JPH0537024A - Optical semiconductor device - Google Patents

Optical semiconductor device

Info

Publication number
JPH0537024A
JPH0537024A JP19226091A JP19226091A JPH0537024A JP H0537024 A JPH0537024 A JP H0537024A JP 19226091 A JP19226091 A JP 19226091A JP 19226091 A JP19226091 A JP 19226091A JP H0537024 A JPH0537024 A JP H0537024A
Authority
JP
Japan
Prior art keywords
groove
optical
substrate
semiconductor
trapezoidal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19226091A
Other languages
Japanese (ja)
Inventor
Mayumi Sakaguchi
眞弓 阪口
Fumihiko Kuroda
文彦 黒田
Hideto Furuyama
英人 古山
Hiroshi Hamazaki
浩史 濱崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP19226091A priority Critical patent/JPH0537024A/en
Publication of JPH0537024A publication Critical patent/JPH0537024A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/10251Elemental semiconductors, i.e. Group IV
    • H01L2924/10253Silicon [Si]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]

Abstract

PURPOSE:To improve the accuracy of optical device mounting by bonding two semiconductor wafers with an insulating film in-between and providing one wafer with a trapezoid groove with a depth reaching the insulating film and a V-groove with a width permitting the alignment of optical axes of optical devices. CONSTITUTION:A bonded substrate obtained by bonding two silicon wafers 18a and 18b with an oxide film 21 in-between, is used for a substrate 18 for optical coupling. In this substrate 18 for optical coupling, a trapezoidal groove 20 to mount a semiconductor laser 1 as a semiconductor luminous element and a V-groove 19 perpendicular to the trapezoid groove 20 to mount an optical fiber 2 and spherical lenses 4 are formed. The depths of the trapezoidal groove 20 and V-groove 19 are determined according to the size and shape of individual optical devices so that the center of the optical beam projecting part 8 of the semiconductor laser 1 is in accordance with those of the optical fiber core and the spherical lenses 4. This enables mounting optical devices with accuracy.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体基板上に複数の
光デバイスを装着して、これらを光結合させた光半導体
装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical semiconductor device in which a plurality of optical devices are mounted on a semiconductor substrate and these are optically coupled.

【0002】[0002]

【従来の技術】光ファイバ通信において、半導体発光素
子の光ビームを光ファイバに効率良く入射させること
は、通信の長距離化,高SN比を達成する上で重要であ
る。しかし、光デバイスを光学的に結合させて搭載する
簡便な方法は未だ確立されていない。また、光デバイス
の固定の際に、接着剤による接着或いは溶接時に軸心が
ずれたり、固定にいくつかの部材が介在するため光デバ
イスの位置関係の経時的な安定性などにも問題がある。
2. Description of the Related Art In optical fiber communication, it is important to make a light beam of a semiconductor light emitting element incident on an optical fiber efficiently in order to achieve a long communication distance and a high SN ratio. However, a simple method of optically coupling and mounting an optical device has not been established yet. In addition, when fixing the optical device, there is a problem in time-dependent stability of the positional relationship of the optical device due to the misalignment of the shaft center during bonding with an adhesive or during welding, and the interposition of several members for fixing. ..

【0003】そこで、特開昭63−161411号公報
や特開平2−22884号公報においては、図4(a)
又は(b)に示すような光結合用基板に光デバイスを搭
載することで、長時間を要する光デバイスの微動調整を
省略する方法を取っている。なお、図中1は半導体レー
ザ、2は光ファイバ、3は光結合用基板、4は球レン
ズ、5は金属細線、6は位置合せパターン、7は電極
部、8は光ビーム出射部、9は溝状凹部、10は周辺回
路、11はヒートシンク、12はパッケージを示してい
る。
Therefore, in Japanese Patent Application Laid-Open No. 63-161411 and Japanese Patent Application Laid-Open No. 2-22884, FIG.
Alternatively, by mounting the optical device on the optical coupling substrate as shown in (b), a method of omitting the fine movement adjustment of the optical device which requires a long time is adopted. In the figure, 1 is a semiconductor laser, 2 is an optical fiber, 3 is a substrate for optical coupling, 4 is a spherical lens, 5 is a fine metal wire, 6 is an alignment pattern, 7 is an electrode part, 8 is a light beam emitting part, and 9 is. Is a groove-shaped recess, 10 is a peripheral circuit, 11 is a heat sink, and 12 is a package.

