JPH05346455A - In-circuit tester jig - Google Patents

In-circuit tester jig

Info

Publication number
JPH05346455A
JPH05346455A JP4154795A JP15479592A JPH05346455A JP H05346455 A JPH05346455 A JP H05346455A JP 4154795 A JP4154795 A JP 4154795A JP 15479592 A JP15479592 A JP 15479592A JP H05346455 A JPH05346455 A JP H05346455A
Authority
JP
Japan
Prior art keywords
measured
pin
pins
pogo
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4154795A
Other languages
Japanese (ja)
Inventor
Masatoshi Imai
正資 今井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asia Electronics Co
Original Assignee
Asia Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asia Electronics Co filed Critical Asia Electronics Co
Priority to JP4154795A priority Critical patent/JPH05346455A/en
Publication of JPH05346455A publication Critical patent/JPH05346455A/en
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To improve workability, cost and reliability in the manufacture of jig by realizing automatic interconnection of POGO pins. CONSTITUTION:POGO pins 9 held in a pin holder 4 on the side to be measured and POGO pins 10 held in a pin holder 7 on the measuring side are arranged, in large number, on the upper and lower stages of a jig. A relay board 6 connecting corresponding pins 9, 10 is interposed between the upper and lower stages. A wiring 18 for electrically interconnecting corresponding pins is formed on the relay board 6. The POGO pins 9 on the side to be measured and the POGO pins 10 on the measuring side are pressed, respectively, against the wiring 18, and the POGO pins to be connected are connected electrically through the wiring 18.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント基板に実装し
たまま電子部品の電気的検査を行うインサーキットテス
タ治具に係り、特に測定系と被測定系との間に介在する
接続治具の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an in-circuit tester jig for electrically inspecting electronic components while mounted on a printed circuit board, and more particularly to a connecting jig interposed between a measuring system and a measured system. Regarding improvement.

【0002】[0002]

【従来の技術】一般に、プリント基板に実装されたIC
の電気的検査には、インサーキットテスタが使われる。
このインサーキットテスタは、被測定プリント基板のノ
ードにポゴピンを押し当てて測定系との電気的接続を行
い、ICの有無を確認する欠品検査、異同を確認する異
部品検査、向きを確認する方向検査、チップ抵抗などの
特性値検査等の各種検査を行うものである。
2. Description of the Related Art Generally, an IC mounted on a printed circuit board.
An in-circuit tester is used for the electrical inspection of.
This in-circuit tester presses pogo pins against the nodes of the printed circuit board to be electrically connected to the measurement system, and checks for the presence or absence of ICs, missing parts inspection, different parts inspection, and direction confirmation. Various inspections such as a direction inspection and a characteristic value inspection such as chip resistance are performed.

【0003】ところで、図2に示すようにインサーキッ
トテスタでは汎用性をもたせるために、ピンホルダ4、
7に保持されたポゴピン9、10を上下2段に使用した
接続治具を用いている。上段のポゴピン9は、IC1を
実装した被測定プリント基板2のノードに合せたピン配
列をもつ被測定系用のポゴピンで、被測定プリント基板
2の種類毎に個別に用意する必要がある。下段のポゴピ
ン10は、電極基板8の電極11に対応した固定ピン配
列をもつ測定系用のポゴピンである。
By the way, as shown in FIG. 2, in the in-circuit tester, in order to have versatility, the pin holder 4,
A connection jig is used in which the pogo pins 9 and 10 held in 7 are used in two upper and lower stages. The upper pogo pin 9 is a pogo pin for the system under measurement having a pin arrangement that matches the node of the printed circuit board 2 under measurement on which the IC 1 is mounted, and it is necessary to separately prepare each type of printed circuit board 2 under measurement. The lower pogo pin 10 is a pogo pin for a measurement system having a fixed pin array corresponding to the electrode 11 of the electrode substrate 8.

