JPH05249172A - Electricity inspection method and method for mounting electronic part using the same - Google Patents

Electricity inspection method and method for mounting electronic part using the same

Info

Publication number
JPH05249172A
JPH05249172A JP4051425A JP5142592A JPH05249172A JP H05249172 A JPH05249172 A JP H05249172A JP 4051425 A JP4051425 A JP 4051425A JP 5142592 A JP5142592 A JP 5142592A JP H05249172 A JPH05249172 A JP H05249172A
Authority
JP
Japan
Prior art keywords
cream solder
electronic component
land
circuit board
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4051425A
Other languages
Japanese (ja)
Inventor
Takahiko Yagi
能彦 八木
Yoshifumi Kitayama
喜文 北山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4051425A priority Critical patent/JPH05249172A/en
Publication of JPH05249172A publication Critical patent/JPH05249172A/en
Pending legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To remove a rejected article, to re-install an electronic part without resupplying solder and to conduct an electricity inspection, by overheating cream solder before melting in a specific temperature, by agglomerating and by making electric continuity between electrodes. CONSTITUTION:Cream solder 11 lying between a bump 9 and a land 10 of a circuit substrate 1 of an electronic part 7 after installation is heated in 100 deg.C to 180 deg.C and agglomerated, and electric continuity is made between the bump 9 and the land 10. Pins 13 for an inspection are contacted on lands 10, electricity inspection is conducted by an electric inspection apparatus 12, and whether the part 7 comes up to the standard or not is judged. In a process for removing a rejected electronic part, the rejected electronic part 7 is removed from the substrate 1 by an installation head 6. In this case, the electricity inspection can be conducted, because the solder 11 is heated in 100 deg.C to 180 deg.C, agglomerated and electrically conductible. However, the rejected part 7 can easily be removed from the substrate 1, because it does not melt. The solder 11 applied on the land 10 is not taken off by the bump 9 and keeps a remounting state with invariant weight and there is no necessity for resupplying the solder 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電子部品装着工程での
電気検査方法と、この電気検査方法を使用する電子部品
の装着方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electrical inspection method in an electronic component mounting process and an electronic component mounting method using this electrical inspection method.

【0002】[0002]

【従来の技術】近年、電子部品の回路基板への装着は、
高密度化、狭ピッチ化が主流となっている。その為に、
装着工程での電気検査の必要性が大きくなっている。
2. Description of the Related Art In recent years, mounting of electronic parts on a circuit board has been
High density and narrow pitch are the mainstream. Therefore,
The need for electrical inspection in the mounting process is increasing.

【0003】電子部品装着工程での従来の電気検査方法
と、この電気検査方法を使用する電子部品の装着方法の
従来例を図8〜図14に基づいて説明する。
A conventional electrical inspection method in an electronic component mounting step and a conventional example of an electronic component mounting method using this electrical inspection method will be described with reference to FIGS.

【0004】図8のフローチャーと図9〜図14におい
て、ステップ#1の印刷工程で、図9に示すように、回
路基板1上にメタルマスク2を置き、スキージ4を矢印
の方向に移動させて、クリーム半田5を、メタルマスク
2の開孔部3に充填して回路基板1に印刷し、ステップ
#2に進む。
In the flow chart of FIG. 8 and FIGS. 9 to 14, in the printing step of step # 1, as shown in FIG. 9, the metal mask 2 is placed on the circuit board 1 and the squeegee 4 is moved in the direction of the arrow. Then, the cream solder 5 is filled in the opening 3 of the metal mask 2 and printed on the circuit board 1, and the process proceeds to step # 2.

【0005】ステップ#2の電子部品装着工程で、図1
0に示すように、電子部品7のアルミニウム電極8上に
金バンプ9を設けたものを、装着ヘッド6で保持してこ
の金バンプ9を、ステップ#1の印刷工程で回路基板1
のランド10上に印刷されたクリーム半田11上に装着
し、ステップ#3に進む。
In the electronic component mounting process of step # 2, as shown in FIG.
As shown in FIG. 0, the electronic component 7 having the aluminum bumps 8 provided on the aluminum electrodes 8 is held by the mounting head 6, and the gold bumps 9 are attached to the circuit board 1 by the printing process of step # 1.
It is mounted on the cream solder 11 printed on the land 10, and the process proceeds to step # 3.

