JPH05280647A - Vacuum seal method - Google Patents

Vacuum seal method

Info

Publication number
JPH05280647A
JPH05280647A JP4078086A JP7808692A JPH05280647A JP H05280647 A JPH05280647 A JP H05280647A JP 4078086 A JP4078086 A JP 4078086A JP 7808692 A JP7808692 A JP 7808692A JP H05280647 A JPH05280647 A JP H05280647A
Authority
JP
Japan
Prior art keywords
ring
vacuum
shaft
partition
seal member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4078086A
Other languages
Japanese (ja)
Inventor
Taku Yoshida
卓 吉田
Koichi Murakami
公一 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyushu Fujitsu Electronics Ltd
Fujitsu Ltd
Original Assignee
Kyushu Fujitsu Electronics Ltd
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyushu Fujitsu Electronics Ltd, Fujitsu Ltd filed Critical Kyushu Fujitsu Electronics Ltd
Priority to JP4078086A priority Critical patent/JPH05280647A/en
Publication of JPH05280647A publication Critical patent/JPH05280647A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Sealing Devices (AREA)

Abstract

PURPOSE:To obtain a means of preventing dust from being generated by wearing an O ring even in a condition of high temperature, relating to a vacuum seal method between a partition of a vacuum device and a shaft inserted through the partition. CONSTITUTION:In a vacuum seal method between a partition 1 of a vacuum device and a shaft 2 inserted through the partition, a seal member 3 for burying a part between the partition 1 and the shaft 2 is provided. The seal member 3 provides a ring-shaped groove 7, for fitting an O ring 4, formed of a cylindrical film 5 between the O ring 11 and the shaft 2 and further of a side surface 6 with an opposite side to the film 5 in a narrow tapered shape to a bottom part direction. Constitution is provided such that the O ring 4 is deformed by pressing it with a retaining jig 8 to compress the film 5, and it tightens the shaft 2 to hold a vacuum of the vacuum device.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は,真空装置の摺動部の真
空シール方法に関する。中真空(1Pa程度)の真空処
理を必要とする装置は,半導体製造装置においても,C
VD装置,スパッタ装置等,多々必要である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vacuum sealing method for a sliding portion of a vacuum device. Even in semiconductor manufacturing equipment, equipment that requires a medium vacuum (about 1 Pa) vacuum treatment is C
A lot of VD equipment, sputtering equipment, etc. are required.

【0002】これらの装置は,シリコンウエハ等の半導
体基板を真空領域に入れる時には,大気圧であり,これ
らの基板を処理する時に真空にする。従って,これらの
装置には,真空装置内の基板を,外部から上下,左右に
摺動する機構が必要であり,これに適応した摺動部の真
空シール方法が要求される。
These devices are at atmospheric pressure when a semiconductor substrate such as a silicon wafer is put in a vacuum region, and are evacuated when processing these substrates. Therefore, these devices require a mechanism for sliding the substrate inside the vacuum device vertically and horizontally from the outside, and a vacuum sealing method for the sliding portion adapted to this is required.

【0003】[0003]

【従来の技術】図4は従来例の説明図である。図におい
て,19は隔壁, 20は摺動軸, 21はOリング,22は締付板
である。
2. Description of the Related Art FIG. 4 is an explanatory view of a conventional example. In the figure, 19 is a partition wall, 20 is a sliding shaft, 21 is an O-ring, and 22 is a tightening plate.

【0004】従来, 真空装置等のベルジャーやチャンバ
からなる真空側と大気側の隔壁19に設けた摺動軸20のシ
ールは,比較的真空度の低い場合は,簡単な方法では,
図3に示すように,Oリング21を用い,このOリング21
を締付板22によりネジで押圧固定してシールするのが一
般的であった。
Conventionally, the seal of the sliding shaft 20 provided on the partition wall 19 on the vacuum side and the atmosphere side, which is composed of a bell jar and a chamber such as a vacuum device, has a simple method when the degree of vacuum is relatively low.
As shown in FIG. 3, an O-ring 21 is used.
It was common to press and fix with a tightening plate 22 with a screw for sealing.

