JPH0523389B2 - - Google Patents

Info

Publication number
JPH0523389B2
JPH0523389B2 JP59206100A JP20610084A JPH0523389B2 JP H0523389 B2 JPH0523389 B2 JP H0523389B2 JP 59206100 A JP59206100 A JP 59206100A JP 20610084 A JP20610084 A JP 20610084A JP H0523389 B2 JPH0523389 B2 JP H0523389B2
Authority
JP
Japan
Prior art keywords
pin
contact
contact pin
tip
pitch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59206100A
Other languages
Japanese (ja)
Other versions
JPS6183966A (en
Inventor
Tomoyuki Kinoshita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP20610084A priority Critical patent/JPS6183966A/en
Publication of JPS6183966A publication Critical patent/JPS6183966A/en
Publication of JPH0523389B2 publication Critical patent/JPH0523389B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 技術分野 本発明は、電子部品を実装した電子回路基板の
検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to an inspection apparatus for an electronic circuit board on which electronic components are mounted.

従来技術 上記種の検査装置における検出先端部は、一般
に、電子回路基板上に実装された電子部品(被検
査体)に対して接離自在の一対のコンタクトピン
と、このコンタクトピンを固定保持するピン保持
板等により構成されており、前記一対のコンタク
トピンは、ピン保持板にその取付けピツチが固定
された状態で差込み挿着されているのが普通であ
る。
Prior Art The detection tip of the above-mentioned type of inspection device generally includes a pair of contact pins that can freely move toward and away from an electronic component (tested object) mounted on an electronic circuit board, and a pin that fixes and holds this contact pin. It is composed of a holding plate, etc., and the pair of contact pins are usually inserted into the pin holding plate with their mounting pitches fixed.

しかしながら、上記構成よりなる従来の検査装
置においては、次のごとき問題点があつた。
However, the conventional inspection apparatus having the above configuration has the following problems.

(1) コンタクトピンは、その取付けピツチが固定
されてピン保持板に固装される構成であつたの
で、被検査体である電子部品のサイズが異なる
度毎にその異なる電子部品に対応するピツチの
コンタクトピン装備部を有するピン保持板を用
意しなければならなかつた。そのために、段取
り換えが大変であるとともに多数のピンを要
し、作業性が著しく低下するとともに極めて不
経済であつた。
(1) The contact pin has a fixed mounting pitch and is fixed to the pin holding plate, so each time the size of the electronic component to be inspected changes, the pitch corresponding to the different electronic component must be adjusted. It was necessary to prepare a pin holding plate having a contact pin equipment part. Therefore, setup changes are difficult and a large number of pins are required, which significantly reduces work efficiency and is extremely uneconomical.

(2) 特に、多種サイズの電子部品を実装した電子
回路基板又は多種少量もしくは多種中量の基板
チエツクの場合に段取り換えに多大な時間を要
し、検査作業における作業性、作業効率が著し
く低下していた。
(2) In particular, when checking electronic circuit boards mounted with electronic components of various sizes, or boards of many kinds in small quantities or in many kinds of medium quantities, it takes a lot of time to change the setup, which significantly reduces the workability and efficiency of inspection work. Was.

発明の目的 本発明は、上記従来技術の問題点に鑑みなされ
たものであつて、多種サイズの電子部品を実装し
た電子回路基板又は多種少量もしくは多種中量の
基板チエツクをする場合であつても、高作業性、
高作業効率にて検査しうるようにした電子回路基
板の検査装置を提供することを目的とする。
Purpose of the Invention The present invention has been made in view of the problems of the prior art described above, and is applicable even when checking electronic circuit boards mounted with electronic components of various sizes, or boards of various types in small quantities or in large quantities in medium quantities. , high workability,
An object of the present invention is to provide an inspection device for electronic circuit boards that can be inspected with high work efficiency.

発明の概要 本発明は、検査装置における一対のコンタクト
ピンのピツチを拡縮調節自在の構成にすることに
より、上記本発明の目的を達成しようとするもの
である。
SUMMARY OF THE INVENTION The present invention attempts to achieve the above-mentioned object of the present invention by configuring the pitch of a pair of contact pins in an inspection device to be adjustable in expansion and contraction.

実施例 以下、本発明の実施例について図面を用いて詳
細に説明する。
Embodiments Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

第1図は、本発明に係る電子回路基板の検査装
置の要部である検出先端部1を示す正面図であ
る。
FIG. 1 is a front view showing a detection tip 1 which is a main part of an electronic circuit board inspection apparatus according to the present invention.

