JPH05264942A - Method and device for washing substrate after rubbing treatment - Google Patents

Method and device for washing substrate after rubbing treatment

Info

Publication number
JPH05264942A
JPH05264942A JP9472992A JP9472992A JPH05264942A JP H05264942 A JPH05264942 A JP H05264942A JP 9472992 A JP9472992 A JP 9472992A JP 9472992 A JP9472992 A JP 9472992A JP H05264942 A JPH05264942 A JP H05264942A
Authority
JP
Japan
Prior art keywords
substrate
cleaning
pure water
chamber
washing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9472992A
Other languages
Japanese (ja)
Other versions
JP2729723B2 (en
Inventor
Tsugio Nakamura
次雄 中村
Satoshi Suzuki
聡 鈴木
Mitsuaki Yoshitani
光明 芳谷
Akio Tsuchiya
昭夫 土屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP9472992A priority Critical patent/JP2729723B2/en
Publication of JPH05264942A publication Critical patent/JPH05264942A/en
Application granted granted Critical
Publication of JP2729723B2 publication Critical patent/JP2729723B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To prevent generation of uneven washing on the surface of a substrate by covering lamellately the whole surface of the substrate with pure water flowing on the substrate until the time point when washing is started. CONSTITUTION:The substrate washing device is constituted by providing successively and continuously a pre-stage treating chamber 10, an ultrasonic chamber 12, a spray washing chamber 14 and a draining chamber 16. Also, in each chamber thereof, carrying rollers 18 for carrying a substrate W are provided in one line. When the substrate W subjected to rubbing treatment is fed in, first of all, to the substrate W, pure water 28 is supplied in a form of curtain from a high pressure spray tube 20 in the pre-stage treating chamber 10, and the whole surface is covered lamellately and quickly with pure water being in a flowing state and is wetted. The pure water 28 is supplied to the surface of the substrate W from the high pressure spray tube 20 in the direction reverse to the substrate carrying direction, therefore, it does not occur that mist of the pure water sticks to the part on the surface of the substrate W which had already past through a flowing down position of the pure water 28 to cause unevenness, and in a washing process of the substrate, the orientation performance of an oriented film is maintained, and an LCD having averaged display quality can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、液晶表示素子(LC
D)の製造工程における配向膜形成プロセスにおいて、
液晶用基板の表面にポリイミドなどの高分子膜を塗布し
その膜面をラビング処理した後に基板表面を洗浄する方
法並びにその方法の実施に使用する基板洗浄装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a liquid crystal display device (LC
In the alignment film forming process in the manufacturing process of D),
The present invention relates to a method for coating a surface of a liquid crystal substrate with a polymer film such as polyimide, rubbing the film surface, and then cleaning the substrate surface, and a substrate cleaning apparatus used for implementing the method.

【0002】[0002]

【従来の技術】LCDの配向膜は、ガラス基板上に形成
された電極面を被覆するようにポリイミド等の高分子膜
を基板表面に塗布し、その膜面をナイロンやポリエステ
ル等の布帛で一定方向に擦ってラビング処理した後、そ
のラビング処理において発生した削り滓を除去するため
に基板表面を洗浄して形成される。この場合、基板表面
の洗浄は、ラビングで生じた配向性能が変化しないよう
な方法によって行なわれ、従来は、イソプロピルアルコ
ール(IPA)やフロンなどの溶剤を使用して基板の洗
浄・乾燥処理を行なっていた。
2. Description of the Related Art As an alignment film for LCD, a polymer film such as polyimide is applied to the surface of a substrate so as to cover an electrode surface formed on a glass substrate, and the film surface is fixed with a cloth such as nylon or polyester. After rubbing by rubbing in the direction, the substrate surface is washed to remove shavings generated in the rubbing treatment. In this case, the substrate surface is cleaned by a method that does not change the alignment performance caused by rubbing, and conventionally, the substrate is cleaned and dried using a solvent such as isopropyl alcohol (IPA) or Freon. Was there.