【0005】[0005]

【発明が解決しようとする課題】例えば, 本発明のシー
ル方法を採用した後述の真空加熱装置を例にとれば, 従
来, この装置で,半導体基板9を真空加熱装置内に横方
向から挿入するときには,図2(a)に示すように,軸
2の先端は熱板10より上側にあり,この軸2の上に半導
体基板9がロボット等により供給される。その後,図2
(b)に示すように,熱板10が上に上がった後, 蓋12を
してから,真空加熱装置内を排気する真空工程に移る。
Taking, for example, a vacuum heating device described below that employs the sealing method of the present invention, the semiconductor substrate 9 is conventionally inserted laterally into the vacuum heating device by this device. Sometimes, as shown in FIG. 2A, the tip of the shaft 2 is above the heating plate 10, and the semiconductor substrate 9 is supplied onto the shaft 2 by a robot or the like. Then, Figure 2
As shown in (b), after the hot plate 10 is lifted up, the lid 12 is closed, and then the vacuum step of evacuating the inside of the vacuum heating device is performed.

【0006】この時,軸2はシール部材3の位置で摺動
が起こる。近年,半導体デバイスの集積度が上がり,微
細なゴミ等の異物の付着が問題となる。上記のような高
温状態で,且つ,摺動部のあるシール部では,従来のO
リングを用いたシール方法では,ゴムの磨耗に伴う寿命
の低減と,ゴミの発生が生じて問題となる。
At this time, the shaft 2 slides at the position of the seal member 3. In recent years, the degree of integration of semiconductor devices has increased, and the adhesion of foreign matter such as fine dust has become a problem. In the high temperature condition and the seal part with sliding parts, the conventional O
The sealing method using a ring poses a problem because the life of the rubber is shortened due to abrasion and dust is generated.

【0007】本発明は,高温状態においても,Oリング
が磨耗してゴミが発生することを防止する手段を得るこ
とを目的として提供される。
The present invention is provided for the purpose of obtaining means for preventing the O-ring from being worn and dust being generated even in a high temperature state.

【0008】[0008]

【課題を解決するための手段】図1は本発明の原理説明
図であり,真空シール部の拡大模式断面図である。図に
おいて,1は隔壁,2は軸,3はシール部材,4はOリ
ング,5は膜,6は側面,7は溝,8は押さえ治具であ
る。
FIG. 1 is an explanatory view of the principle of the present invention, which is an enlarged schematic sectional view of a vacuum seal portion. In the figure, 1 is a partition wall, 2 is a shaft, 3 is a sealing member, 4 is an O-ring, 5 is a film, 6 is a side surface, 7 is a groove, and 8 is a holding jig.

【0009】図2(a)に示すように,シール部材3
は,Oリング4を嵌め込むためのリング状の溝7が設け
られ,その溝7の内側は,厚さ0.2〜0.3mmの薄
い膜5を介して摺動する軸2と接している。溝7の外側
側面6は底面に向かって狭まる傾斜が付いている。
As shown in FIG. 2A, the seal member 3
Is provided with a ring-shaped groove 7 into which the O-ring 4 is fitted, and the inside of the groove 7 is in contact with the shaft 2 sliding through a thin film 5 having a thickness of 0.2 to 0.3 mm. There is. The outer side surface 6 of the groove 7 is inclined so as to narrow toward the bottom surface.

【0010】シール部材3の材料は四弗化エチレン(テ
フロン)のようなある程度柔らかく,且つ摩擦の少ない
材料が好ましい。軸2が摺動しているときには,Oリン
グ4は開放状態で,シール部材3の薄い膜5には力が掛
かっていない。
The material of the seal member 3 is preferably a material such as ethylene tetrafluoride (Teflon) which is soft to some extent and has little friction. When the shaft 2 is sliding, the O-ring 4 is in an open state, and no force is applied to the thin film 5 of the seal member 3.

