JPH05312713A - Testing apparatus for resistance to weather and light - Google Patents

Testing apparatus for resistance to weather and light

Info

Publication number
JPH05312713A
JPH05312713A JP17207992A JP17207992A JPH05312713A JP H05312713 A JPH05312713 A JP H05312713A JP 17207992 A JP17207992 A JP 17207992A JP 17207992 A JP17207992 A JP 17207992A JP H05312713 A JPH05312713 A JP H05312713A
Authority
JP
Japan
Prior art keywords
sample
lamp
chamber
lamps
glass filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17207992A
Other languages
Japanese (ja)
Other versions
JPH0743315B2 (en
Inventor
Shigeru Suga
須賀  蓊
Etsuji Natori
悦二 名取
Shigeo Suga
茂雄 須賀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suga Test Instruments Co Ltd
Original Assignee
Suga Test Instruments Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suga Test Instruments Co Ltd filed Critical Suga Test Instruments Co Ltd
Publication of JPH05312713A publication Critical patent/JPH05312713A/en
Publication of JPH0743315B2 publication Critical patent/JPH0743315B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)

Abstract

PURPOSE:To test an object by irradiating it uniformly with intense energy rays. CONSTITUTION:The interior of a testing tank 1 is sectioned in the horizontal direction by a glass filter 2. The lower part is used as a sample chamber and the upper part as a lamp chamber 4. A sample stage 6 is arranged a predetermined distance from the glass filter 2 in the sample chamber 3, onto which a sample 19 is mounted. A lamp 8 which is curved like a mountain to apply the uniform irradiance to the whole upper surface of the sample stage 6 is set a predetermined distance from the glass filter 2 in the lamp chamber 4. Moreover, a blower 11 of a cooling wind to cool the interior of the lamp chamber 4 and the lamp 8 is provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、塗料やプラスチックな
どの耐候・光劣化を促進評価する試験機に関するもの
で、特に試料の被照射面全体を均一に照射することので
きる装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tester for accelerating and evaluating weather resistance and photodegradation of paints and plastics, and more particularly to a device capable of uniformly irradiating the entire surface to be irradiated of a sample.

【0002】[0002]

【従来の技術】従来の耐候光試験機としては、広く公知
の構成のため特に図示しないが、日本工業規格JIS
B 7754「キセノンアーク燈式耐光性及び耐候性試
験機」などに規定の、試験槽の中央に耐候光試験用の光
源(例えば直管状のキセノンランプ)を垂直に配し、そ
の周囲に円筒状または多角形状に構成した特定波長また
は特定波長域の光を透過するフィルタを近接して配し、
さらに光源と所定の距離(例えば光源の中心から480
mm)を隔ててその周囲を回転する垂直円筒または円環
状の試料枠に垂直に試料を取り付け、試料の被照射面に
特定波長または特定波長域の光を照射すると共に、試験
槽内の温湿度の付与装置や試料に降雨条件を付与するた
めのスプレー装置などを制御して、各種気候条件に対応
した試験を行う装置がある。
2. Description of the Related Art As a conventional weather resistance tester, which is not shown in the drawings because of its widely known construction, Japanese Industrial Standard JIS
B 7754 "Xenon arc lamp type light resistance and weather resistance tester", etc., a light source for weather light test (for example, a straight tube-shaped xenon lamp) is vertically arranged in the center of a test tank, and a cylindrical shape is provided around the light source. Or, arrange a filter that transmits light of a specific wavelength or a specific wavelength range configured in a polygonal shape in close proximity,
Furthermore, a certain distance from the light source (for example, 480 from the center of the light source)
(mm) The sample is mounted vertically on a vertical cylindrical or annular sample frame that rotates around it and irradiates the irradiated surface of the sample with light of a specific wavelength or a specific wavelength range, and the temperature and humidity inside the test tank. There is a device that controls the spraying device for applying rainfall conditions to the sample and the spraying device for applying rain conditions to the sample, and performs a test corresponding to various climatic conditions.

【0003】又、特公昭55−13541号公報には、
図6に示すような耐候光試験機が開示されている。尚、
図6は、この試験機の構成の要旨を示す断面図である。
Further, Japanese Patent Publication No. 55-13541 discloses that
A weather resistance tester as shown in FIG. 6 is disclosed. still,
FIG. 6 is a sectional view showing the gist of the configuration of this testing machine.

【0004】図において、試料室3の側壁21、は断面
が放物線状の反射体で、その焦点内に光源として直管状
のキセノンランプ8が水平に配してあり、試料19は試
料室3の下方に水平に配した試料台6上に載置されてい
る。又、キセノンランプ8からサンプル方向に湾曲して
いる3分の1円筒上のミラー22が側壁21、の上端部
間に配してあり、キセノンランプ8の上方で屋根形に形
成された補助ミラー23が、その端部を前記ミラー22
の端部と接した状態に配して構成してある。
In the figure, a side wall 21 of the sample chamber 3 is a reflector having a parabolic cross section, and a straight tube-shaped xenon lamp 8 as a light source is horizontally arranged in its focus. It is placed on a sample table 6 which is horizontally arranged below. Further, a mirror 22 on a one-third cylinder curved in the sample direction from the xenon lamp 8 is arranged between the upper ends of the side walls 21, and an auxiliary mirror formed in a roof shape above the xenon lamp 8. 23 has the end of the mirror 22
It is arranged so as to be in contact with the end of the.

