diluent passage Q 1 communicates with the recess 32 .

洗浄液恒温部20はたとえば樹脂製であり、一
時的に洗浄液を貯めておくための凹部22と、洗
浄液を洗浄液恒温部外部から凹部22に供給する
ための洗浄液流入口24が設けられている。洗浄
液通路Q4は凹部22と通じている。
The cleaning liquid constant temperature section 20 is made of resin, for example, and is provided with a recess 22 for temporarily storing the cleaning liquid and a cleaning liquid inlet 24 for supplying the cleaning liquid to the recess 22 from outside the cleaning liquid constant temperature section. The cleaning liquid passage Q 4 communicates with the recess 22 .

試料定量弁40は、常に静止状態にある2つの
固定素子42,56と、固定素子に対し一定角度
回転移動することができる1つの可動素子48
と、固定素子42,56を固定させるための固定
用部材66と、固定素子42,56、可動素子4
8を所定の位置に配置し保持するための保持用部
材62と、固定素子42,56、可動素子48を
程よく密着させるための密着用部材64と、可動
素子48と連結し可動素子48を固定素子42,
56に対して一定角度回転させるための駆動源6
8からなる。
The sample metering valve 40 includes two fixed elements 42 and 56 that are always stationary, and one movable element 48 that can be rotated at a fixed angle relative to the fixed element.
, a fixing member 66 for fixing the fixed elements 42 and 56, the fixed elements 42 and 56, and the movable element 4.
8 in a predetermined position; a contact member 64 for bringing the fixed elements 42, 56 and the movable element 48 into moderate contact; element 42,
Drive source 6 for rotating at a constant angle with respect to 56
Consists of 8.

固定素子42、可動素子48、固定素子56の
一実施例をそれぞれ第3図〜第11図に示す。
Examples of the fixed element 42, movable element 48, and fixed element 56 are shown in FIGS. 3 to 11, respectively.

固定素子42,56にはそれぞれ切り欠き4
6,60が設けられ恒温部本体10に取り付けら
れた固定用部材66にはめ込まれることにより固
定され、3枚の素子は固定素子56、可動素子4
8、固定素子42の順で、それぞれ中央部に設け
られた孔58,50,44に恒温部本体10に取
り付けられた保持用部材62を貫通した後、密着
用部材64でネジ止めされることにより、可動素
子の研摩面48a,48bがそれぞれ固定素子4
2,56の研摩面42a,56aと向い合つて密
着配置される。さらに固定素子56は恒温部本体
10に密接して取り付けられる。
The fixing elements 42 and 56 each have a notch 4.
6, 60 are provided and fixed by being fitted into a fixing member 66 attached to the constant temperature section main body 10, and the three elements are fixed element 56, movable element 4
8. After passing through the holding member 62 attached to the constant temperature section main body 10 through the holes 58, 50, and 44 provided in the central part of the fixing element 42 in this order, the fixing element 42 is screwed with the sealing member 64. As a result, the polished surfaces 48a and 48b of the movable element are respectively attached to the fixed element 4.
The polishing surfaces 42a and 56a of No. 2 and 56 are disposed facing each other in close contact with each other. Further, the fixing element 56 is attached closely to the constant temperature section main body 10.

可動素子48には円周の一部に穴52が設けら
れ、先端が球状の球部54aを形成した連結用部
材54が接合されている。往復直線移動が可能な
駆動源68、例えばエアーシリンダの軸70に固
定円板72,74が固定され、固定円板72,7
4の間に連結用部材54の球部54aがはさまれ
るように保持される。駆動源68が往復直線移動
することにより球部54aが固定円板72または
74の面に押され、可動素子48は保持用部材6
2を軸にして正逆回転移動を行う。
A hole 52 is provided in a part of the circumference of the movable element 48, and a connecting member 54 having a spherical portion 54a at the tip is joined. Fixed disks 72, 74 are fixed to a drive source 68 capable of reciprocating linear movement, for example, a shaft 70 of an air cylinder.
The spherical portion 54a of the connecting member 54 is held between the two. As the driving source 68 moves back and forth in a straight line, the ball portion 54a is pushed against the surface of the fixed disk 72 or 74, and the movable element 48 is moved against the holding member 6.
2 is used as an axis for forward and reverse rotational movement.