【0003】しかしながら、IPAやフロン等の溶剤を
用いた洗浄方法ではバッチ式処理となり、このため、高
周波、超音波等を利用した物理的洗浄手段を有効に使用
することができず、また、溶剤、特にフロンは、その使
用が規制されており、今後使用できなくなる可能性が高
い。これらの理由から、最近では、洗浄剤として水系洗
浄液又は純水を使用し、洗浄装置の型式が枚葉処理方式
のものに変わりつつある。例えば、特開平3−6201
8号公報には、配向膜の膜面を純水で超音波洗浄する方
法が開示されている。また、特開平3−81730号公
報には、配向膜表面に水を流しながら、配向膜表面をラ
ビング処理方向と同一方向にスクラブ処理(ブラシや
布、スポンジ等で配向膜表面を擦る処理)する方法が開
示されている。
However, the cleaning method using a solvent such as IPA or chlorofluorocarbon is a batch type treatment, and therefore, physical cleaning means utilizing high frequency waves or ultrasonic waves cannot be effectively used, and the solvent is not used. , Especially the use of CFCs is regulated, and there is a high possibility that CFCs will no longer be usable. For these reasons, recently, the type of cleaning device is changing to a single-wafer processing type using an aqueous cleaning liquid or pure water as a cleaning agent. For example, JP-A-3-6201
Japanese Unexamined Patent Publication No. 8 discloses a method of ultrasonically cleaning the surface of the alignment film with pure water. Further, in Japanese Patent Application Laid-Open No. 3-81730, scrubbing is performed on the surface of the alignment film in the same direction as the rubbing direction (a treatment of rubbing the surface of the alignment film with a brush, cloth, sponge, etc.) while flowing water on the surface of the alignment film. A method is disclosed.

【0004】[0004]

【発明が解決しようとする課題】ところが、水や純水な
どの洗浄液によってラビング処理後の基板表面を洗浄し
た場合、基板表面が純水等によって濡れ始める時期に基
板表面に洗浄むらがしばしば発生し、その洗浄むらが消
えずに基板表面にそのまま残ってしまうことが起こる。
この結果、配向膜の配向性能が変化し、製造されたLC
Dの表示品質に大きな悪影響を及ぼすことになる。基板
表面に洗浄むらが発生する原因として、配向膜を構成す
るポリイミド等の高分子膜は、基板に対する密着強化の
ため、下地面にシランカップリング剤のような界面活性
剤を塗布しているが、基板洗浄に際しての入水時にその
一部が溶出し、その溶出した薬剤が基板表面に瞬時に固
着して洗浄むらとなる、といったことが考えられる。
尚、界面活性剤の溶出に起因する洗浄むらは、基板表面
を中性洗剤により洗浄すれば消失することもあるが、チ
ルト角の大きいSTN(スーパー・ツイステッド・ネマ
ティック)型LCDでは、洗剤成分によってチルト角或
いは配向性能が微妙に変化してしまい、表示品質に影響
するため、洗剤を使用できない場合が多い。
However, when the substrate surface after the rubbing treatment is cleaned with a cleaning liquid such as water or pure water, uneven cleaning often occurs on the substrate surface when the substrate surface begins to get wet with pure water or the like. However, the cleaning unevenness may remain on the substrate surface without disappearing.
As a result, the alignment performance of the alignment film changes, and the manufactured LC
The display quality of D will be greatly adversely affected. As a cause of uneven cleaning on the surface of the substrate, a polymer film such as polyimide forming the alignment film is coated with a surfactant such as a silane coupling agent on the underlying surface to enhance adhesion to the substrate. It is conceivable that a part of the substance may be eluted when the substrate is washed with water, and the eluted drug may be instantly adhered to the substrate surface to cause uneven cleaning.
The cleaning unevenness due to the elution of the surfactant may be eliminated by cleaning the substrate surface with a neutral detergent, but in the STN (Super Twisted Nematic) type LCD with a large tilt angle, it may depend on the detergent component. Detergent changes in tilt angle or alignment performance affect display quality, so detergents cannot be used in many cases.

【0005】この発明は、以上のような問題点を解決す
るためになされたものであり、水や純水などの洗浄液を
使用して枚葉処理方式でラビング処理後の基板表面を洗
浄する場合に、基板表面における洗浄むらの発生を防止
することができる基板洗浄方法、並びに、その方法を実
施するための基板洗浄装置を提供することを技術的課題
とする。
The present invention has been made to solve the above problems, and in the case of cleaning the substrate surface after the rubbing treatment by a single-wafer treatment method using a cleaning liquid such as water or pure water. Further, it is a technical object to provide a substrate cleaning method capable of preventing the occurrence of cleaning unevenness on the substrate surface, and a substrate cleaning apparatus for carrying out the method.