【0005】この装置の構成の要点は、光源の光を平行
光線とし、全試料19に亘って均一な照射を行うことに
あり、そのため上記のように側壁21を断面が放物線状
とし、その焦点に光源を配したことにある。又、さらに
特公昭54−1199号に開示の装置の主目的と同様
に、広義の光学的フィルタである前記ミラー22及び補
助ミラー23により、紫外線部分(UV部分)のみを選
択的に照射できるよにし、熱源である赤外線部分(IR
部分)を反射して熱放出するようにしたものである。
The point of the construction of this device is that the light from the light source is made into a parallel light beam, and uniform irradiation is carried out over the entire sample 19. Therefore, as described above, the side wall 21 has a parabolic cross section and its focal point. There is a light source in the room. Further, similarly to the main purpose of the device disclosed in Japanese Patent Publication No. 54-1199, the mirror 22 and the auxiliary mirror 23, which are optical filters in a broad sense, can selectively irradiate only the ultraviolet ray portion (UV portion). And the infrared part (IR
The part) is designed to reflect heat and release heat.

【0006】[0006]

【発明が解決しようとする課題】さて、上記のようなJ
IS B 7754などに規定の従来の耐候光試験機にあ
っては、平板状の試料ホルダーに試料を取り付けてこれ
を光源に正対させて試験するため、試料の中心位置とそ
の上下位置とは光源との距離が異なることになるため、
試料の被照射面全体が受ける放射照度は上中下で均一で
なく、中心部に対して上下部分は弱いものであった。
又、ランプ強度を高めるためにランプ容量を大きくする
と、熱エネルギーが比例して増加することになり、これ
を試験片に影響せずに排除することは、構造上複雑にな
り、当然装置の価格も高くなり試験装置として経済効率
の悪いものであった。
DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention
In the conventional weather resistance tester specified in IS B 7754, etc., the sample is mounted on a flat sample holder and the test is performed by directly facing the sample to the light source. Since the distance to the light source will be different,
The irradiance received by the entire irradiated surface of the sample was not uniform in the upper, middle, and lower parts, and the upper and lower parts were weak with respect to the central part.
Also, if the lamp capacity is increased to increase the lamp strength, the thermal energy will increase in proportion, and eliminating this without affecting the test piece would be structurally complicated, and of course the cost of the device would be high. It was also high and the economic efficiency of the test equipment was poor.

【0007】このため、例えば実公平1−16034号
公報に開示のように、垂直円筒形状の試料枠で、その上
下部分を所定の角度で光源に向けて絞り込んだ形状の試
料枠として試料が受ける放射照度を均一にしようとする
ものや、このような試料枠を垂直に分割した形状の試料
ホルダー(断面が変形コの字状の試料ホルダー)や、特
公昭32−700号公報に開示の円弧状の試料ホルダー
に試料を取り付け、これらの試料ホルダーを組み合わせ
て上記の試料枠と同一の効果を持つようにして試料面が
受ける放射照度を均一にしようとしていた。
Therefore, as disclosed in, for example, Japanese Utility Model Publication No. 1-16034, the sample is received as a sample frame having a vertically cylindrical sample frame whose upper and lower portions are narrowed down toward a light source at a predetermined angle. An object to make the irradiance uniform, a sample holder having such a sample frame divided vertically (a sample holder having a U-shaped cross section), and a circle disclosed in Japanese Patent Publication No. 32-700. The sample is attached to an arc-shaped sample holder, and these sample holders are combined so as to have the same effect as that of the above-described sample frame so that the irradiance received by the sample surface is made uniform.

【0008】しかしながら上記のような試料枠及び試料
ホルダーを用いた場合、試験時には試料の大きさが限定
されるものであった(一般に試料の最大寸法は長さ15
0mm、幅70mm程度)。例えば、長尺の試料はそのま
ま試験することはできないため短く分割する必要があ
り、幅広の試料においても、試料枠の曲率に応じて曲げ
る必要がある。従って、上記のような試料枠及び試料ホ
ルダーに適応しない試料は、どうしても適当な大きさに
分割して試験する必要があり、試料を作成する手間がか
かると共に分割あるいは曲げることのできない試料にお
いては別に試験用の試料を作成する必要があった。
However, when the sample frame and the sample holder as described above are used, the size of the sample is limited during the test (generally, the maximum size of the sample is 15
0 mm, width 70 mm). For example, since a long sample cannot be tested as it is, it is necessary to divide it into short pieces, and even a wide sample needs to be bent according to the curvature of the sample frame. Therefore, samples that are not applicable to the sample frame and sample holder as described above must be divided into an appropriate size for testing, and it takes time and effort to prepare the sample, and samples that cannot be divided or bent cannot be separated. It was necessary to make samples for testing.

