JPH0531735B2 - - Google Patents
Info
- Publication number
- JPH0531735B2 JPH0531735B2 JP2630084A JP2630084A JPH0531735B2 JP H0531735 B2 JPH0531735 B2 JP H0531735B2 JP 2630084 A JP2630084 A JP 2630084A JP 2630084 A JP2630084 A JP 2630084A JP H0531735 B2 JPH0531735 B2 JP H0531735B2
- Authority
- JP
- Japan
- Prior art keywords
- optical fiber
- scattered light
- measured
- angle
- scattering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000013307 optical fiber Substances 0.000 claims description 75
- 238000009826 distribution Methods 0.000 description 19
- 238000005259 measurement Methods 0.000 description 18
- 238000000034 method Methods 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000005253 cladding Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000000149 argon plasma sintering Methods 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 3
- 239000000835 fiber Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012681 fiber drawing Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- PGAPATLGJSQQBU-UHFFFAOYSA-M thallium(i) bromide Chemical compound [Tl]Br PGAPATLGJSQQBU-UHFFFAOYSA-M 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/35—Testing of optical devices, constituted by fibre optics or optical waveguides in which light is transversely coupled into or out of the fibre or waveguide, e.g. using integrating spheres
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Light Guides In General And Applications Therefor (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2630084A JPS60173438A (ja) | 1984-02-14 | 1984-02-14 | 光フアイバの散乱光測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2630084A JPS60173438A (ja) | 1984-02-14 | 1984-02-14 | 光フアイバの散乱光測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60173438A JPS60173438A (ja) | 1985-09-06 |
JPH0531735B2 true JPH0531735B2 (enrdf_load_stackoverflow) | 1993-05-13 |
Family
ID=12189486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2630084A Granted JPS60173438A (ja) | 1984-02-14 | 1984-02-14 | 光フアイバの散乱光測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60173438A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8951348B1 (en) | 2005-04-26 | 2015-02-10 | Novellus Systems, Inc. | Single-chamber sequential curing of semiconductor wafers |
US9073100B2 (en) | 2005-12-05 | 2015-07-07 | Novellus Systems, Inc. | Method and apparatuses for reducing porogen accumulation from a UV-cure chamber |
US9384959B2 (en) | 2005-04-26 | 2016-07-05 | Novellus Systems, Inc. | Purging of porogen from UV cure chamber |
-
1984
- 1984-02-14 JP JP2630084A patent/JPS60173438A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8951348B1 (en) | 2005-04-26 | 2015-02-10 | Novellus Systems, Inc. | Single-chamber sequential curing of semiconductor wafers |
US9384959B2 (en) | 2005-04-26 | 2016-07-05 | Novellus Systems, Inc. | Purging of porogen from UV cure chamber |
US10121682B2 (en) | 2005-04-26 | 2018-11-06 | Novellus Systems, Inc. | Purging of porogen from UV cure chamber |
US9073100B2 (en) | 2005-12-05 | 2015-07-07 | Novellus Systems, Inc. | Method and apparatuses for reducing porogen accumulation from a UV-cure chamber |
Also Published As
Publication number | Publication date |
---|---|
JPS60173438A (ja) | 1985-09-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |