JPH05339741A - Substitution tin plating method for copper material - Google Patents

Substitution tin plating method for copper material

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Publication number
JPH05339741A
JPH05339741A JP4174951A JP17495192A JPH05339741A JP H05339741 A JPH05339741 A JP H05339741A JP 4174951 A JP4174951 A JP 4174951A JP 17495192 A JP17495192 A JP 17495192A JP H05339741 A JPH05339741 A JP H05339741A
Authority
JP
Japan
Prior art keywords
plating
ion
tin
copper
substitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4174951A
Other languages
Japanese (ja)
Other versions
JP3071567B2 (en
Inventor
Junichi Ito
順一 伊藤
Tetsuo Atsumi
哲郎 渥美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Light Metal Industries Ltd
Original Assignee
Sumitomo Light Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Light Metal Industries Ltd filed Critical Sumitomo Light Metal Industries Ltd
Priority to JP4174951A priority Critical patent/JP3071567B2/en
Publication of JPH05339741A publication Critical patent/JPH05339741A/en
Application granted granted Critical
Publication of JP3071567B2 publication Critical patent/JP3071567B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To always form a uniform Sn-plating film without defects for substitution Sn plating on Cu parts by controlling the concn. ratio of Sn ion to Cu ion in the plating liquid to a specified value. CONSTITUTION:In the process of substitution Sn plating on Cu parts, Cu parts are dipped in a substitution Sn plating liquid containing dissolved tin (II) chloride, sodium cyanate, and sodium hydroxide. While plating proceeds, the concn. of Sn ion in the plating liquid decreases and the concn. of Cu ion increases by dissolution of Cu from the Cu parts, and this causes defects in plating. Therefore, concns. of Cu ion and Sn ion are always measured and controlled to keep the ratio of Cu ion conc./Sn ion concn. to <=0.7. By this method, production of defective plating film is prevented and the obtd. Sn plating film is always uniform. Moreover, excess discharge or excess supply of Sn ion can be prevented.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、銅材料の置換錫めっき
処理方法、詳しくは電子基板として用いられる銅板、給
水・給湯用配管、熱交換器用伝熱管として用いられる銅
管等に置換錫めっき処理を施す方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substitution tin plating method for copper materials, and more specifically, substitution tin plating for copper plates used as electronic substrates, water / hot water supply pipes, copper tubes used as heat exchanger tubes for heat exchangers, etc. It relates to a method of applying a treatment.

【0002】[0002]

【従来の技術】従来、電子基板用銅板あるいは配管用銅
管や伝熱管用銅管の内面に錫めっきを施して耐食性を向
上させ、さらには銅イオンの溶出を防止することが行わ
れている。このような銅材料の錫めっき処理工程では、
一度建浴しためっき浴は主要浴成分の補給を行いながら
連続的に使用されるが、浴管理は経験によるところが大
きく、一定面積をめっき処理した時点で、処理面積を目
安に所定量の主要浴成分補給が行われることが多い。ま
た、浴中の錫イオンの濃度を測定し、建浴時を基準とし
て不足分を補給することも行われている。しかしなが
ら、これらの浴管理方法では、処理面積の増加とともに
めっき厚さが低下したり、めっきムラが生じる等の問題
があった。
2. Description of the Related Art Conventionally, tin plating is applied to the inner surface of a copper plate for an electronic substrate, a copper pipe for piping, or a copper pipe for heat transfer tubes to improve corrosion resistance and prevent elution of copper ions. .. In the tin plating process of such a copper material,
The plating bath once constructed is used continuously while replenishing the main bath components, but the experience of bath management is largely dependent on the fact that when a certain area is plated, a predetermined amount of the main bath is used as a guide for the treated area. Ingredients are often replenished. In addition, the concentration of tin ions in the bath is measured and the shortage is replenished on the basis of the time of building the bath. However, these bath management methods have problems such as a decrease in plating thickness and an increase in plating unevenness as the treated area increases.

