JPH0540014A - System for detecting position of object to be measured - Google Patents

System for detecting position of object to be measured

Info

Publication number
JPH0540014A
JPH0540014A JP3223391A JP22339191A JPH0540014A JP H0540014 A JPH0540014 A JP H0540014A JP 3223391 A JP3223391 A JP 3223391A JP 22339191 A JP22339191 A JP 22339191A JP H0540014 A JPH0540014 A JP H0540014A
Authority
JP
Japan
Prior art keywords
line
luminance
pixel
measured
coordinates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3223391A
Other languages
Japanese (ja)
Other versions
JPH0792365B2 (en
Inventor
Atsushi Kirita
篤 切田
Tomeo Nanpuku
留男 南幅
Atsushi Sasaki
淳 佐々木
Chisato Oshima
千里 大島
Atsuhiro Nakano
敦弘 中野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RAPIASU DENKI KK
Iwate Prefectural Government
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
RAPIASU DENKI KK
Agency of Industrial Science and Technology
Iwate Prefectural Government
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RAPIASU DENKI KK, Agency of Industrial Science and Technology, Iwate Prefectural Government filed Critical RAPIASU DENKI KK
Priority to JP3223391A priority Critical patent/JPH0792365B2/en
Publication of JPH0540014A publication Critical patent/JPH0540014A/en
Publication of JPH0792365B2 publication Critical patent/JPH0792365B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To improve the detecting accuracy of positions of objects to be measured by reading the luminance of pixels in the direction perpendicular to a standard line and calculating the luminance difference between adjacent pixels. CONSTITUTION:By using the edge of the wiring pattern 5 of electronic parts 1 as a reference line K, the position of the pattern 5 is detected against a standard line H. A camera device 10 which takes the image of the line K is provided and a luminance reading section 12 reads the luminance of pixels in the direction perpendicular to the standard line H on a picture element coordinate system 11 which is set in the picture of the line K taken by the device 10 and on which the inclination of the line H is set to zero by paying attention to the luminance variation of pixels in the picture of the wiring pattern 5 taken by the device 10. A pixel coordinate reading-out section 15 reads out the pixel coordinates at which the luminance difference calculated by a luminance difference calculating section 14 which calculates the luminance difference between adjacent pixels becomes the maximum. Then a coordinate computing section 16 computes the coordinates of the reference line K by correcting the pixel coordinates read out by the section 15 by using the luminance difference.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電子部品等の被測定物
の位置を検出するのに有用な被測定物の位置検出方式に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a position detection method of an object to be measured useful for detecting the position of the object to be measured such as an electronic component.

【0002】[0002]

【従来の技術】従来、例えば、図3に示すような配線パ
ターン5を有した電子部品1を、他の電子部品に組み付
ける際などは、電子部品1の配線パターン5を基準線K
として、該基準線Kの標準線Hに対する位置(傾き等)
を顕微鏡で目視して検知し、その後、この標準線Hに対
して平行度を出して位置合せをし、この位置合せをした
電子部品1を他の電子部品に組み付けるようにするシス
テムがある。
2. Description of the Related Art Conventionally, for example, when an electronic component 1 having a wiring pattern 5 as shown in FIG. 3 is assembled to another electronic component, the wiring pattern 5 of the electronic component 1 is used as a reference line K.
Is the position of the reference line K with respect to the standard line H (tilt, etc.)
Is visually detected with a microscope, and then the parallelism with respect to the standard line H is obtained to perform alignment, and the aligned electronic component 1 is assembled to another electronic component.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記従
来の電子部品1の位置出しは、顕微鏡による目視によ
り、行なっているので、検出精度が悪くなっており、そ
のため、位置合せが不十分になり易くなるという問題が
あった。
However, since the above-mentioned conventional electronic component 1 is positioned by visual inspection with a microscope, the detection accuracy is poor, and therefore the alignment is likely to be insufficient. There was a problem of becoming.

【0004】本発明は上記の問題点に鑑みてなされたも
ので、その課題は、被測定物の位置検出の精度を向上さ
せるようにした位置検出方式の提供にある。
The present invention has been made in view of the above problems, and an object of the present invention is to provide a position detection system which improves the accuracy of position detection of an object to be measured.

【0005】[0005]

【課題を解決するための手段】このような課題を解決す
るための本発明の技術的手段は、
The technical means of the present invention for solving the above problems are as follows.

