JPH05223905A - Combined testing device for circuit breaker - Google Patents

Abstract

PURPOSE:To improve economic and time efficiency by totally deciding breaking performance of a circuit breaker by using a combined testing circuit for generating 4-parameter transition recovery voltage(TRV) waveform and 2-parameter TRV waveform. CONSTITUTION:Current ic is supplied from a power source 2 through a reactor 3 for adjusting current, a short-circuit transformer 4, a first auxiliary circuit breaker 5 and a circuit breaker 1 to be tested. At the same time, short-circuit small current which ia smaller than the current ic is supplied to an auxiliary switch 10 from a short-circuit voltage device 7 through a rector 8 and a second auxiliary circuit breaker 9. Since a capacitor 23 is charged subsequently by current i3 after current i2 is shut, the voltage of transition recovery voltage (TRV)2 is raised with delay. As a result, TRV waveforms appropriate for TRV display of 4-parameter TRV of TRV, +TRV2 can be applied to the circuit breaker 1 to be tested. Economy in enforcing voltage source circuit facility associated with voltage increase per breaking point of a breaker has a large effect in reducing the capacity of a capacitor.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a synthetic test device for verifying the breaking performance of a power circuit breaker.

[0002]

2. Description of the Related Art In recent years, circuit breakers for large-capacity electric power have been made higher in voltage, and circuit breakers having a rated voltage of 550 kV can now be constructed at one breaking point. International standard for breaking test to verify breaking performance of these power circuit breakers
(International Electrotechnical Commission; abbreviated as IEC) and Electrical Standards Committee (Japanese Electrotechnical Commission)
-Technical Committee (abbreviated as JEC) specifies that the transient recovery voltage (Transie
nt recovery voltage; hereinafter abbreviated as TRV. ) As a waveform, a so-called 4-parameter TRV in which a voltage peak value appears with a delay is defined. This defines four parameters of the initial peak time and the peak time of the TRV waveform, and the initial peak value and the peak value corresponding to each time, and if the withstand voltage of these four parameters TRV is satisfied, the test circuit breaker has a desired value. It is determined to have a blocking performance. On the contrary,
In the synthesis test circuit of the Wiroud-Pouquet method, which has been widely used for verifying the breaking performance, the TRV waveform generated by the circuit is a single frequency oscillation and is called a two-parameter TRV waveform defined by the crest time and the crest value. However, many proposals have been made to improve this so that a 4-parameter TRV waveform can be generated. However, it has not been widely spread in general because of the technical problems of the test method and the economics for the enhancement of the test circuit equipment accompanying the high voltage per break point of the circuit breaker. Therefore, it is highly economical
It is desired to develop a synthetic test circuit that generates a 4-parameter TRV waveform that is technically easy.

On the other hand, for example, in the JEC standard, when the TRV waveform in the test cannot cover the four-parameter TRV waveform of the standard, a multi-part test method by a plurality of continuous tests is specified. This is TRV in the first test
Satisfies the condition of reaching the initial peak value and the condition of TRV in the second test reaching the peak value,
If the intermediate value of TRV is not sufficiently covered by these two tests, the third test will be performed. In the commonly used multi-part test method using a two-parameter TRV waveform, at least three or more tests are actually required for one condition of the breaking performance verification items, and all the breakers required. A large number of tests were required to verify the performance verification items of. In the breaking test, the circuit breaker poles are damaged by the arc by breaking the current, so it is necessary to replace the parts, and the breaking test itself requires a lot of time, and the number of tests is reduced as much as possible. It was desired to improve economic and time efficiency.

[0004]

[Problems to be Solved by the Invention] As described above,
There is a need for the development of a synthetic test circuit that generates a four-parameter TRV waveform that is technically easy and that is economically advantageous for increasing the test circuit equipment that accompanies a higher voltage per breaker of the circuit breaker. It was necessary to improve the economical and time efficiency of the breaking test by reducing the number of tests in the multi-part test method used by the company.

An object of the present invention is to provide a circuit breaker using a synthetic test circuit that generates a 4-parameter TRV waveform that is economically and technically easy and a conventional synthetic test circuit that generates a 2-parameter TRV waveform. It is to improve economic and time efficiency by comprehensively judging the breaking performance.

[0006]

In order to achieve the above object, the present invention is to verify the performance against the thermal breakdown phenomenon at the initial part of the TRV by at least the current change rate at the current zero at the time when the voltage source current is cut off, and With a synthetic test circuit that generates a two-parameter TRV waveform in which the initial increase rate of TRV of the TRV waveform matches the standard value, the performance verification for the induced breakdown phenomenon after the initial part of the TRV is at least four parameters in which the TRV waveform matches the standard waveform. The test was performed by a synthetic test circuit that generates a TRV waveform.

