JPH0545961Y2 - - Google Patents

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Publication number
JPH0545961Y2
JPH0545961Y2 JP1986046929U JP4692986U JPH0545961Y2 JP H0545961 Y2 JPH0545961 Y2 JP H0545961Y2 JP 1986046929 U JP1986046929 U JP 1986046929U JP 4692986 U JP4692986 U JP 4692986U JP H0545961 Y2 JPH0545961 Y2 JP H0545961Y2
Authority
JP
Japan
Prior art keywords
displacement
indenter
displacement detector
measurement range
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1986046929U
Other languages
Japanese (ja)
Other versions
JPS62168448U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986046929U priority Critical patent/JPH0545961Y2/ja
Publication of JPS62168448U publication Critical patent/JPS62168448U/ja
Application granted granted Critical
Publication of JPH0545961Y2 publication Critical patent/JPH0545961Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)

Description

【考案の詳細な説明】 [産業上の利用分野] 本考案は、超微小材料試験機に関し、特に圧子
の押込み深さの測定範囲が広い超微小材料試験機
に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an ultra-fine material testing machine, and more particularly to an ultra-fine material testing machine having a wide measurement range of the indentation depth of an indenter.

[従来技術] 従来、試料の硬度を測定する超微小材料試験機
は、微小荷重を加える可変式負荷機構によつて被
測定物の測定面に圧子を押し付け、該圧子の変位
量すなわち押し込み深さを計測するようにしてい
る。圧子の変位量検出器としては通常差動トラン
ス式の変位検出器が用いられている。
[Prior Art] Conventionally, ultra-fine material testing machines that measure the hardness of samples press an indenter against the measurement surface of the object using a variable load mechanism that applies a minute load, and measure the amount of displacement of the indenter, that is, the indentation depth. I am trying to measure the A differential transformer type displacement detector is normally used as an indenter displacement detector.

[考案が解決しようとする問題点] 上記した差動トランス式変位検出器の変位計測
可能範囲は通常20μmであるが、圧子が試験片に
接触した瞬間を検出する機能と押込み深さを計測
する機能とを一つに差動トランスに持たせている
ため、押し込み深さの計測範囲は5μmと狭い範囲
に限定されていた。また、従来の装置では、補助
的装置として光学モニターが設けられており、該
光学モニターによつて試料台に載置した試験片の
試験位置を決定し、試料台を回転させて負荷位置
に持つてくるようになつているが、試料台の回転
による高さ合せがずれると、上記したように計測
範囲が狭い差動トランス式変位検出器の計測範囲
外になることがあり、この場合圧子の押込み深さ
が計測不能となつて試験そのものが行なえなくな
るという問題点があつた。
[Problems to be solved by the invention] The displacement measurement range of the differential transformer type displacement detector described above is usually 20 μm, but it has a function to detect the moment the indenter contacts the test piece and measures the indentation depth. Because the differential transformer has both functions, the measurement range of the indentation depth was limited to a narrow range of 5 μm. In addition, in conventional equipment, an optical monitor is provided as an auxiliary device, and the optical monitor determines the test position of the specimen placed on the sample stage, and the sample stage is rotated and held at the load position. However, if the height adjustment due to the rotation of the sample stage deviates, the measurement range of the differential transformer type displacement detector, which has a narrow measurement range as described above, may fall outside the measurement range, and in this case, the indenter There was a problem in that the indentation depth could not be measured and the test itself could not be performed.

そこで、本考案は圧子の押込み深さを広範囲に
わたつて計測できるようにした超微小材料試験機
を提供することを目的とする。
Therefore, an object of the present invention is to provide an ultra-fine material testing machine that can measure the indentation depth of an indenter over a wide range.

[問題点を解決するための手段] 本考案は上記問題点を解決するため次のような
構成を採用した。
[Means for Solving the Problems] In order to solve the above problems, the present invention employs the following configuration.