【0004】このように上段のポゴピン配列と下段のポ
ゴピン配列とは物理的位置が対応していない。このた
め、ポゴピン9、10を通して被測定プリント基板2の
電気的検査を行うためには、互に食違う上下段の対応す
るポゴピン9、10間を電気的に接続する必要がある。
従来、このポゴピン9、10間の電気的接続には、人手
によるワイヤラッピング14が用いられていた。
As described above, the upper pogo pin array and the lower pogo pin array do not correspond in physical position. Therefore, in order to electrically inspect the printed circuit board 2 to be measured through the pogo pins 9 and 10, it is necessary to electrically connect the corresponding pogo pins 9 and 10 in the upper and lower stages, which are different from each other.
Conventionally, manual wire wrapping 14 has been used for electrical connection between the pogo pins 9 and 10.

【0005】[0005]

【発明が解決しようとする課題】しかし、上記したワイ
ヤラッピングに頼る従来技術では、次のような種々の問
題があった。
However, the above-mentioned conventional techniques that rely on wire wrapping have various problems as described below.

【0006】(1)被測定プリント基板のノード数は非
常に多く、検査にはこの全部にピンを立てる必要があ
り、ピン数は多いものでは2500〜3000本近くに
達することから、これら上下段のピン間接続をワイヤラ
ッピングで行うと、治具製作の作業性が極めて悪く時間
もかかり、納期に要する期間も長くなり、製作した治具
も非常に高価となる。
(1) The number of nodes on the printed circuit board to be measured is very large, and it is necessary to set pins for all of them for inspection. With a large number of pins, the number reaches about 2500 to 3000. If the pin-to-pin connection is performed by wire wrapping, the workability of jig production is extremely poor, it takes time, the time required for delivery is long, and the produced jig is very expensive.

【0007】(2)このように治具が高価になっても同
種のプリント基板が大量に生産されるのであれば、ピン
ホルダ等を含めた全体のコストが下がるため、それ程重
要視されることはないが、多品種、少量化の傾向にある
最近では、高価格化は非常に重要な問題となる。例え
ば、プリント基板よりもこれを測定する治具の方が高く
なることすらある。このような状況はプリント基板価格
とのバランス上、是が非でも改善されなければならな
い。
(2) Even if the jig becomes expensive in this way, if printed boards of the same kind are mass-produced, the overall cost including the pin holder and the like will be reduced, so that importance is given to that extent. Although not available, high prices have become a very important issue in recent years due to the trend toward high-mix low-volume production. For example, a jig for measuring this may be higher than a printed circuit board. This situation must be improved even if it is improper in view of the balance with the printed circuit board price.

【0008】(3)また、接続作業が人手によるため間
違ったピン間を接続する危険があり、そのため信頼性に
欠ける。
(3) Further, since the connecting work is performed manually, there is a risk of connecting wrong pins, which is unreliable.

【0009】本発明の目的は、ピン間に中継基板を介在
させることによって、上述した従来技術の欠点を解消し
て、短時間で容易、かつ安価に製造でき、しかも信頼性
の高いインサーキットテスタ治具を提供することにあ
る。
An object of the present invention is to eliminate the above-mentioned drawbacks of the prior art by interposing a relay substrate between the pins, to make the in-circuit tester highly reliable in a short time and of high reliability. To provide a jig.

【0010】[0010]

【課題を解決するための手段】本発明のインサーキット
テスタ治具は、IC等の電子部品の実装された被測定プ
リント基板のノードに対応して配列され、各ノードに一
端が押し当てられるテストピンを保持する被測定系側ピ
ンホルダと、被測定プリント基板に実装された電子部品
の電気的検査を行う測定系に接続される電極基板上の電
極に対応して配列され、各電極に一端が押し当てられる
テストピンを保持する測定系側ピンホルダとを備え、被
測定系側ピンホルダに保持されたテストピンと測定系側
ピンホルダに保持されたテストピンとの間に、被測定系
側テストピン及び測定系側テストピンの他端がそれぞれ
押し当てられて、相互接続すべき対応ピン間を電気的に
接続する配線が形成された中継基板を設けたものであ
る。
The in-circuit tester jig of the present invention is a test in which one end is pressed against each node, which is arranged corresponding to a node of a printed circuit board under measurement on which an electronic component such as an IC is mounted. The pin holders on the measurement system side that hold the pins and the electrodes on the electrode board that are connected to the measurement system that electrically tests the electronic components mounted on the printed circuit board under measurement are arranged corresponding to one end of each electrode. The measurement system side pin holder that holds the pressed test pin is provided, and the measurement system side test pin and the measurement system side test pin and the measurement system side test pin are held between the test pin held by the measurement system side pin holder and the measurement system side pin holder. The other ends of the side test pins are pressed against each other, and a relay board is provided in which wirings for electrically connecting corresponding pins to be interconnected are formed.

