JPH0545397A - Sheet for analysis of wiring board and method for analysis thereof - Google Patents

Sheet for analysis of wiring board and method for analysis thereof

Info

Publication number
JPH0545397A
JPH0545397A JP3200336A JP20033691A JPH0545397A JP H0545397 A JPH0545397 A JP H0545397A JP 3200336 A JP3200336 A JP 3200336A JP 20033691 A JP20033691 A JP 20033691A JP H0545397 A JPH0545397 A JP H0545397A
Authority
JP
Japan
Prior art keywords
wiring board
straight line
analysis
virtual straight
intersection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3200336A
Other languages
Japanese (ja)
Other versions
JP2900649B2 (en
Inventor
Hidehiro Shigematsu
英弘 重松
Taiichi Miho
泰一 美保
Takeo Ogawa
武男 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3200336A priority Critical patent/JP2900649B2/en
Publication of JPH0545397A publication Critical patent/JPH0545397A/en
Application granted granted Critical
Publication of JP2900649B2 publication Critical patent/JP2900649B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To obtain a sheet for analysis of a wiring board which makes it possible to seek a necessary measuring point out of a plurality of measuring points on the wiring board in a short time, in particular, regarding the sheet for analysis of the wiring board which is used as a means of seeking the necessary measuring point out of the measuring points in a plurality on the wiring board. CONSTITUTION:Measuring points located in a dotted manner on a wiring board which is marked out in the shape of squares by a plurality of virtual straight lines (Xi; i=1, 2, 3,...) being parallel to one another and by a plurality of virtual straight lines (Yj; j=1, 2, 3, ...) being orthogonal to the virtual straight lines (Xi) and parallel to one another, are shown on a display surface. A sheet for analysis of the wiring board which is used as a means of seeking a necessary measuring point out of a plurality of measuring points on the wiring board and measuring points M are shown on the display surface, and the virtual straight lines Xi and the virtual straight lines Yi are shown on this surface so that the positional relationships thereof with the measuring point on the wiring board are made to correspond to each other. A construction is made so that a straight line L whereby each measuring point Ma out of the measuring points M which deviates from a point C of intersection of the straight lines Xi and Yi is made to correspond, 1 to 1, to a point Ca of intersection not overlapping with the measuring point M, out of the points C of intersection located in the vicinity of the measuring point Ma, is shown in the figure.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、配線基板上に点在する
測定点を表示面に図示し、配線基板上の複数の測定点の
中から所要の測定点を探し出す手段として用いられる配
線基板の解析用シート、特に配線基板上の複数の測定点
の中から所要の測定点を短時間で探し出すことを可能に
する配線基板の解析用シートに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention shows a wiring board used as a means for locating a desired measurement point from a plurality of measurement points on the wiring board by displaying measurement points scattered on the wiring board on a display surface. The present invention relates to a sheet for analysis of wiring boards, and more particularly, to a sheet for analysis of wiring boards that enables a required measurement point to be searched out from a plurality of measurement points on a wiring board in a short time.

【0002】[0002]

【従来の技術】次に、従来の配線基板の解析用シートに
ついて図3を参照して説明する。図2は、従来の配線基
板の解析用シートを模式的に示す要部平面図である。
2. Description of the Related Art Next, a conventional wiring board analysis sheet will be described with reference to FIG. FIG. 2 is a plan view of a main part schematically showing a conventional analysis sheet for a wiring board.

【0003】従来の配線基板の解析用シートは、図2に
示す如く配線基板(図示せず)上に点在する多くの測定
点Mを表示面に図示し、そして、この紙面上に図示され
た測定点Mに一連の識別番号Nk(k;1,2,3, ・・・) を付
与していた。
A conventional analysis sheet for a wiring board shows many measurement points M scattered on a wiring board (not shown) on the display surface as shown in FIG. A series of identification numbers Nk (k; 1,2,3, ...) Are assigned to the measurement points M.

【0004】[0004]

【発明が解決しようとする課題】したがって、配線基板
の測定点M間の導通状態等の電気的な特性値を試験する
配線基板試験装置(図示せず)は、それぞれの測定点M
に関わる試験結果を識別番号Nk(k;1,2,3, ・・・) に対
応させて出力していた。
Therefore, a wiring board testing apparatus (not shown) for testing electrical characteristic values such as the electrical connection between the measurement points M of the wiring board is provided at each measurement point M.
The test result related to was output corresponding to the identification number Nk (k; 1,2,3, ...).