【0011】半導体基板等の搬送のための摺動が終わ
り,真空シールが必要になると,先ず始めに,押さえ治
具8が上に上がってOリング4を溝7の中に押し込む。
すると,Oリング4は溝7の側面6のテーパーにより軸
2の方向に押圧される。そこで,シール部材3の薄い膜
5がOリング4に圧迫されて,軸2を締め付て,隔壁1
の大気側と真空側を完全に遮断し,真空シールが完成す
る。
When the sliding for carrying the semiconductor substrate or the like is completed and the vacuum sealing is required, first, the pressing jig 8 is moved up to push the O-ring 4 into the groove 7.
Then, the O-ring 4 is pressed in the direction of the shaft 2 by the taper of the side surface 6 of the groove 7. Then, the thin film 5 of the seal member 3 is pressed against the O-ring 4 and the shaft 2 is tightened, and the partition wall 1
The atmosphere side and the vacuum side are completely cut off, and the vacuum seal is completed.

【0012】このシール構造を採用すると,Oリング4
等の磨耗によるごみの発生が少なくなり,シール性も良
好である。即ち,本発明の目的は,図1(a)に示すよ
うに,該隔壁1に, 該隔壁1と該軸2との間を埋めるシ
ール部材3を設け, 該シール部材3には, Oリング4と
該軸2との間が円筒状の膜5からなり, かつ, 反対側が
底部方向に狭いテーパー状の側面6からなる, 該Oリン
グ4を嵌め込むリング状の溝7を設け, 図1(b)に示
すように,該Oリング4を押さえ治具8で押圧すること
により, 該Oリング4が変形して該膜5を圧迫し, 該膜
5が該軸2を締め付けて, 真空装置の真空を保つことに
より達成される。
If this seal structure is adopted, the O-ring 4
Less dust is generated due to abrasion and the sealing performance is good. That is, as shown in FIG. 1 (a), the object of the present invention is to provide the partition wall 1 with a seal member 3 filling the space between the partition wall 1 and the shaft 2, and the seal member 3 is provided with an O-ring. 4 is provided with a cylindrical film 5 between the shaft 4 and the shaft 2, and a ring-shaped groove 7 into which the O-ring 4 is fitted, the opposite side having a tapered side surface 6 narrowing toward the bottom, As shown in (b), when the O-ring 4 is pressed by the pressing jig 8, the O-ring 4 is deformed and presses against the film 5, and the film 5 tightens the shaft 2 to form a vacuum. This is accomplished by maintaining a vacuum on the device.

【0013】[0013]

【作用】本発明のような方法を用いると,Oリングの押
え治具による固定,或いは,解除によりシール部材に掛
かる力を変えることができる。軸が摺動する非固定の時
にはシール部材に掛かる力が少なく,従って,磨耗が少
なくなり,ごみの発生も殆どなくなる。
When the method according to the present invention is used, the force applied to the seal member can be changed by fixing or releasing the O-ring with a holding jig. When the shaft slides and is not fixed, the force exerted on the seal member is small, therefore wear is reduced and dust is hardly generated.

【0014】そして,シール効果が必要な時には,シー
ル部材に掛かる力を強くすることができる。
When the sealing effect is required, the force applied to the sealing member can be increased.

【0015】[0015]

【実施例】図2は本発明の一実施例で説明する真空加熱
装置である。図において,1は隔壁,2は軸,3はシー
ル部材,4はOリング,5は膜,6は側面,7は溝,8
は押え治具,9は半導体基板,10は熱板, 11は断熱材,
12は蓋, 13は支持板, 14はヒータ, 15は基板, 16はクラ
ンプシリンダ, 17は熱板上下シリンダ, 18は継ぎ部材で
ある。
EXAMPLE FIG. 2 shows a vacuum heating apparatus explained in an example of the present invention. In the figure, 1 is a partition wall, 2 is a shaft, 3 is a sealing member, 4 is an O-ring, 5 is a film, 6 is a side surface, 7 is a groove, 8
Is a holding jig, 9 is a semiconductor substrate, 10 is a hot plate, 11 is a heat insulating material,
12 is a lid, 13 is a support plate, 14 is a heater, 15 is a substrate, 16 is a clamp cylinder, 17 is a heating plate upper and lower cylinder, and 18 is a joint member.