【0006】ステップ#3のリフロー工程で、図11に
示すように、クリーム半田を溶融して、電子部品7と回
路基板1とを接合し、ステップ#4に進む。
In the reflow process of step # 3, as shown in FIG. 11, the cream solder is melted to bond the electronic component 7 and the circuit board 1, and the process proceeds to step # 4.

【0007】ステップ#4の電気検査工程で、図12に
示すように、検査用のピン13を回路基板1のランド1
0に当て、電気的検査機12で電気検査を行い、合格の
場合は終了し、不合格の場合はステップ#5に進む。
In the electrical inspection process of step # 4, as shown in FIG. 12, the inspection pin 13 is connected to the land 1 of the circuit board 1.
When 0, the electric inspection is performed by the electric inspection machine 12. If the electric inspection is successful, the process ends. If the electric inspection is not successful, the process proceeds to step # 5.

【0008】ステップ#5の不合格電子部品除去工程
で、回路基板1を加熱して、クリーム半田11を溶融
し、図13に示すように、不合格電子部品7を除去し、
ステップ#6に進む。
In the step # 5 of removing rejected electronic components, the circuit board 1 is heated to melt the cream solder 11, and the rejected electronic components 7 are removed as shown in FIG.
Go to step # 6.

【0009】ステップ#6のクリーム半田供給工程で、
ステップ#5の図13に示すように、不合格電子部品7
を除去する際に失われて欠けたクリーム半田11に、ク
リーム半田を供給して、図14に示すクリーム半田11
のように再生し、ステップ#2に戻る。
In the step # 6 of supplying the cream solder,
As shown in FIG. 13 of step # 5, the rejected electronic component 7
14 is supplied to the cream solder 11 that is lost and chipped when the solder is removed, and the cream solder 11 shown in FIG.
And then return to step # 2.

【0010】[0010]

【発明が解決しようとする課題】しかし、上記の従来例
の構成では、ステップ#2の電子部品装着工程終了後で
は、溶融前のクリーム半田11に電気的導通が無いの
で、ステップ#3のリフロー工程でクリーム半田を溶融
接合してから、ステップ#4の電気検査工程で電気検査
している。従って、電気検査工程で、不良品が出た場合
には、ステップ#5の不合格電子部品除去工程で回路基
板1を加熱して、クリーム半田11を溶融し、不合格電
子部品7を除去することになり、この際、回路基板1側
のクリーム半田11が不合格電子部品7側に取られ、図
13に示すようにクリーム半田11が欠けた形になって
しまうので、ステップ#6のクリーム半田供給工程で、
クリーム半田11を再生する必要があるが、硬化したク
リーム半田が一部残っているので、作業が困難で、生産
性が低下するという問題点がある。
However, in the configuration of the above-mentioned conventional example, since the cream solder 11 before melting is not electrically connected after the electronic component mounting process of step # 2, the reflow of step # 3 is performed. After melt-bonding the cream solder in the process, electrical inspection is performed in the electrical inspection process in step # 4. Therefore, if a defective product is found in the electrical inspection process, the circuit board 1 is heated in the reject electronic component removing process of step # 5 to melt the cream solder 11 and remove the reject electronic component 7. At this time, the cream solder 11 on the side of the circuit board 1 is taken by the rejected electronic component 7 side, and the cream solder 11 is chipped as shown in FIG. In the solder supply process,
Although it is necessary to regenerate the cream solder 11, there is a problem that the work is difficult and the productivity is lowered because the hardened cream solder remains partially.

【0011】本発明は、上記の問題点を解決して、不合
格電子部品7を容易に取り除くことができ、クリーム半
田11を再供給することなく、電子部品の再装着ができ
る、電気検査方法とこれを使用した電子部品の装着方法
とを提供することを課題としている。
The present invention solves the above-mentioned problems, the rejected electronic component 7 can be easily removed, and the electronic component can be remounted without re-supplying the cream solder 11. Another object of the present invention is to provide an electronic component mounting method using the same.

【0012】[0012]

【課題を解決するための手段】本願第1発明の電気検査
方法は、上記の課題を解決するために、電極間に介在す
る溶融前のクリーム半田を、100°Cから180°C
に加熱することによって、クリーム半田を凝集させ、前
記電極間に電気的導通を構成し、この電気的導通に基づ
いて電気検査を行うことを特徴とする。
In order to solve the above-mentioned problems, an electrical inspection method according to the first invention of the present application is to apply cream solder between electrodes between 100 ° C and 180 ° C before melting.
It is characterized in that the cream solder is agglomerated by heating to form electrical conduction between the electrodes, and an electrical inspection is performed based on the electrical conduction.

