JPH05279170A - Unit for pulling up silicon single crystal - Google Patents

Unit for pulling up silicon single crystal

Info

Publication number
JPH05279170A
JPH05279170A JP10350292A JP10350292A JPH05279170A JP H05279170 A JPH05279170 A JP H05279170A JP 10350292 A JP10350292 A JP 10350292A JP 10350292 A JP10350292 A JP 10350292A JP H05279170 A JPH05279170 A JP H05279170A
Authority
JP
Japan
Prior art keywords
silicon
single crystal
pulling
quartz crucible
silicon single
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10350292A
Other languages
Japanese (ja)
Other versions
JP2785578B2 (en
Inventor
Yoshihiko Yamada
好彦 山田
Michiaki Oda
道明 小田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Priority to JP4103502A priority Critical patent/JP2785578B2/en
Publication of JPH05279170A publication Critical patent/JPH05279170A/en
Application granted granted Critical
Publication of JP2785578B2 publication Critical patent/JP2785578B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To provide a single crystal-pulling up unit which can inhibit the crystals from becoming polycrystalline and increase the production efficiency. CONSTITUTION:In the silicon single crystal-pulling up unit where molten silicon is held in the quartz crucible, the seed crystal hung down from the top is dipped in the silicon melt and the single crystal is pulled up where the silicon melt is always kept constant at the same level in the quartz 24, a skirt-like thermal insulator 33 is set on the outer periphery of the support 26 for holding the quartz crucible 24 through the graphite crucible 25 so that the tail of the insulator comes near to the heater. Further, in this case, the insulator is constituted from graphite, silicon nitride, silicon carbide, ceramic containing silicon carbide fibers, carbon fibers or their combination.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、チョクラルスキー法
(以下CZ法と称する。)によるシリコン単結晶の引上
げ装置に関するもので、さらに詳しくは、シリコン融液
の液面を一定高さに保持しつつシリコン単結晶の引上げ
を行うシリコン単結晶の引上げ装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for pulling a silicon single crystal by the Czochralski method (hereinafter referred to as CZ method), and more specifically, it holds a liquid surface of a silicon melt at a constant height. The present invention also relates to a silicon single crystal pulling apparatus for pulling a silicon single crystal.

【0002】[0002]

【従来の技術】CZ法によるシリコン単結晶の引上げ装
置の従来例の模式図が図2に示されている。この図2に
基づいて当該シリコン単結晶の引上げ装置の概要を説明
すれば、この引上げ装置1はメインチャンバ2とその上
のプルチャンバ3とからなり、その間にはゲートバルブ
1aが設けられている。
2. Description of the Related Art A schematic view of a conventional example of a silicon single crystal pulling apparatus by the CZ method is shown in FIG. The silicon single crystal pulling apparatus will be briefly described with reference to FIG. 2. The pulling apparatus 1 includes a main chamber 2 and a pull chamber 3 above the main chamber 2, and a gate valve 1a is provided between them.

【0003】ここで、下側のメインチャンバ2には、そ
の中央に、シリコン融液を保持するための石英るつぼ4
が黒鉛るつぼ5にはまり合った状態で設けられ、これら
るつぼ4、5はサポート6によって回転可能に支持され
ている。また、黒鉛るつぼ5の周りにはヒータ7が設け
られ、さらにその周りにはヒートシールド8が設けられ
ている。またさらに、メインチャンバ2のショルダに
は、石英るつぼ4内のシリコン融液9から引き上げられ
るシリコン単結晶10の直径を監視する直径制御用光学
系直径検出器11が設置されている。
Here, the lower main chamber 2 has a quartz crucible 4 for holding a silicon melt in the center thereof.
Are provided so as to fit in a graphite crucible 5, and these crucibles 4 and 5 are rotatably supported by a support 6. A heater 7 is provided around the graphite crucible 5, and a heat shield 8 is provided around the heater 7. Furthermore, a diameter control optical system diameter detector 11 for monitoring the diameter of the silicon single crystal 10 pulled up from the silicon melt 9 in the quartz crucible 4 is installed in the shoulder of the main chamber 2.