【0016】図2(a)に示すように,半導体基板9を
搬送するために,熱板10を貫通して,上下に摺動する軸
2が設けられている。この軸2は,は真空チャンバ内に
半導体基板9を挿入する時には,熱板10の上に突出して
いて,半導体基板9をロボット等により横方向から受け
取る。真空加熱処理をする時には,図2(b)に示すよ
うに,熱板10が上に上がり,上の蓋12に断熱材11の部分
が当たって密閉され,排気装置で所定の真空度に排気さ
れる。その後,ヒータ14を通して熱板10が加熱され, 其
にともない, 半導体基板9が真空加熱される。
As shown in FIG. 2 (a), a shaft 2 which penetrates the heat plate 10 and slides vertically is provided for carrying the semiconductor substrate 9. When the semiconductor substrate 9 is inserted into the vacuum chamber, the shaft 2 projects above the heating plate 10 and receives the semiconductor substrate 9 from the lateral direction by a robot or the like. When performing the vacuum heat treatment, as shown in FIG. 2 (b), the heat plate 10 rises up and the upper lid 12 is contacted with the heat insulating material 11 to be hermetically sealed, and exhausted to a predetermined vacuum degree by an exhaust device. To be done. After that, the heating plate 10 is heated through the heater 14, and the semiconductor substrate 9 is vacuum-heated accordingly.

【0017】図においては,軸2が固定しており,熱板
10が上下するが,熱板10が固定で,軸2が上下しても同
じである。図3はシール部材3の詳細図である。シール
部材3は真空装置の隔壁となる熱板10, 及びヒータ14に
直接に接しないように継ぎ部材18に装着されて大気側に
突き出している。そして, 継ぎ部材18は熱板10にねじ込
まれている。
In the figure, the shaft 2 is fixed and the heat plate
Although 10 moves up and down, it is the same when the heating plate 10 is fixed and the shaft 2 moves up and down. FIG. 3 is a detailed view of the seal member 3. The seal member 3 is attached to the joint member 18 so as not to be in direct contact with the heating plate 10 serving as the partition wall of the vacuum device and the heater 14, and protrudes to the atmosphere side. The joint member 18 is screwed into the hot plate 10.

【0018】実際の真空シールはシール部材3の薄い膜
5をOリング4で押さえることにより行われる。これ
は,図に示す押さえ治具8をクランプシリンダ6で押す
ことにより行われる。
The actual vacuum sealing is performed by pressing the thin film 5 of the sealing member 3 with the O-ring 4. This is done by pushing the holding jig 8 shown in the figure with the clamp cylinder 6.

【0019】シール部材3の形状は,摺動する軸2の間
で,シールする薄い膜5とOリングを押圧するための斜
めの溝がある構造を有していれば,その他の形状はどん
な形をとっても良い。
The shape of the seal member 3 is not limited to any other shape as long as it has a structure in which a thin film 5 to be sealed and an oblique groove for pressing the O-ring are provided between the sliding shafts 2. You can take the shape.

【0020】[0020]

【発明の効果】以上説明したように, 本発明によれば,
従来のOリングの直接摺動する方式に比して,シールの
薄い膜を摺動時にはOリングよりフリーにし,真空時に
はOリングを介してシールの薄い膜を摺動する軸に押し
付けて真空を保持することにより,シール部分の摩擦が
軽減されて, ごみの発生を抑えることができる。
As described above, according to the present invention,
Compared to the conventional method of directly sliding the O-ring, the thin film of the seal is made freer than the O-ring when sliding, and when the vacuum is applied, the thin film of the seal is pressed against the sliding shaft through the O-ring to create a vacuum. By holding it, the friction of the seal part is reduced and the generation of dust can be suppressed.

【0021】これにより,半導体プロセスの品質向上に
大いに寄与するものである。
This greatly contributes to the quality improvement of the semiconductor process.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の原理説明図FIG. 1 is an explanatory view of the principle of the present invention.

【図2】 本発明の一実施例の説明図(その1)FIG. 2 is an explanatory diagram (1) of an embodiment of the present invention.

【図3】 本発明の一実施例の説明図(その2)FIG. 3 is an explanatory diagram of an embodiment of the present invention (part 2).

【図4】 従来例の説明図FIG. 4 is an explanatory diagram of a conventional example.