【0006】基準線を有する被測定物をカメラ装置で撮
像し、この撮像結果から被測定物の標準線に対する位置
を検出する被測定物の位置検出方式において、基準線の
撮像画面であって標準線の傾きをゼロとした画素座標系
において標準線に直交する方向の画素の輝度を読み取る
輝度読取部と、隣接する画素の輝度の輝度差を算出する
輝度差算出部と、輝度差算出部が算出した輝度差が最大
となる画素座標を読み出す画素座標読出部と、画素座標
読出部が読み出した画素座標を上記輝度差を用いて補正
し上記基準線の座標の演算を行なう座標演算部とを備え
たものである。
In the position detection method of the object to be measured in which the object to be measured having the reference line is imaged by the camera device and the position of the object to be measured with respect to the standard line is detected from the imaged result, the standard screen is the imaging screen of the reference line. A brightness reading unit that reads the brightness of a pixel in a direction orthogonal to a standard line in a pixel coordinate system where the slope of a line is zero, a brightness difference calculation unit that calculates a brightness difference between the brightness of adjacent pixels, and a brightness difference calculation unit. A pixel coordinate reading unit that reads out the pixel coordinate that maximizes the calculated brightness difference, and a coordinate calculation unit that corrects the pixel coordinates read by the pixel coordinate reading unit using the brightness difference and calculates the coordinates of the reference line. Be prepared.

【0007】[0007]

【作用】上記構成からなる被測定物の位置検出方式によ
れば、カメラ装置で被測定物が撮像されると、標準線に
直交する方向の画素の輝度が読み取られ、隣接する画素
の輝度の輝度差が算出される。次に、輝度差が最大とな
る画素座標が読み出され、座標演算部において、輝度差
が最大となる画素座標を上記輝度差を用いて補正した上
記基準線の座標の演算が行なわれる。この場合、補正さ
れるので精度の高い座標が得られる。
According to the position detecting method of the object to be measured having the above structure, when the object to be measured is imaged by the camera device, the brightness of the pixel in the direction orthogonal to the standard line is read and the brightness of the pixel of the adjacent pixel is read. The brightness difference is calculated. Next, the pixel coordinates having the maximum brightness difference are read out, and the coordinates of the reference line, in which the pixel coordinates having the maximum brightness difference are corrected using the brightness difference, are calculated in the coordinate calculation unit. In this case, since the correction is performed, highly accurate coordinates can be obtained.

【0008】[0008]

【実施例】以下、添付図面に基づいて本発明の実施例に
係る被測定物の位置検出方式について説明する。実施例
に係る被測定物の位置検出方式は、上述した図3に示す
電子部品1の位置検出に適用され、電子部品1の配線パ
ターン5のエッジを基準線Kとし、標準線Hに対する位
置を検出するものである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A position detecting method for an object to be measured according to an embodiment of the present invention will be described below with reference to the accompanying drawings. The position detection method of the object to be measured according to the embodiment is applied to the position detection of the electronic component 1 shown in FIG. 3 described above, and the edge of the wiring pattern 5 of the electronic component 1 is set as the reference line K and the position with respect to the standard line H is set. It is something to detect.

【0009】この位置検出方式は、図1に示すように、
基準線Kを撮像するカメラ装置10を備え、このカメラ
装置10が撮像した配線パターン5の画像における輝度
の変化に着目し、基準線Kの撮像画面であって標準線H
の傾きをゼロとした画素座標系11において標準線Hに
直交する方向の画素の輝度を読み取る輝度読取部13
と、隣接する画素の輝度の輝度差を算出する輝度差算出
部14と、輝度差算出部14が算出した輝度差が最大と
なる画素座標を読み出す画素座標読出部15と、画素座
標読出部15が読み出した画素座標を上記輝度差を用い
て補正し基準線Kの座標の演算を行なう座標演算部16
とを備えている。
This position detecting method is, as shown in FIG.
A camera device 10 that captures an image of the reference line K is provided, and attention is paid to a change in luminance in an image of the wiring pattern 5 captured by the camera device 10.
The luminance reading unit 13 that reads the luminance of the pixel in the direction orthogonal to the standard line H in the pixel coordinate system 11 with the inclination of zero
A luminance difference calculation unit 14 that calculates the luminance difference between the luminances of adjacent pixels, a pixel coordinate reading unit 15 that reads out the pixel coordinates that maximizes the luminance difference calculated by the luminance difference calculation unit 14, and a pixel coordinate reading unit 15. A coordinate calculation unit 16 that corrects the pixel coordinates read by the CPU using the brightness difference to calculate the coordinates of the reference line K.
It has and.