すなわち、本考案にかかる超微小材料試験装置
は、任意に微小荷重を加えることができる可変形
負荷装置により被試験体に圧子を押し付け、該圧
子の変位量を変位検出器によつて求めるようにし
た微小材料試験機において、変位検出器を複数の
差動式変位検出器で構成してこれらを直列に結合
し、第1の変位検出器の測定範囲の上限が第2の
変位検出器の0点と一致するように順次調整して
設けるとともに、これら複数の差動式変位検出器
の出力を選択する選択手段を設けたことを特徴と
する。
In other words, the ultra-fine material testing device according to the present invention presses an indenter against a test object using a variable load device that can arbitrarily apply a minute load, and determines the amount of displacement of the indenter using a displacement detector. In the micro material testing machine, the displacement detector is composed of a plurality of differential displacement detectors, which are connected in series, so that the upper limit of the measurement range of the first displacement detector is equal to the upper limit of the measurement range of the second displacement detector. The present invention is characterized in that the outputs of the plurality of differential displacement detectors are sequentially adjusted so as to coincide with the zero point, and that a selection means is provided for selecting the outputs of the plurality of differential displacement detectors.

[作用] 圧子の変位を圧子側に設けた第1の差動式変位
検出器が測定し、この測定範囲を越えた変位に対
しては、第1の差動式変位検出器の測定範囲を越
えた時点から第2の差動変位検出器から変位信号
が出力され、この信号を選択手段が選択する。こ
のように、測定範囲の異なる複数の差動式変位検
出が順次圧子の変位を測定するので、全体として
広い範囲にわたつて圧子の変位を測定することが
できる。
[Function] The displacement of the indenter is measured by the first differential displacement detector provided on the indenter side, and if the displacement exceeds this measurement range, the measurement range of the first differential displacement detector is changed. A displacement signal is output from the second differential displacement detector from the point in time when the displacement is exceeded, and the selection means selects this signal. In this way, since the plurality of differential displacement detectors having different measurement ranges sequentially measure the displacement of the indenter, the displacement of the indenter can be measured over a wide range as a whole.

[実施例] 第1図は本考案の実施例である超微小材料試験
機のうち自動平衡型電子天秤タイプの負荷装置1
と圧子6との構成を示す模式図で、中央部をナイ
フエツジ5により支持した天秤2の一端には角錘
状の圧子6が、他端にはソレノイド3と協動して
電磁力を発生する鉄心7が取付けられている。圧
子6の上部には差動トランス式の2つの変位検出
器9,10が設けられており、荷重をかけている
間、圧子6によつて押し付けられた試料16表面
での変位を検出する。
[Example] Figure 1 shows a self-balancing electronic balance type loading device 1 of an ultra-fine material testing machine that is an example of the present invention.
This is a schematic diagram showing the configuration of a balance 2 whose central part is supported by a knife edge 5, and a pyramid-shaped indenter 6 at one end of the balance 2, which works with a solenoid 3 at the other end to generate electromagnetic force. Iron core 7 is attached. Two differential transformer-type displacement detectors 9 and 10 are provided above the indenter 6 to detect displacement on the surface of the sample 16 pressed by the indenter 6 while a load is being applied.

2つの変位検出器9,10は、その磁性体で作
られたコア9A,10Aが圧子6の変位に連動し
て移動するように接続されるとともに、一方の変
位検出器9(測定範囲を0〜20μmであるとす
る。)のコア9Aが測定範囲の0点位置にある時
に、他方の変位検出器10のコア10Aが変位検
出器10の測定範囲より20μm上方に位置するよ
うに調整されている。すなわち、第1の変位検出
器9の測定範囲の上限が第2の変位検出器の0点
と一致するように調整されている。このような調
整は変位検出器のコイル部を上下させればよく、
従来の変位検出器の調整と同様に行なえばよい。
The two displacement detectors 9 and 10 are connected so that cores 9A and 10A made of magnetic material move in conjunction with the displacement of the indenter 6, and one displacement detector 9 (with a measurement range of 0 ~20 μm) is adjusted so that when the core 9A of the displacement detector 10 is at the zero point position of the measurement range, the core 10A of the other displacement detector 10 is located 20 μm above the measurement range of the displacement detector 10. There is. That is, the upper limit of the measurement range of the first displacement detector 9 is adjusted to match the zero point of the second displacement detector. Such adjustments can be made by moving the coil section of the displacement detector up and down.
This can be done in the same way as the adjustment of conventional displacement detectors.