【0004】光結合用基板3には光デバイスが光結合し
て設置される位置に、各光デバイスの形とサイズから定
められる所定の幅を有する一条及び十字状のパターンが
フォトリソグラフィ工程などにより形成され、しかるの
ち光デバイスの光軸の高さが一致するように定めた所定
の深さの溝状凹部9が該パターンに沿ってダイシングソ
ー装置により形成される。そして、光結合用基板3の溝
状凹部9の交差部に光デバイスを装着する。
At the position where the optical devices are optically coupled and installed on the optical coupling substrate 3, a linear and cross-shaped pattern having a predetermined width determined by the shape and size of each optical device is formed by a photolithography process or the like. A groove-shaped recess 9 having a predetermined depth, which is formed so that the optical axes of the optical devices coincide with each other, is formed by a dicing saw device along the pattern. Then, the optical device is mounted at the intersection of the groove-shaped recess 9 of the optical coupling substrate 3.

【0005】溝状凹部9の形成に用いる該ダイシングソ
ー装置は、集積回路などが形成された半導体基板を個々
のチップに切断する装置であり、薄い金属板にダイヤモ
ンド粉などを埋め込んだ刃を高速回転させて切断する。
ダイシングソー装置による溝状凹部9の形成では、所定
の溝幅を得るのに適切な刃幅の金属板に交換したり、所
定の深さとするために切断刃の高さコントロールする必
要がある。そこで、溝状凹部9の深さや位置の精度を良
くするためには、ダイシングソー装置の切断刃の位置調
整に高い精度が必要であり、このため装置が大型のもの
となり作業スペースの占有や保守、運用の点でコスト高
となる。また、溝が形成できる位置に制限がある。
The dicing saw device used for forming the groove-shaped recess 9 is a device for cutting a semiconductor substrate on which an integrated circuit or the like is formed into individual chips, and a blade made by embedding diamond powder or the like in a thin metal plate at high speed. Rotate and cut.
In forming the groove-shaped recess 9 by the dicing saw device, it is necessary to replace with a metal plate having a blade width suitable for obtaining a predetermined groove width, or to control the height of the cutting blade so as to have a predetermined depth. Therefore, in order to improve the accuracy of the depth and position of the groove-shaped recess 9, it is necessary to adjust the position of the cutting blade of the dicing saw device with high accuracy, which makes the device large and occupies and maintains a work space. In terms of operation, the cost is high. Further, there is a limit to the position where the groove can be formed.

【0006】そこで特開昭60−68301号公報にお
いては、光デバイスを搭載する光結合用基板3の溝状凹
部を、図5に示すように光軸の高さが一致するよう光デ
バイス毎に定めた所定の幅を有するパターンに沿って、
エッチング手段により形成されるV溝19としている。
例えば{100}結晶面を表面とするシリコン基板の場
合に異方性を有するエッチャントに浸すと、{100}
面と{111}面のエッチング速度が異なる異方性エッ
チングのため溝幅を規定することにより容易に所望の深
さのV溝19を得る。光デバイスは該V溝19の交差
部、或いは溝幅が異なる2本の該V溝19の境界部に装
着し固定され、さらに押さえ板26でカバーされる。
Therefore, in Japanese Unexamined Patent Publication No. 60-68301, the groove-shaped concave portion of the optical coupling substrate 3 on which the optical device is mounted is provided for each optical device so that the optical axes have the same height as shown in FIG. Along a pattern with a defined width,
The V groove 19 is formed by etching means.
For example, in the case of a silicon substrate having a {100} crystal plane as the surface, when immersed in an etchant having anisotropy, {100}
The V-groove 19 having a desired depth can be easily obtained by defining the groove width for anisotropic etching in which the etching rates of the {111} plane and the {111} plane are different. The optical device is mounted and fixed at the intersection of the V-shaped grooves 19 or the boundary between the two V-shaped grooves 19 having different groove widths, and is further covered by the pressing plate 26.

【0007】しかしながら、前述の方法においては、半
導体発光素子や受光素子等、接着面が平坦な光デバイス
の装着に適する平坦な底面を有し、且つ深さが正確な溝
は得られない。平坦な{100}面を底面とする溝は、
異方性エッチングによりV溝が形成される途中経過でエ
ッチングを止めて、台形形状の溝として得られる。該台
形形状の溝の深さはエッチングが止まる時間に依存する
ため、深さを正確に再現性良く形成することは困難であ
る。このため、接着面が平坦である光デバイスは、光軸
を一致させて安定に設置することが難しいと言う問題点
がある。
However, in the above-mentioned method, it is impossible to obtain a groove having a flat bottom surface and a precise depth suitable for mounting an optical device such as a semiconductor light emitting element or a light receiving element having a flat adhesive surface. A groove with a flat {100} face as the bottom is
Etching is stopped in the middle of formation of the V-shaped groove by anisotropic etching to obtain a trapezoidal groove. Since the depth of the trapezoidal groove depends on the time when etching is stopped, it is difficult to form the depth accurately and with good reproducibility. Therefore, an optical device having a flat adhesive surface has a problem that it is difficult to stably install the optical device by aligning the optical axes.

