JPH05222534A - Vapor deposition device - Google Patents

Vapor deposition device

Info

Publication number
JPH05222534A
JPH05222534A JP5977892A JP5977892A JPH05222534A JP H05222534 A JPH05222534 A JP H05222534A JP 5977892 A JP5977892 A JP 5977892A JP 5977892 A JP5977892 A JP 5977892A JP H05222534 A JPH05222534 A JP H05222534A
Authority
JP
Japan
Prior art keywords
carbon
thermocouple
vapor deposition
crucible
evaporated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5977892A
Other languages
Japanese (ja)
Other versions
JP3199278B2 (en
Inventor
Shunichi Murakami
俊一 村上
Ikuo Hara
育夫 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP05977892A priority Critical patent/JP3199278B2/en
Publication of JPH05222534A publication Critical patent/JPH05222534A/en
Application granted granted Critical
Publication of JP3199278B2 publication Critical patent/JP3199278B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To provide the vapor deposition device which is applicable to a method for precise formation of thin films, adds carbon at a precise addition ratio into the films and produces the films at the extremely small thickness of the formed films with high accuracy. CONSTITUTION:This vapor deposition device accelerates the electrons released from a hot filament 2 in a vacuum, deflects the electrons by a magnetic field or electric field and irradiates a material 6 to be evaporated with these electrons as an electron beam 9, thereby heating and evaporating this material. The material to be evaporated is the carbon. A crucible 3 housing this carbon, the surface of the circumferential part of this crucible and hearth parts 5A, 5B for deflecting the orbit of the electrons are respectively coated with a carbon material 7. Further, a thermocouple 10 which comes into contact with the surface of the circumferential part of the crucible housing the material to be evaporated and a control means which is inputted with the output signal of this thermocouple and controls the power feed rate to the hot filament so as to maintain the output value of the thermocouple at a prescribed value are provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は蒸着装置に係り、特に炭
素をドーピングするための電子銃型の蒸着装置の改良に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vapor deposition apparatus, and more particularly to improvement of an electron gun type vapor deposition apparatus for doping carbon.

【0002】[0002]

【従来の技術】従来の電子銃型の炭素添加用蒸着装置
は、基本的に、蒸発物質である炭素を収容するルツボ
と、このルツボを含むその周囲の表面と、蒸発物質を蒸
発させるために蒸発物質に照射される電子ビームを曲げ
るためのハース部分とから構成される。通常、ルツボは
銅で形成され、ルツボを含む表面も銅で形成され、ハー
ス部分はニッケルで形成されている。かかる構成におい
て、前記ルツボ内に収容された蒸発物質に所要のエネル
ギ量の電子ビームを与えて、蒸発物質を蒸発させるよう
にしていた。蒸発した炭素は、上方に移動し、上方に配
置された基板の表面膜の中に不純物として混入する。
2. Description of the Related Art A conventional electron gun type vapor deposition apparatus for adding carbon basically has a crucible for containing carbon, which is a vaporizing substance, a surface around the crucible including the crucible, and a vaporizing substance for vaporizing the vaporizing substance. The hearth portion for bending the electron beam with which the vaporized material is irradiated is formed. Usually, the crucible is made of copper, the surface including the crucible is also made of copper, and the hearth portion is made of nickel. In such a configuration, the evaporation material contained in the crucible is provided with an electron beam having a required energy amount to evaporate the evaporation material. The evaporated carbon moves upward and is mixed as an impurity in the surface film of the substrate arranged above.