【0011】電子部品はICなどの集積ないし複合部品
の他にトランジスタ、コンデンサ、抵抗などの個別部品
等である。被測定プリント基板は単層、多層を問わな
い。テストピンは基板のノードへバネなどで押し当て
て、電気的接続を行うポゴピンである。被測定系側テス
トピンは、被測定プリント基板に応じてピン配列が異な
るもので、測定系側テストピンは、被測定プリント基板
に関係なくシステムによりピン配列が固定されているも
のである。そして、中継基板の配線は印刷配線により形
成され、その配線は単層、多層を問わない。
The electronic parts include integrated parts such as ICs or composite parts, as well as individual parts such as transistors, capacitors and resistors. The printed circuit board to be measured may be a single layer or a multilayer. The test pin is a pogo pin that is pressed against a node on the substrate with a spring or the like to make an electrical connection. The test-system-side test pin has a different pin arrangement depending on the print-circuit board to be measured, and the test-system-side test pin has a pin arrangement fixed by the system regardless of the print-circuit board to be measured. The wiring of the relay board is formed by printed wiring, and the wiring may be a single layer or a multilayer.

【0012】[0012]

【作用】被測定プリント基板のノードに対応して被測定
系側テストピンの配列を予め決めて、これを保持した被
測定系側ピンホルダを形成する。また、被測定系側テス
トピンと、電極に対応して配列される測定系側テストピ
ン間に設けられる中継基板に、被測定系側テストピン
と、この被測定系側テストピンを接続すべき測定系側テ
ストピンとが、ピンを押し当てるだけで電気的に相互接
続されるように、対応ピン間をつなぐ配線を予め形成し
ておく。
The arrangement of the test pins on the measured system side is determined in advance corresponding to the nodes of the printed circuit board to be measured, and the pin holder on the measured system side holding the pin is formed. Also, the measured system side test pin and the measured system to which this measured system side test pin should be connected to the relay board provided between the measured system side test pin and the measured system side test pin arranged corresponding to the electrodes. A wiring for connecting the corresponding pins is formed in advance so that the side test pins are electrically connected to each other only by pressing the pins.

【0013】その上で、被測定系側テストピンの一端を
被測定プリント基板のノードに、測定系側テストピンの
一端を電極基板の電極に押し当てる。また被測定系側テ
ストピン及び測定系側テストピンの他端を中継基板上に
形成した配線にそれぞれの面から押し当てると、ワイヤ
ラッピングをすることなしに、測定系の電極と被測定プ
リント基板のノードとが電気的に接続され、測定系によ
る電気的検査が行える。
Then, one end of the measured system side test pin is pressed against the node of the measured printed circuit board, and one end of the measured system side test pin is pressed against the electrode of the electrode substrate. When the test pin on the system to be measured and the other end of the test pin on the system to be measured are pressed against the wiring formed on the relay board from each surface, the electrodes of the measurement system and the printed circuit board to be measured without wire wrapping. Is electrically connected to the node, and an electrical inspection by the measurement system can be performed.

【0014】[0014]

【実施例】以下、本発明の実施例を図1を用いて説明す
る。図1は本実施例によるインサーキットテスタの接続
治具の断面構造を示す。治具は被測定系側となる上段
と、測定系側となる下段とから構成され、その中間に本
発明の要部となる中継基板6が介設される。
EXAMPLE An example of the present invention will be described below with reference to FIG. FIG. 1 shows a sectional structure of a connection jig of an in-circuit tester according to this embodiment. The jig is composed of an upper stage on the side of the system to be measured and a lower stage on the side of the measurement system, and a relay board 6 which is a main part of the present invention is interposed between them.

