JPH0543471Y2 - - Google Patents

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Publication number
JPH0543471Y2
JPH0543471Y2 JP1988136028U JP13602888U JPH0543471Y2 JP H0543471 Y2 JPH0543471 Y2 JP H0543471Y2 JP 1988136028 U JP1988136028 U JP 1988136028U JP 13602888 U JP13602888 U JP 13602888U JP H0543471 Y2 JPH0543471 Y2 JP H0543471Y2
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JP
Japan
Prior art keywords
substrate
reaction chamber
phase growth
vapor phase
front chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988136028U
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Japanese (ja)
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JPH0256433U (en
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Priority to JP1988136028U priority Critical patent/JPH0543471Y2/ja
Publication of JPH0256433U publication Critical patent/JPH0256433U/ja
Application granted granted Critical
Publication of JPH0543471Y2 publication Critical patent/JPH0543471Y2/ja
Anticipated expiration legal-status Critical
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Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は、基板面に薄膜を形成する横型気相成
長装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a horizontal vapor phase growth apparatus for forming a thin film on a substrate surface.

〔従来の技術〕[Conventional technology]

横型気相成長装置を用いた気相成長方法は、反
応室内に配置した保持台上の基板を昇温すると共
に、該反応室内に気相成長ガスを前記基板面と略
平行に流れるように導入して行う。これによつて
気相成長ガスが基板近傍で加熱分解し、反応生成
物が基板上に堆積して薄膜が形成される。この場
合、一般には気相成長ガスの流れを円滑にして基
板に接触させるため、反応室内にフローチヤンネ
ルを設けるのが普通である。また、大径の基板に
気相成長を実施する場合は、気相成長ガスの利用
効率を高めるために反応室内を区画するフローチ
ヤンネルを設けることもある。
A vapor phase growth method using a horizontal vapor phase growth apparatus involves raising the temperature of a substrate on a holder placed in a reaction chamber, and introducing vapor phase growth gas into the reaction chamber so as to flow approximately parallel to the surface of the substrate. and do it. As a result, the vapor phase growth gas is thermally decomposed in the vicinity of the substrate, and reaction products are deposited on the substrate to form a thin film. In this case, it is common to provide a flow channel within the reaction chamber in order to smooth the flow of the vapor phase growth gas and bring it into contact with the substrate. Furthermore, when performing vapor phase growth on a large diameter substrate, a flow channel may be provided to partition the inside of the reaction chamber in order to increase the utilization efficiency of vapor phase growth gas.

しかしながら、前記反応生成物は、基板上だけ
でなく基板の周囲及び基板の下流側の反応室の内
面にも付着する。特に基板の上方および基板の下
流側の反応室内上面に付着した反応生成物は、付
着量が増大するに従つて剥離し易くなり、気相成
長中に基板の薄膜面に落下したり、気相成長後に
成膜基板を前室内に移動する過程で僅かの振動に
よつて剥離して落下し、基板の成膜面に付着して
成膜基板の品質を著しく低下させる。
However, the reaction products adhere not only on the substrate but also around the substrate and on the inner surface of the reaction chamber downstream of the substrate. In particular, reaction products adhering to the upper surface of the reaction chamber above the substrate and downstream of the substrate become more likely to peel off as the amount of adhesion increases, and may fall onto the thin film surface of the substrate during vapor phase growth or During the process of moving the film-forming substrate into the front chamber after growth, it may peel off and fall due to slight vibrations, and adhere to the film-forming surface of the substrate, significantly degrading the quality of the film-forming substrate.

そこで、1回の気相成長毎に付着した反応生成
物を除去清掃することが望ましいが、これでは清
掃及び清掃のための反応室の分解,組立て等に多
大な手間がかかるほか、清掃中は気相成長が実施
できないので生産性が低下してしまう。
Therefore, it is desirable to remove and clean the attached reaction products after each vapor phase growth, but this requires a great deal of effort to clean and disassemble and assemble the reaction chamber for cleaning, and during cleaning, Since vapor phase growth cannot be performed, productivity decreases.