固定素子42には、素子を貫通して試料吸入通
路P1、試料吸出通路P5と、研摩面42a側の表
面に溝状の通路P12が設けられ、可動素子48に
は素子を貫通して試料を定量するために精度良く
加工された試料定量通路P2および通路P4,P11
設けられ、固定素子56には素子を貫通して希釈
液供給通路P10、試料移送通路P13と、研摩面56
a側の表面に溝状の通路P3が設けられている。
希釈液供給通路P10、試料移送通路P13はそれぞれ
シール材14,16を介して恒温部本体の希釈液
通路Q1、試料通路Q2に接続される。
The fixed element 42 is provided with a sample suction passage P 1 and a sample suction passage P 5 passing through the element, and a groove-shaped passage P 12 on the surface on the polishing surface 42a side, and the movable element 48 is provided with a groove-shaped passage P 12 passing through the element. A sample quantification passage P 2 and passages P 4 , P 11 are provided which are machined with high precision to quantify the sample, and the fixing element 56 is provided with a diluent supply passage P 10 and a sample transfer passage P 13 that pass through the element. and the polished surface 56
A groove-shaped passage P3 is provided on the surface of the a side.
The diluent supply passage P 10 and the sample transfer passage P 13 are connected to the dilution liquid passage Q 1 and the sample passage Q 2 of the constant temperature section main body via sealing materials 14 and 16, respectively.

試料定量弁40は可動素子48の停止位置によ
り第1の状態と第2の状態の2つの状態をとり得
る。
The sample metering valve 40 can take two states, a first state and a second state, depending on the stop position of the movable element 48.

第12図、第13図はそれぞれ第1の状態、第
2の状態を示す説明図である。第1の状態では通
路P1とP2、P2とP3、P3とP4、P4とP5、P11とP12
P11とP13がそれぞれ通じ、第2の状態では通路
P10とP11、P11とP12、P12とP2、P2とP13がそれぞ
れ通じている。第1の状態は試料の吸引・定量時
の状態であり、第2の状態は試料の希釈・移送時
の状態である。
FIG. 12 and FIG. 13 are explanatory diagrams showing the first state and the second state, respectively. In the first state, the paths P 1 and P 2 , P 2 and P 3 , P 3 and P 4 , P 4 and P 5 , P 11 and P 12 ,
P 11 and P 13 lead respectively, and in the second state the passage
P 10 and P 11 , P 11 and P 12 , P 12 and P 2 , and P 2 and P 13 are connected, respectively. The first state is the state when the sample is aspirated and quantified, and the second state is the state when the sample is diluted and transferred.

試料定量弁40が第1の状態の時に、固定素子
42の通路P5に配管T1a,T1を通じて接続された
試料吸引源A1が動作することにより、通路P1
接続された配管T7から試料を吸引させることが
できる。試料は、配管T7、通路P1,P2,P3,P4
P5、配管T1aの順に通り吸引され、通路P2に満た
されることにより定量される。
When the sample metering valve 40 is in the first state, the sample suction source A 1 connected to the passage P 5 of the fixing element 42 through the pipes T 1a and T 1 is operated, so that the pipe T connected to the passage P 1 is operated. The sample can be aspirated from 7 . The samples are pipe T 7 , passages P 1 , P 2 , P 3 , P 4 ,
P 5 and pipe T 1a are sucked in this order, and the amount is determined by filling the passage P 2 .