【0003】[0003]

【発明が解決しようとする課題】発明者等は錫めっき処
理における不良発生とめっき浴組成との関連性について
研究を重ねた結果、めっき不良が発生した時のめっき浴
中には多量の銅イオンが検出され、めっき不良が発生し
易いめっき浴中では錫イオン濃度と銅イオン濃度が接近
していることを発見し、さらに究明した結果、置換錫め
っきは、錫イオンと銅イオンとの置換反応により進行す
るが、置換反応の駆動力となる浴中での両イオンの電位
差は、両イオンの浴中での活量の違いによってもたらさ
れるから、浴管理には錫イオン濃度と銅イオン濃度の相
対的な管理が必要なことを見い出した。
As a result of repeated studies on the relationship between the occurrence of defects in tin plating and the composition of the plating bath, the inventors have found that when a plating defect occurs, a large amount of copper ions are present in the plating bath. It was discovered that the tin ion concentration and the copper ion concentration were close to each other in the plating bath where the plating failure was likely to occur, and as a result of further investigation, the substitution tin plating showed that the substitution reaction of tin ion and copper ion However, the potential difference between the two ions in the bath, which is the driving force for the substitution reaction, is brought about by the difference in the activity of both ions in the bath. We have found that relative management is needed.

【0004】本発明は、上記研究の成果に基づいて開発
されたもので、その目的は、常に欠陥のない均一なめっ
き皮膜が得られ、過剰なめっき液の排出や過剰な薬液の
補給を防止できる浴管理を行う銅材料の錫めっき処理方
法を提供することにある。
The present invention was developed based on the results of the above research, and its purpose is to always obtain a uniform plating film without defects and prevent the discharge of excessive plating solution and the replenishment of excessive chemical solution. (EN) It is possible to provide a tin plating treatment method for a copper material, which is capable of bath management.

【0005】[0005]

【課題を解決するための手段】上記の目的を達成するた
めの本発明による銅材料の錫めっき処理方法は、銅材料
に置換錫めっきする方法において、めっき浴の管理を浴
中の錫イオンと銅イオンとの濃度比に基づいて行い、好
ましくはめっき浴中の錫イオン濃度と銅イオン濃度の
比、銅イオン濃度/錫イオン濃度を0.7以下の範囲内
に管理することにより、均一なめっき皮膜を得ることを
特徴とする。
The tin plating treatment method for a copper material according to the present invention for achieving the above object is a method of performing displacement tin plating on a copper material, wherein the plating bath is controlled by tin ions in the bath. It is carried out based on the concentration ratio with copper ions, preferably by controlling the ratio of the tin ion concentration to the copper ion concentration in the plating bath and the copper ion concentration / tin ion concentration within the range of 0.7 or less Characterized by obtaining a plating film.

【0006】置換錫めっきは、錫イオンと銅イオンとの
置換反応により進行するが、置換反応の駆動力となる浴
中での両イオンの電位差は、それぞれの活量すなわち濃
度に最も影響されるから、銅材料のめっき処理工程にお
いて、欠陥のない均一なめっき皮膜を得るには、錫イオ
ンと銅イオンの濃度比に基づいて浴管理を行えばよい。
好ましくはめっき浴中の錫イオン濃度と銅イオン濃度と
の比、銅イオン濃度/錫イオン濃度を0.7以下の範囲
内に管理する。浴中の銅イオン濃度/錫イオン濃度の比
が0.7を越えると、置換反応速度が低下し、めっきム
ラが生じ易くなり、析出速度がおそくなる。なお、置換
めっき液には銅イオンと錯体を形成する錯体形成剤が添
加されることがあるが、多くの実験から、その濃度は錫
めっきの反応に実用上影響しないことが確認された。
Substitution tin plating proceeds by a substitution reaction between tin ions and copper ions, and the potential difference between the two ions in the bath, which is the driving force for the substitution reaction, is most affected by the activity or concentration of each. Therefore, in order to obtain a uniform plating film having no defects in the copper material plating treatment step, bath management may be performed based on the concentration ratio of tin ions and copper ions.
Preferably, the ratio of the tin ion concentration to the copper ion concentration in the plating bath and the copper ion concentration / tin ion concentration are controlled within the range of 0.7 or less. When the ratio of copper ion concentration / tin ion concentration in the bath exceeds 0.7, the substitution reaction rate decreases, uneven plating is likely to occur, and the deposition rate becomes slow. In addition, although a complex forming agent that forms a complex with copper ions may be added to the displacement plating solution, many experiments have confirmed that the concentration does not practically affect the tin plating reaction.