【0006】[0006]

【課題を解決するための手段】この発明では、ラビング
処理後の基板の表面に洗浄液を供給して基板表面を洗浄
する前に、基板の表面に対し純水をカーテン状に流下さ
せながら基板を純水の流下位置に対して相対的に移動さ
せ、洗浄が開始される時点まで、基板上を流動する純水
で基板の表面全体を層状に覆うようにした。このよう
に、基板表面を純水等の洗浄液で濡らす前に、予め、基
板表面全体を純水で速やかに濡らし、基板表面全体が純
水で層状に覆われ濡れた状態にされるため、シランカッ
プリング剤等の界面活性剤の溶出が起こっても、それは
基板表面に固着しにくく、かつ、純水は基板上に滞留す
ることなく常に流動しているため、溶出した薬剤は、純
水と共に基板上から流れ落ちることになる。
According to the present invention, before the cleaning liquid is supplied to the surface of the substrate after the rubbing treatment to clean the surface of the substrate, the substrate is cleaned while flowing pure water in a curtain shape. The pure water was moved relative to the pure water flow-down position, and the entire surface of the substrate was covered in layers with pure water flowing on the substrate until the cleaning was started. As described above, before the substrate surface is wet with a cleaning liquid such as pure water, the entire substrate surface is quickly wet with pure water in advance, and the entire substrate surface is covered with pure water in a layered state so that the silane is wet. Even if the elution of the surfactant such as the coupling agent occurs, it is difficult to adhere to the substrate surface, and the pure water is always flowing without staying on the substrate. It will flow down from the substrate.

【0007】また、上記方法を実施するための基板洗浄
装置は、ラビング処理後の基板の表面に洗浄液を供給し
て基板表面を洗浄する基板洗浄手段の、基板搬送方向の
手前側に前段給水手段を配設し、その前段給水手段によ
り、基板搬送手段によって搬送されてくる基板の表面に
対し純水を基板搬送方向と逆向きにかつカーテン状に流
下させて供給するように構成されている。この場合、上
記前段給水手段における基板搬送速度が上記基板洗浄手
段における基板搬送速度より大きくなるように上記基板
搬送手段を制御するようにすると、前段給水手段によっ
て供給される純水により、基板表面全体がより速やかに
濡らされることになるので、好ましい。また、この基板
洗浄装置では、搬送移動中の基板の表面に、基板搬送方
向と逆向きに純水を供給するようにしているため、基板
表面の、純水の流下位置を通過し終わった部分に、純水
供給に伴って発生したミストが付着して基板表面にむら
を生じる、といったことが起こりにくい。
Further, the substrate cleaning apparatus for carrying out the above-mentioned method comprises a pre-stage water supply means on the front side of the substrate cleaning means for supplying a cleaning liquid to the surface of the substrate after the rubbing treatment to clean the substrate surface. Is arranged, and the pre-stage water supply means supplies pure water to the surface of the substrate conveyed by the substrate conveying means in a curtain shape in a direction opposite to the substrate conveying direction. In this case, if the substrate transfer means is controlled so that the substrate transfer speed in the pre-stage water supply means is higher than the substrate transfer speed in the substrate cleaning means, the entire surface of the substrate is covered by the pure water supplied by the pre-stage water supply means. Will be wetted more quickly, which is preferable. Further, in this substrate cleaning apparatus, since pure water is supplied to the surface of the substrate which is being transported in the direction opposite to the substrate transport direction, the portion of the substrate surface that has passed through the pure water flow-down position In addition, it is unlikely that mist generated due to the supply of pure water adheres to cause unevenness on the substrate surface.

【0008】[0008]

【実施例】以下、この発明の好適な実施例について図面
を参照しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A preferred embodiment of the present invention will be described below with reference to the drawings.

【0009】図1は、この発明に係る基板洗浄方法を実
施するための装置の概略構成の1例を示す模式的断面図
である。この基板洗浄装置は、前段処理室10、超音波洗
浄室12、スプレイ洗浄室14及び水切り室16を順次連設し
て構成されている。そして、それら各室内には、基板W
を搬送するための搬送ローラ18が一列に設けられてい
る。
FIG. 1 is a schematic sectional view showing an example of a schematic configuration of an apparatus for carrying out the substrate cleaning method according to the present invention. This substrate cleaning apparatus is configured by sequentially connecting a pretreatment chamber 10, an ultrasonic cleaning chamber 12, a spray cleaning chamber 14 and a draining chamber 16. Then, in each of these chambers, the substrate W
Conveying rollers 18 for conveying the are provided in a line.