【0008】[0008]

【発明が解決しようとする課題】このように従来、半導
体発光素子や受光素子等の接着面が平坦な光デバイスを
装着するための台形溝の深さを正確に、且つ再現性良く
形成することは困難であり、これが光結合用基板上に装
着する光デバイスの位置精度を低下させる要因となって
いた。
As described above, it is necessary to form the depth of a trapezoidal groove for mounting an optical device such as a semiconductor light emitting element or a light receiving element having a flat adhesive surface accurately and with good reproducibility. However, this is a factor that reduces the positional accuracy of the optical device mounted on the optical coupling substrate.

【0009】本発明は、上記事情を考慮してなされたも
ので、その目的とするところは、台形溝をも正確に且つ
再現性良く形成することができ、あらゆる光デバイスの
装着を精度良く簡便に行うことができ、且つ経時的な信
頼性も得られる光半導体装置を提供することにある。
The present invention has been made in consideration of the above circumstances, and it is an object of the present invention to form a trapezoidal groove accurately and with good reproducibility, and to mount all optical devices with high accuracy and simplicity. Another object of the present invention is to provide an optical semiconductor device which can be performed at any time and which is also reliable over time.

【0010】[0010]

【課題を解決するための手段】上記目的を達成するため
に本発明では、次のような構成を採用している。
In order to achieve the above object, the present invention adopts the following configuration.

【0011】即ち本発明は、半導体基板上に台形溝とV
溝を形成し、それぞれの溝に光デバイスを設置した光半
導体装置において、半導体基板として2枚の半導体ウェ
ハを絶縁膜を介して接着した接着基板を用い、一方のウ
ェハに絶縁膜に達する深さの台形溝を設けると共に、各
光デバイスの光軸の高さがそれぞれ一致するように溝幅
が設定されたV溝を設けるようにしたものである。
That is, according to the present invention, a trapezoidal groove and a V-shaped groove are formed on a semiconductor substrate.
In an optical semiconductor device in which a groove is formed and an optical device is installed in each groove, an adhesive substrate in which two semiconductor wafers are bonded via an insulating film is used as a semiconductor substrate, and the depth at which one wafer reaches the insulating film is reached. In addition to the trapezoidal groove, the V groove having a groove width set so that the heights of the optical axes of the respective optical devices coincide with each other is provided.

【0012】また本発明は、複数の光デバイスを同一の
基板に搭載する際に、所定の厚さと平滑な表面を有する
複数の半導体ウェハの表面同士を接合してなる接着基板
を光結合用基板として用い、光軸の高さが一致するよう
に光デバイス毎に定めた溝幅を有するV溝及び台形溝を
基板上の所定の位置に一条或いは十字状に形成し、該V
溝及び台形溝にそれぞれ光デバイスを装着して光結合す
ることを特徴とする。本発明では、複数の半導体ウェハ
を絶縁膜(酸化膜)などのエッチングストップ層を介し
て接合してなる接着基板上に複数の光デバイスを搭載す
る。該基板表面にはフォトリソグラフィ技術とエッチン
グ技術により所定の溝幅を有し、一条或いは十字状のパ
ターンに沿うV溝又は台形溝を形成する。該パターン及
び溝形状は光結合して設置されるように個々の光デバイ
スに応じて適宜選択される。また、該台形溝は半導体ウ
ェハ接合部のエッチングストップ層を露出した平坦な底
面を有する溝である。しかるのち、該V溝或いは台形状
の交差部、若しくは溝幅が異なる2本の該V溝或いは台
形溝の境界部に各光デバイスを装着する。
Further, according to the present invention, when a plurality of optical devices are mounted on the same substrate, an adhesive substrate formed by joining the surfaces of a plurality of semiconductor wafers having a predetermined thickness and smooth surfaces to each other is used as an optical coupling substrate. V groove and trapezoidal groove having a groove width determined for each optical device so that the heights of the optical axes coincide with each other are formed at predetermined positions on the substrate in a linear or cross shape, and
It is characterized in that optical devices are respectively mounted in the groove and the trapezoidal groove to perform optical coupling. In the present invention, a plurality of optical devices are mounted on an adhesive substrate formed by bonding a plurality of semiconductor wafers via an etching stop layer such as an insulating film (oxide film). A V-groove or a trapezoidal groove having a predetermined groove width and having a linear or cross pattern is formed on the surface of the substrate by a photolithography technique and an etching technique. The pattern and groove shape are appropriately selected according to each optical device so as to be optically coupled and installed. Further, the trapezoidal groove is a groove having a flat bottom surface which exposes the etching stop layer of the semiconductor wafer bonding portion. Then, each optical device is attached to the V-shaped groove or the trapezoidal intersection, or to the boundary between two V-shaped grooves or trapezoidal grooves having different groove widths.

