JPH05335194A - Manufacture of electronic component - Google Patents

Manufacture of electronic component

Info

Publication number
JPH05335194A
JPH05335194A JP14281992A JP14281992A JPH05335194A JP H05335194 A JPH05335194 A JP H05335194A JP 14281992 A JP14281992 A JP 14281992A JP 14281992 A JP14281992 A JP 14281992A JP H05335194 A JPH05335194 A JP H05335194A
Authority
JP
Japan
Prior art keywords
electrode
mother
mother substrate
partial
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14281992A
Other languages
Japanese (ja)
Other versions
JP2976698B2 (en
Inventor
Tadashi Tsukamoto
正 塚本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP14281992A priority Critical patent/JP2976698B2/en
Publication of JPH05335194A publication Critical patent/JPH05335194A/en
Application granted granted Critical
Publication of JP2976698B2 publication Critical patent/JP2976698B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To provide an electronic component manufacturing method, where cutting reference dimensions can be determined without actually cutting a mother substrate so as to enhance a dicer in operating efficiency when many electronic components are cut out of the mother substrate. CONSTITUTION:A full-face electrode 8 is formed on one side of a mother substrate 5, partial electrodes 6a to 6d different in area and a mother electrode 7 are formed on the other side, a voltage is applied between the partial electrodes 6a to 6d and the full-face electrode 8 to measure electrical properties, a partial electrode where required properties are displayed is selected, a part of the mother substrate 5 where the mother electrode 7 and the full-face electrode 8 opposed to each other is cut out corresponding to the side of the partial electrode concerned to obtain a separate electronic component.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、マザー基板から多数の
電子部品を切り出す工程を備える電子部品の製造方法に
関し、特に、個々の電子部品を切り出す寸法を決定する
工程が改良された電子部品の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an electronic component including a step of cutting out a large number of electronic components from a mother board, and more particularly, to an electronic component improved in the step of determining the dimensions for cutting out the individual electronic components. It relates to a manufacturing method.

【0002】[0002]

【従来の技術】コンデンサ等の電子部品では、マザー基
板上において多数の電子部品を構成し、該マザー基板を
個々の電子部品単位に切り出すことにより、電子部品が
量産されている。このような電子部品の製造方法の一例
を、高周波用チップ型コンデンサを例にとり、図2を参
照して説明する。まず、図2(a)に示すように、誘電
体材料よりなるマザー基板1の上面及び下面に、それぞ
れ、全面電極2,3をスクリーン印刷等より形成する。
次に、上記マザー基板1を、切断装置としてのダイサー
にセットし、図2(b)に示すようにあらかじめ設定し
た基準寸法に従って複数個のコンデンサ・チップ4a〜
4fを切り出す。この際、コンデンサ・チップ4a〜4
fは、それぞれ、図2(b)の矢印xの方向の寸法が異
なるように切り出される。そして、各コンデンサ・チッ
プ4a〜4fの静電容量を測定し、目的とする容量に一
番近いコンデンサ・チップを選び出し、そのコンデンサ
・チップの矢印X方向の寸法に合わせて、上記マザー基
板1の矢印Xと直交する方向における切断寸法を決定
し、残りのマザー基板1を該寸法に従って切断し、多数
のチップ型コンデンサを得ていた。
2. Description of the Related Art In electronic parts such as capacitors, a large number of electronic parts are formed on a mother board and the mother board is cut into individual electronic parts to mass-produce the electronic parts. An example of a method of manufacturing such an electronic component will be described with reference to FIG. 2 by taking a high frequency chip type capacitor as an example. First, as shown in FIG. 2A, full-surface electrodes 2 and 3 are formed on the upper surface and the lower surface of the mother substrate 1 made of a dielectric material by screen printing or the like.
Next, the mother board 1 is set on a dicer as a cutting device, and a plurality of capacitor chips 4a to 4a to 4c are attached according to preset reference dimensions as shown in FIG. 2B.
Cut out 4f. At this time, the capacitor chips 4a-4
f is cut out so that the dimensions in the direction of arrow x in FIG. 2B are different. Then, the capacitance of each of the capacitor chips 4a to 4f is measured, the capacitor chip closest to the target capacitance is selected, and the size of the mother chip 1 of the mother board 1 is adjusted according to the dimension of the capacitor chip in the arrow X direction. The cutting dimension in the direction orthogonal to the arrow X was determined, and the remaining mother substrate 1 was cut according to the dimension to obtain a large number of chip capacitors.