検出先端部1は、電子回路基板上の電子部品の
抵抗値、容量値、インダクタンス及びオープンシ
ヨートを検査するものであり、以下のように構成
してある。即ち、図において2,2で示すのは、
図示を省略している電子回路基板上の電子部品に
対して接触自在の検知部を有する一対のコンタク
トピンである。
The detection tip section 1 is used to inspect the resistance value, capacitance value, inductance, and open shot of electronic components on an electronic circuit board, and is configured as follows. That is, what is indicated by 2,2 in the figure is
These are a pair of contact pins having a detection portion that can freely come into contact with an electronic component on an electronic circuit board (not shown).

コンタクトピン2,2は、それぞれピン保持部
材3に設けた孔内に挿着してあり、ピン保持部材
を支持ピン4,4を介してピン保持枠5に揺動自
在に支持し、ピン保持部材3,3を上下作動軸6
の下端部に固設したクサビ状(又はコーン状)の
ピツチ調節部材7を介して揺動しうるように構成
することにより、各コンタクトピン2のピンタツ
チPを任意ピツチに調節しうるように設定構成す
る。また、8で示すのは、コンタクトピン2,2
のピンタツチPを常時拡大させるべくピン保持部
材3,3に張設された引張りコイルばねのごとき
弾機、9で示すのはコンタクトピンと接続された
コートである。上記構成によれば、ピツチ調節部
材7を上下作動軸6を介して上下作動させること
により、コンタクトピン2,2のピンピツチPを
任意ピツチに拡縮張設しうるものである。
The contact pins 2, 2 are each inserted into a hole provided in the pin holding member 3, and the pin holding member is swingably supported by the pin holding frame 5 via the support pins 4, 4, and the pin holding member is The members 3 and 3 are connected to the vertical operating shaft 6
The pin touch P of each contact pin 2 can be adjusted to an arbitrary pitch by configuring the contact pin 2 to be able to swing via a wedge-shaped (or cone-shaped) pitch adjustment member 7 fixed to the lower end of the contact pin 2. Configure. Also, 8 indicates contact pins 2, 2.
9 is a coat connected to the contact pin. According to the above configuration, by vertically moving the pitch adjusting member 7 via the vertically operating shaft 6, the pin pitch P of the contact pins 2, 2 can be expanded or contracted to an arbitrary pitch.

従つて、上記構成によれば、一対のコンタクト
ピン2,2にて多種サイズの電子部品を検査する
ことができ、電子部品のサイズが異なる度毎にコ
ンタクトピン及びピン保持部を交換する必要がな
い。しかも、極めて簡単な構成にして短時間にて
ピツチ変更調節を行いうるので、検査作業におけ
る作業性、作業効率を大幅に向上しうるものであ
る。特に、多種サイズの電子部品を実装した電子
回路基板の検査や、異種サイズの電子部品を実装
した多種少量もしくは多種中量の電子回路基板の
検査においては、顕著な効果を奏しうる。
Therefore, according to the above configuration, electronic components of various sizes can be inspected using the pair of contact pins 2, 2, and there is no need to replace the contact pins and the pin holder each time the size of the electronic component changes. do not have. Moreover, since the pitch can be changed and adjusted in a short time with an extremely simple configuration, workability and efficiency in inspection work can be greatly improved. Particularly, remarkable effects can be achieved in the inspection of electronic circuit boards mounted with electronic components of various sizes, and the inspection of electronic circuit boards of a wide variety of small quantities or of a wide variety of medium quantities on which electronic components of different sizes are mounted.

なお、図においては配線コード9の接続先を省
略してあるが、配線コード9をLCRメーター
(図示省略)に接続させることにより、電子部品
の抵抗値、容量値、インダクタンス及びオープン
シヨートを検査しうるものである。
Although the connection of the wiring cord 9 is omitted in the figure, by connecting the wiring cord 9 to an LCR meter (not shown), the resistance value, capacitance value, inductance, and open short of electronic components can be inspected. It is possible.