第2図は、2つの変位検出器9,10から出力
される信号の処理回路の構成を示すブロツク図
で、各々の変位検出器9,10の出力信号をアン
プ11で増幅し、これら出力信号を選択する選択
手段としてのマルチプレクサ12で切換えてA/
D変換器13によりA/D変換してCPU14へ
送る。通常の圧子6の変位は、圧子6側に設けた
変位検出器9で測定される。この測定範囲を終え
た変位に対しては、コア9Aが測定範囲を越えた
時点で変位検出器10から変位信号が出力される
ので、マルチプレクサ12で切換え、CPU14
で変位検出器9の変位信号に変位検出器10から
の信号を加えて圧子6の変位量が算出される。算
出された変位量は図示しないレコーダ15で記録
される。変位検出器は測定範囲外であれば出力電
圧が変化しないので、どちらの検出器が作動して
いるかは出力電圧をチエツクすることによつて判
別することができる。マルチプレクサ12を使用
しない時は、A/D変換器13を2チヤンネル分
使用するようにしてCPU14へ信号を送るよう
にしてもよい。
FIG. 2 is a block diagram showing the configuration of a processing circuit for signals output from two displacement detectors 9 and 10. The output signals of each displacement detector 9 and 10 are amplified by an amplifier 11, and these output signals are A/
The data is A/D converted by the D converter 13 and sent to the CPU 14. The displacement of the normal indenter 6 is measured by a displacement detector 9 provided on the indenter 6 side. For the displacement that has finished this measurement range, a displacement signal is output from the displacement detector 10 when the core 9A exceeds the measurement range, so it is switched by the multiplexer 12, and the CPU 14
The amount of displacement of the indenter 6 is calculated by adding the signal from the displacement detector 10 to the displacement signal from the displacement detector 9. The calculated displacement amount is recorded by a recorder 15 (not shown). Since the output voltage of the displacement detector does not change if it is outside the measurement range, it is possible to determine which detector is operating by checking the output voltage. When the multiplexer 12 is not used, the A/D converter 13 may be used for two channels to send signals to the CPU 14.

上記実施例では、2つの変位検出器を使用した
が、3個以上使用することもできる。上記したよ
うに各変位検出器を接続配置することにより、使
用数に応じて一つの変位検出器で計測できる変位
量の使用数倍だけ測定範囲を広げることができ
る。また、実施例では変位検出器を直列に配置し
たが、順次各変位検出器の測定範囲内を可動部が
連続して移動するように接続配置すればよく、場
合によつては並列に配置してもよい。さらには天
秤の可動杆の他の部材の位置に設置してもよい。
この場合は可動量の関係を調整する必要がある。
In the above embodiment, two displacement detectors are used, but three or more can also be used. By connecting and arranging the displacement detectors as described above, the measurement range can be expanded by the number of displacements that can be measured with one displacement detector, depending on the number of displacement detectors used. In addition, although the displacement detectors are arranged in series in the embodiment, they may be connected and arranged so that the movable parts move continuously within the measurement range of each displacement detector, or in some cases they may be arranged in parallel. You can. Furthermore, it may be installed at the position of another member of the movable rod of the balance.
In this case, it is necessary to adjust the relationship between the movable amounts.

