JPH05209742A - Inspecting method and machining method for v-shaped groove - Google Patents

Inspecting method and machining method for v-shaped groove

Info

Publication number
JPH05209742A
JPH05209742A JP1481092A JP1481092A JPH05209742A JP H05209742 A JPH05209742 A JP H05209742A JP 1481092 A JP1481092 A JP 1481092A JP 1481092 A JP1481092 A JP 1481092A JP H05209742 A JPH05209742 A JP H05209742A
Authority
JP
Japan
Prior art keywords
shaped groove
shape
shaped
inspecting
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1481092A
Other languages
Japanese (ja)
Inventor
Hidetoshi Ishida
英敏 石田
Kazuto Saito
和人 斎藤
Toshiaki Kakii
俊昭 柿井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP1481092A priority Critical patent/JPH05209742A/en
Publication of JPH05209742A publication Critical patent/JPH05209742A/en
Withdrawn legal-status Critical Current

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Mechanical Coupling Of Light Guides (AREA)

Abstract

PURPOSE:To inspect a V-shaped groove more highly accurately by using a contact-type shape measuring apparatus or an optical contact type measuring apparatus, and measuring the positions along the inner surface of the V-shaped groove. CONSTITUTION:For example, V-shaped grooves used in an SV optical connector are formed as follows. V-shaped grooves 12 for positioning optical fibers and V-shaped grooves 13 for positioning guide pins are formed an the surface of a silicon substrate 11 by grinding using V-shaped grindstones. The shape of the surface in the direction orthogonal to the longitudinal direction of the V-shaped groove is measured by using, e.g. laser microscope measurement, optical microscope measurement for measuring transmitted light or a contact type shape measuring device. The scanning directions of the measurement of the surface shape are B from A and D from C. The measured data from A to B and the measured data from C to D are approximated with secondary curves. The shapes of the respective slant surfaces are grasped. At this time, e.g. from C to D, only the range from C' to D', which are located in the vicinity of the contact point between a circle 14 having the same diameter as a cylinder body mounted on the V-shaped groove 12 or 13 and the slant surface is measured.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、光コネクタ基板に形成
されるようなV型溝を高精度に検査する方法及び加工方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and a processing method for inspecting a V-shaped groove formed on an optical connector board with high accuracy.

【0002】[0002]

【従来の技術】光ファイバ同士を光結合する光コネクタ
として、表面に複数のV型溝を形成した一対の基板間、
又は基板と平面との間に光ファイバを挾持することによ
り各光ファイバを位置決め固定する光コネクタがある。
2. Description of the Related Art As an optical connector for optically coupling optical fibers, a pair of substrates having a plurality of V-shaped grooves formed on the surface thereof,
Alternatively, there is an optical connector that positions and fixes each optical fiber by holding the optical fiber between the substrate and the plane.

【0003】例えば、SV光コネクタは、図4に示すよ
うに、シリコン基板1に、光ファイバ位置決め用の複数
のV型溝2と、ガイドピン位置決め用のV型溝3とを形
成した後、ファイバ用のV型溝2上に平板4を重ねた状
態で樹脂モールド5を施したものである。かかる光コネ
クタ同士を光結合する場合、ガイドピン穴6とV型溝2
と平板4との間に挿入された光ファイバとの位置関係の
精度により接続損失が決定されるので、V型溝2,3の
加工精度が極めて重要となる。
For example, in an SV optical connector, a plurality of V-shaped grooves 2 for positioning an optical fiber and a V-shaped groove 3 for positioning a guide pin are formed on a silicon substrate 1 as shown in FIG. A resin mold 5 is applied in a state where a flat plate 4 is placed on the V-shaped groove 2 for a fiber. When such optical connectors are optically coupled to each other, the guide pin hole 6 and the V-shaped groove 2
Since the connection loss is determined by the accuracy of the positional relationship with the optical fiber inserted between the flat plate 4 and the flat plate 4, the processing accuracy of the V-shaped grooves 2 and 3 is extremely important.

【0004】このようなV型溝2,3の加工は、通常V
型状砥石や回転砥石などの砥石加工によって行われる
が、高精度な検査を行いながら、その検査結果を加工条
件にフィードバックする必要がある。
Processing of such V-shaped grooves 2 and 3 is usually performed by V
It is carried out by processing a grindstone such as a model grindstone or a rotary grindstone, but it is necessary to feed back the inspection result to the processing conditions while performing highly accurate inspection.

【0005】このようなV型溝の検査する場合、図5に
示すように、V型溝7の斜面7a,7bに沿ってその表
面位置を測定してV型溝7の形状を把握し、当該V型溝
7に支持される円柱体と同径の円8をV型溝7の斜面7
a,7bに接したときの中心点Oを算出するようにす
る。
When inspecting such a V-shaped groove, as shown in FIG. 5, the surface position is measured along the slopes 7a and 7b of the V-shaped groove 7 to grasp the shape of the V-shaped groove 7, A circle 8 having the same diameter as the cylindrical body supported by the V-shaped groove 7 is formed on the sloped surface 7 of the V-shaped groove 7.
The center point O when contacting a and 7b is calculated.