次に、駆動源68が動作することにより、可動
素子48が固定素子42,56に対して所定角度
回転し第2の状態になる。希釈液供給源A3が動
作すると、所定量の希釈液が配管T3を通つて希
釈液恒温部30の流入口34から凹部32に供給
される。凹部32内の希釈液33は、熱伝導率の
高い材料の恒温部本体10と密接され、また外部
とは熱伝導率の低い材料により遮断されているの
で、周囲温度の影響を受けず良好に恒温状態が保
たれている。凹部内の希釈液の量が供給される希
釈液の量よりも多く、希釈液流入口34が希釈液
通路Q1から離れているため、たとえ恒温状態か
らずれた温度の希釈液が供給されても、希釈液通
路Q1から押し出されるまでには希釈液は恒温状
態に達する。希釈液通路Q1、試料通路Q2は恒温
部本体10に設けられており、試料定量弁40は
恒温部本体10に密接しているので、恒温状態の
希釈液は恒温状態の希釈液通路Q1、通路P10
P11,P12,P2,P13、試料通路Q2を通つて通路P2
にて定量された試料を押し出しながら、反応槽1
2に移送される。また、反応液も反応液供給源
A4から配管T3、反応液通路Q3へ所定量供給され
る。供給する反応液が微量の場合には、特に反応
液恒温部を設ける必要もなく、恒温部本体10に
設けた反応液通路Q3で反応液恒温部を兼用させ
ることができる。反応液通路Q3は恒温部本体1
0に設けられているので、反応液通路Q3内の反
応液は恒温状態である。反応液通路Q3内の反応
液の量が供給される反応液の量よりも多いため、
恒温状態の反応液が反応槽12に供給される。反
応槽12は恒温部本体10に設けられているので
恒温状態である。
Next, when the drive source 68 operates, the movable element 48 rotates by a predetermined angle with respect to the fixed elements 42 and 56, and enters the second state. When the diluent supply source A 3 operates, a predetermined amount of diluent is supplied to the recess 32 from the inlet 34 of the diluent constant temperature section 30 through the pipe T 3 . The diluent 33 in the recess 32 is in close contact with the constant temperature section main body 10 made of a material with high thermal conductivity, and is shielded from the outside by a material with low thermal conductivity, so it is not affected by the ambient temperature and is well maintained. A constant temperature condition is maintained. Since the amount of diluent in the recess is larger than the amount of diluted liquid to be supplied and the diluted liquid inlet 34 is distant from the diluted liquid passage Q1 , even if the diluted liquid is supplied at a temperature that deviates from the constant temperature state. However, the diluent reaches a constant temperature state by the time it is pushed out from the diluent passage Q1 . The diluent passage Q 1 and the sample passage Q 2 are provided in the constant temperature section main body 10, and the sample metering valve 40 is in close contact with the constant temperature section main body 10, so the diluent in a constant temperature state is passed through the constant temperature diluent passage Q. 1 , passage P 10 ,
P 11 , P 12 , P 2 , P 13 , passage P 2 through sample passage Q 2
While pushing out the sample quantified in
Transferred to 2. In addition, the reaction liquid is also a reaction liquid supply source.
A predetermined amount is supplied from A 4 to pipe T 3 and reaction liquid passage Q 3 . When the amount of reaction liquid to be supplied is small, there is no need to provide a constant temperature section for the reaction liquid, and the reaction liquid passage Q3 provided in the constant temperature section main body 10 can also be used as the constant temperature section for the reaction liquid. Reaction liquid passage Q 3 is constant temperature section main body 1
0, the reaction liquid in the reaction liquid passage Q3 is in a constant temperature state. Since the amount of reaction liquid in reaction liquid passage Q3 is greater than the amount of reaction liquid supplied,
A reaction solution in a constant temperature state is supplied to the reaction tank 12. Since the reaction tank 12 is provided in the constant temperature section main body 10, it is in a constant temperature state.