そこで、従来は5〜10回程度の気相成長毎に清
掃を行つているのが実情である。
Therefore, the current situation is that cleaning is conventionally performed every 5 to 10 times of vapor phase growth.

〔考案が解決しようとする課題〕 しかし、前記のごとき清掃頻度では反応室内に
付着した反応生成物の上にさらに反応生成物が付
着し、後に剥離して基板面に落下するので、不良
品となる成膜基板が増大し、歩留りが低下する不
都合が避けられない。
[Problem to be solved by the invention] However, with the frequency of cleaning as described above, reaction products adhere to the reaction products adhering to the reaction chamber, and later peel off and fall onto the substrate surface, resulting in defective products. This inevitably increases the number of substrates on which the film is to be deposited and reduces the yield.

本考案者は、この実情に鑑み鋭意研究の結果、
既に堆積している反応生成物の上に堆積した反応
生成物は剥離し易いのに対し、1回の気相成長で
付着した反応生成物は、その1回限りでは殆ど剥
離しないことを見い出した。
In view of this situation, the inventor of this invention has conducted extensive research and found that
It was found that reaction products deposited on already deposited reaction products are easily peeled off, whereas reaction products deposited during one vapor phase growth hardly peel off after only one step. .

そこで、本考案はかかる知見に基づいて成され
たもので、従来と同等以上の生産性を維持して、
従来より歩留りを向上させた横型気相成長装置を
提供するものである。
Therefore, this invention was made based on such knowledge, and maintains productivity equal to or higher than conventional ones.
The present invention provides a horizontal vapor phase growth apparatus with improved yield compared to the conventional method.

〔課題を解決するための手段〕[Means to solve the problem]

即ち、本考案は、一側に気相成長ガス導入管が
接続された反応室と、該反応室にて気相成長によ
り薄膜が形成される基板を載置する保持台と、前
記反応室の他側に連設され、前記基板の入れ替え
を行う前室と、該前室と前記反応室の保持台との
間を水平移動する搬送装置とを備えた横型気相成
長装置において、前記前室と前記反応室との間
に、前記搬送装置が前記前室に退避している際に
前記前室と前記反応室とを遮断する遮蔽機構を備
え、前記気相成長ガス導入管に連続する筒状のフ
ローチヤンネルを前記反応室内に配設し、該フロ
ーチヤンネルは、前記前室側端部の少なくとも上
部を着脱可能な可動部と成すと共に該可動部に対
応する前室側底部を前記保持台の設置部と成し、
前記可動部は、気相成長毎に前記基板とともに前
記搬送装置にて前記前室に搬送されて交換可能な
ものであることを特徴とするものである。
That is, the present invention comprises a reaction chamber to which a vapor phase growth gas introduction pipe is connected on one side, a holding table on which a substrate on which a thin film is to be formed by vapor phase growth is placed in the reaction chamber, and In the horizontal vapor phase growth apparatus, the front chamber is provided with a front chamber that is connected to the other side and is provided with a front chamber for exchanging the substrate, and a transfer device that moves horizontally between the front chamber and a holding table of the reaction chamber. and the reaction chamber, a shielding mechanism is provided for blocking the front chamber and the reaction chamber when the transport device is evacuated to the front chamber, and a cylinder connected to the vapor growth gas introduction pipe is provided. A flow channel having the shape of a shape is disposed in the reaction chamber, and the flow channel has at least an upper part of an end on the front chamber side as a removable movable part, and a bottom part on the front chamber side corresponding to the movable part is connected to the holding table. The installation part and the
The movable part is transported to the front chamber together with the substrate by the transport device every time vapor phase growth is performed, and is replaceable.

〔作用〕[Effect]

したがつて、気相成長を中断することなく、各
気相成長毎に、基板の交換と同時に清浄化した新
しい可動部と交換することができ、該可動部に反
応生成物が付着しても1回限りの付着とし、該可
動部に付着した反応生成物の剥離を防止すること
ができる。
Therefore, the movable part can be replaced with a new, cleaned movable part at the same time as the substrate is replaced after each vapor-phase growth without interrupting the vapor-phase growth, and even if reaction products adhere to the movable part, the movable part can be replaced with a new one. The reaction product attached to the movable part can be prevented from peeling off by attaching it only once.