【0003】[0003]

【発明が解決しようとする課題】従来の炭素添加用蒸着
装置では、熱フィラメントで発生する電子ビームを磁場
又は電場で制御して蒸着物質(炭素)に照射し、又は蒸
着物質の上で走査を行うようにしていた。この場合にお
いて、電子ビーム(一次ビーム)が、蒸発物質以外の部
分に照射されることがある。電子ビームが蒸発物質以外
の部分に照射されると、蒸着した材料以外の物質が蒸気
中に混入され、蒸着膜の中へ不純物が混入する。すなわ
ち炭素以外の銅やニッケル等が不純物として混入され
る。また、その他に蒸着物質に照射された電子ビーム
が、その後、反射作用によって、ルツボ周囲の表面、ハ
ースト部分に衝突し、衝突箇所から不純物が蒸発し、不
純物混入を起こすこともあった。従って、精密な薄膜成
長法、例えば、単原子層制御、不純物濃度制御を可能に
する分子エピタキシー法に関しては、電子銃型蒸着装置
では上記の如く不純物混入という問題があるため、蒸発
源として電子銃型蒸着装置を使用することができなかっ
た。代りに、温度制御による分子線セルという蒸発源を
使用していた。またP型添加半導体を製作する場合に
は、GaAsの膜で、ベリリュウムという毒性の高い元
素を不純物として使用せざる得なかった。また電子銃型
の蒸着装置におけるその他の問題点として、蒸発物質の
蒸発量の制御の問題がある。従来の蒸発量の制御は、水
晶振動子を用いた膜厚モニターで作製される膜の厚みを
直接に計測しながら行われていた。この膜厚モニター
は、一般的に数ミクロンの膜厚で使用できなくなり、オ
ングストロームレベルでの膜厚計測は不可能であった。
また、膜厚モニターの交換を頻繁に行わなければならな
いという不具合も存在した。
In the conventional vapor deposition apparatus for carbon addition, an electron beam generated by a hot filament is controlled by a magnetic field or an electric field to irradiate a vapor deposition material (carbon) or scan the vapor deposition material. I was going to do it. In this case, the electron beam (primary beam) may be applied to a portion other than the evaporated substance. When the electron beam is applied to a portion other than the vaporized substance, substances other than the vapor-deposited material are mixed in the vapor, and impurities are mixed in the vapor deposition film. That is, copper and nickel other than carbon are mixed as impurities. In addition, the electron beam applied to the vapor deposition material may subsequently collide with the surface around the crucible and the hurst portion due to the reflection action, and the impurities may evaporate from the collision portion to cause the contamination of the impurities. Therefore, with respect to a precise thin film growth method, for example, a molecular epitaxy method capable of controlling a monoatomic layer and an impurity concentration, the electron gun type vapor deposition apparatus has a problem that impurities are mixed as described above. The mold vaporizer could not be used. Instead, an evaporation source called a molecular beam cell with temperature control was used. Further, when manufacturing a P-type doped semiconductor, a highly toxic element called beryllium must be used as an impurity in a GaAs film. Further, as another problem in the electron gun type vapor deposition device, there is a problem of controlling the evaporation amount of the evaporation material. Conventionally, the amount of evaporation is controlled by directly measuring the thickness of a film produced by a film thickness monitor using a crystal oscillator. This film thickness monitor cannot be generally used with a film thickness of several microns, and it is impossible to measure the film thickness at the angstrom level.
There was also a problem that the film thickness monitor had to be replaced frequently.

【0004】本発明の目的は、精密な薄膜成長法に適用
でき、且つ膜の中に炭素を精密な添加割合で添加するこ
とのできる蒸着装置を提供することにある。また本発明
の目的は、作製される膜の厚みを非常に薄い精度で作製
することのできる蒸発量制御機構を備えた蒸着装置を提
供することにある。
An object of the present invention is to provide a vapor deposition apparatus which can be applied to a precise thin film growth method and which can add carbon into a film at a precise addition ratio. Another object of the present invention is to provide a vapor deposition apparatus provided with an evaporation amount control mechanism that can produce a film to be produced with extremely small accuracy.