[0007]

In a synthetic test circuit for generating a four-parameter TRV waveform, only the TRV waveform is made to match the standard waveform, and the current change rate at zero current when the voltage source current is cut off, that is, the voltage source current value is set smaller than the standard value. by doing,
The capacitor capacity required for the voltage source circuit can be made small. Therefore, the circuit configuration can be minimized with the increase in the test circuit equipment accompanying the high voltage per break point of the breaker. A synthetic test circuit for generating this four-parameter TRV waveform, and a two-parameter TRV waveform in which at least the current change rate at zero current at the time of voltage source current interruption and the initial increase rate of TRV after current interruption are matched with the standard value. By performing the interruption test with the synthetic test circuit that generates the, it is possible to perform verification by two tests for one condition of the performance verification item.

[0008]

EXAMPLE FIG. 1 shows a four-parameter TR based on the current superposition method.
FIG. 2 is an explanatory diagram of the circuit phenomenon of FIG. 1 in one embodiment of the V waveform generating circuit. Voltage of this four-parameter TRV waveform generation circuit Document issued in January 1988, iEeE,
Transaction, On, Power, Delivery "" IEEE
Transaction on Power Delivery "Volume 3 Issue 1 Issue 2
3 and 4 on page 33, this embodiment is
A proposal for improving the circuit is newly proposed in Japanese Patent Application No. 2-242369.

In FIG. 1, the right side of the illustrated circuit breaker 1 is a high voltage voltage source circuit, and the left side is a low voltage current source circuit. A current source current ic is supplied from a commercial frequency power source 2 through a current adjusting reactor 3, a short-circuit transformer 4, a first auxiliary circuit breaker 5, and a test circuit breaker 1. At the same time, from the second short-circuit transformer 7 connected in parallel to the power source 2 via the current adjusting reactor 6 to the secondary side current limiting reactor 8,
A short circuit small current ia that is at least about 1/10 to 1/100 of the current source current ic is supplied to the auxiliary switch 10 via the second auxiliary breaker 9. The short-circuit small current ia further flows from the auxiliary switch 10 through the test breaker 1 and the ground side of the short-circuit transformer 4 and returns to the second short-circuit transformer 7. The second auxiliary circuit breaker 9 is, like the auxiliary circuit breaker 5, a second auxiliary circuit breaker from the voltage source circuit side after passing a current.
It is for disconnecting the circuit of the short-circuit transformer 7. Here, the surge absorbers 11 and 12 are often connected to the positions shown for protection of the current source. Also, 13
Is a shunt for measuring each current.

After passing the current source current ic and the short-circuit small current ia, for example, the test breaker 1, the auxiliary breaker 5, and the second auxiliary breaker 9 are opened almost simultaneously. As shown in FIG. 2, the control gap 14 is discharged immediately before the final zero point of the current source current ic and the short circuit small current ia, and the control gap 14, the reactor 16, the auxiliary switch 1 are discharged from the precharged capacitor 15.
The voltage source current iv is superimposed on the current source current ic via 0 and the test breaker 1. For example, according to the JEC standard, the superposition time point of the voltage source current iv by the current superposition method is before the zero time point of the current source current ic, and the period t ₀ of only iv is the period of the voltage source current iv. It is specified that it must be in the range of 1/8 to 1/4. The frequency of the voltage source current iv is
It is usually selected to be about 10 times the commercial frequency.

First, the auxiliary circuit breaker 5 and the second auxiliary circuit breaker 9
Respectively cut off the current source current ic and the short-circuit small current ia, and when the test breaker 1 finally succeeds in cutting off the voltage source current iv, the residual voltage of the capacitor 15 causes the residual voltage of FIG.
As shown, the current i ₁ is the resistor 17, capacitor 18
b, the current i ₂ is the resistance 19, the capacitor 20, and the current i
₃ flows through the series circuit of the reactor 21 and the resistor 22. Eventually, a current of (i ₁ −i ₃ ) flows in the capacitor 18a and a current of (i ₂ + i ₃ ) flows in the capacitor 23. here,
The capacitance of the capacitor 20 is set to be considerably smaller than that of the capacitors 23 and 18. Therefore, the voltage source current
When iv is cut off by the test breaker 1, TRV ₁ which is the initial part of the target TRV as shown in FIG. 2 is generated as a current i ₂ and a voltage drop across the capacitors 20 and 23.
If the auxiliary switch 10 cuts off the current i ₂ and there is no series circuit of the reactor 21 and the resistor 22, the terminal voltage of the test breaker 1 has an initial peak value U as shown by the one-dotted line in FIG.
Keep a constant value close to ₁ . Most of the voltage is shared between the terminals of the capacitor 20, and the voltage between the terminals of the capacitor 23 is sufficiently low. After the current i _{2 is} cut off, the capacitor 23 is continuously charged by the current i ₃ , so that TRV
_The voltage is delayed and increased as shown in ₂ . As a result, the TRV waveform suitable for the four-parameter TRV display represented by (TRV ₁ + TRV ₂ ) can be applied to the test breaker 1. This circuit is an auxiliary switch 10 that switches the circuit.
As such, it is possible to use a circuit breaker having a simple structure such as a puffer type gas circuit breaker which is usually used, and it is technically easy to generate a 4-parameter TRV waveform.