【0009】又、前記図6で示した特公昭55−135
41号公報に開示のような装置にあっては、試料室3の
側壁21を放物線状とし、ランプ8をその焦点位置に配
し、照射光を平行光線として試料19面に均一な照射を
行おうとしたものであるが、同じ照射面積を異なる放射
照度で照射すること、例えば複数のランプ8を配してよ
り強力な放射照度を得ることは、側壁21を放物線状と
し、ランプ8をその焦点位置に配す構造であるため不可
能である。又、試料19をランプ8に近づけてより強力
な放射照度を得ようとする場合は、このような構造では
当然照射面積の減少に結びつくことになる。さらに、ラ
ンプ8から発する熱の排除には、ランプ8を前記放物線
の焦点位置に配する必要があるため、放熱構造も限定さ
れることになり、又、大容量のランプ8もこの構造上使
用できない。
The Japanese Patent Publication No. 55-135 shown in FIG.
In the apparatus as disclosed in Japanese Patent No. 41, the side wall 21 of the sample chamber 3 is parabolic, the lamp 8 is arranged at the focal position thereof, and the irradiation light is made into parallel rays to uniformly irradiate the surface of the sample 19. Although it is an attempt to irradiate the same irradiation area with different irradiance, for example, to arrange a plurality of lamps 8 to obtain a stronger irradiance, the side wall 21 is made parabolic and the lamp 8 has its focus. This is impossible because it is a structure that is placed in a position. When the sample 19 is brought closer to the lamp 8 to obtain a stronger irradiance, such a structure naturally leads to a reduction in the irradiation area. Further, in order to remove the heat generated from the lamp 8, it is necessary to dispose the lamp 8 at the focal position of the parabola, so that the heat dissipation structure is also limited, and a large capacity lamp 8 is also used in this structure. Can not.

【0010】従って、特公昭55−13541号公報に
開示のような装置では、容易に放射照度の増大ができな
いため、耐候光試験の目的である高い促進度を得ること
が不可能であった。又、試料を照射するための照射面積
を容易に増大できるものではなかった。
Therefore, with the device disclosed in Japanese Patent Publication No. 55-13541, it is not possible to easily increase the irradiance, so that it is impossible to obtain a high degree of acceleration, which is the purpose of the weather resistance test. Moreover, the irradiation area for irradiating the sample cannot be easily increased.

【0011】又、図7のように、例えば2本の直管状の
キセノンランプ8を所定の開き角を有した山形状にして
配置した装置では、その電極部分24が頂部に位置する
ことになり、当然その電極部分24は発光しないため、
図8のように照射面の中央部の光エネルギーが低いもの
となり、全試料表面を均一な放射照度とすることは不可
能であった。
Further, as shown in FIG. 7, in an apparatus in which, for example, two straight tubular xenon lamps 8 are arranged in a mountain shape having a predetermined opening angle, the electrode portion 24 is located at the top. , Of course, because the electrode part 24 does not emit light,
As shown in FIG. 8, the light energy at the center of the irradiation surface was low, and it was impossible to make the entire sample surface have uniform irradiance.

【0012】このため、上述したような従来装置の各種
の問題点を解決し、強い照射エネルギーで大形の試料の
被照射面全体に亘って均一な放射照度の試験が、どのよ
うな試験条件であっても再現性良くできる装置の開発が
課題であった。
Therefore, what kind of test condition is to solve the various problems of the conventional apparatus as described above, and to test the uniform irradiance over the entire irradiation surface of a large sample with strong irradiation energy. However, the challenge was to develop a device that can achieve good reproducibility.

【0013】[0013]

【課題を解決するための手段】上記課題を解決するため
に、試験槽内を特定の波長または特定の波長域の光エネ
ルギーを透過するガラスフィルタで水平に仕切って、下
部を試料室、上部をランプ室とし、下部の試料室にはガ
ラスフィルタと所定の間隔を設けて上面が水平な試料台
を配設し、上部のランプ室内には山形状に曲がりを持っ
たランプを1本または並列に複数本、その頂部を上向き
にしてガラスフィルタと所定の間隔を設けて配設し、前
記ランプの開き角は、前記試料台上面の全面に亘って均
一な放射照度を与えるような角度とし、さらにランプ室
にランプ室内部及びランプ自体を冷却するための外気又
は強制冷却風の送入装置を接続して構成した耐候光試験
機を第1の手段とした。
In order to solve the above-mentioned problems, the inside of the test tank is horizontally partitioned by a glass filter which transmits light energy of a specific wavelength or a specific wavelength range, and the lower part is divided into a sample chamber and the upper part. The sample chamber in the lower part has a glass filter in the lower part with a certain distance from the glass plate, and the upper part has a horizontal sample stand. In the upper part, one or more lamps with a mountain-shaped bend are arranged in parallel. A plurality of lamps are arranged with their tops facing upward at a predetermined distance from the glass filter, and the opening angle of the lamp is an angle that gives a uniform irradiance over the entire upper surface of the sample table. A weathering light tester constituted by connecting a device for introducing outside air or forced cooling air for cooling the interior of the lamp chamber and the lamp itself to the lamp chamber was used as the first means.

【0014】又、第2の手段として、上記の山形状に曲
がりを持った複数のランプを、各々のランプの曲がりの
頂部を上向きにし、この頂部を中心に、間隔を設けて交
差配置して構成した。
As a second means, a plurality of lamps each having the above-mentioned mountain-shaped bend are arranged such that the tops of the respective bends of the lamps are directed upward, and the tops of the lamps are centered with a space provided therebetween. Configured.