【0004】[0004]

【課題を解決するための手段】本発明に係る蒸着装置
は、真空中にて熱フィラメントから放出された電子を加
速し且つ磁場又は電場により偏向し電子ビームとして蒸
発物質に照射し、これを加熱して蒸発させる蒸着装置に
おいて、蒸発物質は炭素であり、この炭素を収容するル
ツボ、このルツボの周囲部分の表面、電子の軌道を偏向
するハース部分のそれぞれを炭素材料で覆ったことを特
徴とする。前記構成において、好ましくは、炭素材料に
接触する熱電対と、この熱電対の出力を入力し、熱電対
の出力値が所定の値に保持されるように、熱フィラメン
トへの給電量を制御する制御手段を設けたことを特徴と
する。また本発明に係る蒸着装置は、真空中にて熱フィ
ラメントから放出された電子を加速し且つ磁場又は電場
により偏向し電子ビームとして蒸発物質に照射し、これ
を加熱して蒸発させる蒸着装置において、蒸発物質を収
容するルツボの周囲部分の表面に接触する熱電対と、こ
の熱電対の出力信号を入力し、熱電対の出力値が所定の
値に保持されるように、熱フィラメントへの給電量を制
御する制御手段を設けたことを特徴とする。
A vapor deposition apparatus according to the present invention accelerates electrons emitted from a hot filament in a vacuum and deflects them by a magnetic field or an electric field to irradiate an evaporated substance as an electron beam and heat it. In the vapor deposition apparatus for evaporating by the above, the vaporized substance is carbon, and the crucible containing the carbon, the surface of the peripheral portion of the crucible, and the hearth portion for deflecting the orbit of electrons are each covered with a carbon material. To do. In the above configuration, preferably, the thermocouple in contact with the carbon material and the output of the thermocouple are input, and the power supply amount to the hot filament is controlled so that the output value of the thermocouple is maintained at a predetermined value. A control means is provided. Further, the vapor deposition apparatus according to the present invention is an vapor deposition apparatus for accelerating electrons emitted from a hot filament in a vacuum and deflecting the electrons by a magnetic field or an electric field to irradiate an evaporation substance as an electron beam, and heating and evaporating the same. Input the thermocouple in contact with the surface of the surrounding part of the crucible containing the vaporized substance and the output signal of this thermocouple, and supply the power to the hot filament so that the output value of the thermocouple is maintained at a predetermined value. It is characterized in that a control means for controlling is provided.

【0005】[0005]

【作用】本発明による蒸着装置では、蒸発物質である炭
素が収容されるルツボ及びその周囲部分の表面、ハース
部分を炭素材料で覆うようにしたため、所定の膜の中に
不純物として炭素を添加させるとき、炭素以外の不純物
が添加されるのを防止でき、不純物濃度を精度良く制御
できる。従って本発明による蒸着装置は、精密な薄膜作
製法、例えば分子線エピタキシー法に適用することがで
きる。また熱電対を用いて温度を介して蒸発物質の蒸発
量を把握できるようにしたため、熱電対の出力が一定に
なるように、熱電対の検出値を利用して、蒸発物質に電
子ビームを与える熱フィラメントへの給電量を制御すれ
ば、当該蒸発量を精度良く制御することができる。
In the vapor deposition apparatus according to the present invention, the surface of the crucible in which carbon, which is a vaporized substance, and the peripheral portion thereof, and the hearth portion are covered with the carbon material, so that carbon is added as an impurity in a predetermined film. At this time, impurities other than carbon can be prevented from being added, and the impurity concentration can be controlled with high accuracy. Therefore, the vapor deposition device according to the present invention can be applied to a precise thin film forming method, for example, a molecular beam epitaxy method. In addition, since the amount of evaporation of evaporative substances can be grasped via temperature using a thermocouple, an electron beam is given to the evaporative substance by using the detection value of the thermocouple so that the output of the thermocouple becomes constant. By controlling the amount of power supplied to the hot filament, the amount of evaporation can be controlled accurately.