〔実施例〕〔Example〕

以下、第1図乃至第4図に基づいて本考案の一
実施例を説明する。
Hereinafter, one embodiment of the present invention will be described based on FIGS. 1 to 4.

横型気相成長装置1は、内部で気相成長を実施
する反応室2と、該反応室2の一側に接続された
気相成長ガス導入管3と、反応室2にて気相成長
により薄膜が形成される基板Pを載置する保持台
4と、反応室2の他側に連設され、前記基板Pの
入れ替えを行う前室5と、該前室5と反応室2の
保持台4との間を水平移動する搬送装置6と、前
記前室5と反応室2との間に備えられ、搬送装置
6が前室5に退避している際に前室5と反応室2
とを遮断する遮蔽機構7と、反応室2内に配設さ
れ、気相成長ガス導入管3に連続する筒状のフロ
ーチヤンネル8とで構成されている。
A horizontal vapor growth apparatus 1 includes a reaction chamber 2 in which vapor growth is performed, a vapor growth gas introduction pipe 3 connected to one side of the reaction chamber 2, and a vapor growth gas introduction pipe 3 that performs vapor growth in the reaction chamber 2. A holding table 4 on which a substrate P on which a thin film is to be formed is placed, a front chamber 5 which is connected to the other side of the reaction chamber 2 and in which the substrate P is exchanged, and a holding table between the front chamber 5 and the reaction chamber 2. A transport device 6 is provided between the front chamber 5 and the reaction chamber 2, and the transport device 6 horizontally moves between the front chamber 5 and the reaction chamber 2 when the transport device 6 is retracted to the front chamber 5.
and a cylindrical flow channel 8 disposed within the reaction chamber 2 and continuous with the vapor phase growth gas introduction pipe 3.

前記反応室2は、石英ガラス等を用いて形成さ
れたもので、一側がフランジ20で閉塞され、該
フランジ20を貫通してガス導入管3が連設され
ると共に、他側壁面には排ガス排出管21が連設
されている。また、反応室2の外周には、RFコ
イル(図示せず)が巻回されている。
The reaction chamber 2 is formed using quartz glass or the like, and one side is closed with a flange 20, and a gas introduction pipe 3 is connected to the flange 20 passing through the flange 20. A discharge pipe 21 is provided in series. Further, an RF coil (not shown) is wound around the outer periphery of the reaction chamber 2.

前記保持台4は、カーボンで形成されており、
第3図及び第4図に示すごとく、該保持台4に
は、保持台4に着脱可能に嵌装されるリング状の
トレイ9を介して基板Pが載置される。該トレイ
9は、搬送装置6にて搬送されるもので、トレイ
9の幅寸法を保持台4の幅寸法より広く形成して
トレイ9の両側下部に後述する搬送装置6の下ホ
ーク66が挿入可能に形成されている。
The holding base 4 is made of carbon,
As shown in FIGS. 3 and 4, a substrate P is placed on the holding table 4 via a ring-shaped tray 9 that is removably fitted onto the holding table 4. As shown in FIGS. The tray 9 is transported by a transport device 6, and the width of the tray 9 is made wider than the width of the holding table 4, and lower forks 66 of the transport device 6, which will be described later, are inserted into the lower sides of both sides of the tray 9. possible.

また、保持台4およびトレイ9は、前部から後
部に亘つて後ろ上がりに傾斜して形成されてお
り、これにより、気相成長ガスが平均した濃度で
保持台4に載置した基板P上を流れる。尚、基板
Pの昇温手段が保持台4の誘導加熱または抵抗加
熱に伴う熱伝導の場合には、基板Pの底面が保持
台4の上面に接触するように、保持台4の上面が
トレイ9の上面より僅かに高くなるように形成す
ることが望ましい。
Further, the holding table 4 and the tray 9 are formed so as to be inclined backward upward from the front part to the rear part, so that the vapor phase growth gas is distributed over the substrate P placed on the holding table 4 at an average concentration. flows. In addition, when the means for raising the temperature of the substrate P is heat conduction accompanying induction heating or resistance heating of the holding table 4, the top surface of the holding table 4 is placed on the tray so that the bottom surface of the substrate P is in contact with the top surface of the holding table 4. It is desirable to form it so that it is slightly higher than the upper surface of 9.