【0015】上段は、一番上に電子部品である多数のI
C1の実装された測定対象となる被測定プリント基板2
が取り付けられ、二番目に被測定プリント基板2の裏面
に補強板3が当てがわれる。補強板3は、必要に応じて
設けられるものであるが、ポゴピン9を押しつけるとき
に被測定プリント基板2に加えられる押圧力に十分耐え
るように、被測定プリント基板2の強度を補強するもの
である。補強板3には、被測定プリント基板2の裏面に
形成されているノードの全数に対応する箇所に穴が明け
られており、その穴を介してポゴピン9の一端が挿通さ
れて、ポゴピン9のその一端がノードに押し付けられる
ようになっている。ポゴピン9は、三番目の被測定系側
ピンホルダ(ポゴピンホルダ)4に保持され、ピンホル
ダ4に明けた貫通孔内にピンの中間部を埋め込み、上下
端を突出した格好で垂直に固定されている。被測定系側
ピンホルダ4に保持されたポゴピン9の両端にはバネ1
5が設けられ、そのバネ15の弾発力を利用して押し付
けるようになっている。なお、バネ15は必ずしも両端
に設ける必要はなく、いずれか一端でもよい。
The upper row shows a number of I's, which are electronic components on the top.
Printed circuit board 2 to be measured on which C1 is mounted and to be measured
Is attached, and the reinforcing plate 3 is secondly applied to the back surface of the printed circuit board 2 to be measured. The reinforcing plate 3 is provided as necessary, but it reinforces the strength of the measured printed circuit board 2 so as to sufficiently withstand the pressing force applied to the measured printed circuit board 2 when the pogo pin 9 is pressed. is there. Holes are formed in the reinforcing plate 3 at positions corresponding to the total number of nodes formed on the back surface of the printed circuit board 2 to be measured, and one end of the pogo pin 9 is inserted through the hole, so that the pogo pin 9 One end of it is pressed against the node. The pogo pin 9 is held by a third pin holder (pogo pin holder) 4 on the side of the system to be measured, the middle portion of the pin is embedded in the through hole opened in the pin holder 4, and the upper and lower ends are vertically fixed in a fashionable manner. .. A spring 1 is provided at both ends of the pogo pin 9 held by the pin holder 4 on the measured system side.
5 is provided, and the elastic force of the spring 15 is used for pressing. The springs 15 do not necessarily have to be provided at both ends, and either one may be provided.

【0016】下段は、一番下に治具と測定系13とをリ
ード線12を介して接続するための電極基板8が配設さ
れる。測定系13は、被測定プリント基板2に実装され
たIC1の電気的検査を行うインサーキットテスタの本
体であり、被測定プリント基板2へ検査信号を送り出す
とともに、被測定プリント基板2からの被検査信号を受
信するようになっている。電極基板8にはその配置が規
格化されて固定の電極11が多数設けられ、電極11は
バネ17により弾持されて埋め込まれており、ポゴピン
10が押し付けられたとき、その弾性によりピン10と
の接触性を高めている。電極基板8の電極11に対応し
て配列され、電極11にその一端を押し付けられるポゴ
ピン10は、二番面の測定系側ピンホルダ(ポゴピンホ
ルダ)7に保持され、ピンホルダ7に明けた貫通孔内に
中間部を埋め込んだ格好でその上下端を突出した格好で
垂直に固定されている。測定系側ピンホルダ7に保持さ
れたポゴピン10の他端(上端)にはバネ16が設けら
れ、そのバネ16の弾発力を利用して押し付けるように
なっている。
At the bottom, the electrode substrate 8 for connecting the jig and the measurement system 13 via the lead wire 12 is arranged at the bottom. The measurement system 13 is a main body of an in-circuit tester that electrically inspects the IC 1 mounted on the printed circuit board 2 to be measured, sends an inspection signal to the printed circuit board 2 to be measured, and is inspected from the printed circuit board 2 to be measured. It is designed to receive signals. The electrode substrate 8 is provided with a large number of fixed electrodes 11 whose arrangement is standardized. The electrodes 11 are elastically held and embedded by a spring 17, and when the pogo pin 10 is pressed, the elasticity of the pin 11 causes the pin 10 to move. Enhances the contactability of. The pogo pins 10, which are arranged corresponding to the electrodes 11 of the electrode substrate 8 and whose one end is pressed against the electrodes 11, are held by the measurement system side pin holder (pogo pin holder) 7 on the second surface and inside the through hole opened in the pin holder 7. It is vertically fixed with a shape in which the middle part is embedded and with its upper and lower ends protruding. A spring 16 is provided at the other end (upper end) of the pogo pin 10 held by the measurement system side pin holder 7, and the elastic force of the spring 16 is used for pressing.

