JPH0523391B2 - - Google Patents
Info
- Publication number
- JPH0523391B2 JPH0523391B2 JP60117824A JP11782485A JPH0523391B2 JP H0523391 B2 JPH0523391 B2 JP H0523391B2 JP 60117824 A JP60117824 A JP 60117824A JP 11782485 A JP11782485 A JP 11782485A JP H0523391 B2 JPH0523391 B2 JP H0523391B2
- Authority
- JP
- Japan
- Prior art keywords
- wire
- guide body
- wire guide
- tip
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60117824A JPS61275668A (ja) | 1985-05-31 | 1985-05-31 | 回路基板等の検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60117824A JPS61275668A (ja) | 1985-05-31 | 1985-05-31 | 回路基板等の検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61275668A JPS61275668A (ja) | 1986-12-05 |
| JPH0523391B2 true JPH0523391B2 (cs) | 1993-04-02 |
Family
ID=14721154
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60117824A Granted JPS61275668A (ja) | 1985-05-31 | 1985-05-31 | 回路基板等の検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61275668A (cs) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4506215A (en) * | 1981-06-30 | 1985-03-19 | International Business Machines Corporation | Modular test probe |
| US4518910A (en) * | 1983-06-30 | 1985-05-21 | International Business Machines Corporation | Buckling beam twist probe contactor assembly with spring biased stripper plate |
-
1985
- 1985-05-31 JP JP60117824A patent/JPS61275668A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61275668A (ja) | 1986-12-05 |
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