【0006】[0006]

【実施例】以下に、本発明の実施例を添付図面に基づい
て説明する。図1において、1は電子銃型の蒸着装置、
2は熱フィラメントである。蒸着装置1は、ルツボ3
と、ルツボ3を備える表面を有した凹所4と、凹所4の
両側の壁部を形成するハース5A,5Bを備える。ルツ
ボ3の内部には蒸発物質である炭素6が配置される。ル
ツボ3の内部表面とルツボ3の周囲部分である凹所表面
とハース5A,5Bの内部表面のそれぞれには、これら
の表面を覆うように、炭素板7が配設される。図示例で
は、炭素板7は、一体的に示されているが、実際には、
ハース表面用炭素板及びルツボを含む表面用炭素板に分
けて配設することが望ましい。
Embodiments of the present invention will be described below with reference to the accompanying drawings. In FIG. 1, 1 is an electron gun type vapor deposition device,
2 is a hot filament. The vapor deposition device 1 has a crucible 3
And a recess 4 having a surface provided with the crucible 3 and hearths 5A and 5B forming walls on both sides of the recess 4. Inside the crucible 3, carbon 6 which is an evaporated substance is arranged. A carbon plate 7 is provided on each of the inner surface of the crucible 3, the recessed surface that is the peripheral portion of the crucible 3, and the inner surfaces of the hearths 5A and 5B so as to cover these surfaces. In the illustrated example, the carbon plate 7 is shown integrally, but in reality,
It is desirable to separately provide the carbon plate for the hearth surface and the carbon plate for the surface including the crucible.

【0007】熱フィラメント2の配置位置は、蒸着装置
1に対して所定距離の位置に設定され、電源8から所定
の電力を受けて発熱作用を生じ、熱電子を発生する。発
生した熱電子は、真空環境にて集束し電子ビーム9とし
て、ルツボ3内の炭素6に照射される。熱フィラメント
2から発射される電子ビーム9は、ハース5A,5B内
に設けられた電子ビームの軌道を変更する装置により、
ルツボ3内の炭素に有効に照射されるようにその軌道を
制御される。
The arrangement position of the hot filament 2 is set to a position at a predetermined distance from the vapor deposition device 1, and receives a predetermined electric power from the power source 8 to generate heat and generate thermoelectrons. The generated thermoelectrons are converged in a vacuum environment and irradiated as an electron beam 9 on the carbon 6 in the crucible 3. The electron beam 9 emitted from the hot filament 2 is changed by the device for changing the trajectory of the electron beam provided in the hearths 5A and 5B.
The orbit is controlled so that the carbon in the crucible 3 is effectively irradiated.

【0008】電子ビーム9による加熱によって蒸着装置
1から蒸発した炭素は、蒸気の状態で上方に進み、蒸発
装置1の上方位置に配置された基板(図示せず)の表面
に蒸着、又は膜の中に添加される。
The carbon evaporated from the vapor deposition apparatus 1 by heating with the electron beam 9 advances upward in the state of vapor and vapor-deposits or forms a film on the surface of a substrate (not shown) located above the vaporization apparatus 1. Added in.

【0009】上記構成によれば、炭素以外の金属物質で
形成されたルツボ3、ルツボ3の周囲部分の表面、ハー
ス5A,5Bの表面を、炭素板7で完全に覆うように構
成した。従って、炭素材料が、一次電子ビーム及び反射
電子ビームが衝突する可能性のあるすべての箇所を覆う
ようにしたため、蒸着装置1からは、炭素のみが、蒸着
対象である基板に飛来することになる。すなわち、ルツ
ボ3等を形成する銅やハース5A,5Bを形成するニッ
ケルが蒸発し、不純物として混入することを完全に防止
できる。
According to the above construction, the carbon plate 7 is configured to completely cover the crucible 3 formed of a metal substance other than carbon, the surface of the peripheral portion of the crucible 3 and the surfaces of the hearths 5A and 5B. Therefore, since the carbon material covers all the places where the primary electron beam and the reflected electron beam may collide, only carbon from the vapor deposition apparatus 1 will fly to the substrate to be vapor deposited. .. That is, it is possible to completely prevent the copper forming the crucible 3 and the like and the nickel forming the hearths 5A and 5B from being evaporated and mixed as impurities.