【0015】[0015]

【作用】試料台上面との距離に応じた開き角の山形状に
曲がったランプを配設することにより、試料台上面の全
面に亘って均一な放射照度を得ることがでる。この均一
性はどのような試験条件であっても変わることはない。
又、ランプ室を独立して配したため、ランプ室内部及び
ランプの冷却も十分でき、ランプ室と試料室との仕切り
として用いた所定波長の光を得るためのガラスフィルタ
の冷却効率が上がり熱による透過率変化も生じにくい。
さらに、並列に複数のランプを取り付けることにより、
高強度の放射照度を得ると共に、特に長尺試料に対応し
て試料面積を増加させることができる。
The uniform irradiance can be obtained over the entire upper surface of the sample table by disposing the lamp bent in the shape of a mountain having an opening angle corresponding to the distance from the upper surface of the sample table. This uniformity does not change under any test conditions.
Further, since the lamp chamber is arranged independently, the inside of the lamp chamber and the lamp can be sufficiently cooled, the cooling efficiency of the glass filter for obtaining the light of the predetermined wavelength used as the partition between the lamp chamber and the sample chamber is increased, and Changes in transmittance are unlikely to occur.
Furthermore, by installing multiple lamps in parallel,
It is possible to obtain high-intensity irradiance and increase the sample area especially for long samples.

【0016】さらに、上記のランプを複数本用いて上下
並びに交差配置することによって、試料台上全面に亘っ
てより均一かつ高強度の放射照度を得ることができる。
Further, by using a plurality of the above lamps and arranging them vertically and crossing each other, more uniform and high intensity irradiance can be obtained over the entire surface of the sample table.

【0017】[0017]

【実施例】以下図面に従って本発明の装置の第1の実施
例を説明する。図1及び図2はその要部の構成図で、図
1は図2のA−A断面図、図2は図1のB−B断面図で
ある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the device of the present invention will be described below with reference to the drawings. 1 and 2 are configuration diagrams of a main part thereof, FIG. 1 is a sectional view taken along line AA of FIG. 2, and FIG. 2 is a sectional view taken along line BB of FIG.

【0018】両図において、試験槽1は直方体形状で、
内部を300〜700nmの波長域の光だけを透過する平
板状のガラスフィルタ2で水平に仕切って下部を試料室
3、上部をランプ室4としてある。ガラスフィルタ2は
試験槽1の内壁周囲の同一水平面上に固定した額縁状の
フィルタ取付枠5上に密着して載置してある。
In both figures, the test tank 1 has a rectangular parallelepiped shape.
The inside is horizontally partitioned by a flat glass filter 2 that transmits only light in the wavelength range of 300 to 700 nm, and the lower part is a sample chamber 3 and the upper part is a lamp chamber 4. The glass filter 2 is placed in close contact with a frame-shaped filter mounting frame 5 fixed on the same horizontal surface around the inner wall of the test tank 1.

【0019】試料室3の底部には平板状の試料台6が水
平に固定してあり、この試料台6の上面とガラスフィル
タ2の下面との間隔は約30cmとしてある。又、試料室
3内の温度及び湿度を調節するために、試料室3の一側
壁に接して調温調湿装置7が設けてある。この調温調湿
装置7は詳細図示しないが、ヒーター、加湿装置、送風
機などより構成される公知のものである。尚、必要に応
じて冷却器などを追加してもよい。
A flat plate-shaped sample table 6 is horizontally fixed to the bottom of the sample chamber 3, and the distance between the upper surface of the sample table 6 and the lower surface of the glass filter 2 is about 30 cm. Further, in order to adjust the temperature and humidity inside the sample chamber 3, a temperature and humidity controller 7 is provided in contact with one side wall of the sample chamber 3. Although not shown in detail, the temperature adjusting / humidifying device 7 is a known device including a heater, a humidifying device, a blower, and the like. In addition, you may add a cooler etc. as needed.

【0020】ランプ室4の中央部には、直管ランプを折
り曲げて山形とした形状のキセノンランプ8(空冷1.
5Kw)が1本、その頂部を上向きにして固定(後述)
してある。又、ランプ室4には外気導入口9及び排気口
10が設けてあり、外気導入口9にはランプ8自体及び
ランプ室4内全体を外気により強制的に冷却するための
ブロワー11が接続してある。尚、この冷却は必要に応
じて冷却器などを介した強制冷却風で行ってもよい。
At the center of the lamp chamber 4, a xenon lamp 8 (air cooling 1.
5 Kw) 1 piece, fixed with its top facing upward (described later)
I am doing it. Further, the lamp chamber 4 is provided with an outside air introduction port 9 and an exhaust port 10, and the outside air introduction port 9 is connected to a blower 11 for forcibly cooling the lamp 8 itself and the entire inside of the lamp chamber 4 with the outside air. There is. Note that this cooling may be performed by forced cooling air through a cooler or the like, if necessary.

【0021】図3は、本実施例で用いたキセノンランプ
8の固定方法及びキセノンランプ8の形状を説明する図
である。
FIG. 3 is a diagram for explaining the method of fixing the xenon lamp 8 used in this embodiment and the shape of the xenon lamp 8.