このように反応に関与する液が恒温状態のま
ま、恒温状態の通路を経て、恒温状態の反応槽1
2に導き入れられるので、反応槽12で行われる
反応は恒温状態からずれることがなく、周囲温度
のいかんにかかわらず、常に安定した反応が行わ
れる。所定の反応が完了した試料は排出通路Q5
から配管T8を通り測定部へ移送され、すみやか
に測定される。
In this way, the liquid involved in the reaction is kept at a constant temperature and passes through a constant temperature passage into the constant temperature reaction tank 1.
2, the reaction carried out in the reaction tank 12 does not deviate from a constant temperature state, and a stable reaction is always carried out regardless of the ambient temperature. The sample that has completed the specified reaction is discharged through the discharge passage Q5 .
From there, it is transferred to the measuring section through pipe T8 , where it is immediately measured.

その後、洗浄液供給源A5が動作すると、所定
量の洗浄液が配管T5を通つて洗浄液恒温部20
の洗浄液流入口24から凹部22に供給される。
凹部22内の洗浄液23は恒温状態が保たれてお
り、恒温状態の洗浄液が恒温状態の洗浄液通路を
通り反応槽12へ供給されるので、反応槽12の
温度を変化させることなく洗浄を行うことができ
る。
Thereafter, when the cleaning liquid supply source A 5 operates, a predetermined amount of cleaning liquid passes through the pipe T 5 to the cleaning liquid constant temperature section 20.
The cleaning liquid is supplied to the recess 22 from the cleaning liquid inlet 24 .
The cleaning liquid 23 in the recess 22 is maintained at a constant temperature, and the constant temperature cleaning liquid is supplied to the reaction tank 12 through the constant temperature cleaning liquid passage, so cleaning can be performed without changing the temperature of the reaction tank 12. I can do it.

試料定量弁40は試料の移送の後、駆動源68
が初期位置に戻ることにより、可動素子48が固
定素子42,56に対し所定角度逆回転し第1の
状態に戻る。洗浄液供給源A2が動作し、所定量
の洗浄液が配管T2,T1a、通路P5,P4,P3,P2
P1、配管T7の順で供給されることにより各通路、
配管に残留している試料を洗い流し洗浄を行う。
The sample metering valve 40 is operated by the drive source 68 after transferring the sample.
By returning to the initial position, the movable element 48 reversely rotates by a predetermined angle with respect to the fixed elements 42 and 56, and returns to the first state. The cleaning liquid supply source A 2 operates, and a predetermined amount of cleaning liquid is supplied to the pipes T 2 , T 1a , the passages P 5 , P 4 , P 3 , P 2 ,
Each passage is supplied in the order of P 1 and piping T 7 ,
Rinse and clean the sample remaining in the piping.

また、希釈液恒温部30には気泡流出口36が
設けられているので、凹部32上部にたまつた気
泡を適時、配管T6を経て気泡回収部A6に排出す
ることにより、希釈液の供給量の精度をさらに向
上させることができる。
In addition, since the diluent constant temperature section 30 is provided with a bubble outlet 36, the bubbles accumulated in the upper part of the recess 32 can be discharged to the bubble recovery section A6 via the pipe T6 at a timely manner. The accuracy of the supply amount can be further improved.

新たに、凹部32に供給された希釈液、凹部2
2に供給された洗浄液、反応液通路Q3に供給さ
れた反応液は、試料の測定が行われている間に容
易に恒温状態に達することができるので、次に、
試料の希釈、反応処理を行う時には各液、各部の
温度は恒温状態となつている。
The diluent newly supplied to the recess 32 and the recess 2
The cleaning liquid supplied to Q2 and the reaction liquid supplied to reaction liquid passage Q3 can easily reach a constant temperature state while the sample is being measured.
When diluting samples and performing reaction treatments, the temperature of each liquid and each part is kept constant.

なお上記の実施例では、他方の固定素子42に
試料吸出通路P5を設ける場合について説明した
が、第14図および第15図に示すように、一方
の固定素子56に試料吸出通路P5を設けるよう
に構成することも可能である。第14図、第15
図はそれぞれ試料定量弁40の他の実施例による
第1の状態、第2の状態を示す説明図である。
In the above embodiment, the sample suction passage P5 is provided in the other fixing element 42, but as shown in FIGS. 14 and 15, the sample suction passage P5 is provided in one of the fixing elements 56. It is also possible to configure it so that it is provided. Figures 14 and 15
The figures are explanatory diagrams showing a first state and a second state of the sample metering valve 40 according to other embodiments, respectively.