【0010】他の構成としては、図1に示す如く、ルツ
ボ3の近傍の炭素板7の表面に接触する状態で熱電対1
0が配置される。この熱電対10は、炭素板7の温度を
計測する。この炭素板7の温度は、実質的に、蒸発物質
である炭素6の温度と同じである。そこで、この熱電対
10の出力信号を利用して、図3に示す制御系を構成す
る。
As another structure, as shown in FIG. 1, the thermocouple 1 is in contact with the surface of the carbon plate 7 near the crucible 3.
0 is placed. The thermocouple 10 measures the temperature of the carbon plate 7. The temperature of the carbon plate 7 is substantially the same as the temperature of the carbon 6 which is the evaporated substance. Therefore, the output signal of the thermocouple 10 is utilized to configure the control system shown in FIG.

【0011】図3において、熱電対10の出力は制御手
段11に入力される。制御手段11は温度設定器12を
有する。この温度設定器12は、所定の温度T0 に関
する信号を制御手段11に与える。この温度設定器12
は、蒸発物質を望ましい温度に設定するための基準温度
を与えるものである。熱電対10の出力信号が温度Tを
表しているとすると、制御手段11では、内蔵された比
較手段で、温度T0と温度Tの差をとる。制御手段11
は、前記温度差に基づいて、この温度差がゼロになるよ
うに、電源8における熱フィラメント2への給電量を制
御する。かかる制御系によって、蒸発物質である炭素6
が、常に温度設定器12で設定された温度に保持される
よう温度制御が行われる。蒸発物質の温度が所定温度に
常に設定されると、蒸発物質からの蒸発量は、設定され
た温度に比例して一定の値に保持される。その結果、基
板における蒸着量を、高い精度で制御することができ
る。換言すれば、作製される膜の厚みを、非常に薄い精
度で作製することができる。
In FIG. 3, the output of the thermocouple 10 is input to the control means 11. The control means 11 has a temperature setter 12. The temperature setter 12 gives a signal regarding the predetermined temperature T0 to the control means 11. This temperature setter 12
Provides a reference temperature for setting the vaporized material to a desired temperature. Assuming that the output signal of the thermocouple 10 represents the temperature T, the control means 11 takes the difference between the temperature T0 and the temperature T by the built-in comparison means. Control means 11
Controls the amount of power supply to the hot filament 2 in the power supply 8 based on the temperature difference so that the temperature difference becomes zero. By such a control system, carbon 6 which is an evaporated substance
However, temperature control is performed so that the temperature is always maintained at the temperature set by the temperature setter 12. When the temperature of the evaporation material is constantly set to a predetermined temperature, the amount of evaporation from the evaporation material is maintained at a constant value in proportion to the set temperature. As a result, the vapor deposition amount on the substrate can be controlled with high accuracy. In other words, the thickness of the film to be produced can be produced with extremely thin precision.

【0012】また他の技術的観点では、熱フィラメント
2から炭素6に与えられる電子ビーム9の電子流密度を
精密に制御することが可能となり、これにより電子銃型
蒸着装置本体の寿命を長くすることができる。
From another technical point of view, it is possible to precisely control the electron flow density of the electron beam 9 given to the carbon 6 from the hot filament 2 and thereby prolong the life of the main body of the electron gun type vapor deposition apparatus. be able to.

【0013】前記の蒸発量制御機構については、前記実
施例の炭素添加型蒸着装置に限定されるものではなく、
他の蒸着装置に対して一般的に適用することができるの
は勿論である。
The evaporation amount control mechanism is not limited to the carbon-added type vapor deposition apparatus of the above-mentioned embodiment,
Of course, it can be generally applied to other vapor deposition devices.