【0003】[0003]

【発明が解決しようとする課題】上記のように、従来の
電子部品の製造方法では、マザー基板1をダイサーにセ
ットした後、上記コンデンサ・チップ4a〜4fを切り
出し、静電容量を測定するという一連の工程の間、ダイ
サーの動作が停止されている。従って、多数の電子部品
を量産するにあたり、上記コンデンサ・チップ4a〜4
fの切り出し及び静電容量の測定を行なうのに必要な時
間の分だけ、ダイサーの稼働効率が低下するという問題
があった。
As described above, in the conventional method of manufacturing an electronic component, after setting the mother substrate 1 on the dicer, the capacitor chips 4a to 4f are cut out and the capacitance is measured. The operation of the dicer is stopped during the series of steps. Therefore, when mass-producing a large number of electronic parts, the capacitor chips 4a-4
There is a problem that the operating efficiency of the dicer is reduced by the time required to cut out f and measure the electrostatic capacitance.

【0004】本発明の目的は、マザー基板から多数の電
子部品を切り出すに際し、ダイサーの稼働効率を高める
ことができ、従って電子部品の量産性を高め得る製造方
法を提供することにある。
An object of the present invention is to provide a manufacturing method capable of increasing the operating efficiency of a dicer when cutting out a large number of electronic components from a mother board, and thus enhancing the mass productivity of electronic components.

【0005】[0005]

【課題を解決するための手段】本発明は、マザー基板か
ら多数の電子部品を切り出して個々の電子部品を得る方
法であって、一方面に全面電極が形成されており、他方
面に、目的とする素子の電極面積に応じて面積が異なら
された複数種の部分電極と、マザー電極とが形成された
マザー基板を用意し、前記複数の部分電極のそれぞれと
全面電極との間に電圧を印加し、各部分電極と全面電極
との対向している各部分の電気的性能を測定し、目的と
する性能の部分電極の寸法に応じて、上記マザー電極と
全面電極とが対向されているマザー基板部分を切断し、
個々の電子部品を得ることを特徴とする、電子部品の製
造方法である。
SUMMARY OF THE INVENTION The present invention is a method for cutting out a large number of electronic components from a mother substrate to obtain individual electronic components, in which a full-scale electrode is formed on one side and an object is formed on the other side. A plurality of partial electrodes having different areas according to the electrode area of the element and a mother substrate on which a mother electrode is formed are prepared, and a voltage is applied between each of the plurality of partial electrodes and the entire surface electrode. Apply the voltage and measure the electrical performance of each part where each partial electrode and the whole surface electrode face each other, and the mother electrode and the whole surface electrode face each other according to the dimension of the partial electrode having the desired performance. Cut the mother board part,
It is a method of manufacturing an electronic component, which is characterized by obtaining individual electronic components.

【0006】[0006]

【作用】本発明では、マザー基板から個々の電子部品を
得るためにマザー基板を切断する寸法の決定が、上記マ
ザー基板に形成された部分電極と全面電極との間に電圧
を印加して、各部分電極と全面電極との対向している部
分の電気的性能を測定することにより行われる。すなわ
ち、マザー基板を最終的に切断するための寸法の決定
が、マザー基板を切断することなく行われ得る。よっ
て、上記切断寸法の決定に際しての電気的性能測定作業
を、ダイサーにマザー基板を設定する前に行うことがで
きるため、ダイサーでは最終的なマザー基板の切断工程
のみを行えばよい。よって、ダイサーの稼働効率を効果
的に高めることが可能となる。
According to the present invention, the size of the mother substrate to be cut to obtain individual electronic components from the mother substrate is determined by applying a voltage between the partial electrode and the full surface electrode formed on the mother substrate, This is performed by measuring the electrical performance of the facing portion of each partial electrode and the entire surface electrode. That is, the dimensions for finally cutting the mother substrate can be determined without cutting the mother substrate. Therefore, since the electrical performance measuring operation for determining the cutting dimension can be performed before setting the mother substrate in the dicer, the dicer only needs to perform the final cutting process of the mother substrate. Therefore, the operating efficiency of the dicer can be effectively increased.