〔考案の効果〕[Effect of idea]

本考案の試料反応装置は、以上のような構成で
あるので、次のような効果を有する。
Since the sample reaction device of the present invention has the above configuration, it has the following effects.

(a) 希釈液恒温部、試料定量弁、洗浄液恒温部が
恒温部本体に密接して取り付けられているの
で、試料の希釈、反応、洗浄の機能を簡素に構
成することができ、小形にすることができる。
(a) Since the diluent constant temperature section, sample metering valve, and washing liquid constant temperature section are attached closely to the constant temperature section, the functions of sample dilution, reaction, and washing can be simply configured, making it compact. be able to.

(b) 試料の希釈、反応、洗浄に関与する液、通
路、反応槽が恒温状態に保たれているので、周
囲温度の状態にかかわらず恒温状態にて試料の
反応を行うことができる。このため、反応の安
定性が良く、測定精度が向上する。
(b) The liquids, passages, and reaction vessels involved in sample dilution, reaction, and cleaning are kept at a constant temperature, so the sample can be reacted at a constant temperature regardless of the ambient temperature. Therefore, the stability of the reaction is good and the measurement accuracy is improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す試料反応装置
の一部分解斜視図、第2図は同断面説明図、第3
図は試料定量弁の固定素子42の一例を示す左側
面図、第5図は同右側面図、第4図は第3図にお
けるA−A線断面図、第6図は試料定量弁の可動
素子48の一例を示す左側面図、第8図は同右側
面図、第7図は第6図におけるB−B線断面図、
第9図は試料定量弁の固定素子56の一例を示す
左側面図、第11図は同右側面図、第10図は第
9図におけるC−C線断面図、第12図は試料定
量弁の第1の状態を示す断面説明図、第13図は
試料定量弁の第2の状態を示す断面説明図、第1
4図は試料定量弁の他の実施例による第1の状態
を示す断面説明図、第15図は第2の状態を示す
断面説明図である。 10……恒温部本体、12……反応槽、14,
16……シール材、20……洗浄液恒温部、22
……凹部、23……洗浄液、24……洗浄液流入
口、26……シール材、30……希釈液恒温部、
32……凹部、33……希釈液、34……希釈液
流入口、36……気泡流出口、38……シール
材、40……試料定量弁、42,56……固定素
子、42a,48a,48b,56a……研摩
面、44,50,58……孔、46,60……切
り欠き、48……可動素子、52……穴、54…
…連結用部材、54a……球部、62……保持用
部材、64……密着用部材、66……固定用部
材、68……駆動源、70……軸、72,74…
…固定円板、80……ヒータ、82……温度セン
サ、Q1……希釈液通路、Q2……試料通路、Q3
…反応液通路、Q4……洗浄液通路、Q5……排出
通路、P1……試料吸入通路、P2……試料定量通
路、P5……試料吸出通路、P10……希釈液供給通
路、P13……試料移送通路、P3,P4,P11,P12
…通路、A1……試料吸引源、A2……洗浄液供給
源、A3……希釈液供給源、A4……反応液供給源、
A5……洗浄液供給源、A6……気泡回収部、T1
T2,T1a,T3,T4,T5,T6,T7,T8……配管、
T9,T10……配線。
Fig. 1 is a partially exploded perspective view of a sample reaction device showing one embodiment of the present invention, Fig. 2 is an explanatory cross-sectional view of the same, and Fig. 3