【0014】[0014]

【発明の効果】以上の説明で明らかなように、本発明に
よれば、炭素以外の不純物が混入せず、且つ蒸発量を精
度良く制御できるので、分子エピタキシー法など精密な
薄膜成長法に適用することができる。また膜の中に炭素
を精密な添加割合で添加することができる。またGaA
s等の分子線エピタキシー法で、ベリリュウム等の毒物
を使用せず、安全なP型添加半導体を作ることができ
る。更に、熱電対を用いて蒸発物質の温度を直接に計測
し、温度に基づいて蒸発量を制御するように構成したた
め、作製される蒸着膜の厚みを非常に薄い精度で作製す
ることができる。
As is apparent from the above description, according to the present invention, impurities other than carbon are not mixed and the amount of evaporation can be controlled with high precision, so that the present invention can be applied to a precise thin film growth method such as a molecular epitaxy method. can do. Further, carbon can be added to the film at a precise addition ratio. Also GaA
A safe P-type doped semiconductor can be produced by a molecular beam epitaxy method such as s without using a poison such as beryllium. Further, since the temperature of the evaporation substance is directly measured using a thermocouple and the evaporation amount is controlled based on the temperature, the thickness of the vapor deposition film to be produced can be produced with extremely small accuracy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る蒸着装置の一実施例を示す斜視図
である。
FIG. 1 is a perspective view showing an embodiment of a vapor deposition device according to the present invention.

【図2】蒸着装置の要部を示す横断面図である。FIG. 2 is a transverse cross-sectional view showing a main part of a vapor deposition device.

【図3】蒸発量の制御系を示すブロック構成図である。FIG. 3 is a block diagram showing a control system of an evaporation amount.

【符号の説明】[Explanation of symbols]

1 …電子銃型蒸着装置 2 …熱フィラメント 3 …ルツボ 5A,5B …ハース 6 …炭素(蒸発物質) 7 …炭素板 8 …電源 9 …電子ビーム 10 …熱電対 11 …制御手段 DESCRIPTION OF SYMBOLS 1 ... Electron gun type vapor deposition apparatus 2 ... Thermal filament 3 ... Crucible 5A, 5B ... Hearth 6 ... Carbon (evaporated substance) 7 ... Carbon plate 8 ... Power source 9 ... Electron beam 10 ... Thermocouple 11 ... Control means

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 真空中にて熱フィラメントから放出され
た電子を加速し且つ磁場又は電場により偏向し電子ビー
ムとして蒸発物質に照射し、この蒸発物質を加熱して蒸
発させる蒸着装置において、前記蒸発物質は炭素であ
り、この炭素を収容するルツボ、このルツボの周囲部分
の表面、電子の軌道を偏向するハース部分のそれぞれを
炭素材料で覆ったことを特徴とする蒸着装置。
1. An evaporation apparatus in which electrons emitted from a hot filament are accelerated in a vacuum and deflected by a magnetic field or an electric field to irradiate an evaporated substance as an electron beam, and the evaporated substance is heated and evaporated. The substance is carbon, and the vapor deposition apparatus is characterized in that the crucible containing the carbon, the surface of the peripheral portion of the crucible, and the hearth portion that deflects the orbit of electrons are covered with a carbon material.
【請求項2】 請求項1記載の蒸着装置において、前記
炭素材料に接触する熱電対と、この熱電対の出力を入力
し、前記熱電対の出力値が所定の値に保持されるよう
に、前記熱フィラメントへの給電量を制御する制御手段
を設けたことを特徴とする蒸着装置。
2. The vapor deposition apparatus according to claim 1, wherein the thermocouple in contact with the carbon material and the output of the thermocouple are input, and the output value of the thermocouple is held at a predetermined value. A vapor deposition apparatus comprising a control means for controlling a power supply amount to the hot filament.
【請求項3】 真空中にて熱フィラメントから放出され
た電子を加速し且つ磁場又は電場により偏向し電子ビー
ムとして蒸発物質に照射し、この蒸発物質を加熱して蒸
発させる蒸着装置において、前記蒸発物質を収容するル
ツボの周囲部分の表面に接触する熱電対と、この熱電対
の出力信号を入力し、前記熱電対の出力値が所定の値に
保持されるように、前記熱フィラメントへの給電量を制
御する制御手段を設けたことを特徴とする蒸着装置。
3. An evaporation apparatus in which electrons emitted from a hot filament are accelerated in a vacuum and deflected by a magnetic field or an electric field to irradiate an evaporated substance as an electron beam, and the evaporated substance is heated and evaporated. A thermocouple in contact with the surface of the surrounding portion of the crucible containing the substance and an output signal of the thermocouple are input, and power is supplied to the hot filament so that the output value of the thermocouple is maintained at a predetermined value. An evaporation apparatus comprising a control means for controlling the amount.
JP05977892A 1992-02-14 1992-02-14 Vapor deposition equipment Expired - Fee Related JP3199278B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05977892A JP3199278B2 (en) 1992-02-14 1992-02-14 Vapor deposition equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05977892A JP3199278B2 (en) 1992-02-14 1992-02-14 Vapor deposition equipment