前記前室5は、基板Pの搬入・搬出用の開閉扉
50が設けられている。
The front chamber 5 is provided with an opening/closing door 50 for loading and unloading the substrate P.

前記搬送装置6は、前室5の反応室2との対向
面に、ベロー部60を介して上下方向に揺動可能
に接続されたガイド筒61と、該ガイド筒61内
を摺動する内部磁石62と、ガイド筒61の外周
に沿つて移動可能に設けられた外部磁石63と、
内部磁石62に後端を連設したガイド棒64と、
該ガイド棒64の先端に設けた上ホーク65及び
下ホーク66とで構成されている。
The conveying device 6 includes a guide tube 61 connected to a surface of the front chamber 5 facing the reaction chamber 2 via a bellows portion 60 so as to be swingable in the vertical direction, and an inner tube that slides inside the guide tube 61. a magnet 62; an external magnet 63 movably provided along the outer periphery of the guide cylinder 61;
a guide rod 64 whose rear end is connected to the internal magnet 62;
It consists of an upper fork 65 and a lower fork 66 provided at the tip of the guide rod 64.

前記上ホーク65は後述するフローチヤンネル
8の可動部80を、下ホーク66は前記トレイ9
および基板Pを、前室5と反応室2とに夫々搬送
するもので、外部磁石63のガイド筒61に沿う
移動に伴つて外部磁石63の磁気吸引力により内
部磁石62を移動させて、搬送装置6を水平方向
に移動させる。
The upper fork 65 connects the movable part 80 of the flow channel 8, which will be described later, and the lower fork 66 connects the tray 9.
and the substrate P are transported to the front chamber 5 and the reaction chamber 2, respectively.As the external magnet 63 moves along the guide tube 61, the internal magnet 62 is moved by the magnetic attraction force of the external magnet 63, and the substrate P is transported. Move the device 6 horizontally.

前記遮蔽機構7は、例えばゲート弁からなるも
ので、搬送装置6の上ホーク65及び下ホーク6
6が前室5に退避している際に、前室5と反応室
2とを遮断し、搬送装置6の上ホーク65及び下
ホーク66が反応室2に在るときは開いている。
The shielding mechanism 7 is composed of, for example, a gate valve, and is connected to an upper fork 65 and a lower fork 6 of the conveying device 6.
6 is retreating to the front chamber 5, the front chamber 5 and the reaction chamber 2 are shut off, and when the upper fork 65 and the lower fork 66 of the transfer device 6 are in the reaction chamber 2, they are open.

前記フローチヤンネル8は、前記前室側端部の
少なくとも上部を着脱可能な可動部80と成すと
共に該可動部80に対応する前室側底部を前記保
持台4の設置部81と成し、前記可動部80以外
の部分は、反応室2及び気相成長ガス導入管3に
対しての固定部82を成している。
The flow channel 8 has at least the upper part of the end on the side of the front chamber as a removable movable part 80, and the bottom part on the side of the front chamber corresponding to the movable part 80 as the installation part 81 of the holding table 4. The portion other than the movable portion 80 constitutes a fixed portion 82 with respect to the reaction chamber 2 and the vapor phase growth gas introduction pipe 3.

前記可動部80は、気相成長ガスに乱流を生じ
ないように、該可動部80を固定部82の設置部
81の両側壁上縁部に載置した際に、固定部82
の端縁と密に接続させることが望ましく、そのた
めには、可動部80と固定部82上縁との間に突
起と凹部等を形成して可動部80の位置決め部8
3を形成することが好ましい。
When the movable part 80 is placed on the upper edge of both side walls of the installation part 81 of the fixed part 82, the fixed part 82
It is desirable that the positioning part 8 of the movable part 80 be closely connected to the edge of the movable part 80 and the upper edge of the fixed part 82 by forming protrusions, recesses, etc. between the movable part 80 and the upper edge of the fixed part 82.
It is preferable to form 3.