【0013】本願第2発明の電子部品の装着方法は、上
記の課題を解決するために、回路基板のランドにクリー
ム半田を塗布するクリーム半田塗布工程と、予め電子部
品の電極に設けたバンプを、前記ランドに塗布したクリ
ーム半田上に装着する電子部品装着工程と、前記バンプ
と前記ランド間に介在するクリーム半田を100°Cか
ら180°Cに加熱して、クリーム半田を凝集させ、前
記バンプと前記ランド間に電気的導通を構成する予備加
熱工程と、前記電子部品と前記回路基板間の電気的接合
及び/又は回路特性を検査する電気検査工程と、前記電
気検査工程での合格回路基板のリフロー工程とを有する
ことを特徴とする。
In order to solve the above-mentioned problems, the electronic component mounting method of the second invention of the present application comprises a cream solder applying step of applying cream solder to the land of the circuit board, and a bump previously provided on the electrode of the electronic component. An electronic component mounting step of mounting on the cream solder applied to the land, and heating the cream solder interposed between the bump and the land from 100 ° C to 180 ° C to aggregate the cream solder, And a preliminary heating step for forming electrical conduction between the lands, an electrical inspection step for inspecting electrical connection and / or circuit characteristics between the electronic component and the circuit board, and a circuit board that has passed the electrical inspection step. And a reflow step of.

【0014】本願第3発明の電子部品の装着方法は、上
記の課題を解決するために、予め電子部品の電極に設け
たバンプに、クリーム半田を塗布するクリーム半田塗布
工程と、クリーム半田を塗布された前記バンプを回路基
板の電極に装着する電子部品装着工程と、前記バンプと
前記ランド間に介在するクリーム半田を100°Cから
180°Cに加熱して、クリーム半田を凝集させ、前記
バンプと前記ランド間に電気的導通を構成する予備加熱
工程と、前記電子部品と前記回路基板間の電気的接合及
び/又は回路特性を検査する電気検査工程と、前記電気
検査工程での合格回路基板のリフロー工程とを有するこ
とを特徴とする。
In order to solve the above problems, the electronic component mounting method according to the third aspect of the present invention applies a cream solder applying step of applying cream solder to bumps provided in advance on the electrodes of the electronic component, and applying cream solder. The electronic component mounting step of mounting the bumps on the electrodes of the circuit board, and the cream solder interposed between the bumps and the lands is heated from 100 ° C to 180 ° C to aggregate the cream solder, And a preliminary heating step for forming electrical conduction between the lands, an electrical inspection step for inspecting electrical connection and / or circuit characteristics between the electronic component and the circuit board, and a circuit board that has passed the electrical inspection step. And a reflow step of.

【0015】[0015]

【作用】本願第1発明の電気検査方法は、クリーム半田
を電極間に供給して、電気検査後に、半田付けを行う場
合に、電極間に供給された溶融前のクリーム半田には電
気的導通が無く、このままでは電気検査ができないの
で、電極間に介在する溶融前のクリーム半田を、100
°Cから180°Cに加熱することによって、クリーム
半田を凝集させて電気的導通を構成し、この電気的導通
に基づいて電気検査を行うことができる。
In the electrical inspection method according to the first aspect of the present invention, when the cream solder is supplied between the electrodes and soldering is performed after the electrical inspection, the cream solder before the melting supplied between the electrodes is electrically connected. Since there is no such thing, the electrical inspection cannot be performed as it is.
By heating from ° C to 180 ° C, the cream solder is aggregated to form electrical conduction, and the electrical inspection can be performed based on this electrical conduction.

【0016】本願第2、第3発明の電子部品の装着方法
は、印刷工程と、電子部品装着工程と、リフロー工程と
は従来の電子部品の装着方法と同様であるが、予備加熱
工程で、電極間に介在する溶融前のクリーム半田を、1
00°Cから180°Cに加熱することによって、クリ
ーム半田を凝集させ、電気的導通を構成した後に、電気
検査工程で、この電気的導通を利用して、電子部品と回
路基板間の電気的接合及び/又は回路特性を検査し、良
品のみを次のリフロー工程に送ることができる。
In the electronic component mounting method of the second and third inventions of the present application, the printing step, the electronic component mounting step, and the reflow step are the same as those of the conventional electronic component mounting method, but the preliminary heating step is performed. 1 paste of cream solder before melting
By heating the cream solder from 00 ° C. to 180 ° C. to condense the cream solder to form electrical conduction, the electrical conduction is utilized in the electrical inspection process after electrical conduction between the electronic component and the circuit board. Junction and / or circuit characteristics can be inspected and only good products can be sent to the next reflow process.