【0004】このように構成された引上げ装置1による
シリコン単結晶の引上げは、石英るつぼ4中のシリコン
融液9に、ワイヤ12で懸吊された種結晶10aを浸
し、種結晶10aと石英るつぼ4とを同方向あるいは逆
方向に回転しながら引き上げることによって行われる。
The pulling of the silicon single crystal by the pulling apparatus 1 configured as described above is carried out by immersing the seed crystal 10a suspended by the wire 12 in the silicon melt 9 in the quartz crucible 4 to form the seed crystal 10a and the quartz crucible. It is carried out by pulling up while rotating 4 and 4 in the same direction or in the opposite direction.

【0005】ところで、シリコン単結晶10の直径制御
を精度良く行うためには、常に、直径制御用光学系直径
検出器11がシリコン融液9とシリコン単結晶10との
界面に向いている必要があるが、石英るつぼ4の位置が
高さ方向で一定であると、シリコン融液9とシリコン単
結晶10との界面は、結晶引上げとともに、下方に移行
してしまうことになるので、シリコン単結晶10の直径
制御がうまく行えないことになる。
By the way, in order to accurately control the diameter of the silicon single crystal 10, the diameter control optical system diameter detector 11 must always face the interface between the silicon melt 9 and the silicon single crystal 10. However, if the position of the quartz crucible 4 is constant in the height direction, the interface between the silicon melt 9 and the silicon single crystal 10 will move downward as the crystal is pulled up. The diameter control of 10 cannot be performed well.

【0006】そこで、従来の引上げ装置では、直径制御
用光学系直径検出器11を固定的に設けるとともに、結
晶引上げに伴ってシリコン融液9が減った分だけ、サポ
ート6によって石英るつぼ4を押し上げてシリコン融液
9の液面を常に一定に保つことが行われている。
Therefore, in the conventional pulling apparatus, the diameter control optical system diameter detector 11 is fixedly provided, and the quartz crucible 4 is pushed up by the support 6 by the amount of the silicon melt 9 reduced by the crystal pulling. Therefore, the liquid surface of the silicon melt 9 is always kept constant.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、前記引
上げ装置1によってシリコン単結晶10を引き上げる場
合には、従来、次のような不都合があった。
However, in the case of pulling the silicon single crystal 10 by the pulling apparatus 1, there have been the following disadvantages in the past.

【0008】すなわち、前記引上げ装置1では、メイン
チャンバ2内に固定的に設けられたヒータ7が、石英る
つぼ4の押上げに伴って、当該石英るつぼ4に相対して
下降すること、また、シリコン融液9の液量の減少によ
ってシリコン融液9全体の熱容量が小さくなることと黒
鉛るつぼ5の下部の空間が広くなり放熱が大となること
から、シリコン融液9の液面温度が当初に比べて低くな
ってしまう。その結果、石英るつぼ4内のシリコン融液
9が周りから固化したり、また、シリコン融液9の液面
から蒸発したSiOが石英るつぼ4内面に付着して固化
し、これが石英るつぼ4に落下して結晶中に取り込ま
れ、結晶の多結晶化が起こるなどの不都合があった。
That is, in the pulling apparatus 1, the heater 7 fixedly provided in the main chamber 2 descends relative to the quartz crucible 4 as the quartz crucible 4 is pushed up. Since the heat capacity of the entire silicon melt 9 is reduced due to the decrease in the amount of the silicon melt 9 and the space under the graphite crucible 5 is widened to increase the heat dissipation, the liquid surface temperature of the silicon melt 9 is initially increased. It will be lower than. As a result, the silicon melt 9 in the quartz crucible 4 solidifies from the surroundings, or SiO evaporated from the liquid surface of the silicon melt 9 adheres to the inner surface of the quartz crucible 4 and solidifies, and this falls into the quartz crucible 4. Then, it was taken into the crystal, and there was a problem that the crystal was polycrystallized.

【0009】本発明は、このような問題を解消するため
になされたもので、結晶の多結晶化を防止でき、生産効
率を高めることが可能な引上げ装置を提供することを目
的としている。
The present invention has been made to solve such a problem, and an object of the present invention is to provide a pulling device capable of preventing polycrystallization of crystals and enhancing production efficiency.