【0017】このように、治具の上段と下段にはポゴピ
ン9、10が多数立設され、その軸方向が揃うように配
列されている。ただし、下段の電極11の位置に対応し
て立設されたポゴピン10と、上段の被測定プリント基
板2のノード位置に対応して立設されたポゴピン9と
は、ピン間の物理的位置が互にずれて対応していないこ
とは既述した通りである。
As described above, a large number of pogo pins 9 and 10 are erected on the upper and lower stages of the jig and arranged so that their axial directions are aligned. However, the pogo pins 10 erected corresponding to the positions of the electrodes 11 on the lower stage and the pogo pins 9 erected corresponding to the node positions of the measured printed circuit board 2 on the upper stage have a physical position between the pins. As described above, they do not correspond to each other.

【0018】このような上段と下段との間、すなわち被
測定系側ピンホルダ4に保持されたポゴピン9と、測定
系側ピンホルダ7に保持されたポゴピン10との間に、
これらの対応ピン間を接続するための中継基板6が設け
られている。この中継基板6には、相互に接続したい対
応ピン間を電気的に接続する配線18が形成されてお
り、この配線18に被測定系側ポゴピン9及び測定系側
ポゴピン10の他端がそれぞれ押し当てられたとき、接
続されるべきポゴピン間は配線18を介して電気的につ
ながるようになっている。なお、中継基板5には、その
表面または裏面に必要に応じて中継基板6を補強する補
強板5を当てがう。
Between such an upper stage and a lower stage, that is, between the pogo pin 9 held by the pin holder 4 to be measured and the pogo pin 10 held by the pin holder 7 on the measuring system,
A relay board 6 is provided to connect these corresponding pins. Wirings 18 are formed on the relay board 6 to electrically connect corresponding pins that are desired to be connected to each other, and the other ends of the measured system side pogo pin 9 and the measured system side pogo pin 10 are pressed against the wirings 18, respectively. When applied, the pogo pins to be connected are electrically connected via the wiring 18. A reinforcing plate 5 for reinforcing the relay board 6 is applied to the front surface or the back surface of the relay board 5, if necessary.

【0019】さて、上記のような構成において、治具の
上段と下段とを上下から押しつけるか、上段を下段に押
しつけるかすると、上段ではポゴピン9の一端(上端)
がそのバネ15により被測定波プリント基板2の裏面の
ノードに押し付けられて電気的に接続される。また、下
段ではポゴピン10の一端(下端)がそのバネ16で電
極基板8の電極11の表面に押し付けられて電気的に接
続される。そして、中段ではポゴピン9の他端(下端)
がそのバネ15で中継基板6の配線18の表面側に押し
付けられるとともに、ポゴピン10の他端(上端)がそ
のバネ16で中継基板6の配線18の裏面側に押し付け
られて、ポゴピン間は電気的に接続される。このよう
に、本実施例では、被測定プリント基板2に応じた配線
18をもつ中継基板6を予め用意しておけば、ワイヤラ
ッピング作業なしに接続したいポゴピン間を押し付けに
より電気的に接続できる。
Now, in the above structure, if the upper and lower stages of the jig are pressed from above or below or the upper stage is pressed to the lower stage, one end (upper end) of the pogo pin 9 is in the upper stage.
Is pressed against the node on the back surface of the measured wave printed circuit board 2 by the spring 15 to be electrically connected. In the lower stage, one end (lower end) of the pogo pin 10 is pressed against the surface of the electrode 11 of the electrode substrate 8 by the spring 16 to be electrically connected. And, in the middle stage, the other end (lower end) of the pogo pin 9
Is pressed against the front surface side of the wiring 18 of the relay board 6 by the spring 15, and the other end (upper end) of the pogo pin 10 is pressed against the back surface side of the wiring 18 of the relay board 6 by the spring 16 to electrically connect the pogo pins. Connected to each other. As described above, in this embodiment, if the relay board 6 having the wiring 18 corresponding to the printed circuit board 2 to be measured is prepared in advance, the pogo pins to be connected can be electrically connected by pressing without wire wrapping work.