The figure is a left side view showing an example of the fixed element 42 of the sample metering valve, FIG. 5 is a right side view of the same, FIG. 4 is a sectional view taken along line A-A in FIG. A left side view showing an example of the element 48, FIG. 8 is a right side view thereof, and FIG. 7 is a sectional view taken along the line B-B in FIG. 6.
FIG. 9 is a left side view showing an example of the fixing element 56 of the sample metering valve, FIG. 11 is a right side view of the same, FIG. 10 is a sectional view taken along the line CC in FIG. 9, and FIG. 12 is a sample metering valve. 13 is a cross-sectional explanatory diagram showing the first state of the sample metering valve, and FIG.
FIG. 4 is an explanatory cross-sectional view showing a first state according to another embodiment of the sample metering valve, and FIG. 15 is an explanatory cross-sectional view showing a second state. 10... constant temperature section main body, 12... reaction tank, 14,
16...Sealing material, 20...Cleaning liquid constant temperature section, 22
... recess, 23 ... cleaning liquid, 24 ... cleaning liquid inlet, 26 ... sealing material, 30 ... diluent constant temperature section,
32... Recess, 33... Diluent, 34... Diluent inlet, 36... Air bubble outlet, 38... Seal material, 40... Sample metering valve, 42, 56... Fixed element, 42a, 48a , 48b, 56a... Polished surface, 44, 50, 58... Hole, 46, 60... Notch, 48... Movable element, 52... Hole, 54...
...Connecting member, 54a... Ball portion, 62... Holding member, 64... Close contact member, 66... Fixing member, 68... Drive source, 70... Shaft, 72, 74...
...Fixed disk, 80...Heater, 82...Temperature sensor, Q1 ...Diluent passage, Q2 ...Sample passage, Q3 ...
…Reaction liquid passage, Q 4 …Cleaning liquid passage, Q 5 …Discharge passage, P 1 …Sample suction passage, P 2 …Sample quantitative passage, P 5 …Sample suction passage, P 10 …Dilution liquid supply Passageway, P 13 ... Sample transfer path, P 3 , P 4 , P 11 , P 12 ...
...Aisle, A1 ...Sample suction source, A2 ...Washing liquid supply source, A3 ...Dilution liquid supply source, A4 ...Reaction liquid supply source,
A 5 ... Cleaning liquid supply source, A 6 ... Air bubble collection section, T 1 ,
T 2 , T 1a , T 3 , T 4 , T 5 , T 6 , T 7 , T 8 ... Piping,
T9 , T10 ...Wiring.