【0007】[0007]

【実施例の説明】以下、図面を参照しつつ、本発明の一
実施例を説明することにより本発明を明らかにする。本
実施例では、まず、図1に示すマザー基板5を用意す
る。マザー基板5の上面には、端線5a近傍の細長い領
域5b内に、複数の部分電極6a〜6dが形成されてい
る。部分電極6a〜6dは、図示の矢印X方向の寸法が
異ならされており、他方、X方向と直交する方向の寸法
が一定とされた矩形の形状に構成されている。また、細
長い領域5bを除いた残りの全領域にはマザー電極7が
形成されている。他方、マザー基板5の下面には全面電
極8が形成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be clarified by describing one embodiment of the present invention with reference to the drawings. In this embodiment, first, the mother substrate 5 shown in FIG. 1 is prepared. On the upper surface of the mother substrate 5, a plurality of partial electrodes 6a to 6d are formed in an elongated region 5b near the end line 5a. The partial electrodes 6a to 6d have different dimensions in the arrow X direction shown in the drawing, and are configured in a rectangular shape in which the dimensions in the direction orthogonal to the X direction are constant. Further, the mother electrode 7 is formed in the entire remaining area except the elongated area 5b. On the other hand, the whole surface electrode 8 is formed on the lower surface of the mother substrate 5.

【0008】なお、上記部分電極6a〜6d、マザー電
極7及び全面電極8は、スクリーン印刷等の適宜の方法
により形成され得る。次に、上記マザー基板5におい
て、部分電極6a〜6dのそれぞれと、全面電極8との
間に電圧を印加し、各部分電極6a〜6dと全面電極8
とが対向している部分の静電容量を測定する。この測定
結果に基づき、目的とする静電容量に一番近い部分の部
分電極を選択し、該部分電極のX方向の長さ寸法をマザ
ー基板5の切断寸法として採用する。
The partial electrodes 6a to 6d, the mother electrode 7 and the whole surface electrode 8 can be formed by an appropriate method such as screen printing. Next, in the mother substrate 5, a voltage is applied between each of the partial electrodes 6a to 6d and the whole surface electrode 8 to make each of the partial electrodes 6a to 6d and the whole surface electrode 8
Measure the capacitance of the part where and are facing each other. Based on this measurement result, the partial electrode closest to the target capacitance is selected, and the length dimension of the partial electrode in the X direction is adopted as the cutting dimension of the mother substrate 5.

【0009】次に、上記マザー基板5をダイサー等の切
断装置にセットし、上記のようにして選択された切断寸
法に従って、マザー基板5を、矢印X方向と直交する方
向に切断し、X方向については上記部分電極6a〜6d
の幅(矢印×方向と直交する方向の長さ)と等しい寸法
で切断することにより、目的とする静電容量のチップ型
コンデンサを多数得ることができる。上記のように、部
分電極6a〜6dは、目的とする容量に一番近い容量を
取得し得るX方向寸法を決定するために形成されている
ものであるため、通常、目的とする静電容量を得るため
の寸法を中心として、該寸法よりも短いものから長いも
のまで複数種類形成されることが必要である。
Next, the mother board 5 is set in a cutting device such as a dicer, and the mother board 5 is cut in the direction orthogonal to the arrow X direction according to the cutting dimension selected as described above, and the X direction is cut. For the above-mentioned partial electrodes 6a to 6d
By cutting with a size equal to the width (length in the direction orthogonal to the arrow x direction), a large number of chip-type capacitors having a desired capacitance can be obtained. As described above, since the partial electrodes 6a to 6d are formed in order to determine the dimension in the X direction that can obtain the capacitance closest to the target capacitance, the target capacitance is usually set. It is necessary to form a plurality of types from a dimension shorter than the dimension to a dimension longer than the dimension for obtaining the dimension.