【0007】[0007]

【作用】本発明においては、錫めっきを進行させる錫イ
オンと銅イオンの置換反応の駆動力となる浴中の両イオ
ンの電位差が、両イオンの濃度比を所定の範囲に保つこ
とによって常時正しく調整されるから、めっき皮膜の析
出速度は一定となり、均一かつ有効なめっき皮膜が形成
されることになる。
In the present invention, the potential difference between the two ions in the bath, which is the driving force for the tin ion-copper ion substitution reaction that promotes tin plating, is always correct by keeping the concentration ratio of both ions within a predetermined range. Since it is adjusted, the deposition rate of the plating film becomes constant, and a uniform and effective plating film is formed.

【0008】[0008]

【実施例】以下、本発明の実施例を比較例と対比して説
明する。 実施例1 塩化第一錫18.8g/l 、シアン化ナトリウム188g/l、水酸
化ナトリウム22.5g/lからなる置換めっき液( 錫濃度9.9
g/l) を用い、銅イオン濃度/錫イオン濃度の比を変え
て、りん脱酸銅板(JIS H3100 C1220, 寸法:0.5mm厚さ×
50mm幅×100mm長さ) を被めっき体とし、硫酸、硝酸の
混合液で表面を活性化した後、置換錫めっきを行った。
めっき浴中の銅イオン濃度/錫イオン濃度の比は、硫酸
銅を添加することによって変化させ、めっき処理は、メ
ッキ浴温度333K、液量2l、浸漬時間10分の条件で実施し
た。めっき処理後、めっきムラの有無を目視で観察する
とともに、めっき皮膜を溶解してその質量差を測定する
ことによって膜厚を算出した。また、めっき処理した銅
板を水道水に24時間浸漬して銅イオン溶出量を測定し
た。めっき浴中の銅イオン濃度/ 錫イオン濃度の比とめ
っき皮膜評価結果並びに膜厚測定結果の関連性を表1に
示す。表1より、銅イオン濃度/錫イオン濃度の比が
0.7以下の場合は、メッキ厚が一定で、めっきムラが
無く、銅イオンの溶出も少ないことが認められた。
EXAMPLES Examples of the present invention will be described below in comparison with comparative examples. Example 1 A displacement plating solution containing stannous chloride 18.8 g / l, sodium cyanide 188 g / l, and sodium hydroxide 22.5 g / l (tin concentration 9.9
g / l) and changing the copper ion concentration / tin ion concentration ratio to obtain phosphorous deoxidized copper plate (JIS H3100 C1220, dimensions: 0.5 mm thickness x
(50 mm width × 100 mm length) was used as the object to be plated, the surface was activated with a mixed solution of sulfuric acid and nitric acid, and then substitutional tin plating was performed.
The ratio of copper ion concentration / tin ion concentration in the plating bath was changed by adding copper sulfate, and the plating treatment was carried out under the conditions of a plating bath temperature of 333 K, a liquid volume of 2 l, and an immersion time of 10 minutes. After the plating treatment, the presence or absence of plating unevenness was visually observed, and the film thickness was calculated by melting the plating film and measuring the mass difference. Further, the plated copper plate was immersed in tap water for 24 hours to measure the amount of copper ion elution. Table 1 shows the relationship between the copper ion concentration / tin ion concentration ratio in the plating bath and the plating film evaluation results and film thickness measurement results. From Table 1, it was confirmed that when the ratio of copper ion concentration / tin ion concentration was 0.7 or less, the plating thickness was constant, there was no plating unevenness, and the elution of copper ions was small.