【0022】図において、キセノンランプ8の形状は、
その両端にリード線12付きの碍子13が取り付けてあ
り、この両碍子13先端間の距離aが約40cm、放電部
分の管径(直径)bが約20mm、山形状の開き角θが約
120度である。又、キセノンランプ8とガラスフィル
タ2の間隔は、ガラスフィルタ2の下面と両碍子13先
端間を結ぶ水平線との間隔cで規定してあり、約10cm
である。
In the figure, the shape of the xenon lamp 8 is
Insulators 13 with lead wires 12 are attached to both ends thereof, the distance a between the tips of the insulators 13 is about 40 cm, the tube diameter (diameter) b of the discharge portion is about 20 mm, and the opening angle θ of the mountain shape is about 120. It is degree. The distance between the xenon lamp 8 and the glass filter 2 is defined by the distance c between the lower surface of the glass filter 2 and the horizontal line connecting the tips of the two insulators 13.
Is.

【0023】このキセノンランプ8は、碍子取付具14
の貫通口にこのランプ8両端の碍子13をそれぞれ挿入
し、この取付具をフィルタ取付枠5に固定した固定具1
5にボルト16などで固定して取り付けるものである。
又、碍子取付具14及びその固定具15にはそれぞれ長
孔17が設けてあり、垂直方向、水平方向及び取り付け
角度が調節できるようになっている。尚、これら碍子取
付具14及び固定具15などは絶縁性の材質で作られて
いる。又、このキセノンランプ8の固定方法は、上記方
法に限定されるものではなく、垂直方向、水平方向及び
取り付け角度が容易に調節でき、ランプ8がしっかり固
定できるものであればよい。
This xenon lamp 8 has an insulator mounting member 14
The fixtures 1 in which the insulators 13 at both ends of the lamp 8 are inserted into the through holes of the lamps and the fixtures are fixed to the filter attachment frame 5.
5 is fixed by bolts 16 or the like.
Further, the insulator mounting tool 14 and its fixing tool 15 are provided with elongated holes 17, respectively, so that the vertical direction, the horizontal direction and the mounting angle can be adjusted. The insulator mounting tool 14, the fixing tool 15 and the like are made of an insulating material. The fixing method of the xenon lamp 8 is not limited to the above method, and any method can be used as long as the vertical direction, the horizontal direction and the mounting angle can be easily adjusted and the lamp 8 can be firmly fixed.

【0024】図2において、詳細図示しないが、制御盤
18にはランプ8の点灯及び消灯時間を制御する機能、
試料室3内の乾球及び湿球温度計(図示せず)と連絡
し、試料室3内の温度及び湿度を設定し制御する機能、
試験時間の設定制御機能などを有したマイクロコンピュ
ーターなどよりなる制御機器が配してある。尚、20は
試料19を出し入れするための扉である。
Although not shown in detail in FIG. 2, the control panel 18 has a function of controlling lighting and extinguishing times of the lamp 8.
A function of communicating with a dry bulb and wet bulb thermometer (not shown) in the sample chamber 3 to set and control the temperature and humidity in the sample chamber 3,
There is a control device such as a microcomputer having a test time setting control function. Reference numeral 20 is a door for loading and unloading the sample 19.

【0025】又、本実施例では採用しなかったが、試料
台6上の試料19と同位置の温度で試料室3を制御した
い場合には、試料台6上に直接温度計(例えば耐候光試
験機で一般的に用いられているブラックパネル温度計)
を置き、これと前記温度制御機能とを連絡すればよく、
試料19面が受ける放射照度を連続して測定する場合に
は、上記温度計と同様に放射照度測定器の受光部分を配
し、制御盤18上でその測定あるいは記録ができるよう
にすることも公知の技術で容易に可能である。同様に、
試料19面が受ける放射照度が常に一定レベルに維持さ
れるようにランプ8の電流電圧を調整することも可能で
ある。
Although not used in this embodiment, when it is desired to control the sample chamber 3 at a temperature at the same position as the sample 19 on the sample table 6, a thermometer (for example, weatherproof light) is directly mounted on the sample table 6. (Black panel thermometer generally used in testing machines)
And put it in contact with the temperature control function,
When continuously measuring the irradiance received by the surface of the sample 19, the light receiving part of the irradiance measuring device may be arranged in the same manner as the thermometer so that the measurement or recording can be performed on the control panel 18. This is easily possible with known technology. Similarly,
It is also possible to adjust the current voltage of the lamp 8 so that the irradiance received by the surface of the sample 19 is always maintained at a constant level.

【0026】次に、上記本実施例の装置を用いた実験を
示す。表1は図4で示す試料台6上の各位置における放
射照度の比である。尚、本実施例の試料台6は上面が4
0cm角の正方形である。
Next, an experiment using the apparatus of this embodiment will be shown. Table 1 shows the ratio of irradiance at each position on the sample table 6 shown in FIG. The sample table 6 of this embodiment has an upper surface of 4
It is a 0 cm square.