【符号の説明】[Explanation of symbols]

1 隔壁 2 軸 3 シール部材 4 Oリング 5 膜 6 側面 7 溝 8 押さえ治具 9 半導体基板 10 熱板 11 は断熱材 12 蓋 13 支持板 14 ヒータ 15 基板 16 クランプシリンダ 17 熱板上下シリンダ 18 継ぎ部材 1 partition wall 2 shaft 3 sealing member 4 O-ring 5 film 6 side surface 7 groove 8 holding jig 9 semiconductor substrate 10 hot plate 11 is a heat insulating material 12 lid 13 support plate 14 heater 15 substrate 16 clamp cylinder 17 hot plate upper and lower cylinder 18 joint member

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 真空装置の隔壁(1) と該隔壁を貫通する
軸(2) との間の真空シール方法であって,該隔壁(1)
に, 該隔壁(1) と該軸(2) との間を埋めるシール部材
(3) を設け,該シール部材(3) には, Oリング(4) と該
軸(2) との間が円筒状の膜(5) からなり, かつ, 反対側
が底部方向に狭いテーパー状の側面(6) からなる, 該O
リング(4) を嵌め込むリング状の溝(7) を設け, 該Oリ
ング(4) を押さえ治具(8) で押圧することにより, 該O
リング(4) が変形して該膜(5) を圧迫し, 該膜(5) が該
軸(2) を締め付けて, 真空装置の真空を保つことを特徴
とする真空シール方法。
1. A vacuum sealing method between a partition (1) of a vacuum device and a shaft (2) penetrating the partition, the partition (1)
And a seal member filling the space between the partition wall (1) and the shaft (2)
(3) is provided, and the sealing member (3) is composed of a cylindrical membrane (5) between the O-ring (4) and the shaft (2), and the opposite side has a narrow taper shape toward the bottom. Side (6) of the O
By providing a ring-shaped groove (7) into which the ring (4) is fitted and pressing the O-ring (4) with a holding jig (8),
A vacuum sealing method, characterized in that the ring (4) is deformed to press the membrane (5), the membrane (5) clamps the shaft (2), and the vacuum of the vacuum device is maintained.
JP4078086A 1992-04-01 1992-04-01 Vacuum seal method Withdrawn JPH05280647A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4078086A JPH05280647A (en) 1992-04-01 1992-04-01 Vacuum seal method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4078086A JPH05280647A (en) 1992-04-01 1992-04-01 Vacuum seal method

Publications (1)

Publication Number Publication Date
JPH05280647A true JPH05280647A (en) 1993-10-26

Family

ID=13652041

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4078086A Withdrawn JPH05280647A (en) 1992-04-01 1992-04-01 Vacuum seal method

Country Status (1)

Country Link
JP (1) JPH05280647A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11145271A (en) * 1997-11-05 1999-05-28 Tokyo Electron Ltd Wafer holder
JP2004271045A (en) * 2003-03-07 2004-09-30 Matsushita Electric Ind Co Ltd Fluid draining device
WO2010142022A1 (en) * 2009-06-08 2010-12-16 Noetic Technologies Inc. Seal assembly
JP2021047335A (en) * 2019-09-19 2021-03-25 株式会社Screenホールディングス Substrate processing apparatus

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11145271A (en) * 1997-11-05 1999-05-28 Tokyo Electron Ltd Wafer holder
JP2004271045A (en) * 2003-03-07 2004-09-30 Matsushita Electric Ind Co Ltd Fluid draining device
WO2010142022A1 (en) * 2009-06-08 2010-12-16 Noetic Technologies Inc. Seal assembly
CN102459968A (en) * 2009-06-08 2012-05-16 诺伊蒂克技术股份有限公司 Seal assembly
AU2010258039B2 (en) * 2009-06-08 2013-09-26 Noetic Technologies Inc. Seal assembly
CN102459968B (en) * 2009-06-08 2015-07-22 诺伊蒂克技术股份有限公司 Seal assembly
US9243715B2 (en) 2009-06-08 2016-01-26 Noetic Technologies Inc. Seal assembly
JP2021047335A (en) * 2019-09-19 2021-03-25 株式会社Screenホールディングス Substrate processing apparatus

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Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990608