【0013】[0013]

【作用】本発明では、光デバイスが設置される台形溝を
通常のマスク合わせ工程を用いて形成することで、水平
方向の位置を正確に規定できる。また、複数のウェハを
酸化膜などのエッチングストップ層を介して接合してい
るので、台形溝のエッチングはその酸化膜で自動的に止
まる。従って、ウェハの厚さを正確に研磨しておけば台
形溝の深さを正確に且つ平坦にエッチングすることが容
易となる。一方、エッチングストップ層に達しない深さ
を持つV溝は、溝幅を規定することにより所定の深さに
エッチングできる。そして、それら凹部を利用すること
により、水平,垂直方向共に、正確な位置に光デバイス
をマウントすることが可能となる。また、V溝は個々の
光デバイスに応じて一条或いは十字状のパターンを適宜
選択して形成し、固定のための部材を必要としない装着
を行うため、光デバイスの位置関係が経時的にも安定で
ある。
In the present invention, the trapezoidal groove in which the optical device is installed is formed by using a normal mask aligning process, so that the horizontal position can be accurately defined. Further, since a plurality of wafers are bonded via the etching stop layer such as an oxide film, etching of the trapezoidal groove automatically stops at the oxide film. Therefore, if the thickness of the wafer is accurately polished, it becomes easy to accurately and flatly etch the depth of the trapezoidal groove. On the other hand, the V groove having a depth that does not reach the etching stop layer can be etched to a predetermined depth by defining the groove width. Then, by utilizing these recesses, it becomes possible to mount the optical device at an accurate position in both the horizontal and vertical directions. Further, the V groove is formed by appropriately selecting a single-line or cross-shaped pattern according to each optical device, and mounting is performed without requiring a member for fixing, so that the positional relationship of the optical device can be changed with time. It is stable.

【0014】[0014]

【実施例】以下、本発明の実施例を図面を参照して説明
する。
Embodiments of the present invention will be described below with reference to the drawings.

【0015】図1は、本発明の一実施例に係わる光半導
体装置の概略構成を説明するためのもので、(a)は斜
視図、(b)は断面図である。光デバイスが搭載される
光結合用基板には、熱酸化等によりSiO2 膜(絶縁
膜)21を表面に形成したシリコンウェハ18aに、他
のシリコンウェハ18bを直接接着技術により接合した
接着基板18を用いる。直接接着技術は、高い耐圧を持
つIGBT(InsulatedGate Bipolar Transistor )や
パワーにその製造工程に用いられるようになってきた技
術で、まず2枚の半導体ウェハの平滑な表面にOH基を
形成し、これらの面を接触させる。それぞれのウェハの
OH基同士が水素結合をして2枚のウェハは密着し、さ
らに熱処理により脱水縮合反応及び酸素原子の移動が起
こる。この結果、ウェハを構成する原子同士が結合し、
半導体ウェハが直接接合して接着基板が形成される。該
接着基板のシリコンウェハは(100)結晶面を表面と
しており、KOH溶液或いはヒドラジン等の異方性を有
するエッチャントにより角度70.6°のV溝が得られ
る。
1A and 1B are schematic views of an optical semiconductor device according to an embodiment of the present invention. FIG. 1A is a perspective view and FIG. 1B is a sectional view. The optical coupling substrate on which the optical device is mounted is an adhesive substrate 18 in which a silicon wafer 18a having a SiO 2 film (insulating film) 21 formed on the surface thereof by thermal oxidation or the like and another silicon wafer 18b are directly bonded to each other. To use. The direct bonding technology is a technology that has come to be used in the manufacturing process of IGBT (Insulated Gate Bipolar Transistor) and power with high withstand voltage. First, OH groups are formed on the smooth surface of two semiconductor wafers, Contact the surfaces of. The OH groups of the respective wafers are hydrogen-bonded to each other to bring the two wafers into close contact with each other, and the heat treatment causes a dehydration condensation reaction and movement of oxygen atoms. As a result, the atoms that make up the wafer are bound together,
The semiconductor wafer is directly bonded to form an adhesive substrate. The silicon wafer of the adhesive substrate has a (100) crystal plane as a surface, and a V groove having an angle of 70.6 ° can be obtained by an anisotropic etchant such as a KOH solution or hydrazine.