【0005】かかる試験等から、配線基板上の多くの測
定点Mの中のある測定点M’を特定して更に綿密な検査
を行なうことが必要となることは少なくない。如上の測
定点の特定、すなわち配線基板上の多くの測定点Mの中
から所要の測定点M’の探し出しは、配線基板試験装置
が出力した識別番号Nkと同じ番号の測定点M’を表示シ
ート上で探し出した後に、表示シート上におけるその位
置関係から配線基板上の測定点を目視により特定してい
た。
From such tests and the like, it is often necessary to identify a certain measurement point M'of many measurement points M on the wiring board and perform a more detailed inspection. In order to identify the above measurement point, that is, to find out the required measurement point M ′ from many measurement points M on the wiring board, the measurement point M ′ having the same number as the identification number Nk output by the wiring board tester is displayed. After finding out on the sheet, the measurement point on the wiring board was visually identified from the positional relationship on the display sheet.

【0006】このように従来の表示シートは、この表示
シート上における位置関係を表示する機能を持たない識
別番号Nkを測定点Mに付与し記入していたため、特定の
識別番号Nkを表示シート上で探し出すには多くの時間が
必要となる問題があった。
As described above, in the conventional display sheet, since the identification number Nk which does not have the function of displaying the positional relationship on the display sheet is added to the measurement point M and written, the specific identification number Nk is displayed on the display sheet. There was a problem that it took a lot of time to find out in.

【0007】本発明は、このような問題を解消するため
になされたものであって、その目的は配線基板上の複数
の測定点の中から所要の測定点を短時間で探し出すこと
を可能にする配線基板の解析用シートの提供にある。
The present invention has been made to solve such a problem, and an object thereof is to make it possible to find a required measurement point from a plurality of measurement points on a wiring board in a short time. To provide a sheet for analysis of a wiring board.

【0008】[0008]

【課題を解決するための手段】図1に示すように前記目
的は、互いに平行な複数の仮想直線(Xi;i=1,2,3,・・
・)と、この仮想直線(Xi)に直交且つ互いに平行な複数
の仮想直線(Yj;j=1,2,3,・・・) とにより方形陣状に
区画される配線基板上に点在する測定点を表示面に図示
し、配線基板上の複数の測定点の中から所要の測定点を
探し出す手段として用いられる配線基板の解析用シート
において、測定点Mを図示した表示面に、配線基板上に
おける測定点との位置関係を対応させて仮想直線Xiと仮
想直線Yjとを図示し、測定点Mの中で直線Xiと直線Yjと
の交点Cから外れたそれぞれの測定点Maと、この測定点
Maの近傍の交点Cの中で測定点とならない交点Caとを1
対1で対応させる直線Lを図示することを特徴とする配
線基板の解析用シートにより達成される。
As shown in FIG. 1, the above-mentioned object is to achieve a plurality of virtual straight lines (Xi; i = 1,2,3, ...
,) And a plurality of virtual straight lines (Yj; j = 1,2,3, ...) Which are orthogonal to this virtual straight line (Xi) and parallel to each other, are scattered on the wiring board which is partitioned in a square formation. In the analysis sheet of the wiring board used as a means for finding a desired measurement point from a plurality of measurement points on the wiring board, the measurement point M is displayed on the display surface. The virtual straight line Xi and the virtual straight line Yj are shown in correspondence with the positional relationship with the measurement points on the substrate, and the measurement points Ma deviating from the intersection point C of the straight lines Xi and the straight lines Yj among the measurement points M, This measurement point
Among the intersection points C near Ma, set the intersection point Ca that does not become the measurement point to 1
This is achieved by an analysis sheet of a wiring board, which shows a straight line L corresponding to one another.