【0020】ところで、配線18を形成した中継基板6
の作製は、次のように行う。中継基板6の何処にポゴピ
ン9あるいは10を立てるかは、被測定プリント基板2
のノードに基づいて作られた被測定系側ピンホルダ4を
設計したときのCADデータ及び、電極11の位置に対
応して予め決められている測定系ピンホルダを設計した
ときのCADデータにより既知であるから、そのデータ
にもとづいて配線を設計することができる。作製された
中継基板6は、素子や部品等一切実装されていない配線
のみからなる専用基板であるから、非常に安価に製造で
きる。この場合、特に公知の自動配線システム、すなわ
ちオートルータを使うことができる。中継基板6上に求
められる配線数は、通常の被測定対象となるようなプリ
ント基板に比して少なく、凡そ1/10くらいで済むか
ら、オートルータによる設計製造に最適となるからであ
る。中継基板6の配線をオートルータにより自動設計す
るようにすれば、パターン設計の労力が大幅に軽減で
き、治具作製効率を一層向上させ、治具製造コストの低
減を図ることができる。
By the way, the relay board 6 on which the wiring 18 is formed
Is manufactured as follows. The position of the relay board 6 on which the pogo pins 9 or 10 are to be set depends on the printed board 2 to be measured.
It is known from the CAD data when designing the pin holder 4 to be measured, which is made on the basis of the above node, and the CAD data when designing the measurement pin holder that is predetermined corresponding to the position of the electrode 11. Therefore, the wiring can be designed based on the data. Since the produced relay board 6 is a dedicated board that is composed only of wiring on which no elements or parts are mounted, it can be manufactured at a very low cost. In this case, a particularly known automatic wiring system, that is, an automatic router can be used. This is because the number of wirings required on the relay board 6 is smaller than that of a printed circuit board that is a normal object to be measured, and is about 1/10, which is optimal for design and manufacture by an autorouter. If the wiring of the relay board 6 is automatically designed by an autorouter, the labor of pattern design can be significantly reduced, the jig manufacturing efficiency can be further improved, and the jig manufacturing cost can be reduced.

【0021】このように本実施例によれば、予め準備し
た中継基板6を介在させるだけで、上下のポゴピンをワ
イヤラッピングなしに自動接続でき、しかも中継基板の
製作が容易なので、次のような効果がある。
As described above, according to this embodiment, the upper and lower pogo pins can be automatically connected without wire wrapping simply by interposing the relay substrate 6 prepared in advance, and the relay substrate can be easily manufactured. effective.

【0022】(1)プリント基板のノード数が多くなっ
ても、上下の治具を押しつけるだけでピン間は自動的に
接続されるので、作業性が極めて良好で短時間で済み、
納期に要する期間も短くなるため、治具が非常に安価に
なる。
(1) Even if the number of nodes on the printed circuit board increases, the pins are automatically connected by pressing the upper and lower jigs, so the workability is extremely good and the time is short.
Since the time required for delivery is also short, the jig is very cheap.

【0023】(2)このように治具が安価になると、多
品種、少量化の傾向にあるプリント基板の基板価格との
バランスの適正化が図れる。
(2) When the cost of the jig becomes low in this way, it is possible to optimize the balance with the board price of the printed board, which tends to be of a large variety and small in quantity.

【0024】(3)また、中継基板の作製、及び中継基
板を介しての接続は、自動的に行えるので、接続ミス等
のトラブルがなくなり、信頼性が向上する。
(3) Further, since the production of the relay board and the connection through the relay board can be automatically performed, troubles such as connection mistakes are eliminated, and the reliability is improved.

【0025】[0025]

【発明の効果】本発明によれば、被測定系側テストピン
と測定系側テストピンとの間に、対応ピン間を電気的に
接続する配線を形成した中継基板を介設するようにした
ので、被測定系側テストピンと測定系側テストピントと
を押し当てるだけで、対応させたいテストピン間が電気
的に接続できる。従って、ワイヤラッピングによる人的
作業によっていた従来方法に比べ、接続の自動化が図れ
るため作業性が飛躍的に向上し、接続ミスもなくなるの
で信頼性も高く、しかも安価に製造できる。
According to the present invention, the relay board having the wiring for electrically connecting the corresponding pins is provided between the measured system side test pin and the measured system side test pin. By simply pressing the measured system side test pin and the measured system side test focus, the desired test pins can be electrically connected. Therefore, as compared with the conventional method in which manual work by wire wrapping is performed, the connection can be automated, so that the workability is dramatically improved, and connection mistakes are eliminated, so that the reliability is high and the manufacturing cost is low.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例によるインサーキットテスタ治
具の主要部の構成図。
FIG. 1 is a configuration diagram of a main part of an in-circuit tester jig according to an embodiment of the present invention.