また、前記可動部80は、搬送装置6の下ホー
ク66にて搬送されるトレイ9および基板Pとと
もに上ホーク65にて前記前室5に搬送されて気
相成長毎に清浄化した新しい可動部と交換され
る。
Moreover, the movable part 80 is transported to the front chamber 5 by the upper fork 65 together with the tray 9 and the substrate P transported by the lower fork 66 of the transport device 6, and a new movable part is cleaned for each vapor phase growth. is exchanged with

このように構成した横型気相成長装置1で気相
成長を行うには、先ず搬送装置6を後退(第1図
において左方向)させて、上ホーク65及び下ホ
ーク66を前室5内に退避させ、開閉扉50から
下ホーク66上にトレイ9と未処理の基板Pを載
置すると共に、上ホーク65上に清浄化した新し
い可動部80を載置する。
In order to perform vapor phase growth using the horizontal vapor phase growth apparatus 1 configured as described above, first, the transfer device 6 is moved backward (to the left in FIG. 1), and the upper fork 65 and the lower fork 66 are moved into the front chamber 5. The tray 9 and the unprocessed substrate P are placed on the lower fork 66 from the opening/closing door 50, and a new cleaned movable part 80 is placed on the upper fork 65.

次いで、遮蔽機構7を開くと共に、上ホーク6
5及び下ホーク66を上方に僅かに持上げるよう
にガイド筒61を上動させ、ガイド棒64の後端
の内部磁石62を外部磁石63で移動させて搬送
装置24を前進(第1図において右方向)させ、
上ホーク65及び下ホーク66が反応室2内の所
定の位置まで前進した時にガイド筒61を下動さ
せ、上ホーク65及び下ホーク66を下げてトレ
イ9を、フローチヤンネル8の設置部81に置か
れている保持台4の所定の位置にセツトして、保
持台4上に基板Pを載置するとともに、上ホーク
32に載置されている可動部80をフローチヤン
ネル8の固定部82の設置部81上方の開口部を
覆うようにセツトする。
Next, while opening the shielding mechanism 7, the upper fork 6
5 and the lower fork 66 upward, and the internal magnet 62 at the rear end of the guide bar 64 is moved by the external magnet 63 to move the conveying device 24 forward (as shown in FIG. right direction),
When the upper fork 65 and the lower fork 66 advance to a predetermined position in the reaction chamber 2, the guide tube 61 is moved down, the upper fork 65 and the lower fork 66 are lowered, and the tray 9 is placed in the installation part 81 of the flow channel 8. Set the holding table 4 at a predetermined position, place the substrate P on the holding table 4, and move the movable part 80 placed on the upper fork 32 to the fixed part 82 of the flow channel 8. Set so as to cover the opening above the installation part 81.

そして、搬送装置24を後退させて、上ホーク
65及び下ホーク66を前室5内に退避させて遮
蔽機構7を閉じ、気相成長ガス導入管3から気相
成長ガスをフローチヤンネル8内に流すと共に
RFコイル(図示せず)に通電し、保持台4を介
して基板Pを所定の温度に保持する。これによ
り、フローチヤンネル8内を流れる気相成長ガス
が基板P上で熱分解し、反応生成物が基板P上に
堆積して該基板Pに薄膜が形成される。
Then, the transport device 24 is retreated, the upper fork 65 and the lower fork 66 are retreated into the front chamber 5, the shielding mechanism 7 is closed, and the vapor growth gas is introduced into the flow channel 8 from the vapor growth gas introduction pipe 3. Along with flowing
An RF coil (not shown) is energized to hold the substrate P at a predetermined temperature via the holding table 4. As a result, the vapor growth gas flowing through the flow channel 8 is thermally decomposed on the substrate P, and reaction products are deposited on the substrate P to form a thin film on the substrate P.