【0027】さて、図4は試料台6の平面図であり、こ
の上面に相互に直角な直線を引いたとき、その交点を図
示のように、XY0、X1、X2、X3、X4、Y1、Y2、
Y3、Y4、Y5、Y6、XY1、XY2、XY3、XY4、X
Y5、XY6、XY7、XY8 とした。このとき、XY0
点がキセノンランプ8の頂部からの垂線と一致し、XY
0、X1、X2、X3、X4 が位置する直線がこのランプ8
の長手方向の中心線と一致するように試料台6が配して
ある。又、表1の各値は、上記の各点で放射照度を測定
し、XY0 点での値を100としたときの比である。
FIG. 4 is a plan view of the sample table 6. When straight lines which are perpendicular to each other are drawn on the upper surface of the sample table 6, the intersections thereof are XY0, X1, X2, X3, X4, Y1, as shown in the drawing. Y2,
Y3, Y4, Y5, Y6, XY1, XY2, XY3, XY4, X
Y5, XY6, XY7 and XY8. At this time, XY0
The point coincides with the vertical line from the top of the xenon lamp 8, and XY
The straight line where 0, X1, X2, X3 and X4 are located is this lamp 8
The sample table 6 is arranged so as to coincide with the center line in the longitudinal direction of. Further, each value in Table 1 is a ratio when the irradiance is measured at each of the above points and the value at the XY0 point is set to 100.

【0028】[0028]

【表1】 [Table 1]

【0029】この表から明らかなように、XY1、XY
2、XY3、XY4の4点で囲まれる範囲(40cm×30c
mの範囲)で、中心XY0 に対して92%以上の放射照
度が得られている。
As is clear from this table, XY1, XY
Area surrounded by 4 points of 2, XY3 and XY4 (40 cm x 30 c
In the m range), an irradiance of 92% or more is obtained with respect to the center XY0.

【0030】又、キセノンランプ8を点灯した状態で、
上記表1の各点にブラックパネル温度計を置き、中心X
Y0 の同温度計が63°Cを維持するように試料室3の
温度を調節したとき、各点の温度は、前記JIS B 7
754に規定の試験温度と同じく、63±3°Cの範囲
内であった。
With the xenon lamp 8 turned on,
Place a black panel thermometer at each point in Table 1 above, center X
When the temperature of the sample chamber 3 is adjusted so that the same thermometer of Y0 maintains 63 ° C, the temperature at each point is the same as in JIS B 7
Like the test temperature specified in 754, it was within the range of 63 ± 3 ° C.

【0031】次に、第2の実施例として、図示しないが
前記第1の実施例の装置と基本的に同一構成の装置で、
高エネルギーでより大面積を照射可能とするために、前
記キセノンランプと同一のランプを2本、ランプ長手方
向の中心線間の間隔を20cmとして並列に、前記第1の
実施例と同様に固定して配した場合を説明する。
Next, as a second embodiment, although not shown, an apparatus having basically the same configuration as the apparatus of the first embodiment,
In order to make it possible to irradiate a large area with high energy, two lamps identical to the xenon lamp are fixed in parallel with the distance between the center lines in the lamp longitudinal direction being 20 cm, and fixed in the same manner as in the first embodiment. The case of arranging them will be described.

【0032】この装置では、ランプは前記図4でX1、
X4を結ぶ直線を中心にそれぞれ10cm離れた平行線
(Y2を通る平行線及びY3を通る平行線)の垂直上方に
その長手方向の中心線を一致させて配した。又、ランプ
自体及びランプ室内を冷却するためのブロワーや、試料
室内の温湿度を調節するための調温調湿装置は当然その
個数、容量を増加した。又、ガラスフィルタの下面と試
料台の上面及びキセノンランプとの距離は、前記第1の
実施例と同一とした。
In this device, the lamp is X1, in FIG.
Center lines in the longitudinal direction were arranged vertically above parallel lines (parallel lines passing through Y2 and parallel lines passing through Y3) 10 cm apart from each other with a straight line connecting X4 as the center. In addition, the number and capacity of the blower for cooling the lamp itself and the lamp chamber and the temperature and humidity control device for controlling the temperature and humidity in the sample chamber are naturally increased. The distance between the lower surface of the glass filter, the upper surface of the sample table and the xenon lamp was the same as in the first embodiment.

【0033】このとき図4における試料台6上の放射照
度の比は、XY0 点の放射照度を100としたとき、前
記第1の実施例と同じ範囲(XY1、XY2、XY3、X
Y4の4点で囲まれる40cm×30cmの範囲)でその9
5%以上であり、同様に試料台上面の全範囲(XY5、
XY6、XY7、XY8の4点で囲まれる40cm×40cm
の範囲)ではその90%以上であった。又、放射エネル
ギーは、前記装置の約1.8倍であった。又、この範囲
のブラックパネル温度は、前記第1の実施例と同じく6
3±3°Cの範囲内であった。
At this time, the ratio of the irradiance on the sample table 6 in FIG. 4 is the same range as that in the first embodiment (XY1, XY2, XY3, X) when the irradiance at the XY0 point is 100.
9 in a 40 cm x 30 cm area surrounded by 4 points of Y4)
5% or more, similarly, the entire range (XY5,
40cm x 40cm surrounded by 4 points of XY6, XY7, XY8
In the range) was 90% or more. The radiant energy was about 1.8 times that of the device. The black panel temperature in this range is 6 as in the first embodiment.
It was within the range of 3 ± 3 ° C.