【0010】座標演算部16は、以下の数式によって座
標を算出する。
The coordinate calculator 16 calculates the coordinates by the following mathematical formula.

【0011】[0011]

【数1】 [Equation 1]

【0012】数式1において、Bn は輝度差が最大とな
る画素座標(実施例では座標の小さいほうを選択)、D
m は輝度差の最大値、Dm+1 は輝度差の最大値よりも1
つ座標の大きい側の輝度差、Dm+2 は輝度差の最大値よ
りも2つ座標の大きい側の輝度差、Dm-1 は輝度差の最
大値よりも1つ座標の小さい側の輝度差、Dm-2 は輝度
差の最大値よりも2つ座標の小さい側の輝度差である。
In Equation 1, Bn is a pixel coordinate that maximizes the brightness difference (in the embodiment, the one having the smaller coordinate is selected), Dn
m is the maximum brightness difference, Dm + 1 is 1 more than the maximum brightness difference
Luminance difference on the side with one coordinate, Dm + 2 is the luminance difference on the side with two coordinates larger than the maximum value of the luminance difference, and Dm-1 is the luminance difference on the side with one coordinate smaller than the maximum value of the luminance difference. , Dm-2 are the brightness differences on the side of which two coordinates are smaller than the maximum value of the brightness difference.

【0013】従って、この位置検出方式によれば、先
ず、図1に示す基準線Kの上記撮像画面であって標準線
Hの傾きをゼロとした画素座標系11において、輝度読
取部13によって、X座標のいくつかの点の標準線Hに
直交する方向の画素の輝度が読み取られる。その読み取
り結果(2ケ所)の例を図2に示す。次に、輝度差算出
部14によって、隣接する画素の輝度の輝度差が算出さ
れる。その結果も図2に示す。その後、画素座標読出部
15によって、輝度差算出部14が算出した輝度差が最
大となる画素座標が読み出される。
Therefore, according to this position detection method, first, in the pixel coordinate system 11 in which the inclination of the standard line H is zero in the image pickup screen of the reference line K shown in FIG. The luminance of the pixel in the direction orthogonal to the standard line H at some points on the X coordinate is read. FIG. 2 shows an example of the reading result (2 places). Next, the brightness difference calculation unit 14 calculates the brightness difference of the brightness of the adjacent pixels. The results are also shown in FIG. After that, the pixel coordinate reading unit 15 reads out the pixel coordinate at which the brightness difference calculated by the brightness difference calculating unit 14 is the maximum.

【0014】そして、座標演算部16によって、画素座
標読出部15が読み出した画素座標を上記輝度差を用い
て補正し基準線Kの座標の演算が行なわれる。今、図2
中X1 の点における場合について説明すると、輝度差が
最大となる画素座標Bn は115となり、その算出結果
は、以下のとおりである。
Then, the coordinate calculation unit 16 corrects the pixel coordinates read by the pixel coordinate reading unit 15 using the above-mentioned brightness difference, and calculates the coordinates of the reference line K. Figure 2 now
Explaining the case of the middle X1 point, the pixel coordinate Bn at which the brightness difference is maximum is 115, and the calculation result is as follows.

【0015】[0015]

【数2】 [Equation 2]

【0016】このようにしてX座標のいくつかの点にお
けるY座標が求められる。この場合、この座標は、上下
の輝度の重みを考慮して補正されているので、精度が高
いものになる。その後、座標演算部16が演算した座標
に基づいて基準線Kの角度θを演算して傾きを求める等
する。
In this way, the Y coordinate at some points of the X coordinate is obtained. In this case, since the coordinates are corrected in consideration of the weights of the upper and lower luminances, the accuracy is high. After that, the angle θ of the reference line K is calculated based on the coordinates calculated by the coordinate calculation unit 16, and the inclination is obtained.

【0017】そして、算出した角度分だけ、電子部品1
を回転させれば、基準線Kを標準線Hと平行にする位置
合せを行なうことができる。この場合上記算出された角
度の精度が高いので、誤差を少なくすることができる。
Then, the electronic component 1 is moved by the calculated angle.
By rotating, the reference line K can be aligned with the standard line H in parallel. In this case, since the accuracy of the calculated angle is high, the error can be reduced.