さらに本考案を、補助的装置として例えば光学
モニターを備え、該モニターによつて回転試料台
上の試験片に対する圧子の位置決めを行ない、試
料台を回転させて負荷位置に持つてくるようにし
た試験機に実施すれば、変位検出器の測定範囲が
広くなるので、試料台の回転による高さ合せの調
整を簡単に行なうことができるようになる。
Furthermore, the present invention was tested by providing an optical monitor as an auxiliary device, using the monitor to position the indenter with respect to the test piece on the rotating sample stage, and rotating the sample stage to bring it to the loading position. If this method is implemented in a machine, the measurement range of the displacement detector will be widened, making it possible to easily adjust the height by rotating the sample stage.

[考案の効果] 上記説明から明らかなように、本考案にかかる
超微小材料試験機によれば、一回の試験で複数の
変位検出器を選択使用でき、圧子の押込み深さを
広範囲にわたつて測定することが可能となつた。
[Effects of the invention] As is clear from the above explanation, the ultra-fine material testing machine according to the invention allows multiple displacement detectors to be selectively used in a single test, and the indentation depth of the indenter can be varied over a wide range. It has become possible to measure across the board.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例である超微小材料試験
機の要部の構成を示す模式図、第2図は変位検出
器からの出力信号の処理回数を示すブロツク図で
ある。 9,10……変位検出器、9A,10A……コ
ア、12……マルチプレクサ(選択手段)、14
……CPU。
FIG. 1 is a schematic diagram showing the configuration of the essential parts of an ultra-fine material testing machine which is an embodiment of the present invention, and FIG. 2 is a block diagram showing the number of times an output signal from a displacement detector is processed. 9, 10...Displacement detector, 9A, 10A...Core, 12...Multiplexer (selection means), 14
……CPU.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 任意に微小荷重を加えることができる可変形負
荷装置により被試験体に圧子を押し付け、該圧子
の変位量を変位検出器によつて求めるようにした
超微小材料試験機において、変位検出器を複数の
差動式変位検出器で構成してこれらを直列に結合
し、第1の変位検出器の測定範囲の上限が第2の
変位検出器の0点と一致するように順次調整して
設けるとともに、これら複数の差動式変位検出器
の出力を選択する選択手段を設けたことを特徴と
する超微小材料試験機。
This ultra-micro material testing machine presses an indenter against the test piece using a variable load device that can apply any minute load, and determines the amount of displacement of the indenter using a displacement detector.The displacement detector is composed of a plurality of differential displacement detectors that are connected in series, and are sequentially adjusted so that the upper limit of the measurement range of a first displacement detector coincides with the zero point of a second displacement detector, and a selection means is provided for selecting the output of these multiple differential displacement detectors.
JP1986046929U 1986-03-29 1986-03-29 Expired - Lifetime JPH0545961Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986046929U JPH0545961Y2 (en) 1986-03-29 1986-03-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986046929U JPH0545961Y2 (en) 1986-03-29 1986-03-29

Publications (2)

Publication Number Publication Date
JPS62168448U JPS62168448U (en) 1987-10-26
JPH0545961Y2 true JPH0545961Y2 (en) 1993-11-30

Family

ID=30867050

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986046929U Expired - Lifetime JPH0545961Y2 (en) 1986-03-29 1986-03-29

Country Status (1)

Country Link
JP (1) JPH0545961Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5240216B2 (en) * 2010-02-19 2013-07-17 株式会社島津製作所 Amplifier device for displacement meter

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5611888A (en) * 1979-07-09 1981-02-05 Tokyo Shibaura Electric Co High frequency heater
JPS60256030A (en) * 1984-06-01 1985-12-17 Shimadzu Corp Apparatus for applying minute load

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5611888A (en) * 1979-07-09 1981-02-05 Tokyo Shibaura Electric Co High frequency heater
JPS60256030A (en) * 1984-06-01 1985-12-17 Shimadzu Corp Apparatus for applying minute load

Also Published As

Publication number Publication date
JPS62168448U (en) 1987-10-26

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