【0034】本発明の第3の実施例は、図5に示すよう
に、上記第1の実施例で用いたのと同一のキセノンラン
プ8を2本、両ランプの頂部がほぼ同一垂直線上に位置
するようにして、両ランプの頂部を中心に直交して配置
したもので、例えばキセノンランプ8の長手方向が、図
4において、一方のキセノンランプはX1、X4方向に、
他方のキセノンランプをY5、Y6になるように配置した
もので、両者の上下方向の間隔は頂部間で約10mm離し
てある。又、ガラスフィルタの下面と試料台の上面及び
X1、X4方向に配置したキセノンランプとの距離は、前
記第1の実施例と同一とした。
In the third embodiment of the present invention, as shown in FIG. 5, two xenon lamps 8 which are the same as those used in the first embodiment are provided, and the tops of both lamps are arranged on the same vertical line. The lamps are arranged so as to be positioned so as to be orthogonal to each other with the tops of the two lamps as the centers. For example, the longitudinal direction of the xenon lamp 8 is one of the xenon lamps in the X1 and X4 directions in FIG.
The other xenon lamp is arranged so as to be Y5 and Y6, and the vertical distance between the two is approximately 10 mm between the tops. The distance between the lower surface of the glass filter and the upper surface of the sample table and the xenon lamps arranged in the X1 and X4 directions was the same as that in the first embodiment.

【0035】又、図5では図示していないが、各キセノ
ンランプ8の固定は、図3で示した第1の実施例の方法
と同様であり、固定具15の長孔17(図3参照)を用
いて、一方のキセノンランプ(上記Y5、Y6方向に配置
したキセノンランプ)を約10mm上方に取り付けてあ
る。
Although not shown in FIG. 5, the fixing of each xenon lamp 8 is the same as the method of the first embodiment shown in FIG. 3, and the long hole 17 of the fixture 15 (see FIG. 3). ), One of the xenon lamps (the xenon lamps arranged in the Y5 and Y6 directions) is mounted about 10 mm above.

【0036】尚、本図では図示しないが、図1における
ブロワー11や調温調湿装置7は第2の実施例と同じく
その個数、容量を増加して構成してある。
Although not shown in the figure, the blower 11 and the temperature / humidity adjusting device 7 in FIG. 1 are constructed by increasing the number and capacity thereof as in the second embodiment.

【0037】表1の各値は、第1の実施例と同じく図4
の各点で放射照度を測定し、XY0点での値を100と
したときの比である。
The values in Table 1 are the same as those in the first embodiment shown in FIG.
Is the ratio when the irradiance is measured at each point and the value at the XY0 point is 100.

【0038】[0038]

【表2】 [Table 2]

【0039】この表から明らかなように、XY5、XY
6、XY7、XY8の4点で囲まれる40cm×40cmの範
囲の放射照度の比は、第2の実施例では中心XY0 に対
して90%以上であったが、本実施例では98%以上で
あることがわかる。又、放射照度及びこの範囲のブラッ
クパネル温度は第2の実施例とほぼ同一で、それぞれ約
1.8倍及び63±3°Cの範囲内であった。
As is clear from this table, XY5, XY
The irradiance ratio in the range of 40 cm × 40 cm surrounded by four points of 6, XY7 and XY8 was 90% or more with respect to the center XY0 in the second embodiment, but was 98% or more in this embodiment. I know there is. Further, the irradiance and the black panel temperature in this range were almost the same as those in the second embodiment, and were about 1.8 times and 63 ± 3 ° C., respectively.

【0040】又、上記3つの実施例において、さらに高
エネルギーを得ようとする場合には、より大きな定格の
キセノンランプを用いればよく、このランプの取り付け
は、上述のように垂直方向、水平方向及び取り付け角度
が調節でき取り付け方法のため容易に可能である。
Further, in order to obtain higher energy in the above three embodiments, a xenon lamp having a larger rating may be used, and the lamp is mounted in the vertical or horizontal direction as described above. Also, the mounting angle can be adjusted and the mounting method is easily possible.

【0041】[0041]

【効果】本発明によれば、 試料台上面との距離に応じ
た開き角の山形状に曲がったランプを配設することによ
り、試料台上面の全面に亘って均一な放射照度を得るこ
とがでる。又、ランプ室を独立して配したため、ランプ
室内部及びランプの冷却も十分でき、ランプ室と試料室
との仕切りとして用いた所定波長の光を得るためのガラ
スフィルタの冷却効率が上がり熱による透過率変化も生
じにくい。さらに、装置の大幅な改造なしに複数のラン
プの使用が容易にでき、より強い光エネルギーを照射で
きると共に均一な照射面積を増加して大形試料に対応す
ることが容易にできるものである。
[Effect] According to the present invention, by disposing a lamp bent in a mountain shape having an opening angle according to the distance from the upper surface of the sample table, uniform irradiance can be obtained over the entire upper surface of the sample table. Out. Further, since the lamp chamber is arranged independently, the inside of the lamp chamber and the lamp can be sufficiently cooled, the cooling efficiency of the glass filter for obtaining the light of the predetermined wavelength used as the partition between the lamp chamber and the sample chamber is increased, and Changes in transmittance are unlikely to occur. Furthermore, it is possible to easily use a plurality of lamps without major modification of the device, to irradiate stronger light energy, and to increase a uniform irradiation area to easily cope with a large sample.

【図面の簡単な説明】[Brief description of drawings]

【図1】第1の実施例の装置の要部の構成図で、図2の
A−A断面図。
FIG. 1 is a configuration diagram of a main part of an apparatus according to a first embodiment, which is a cross-sectional view taken along the line AA of FIG.