【0016】光結合用基板18には、半導体発光素子と
しての半導体レーザ1を設置するための台形溝部20
と、この台形溝20に垂直に交差する光ファイバ2及び
球レンズ4を設置するためのV溝19が形成される。半
導体レーザ1は、近傍に位置合わせパターン6が付けら
れた一条の台形溝20に設置される。球レンズ4は、十
字状のV溝19に安定に設置される。また、光ファイバ
2は溝幅の境界部にファイバ端面を合わせて、一条のV
溝19に設置される。台形溝20及びV溝19の深さ
は、半導体レーザ1の光ビーム出射部8と、光ファイバ
2のコア及び球レンズ4の中心部が一致するように、個
々の光デバイスの大きさと形状に応じて定められる。
The optical coupling substrate 18 has a trapezoidal groove portion 20 for mounting the semiconductor laser 1 as a semiconductor light emitting element.
Then, a V-shaped groove 19 for installing the optical fiber 2 and the spherical lens 4 perpendicularly intersecting the trapezoidal groove 20 is formed. The semiconductor laser 1 is installed in a single trapezoidal groove 20 having an alignment pattern 6 provided in the vicinity thereof. The ball lens 4 is stably installed in the V-shaped groove 19 having a cross shape. Further, the optical fiber 2 has a single V
It is installed in the groove 19. The depths of the trapezoidal groove 20 and the V-shaped groove 19 are determined according to the size and shape of each optical device so that the light beam emitting portion 8 of the semiconductor laser 1 and the core of the optical fiber 2 and the central portion of the spherical lens 4 coincide with each other. It is determined accordingly.

【0017】上述のように個々の光デバイスを光結合基
板18の溝部19,20に設置した後、接着剤にて固定
するか、或いは該基板18のV溝19と同形で溝幅が小
さく相似のV溝が形成された押さえ板(図示せず)を冠
着し固定する。
As described above, after the individual optical devices are installed in the groove portions 19 and 20 of the optical coupling substrate 18, they are fixed with an adhesive, or they have the same shape as the V groove 19 of the substrate 18 but the groove width is small and similar. The pressing plate (not shown) having the V-groove is capped and fixed.

【0018】次に、上記実施例に用いた光結合用基板の
製造工程について説明する。まず、図2(a)に示すよ
うに、接着基板18の一方のシリコンウェハ表面にSi
2 膜21を形成した後、レジスト22を全面に塗布す
る。続いて、フォトリソグラフィ工程により、所望のパ
ターンをレジストに形成した後、SiO2 膜21を選択
エッチングしてSiO2 膜21にパターンを転写する。
Next, the manufacturing process of the optical coupling substrate used in the above embodiment will be described. First, as shown in FIG. 2A, Si is formed on one silicon wafer surface of the adhesive substrate 18.
After forming the O 2 film 21, a resist 22 is applied on the entire surface. Then, after a desired pattern is formed on the resist by a photolithography process, the SiO 2 film 21 is selectively etched to transfer the pattern to the SiO 2 film 21.

【0019】次いで、KOH溶液或いはヒドラジン等の
異方性を有するエッチャントに所定の時間浸すことによ
り、図2図(b)に示すようなパターンの幅に応じたV
溝19及び台形溝20を得る。V溝19は半導体ウェハ
の接合部に達しない場合に形成される形状であり、台形
溝20は接合部の酸化膜21などのエッチングストップ
層で凹部のエッチングが自動的に止まることにより形成
される。シリコンウェハ18aの厚さを正確に研磨して
おけば、台形溝20の深さは正確に定まる。その後、マ
スクとして用いたSiO2 膜21を弗化アンモニウムな
どにより除去して光結合用基板を得る。
Then, by immersing in an anisotropic etchant such as KOH solution or hydrazine for a predetermined time, V corresponding to the width of the pattern as shown in FIG. 2B is formed.
A groove 19 and a trapezoidal groove 20 are obtained. The V-shaped groove 19 has a shape formed when it does not reach the bonded portion of the semiconductor wafer, and the trapezoidal groove 20 is formed by automatically stopping the etching of the recessed portion by the etching stop layer such as the oxide film 21 of the bonded portion. .. If the thickness of the silicon wafer 18a is accurately polished, the depth of the trapezoidal groove 20 can be accurately determined. After that, the SiO 2 film 21 used as a mask is removed with ammonium fluoride or the like to obtain an optical coupling substrate.