【0017】[0017]

【実施例】本願第1発明を使用した本願第2発明の電子
部品の装着方法の一実施例を図1〜図7に基づいて説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a method of mounting an electronic component according to the second invention of the present application using the first invention of the present application will be described with reference to FIGS.

【0018】図1のフローチャーと図2〜図7におい
て、ステップ#1の印刷工程で、図2に示すように、回
路基板1上にメタルマスク2を置き、スキージ4を矢印
の方向に移動させて、クリーム半田5を、メタルマスク
2の開孔部3に充填して回路基板1に印刷し、ステップ
#2に進む。
2 and 7, the metal mask 2 is placed on the circuit board 1 and the squeegee 4 is moved in the direction of the arrow in the printing process of step # 1 as shown in FIG. Then, the cream solder 5 is filled in the opening 3 of the metal mask 2 and printed on the circuit board 1, and the process proceeds to step # 2.

【0019】ステップ#2の電子部品装着工程で、図3
に示すように、電子部品7のアルミニウム電極8上に金
バンプ9を設けたものを、装着ヘッド6で保持してこの
金バンプ9を、ステップ#1の印刷工程で回路基板1の
ランド10上に印刷されたクリーム半田11上に装着
し、ステップ#3に進む。
In the electronic component mounting process of step # 2, as shown in FIG.
As shown in FIG. 2, the electronic head 7 having the aluminum bumps 8 provided on the aluminum electrodes 8 is held by the mounting head 6 and the gold bumps 9 are placed on the lands 10 of the circuit board 1 in the printing process of step # 1. It is mounted on the cream solder 11 printed on, and the process proceeds to step # 3.

【0020】ステップ#3の予備加熱工程で、図4に示
す装着後の電子部品7と回路基板1の前記バンプ9と前
記ランド間に介在するクリーム半田11を100°Cか
ら180°Cに加熱して、クリーム半田11を凝集さ
せ、前記バンプ9と前記ランド10間に電気的導通を構
成し、ステップ#4に進む。
In the preheating step of step # 3, the cream solder 11 interposed between the mounted electronic component 7, the bump 9 of the circuit board 1 and the land shown in FIG. 4 is heated from 100 ° C to 180 ° C. Then, the cream solder 11 is aggregated to establish electrical conduction between the bump 9 and the land 10, and the process proceeds to step # 4.

【0021】ステップ#4の電気検査工程で、図5に示
すように、検査用のピン13を回路基板1のランド10
に当て、電気的検査機12で電気検査を行い、合格の場
合はステップ#5に進み、不合格の場合はステップ#6
に進む。
In the electrical inspection process of step # 4, as shown in FIG. 5, the inspection pin 13 is connected to the land 10 of the circuit board 1.
Then, the electrical inspection is performed by the electrical inspection machine 12, and if it passes, the process proceeds to step # 5, and if it fails, the step # 6.
Proceed to.

【0022】ステップ#5のリフロー工程で、図6に示
すように、クリーム半田を溶融して、電子部品7と回路
基板1とを接合し、終了する。
In the reflow process of step # 5, as shown in FIG. 6, the cream solder is melted, the electronic component 7 and the circuit board 1 are joined, and the process is completed.

【0023】ステップ#6の不合格電子部品除去工程
で、図7に示すように、装着ヘッド6によって回路基板
1から不合格電子部品7を除去し、ステップ#2に戻
る。この場合、クリーム半田11は、100°Cから1
80°Cに加熱されて凝集し、電気的導通を有し電気検
査が可能であるが、溶融していないので、不合格電子部
品7は容易に回路基板1から除去され、ランド10上に
塗布されたクリーム半田11は、バンプ9に取られるこ
と無く、塗布されたときの重量のままで、再装着できる
状態を維持しおり、クリーム半田11を再供給する必要
は無い。
In the reject electronic component removing step of step # 6, the reject electronic component 7 is removed from the circuit board 1 by the mounting head 6 as shown in FIG. 7, and the process returns to step # 2. In this case, the cream solder 11 is from 100 ° C to 1
Although it is heated to 80 ° C. and agglomerated, it has electrical continuity and is capable of electrical inspection, but since it has not melted, the rejected electronic component 7 is easily removed from the circuit board 1 and applied onto the land 10. The applied cream solder 11 is not taken by the bumps 9 and remains in the state of being able to be reattached with the weight when applied, and it is not necessary to re-supply the cream solder 11.

