JPH0529140U - Substrate device - Google Patents
Substrate deviceInfo
- Publication number
- JPH0529140U JPH0529140U JP6403092U JP6403092U JPH0529140U JP H0529140 U JPH0529140 U JP H0529140U JP 6403092 U JP6403092 U JP 6403092U JP 6403092 U JP6403092 U JP 6403092U JP H0529140 U JPH0529140 U JP H0529140U
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- radiant heat
- thin film
- heated
- heat absorber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
(57)【要約】
【目的】 基板のみ、又は、基板の必要部分のみを効率
的に輻射熱で加熱できる基板装置を提供する。
【構成】 真空中で輻射熱を用いて加熱する半導体もし
くは絶縁体の基板の、加熱したい表面の丁度その部分の
裏面に、輻射熱吸収体薄膜層を主体とする多層膜を被膜
したものである。
(57) [Summary] [Object] To provide a substrate device capable of efficiently heating only a substrate or only a necessary portion of the substrate with radiant heat. [Structure] A semiconductor or insulator substrate that is heated by radiant heat in a vacuum is coated with a multilayer film mainly composed of a radiant heat absorber thin film layer on the back surface of that portion of the surface to be heated.
Description
【0001】[0001]
本考案は、例えば、分子線エピタキシー処理で必要となる技術であって、半導 体もしくは絶縁体の基板において基板表面の一部又は全面を真空中で加熱する場 合に効果を発揮する基板装置に関する。 The present invention is, for example, a technique required for molecular beam epitaxy treatment, and is a substrate device that is effective when a part or the whole surface of a substrate of a semiconductor or an insulator is heated in a vacuum. Regarding
【0002】 イオン注入後の半導体基板では、注入不純物を電気的に活性化するために、フ ラッシュアニールという基板加熱方法がとられているが、この基板を面内均一に 昇温する際にも本考案の基板装置は極めて有効性を発揮する。In a semiconductor substrate after ion implantation, a substrate heating method called flash annealing is used in order to electrically activate the implanted impurities. However, even when the substrate is uniformly heated in-plane. The substrate device of the present invention is extremely effective.
【0003】[0003]
従来、分子線エピタキシー成長処理等の工程で、輻射熱で半導体もしくは絶縁 体の基板を300℃〜1200℃等に加熱する場合、この半導体または絶縁体の 基板を熱伝導度のよい部材の上に置き、この部材を輻射熱で加熱しこの部材から の熱伝導で間接的に基板を加熱していた。加熱を間接的にする理由は、Si、G aAsなどの半導体、もしくは透明な絶縁体は、赤外波長領域では透過率が高く 、輻射熱をほとんど透過してしまい、基板の温度を上昇させることに困難がある ためである。この間接的な方法で基板を加熱する場合には、裏面に設置した部材 をも加熱することになり、基板単体の場合に比べて熱容量が大きくなるため、加 熱電力が増大する。それと同時に、部材周辺部も加熱されるので、これが真空へ のガス放出の原因となり、基板表面が汚染されるなどの欠点があった。またこの 加熱部材からゴミが遊離して基板表面に付着する現象も見られ、これらはデバイ ス製造プロセス上大きい問題となっていた。 Conventionally, in a process such as molecular beam epitaxy growth treatment, when a semiconductor or insulating substrate is heated to 300 ° C to 1200 ° C by radiant heat, the semiconductor or insulating substrate is placed on a member having good thermal conductivity. This member was heated by radiant heat and the substrate was indirectly heated by heat conduction from this member. The reason for indirectly heating is that a semiconductor such as Si or GaAs or a transparent insulator has a high transmittance in the infrared wavelength region and almost transmits radiant heat, which raises the temperature of the substrate. This is because there are difficulties. When the substrate is heated by this indirect method, the member installed on the back surface is also heated, and the heat capacity becomes larger than that in the case of the substrate alone, so the heating power increases. At the same time, the peripheral portion of the member is also heated, which causes the release of gas into the vacuum, and there is a drawback that the substrate surface is contaminated. There was also a phenomenon in which dust was released from the heating member and adhered to the substrate surface, which was a major problem in the device manufacturing process.
【0004】 本考案は、上記問題を解決し、基板のみ、もしくは、基板の必要部分のみを効 率よく輻射熱で加熱できる基板装置を提供することを目的とする。An object of the present invention is to solve the above problems and to provide a substrate device capable of efficiently heating only the substrate or only a necessary portion of the substrate with radiant heat.
【0005】[0005]
【課題を解決するための手段】 本考案は、真空中で輻射熱を用いて加熱する半導体もしくは絶縁体の基板の、 加熱したい表面の丁度その部分の裏面に、蒸着又は放電反応処理で輻射熱吸収体 薄膜層を主体とする多層膜を被覆したものである。Means for Solving the Problems The present invention is to provide a radiant heat absorber by vapor deposition or discharge reaction treatment on a back surface of a portion of a surface of a semiconductor or an insulator which is heated by using radiant heat in a vacuum, just on the surface to be heated. It is a multi-layer film mainly composed of thin film layers.