【0010】前段処理室10には、基板搬送路の上方側に
高圧スプレイ管20が配設されている。この高圧スプレイ
管20は、純水22を貯留した純水タンク24に配管接続され
ており、高圧ポンプ26を駆動させることにより、純水タ
ンク24から高圧スプレイ管20へ純水が送給され、高圧ス
プレイ管20のノズルから純水が基板Wの表面へ噴出され
るようになっている。高圧スプレイ管20のノズルは、基
板Wの搬送方向に対し直交する方向に複数個並列して設
けられており、純水を基板Wの表面に対しカーテン状に
高圧、例えば1.8kg/cm2程度の圧力で流下させる。
また、高圧スプレイ管20は、搬送ローラ18によって搬送
されてくる基板Wに対し、その搬送方向と逆向きにカー
テン状の純水28が供給されるように、基板搬送路上方に
設置されている。
A high-pressure spray pipe 20 is disposed in the pretreatment chamber 10 above the substrate transfer path. This high-pressure spray pipe 20 is connected to a pure water tank 24 storing pure water 22 by piping, and by driving a high-pressure pump 26, pure water is fed from the pure water tank 24 to the high-pressure spray pipe 20, Pure water is ejected from the nozzle of the high-pressure spray pipe 20 onto the surface of the substrate W. A plurality of nozzles of the high-pressure spray tube 20 are provided in parallel in a direction orthogonal to the transport direction of the substrate W, and pure water is applied to the surface of the substrate W in a curtain-like high pressure, for example, 1.8 kg / cm 2 Let it flow down at a moderate pressure.
The high-pressure spray pipe 20 is installed above the substrate transport path so that the curtain-shaped pure water 28 is supplied to the substrate W transported by the transport rollers 18 in the direction opposite to the transport direction. ..

【0011】超音波洗浄室12には、超音波発生器とスプ
レイ管とを備えた超音波洗浄装置30が基板Wの搬送方向
に沿って複数並設されている。各超音波洗浄装置30のス
プレイ管は、洗浄水32を貯留した洗浄水タンク34にポン
プ36を介挿してそれぞれ配管接続されている。そして、
洗浄水タンク34からポンプ36によって超音波洗浄装置30
へ送給された洗浄水に高周波(メガヘルツ)の超音波を
付与し、超音波洗浄装置30から基板Wの表面に対し超音
波付与された洗浄水38を供給することにより、基板W表
面の洗浄が行なわれる。
In the ultrasonic cleaning chamber 12, a plurality of ultrasonic cleaning devices 30 each having an ultrasonic generator and a spray tube are arranged in parallel along the transfer direction of the substrate W. The spray pipe of each ultrasonic cleaning device 30 is connected to a cleaning water tank 34, which stores cleaning water 32, through a pump 36 so as to be connected by piping. And
Ultrasonic cleaning device 30 from wash water tank 34 by pump 36
Cleaning the surface of the substrate W by applying high-frequency (megahertz) ultrasonic waves to the cleaning water sent to the cleaning water and supplying the cleaning water 38 that has been ultrasonically applied to the surface of the substrate W from the ultrasonic cleaning device 30. Is performed.