【0024】本願第1発明を使用した本願第3発明の電
子部品の装着方法の場合も、前記の本願第2発明の電子
部品の装着方法の場合と同様なので説明を省略する。
The electronic component mounting method of the third invention of the present application using the first invention of the present application is also the same as the electronic component mounting method of the second invention of the present application, and the description thereof will be omitted.

【0025】[0025]

【発明の効果】本発明の電気検査方法は、電子部品装着
後に、電極間に介在する溶融前のクリーム半田を、10
0°Cから180°Cに加熱することによって、クリー
ム半田を凝集させ、前記電極間に電気的導通を構成し、
この電気的導通に基づいて電気検査を行うことができる
という効果を奏する。
According to the electrical inspection method of the present invention, after the electronic parts are mounted, the cream solder which is interposed between the electrodes and which is not yet melted is applied to 10 times.
By heating from 0 ° C to 180 ° C, the cream solder is aggregated to form electrical conduction between the electrodes,
There is an effect that an electrical inspection can be performed based on this electrical continuity.

【0026】本発明の電子部品の装着方法は、電子部品
装着工程後に、予備加熱工程を設け、電極間に介在する
溶融前のクリーム半田を、100°Cから180°Cに
加熱することによって、前記電極間に電気的導通を構成
し、この予備加熱工程後に、電気検査工程を設け、前記
電気的導通に基づいて電気検査を行うことができるばか
りではなく、この場合、クリーム半田が、100°Cか
ら180°Cに加熱されて凝集し、電気的導通を有し電
気検査が可能であるが、溶融していないので、不合格電
子部品が容易に回路基板1から除去され、回路基板1上
のクリーム半田11は、バンプ9に取られること無く、
そのままで再装着できる状態を維持しており、クリーム
半田11を再供給する工程を省略できるという効果を奏
する。
In the electronic component mounting method of the present invention, a pre-heating step is provided after the electronic component mounting step, and the cream solder before melting interposed between the electrodes is heated from 100 ° C to 180 ° C. Not only can electrical conduction be configured between the electrodes, and an electrical inspection step can be provided after this preheating step to perform an electrical inspection based on the electrical conduction, in this case, the cream solder is 100 °. It is heated from C to 180 ° C and agglomerated, and it has electrical continuity and electrical inspection is possible, but since it has not melted, rejected electronic components are easily removed from the circuit board 1 and The cream solder 11 of is not taken by the bump 9,
The remountable state is maintained as it is, and the effect that the step of resupplying the cream solder 11 can be omitted is achieved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の電気検査方法を使用する電子部品の装
着方法の一実施例のフローチャートである。
FIG. 1 is a flow chart of an embodiment of a method of mounting an electronic component using the electrical inspection method of the present invention.

【図2】図1の動作図である。2 is an operation diagram of FIG. 1. FIG.

【図3】図1の動作図である。3 is an operation diagram of FIG. 1. FIG.

【図4】図1の動作図である。FIG. 4 is an operation diagram of FIG. 1.

【図5】図1の動作図である。5 is an operation diagram of FIG. 1. FIG.

【図6】図1の動作図である。6 is an operation diagram of FIG. 1. FIG.

【図7】図1の動作図である。FIG. 7 is an operation diagram of FIG. 1.

【図8】従来例の電気検査方法を使用する電子部品の装
着方法のフローチャートである。
FIG. 8 is a flowchart of a method of mounting an electronic component using the conventional electrical inspection method.

【図9】図8の動作図である。9 is an operation diagram of FIG. 8. FIG.

【図10】図8の動作図である。10 is an operation diagram of FIG. 8. FIG.

【図11】図8の動作図である。11 is an operation diagram of FIG. 8. FIG.

【図12】図8の動作図である。12 is an operation diagram of FIG. 8. FIG.

【図13】図8の動作図である。13 is an operation diagram of FIG. 8. FIG.

【図14】図8の動作図である。14 is an operation diagram of FIG. 8. FIG.