【0006】[0006]
以下、図に基づいて、本考案の実施例を説明する。 An embodiment of the present invention will be described below with reference to the drawings.
【0007】 図1の実施例において、1は加熱される基板、2は輻射熱吸収体薄膜層を含む 多層膜、3は発熱体である。輻射熱吸収体薄膜としては、モリブデン、タングス テンなどの高融点金属又はカーボンが用いられる。In the embodiment of FIG. 1, 1 is a substrate to be heated, 2 is a multilayer film including a radiant heat absorber thin film layer, and 3 is a heating element. As the radiant heat absorber thin film, a refractory metal such as molybdenum or tungsten, or carbon is used.
【0008】 図2では、4が輻射熱吸収体薄膜層を含む多層膜の生成室、5は基板加熱室で ある。生成室4内で基板の裏面に真空蒸着又は放電反応処理などの成膜技術をも ちいて輻射熱吸収体薄膜層等を被覆する。基板が充分に薄いときには、加熱した い表面部のすぐ裏面に被覆が行なわれる。次いで、ゲート7を開いて被覆された 基板を基板加熱室5へ送り出し、この加熱室5で所定の表面加工が行なわれる。In FIG. 2, reference numeral 4 is a multi-layer film forming chamber including a radiant heat absorber thin film layer, and 5 is a substrate heating chamber. Inside the generation chamber 4, the back surface of the substrate is coated with a radiant heat absorber thin film layer or the like using a film forming technique such as vacuum deposition or discharge reaction treatment. When the substrate is thin enough, the coating is applied just to the backside of the surface to be heated. Next, the gate 7 is opened and the coated substrate is sent out to the substrate heating chamber 5, where predetermined surface processing is performed.
【0009】 図3は、輻射熱吸収体薄膜を多層に被覆した本考案の実施例である。多層膜は 、その組成薄膜層が熱線の波長に対し、互に異なる吸収・反射の選択性を持つ場 合に、それを互に補完できる効果があるが、殊に基板と輻射熱吸収体薄膜が反応 する場合には、その反応の防止策として効果が著るしい。このときは基板と輻射 熱吸収体薄膜の間に基板と反応しない薄膜を挿入するもので、例えば、基板がS iのときに、先づSiO2 の薄膜を被覆したのち、その上にモリブデン薄膜を被 覆するとか、基板がGaAsのときに、先づSi3 N4 の薄膜を置いてその上に モリブデン薄膜を被覆するとかである。FIG. 3 shows an embodiment of the present invention in which a radiant heat absorber thin film is coated in multiple layers. The multilayer film has the effect of complementing each other when the composition thin film layers have mutually different absorption / reflection selectivity with respect to the wavelength of heat rays, but especially when the substrate and the radiant heat absorber thin film are used. When it reacts, it is effective as a measure for preventing the reaction. At this time, a thin film that does not react with the substrate is inserted between the substrate and the radiant heat absorber thin film. For example, when the substrate is Si, a SiO 2 thin film is first coated and then a molybdenum thin film is formed thereon. Or when the substrate is GaAs, a Si 3 N 4 thin film is first placed and then a molybdenum thin film is coated thereon.
【0010】 なお、実施に当って、本考案の輻射熱吸収体を含む多層薄膜又はその一部の薄 膜層の生成は、これを完全に別工程で、バッチ処理で行なうことも可能である。 また、基板表面に加熱したい部分が局在するときは、輻射熱吸収体薄膜生成時に マスクを用いることもできる。In practice, the multi-layered thin film including the radiant heat absorber of the present invention or a thin film layer of a part thereof can be formed by a completely different process in a batch process. Further, when the portion to be heated is localized on the surface of the substrate, a mask can be used when forming the radiant heat absorber thin film.
【0011】 なおまた、裏面に被覆する膜の熱膨張率は、基板の熱膨張率に近接させること が望ましい。The coefficient of thermal expansion of the film covering the back surface is preferably close to that of the substrate.
【0012】 次に、もし表面処理後、裏面に電極を設けたいなどで、裏面の薄膜を除去した いときは、有機物のレジストを表面に塗布して裏面の薄膜を酸で除くとか、裏面 の薄膜を機械的に除去するとかの方法が採られる。Next, if it is desired to provide an electrode on the back surface after the surface treatment and thus to remove the thin film on the back surface, an organic resist is applied to the surface and the thin film on the back surface is removed with an acid. A method of mechanically removing the thin film is adopted.
【0013】[0013]
本考案の装置によれば、基板表面又はその加熱したい部分のみを効率よくしか も迅速に、かつ精度よく、すぐれた応答性をもって、輻射熱で加熱出来る基板が 提供される。 According to the device of the present invention, there is provided a substrate capable of heating only the surface of the substrate or a portion to be heated thereof with radiant heat efficiently, quickly, accurately and with excellent responsiveness.