【0012】また、スプレイ洗浄室14には、搬送ローラ
18によって搬送されてくる基板Wの表面に対し純水42を
供給するスプレイ管40が配設されている。このスプレイ
管40は、純水供給源に流路接続されている。この純水供
給源からスプレイ管40及び上記した純水タンク24へそれ
ぞれ純水が供給される。また、スプレイ管40から噴出
し、基板Wの表面の洗浄に使用された後の使用水は、洗
浄水タンク34へ送給され、超音波洗浄の洗浄水32として
再使用されるようになっている。スプレイ洗浄室14に隣
接して設けられた水切り室16には、加圧空気源に接続さ
れたエアーナイフ44が配設されている。そして、スプレ
イ洗浄室14から搬送ローラ18によって水切り室16内へ搬
送されてきた洗浄済みの基板Wの表面に向かってエアー
ナイフ44から加圧空気を吹き付けることにより、基板W
の表面の水切りが行なわれ、その水切り後に基板Wの表
面が完全に乾燥させられる。
Further, in the spray cleaning chamber 14, there are conveyance rollers.
A spray tube 40 for supplying pure water 42 to the surface of the substrate W conveyed by 18 is provided. This spray pipe 40 is connected to a pure water supply source by a flow path. Pure water is supplied from the pure water supply source to the spray pipe 40 and the pure water tank 24. The water used after being sprayed from the spray pipe 40 and used for cleaning the surface of the substrate W is fed to the cleaning water tank 34 and reused as the cleaning water 32 for ultrasonic cleaning. There is. An air knife 44 connected to a pressurized air source is arranged in the draining chamber 16 provided adjacent to the spray cleaning chamber 14. Then, the pressurized air is blown from the air knife 44 toward the surface of the cleaned substrate W which has been transported from the spray cleaning chamber 14 into the draining chamber 16 by the transport roller 18, whereby the substrate W
The surface of the substrate W is drained, and after the draining, the surface of the substrate W is completely dried.

【0013】上記構成の装置を使用してラビング処理後
の基板の表面を洗浄する場合、図示しないラビング装置
からラビング処理後の基板Wが送られてくると、まず、
基板Wは、前段処理室10内において高圧スプレイ管20か
らカーテン状に純水28が供給され、表面全体が速やかに
流動状態の純水で層状に覆われて濡らされる。このた
め、配向膜の下地として塗布されたシランカップリング
剤などの薬剤が基板上に溶出してきても、その薬剤は、
基板表面に固着することなく基板上から純水と一緒に流
れ落ちる。この場合、多数の搬送ローラ18からなる基板
搬送装置を制御し、前段処理室10内において基板Wを搬
送する速度を、後段に配設された超音波洗浄室12、スプ
レイ洗浄室14及び水切り室16内における基板搬送速度よ
りも大きくすることが好ましく、その場合には、基板W
の表面全体が瞬時に純水によって層状に覆われることに
なり、より効果が大きい。また、純水28は、高圧スプレ
イ管20から基板Wの表面へ、基板搬送方向と逆向きに供
給されるため、基板Wの表面の、純水28の流下位置を通
過し終った部分に純水のミストが付着してむらを生じる
こともない。そして、基板Wは、その表面が流動する純
水で層状に覆われて濡れた状態のまま、超音波洗浄室12
へ送られるので、超音波洗浄の過程で従来のような煙状
の洗浄むらが基板表面に発生することはない。
In the case of cleaning the surface of the substrate after the rubbing treatment using the apparatus having the above-mentioned structure, when the substrate W after the rubbing treatment is sent from a rubbing device (not shown), first,
In the pre-treatment chamber 10, the substrate W is supplied with pure water 28 in a curtain shape from the high-pressure spray tube 20, and the entire surface thereof is quickly covered with the pure water in a layered state to be wet. Therefore, even if a chemical such as a silane coupling agent applied as a base of the alignment film is eluted on the substrate, the chemical still remains
It does not stick to the surface of the substrate and flows down along with pure water from the substrate. In this case, the substrate transfer device including a large number of transfer rollers 18 is controlled to control the speed at which the substrate W is transferred in the pre-stage processing chamber 10 so that the ultrasonic cleaning chamber 12, the spray cleaning chamber 14 and the draining chamber are arranged in the subsequent stage. It is preferable to make it faster than the substrate transfer speed within 16 and in that case, the substrate W
The entire surface of is instantly covered with pure water in layers, which is more effective. Further, since the pure water 28 is supplied from the high-pressure spray tube 20 to the surface of the substrate W in the direction opposite to the substrate transport direction, the pure water 28 is purely applied to the portion of the surface of the substrate W that has passed through the flow-down position of the pure water 28. No mist of water adheres to cause unevenness. Then, the surface of the substrate W is covered with the flowing pure water in a layered manner and remains wet in the ultrasonic cleaning chamber 12
Since it is sent to the substrate, smoke-like cleaning unevenness unlike the conventional case does not occur on the substrate surface during the ultrasonic cleaning process.