反応室2内での気相成長が終了したら、気相成
長ガスの導入を停止し、パージガスにて反応室2
内の残留気相成長ガスを排ガス排出管21を介し
て排気し、遮蔽機構7を開いて、搬送装置24を
前進させて、上ホーク65及び下ホーク66をそ
れぞれトレイ9と可動部80の下部に挿入し、ガ
イド筒26を僅か上動させて、上ホーク65及び
下ホーク66にてトレイ9と可動部80とを持上
げ、保持台4とフローチヤンネル8の固定部82
から取外し、搬送装置24を後退させて、上ホー
ク65及び下ホーク66を前室5内に退避させ、
開閉扉50から可動部80とトレイ9および処理
済みの基板Pを外部に取出す。
When the vapor phase growth in the reaction chamber 2 is completed, the introduction of the vapor phase growth gas is stopped and the reaction chamber 2 is closed with purge gas.
The residual vapor growth gas in the interior is exhausted through the exhaust gas exhaust pipe 21, the shielding mechanism 7 is opened, the conveying device 24 is advanced, and the upper fork 65 and the lower fork 66 are removed from the tray 9 and the lower part of the movable part 80, respectively. , move the guide tube 26 slightly upward, lift the tray 9 and the movable part 80 with the upper fork 65 and the lower fork 66, and remove the holding table 4 and the fixed part 82 of the flow channel 8.
, the transport device 24 is moved backward, and the upper fork 65 and the lower fork 66 are retracted into the front chamber 5.
The movable part 80, the tray 9, and the processed substrate P are taken out from the opening/closing door 50.

次いで、新たに未処理の基板Pとトレイ9とを
下ホーク66上に載置すると共に、新たに清浄な
可動部80を上ホーク65に載置して再び前記同
様に気相成長を実施する。
Next, a new unprocessed substrate P and tray 9 are placed on the lower fork 66, a new clean movable part 80 is placed on the upper fork 65, and vapor phase growth is performed again in the same manner as described above. .

上記実施例に示すように、搬送装置6の先端部
分に、基板Pの上部を被う可動部80を載置する
ことにより、基板Pの移動の際に、反応室2の内
面等に付着した反応生成物が剥離して落下して
も、可動部80により遮られるため、基板P上に
落下することを防止することができる。
As shown in the above embodiment, by placing the movable part 80 that covers the upper part of the substrate P at the tip of the transfer device 6, when the substrate P is moved, the movable part 80 that covers the top of the substrate P can be removed. Even if the reaction product peels off and falls, it is blocked by the movable part 80, so that it can be prevented from falling onto the substrate P.

また、気相成長実施時に、可動部80の下面に
も反応生成物が付着するが、可動部80を各気相
成長毎に着脱自在としたので、各気相成長毎に新
しい清浄なものと交換することができ、1回の気
相成長での付着のみとすることできるので、可動
部80に付着した反応生成物の剥離・落下を防止
することができる。
In addition, during vapor phase growth, reaction products also adhere to the underside of the movable part 80. However, since the movable part 80 is detachable for each vapor phase growth, it can be replaced with a new, clean part for each vapor phase growth. Since adhesion is limited to one vapor phase growth, the reaction products adhering to the movable part 80 can be prevented from peeling off or falling off.

しかも、基板Pの交換と可動部80の交換とを
同時に行えるので、清浄作業が容易になると共
に、反応室内やフローチヤンネル内の清浄作業に
よる気相成長の中断がなくなり、従来と同等以上
の生産性を維持して、従来より歩留りを向上させ
ることができる。
Moreover, since the substrate P and the movable part 80 can be replaced at the same time, cleaning work becomes easier, and there is no need to interrupt the vapor phase growth due to cleaning work in the reaction chamber or flow channel, resulting in an increase in production that is equivalent to or better than before. It is possible to maintain the properties and improve the yield compared to the conventional method.