【0009】[0009]

【作用】図1に示すように本発明の配線基板の解析用シ
ートは、測定点Mを図示した表示面に配線基板上におけ
る測定点との位置関係を対応させて仮想直線Xiと仮想直
線Yjとを図示するとともに、測定点Mの中で直線Xiと直
線Yjとの交点Cから外れたそれぞれの測定点Maと、この
測定点Maの近傍の交点Cの中で測定点Mと重畳しない交
点Caとをそれぞれ1対1で対応させる直線を図示してい
る。
As shown in FIG. 1, in the wiring sheet analysis sheet of the present invention, the virtual straight line Xi and the virtual straight line Yj are made to correspond to the positional relationship between the measurement points M on the display surface and the measurement points on the wiring substrate. And the respective measurement points Ma deviating from the intersection point C of the straight line Xi and the straight line Yj in the measurement point M and the intersection points of the intersection points C near the measurement point Ma that do not overlap with the measurement point M. The straight lines that correspond one-to-one with Ca are shown.

【0010】したがって、前述した配線基板試験装置
が、測定点Mの中で直線Xiと直線Yjとの交点Cにある測
定点Mに関わる試験結果をこの交点Cの座標値とともに
出力し、そして、交点Cから外れたそれぞれの測定点Ma
に関わる試験結果をこの測定点Maが直線Lにより連結し
た交点Caの座標値とともに出力するようにして構成して
おけば、それぞれの測定点は配線基板試験装置が測定結
果とともに出力した座標値を見ることに直ちに探し出せ
ることとなる。
Therefore, the above-described wiring board testing device outputs the test result relating to the measurement point M at the intersection C between the straight line Xi and the straight line Yj in the measurement point M together with the coordinate value of this intersection C, and Each measurement point Ma deviating from the intersection point C
If the test result relating to is output together with the coordinate value of the intersection point Ca where the measurement point Ma is connected by the straight line L, the coordinate value output by the wiring board test device together with the measurement result is obtained at each measurement point. You will be able to find it immediately by looking at it.

【0011】[0011]

【実施例】以下、本発明の一実施例の配線基板の解析用
シートについて図1を参照して説明する。図1は、本発
明の一実施例の配線基板の解析用シートを模式的に示す
要部平面図である。なお、本明細書においては、同一部
品、同一材料等に対しては全図をとおして同じ符号を付
与してある。
EXAMPLE An analysis sheet for a wiring board according to an example of the present invention will be described below with reference to FIG. FIG. 1 is a main part plan view schematically showing an analysis sheet of a wiring board according to an embodiment of the present invention. In the present specification, the same parts, the same materials and the like are designated by the same reference numerals throughout the drawings.

【0012】本発明の一実施例の配線基板の解析用シー
トは、配線基板(図示せず)上の測定点を表示面に図示
した従来の配線基板の解析用シート(図2参照)に、配
線基板上における測定点との位置関係を対応させて仮想
直線Xi(i=1,2,3,・・・)と、この仮想直線Xiに直交且
つ互いに平行な複数の仮想直線Yj(j=1,2,3,・・・)と
を図示するとともに、測定点Mの中で直線Xiと直線Yjと
の交点Cから外れたそれぞれの測定点Maと、これらの測
定点Maの近傍の交点Cの中で測定点Mと位置関係が重畳
しない交点Ca( この交点Caは測定点Maの周囲に存在する
測定点Mと位置関係が重畳しない交点Cの中から任意に
選択できる) とを1対1で対応させる直線Lを図示する
ものである。
The wiring board analysis sheet of one embodiment of the present invention is the same as the conventional wiring board analysis sheet (see FIG. 2) in which the measurement points on the wiring board (not shown) are shown on the display surface. A virtual straight line Xi (i = 1,2,3, ...) Corresponding to the positional relationship with the measurement point on the wiring board, and a plurality of virtual straight lines Yj (j = j 1, 2, 3, ...), and each measurement point Ma deviating from the intersection C of the straight line Xi and the straight line Yj in the measurement point M, and the intersection points in the vicinity of these measurement points Ma. Intersection Ca that does not have a positional relationship with measurement point M in C (this intersection point Ca can be arbitrarily selected from intersection points C that do not have a positional relationship with measurement points M existing around measurement point Ma) A straight line L corresponding to a pair 1 is illustrated.