【0014】 また、本考案の副次的効果として次のものがある。即ちイオン注入を絶縁体ま たは半絶縁半導体基板に対して行なう場合、イオン衝突によって多量の2次電子 が放出され、この2次電子で基板全体がチャージアップし、所定の場所にイオン を注入することが不可能となる現象があるが、このチャージアップを防止する上 で、裏面に高融点金属を被覆した本考案の基板は著効をもっている。In addition, there are the following secondary effects of the present invention. That is, when ion implantation is performed on an insulator or a semi-insulating semiconductor substrate, a large amount of secondary electrons are emitted due to ion collision, and the entire substrate is charged up by the secondary electrons, and the ions are implanted at a predetermined location. Although there is a phenomenon that it becomes impossible to do so, the substrate of the present invention whose back surface is coated with a refractory metal is very effective in preventing this charge-up.
【図1】本考案の実施例の基板装置の加熱状況を示す図
である。FIG. 1 is a diagram showing a heating state of a substrate device according to an embodiment of the present invention.
【図2】本考案の実施例の基板装置の薄膜生成、加熱処
理装置を略示する図である。FIG. 2 is a schematic view of a thin film forming and heat treatment apparatus of a substrate device according to an embodiment of the present invention.
【図3】本考案の多層膜を被覆した基板装置の実施例の
図である。FIG. 3 is a diagram of an embodiment of a substrate device coated with a multilayer film of the present invention.
1 基板 2 輻射熱吸収体薄膜層を含む多層膜 3 発熱体 4 輻射熱吸収体薄膜層を含む多層膜の生成室 5 基板加熱室 6 輻射熱吸収体薄膜 DESCRIPTION OF SYMBOLS 1 Substrate 2 Multilayer film including radiant heat absorber thin film layer 3 Heating element 4 Multilayer film generation chamber including radiant heat absorber thin film layer 5 Substrate heating chamber 6 Radiant heat absorber thin film
───────────────────────────────────────────────────── フロントページの続き (72)考案者 三戸 英夫 東京都府中市四谷5丁目8番1号 日電ア ネルバ株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Creator Hideo Minohe 5-8-1, Yotsuya, Fuchu-shi, Tokyo Nichiden Anelva Co., Ltd.
Claims (3)
は全面に加熱を行なう半導体もしくは絶縁体の基板にお
いて、該加熱したい表面の裏面に、輻射熱吸収体薄膜層
を含む多層膜を被膜したことを特徴とする基板装置。1. A substrate of a semiconductor or an insulator in which a part or the whole of the surface is heated by using radiant heat in a vacuum, and a back surface of the surface to be heated is coated with a multilayer film including a radiant heat absorber thin film layer. A substrate device characterized by the above.
はカーボンであることを特徴とする請求項1記載の基板
装置。2. The substrate device according to claim 1, wherein the radiant heat absorber thin film is a refractory metal or carbon.
該基板と化学的に反応しない物質で構成されていること
を特徴とする請求項1又は2記載の基板装置。3. A film of the multilayer film, which is in contact with the substrate,
The substrate device according to claim 1 or 2, wherein the substrate device is made of a substance that does not chemically react with the substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1992064030U JPH0717148Y2 (en) | 1992-07-28 | 1992-07-28 | Substrate device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1992064030U JPH0717148Y2 (en) | 1992-07-28 | 1992-07-28 | Substrate device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0529140U true JPH0529140U (en) | 1993-04-16 |
JPH0717148Y2 JPH0717148Y2 (en) | 1995-04-19 |
Family
ID=13246329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1992064030U Expired - Lifetime JPH0717148Y2 (en) | 1992-07-28 | 1992-07-28 | Substrate device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0717148Y2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8703626B2 (en) | 2006-08-31 | 2014-04-22 | Shindengen Electric Manufacturing Co., Ltd. | Method, tool, and apparatus for manufacturing a semiconductor device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5216971A (en) * | 1975-07-30 | 1977-02-08 | Hitachi Ltd | Base plate heat treatment method and wafer for semiconductor |
JPS58190897A (en) * | 1982-04-30 | 1983-11-07 | Fujitsu Ltd | Method for growing crystal by molecular beam |
-
1992
- 1992-07-28 JP JP1992064030U patent/JPH0717148Y2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5216971A (en) * | 1975-07-30 | 1977-02-08 | Hitachi Ltd | Base plate heat treatment method and wafer for semiconductor |
JPS58190897A (en) * | 1982-04-30 | 1983-11-07 | Fujitsu Ltd | Method for growing crystal by molecular beam |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8703626B2 (en) | 2006-08-31 | 2014-04-22 | Shindengen Electric Manufacturing Co., Ltd. | Method, tool, and apparatus for manufacturing a semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPH0717148Y2 (en) | 1995-04-19 |
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