【0018】尚、上記実施例において、基準線Kを配線
パターン5のエッジに設定したが、必ずしもこれに限定
されるものではなく、他の部分に設定しても良い。
Although the reference line K is set at the edge of the wiring pattern 5 in the above embodiment, the present invention is not limited to this and may be set at another portion.

【0019】[0019]

【発明の効果】以上説明したように、本発明の被測定物
の位置検出方式によれば、カメラ装置で被測定物を撮像
し、座標演算部において、輝度差が最大となる画素座標
を輝度差を用いて補正して、基準線の座標の演算を行な
うので、精度の高い座標が得られ、特に、単に画素座標
の読み取りではプラスマイナス1画素の量子化誤差の発
生が避けられないが、本発明によれば、量子化誤差を1
画素以下にすることができ、それだけ、精度の高い座標
を得ることができる。その結果、被測定物の位置検出の
精度を大幅に向上させることができる。
As described above, according to the position detecting method of the object to be measured of the present invention, the object to be measured is imaged by the camera device, and the coordinate calculation unit calculates the pixel coordinate having the maximum brightness difference. Since the coordinates of the reference line are calculated by making corrections using the difference, highly accurate coordinates can be obtained. In particular, simply reading pixel coordinates inevitably causes a quantization error of plus or minus one pixel. According to the present invention, the quantization error is 1
The number of pixels can be set to be less than or equal to the number of pixels, and accordingly, highly accurate coordinates can be obtained. As a result, the accuracy of detecting the position of the measured object can be significantly improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の被測定物の位置検出方式の構成を示す
ブロック図である。
FIG. 1 is a block diagram showing a configuration of a position detection system for an object to be measured according to the present invention.

【図2】実施例に係る位置検出方式の読取り及び算出デ
ータの一例を示す図である。
FIG. 2 is a diagram showing an example of reading and calculation data of the position detection method according to the embodiment.

【図3】電子部品の一例を模式的に示す図である。FIG. 3 is a diagram schematically showing an example of an electronic component.

【符号の説明】[Explanation of symbols]

1 電子部品 5 配線パターン K 基準線 H 標準線 10 カメラ装置 11 画素座標系 13 輝度読取部 14 輝度差算出部 15 画素座標読出部 16 座標演算部 DESCRIPTION OF SYMBOLS 1 Electronic component 5 Wiring pattern K Reference line H Standard line 10 Camera device 11 Pixel coordinate system 13 Luminance reading unit 14 Luminance difference calculation unit 15 Pixel coordinate reading unit 16 Coordinate calculation unit

───────────────────────────────────────────────────── フロントページの続き (72)発明者 切田 篤 茨城県つくば市梅園1丁目1番4 工業技 術院 計量研究所内 (72)発明者 南幅 留男 岩手県紫波郡都南村津志田26地割17の2 岩手県工業試験場内 (72)発明者 佐々木 淳 岩手県紫波郡都南村津志田26地割17の2 岩手県工業試験場内 (72)発明者 大島 千里 岩手県岩手郡滝沢村字滝沢野沢62−536 (72)発明者 中野 敦弘 岩手県盛岡市加賀野三丁目12番29号 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Atsushi Kirita 1-1-4 Umezono, Tsukuba-shi, Ibaraki Institute of Industrial Science and Technology (72) Inventor Toruo Minami width 26 Shizuta, Minamimura, Shiwa-gun, Iwate Prefecture 17-2 Iwate Prefectural Industrial Test Site (72) Inventor Jun Sasaki 26 Tsushima, Tsunami-mura, Minamimura, Shiwa-gun, Iwate Pref. 17-2 Inside Iwate Prefectural Industrial Test Site (72) Inventor Chisato Oshima 62 Takizawa Nozawa, Takizawa-mura, Iwate-gun, Iwate Prefecture −536 (72) Inventor Atsuhiro Nakano 3-12-12 Kagano, Morioka-shi, Iwate