【0009】比較例1 実施例1と同じ置換錫めっき液を用い、実施例1と同じ
材質、寸法のりん脱酸銅板を被めっき体として、めっき
浴中の銅イオン濃度/錫イオン濃度の比を0.8および1.2
に変え、実施例1と同様な条件で置換錫めっきを行
い、めっき処理後、実施例1と同様のめっき皮膜評価お
よび膜厚測定を行った。結果を表2に示す。表2にみら
れるように、めっき浴中の銅イオン濃度/錫イオン濃度
の比が0.7を越える場合はめっきムラが生じ、膜厚が
変動した。
Comparative Example 1 Using the same substitution tin plating solution as in Example 1, a phosphorous deoxidized copper plate having the same material and size as in Example 1 was used as the object to be plated, and the ratio of copper ion concentration / tin ion concentration in the plating bath was To 0.8 and 1.2
Substitution tin plating was performed under the same conditions as in Example 1, and after the plating treatment, the same plating film evaluation and film thickness measurement as in Example 1 were performed. The results are shown in Table 2. As seen in Table 2, when the copper ion concentration / tin ion concentration ratio in the plating bath exceeds 0.7, plating unevenness occurred and the film thickness varied.

【0010】[0010]

【表1】 [Table 1]

【0011】実施例2 塩化第一錫6g/l、チオ尿素55g/l 、酒石酸39g/l からな
る置換めっき液( 錫濃度3.2g/l) を用い、りん脱酸銅管
( JIS H3300 C1220,寸法: 外径22.22mm ×厚さ0.81mm×
長さ300mm)を被めっき体として、硫酸、硝酸の混合液で
表面を活性化後、銅管の内面に置換錫めっき処理を行っ
た。めっき浴中の銅イオン濃度/錫イオン濃度の比は硫
酸銅を添加させることによって変化させ、めっき処理は
めっき浴温度333K、液量20l 、循環通水時間10分の条件
で実施した。錫めっき処理後、めっき皮膜のムラ発生の
有無を目視で観察するとともに、皮膜を溶解してその質
量差を測定することによって膜厚を算出した。また、メ
ッキ処理した銅管中に水道水を24時間充填し銅イオン溶
出量を測定した。さらに、耐孔食性を調べるために、温
度60℃、pH7 、SO4 2 - /HCO3 - =1.67 、Cl- 10ppm 、R-
Cl0.5 〜2.0ppmの水中に40日間浸漬した。めっき皮膜評
価結果および膜厚測定結果を表2に示す。表2に示され
るように、めっき浴中の銅イオン濃度/錫イオン濃度の
比が0.7以下の場合はめっきムラが無く、膜厚が一定
であり、耐孔食性も優れていた。
Example 2 A phosphorus-deoxidized copper tube was used using a displacement plating solution (tin concentration: 3.2 g / l) consisting of stannous chloride 6 g / l, thiourea 55 g / l and tartaric acid 39 g / l.
(JIS H3300 C1220, dimensions: outside diameter 22.22mm × thickness 0.81mm ×
The surface of the copper tube was activated with a mixed solution of sulfuric acid and nitric acid, and the inner surface of the copper tube was subjected to substitution tin plating. The copper ion concentration / tin ion concentration ratio in the plating bath was changed by adding copper sulfate, and the plating treatment was carried out under the conditions of a plating bath temperature of 333 K, a liquid volume of 20 l, and a circulating water passage time of 10 minutes. After the tin plating treatment, the film thickness was calculated by visually observing the occurrence of unevenness in the plating film and melting the film and measuring the mass difference. Further, tap water was filled in the plated copper pipe for 24 hours, and the amount of eluted copper ions was measured. Furthermore, in order to examine the pitting corrosion resistance, temperature 60 ℃, pH7, SO 4 2 - / HCO 3 - = 1.67, Cl - 10ppm, R-
It was immersed in water containing Cl 0.5 to 2.0 ppm for 40 days. Table 2 shows the plating film evaluation results and the film thickness measurement results. As shown in Table 2, when the copper ion concentration / tin ion concentration ratio in the plating bath was 0.7 or less, there was no plating unevenness, the film thickness was constant, and pitting corrosion resistance was excellent.