【0013】したがって、前述した配線基板試験装置
が、測定点Mの中で仮想直線Xiと仮想直線Yjとの交点C
にある測定点Mcに関わる試験結果をこの交点Cの座標値
とともに出力し、そして、測定点Mの中で直線Xiと直線
Yjとの交点Cから外れたそれぞれの測定点Maに関わる試
験結果をこの測定点Maが直線Lにより連結した交点Caの
座標値とともに出力するようにして構成しておけば、そ
れぞれ測定点は座標値を見ることにより直ちに探し出せ
ることとなる。
Therefore, the above-mentioned wiring board test apparatus has the intersection C of the virtual straight line Xi and the virtual straight line Yj in the measuring point M.
The test result related to the measurement point Mc at is output together with the coordinate value of the intersection point C, and the straight line Xi and the straight line at the measurement point M are output.
If the test results relating to each measurement point Ma deviating from the intersection point C with Yj are configured to be output together with the coordinate value of the intersection point Ca that this measurement point Ma is connected by the straight line L, each measurement point is coordinated. By looking at the value, you can find it immediately.

【0014】かくして、配線基板上に点在する多くの測
定点から所要の測定点を短時間で特定できることとな
る。次に、前述した解析用シートを活用した配線基板の
解析方法の一実施例について図2を参照して説明する。
図2は、配線基板の解析方法の一実施例を説明するため
の模式図である。
Thus, the required measurement point can be specified in a short time from the many measurement points scattered on the wiring board. Next, an embodiment of a method of analyzing a wiring board using the above-mentioned analysis sheet will be described with reference to FIG.
FIG. 2 is a schematic diagram for explaining an example of a method of analyzing a wiring board.

【0015】この一実施例の試験システムは、照準格子
状交点に一端を固定したプローブピン11a を有するプロ
ーブヘッド11、貫通孔12a にプローブピン11a を挿通さ
せて屈曲するプローブ位置変換治具12、プローブピン11
a に接続した試験機13及びこの試験機13に接続した出力
装置14とを含んで構成したものである。
The test system of this embodiment comprises a probe head 11 having a probe pin 11a whose one end is fixed at an aiming grid-like intersection, a probe position conversion jig 12 which is bent by inserting the probe pin 11a into a through hole 12a, Probe pin 11
The tester 13 is connected to a and the output device 14 is connected to the tester 13.

【0016】また、照準格子状交点に一端を固定したプ
ローブピン11aは、プローブ位置変換治具12の貫通孔12a
を挿通してそれぞれ所定の方向に屈曲し、その先端が
測定すべき配線基板10の測定点10aに接触するように構
成されている。
The probe pin 11a, one end of which is fixed to the aiming grid-like intersection, has a through hole 12a of the probe position conversion jig 12.
Each of them is configured to be inserted and bent in a predetermined direction, and the tip end thereof contacts the measurement point 10a of the wiring board 10 to be measured.

【0017】したがって、試験機13が配線基板10の電気
的特性値を測定し、この試験結果とともに照準格子状交
点を出力装置14を介して出力させれば、この出力された
照準格子状交点と前述した解析用シートを使用すれは、
配線基板10のそれぞれの測定点10a の特定が容易とな
る。
Therefore, if the tester 13 measures the electrical characteristic value of the wiring board 10 and outputs the aiming grid-like intersections together with the test result through the output device 14, the output aiming grid-like intersections are obtained. If you use the above analysis sheet,
The measurement points 10a on the wiring board 10 can be easily identified.

【0018】[0018]

【発明の効果】以上説明したように本発明は、配線基板
上の複数の測定点の中から所要の測定点を短時間で探し
出すことを可能にする。
As described above, the present invention makes it possible to find a required measurement point from a plurality of measurement points on a wiring board in a short time.

【図面の簡単な説明】[Brief description of drawings]

【図1】は、本発明の一実施例の配線基板の解析用シー
トを模式的に示す要部平面図、
FIG. 1 is a plan view of an essential part schematically showing an analysis sheet of a wiring board according to an embodiment of the present invention,

【図2】は、配線基板の解析方法の一実施例を説明する
ための模式図、
FIG. 2 is a schematic diagram for explaining an embodiment of a method of analyzing a wiring board,

【図3】は、従来の配線基板の解析用シートを模式的に
示す要部平面図、
FIG. 3 is a plan view of an essential part schematically showing a conventional analysis sheet for a wiring board;

【符号の説明】[Explanation of symbols]