発明の効果 以上のように本発明によれば、一対の(一組
の)コンタクトピン及びピン保持部にて多種サイ
ズの電子部品を検査することができ、多種サイズ
の電子部品を実装した電子回路基板の検査や異種
サイズの電子部品を実装した多種少量もしくは多
種中量の検査基板の検査を短時間にて行いうるも
のである。その結果、検査作業における作業性、
作業効率の向上が図れるものである。
Effects of the Invention As described above, according to the present invention, electronic components of various sizes can be inspected using a pair of contact pins and a pin holding part, and an electronic circuit mounting electronic components of various sizes can be used. It is possible to inspect boards and test boards of various kinds and small quantities or of many kinds and medium quantities on which electronic components of different sizes are mounted in a short time. As a result, workability in inspection work,
This can improve work efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る装置の実施例を示す正面
図である。 2……コンタクトピン、5……ピン保持枠、6
……上下動作軸、7……ピンピツチ調節部材。
FIG. 1 is a front view showing an embodiment of the apparatus according to the present invention. 2...Contact pin, 5...Pin holding frame, 6
... Vertical movement axis, 7... Pin pitch adjustment member.

Claims (1)

【特許請求の範囲】[Claims] 1 被検査体である電子回路基板上の電子部品に
対して先端部が接触自在となつている少なくとも
2つの離隔されたコンタクトピンと、それぞれの
コンタクトピンの先端部の反対側の端部を保持す
るピン保持部材と、それぞれのピン保持部材を支
持ピンを介して揺動自在に支持し当該揺動でコン
タクトピンの先端部を開閉動自在とするピン保持
枠と、コンタクトピンの先端部が開動作するよう
に双方のピン保持部材に対して付勢力を与える弾
機と、コンタクトピンを保持する各ピン保持部材
の端部間に当接するように設けたクサビ状もしく
はコーン状のピツチ調整部材とを備え、前記ピツ
チ調整部材をコンタクトピン方向に摺動させてコ
ンタクトピンを保持しているピン保持部材を揺動
させることによりコンタクトピン先端部のピンピ
ツチを拡縮調整することを特徴とする電子回路基
板の検査装置。
1 Hold at least two spaced apart contact pins whose tips can freely contact electronic components on the electronic circuit board that is the object to be inspected, and the end opposite to the tip of each contact pin. A pin holding member, a pin holding frame that swingably supports each pin holding member via a support pin and allows the tip of the contact pin to open and close with the swing, and the tip of the contact pin to open and close. A bullet that applies a biasing force to both pin holding members so as to hold the contact pin, and a wedge-shaped or cone-shaped pitch adjustment member that is provided so as to abut between the ends of each pin holding member that holds the contact pin. The electronic circuit board is characterized in that the pin pitch at the tip of the contact pin is adjusted to expand or contract by sliding the pitch adjusting member in the direction of the contact pin and swinging the pin holding member that holds the contact pin. Inspection equipment.
JP20610084A 1984-10-01 1984-10-01 Apparatus for inspecting electronic printed circuit board Granted JPS6183966A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20610084A JPS6183966A (en) 1984-10-01 1984-10-01 Apparatus for inspecting electronic printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20610084A JPS6183966A (en) 1984-10-01 1984-10-01 Apparatus for inspecting electronic printed circuit board

Publications (2)

Publication Number Publication Date
JPS6183966A JPS6183966A (en) 1986-04-28
JPH0523389B2 true JPH0523389B2 (en) 1993-04-02

Family

ID=16517801

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20610084A Granted JPS6183966A (en) 1984-10-01 1984-10-01 Apparatus for inspecting electronic printed circuit board

Country Status (1)

Country Link
JP (1) JPS6183966A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03122370U (en) * 1990-03-26 1991-12-13
US5923176A (en) * 1991-08-19 1999-07-13 Ncr Corporation High speed test fixture
DE102012205352B4 (en) * 2012-02-24 2022-12-08 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Adapter for a probe to measure a differential signal
JP6214919B2 (en) * 2013-05-17 2017-10-18 日本メクトロン株式会社 Coaxial probe holding mechanism and electrical characteristic inspection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5821879B2 (en) * 1974-05-07 1983-05-04 古野電気株式会社 Chiyo Onpa Souji Yuhaki

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5036762U (en) * 1973-07-27 1975-04-17
JPS52138257U (en) * 1976-04-15 1977-10-20
JPS5821879U (en) * 1981-08-05 1983-02-10 日本電気株式会社 Electronic circuit testing equipment

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5821879B2 (en) * 1974-05-07 1983-05-04 古野電気株式会社 Chiyo Onpa Souji Yuhaki

Also Published As

Publication number Publication date
JPS6183966A (en) 1986-04-28

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