【0010】また、図示の実施例では、上記部分電極6
a〜6dは、X方向の寸法のみが異ならされていたが、
X方向と直交する方向の寸法が異ならされている部分電
極を複数形成してもよい。さらに、上記実施例は、チッ
プ型コンデンサを得るための方法に適用したものである
が、本発明は、基板を介して電極が対向されておりかつ
対向されている両電極間で電気的な性能を引き出す電子
部品の製造方法一般に適用することができ、例えば圧電
共振子等の他の電子部品の製造方法にも適用することが
できる。
In the illustrated embodiment, the partial electrode 6 is
Although a to 6d are different only in the dimension in the X direction,
A plurality of partial electrodes having different dimensions in the direction orthogonal to the X direction may be formed. Further, although the above-mentioned embodiment is applied to the method for obtaining the chip type capacitor, the present invention is such that the electrodes are opposed to each other via the substrate and the electrical performance between the opposed electrodes is improved. The present invention can be generally applied to a method of manufacturing an electronic component that draws out the electric field, and can also be applied to a method of manufacturing another electronic component such as a piezoelectric resonator.

【0011】[0011]

【発明の効果】以上のように、本発明では、マザー基板
を切断することなく、複数の部分電極のそれぞれと全面
電極との間で電気的な性能を測定することにより、マザ
ー基板を切断するための基準寸法が決定される。従っ
て、該マザー基板を切断する基準寸法を決定した後にマ
ザー基板をダイサーにセットしてマザー基板の切断工程
を実施し得るため、ダイサーの稼働効率を、ひいては電
子部品の量産性を飛躍的に高めることが可能となる。
As described above, in the present invention, the mother substrate is cut by measuring the electrical performance between each of the plurality of partial electrodes and the entire surface electrode without cutting the mother substrate. A reference dimension for is determined. Therefore, since the mother substrate can be set in the dicer and the mother substrate cutting process can be performed after the reference dimension for cutting the mother substrate is determined, the operating efficiency of the dicer and thus the mass productivity of electronic components are dramatically improved. It becomes possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の電子部品の製造方法を説明
するための斜視図。
FIG. 1 is a perspective view for explaining a method of manufacturing an electronic component according to an embodiment of the present invention.

【図2】(a)及び(b)は、従来の電子部品の製造方
法を説明するための各斜視図。
2A and 2B are perspective views for explaining a conventional method for manufacturing an electronic component.

【符号の簡単な説明】[Simple explanation of symbols]

5…マザー基板 6a〜6d…部分電極 7…マザー電極 8…全面電極 5 ... Mother substrate 6a-6d ... Partial electrode 7 ... Mother electrode 8 ... Full surface electrode

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 一方面に全面電極が形成されており、他
方面に、目的とする電子部品の電極面積に応じて面積が
異ならされた複数種の部分電極と、マザー電極とが形成
されたマザー基板を用意し、 前記複数の部分電極のそれぞれと全面電極との間に電圧
を印加し、各部分電極と全面電極との対向している各部
分の電気的性能を測定し、目的とする性能の部分電極の
寸法に従って、上記マザー電極と全面電極とが対向され
ているマザー基板部分を切断し、個々の電子部品を得る
ことを特徴とする、電子部品の製造方法。
1. A full-scale electrode is formed on one surface, and a plurality of types of partial electrodes having different areas according to the electrode area of a target electronic component, and a mother electrode are formed on the other surface. A mother substrate is prepared, a voltage is applied between each of the plurality of partial electrodes and the full-scale electrode, and the electrical performance of each of the facing portions of each partial electrode and the full-scale electrode is measured to obtain the objective. A method for manufacturing an electronic component, characterized in that an individual electronic component is obtained by cutting a mother substrate portion where the mother electrode and the entire surface electrode face each other according to the dimension of the partial electrode having the performance.
JP14281992A 1992-06-03 1992-06-03 Electronic component manufacturing method Expired - Fee Related JP2976698B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14281992A JP2976698B2 (en) 1992-06-03 1992-06-03 Electronic component manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14281992A JP2976698B2 (en) 1992-06-03 1992-06-03 Electronic component manufacturing method

Publications (2)

Publication Number Publication Date
JPH05335194A true JPH05335194A (en) 1993-12-17
JP2976698B2 JP2976698B2 (en) 1999-11-10

Family

ID=15324367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14281992A Expired - Fee Related JP2976698B2 (en) 1992-06-03 1992-06-03 Electronic component manufacturing method

Country Status (1)

Country Link
JP (1) JP2976698B2 (en)

Also Published As

Publication number Publication date
JP2976698B2 (en) 1999-11-10

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