【0010】[0010]

【課題を解決するための手段】上記目的を達成すべく本
発明は、石英るつぼ内にシリコン融液を保持し、上から
吊り下げた種結晶を前記シリコン融液に浸し、シリコン
単結晶を引き上げるにあたり、石英るつぼのシリコン融
液の液面位置を常に同一高さに保持するようにしたシリ
コン単結晶の引上げ装置において、前記石英るつぼを黒
鉛るつぼを介して下側から支えるサポートの外周に、裾
先がヒータに近接するスカート状の断熱部を設けたもの
である。この場合、断熱部は、黒鉛か、窒化珪素、炭化
珪素及びシリコンカーバイトファイバ含有のセラミック
スか、カーボンファイバか、若しくはこれらの組合わせ
から構成されていることが好ましい。
In order to achieve the above object, the present invention is to hold a silicon melt in a quartz crucible, immerse a seed crystal suspended from above into the silicon melt, and pull up a silicon single crystal. In the pulling device for a silicon single crystal, which is designed to always keep the liquid level position of the silicon melt of the quartz crucible at the same height, in the outer periphery of the support that supports the quartz crucible from below through the graphite crucible, The tip is provided with a skirt-shaped heat insulating portion close to the heater. In this case, the heat insulating portion is preferably made of graphite, ceramics containing silicon nitride, silicon carbide and silicon carbide fiber, carbon fiber, or a combination thereof.

【0011】[0011]

【作用】前記した手段によれば、結晶引上げに伴って、
石英るつぼが上昇した場合でも、ヒータの輻射熱を効果
的に利用できることになり、その結果、シリコン融液の
液面温度の低下を可及的に防止することができ歩留の向
上が図られ、また、その分、電力消費も低減することが
できる。
According to the above-mentioned means, when the crystal is pulled,
Even if the quartz crucible rises, it is possible to effectively use the radiant heat of the heater, and as a result, it is possible to prevent the decrease in the liquid surface temperature of the silicon melt as much as possible and improve the yield, In addition, power consumption can be reduced accordingly.

【0012】[0012]

【実施例】以下、本発明の実施例を図1の模式図に基づ
いて説明する。
Embodiments of the present invention will be described below with reference to the schematic view of FIG.

【0013】この引上げ装置21は下方に位置するメイ
ンチャンバ22とその上のプルチャンバ23とからな
り、その間には両チャンバ22、23を切離し可能なゲ
ートバルブ20が設けられている。
The pulling device 21 is composed of a main chamber 22 located below and a pull chamber 23 above it, and a gate valve 20 is provided between the main chamber 22 and the pull chamber 23 so that the chambers 22 and 23 can be separated from each other.

【0014】ここで、下側のメインチャンバ22には、
その中央に、シリコン融液を保持するための石英るつぼ
24が黒鉛るつぼ25にはまり合った状態で設けられて
いる。そして、これらるつぼ24、25はサポート26
によって回転および上下動可能に支持されている。一
方、黒鉛るつぼ25の周りにはヒータ27が設けられ、
さらにその周りにはヒートシールド28が設けられてい
る。メインチャンバ22のショルダには、石英るつぼ2
4内のシリコン融液29から引き上げられるシリコン単
結晶30の直径を監視する直径制御用光学系直径検出器
31が設置されている。ここまでの構成は、従来と同様
な構成となっている。
Here, in the lower main chamber 22,
A quartz crucible 24 for holding a silicon melt is provided in the center of the quartz crucible 25 so as to fit in the graphite crucible 25. The crucibles 24 and 25 are supported by the support 26.
It is supported so that it can rotate and move up and down. On the other hand, a heater 27 is provided around the graphite crucible 25,
Further, a heat shield 28 is provided around it. The quartz crucible 2 is installed in the shoulder of the main chamber 22.
An optical system diameter detector 31 for diameter control for monitoring the diameter of the silicon single crystal 30 pulled up from the silicon melt 29 in 4 is installed. The configuration up to this point is similar to the conventional configuration.