In the above four-parameter TRV waveform generation circuit, for example, the voltage source current iv without changing the TRV waveform.
Is set to 1/3 of the standard value, capacitors 15 and 18
It is possible to reduce the capacity of each to about 1/3. Considering the economical efficiency of the voltage source circuit equipment enhancement due to the high voltage per break point of the circuit breaker, the reduction of the capacitor capacity has the greatest effect. But the voltage source current
iv That is, the rate of current change at zero current at the time of voltage source current interruption is below the standard value, so the conditions specified by the standard can be satisfied for performance verification in the area of the thermal breakdown phenomenon in the initial part of the TRV. There is a defect that disappears. Therefore, for the performance verification in the area of the thermal breakdown phenomenon, the problem can be solved by adding a test using a synthetic test circuit of the conventionally used Wiroud-Puke method.

Next, the synthesis test circuit of the Wiroud-Puke method will be briefly described with reference to FIGS. FIG. 3 is an embodiment of a synthesis test circuit of the Weilde-Puke method, which is a two-parameter TRV waveform generation circuit, and FIG. 4 is an explanatory diagram of the circuit phenomenon of FIG.

3, the right side of the illustrated circuit breaker 24 is a high voltage voltage source circuit, and the left side is a low voltage current source circuit. A current source current ic is supplied from a commercial frequency power supply 25 through a current adjusting reactor 26, a short-circuit transformer 27, an auxiliary circuit breaker 28, and a test circuit breaker 24. here,
29 is a surge absorber, and 30 is a shunt for measuring the respective currents.

After passing the current source current ic, for example, the test breaker 24 and the auxiliary breaker 28 are opened almost simultaneously. As shown in FIG. 4, the control gap 31 is discharged immediately before the final zero point of the current source current ic, and the voltage source current iv is transferred from the precharged capacitor 32 via the control gap 31 and the reactor 33. Superimpose on. After interrupting the voltage source current iv,
A TRV having a single vibration determined by the TRV adjusting resistor 34, the capacitor 35, and the capacitor 32 and the reactor 33 is applied to the test breaker 24. This TRV example is shown by a waveform covering the area up to the initial wave height time t ₁ .

Thus, for one condition of the breaking performance verification item, a synthetic test circuit for generating an economical four-parameter TRV waveform with a reduced capacitor capacity and a conventional synthetic test circuit for generating a two-parameter TRV waveform. Performance verification can be performed by performing two tests with and.

[0017]

According to the present embodiment, a synthetic test circuit that generates a 4-parameter TRV waveform that is economically and technically easy and a conventional synthetic test circuit that generates a 2-parameter TRV waveform are used. By comprehensively judging the breaking performance of the circuit breaker, economic and time efficiency can be improved.

[Brief description of drawings]

FIG. 1 is a circuit diagram of a synthetic test of a circuit breaker using an embodiment of the present invention.

FIG. 2 is an explanatory diagram of a current zero point phenomenon in the embodiment of FIG.

FIG. 3 is a circuit diagram of a circuit breaker synthetic test to which a conventional example is applied.

FIG. 4 is an explanatory view of a current zero point phenomenon of the conventional example of FIG.

[Explanation of symbols]

1, 24 ... Test breaker, 2, 25 ... Power supply, 4, 7, 27
... Short-circuit transformer, 3,6,8,16,21,26,33 ...
Reactor, 13, 30 ... Shunt, 5, 28 ... Auxiliary circuit breaker, 9 ... Second auxiliary circuit breaker, 10 ... Auxiliary switch, 11,
12, 15, 18, 20, 23, 29, 32, 35 ... Capacitor, 14, 31 ... Control gap, 17, 19, 2
2, 34 ... Resistance.

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yukio Kurosawa 4026 Kuji-cho, Hitachi City, Ibaraki Prefecture Hitachi Research Laboratory, Hitachi Ltd. (72) Minoru Sato 1-1 1-1 Kokubuncho, Hitachi City, Ibaraki Stock Kokubun Plant, Hitachi, Ltd. (72) Inventor Isao Takahashi 4026 Kuji Town, Hitachi City, Ibaraki Prefecture

Claims (1)

[Claims] 1. A synthetic test circuit for a circuit breaker comprising a current source circuit and a voltage source circuit, wherein the synthetic test circuit generates a two-parameter transient recovery voltage waveform and the synthetic test circuit generates a four-parameter transient recovery voltage waveform. In the synthetic test circuit for generating the two-parameter transient recovery voltage waveform, at least the current change rate at zero current at the time of the voltage source current cutoff and the initial increase rate of the transient recovery voltage after the current cutoff are defined by standard values. The synthetic test circuit for generating the four-parameter transient recovery voltage waveform satisfies the above conditions, and at least the transient recovery voltage waveform satisfies the standard waveform condition.