【図2】第1の実施例の装置の要部の構成図で、図1の
B−B断面図。
FIG. 2 is a configuration diagram of a main part of the device according to the first embodiment, which is a cross-sectional view taken along line BB of FIG.

【図3】第1の実施例のキセノンランプの固定方法及び
キセノンランプの形状の説明図。
FIG. 3 is an explanatory diagram of a method for fixing the xenon lamp and a shape of the xenon lamp according to the first embodiment.

【図4】第1の実施例の試料台の平面図で、放射照度の
測定点を示す図。
FIG. 4 is a plan view of the sample table of the first embodiment, showing a measurement point of irradiance.

【図5】第3の実施例のキセノンランプの構成図。FIG. 5 is a configuration diagram of a xenon lamp according to a third embodiment.

【図6】従来技術の装置の要部構成図。FIG. 6 is a configuration diagram of main parts of a conventional device.

【図7】2本の直管状のキセノンランプを山形状にして
配置した場合の図。
FIG. 7 is a view showing a case where two straight tubular xenon lamps are arranged in a mountain shape.

【図8】図7における配光分布曲線を示す図。FIG. 8 is a diagram showing a light distribution curve in FIG.

【符号の説明】[Explanation of symbols]

1 試験槽 2 ガラスフィルタ 3 試料室 4 ランプ室 6 試料台 7 調温調湿装置 8 キセノンランプ 11 ブロワー 14 碍子取付具 15 固定具 17 長孔 18 制御盤 19 試料 1 Test Tank 2 Glass Filter 3 Sample Chamber 4 Lamp Chamber 6 Sample Stage 7 Temperature / Humidity Controller 8 Xenon Lamp 11 Blower 14 Insulator Fixture 15 Fixture 17 Long Hole 18 Control Panel 19 Sample

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 試験槽の上部に耐候光試験用の光源を配
し、試験槽の下部に試料台を配してなる耐候光試験機に
おいて、試験槽内を特定の波長または特定の波長域の光
エネルギーを透過するガラスフィルタで水平に仕切っ
て、下部を試料室、上部をランプ室とし、下部の試料室
にはガラスフィルタと所定の間隔を設けて上面が水平な
試料台を配設し、上部のランプ室内には山形状に曲がり
を持ったランプを1本または並列に複数本、その頂部を
上向きにしてガラスフィルタと所定の間隔を設けて配設
し、前記ランプの開き角は、前記試料台上面の全面に亘
って均一な放射照度を与えるような角度とし、さらにラ
ンプ室にランプ室内部及びランプ自体を冷却するための
外気又は強制冷却風の送入装置を接続して構成し、通常
の耐候光試験における温度条件下で、特定の波長または
特定の波長域での高強度の光エネルギーが、試料台面上
に取り付けた試料に均一に照射されることを特徴とする
耐候光試験機。
1. A weathering light tester comprising a light source for weathering resistance test arranged in an upper part of a test tank and a sample table arranged in a lower part of the test tank, and has a specific wavelength or a specific wavelength range in the test tank. It is partitioned horizontally by a glass filter that transmits the light energy of the sample chamber, the lower part is the sample chamber, the upper part is the lamp chamber, and the lower sample chamber is provided with a glass filter and a sample table with a horizontal upper surface. In the upper lamp chamber, one or a plurality of lamps each having a mountain-shaped bend are arranged in parallel, and the tops of the lamps are arranged at a predetermined distance from the glass filter. The opening angle of the lamp is The angle is set so as to provide uniform irradiance over the entire surface of the sample table, and the lamp chamber is connected to a device for feeding outside air or forced cooling air for cooling the lamp chamber and the lamp itself. , In normal weather resistance test A weathering light tester characterized in that, under temperature conditions, high-intensity light energy in a specific wavelength or in a specific wavelength range is uniformly irradiated on a sample mounted on a sample table surface.
【請求項2】 山形状に曲がりを持った複数のランプ
を、各々のランプの曲がりの頂部を上向きにし、この頂
部を中心に、間隔を設けて交差配置したことを特徴とす
る請求項1記載の耐候光試験機。
2. A plurality of lamps each having a mountain-shaped bend are arranged such that the tops of the bends of the respective lamps face upward, and the lamps are crossed at intervals with the tops as the centers. Weather resistance tester.
JP17207992A 1992-03-13 1992-06-05 Weather resistance tester Expired - Fee Related JPH0743315B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP9004192 1992-03-13
JP4-90041 1992-03-13

Publications (2)

Publication Number Publication Date
JPH05312713A true JPH05312713A (en) 1993-11-22
JPH0743315B2 JPH0743315B2 (en) 1995-05-15

Family

ID=13987566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17207992A Expired - Fee Related JPH0743315B2 (en) 1992-03-13 1992-06-05 Weather resistance tester

Country Status (1)

Country Link
JP (1) JPH0743315B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013083564A (en) * 2011-10-11 2013-05-09 Suga Test Instr Co Ltd Temperature/humidity controller for weatherometer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4744315B2 (en) * 2006-02-13 2011-08-10 パナソニック電工株式会社 Heat and light resistance test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013083564A (en) * 2011-10-11 2013-05-09 Suga Test Instr Co Ltd Temperature/humidity controller for weatherometer

Also Published As

Publication number Publication date
JPH0743315B2 (en) 1995-05-15

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