Claims (1)

【実用新案登録請求の範囲】 所定の温度になるように温度制御された恒温部
本体と、希釈液を所定の温度にするために、恒温
部本体に密接して取り付けられた希釈液恒温部
と、試料の吸引・定量、希釈・移送を行うため
に、恒温部本体に密接して取り付けられた試料定
量弁と、洗浄液を所定の温度にするために、恒温
部本体に密接して取り付けられた洗浄液恒温部と
を包含し、 恒温部本体は、反応槽と、希釈液恒温部と試料
定量弁とを通じさせる希釈液通路と、試料定量弁
と反応槽とを通じさせる試料通路と、恒温部本体
外部と反応槽とを通じさせる反応液通路および排
出通路と、洗浄液恒温部と反応槽とを通じさせる
洗浄液通路とを有し、 希釈液恒温部は、希釈液通路と通じる凹部と、
希釈液恒温部外部とこの凹部とを通じさせる希釈
液流入口とを有し、 洗浄液恒温部は、洗浄液通路と通じる凹部と、
洗浄液恒温部外部とこの凹部とを通じさせる洗浄
液流入口とを有し、 試料定量弁は、常に静止状態にある2つの固定
素子と、固定素子に対し一定量移動可能な1つの
可動素子と、固定素子を固定するための固定用部
材と、固定素子および可動素子を所定の位置に配
置させて保持するための保持用部材と、固定素子
および可動素子を密着させるための密着用部材
と、可動素子と連結し可動素子を一定量移動させ
るための駆動源とからなり、 恒温部本体と密接する一方の固定素子には、希
釈液通路、試料通路とそれぞれ接続可能な位置に
希釈液供給通路、試料移送通路が設けられ、一方
の固定素子または他方の固定素子に試料吸入通路
が設けられ、一方の固定素子または他方の固定素
子に試料吸出通路が設けられ、可動素子に試料定
量通路が設けられ、固定素子および可動素子の互
いに面接触する面は精度よく研摩されて密着配置
されており、 試料定量弁は、駆動源により可動素子が一定量
移動されることにより、試料吸入通路、試料定量
通路、試料吸出通路が通じる第1の状態と、希釈
液供給通路、試料定量通路、試料移送通路が通じ
る第2の状態とを有するようにしたことを特徴と
する試料反応装置。
[Scope of Claim for Utility Model Registration] A constant temperature section main body whose temperature is controlled to a predetermined temperature, and a diluent constant temperature section attached closely to the constant temperature section main body to maintain the diluted liquid at a predetermined temperature. , a sample metering valve attached closely to the constant temperature section body in order to aspirate, quantify, dilute, and transfer the sample, and a sample metering valve attached closely to the constant temperature section body to bring the cleaning liquid to a predetermined temperature. The constant temperature section main body includes a reaction tank, a diluent passageway that communicates the diluent constant temperature section with the sample metering valve, a sample passageway that connects the sample metering valve with the reaction tank, and an external section of the constant temperature section main body. and a reaction liquid passage and a discharge passage that communicate with the reaction tank, and a cleaning liquid passage that communicates the cleaning liquid constant temperature section with the reaction tank, and the diluent constant temperature section has a recess that communicates with the dilution liquid passage,
The diluent constant temperature section has a diluted liquid inlet that communicates with the outside of the diluted liquid constant temperature section and this recess, and the cleaning liquid constant temperature section has a recessed section that communicates with the cleaning liquid passage;
The sample metering valve has a cleaning liquid inlet that communicates the outside of the cleaning liquid constant temperature section with this recess, and the sample metering valve includes two fixed elements that are always in a stationary state, one movable element that can be moved by a fixed amount with respect to the fixed element, and a fixed A fixing member for fixing the element, a holding member for arranging and holding the fixed element and the movable element at predetermined positions, a contacting member for bringing the fixed element and the movable element into close contact, and a movable element. and a drive source to move the movable element by a certain amount, and one fixed element that is in close contact with the constant temperature section main body has a diluent supply passage and a sample passage connected to the diluent passage and the sample passage, respectively. A transfer passage is provided, a sample suction passage is provided in one of the fixed elements or the other fixed element, a sample suction passage is provided in one of the fixed elements or the other fixed element, a sample quantification passage is provided in the movable element, The surfaces of the fixed element and the movable element that are in surface contact with each other are precisely ground and placed in close contact with each other, and the sample metering valve has a sample suction passage, a sample metering passage, A sample reaction device characterized by having a first state in which a sample suction passage is in communication, and a second state in which a diluent supply passage, a sample quantification passage, and a sample transfer passage are in communication.
JP19618087U 1987-12-24 1987-12-24 Expired - Lifetime JPH055474Y2 (en)

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JP19618087U JPH055474Y2 (en) 1987-12-24 1987-12-24

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JP19618087U JPH055474Y2 (en) 1987-12-24 1987-12-24

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JPH0199045U JPH0199045U (en) 1989-07-03
JPH055474Y2 true JPH055474Y2 (en) 1993-02-12

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Cited By (2)

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JP2004508542A (en) * 2000-08-25 2004-03-18 シーフィード Fluid control processing system
US8673238B2 (en) 2002-02-25 2014-03-18 Cepheid Fluid processing and control

Cited By (11)

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Publication number Priority date Publication date Assignee Title
JP2004508542A (en) * 2000-08-25 2004-03-18 シーフィード Fluid control processing system
JP2014089201A (en) * 2000-08-25 2014-05-15 Cepheid Fluid control processing system
JP2014160075A (en) * 2000-08-25 2014-09-04 Cepheid Fluid control processing system
US9212980B2 (en) 2000-08-25 2015-12-15 Cepheid Fluid processing and control
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Also Published As

Publication number Publication date
JPH0199045U (en) 1989-07-03

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