【0020】図3は、本実施例装置をパッケージに設置
する様子を示す模式図である。光結合用基板18にパッ
ケージ12に設置する際に位置決めとなる台形溝23を
設ける。具体的には、ウェハの厚さを正確に研磨して、
深さを正確に且つ底面を平坦にエッチングした位置合わ
せ用台形溝23を光結合用基板18に設ける。該位置合
わせ用台形溝23の底面と、パッケージ12の位置合わ
せ部27が合うように光結合用基板18をパッケージ1
2に設置すると、光結合用基板18に搭載した光デバイ
スの光軸とパッケージ12の位置関係が正確に決まる。
FIG. 3 is a schematic diagram showing how the apparatus of this embodiment is installed in a package. The optical coupling substrate 18 is provided with a trapezoidal groove 23 that serves as a positioning when the optical coupling substrate 18 is installed in the package 12. Specifically, precisely polish the thickness of the wafer,
The optical coupling substrate 18 is provided with a trapezoidal groove 23 for alignment, which is etched to have a precise depth and a flat bottom surface. The optical coupling substrate 18 is mounted on the package 1 so that the bottom surface of the alignment trapezoidal groove 23 and the alignment portion 27 of the package 12 are aligned with each other.
When installed in position 2, the positional relationship between the optical axis of the optical device mounted on the optical coupling substrate 18 and the package 12 is accurately determined.

【0021】一方、光ファイバ14とパッケージ12と
の位置関係が正確に決まるように、パッケージ12に対
する位置決め部25を有する光ファイバコネクタ24が
形成できる。そこで、パッケージ12を介在させて、光
デバイスの光軸と光ファイバ14を高い光結合率を有す
る位置関係で簡便に結合できる。
On the other hand, the optical fiber connector 24 having the positioning portion 25 for the package 12 can be formed so that the positional relationship between the optical fiber 14 and the package 12 is accurately determined. Therefore, it is possible to easily couple the optical axis of the optical device and the optical fiber 14 with the package 12 interposed therebetween in a positional relationship having a high optical coupling rate.

【0022】このように本実施例によれば、光結合用基
板18として2枚のシリコンウェハ18a,18bを酸
化膜21を介して接着した接着基板を用い、一方のウェ
ハ18aを酸化膜21に達するまでエッチングして台形
溝20を形成しているので、ウェハ18aの厚さを正確
に研磨しておけば、台形溝20を正確に且つ再現性良く
形成することができる。従って、半導体レーザ1のよう
な接着面が平坦な光デバイスを光結合用基板18上に位
置精度良く装着することができる。
As described above, according to this embodiment, as the optical coupling substrate 18, an adhesive substrate in which two silicon wafers 18a and 18b are adhered to each other with the oxide film 21 in between is used. Since the trapezoidal groove 20 is formed by etching until reaching, the trapezoidal groove 20 can be accurately and reproducibly formed by accurately polishing the thickness of the wafer 18a. Therefore, an optical device such as the semiconductor laser 1 having a flat adhesive surface can be mounted on the optical coupling substrate 18 with high positional accuracy.

【0023】また、エッチングにより溝を形成するた
め、溝の位置に制限がなく、基板表面を有効に利用でき
る。例えば、球レンズ4を設置する十字条溝が必要な範
囲内で形成できるため、ダイシングソー装置で溝状凹部
を形成する図4(a)の従来例に比べると、基板上の余
白部が広がる。そこで、図3に示すように該余白部分に
半導体レーザの駆動回路などの周辺回路を搭載すること
が可能となり、モジュールの小型化に役立つ。
Since the groove is formed by etching, the position of the groove is not limited and the surface of the substrate can be effectively used. For example, since the cross-shaped groove for mounting the spherical lens 4 can be formed within a required range, the blank portion on the substrate is wider than in the conventional example of FIG. 4A in which the groove-shaped recess is formed by the dicing saw device. .. Therefore, as shown in FIG. 3, it becomes possible to mount a peripheral circuit such as a semiconductor laser drive circuit in the margin portion, which is useful for miniaturization of the module.