【0015】本実施例では、このように構成された引上
げ装置21のサポート26の外周に断熱部33を設けて
いる。この断熱部33はスカート形状をなしている。こ
の断熱部33は、特に制限はされないが、黒鉛からなる
ものや、窒化珪素、炭化珪素及びシリコンカーバイトフ
ァイバ含有のセラミックスを黒鉛で覆ったものや、カー
ボンファイバを黒鉛で覆ったもの或いはそれ等の複合体
等、断熱効果の大きい材質のものによって形成されてい
る。なお、セラミックなど汚染源となる可能性のある材
質によって断熱部を形成する場合には、チャンバ内の汚
染を防止するため、その周りを黒鉛で完全に覆うことが
望ましい。また、スカート形状の断熱部33の裾は出来
るだけ下側に延び、かつ裾先がヒータ24に出来るだけ
近接していることが望ましい。
In the present embodiment, the heat insulating portion 33 is provided on the outer periphery of the support 26 of the pulling device 21 thus constructed. The heat insulating portion 33 has a skirt shape. The heat insulating portion 33 is not particularly limited, but is made of graphite, ceramics containing silicon nitride, silicon carbide, and silicon carbide fibers are covered with graphite, carbon fibers are covered with graphite, or the like. It is formed of a material having a large heat insulating effect such as a composite body of. When the heat insulating portion is formed of a material that may become a pollution source such as ceramics, it is desirable to completely cover the surrounding area with graphite in order to prevent the inside of the chamber from being polluted. Further, it is desirable that the skirt of the skirt-shaped heat insulating portion 33 extends downward as much as possible, and that the hem is as close as possible to the heater 24.

【0016】このように構成された実施例のシリコン単
結晶の引上げ装置21によれば、下記のような効果を得
ることができる。
According to the silicon single crystal pulling apparatus 21 of the embodiment thus configured, the following effects can be obtained.

【0017】すなわち、断熱部33が設けられているこ
とから、結晶引上げに伴って、石英るつぼ24が上昇し
た場合でも、ヒータ27の輻射熱が黒鉛るつぼ25下方
に逃げなくなり、その結果、ヒータ27の熱を効果的に
利用できシリコン融液29の液面温度の低下を可及的に
防止することができ歩留の向上が図られ、また、その
分、電力消費も低減することができる。ちなみに、8イ
ンチのシリコン単結晶引上げ機を例にとれば、従来の装
置の平均電力は140kwであったものが、本実施例の
ものでは134kwに低減できた。また、従来のもので
は平均電力を140kwとした場合でも20パーセント
程度のシリコン融液のるつぼ残があったが、本実施例の
ものではるつぼ残をほぼなくすことができた。
That is, since the heat insulating portion 33 is provided, even if the quartz crucible 24 rises as the crystal is pulled up, the radiant heat of the heater 27 does not escape below the graphite crucible 25, and as a result, the heater 27 The heat can be effectively used, and the drop of the liquid surface temperature of the silicon melt 29 can be prevented as much as possible, the yield can be improved, and the power consumption can be correspondingly reduced. By the way, taking an 8-inch silicon single crystal pulling machine as an example, the average power of the conventional apparatus was 140 kW, but it could be reduced to 134 kW in this example. Further, in the conventional case, there was about 20% of the crucible residue of the silicon melt even when the average power was 140 kW, but in the case of this example, the crucible residue could be almost eliminated.

【0018】以上、本発明の実施例の引上げ装置につい
て説明したが、本発明は、かかる実施例に限定されるも
のではなく、その要旨を逸脱しない範囲において種々の
変形が可能であることはいうまでもない。
Although the pulling device according to the embodiment of the present invention has been described above, the present invention is not limited to the embodiment and various modifications can be made without departing from the scope of the invention. There is no end.