【図2】従来例によるインサーキットテスタ治具の主要
部の構成図。
FIG. 2 is a configuration diagram of a main part of an in-circuit tester jig according to a conventional example.

【符号の説明】[Explanation of symbols]

1 IC(電子部品) 2 被測定プリント基板 4 被測定系側テストピンホルダ(ポゴピンホルダ) 6 中継基板 7 測定系側テストピンホルダ(ポゴピンホルダ) 8 電極基板 9 ポゴピン(被測定系側テストピン) 10 ポゴピン(測定系側テストピン) 11 電極 12 リード線 13 測定系 18 配線 1 IC (electronic component) 2 Printed board under test 4 Test pin holder under test (pogo pin holder) 6 Relay board 7 Test pin holder under test (pogo pin holder) 8 Electrode board 9 Pogo pin (test pin under test) 10 Pogo pin (measurement system side test pin) 11 Electrode 12 Lead wire 13 Measurement system 18 Wiring

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 電子部品の実装された被測定プリント基
板のノードに対応して配列され、各ノードに一端が押し
当てられるテストピンを保持する被測定系側ピンホルダ
と、 被測定プリント基板に実装された電子部品の電気的検査
を行う測定系に接続される電極基板上の電極に対応して
配列され、各電極に一端が押し当てられるテストピンを
保持する測定系側ピンホルダとを備え、 被測定系側ピンホルダに保持されたテストピンと測定系
側ピンホルダに保持されたテストピンとの間に、被測定
系側テストピン及び測定系側テストピンの他端がそれぞ
れ押し当てられて、相互接続すべき対応ピン間を電気的
に接続する配線が形成された中継基板を設けたことを特
徴とするインサーキットテスタ治具。
1. A pin holder for a system to be measured, which holds test pins arranged corresponding to nodes of a printed circuit board on which electronic components are mounted and whose one end is pressed against each node, and mounted on the printed circuit board to be measured. The measurement system side pin holder that holds the test pins that are arranged corresponding to the electrodes on the electrode substrate that is connected to the measurement system that electrically tests the electronic components The other end of the measured system side test pin and the other side of the measured system side test pin should be pressed between the test pin held by the measured system side pin holder and the measured system side pin holder, and should be interconnected. An in-circuit tester jig having a relay board on which wiring for electrically connecting corresponding pins is formed.
JP4154795A 1992-06-15 1992-06-15 In-circuit tester jig Pending JPH05346455A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4154795A JPH05346455A (en) 1992-06-15 1992-06-15 In-circuit tester jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4154795A JPH05346455A (en) 1992-06-15 1992-06-15 In-circuit tester jig

Publications (1)

Publication Number Publication Date
JPH05346455A true JPH05346455A (en) 1993-12-27

Family

ID=15592063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4154795A Pending JPH05346455A (en) 1992-06-15 1992-06-15 In-circuit tester jig

Country Status (1)

Country Link
JP (1) JPH05346455A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011149790A (en) * 2010-01-21 2011-08-04 Mitsubishi Electric Corp Substrate connection inspection apparatus
KR101462954B1 (en) * 2013-08-21 2014-11-21 대한민국 Fixture of auto test equipment for testing electronic circuit card
CN109672592A (en) * 2019-02-18 2019-04-23 深圳市菲菱科思通信技术股份有限公司 Router test fixture

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011149790A (en) * 2010-01-21 2011-08-04 Mitsubishi Electric Corp Substrate connection inspection apparatus
KR101462954B1 (en) * 2013-08-21 2014-11-21 대한민국 Fixture of auto test equipment for testing electronic circuit card
CN109672592A (en) * 2019-02-18 2019-04-23 深圳市菲菱科思通信技术股份有限公司 Router test fixture

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