Publications (2)

Publication Number Publication Date
JPH05222534A true JPH05222534A (en) 1993-08-31
JP3199278B2 JP3199278B2 (en) 2001-08-13

Family

ID=13123096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP05977892A Expired - Fee Related JP3199278B2 (en) 1992-02-14 1992-02-14 Vapor deposition equipment

Country Status (1)

Country Link
JP (1) JP3199278B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006111926A (en) * 2004-10-15 2006-04-27 Hitachi Zosen Corp Vapor deposition system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006111926A (en) * 2004-10-15 2006-04-27 Hitachi Zosen Corp Vapor deposition system

Also Published As

Publication number Publication date
JP3199278B2 (en) 2001-08-13

Similar Documents

Publication Publication Date Title
US4543467A (en) Effusion type evaporator cell for vacuum evaporators
US4197814A (en) Apparatus for forming compound semiconductor thin-films
JP2000030620A (en) Ion source and evaporator for it
US5849371A (en) Laser and laser-assisted free electron beam deposition apparatus and method
JP3199278B2 (en) Vapor deposition equipment
JPH0610118A (en) Vapor deposition method and evaporation device
JP3203286B2 (en) Thin film forming apparatus, crucible for evaporation source thereof, and method for forming thin film of sublimable evaporation material
US6139643A (en) Effusion cell for Si and molecular beam epitaxy system
JPH11335820A (en) Vapor deposition and vapor deposition device
JPS63472A (en) Vacuum device for forming film
US5031408A (en) Film deposition system
JPH0469809B2 (en)
EP0056737A2 (en) Method of manufacturing a semiconductor device using molecular beam epitaxy
JP2008248344A (en) Vapor deposition system and vapor deposition method
JPS61220414A (en) Apparatus for generating molecular beam
JPH051376A (en) Vapor deposition device using electron gun
Herman et al. Sources of atomic and molecular beams
JPH02160609A (en) Target for forming oxide superconductor
JPH0598429A (en) Method for manufacturing transparent electrically conductive film and apparatus for manufacturing transparent electrically conductive film
JPS61186472A (en) Apparatus for producing non-crystalline film deposited by evaporation
KR100216925B1 (en) Laser deposition apparatus for high temperature superconducting thin film
Blackburn et al. Focused‐Beam Electron Bombardment Evaporator
JP2603933B2 (en) Method of forming compound thin film
JPH051974B2 (en)
JPH0375360A (en) Thin film forming device

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080615

Year of fee payment: 7

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 7

Free format text: PAYMENT UNTIL: 20080615

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080615

Year of fee payment: 7

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090615

Year of fee payment: 8

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 8

Free format text: PAYMENT UNTIL: 20090615

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 9

Free format text: PAYMENT UNTIL: 20100615

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 10

Free format text: PAYMENT UNTIL: 20110615

LAPS Cancellation because of no payment of annual fees