【符号の説明】[Explanation of symbols]

#1 印刷工程 #2 電子部品装着工程 #3 予備加熱工程 #4 電気検査工程 #5 リフロー工程 1 回路基板 2 メタルマスク 3 開孔部 4 スキージ 5 クリーム半田 6 装着ヘッド 7 電子部品 8 アルミニウム電極 9 金バンプ 10 ランド 11 クリーム半田 12 電気的検査機 13 検査用ピン # 1 Printing process # 2 Electronic component mounting process # 3 Preheating process # 4 Electrical inspection process # 5 Reflow process 1 Circuit board 2 Metal mask 3 Opening part 4 Squeegee 5 Cream solder 6 Mounting head 7 Electronic component 8 Aluminum electrode 9 Gold Bump 10 Land 11 Cream solder 12 Electrical inspection machine 13 Inspection pin

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 電極間に介在する溶融前のクリーム半田
を、100°Cから180°Cに加熱することによっ
て、クリーム半田を凝集させ、前記電極間に電気的導通
を構成し、この電気的導通に基づいて電気検査を行うこ
とを特徴とする電気検査方法。
1. The cream solder before melting interposed between the electrodes is heated from 100 ° C. to 180 ° C. to agglomerate the cream solder to form electrical conduction between the electrodes. An electrical inspection method comprising performing an electrical inspection based on continuity.
【請求項2】 回路基板のランドにクリーム半田を塗布
するクリーム半田塗布工程と、予め電子部品の電極に設
けたバンプを、前記ランドに塗布したクリーム半田上に
装着する電子部品装着工程と、前記バンプと前記ランド
間に介在するクリーム半田を100°Cから180°C
に加熱して、クリーム半田を凝集させ、前記バンプと前
記ランド間に電気的導通を構成する予備加熱工程と、前
記電子部品と前記回路基板間の電気的接合及び/又は回
路特性を検査する電気検査工程と、前記電気検査工程で
の合格回路基板のリフロー工程とを有することを特徴と
する電子部品の装着方法。
2. A cream solder applying step of applying cream solder to a land of a circuit board, and an electronic component attaching step of attaching a bump previously provided on an electrode of an electronic component onto the cream solder applied to the land, Cream solder between the bump and the land is 100 ° C to 180 ° C
A preheating step of heating the above to agglomerate the cream solder to form electrical conduction between the bump and the land, and an electrical test for inspecting electrical connection between the electronic component and the circuit board and / or circuit characteristics. An electronic component mounting method, comprising: an inspection step; and a reflow step of a passing circuit board in the electrical inspection step.
【請求項3】 予め電子部品の電極に設けたバンプに、
クリーム半田を塗布するクリーム半田塗布工程と、クリ
ーム半田を塗布された前記バンプを回路基板の電極に装
着する電子部品装着工程と、前記バンプと前記ランド間
に介在するクリーム半田を100°Cから180°Cに
加熱して、クリーム半田を凝集させ、前記バンプと前記
ランド間に電気的導通を構成する予備加熱工程と、前記
電子部品と前記回路基板間の電気的接合及び/又は回路
特性を検査する電気検査工程と、前記電気検査工程での
合格回路基板のリフロー工程とを有することを特徴とす
る電子部品の装着方法。
3. A bump, which is previously provided on an electrode of an electronic component,
The cream solder applying step of applying the cream solder, the electronic component mounting step of mounting the bumps coated with the cream solder on the electrodes of the circuit board, and the cream solder interposed between the bumps and the land from 100 ° C. to 180 ° C. Preheat step of heating to ° C to agglomerate cream solder to form electrical conduction between the bump and the land, and inspect electrical connection and / or circuit characteristic between the electronic component and the circuit board A method of mounting an electronic component, comprising: an electrical inspection step of: and a reflow step of a circuit board that has passed the electrical inspection step.
JP4051425A 1992-03-10 1992-03-10 Electricity inspection method and method for mounting electronic part using the same Pending JPH05249172A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4051425A JPH05249172A (en) 1992-03-10 1992-03-10 Electricity inspection method and method for mounting electronic part using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4051425A JPH05249172A (en) 1992-03-10 1992-03-10 Electricity inspection method and method for mounting electronic part using the same

Publications (1)

Publication Number Publication Date
JPH05249172A true JPH05249172A (en) 1993-09-28

Family

ID=12886575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4051425A Pending JPH05249172A (en) 1992-03-10 1992-03-10 Electricity inspection method and method for mounting electronic part using the same

Country Status (1)

Country Link
JP (1) JPH05249172A (en)

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