尚、基板Pを載置する保持台およびトレイとし
ては、例えば第5図に示す構造のものも使用可能
である。即ち、フローチヤンネル8の設置部81
に反応室内の所定の位置に円柱状の保持台4を傾
けて配置すると共に、トレイ9の下面に保持台4
の径より大径の凹部9aを形成し、この凹部9a
を保持台4の上部に被冠してトレイ9をセツトす
る。また、トレイ9の上面に、基板Pの径と略同
径の浅い凹部9bを形成し、該凹部9bに基板P
を載置することにより基板Pのすべりを防止して
いる。さらにトレイ9を搬送する下ホーク66に
は、トレイ9の傾きと略同様の傾きを設けると共
に、その先端に滑止用の突起66a突設してい
る。
Note that as the holding table and tray on which the substrate P is placed, for example, those having the structure shown in FIG. 5 can also be used. That is, the installation part 81 of the flow channel 8
The cylindrical holding table 4 is tilted and arranged at a predetermined position in the reaction chamber, and the holding table 4 is placed on the bottom surface of the tray 9.
A recess 9a having a diameter larger than the diameter of the recess 9a is formed.
is placed on top of the holding table 4 and the tray 9 is set. Further, a shallow recess 9b having approximately the same diameter as the substrate P is formed on the upper surface of the tray 9, and the substrate P is placed in the recess 9b.
By placing , the substrate P is prevented from slipping. Furthermore, the lower fork 66 for conveying the tray 9 is provided with an inclination substantially similar to that of the tray 9, and has an anti-slip protrusion 66a protruding from its tip.

〔考案の効果〕[Effect of idea]

以上説明したように、本考案の横型気相成長装
置は、一側に気相成長ガス導入管が接続された反
応室と、該反応室にて気相成長により薄膜が形成
される基板を載置する保持台と、反応室の他側に
連設され、基板の入れ替えを行う前室と、該前室
と反応室の保持台との間を水平移動する搬送装置
とを備え、前室と反応室との間に、搬送装置が前
室に退避している際に前室と反応室とを遮断する
遮蔽機構を備え、気相成長ガス導入管に連続する
筒状のフローチヤンネルを反応室内に配設し、該
フローチヤンネルは、前室側端部の少なくとも上
部を着脱可能な可動部と成すと共に該可動部に対
応する前室側底部を保持台の設置部と成し、前記
可動部は、基板とともに搬送装置にて前室に搬送
されて交換可能なものであるから、各気相成長毎
に新しい清浄な可動部と交換することができ、可
動部内面への反応生成物の付着を1回の気相成長
での付着のみとすることができ、可動部に付着し
た反応生成物の剥離・落下を防止することができ
る。
As explained above, the horizontal vapor phase growth apparatus of the present invention includes a reaction chamber to which a vapor phase growth gas introduction pipe is connected on one side, and a substrate on which a thin film is formed by vapor phase growth in the reaction chamber. a holding table for placing the substrate, a front chamber connected to the other side of the reaction chamber for exchanging substrates, and a transfer device for horizontally moving between the front chamber and the holding table of the reaction chamber. A shielding mechanism is provided between the reaction chamber and the reaction chamber to shut off the front chamber and the reaction chamber when the transport device is evacuated to the front chamber. The flow channel has at least the upper part of the end on the front chamber side as a removable movable part, and the bottom part on the front chamber side corresponding to the movable part as a mounting part for the holding stand, and the flow channel Since the movable part is transported with the substrate to the front chamber by a transport device and can be replaced, it can be replaced with a new clean movable part for each vapor phase growth, and there is no possibility of reaction products adhering to the inner surface of the movable part. can be attached only in one vapor phase growth, and it is possible to prevent the reaction product attached to the movable part from peeling off or falling.