【0014】この発明に係る基板洗浄方法及び装置は上
記のように構成されているが、この発明の範囲は上記説
明並びに図面の内容によって限定されず、要旨を逸脱し
ない範囲で種々の変形例を包含し得る。例えば、上記実
施例では、基板を水平方向へ搬送しながら洗浄する方法
を示したが、基板を鉛直方向に搬送しながら洗浄するよ
うにしてもよい。また、基板搬送手段としては、コンベ
ア方式、ニップローラ方式など、各種の機構のものを使
用し得る。さらに、上記実施例では、基板を搬送しなが
ら固定した高圧スプレイから純水を基板表面へ供給する
ようにしたが、基板を停止させ、高圧スプレイを基板表
面に沿って平行移動させながら、基板表面へ純水を供給
するようにしてもよい。また、前段処理室、超音波洗浄
室、スプレイ洗浄室及び水切り室における基板搬送速度
を低速で一定にし、前段処理室において高圧スプレイを
基板表面に沿って基板搬送方向と逆方向へ移動させる構
成とし、基板の表面全体に速やかに純水を供給できるよ
うにしてもよい。
The substrate cleaning method and apparatus according to the present invention are configured as described above, but the scope of the present invention is not limited by the above description and the contents of the drawings, and various modifications are possible without departing from the scope of the invention. May be included. For example, in the above embodiment, the method of cleaning the substrate while being transported in the horizontal direction has been described, but the substrate may be cleaned while being transported in the vertical direction. Further, as the substrate transfer means, those having various mechanisms such as a conveyor system and a nip roller system can be used. Further, in the above-mentioned embodiment, the pure water is supplied to the substrate surface from the high-pressure spray fixed while transporting the substrate, but the substrate is stopped and the high-pressure spray is moved in parallel along the substrate surface while the substrate surface is being moved. Pure water may be supplied to the. Further, the substrate transfer speed in the pre-treatment chamber, the ultrasonic cleaning chamber, the spray cleaning chamber, and the draining chamber is kept constant at a low speed, and the high-pressure spray is moved in the pre-treatment chamber along the substrate surface in the direction opposite to the substrate transport direction. The pure water may be quickly supplied to the entire surface of the substrate.

【0015】[0015]

【発明の効果】この発明は以上説明したように構成され
かつ作用するので、この発明に係る基板洗浄方法によれ
ば、また、この発明に係る基板洗浄装置を使用すれば、
水や純水などの洗浄液を使用した枚葉処理方式により、
基板表面における洗浄むらを生じることなくラビング処
理後の基板の洗浄を行なうことができ、基板の洗浄過程
において配向膜の配向性能が維持され、表示品質が平均
化されたLCDを得ることができる。
Since the present invention is constructed and operates as described above, according to the substrate cleaning method of the present invention and the substrate cleaning apparatus of the present invention,
By the single-wafer processing method using a cleaning liquid such as water or pure water,
The substrate after the rubbing treatment can be cleaned without causing uneven cleaning on the surface of the substrate, and the alignment performance of the alignment film can be maintained in the process of cleaning the substrate to obtain an LCD with an averaged display quality.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明に係る基板洗浄方法を実施するための
装置の概略構成の1例を示す模式的断面図である。
FIG. 1 is a schematic cross-sectional view showing an example of a schematic configuration of an apparatus for carrying out a substrate cleaning method according to the present invention.

【符号の説明】[Explanation of symbols]

10 前段処理室 12 超音波洗浄室 14 スプレイ洗浄室 16 水切り室 20 高圧スプレイ管 22 純水 28 カーテン状に流下する純水 30 超音波洗浄装置 32 洗浄水 40 スプレイ管 44 エアーナイフ W ラビング処理後の基板 10 Pretreatment chamber 12 Ultrasonic cleaning chamber 14 Spray cleaning chamber 16 Draining chamber 20 High pressure spray pipe 22 Pure water 28 Pure water flowing in a curtain shape 30 Ultrasonic cleaning device 32 Cleaning water 40 Spray pipe 44 Air knife W After rubbing treatment substrate