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 基準線を有する被測定物をカメラ装置で
撮像し、この撮像結果から被測定物の標準線に対する位
置を検出する被測定物の位置検出方式において、基準線
の撮像画面であって標準線の傾きをゼロとした画素座標
系において標準線に直交する方向の画素の輝度を読み取
る輝度読取部と、隣接する画素の輝度の輝度差を算出す
る輝度差算出部と、輝度差算出部が算出した輝度差が最
大となる画素座標を読み出す画素座標読出部と、画素座
標読出部が読み出した画素座標を上記輝度差を用いて補
正し上記基準線の座標の演算を行なう座標演算部とを備
えたことを特徴とする被測定物の位置検出方式。
1. In a position detection method of an object to be measured in which an object to be measured having a reference line is imaged by a camera device and the position of the object to be measured with respect to the standard line is detected from the imaging result, an image of an image screen of the reference line is displayed. The brightness reading unit that reads the brightness of the pixel in the direction orthogonal to the standard line in the pixel coordinate system where the inclination of the standard line is zero, the brightness difference calculation unit that calculates the brightness difference between the brightness of the adjacent pixels, and the brightness difference calculation A pixel coordinate reading unit that reads out the pixel coordinate that maximizes the brightness difference calculated by the unit, and a coordinate calculation unit that corrects the pixel coordinates read by the pixel coordinate reading unit using the brightness difference to calculate the coordinates of the reference line. A method for detecting the position of an object to be measured, comprising:
JP3223391A 1991-08-07 1991-08-07 Position detection method for DUT Expired - Lifetime JPH0792365B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3223391A JPH0792365B2 (en) 1991-08-07 1991-08-07 Position detection method for DUT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3223391A JPH0792365B2 (en) 1991-08-07 1991-08-07 Position detection method for DUT

Publications (2)

Publication Number Publication Date
JPH0540014A true JPH0540014A (en) 1993-02-19
JPH0792365B2 JPH0792365B2 (en) 1995-10-09

Family

ID=16797414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3223391A Expired - Lifetime JPH0792365B2 (en) 1991-08-07 1991-08-07 Position detection method for DUT

Country Status (1)

Country Link
JP (1) JPH0792365B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62278245A (en) * 1986-02-21 1987-12-03 Sky Alum Co Ltd Aluminum-alloy rolled plate for forming and its production
JP2011016623A (en) * 2009-07-09 2011-01-27 Mitsubishi Electric Building Techno Service Co Ltd Main rope tension inspection device of elevator

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62278245A (en) * 1986-02-21 1987-12-03 Sky Alum Co Ltd Aluminum-alloy rolled plate for forming and its production
JP2011016623A (en) * 2009-07-09 2011-01-27 Mitsubishi Electric Building Techno Service Co Ltd Main rope tension inspection device of elevator

Also Published As

Publication number Publication date
JPH0792365B2 (en) 1995-10-09

Similar Documents

Publication Publication Date Title
US6711284B1 (en) Image processor for a digital image of an object having a crack
JP3764364B2 (en) Image feature point detection method, image processing method, and program
CN111263142B (en) Method, device, equipment and medium for testing optical anti-shake of camera module
US20130076896A1 (en) Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium
US7024041B2 (en) Pattern inspection apparatus and method
TWI673686B (en) Video type water ruler scale detecting and identifying system and method
CN111681186A (en) Image processing method and device, electronic equipment and readable storage medium
JP7017207B2 (en) Image inspection device and its image inspection method
JPH08287252A (en) Screw hole position recognizing method
JP2011155412A (en) Projection system and distortion correction method in the same
JPH1089960A (en) Three-dimensional image measuring method
JPH0540014A (en) System for detecting position of object to be measured
US6246478B1 (en) Reticle for an object measurement system
JP2011075289A (en) Visual inspection apparatus, visual inspection method and visual inspection program
JP4611708B2 (en) High-precision mark position / posture detection device
JP2001258054A (en) Image quality inspection device and detector for center of gravity of luminance used therefor
JP2006125896A (en) Flat panel display inspection device
JP2000121337A (en) Method and device for image correction
JP2005274356A (en) Position detector, position detecting tool, and position detecting method
JP2879357B2 (en) Shape judgment method
JPH1040367A (en) Method and device for correcting distortion of thermal image
JP2005030996A (en) Inspection method of substrate having repeated pattern
JP2016134636A (en) Angle-of-view deviation correction device
JP2002250625A (en) Beam evaluation method of laser marker and its device
JP2001012920A (en) Shape detector

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313115

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071009

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081009

Year of fee payment: 13

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081009

Year of fee payment: 13

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081009

Year of fee payment: 13

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091009

Year of fee payment: 14

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091009

Year of fee payment: 14

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101009

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101009

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111009

Year of fee payment: 16

EXPY Cancellation because of completion of term