【0019】[0019]

【発明の効果】以上のように本発明によれば、石英るつ
ぼ内にシリコン融液を保持し、上から吊り下げた種結晶
を前記シリコン融液に浸し、シリコン単結晶を引き上げ
るようにしたシリコン結晶の引上げ装置において、前記
石英るつぼを下側から支えるるつぼサポートの外周に、
裾先がヒータに近接するスカート状の断熱体を設けたの
で、シリコン融液の液面温度の低下を可及的に防止する
ことができ、歩留の向上が図られ、また、その分、電力
消費も低減することができる。
As described above, according to the present invention, a silicon melt is held in a quartz crucible, a seed crystal suspended from above is immersed in the silicon melt, and a silicon single crystal is pulled up. In the crystal pulling device, on the outer periphery of the crucible support that supports the quartz crucible from below,
Since the skirt-shaped heat insulator whose hem is close to the heater is provided, it is possible to prevent the drop of the liquid surface temperature of the silicon melt as much as possible, and the yield is improved. Power consumption can also be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例の引上げ機の模式図である。FIG. 1 is a schematic diagram of a lifting machine according to an embodiment.

【図2】従来の引上げ機の模式図である。FIG. 2 is a schematic view of a conventional pulling machine.

【符号の説明】[Explanation of symbols]

21 引上げ機 24 石英るつぼ 26 サポート 27 ヒータ 21 pulling machine 24 quartz crucible 26 support 27 heater

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 石英るつぼ内にシリコン融液を保持し、
上から吊り下げた種結晶を前記シリコン融液に浸し、シ
リコン単結晶を引き上げるにあたり、石英るつぼのシリ
コン融液の液面位置を常に同一高さに保持するようにし
たシリコン単結晶の引上げ装置において、前記石英るつ
ぼを黒鉛るつぼを介して下側から支えるサポートの外周
に、裾先がヒータに近接するスカート状の断熱部を設け
たことを特徴とするシリコン単結晶の引上げ装置。
1. A silicon melt is held in a quartz crucible,
A seed crystal hung from above is immersed in the silicon melt, and in pulling up the silicon single crystal, in a silicon single crystal pulling device that always holds the liquid level position of the silicon melt in the quartz crucible at the same height. A pulling device for a silicon single crystal, characterized in that a skirt-shaped heat insulating portion having a hem near the heater is provided on the outer periphery of a support that supports the quartz crucible from below via a graphite crucible.
【請求項2】 断熱部は、黒鉛か、窒化珪素、炭化珪素
及びシリコンカーバイトファイバ含有のセラミックス
か、カーボンファイバか、若しくはこれらの組合わせか
ら構成されていることを特徴とする請求項1記載のシリ
コン単結晶の引上げ装置。
2. The heat insulating portion is made of graphite, ceramics containing silicon nitride, silicon carbide and silicon carbide fiber, carbon fiber, or a combination thereof. Silicon single crystal pulling device.
JP4103502A 1992-03-30 1992-03-30 Silicon single crystal pulling equipment Expired - Lifetime JP2785578B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4103502A JP2785578B2 (en) 1992-03-30 1992-03-30 Silicon single crystal pulling equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4103502A JP2785578B2 (en) 1992-03-30 1992-03-30 Silicon single crystal pulling equipment

Publications (2)

Publication Number Publication Date
JPH05279170A true JPH05279170A (en) 1993-10-26
JP2785578B2 JP2785578B2 (en) 1998-08-13

Family

ID=14355758

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4103502A Expired - Lifetime JP2785578B2 (en) 1992-03-30 1992-03-30 Silicon single crystal pulling equipment

Country Status (1)

Country Link
JP (1) JP2785578B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009023867A (en) * 2007-07-19 2009-02-05 Hitachi Cable Ltd Manufacturing method of semiconductor crystal and its manufacturing apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589895A (en) * 1981-07-08 1983-01-20 Sumitomo Electric Ind Ltd Side heating type crucible

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589895A (en) * 1981-07-08 1983-01-20 Sumitomo Electric Ind Ltd Side heating type crucible

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009023867A (en) * 2007-07-19 2009-02-05 Hitachi Cable Ltd Manufacturing method of semiconductor crystal and its manufacturing apparatus

Also Published As

Publication number Publication date
JP2785578B2 (en) 1998-08-13

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