───────────────────────────────────────────────────── フロントページの続き (72)発明者 芳谷 光明 滋賀県彦根市高宮町480番地の1 大日本 スクリーン製造株式会社彦根地区事業所内 (72)発明者 土屋 昭夫 滋賀県彦根市高宮町480番地の1 大日本 スクリーン製造株式会社彦根地区事業所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Mitsuaki Yoshiya 1 at 480 Takamiya-cho, Hikone-shi, Shiga Dai Nippon Screen Mfg. Co., Ltd. in Hikone area (72) Inventor Akio Tsuchiya 480, Takamiya-cho, Hikone-shi, Shiga 1 Dainippon Screen Mfg. Co., Ltd. Hikone District Office

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 液晶用基板の表面に形成された高分子膜
の膜面をラビング処理した後にその基板の表面に洗浄液
を供給して基板表面を洗浄する方法において、洗浄前に
前記基板の表面に対し純水をカーテン状に流下させなが
ら基板を純水の流下位置に対して相対的に移動させ、洗
浄が開始される時点まで、基板上を流動する純水で基板
の表面全体を層状に覆うようにすることを特徴とするラ
ビング処理後の基板の洗浄方法。
1. A method for cleaning a substrate surface by rubbing a film surface of a polymer film formed on a surface of a liquid crystal substrate and then supplying a cleaning liquid to the surface of the substrate, wherein the surface of the substrate is cleaned before cleaning. In contrast, the substrate is moved relative to the pure water flow position while flowing pure water in a curtain shape, and the entire surface of the substrate is layered with pure water flowing on the substrate until the cleaning is started. A method for cleaning a substrate after a rubbing treatment, which is characterized by covering the substrate.
【請求項2】 表面に形成された高分子膜の膜面がラビ
ング処理された後の液晶用基板の表面に洗浄液を供給し
て基板表面を洗浄する基板洗浄手段と、前記基板を搬送
する基板搬送手段とを備えてなるラビング処理後の基板
の洗浄装置において、前記基板洗浄手段の手前側に、前
記基板の表面に対し純水を基板搬送方向と逆向きにかつ
カーテン状に流下させて供給する前段給水手段を配設し
たことを特徴とするラビング処理後の基板の洗浄装置。
2. A substrate cleaning means for supplying a cleaning liquid to the surface of the liquid crystal substrate after the film surface of the polymer film formed on the surface is rubbed to clean the substrate surface, and a substrate for transporting the substrate. In a cleaning device for a substrate after rubbing treatment, which comprises a transport means, pure water is supplied to the front side of the substrate cleaning means in a curtain shape in a direction opposite to the substrate transport direction with respect to the surface of the substrate. An apparatus for cleaning a substrate after a rubbing process, characterized in that a pre-stage water supply means is provided.
【請求項3】 基板搬送手段の基板搬送速度を、前段給
水手段における搬送速度が基板洗浄手段における搬送速
度より大きくなるように設定した請求項2記載の、ラビ
ング処理後の基板の洗浄装置。
3. The apparatus for cleaning a substrate after the rubbing process according to claim 2, wherein the substrate transfer speed of the substrate transfer means is set so that the transfer speed of the pre-stage water supply means is higher than the transfer speed of the substrate cleaning means.
JP9472992A 1992-03-21 1992-03-21 Method and apparatus for cleaning substrate after rubbing treatment Expired - Fee Related JP2729723B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9472992A JP2729723B2 (en) 1992-03-21 1992-03-21 Method and apparatus for cleaning substrate after rubbing treatment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9472992A JP2729723B2 (en) 1992-03-21 1992-03-21 Method and apparatus for cleaning substrate after rubbing treatment

Publications (2)

Publication Number Publication Date
JPH05264942A true JPH05264942A (en) 1993-10-15
JP2729723B2 JP2729723B2 (en) 1998-03-18

Family

ID=14118207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9472992A Expired - Fee Related JP2729723B2 (en) 1992-03-21 1992-03-21 Method and apparatus for cleaning substrate after rubbing treatment

Country Status (1)

Country Link
JP (1) JP2729723B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0429163B1 (en) * 1989-11-20 1994-06-08 AT&T Corp. Optical fiber splicing device
US6007638A (en) * 1996-02-13 1999-12-28 Lion Corporation Detergent composition and cleaning method using the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0429163B1 (en) * 1989-11-20 1994-06-08 AT&T Corp. Optical fiber splicing device
US6007638A (en) * 1996-02-13 1999-12-28 Lion Corporation Detergent composition and cleaning method using the same

Also Published As

Publication number Publication date
JP2729723B2 (en) 1998-03-18

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