【0024】なお、本発明は上述した実施例に限定され
るものではなく、その要旨を逸脱しない範囲で、種々変
形して実施することができる。実施例では、半導体ウェ
ハとしてシリコンを用いたが、絶縁膜を介して接着でき
る半導体であれば用いることが可能である。また、半導
体ウェハ間に介在させる絶縁膜はSiO2 に限るもので
はなく、SiON,Si3 4 等でもよい。
The present invention is not limited to the above-described embodiments, and various modifications can be carried out without departing from the scope of the invention. In the embodiment, silicon is used as the semiconductor wafer, but any semiconductor that can be bonded via the insulating film can be used. Further, the insulating film interposed between the semiconductor wafers is not limited to SiO 2 and may be SiON, Si 3 N 4 or the like.

【0025】[0025]

【発明の効果】以上詳述したように本発明によれば、2
枚の半導体ウェハを絶縁膜を介して接着した接着基板を
用いることにより、V溝は勿論のこと台形溝をも精度良
く形成できるので、あらゆる光デバイスを精度よく簡便
に装着することができ、製造コストの低減、さらに経時
的な信頼性向上をはかり得る。また、光デバイスと周辺
回路の集積化に有効である。
As described above in detail, according to the present invention, 2
By using an adhesive substrate in which a plurality of semiconductor wafers are adhered via an insulating film, not only V-shaped grooves but also trapezoidal shaped grooves can be formed with high precision, so that all optical devices can be mounted accurately with ease. The cost can be reduced and the reliability can be improved over time. It is also effective for integrating optical devices and peripheral circuits.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に係わる光半導体装置を示す
概略構成図、
FIG. 1 is a schematic configuration diagram showing an optical semiconductor device according to an embodiment of the present invention,

【図2】上記実施例に用いた光結合用基板の製造工程を
示す斜視図、
FIG. 2 is a perspective view showing a manufacturing process of the optical coupling substrate used in the above embodiment,

【図3】実施例装置とこれを設置するパッケージを示す
斜視図、
FIG. 3 is a perspective view showing an apparatus according to an embodiment and a package in which the apparatus is installed;

【図4】従来の光半導体装置を示す概略構成図、FIG. 4 is a schematic configuration diagram showing a conventional optical semiconductor device,

【図5】エッチングによりV溝を形成した光結合用基板
を用いた従来例を示す斜視図。
FIG. 5 is a perspective view showing a conventional example using an optical coupling substrate in which a V groove is formed by etching.

【符号の説明】[Explanation of symbols]

1…半導体レーザ、 2…光ファイバ、 4…球レンズ、 5…金属細線、 6…位置合わせパターン、 7…電極部、 8…光ビーム出射部、 10…周辺回路、 12…パッケージ、 18a,18b…半導体ウェハ、 18…接着基板、 19…V溝、 20…台形溝、 21…SiO2 膜、 22…レジスト膜、 23…光結合用基板とパッケージ位置合わせ溝、 24…ファイバコネクタ、 25…パッケージとファイバコネクタ位置合わせ部、 27…位置合わせ部。DESCRIPTION OF SYMBOLS 1 ... Semiconductor laser, 2 ... Optical fiber, 4 ... Spherical lens, 5 ... Metal fine wire, 6 ... Alignment pattern, 7 ... Electrode part, 8 ... Light beam emitting part, 10 ... Peripheral circuit, 12 ... Package, 18a, 18b ... Semiconductor wafer, 18 ... Adhesive substrate, 19 ... V groove, 20 ... Trapezoidal groove, 21 ... SiO 2 film, 22 ... Resist film, 23 ... Optical coupling substrate and package alignment groove, 24 ... Fiber connector, 25 ... Package And fiber connector alignment part, 27 ... alignment part.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 濱崎 浩史 神奈川県川崎市幸区小向東芝町1番地 株 式会社東芝総合研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hiroshi Hamasaki 1 Komukai Toshiba-cho, Kouki-ku, Kawasaki-shi, Kanagawa Stock company Toshiba Research Institute

Claims (1)

【特許請求の範囲】 【請求項1】2枚の半導体ウェハを絶縁膜を介して接着
してなり、一方のウェハを選択的にエッチングして台形
溝とV溝を形成した接着基板と、この接着基板の台形溝
に設置された第1の光デバイスと、前記接着基板のV溝
に設置された第2の光デバイスとを具備し、 前記台形溝は前記絶縁膜に達する深さに形成され、前記
V溝は第1及び第2の光デバイスの光軸の高さがそれぞ
れ一致するようにその溝幅が設定されたものであること
を特徴とする光半導体装置。
Claim: What is claimed is: 1. An adhesive substrate comprising two semiconductor wafers bonded together via an insulating film, one wafer being selectively etched to form a trapezoidal groove and a V groove, and A first optical device installed in a trapezoidal groove of the adhesive substrate; and a second optical device installed in a V groove of the adhesive substrate, wherein the trapezoidal groove is formed to a depth reaching the insulating film. The optical semiconductor device is characterized in that the V groove has a groove width set such that the heights of the optical axes of the first and second optical devices are the same.
JP19226091A 1991-07-31 1991-07-31 Optical semiconductor device Pending JPH0537024A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19226091A JPH0537024A (en) 1991-07-31 1991-07-31 Optical semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19226091A JPH0537024A (en) 1991-07-31 1991-07-31 Optical semiconductor device