しかも、基板の交換と可動部の交換とを同時に
行えるので、清浄作業が容易になると共に、反応
室内やフローチヤンネル内の清浄作業による気相
成長の中断がなくなり、従来と同等以上の生産性
を維持して、従来より歩留りを向上させることが
できる。
Furthermore, since the substrate and the movable parts can be replaced at the same time, cleaning work becomes easier, and there is no need to interrupt vapor phase growth due to cleaning work in the reaction chamber or flow channel, increasing productivity to the same level or higher than before. The yield can be improved compared to the conventional method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第4図は本考案の一実施例を示すも
ので、第1図は横型気相成長装置の断面側面図、
第2図は搬送装置先端部分を示す要部の平面図、
第3図は保持台部分を示す断面正面図、第4図は
同じく断面側面図、第5図は保持台部分の他の実
施例を示す正面図である。 1……横型気相成長装置、2……反応室、3…
…気相成長ガス導入管、4……保持台、5……前
室、6……搬送装置、60……ベロー部、61…
…ガイド筒、64……ガイド棒、65……上ホー
ク、66……下ホーク、7……遮蔽機構、8……
フローチヤンネル、80……可動部、81……設
置部、82……固定部、9……トレイ、P……基
板。
1 to 4 show an embodiment of the present invention, and FIG. 1 is a cross-sectional side view of a horizontal vapor phase growth apparatus;
FIG. 2 is a plan view of the main parts showing the tip of the transport device;
FIG. 3 is a sectional front view showing the holding part, FIG. 4 is a sectional side view, and FIG. 5 is a front view showing another embodiment of the holding part. 1...Horizontal vapor phase growth apparatus, 2...Reaction chamber, 3...
...Vapour-phase growth gas introduction pipe, 4...Holding table, 5...Pre-chamber, 6...Transport device, 60...Bellows part, 61...
...Guide tube, 64...Guide rod, 65...Upper fork, 66...Lower fork, 7...Shielding mechanism, 8...
Flow channel, 80...movable part, 81...installation part, 82...fixed part, 9...tray, P...substrate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 一側に気相成長ガス導入管が接続された反応室
と、該反応室にて気相成長により薄膜が形成され
る基板を載置する保持台と、前記反応室の他側に
連設され、前記基板の入れ替えを行う前室と、該
前室と前記反応室の保持台との間を水平移動する
搬送装置とを備えた横型気相成長装置において、
前記前室と前記反応室との間に、前記搬送装置が
前記前室に退避している際に前記前室と前記反応
室とを遮断する遮蔽機構を備え、前記気相成長ガ
ス導入管に連続する筒状のフローチヤンネルを前
記反応室内に配設し、該フローチヤンネルは、前
記前室側端部の少なくとも上部を着脱可能な可動
部と成すと共に該可動部に対応する前室側底部を
前記保持台の設置部と成し、前記可動部は、気相
成長毎に前記基板とともに前記搬送装置にて前記
前室に搬送されて交換可能なものであることを特
徴とする横型気相成長装置。
A reaction chamber to which a vapor growth gas introduction pipe is connected on one side, a holding table on which a substrate on which a thin film is to be formed by vapor growth in the reaction chamber is placed, and a holding table connected to the other side of the reaction chamber. , a horizontal vapor phase growth apparatus comprising a front chamber in which the substrate is exchanged, and a transport device that horizontally moves between the front chamber and a holding table in the reaction chamber,
A shielding mechanism is provided between the front chamber and the reaction chamber to block the front chamber and the reaction chamber when the transport device is retreating to the front chamber, and a shielding mechanism is provided in the vapor growth gas introduction pipe. A continuous cylindrical flow channel is disposed within the reaction chamber, and the flow channel has at least an upper portion of the end portion on the front chamber side as a removable movable portion, and a bottom portion on the front chamber side corresponding to the movable portion. Horizontal vapor phase growth, characterized in that the movable section is configured as an installation section of the holding table, and the movable section is conveyed to the front chamber by the conveyance device together with the substrate every time the vapor phase growth is performed, and is replaceable. Device.
JP1988136028U 1988-10-18 1988-10-18 Expired - Lifetime JPH0543471Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988136028U JPH0543471Y2 (en) 1988-10-18 1988-10-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988136028U JPH0543471Y2 (en) 1988-10-18 1988-10-18

Publications (2)

Publication Number Publication Date
JPH0256433U JPH0256433U (en) 1990-04-24
JPH0543471Y2 true JPH0543471Y2 (en) 1993-11-02

Family

ID=31396161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988136028U Expired - Lifetime JPH0543471Y2 (en) 1988-10-18 1988-10-18

Country Status (1)

Country Link
JP (1) JPH0543471Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6066028U (en) * 1983-10-11 1985-05-10 関西日本電気株式会社 hearth tube
JPS60119743U (en) * 1984-01-23 1985-08-13 サンケン電気株式会社 chemical vapor deposition equipment

Also Published As

Publication number Publication date
JPH0256433U (en) 1990-04-24

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