CとCaは、交点、 Lは、直線、 MとM’及びMaは、測定点、 Nkは、識別番号、 Xiは、仮想直線、 Yjは、仮想直線、 10は、配線基板、 10a は、測定点、 11は、プローブヘッド、 11a は、プローブピン、 12は、プローブ位置変換治具、 12a は、貫通孔、 13は、試験機、 14は、出力装置をそれぞれ示す。 C and Ca are intersection points, L is a straight line, M and M'and Ma are measurement points, Nk is an identification number, Xi is a virtual straight line, Yj is a virtual straight line, 10 is a wiring board, and 10a is A measurement point, 11 is a probe head, 11a is a probe pin, 12 is a probe position conversion jig, 12a is a through hole, 13 is a tester, and 14 is an output device.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 互いに平行な複数の仮想直線(Xi;i=1,
2,3,・・・)と、この仮想直線(Xi)に直交且つ互いに平
行な複数の仮想直線(Yj;j=1,2,3,・・・)とにより方
形陣状に区画される配線基板上に点在する測定点を表示
面に図示し、配線基板上の複数の測定点の中から所要の
測定点を探し出す手段として用いられる配線基板の解析
用シートにおいて、 測定点(M) を図示した表示面に、配線基板上における測
定点との位置関係を対応させて仮想直線(Xi)と仮想直線
(Yj)とを図示し、 測定点(M) の中で前記直線(Xi)と前記直線(Yj)との交点
(C) から外れたそれぞれの測定点(Ma)と、この測定点(M
a)の近傍の交点(C) の中で測定点(M) と重畳しない交点
(Ca)とをそれぞれ1対1で対応させる直線(L) を図示す
ることを特徴とする配線基板の解析用シート。
1. A plurality of virtual straight lines (Xi; i = 1,
2,3, ...) And a plurality of virtual straight lines (Yj; j = 1,2,3, ...) that are orthogonal to and parallel to this virtual straight line (Xi) The measurement points (M) on the analysis sheet of the wiring board that is used as a means to search for the required measurement points from the multiple measurement points on the wiring board by displaying the measurement points scattered on the wiring board on the display surface The virtual straight line (Xi) and the virtual straight line on the display surface shown in Fig.
(Yj) is shown, and the intersection of the straight line (Xi) and the straight line (Yj) in the measurement points (M)
Each measurement point (Ma) deviating from (C) and this measurement point (M)
Among the intersections (C) near a), the intersections that do not overlap the measurement point (M)
A wiring board analysis sheet characterized by showing straight lines (L) that respectively correspond to (Ca) in a one-to-one relationship.
【請求項2】 照準格子状交点に一端を固定且つプロー
ブ位置変換治具(12)の貫通孔(12a) を挿通したプローブ
ヘッド(11)のプローブピン(11a) の先端を配線基板(10)
の測定点(10a) に接触し、このプローブピン(11a) に接
続した試験装置(13)により配線基板(10)を試験する方法
において、 試験装置(13)が出力装置(14)を介して配線基板(10)の試
験結果とともに出力した前記標準格子状交点の座標位置
並びに前記請求項1記載の解析シートとに基づいて、配
線基板(10)上の測定点(10a) を特定することを特徴とす
る配線基板の解析方法。
2. A wiring board (10) is provided with a tip of a probe pin (11a) of a probe head (11) having one end fixed to an aiming grid-like intersection and having a through hole (12a) of a probe position conversion jig (12) inserted therethrough.
In the method of testing the wiring board (10) with the test device (13) connected to this probe pin (11a) by contacting the measuring point (10a) of the test device (13), the test device (13) The measurement point (10a) on the wiring board (10) is specified based on the coordinate position of the standard grid-like intersection output together with the test result of the wiring board (10) and the analysis sheet according to claim 1. Characteristic wiring board analysis method.
JP3200336A 1991-08-09 1991-08-09 Sheet for analysis of wiring board and analysis method Expired - Fee Related JP2900649B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3200336A JP2900649B2 (en) 1991-08-09 1991-08-09 Sheet for analysis of wiring board and analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3200336A JP2900649B2 (en) 1991-08-09 1991-08-09 Sheet for analysis of wiring board and analysis method

Publications (2)

Publication Number Publication Date
JPH0545397A true JPH0545397A (en) 1993-02-23
JP2900649B2 JP2900649B2 (en) 1999-06-02

Family

ID=16422601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3200336A Expired - Fee Related JP2900649B2 (en) 1991-08-09 1991-08-09 Sheet for analysis of wiring board and analysis method

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63157675U (en) * 1987-04-03 1988-10-17

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63157675U (en) * 1987-04-03 1988-10-17

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