Publications (1)

Publication Number Publication Date
JPH0537024A true JPH0537024A (en) 1993-02-12

Family

ID=16288332

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19226091A Pending JPH0537024A (en) 1991-07-31 1991-07-31 Optical semiconductor device

Country Status (1)

Country Link
JP (1) JPH0537024A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997011398A1 (en) * 1995-09-20 1997-03-27 Hitachi, Ltd. Optical module
WO1999001790A1 (en) * 1997-07-01 1999-01-14 Agilent Technologies, Inc. Improved micro-photonics module integrated on a single substrate
JP2002076498A (en) * 2000-09-01 2002-03-15 Kyocera Corp Optical components mounting substrate and optical module using the same
JP2002116363A (en) * 2000-06-30 2002-04-19 Hoya Corp Optical element positioning method, optical element positioning member, optical unit, and its manufacturing method
WO2002082148A3 (en) * 2001-04-05 2003-10-09 Unique M O D E Ag Optical or optoelectronic module
KR20050005632A (en) * 2003-07-07 2005-01-14 삼성전자주식회사 TWO LENS COUPLING USING SiOB V-GROOVE
JP2006043972A (en) * 2004-08-03 2006-02-16 Seiko Epson Corp Line head and image forming apparatus equipped with it
JP2010020116A (en) * 2008-07-11 2010-01-28 Oki Semiconductor Co Ltd Optical communication module
JP2013041957A (en) * 2011-08-15 2013-02-28 Furukawa Electric Co Ltd:The Optical module and manufacturing method of optical module
CN107728258A (en) * 2017-11-23 2018-02-23 中国工程物理研究院核物理与化学研究所 A kind of linear fiber array
CN113097856A (en) * 2021-03-31 2021-07-09 三序光学科技(苏州)有限公司 Multi-wavelength point light source device and manufacturing method thereof
CN113097857A (en) * 2021-03-31 2021-07-09 三序光学科技(苏州)有限公司 Multi-wavelength composite wave light source device and manufacturing method thereof

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997011398A1 (en) * 1995-09-20 1997-03-27 Hitachi, Ltd. Optical module
JP4632325B2 (en) * 1997-07-01 2011-02-16 アバゴ・テクノロジーズ・ジェネラル・アイピー(シンガポール)プライベート・リミテッド Improved microphotonics module integrated on a single substrate
JP2002510405A (en) * 1997-07-01 2002-04-02 アジレント・テクノロジーズ・インク Improved microphotonics module integrated on a single substrate
WO1999001790A1 (en) * 1997-07-01 1999-01-14 Agilent Technologies, Inc. Improved micro-photonics module integrated on a single substrate
JP2002116363A (en) * 2000-06-30 2002-04-19 Hoya Corp Optical element positioning method, optical element positioning member, optical unit, and its manufacturing method
JP2002076498A (en) * 2000-09-01 2002-03-15 Kyocera Corp Optical components mounting substrate and optical module using the same
WO2002082148A3 (en) * 2001-04-05 2003-10-09 Unique M O D E Ag Optical or optoelectronic module
KR20050005632A (en) * 2003-07-07 2005-01-14 삼성전자주식회사 TWO LENS COUPLING USING SiOB V-GROOVE
JP2006043972A (en) * 2004-08-03 2006-02-16 Seiko Epson Corp Line head and image forming apparatus equipped with it
JP2010020116A (en) * 2008-07-11 2010-01-28 Oki Semiconductor Co Ltd Optical communication module
JP2013041957A (en) * 2011-08-15 2013-02-28 Furukawa Electric Co Ltd:The Optical module and manufacturing method of optical module
CN107728258A (en) * 2017-11-23 2018-02-23 中国工程物理研究院核物理与化学研究所 A kind of linear fiber array
CN113097856A (en) * 2021-03-31 2021-07-09 三序光学科技(苏州)有限公司 Multi-wavelength point light source device and manufacturing method thereof
CN113097857A (en) * 2021-03-31 2021-07-09 三序光学科技(苏州)有限公司 Multi-wavelength composite wave light source device and manufacturing method thereof

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