【0012】比較例2 実施例2と同じ置換錫めっき液を用い、実施例2と同じ
材質、寸法のりん脱酸銅管をめっき体として、めっき浴
中の銅イオン濃度/錫イオン濃度の比を0.9 および1.1
に変え、実施例2と同様の条件で置換錫めっき処理を行
い、めっき処理後の銅管について、実施例2と同様のめ
っき皮膜評価および膜厚測定を行った。結果は表2にみ
られるように、めっきムラが生じ、膜厚変動は大きく、
耐孔食性も劣っていた。
Comparative Example 2 Using the same substitution tin plating solution as in Example 2, and using a phosphorous deoxidized copper tube of the same material and size as in Example 2 as a plated body, the ratio of copper ion concentration / tin ion concentration in the plating bath was set. To 0.9 and 1.1
Substitution tin plating treatment was carried out under the same conditions as in Example 2, and the copper film after the plating treatment was subjected to the same plating film evaluation and film thickness measurement as in Example 2. As shown in Table 2, the results show uneven plating, large variation in film thickness,
The pitting corrosion resistance was also poor.

【0013】[0013]

【表2】 〔表注〕1.外観評価 ○:めっきムラ有り ×:めっ
きムラ無し 2.耐孔食性(最大腐食深さ)◎:30μm 以下 ○:30
〜50μm △:50 〜100 μm ×:100μm 以上
[Table 2] [Table Note] 1. Appearance evaluation ○: With plating unevenness ×: Without plating unevenness 2. Pitting corrosion resistance (maximum corrosion depth) ◎: 30 μm or less ○: 30
〜50μm △: 50〜100μm ×: 100μm or more

【0014】[0014]

【発明の効果】以上のとおり、本発明に従えば、常に欠
陥の無い有効なめっき皮膜が得られ、めっき浴からの過
剰なめっき液の排出やめっき浴への過剰な薬液の補給を
防止できる。また、薬液の補給の頻度も低減することが
できる。
As described above, according to the present invention, an effective plating film having no defects can always be obtained, and it is possible to prevent the discharge of the excessive plating solution from the plating bath and the replenishment of the excessive chemical solution to the plating bath. .. Moreover, the frequency of replenishment of the chemical liquid can be reduced.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 銅材料に置換錫めっきする方法におい
て、めっき浴の管理を浴中の錫イオンと銅イオンの濃度
比に基づいて行うことにより均一なめっき皮膜を形成す
ることを特徴とする銅材料の置換錫めっき処理方法。
1. A method for performing substitutional tin plating on a copper material, characterized in that a uniform plating film is formed by controlling the plating bath based on the concentration ratio of tin ions and copper ions in the bath. Substitution tin plating method of material.
【請求項2】 めっき浴中の錫イオンと銅イオンの濃度
比、銅イオン濃度/錫イオン濃度を0.7以下の範囲内
に管理する請求項1記載の銅材料の置換錫めっき処理方
法。
2. The substitution tin plating method for a copper material according to claim 1, wherein the concentration ratio of tin ions and copper ions in the plating bath and the copper ion concentration / tin ion concentration are controlled within a range of 0.7 or less.
JP4174951A 1992-06-09 1992-06-09 Substitution tin plating method for copper material Expired - Fee Related JP3071567B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4174951A JP3071567B2 (en) 1992-06-09 1992-06-09 Substitution tin plating method for copper material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4174951A JP3071567B2 (en) 1992-06-09 1992-06-09 Substitution tin plating method for copper material

Publications (2)

Publication Number Publication Date
JPH05339741A true JPH05339741A (en) 1993-12-21
JP3071567B2 JP3071567B2 (en) 2000-07-31

Family

ID=15987589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4174951A Expired - Fee Related JP3071567B2 (en) 1992-06-09 1992-06-09 Substitution tin plating method for copper material

Country Status (1)

Country Link
JP (1) JP3071567B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997046732A1 (en) * 1996-06-05 1997-12-11 Sumitomo Light Metal Industries, Ltd. Internally tin-plated copper pipe manufacturing method
JP2002317275A (en) * 2001-04-17 2002-10-31 Toto Ltd Method for elongating service life of electroless tinning solution

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997046732A1 (en) * 1996-06-05 1997-12-11 Sumitomo Light Metal Industries, Ltd. Internally tin-plated copper pipe manufacturing method
US6045860A (en) * 1996-06-05 2000-04-04 Sumitomo Light Metal Industries, Ltd. Process for manufacturing interior tinned copper tube
JP2002317275A (en) * 2001-04-17 2002-10-31 Toto Ltd Method for elongating service life of electroless tinning solution

Also Published As

Publication number Publication date
JP3071567B2 (en) 2000-07-31

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