【0006】[0006]

【発明が解決しようとする課題】一般的には、斜面7
a,7bの表面位置の測定は一定間隔で行い、各データ
を直線で結びつけて斜面7a,7bの形状としている。
例えば特開平2−96609号公報に記載される方法に
おいても、V型溝の形状は直線で形成されるものと把握
している。
Generally, the slope 7
The surface positions of a and 7b are measured at regular intervals, and each data is connected by a straight line to form the slopes 7a and 7b.
For example, even in the method described in Japanese Patent Application Laid-Open No. 2-96609, it is understood that the V-shaped groove is formed in a straight line.

【0007】ところで、技術革新に伴い、光コネクタの
高精度化が要求されるようになり、V型溝の加工誤差に
よるばらつきをさらに減少しなければならないという問
題があるが、上述した従来の検査方法によると、十分に
対応することはできない。
By the way, with the technical innovation, there has been a demand for higher precision of the optical connector, and there is a problem that the variation due to the processing error of the V-shaped groove has to be further reduced. According to the method, it is not possible to respond sufficiently.

【0008】本発明はこのような事情に鑑み、より高精
度にV型溝を検査する方法及び加工する方法を提供する
ことを目的とする。
In view of such circumstances, it is an object of the present invention to provide a method for inspecting and processing a V-shaped groove with higher accuracy.

【0009】[0009]

【課題を解決するための手段】前記目的を達成する本発
明に係るV型溝の検査方法は、円柱体を載置するV型溝
の形状を検査するに際し、接触式形状測定機又は光接触
式測定機を用いてV型溝の内面に沿った位置を測定し、
少なくとも前記円柱体との接触点近傍の測定値を用いて
その形状を曲線として近似し、V型溝形状を検査するこ
とを特徴とする。
A method for inspecting a V-shaped groove according to the present invention which achieves the above object, is a contact type shape measuring device or an optical contact when inspecting the shape of a V-shaped groove on which a cylindrical body is mounted. Position along the inner surface of the V-shaped groove using a type measuring machine,
The V-shaped groove shape is inspected by approximating its shape as a curve using at least the measured value in the vicinity of the contact point with the cylindrical body.

【0010】また、本発明に係るV型溝の加工方法は、
円柱体を載置するV型溝を加工するに際し、上記方法に
より検査しながら、その検査結果により加工条件をフィ
ードバック制御することを特徴とする。
The V-shaped groove processing method according to the present invention is
When machining the V-shaped groove on which the cylindrical body is mounted, the method is characterized by performing inspection by the above method and feedback controlling the processing conditions based on the inspection result.

【0011】[0011]

【作用】V型溝の内面に沿った位置測定データを、実際
の内面形状に合った曲線で近似してその形状を把握する
ことにより、真の形状との差異が極めて小さくなる。そ
して、この検査した形状に基づき、加工条件をフィード
バック制御することにより、より正確な加工を実施でき
る。
By approximating the position measurement data along the inner surface of the V-shaped groove with a curve that fits the actual inner surface shape and grasping the shape, the difference from the true shape becomes extremely small. Then, more accurate machining can be performed by feedback controlling the machining conditions based on the inspected shape.

【0012】[0012]

【実施例】以下、本発明を実施例に基づいて説明する。EXAMPLES The present invention will be described below based on examples.

【0013】図1に本実施例で検査しようとするV型溝
の形状を示す。同図(A)に示すように、これはSV光
コネクタに用いるV型溝であり、シリコン基板11の表
面に光ファイバ位置決め用のV型溝12及びガイドピン
位置決め用のV型溝13をV型状砥石を用いた研削加工
により形成したものである。
FIG. 1 shows the shape of the V-shaped groove to be inspected in this embodiment. As shown in FIG. 3A, this is a V-shaped groove used for an SV optical connector, and a V-shaped groove 12 for positioning an optical fiber and a V-shaped groove 13 for positioning a guide pin are formed on a surface of a silicon substrate 11. It is formed by a grinding process using a model grindstone.

【0014】このV型溝の長手方向に直交する方向表面
形状を常法により測定する。この測定方法は特に限定さ
れない。例えば、非接触式測定方法として、V型溝の上
方からレーザ光を走査してその反射光を測定するレーザ
顕微鏡測定、又は長手方向に直交する方向から光を照射
してその透過光を測定する光学顕微鏡測定などを採用す
ることができる。また、接触式形状測定器を用いて測定
するようにしてもよい。
The surface shape of the V-shaped groove in the direction perpendicular to the longitudinal direction is measured by a conventional method. This measuring method is not particularly limited. For example, as a non-contact type measuring method, laser light is scanned from above the V-shaped groove and the reflected light thereof is measured, or laser light is irradiated from a direction orthogonal to the longitudinal direction to measure the transmitted light. Optical microscope measurement or the like can be adopted. Moreover, you may make it measure using a contact type shape measuring device.

【0015】表面形状の測定の走査方向は図1(B)に
示す通りであり、AからB、CからDである。そして、
本実施例ではAからBの測定データ、及びCからDの測
定データをそれぞれ二次曲線で近似してそれぞれの斜面
の形状を把握するようにする。また、このとき、例えば
CからDにおいては図1(C)に示すように、V型溝1
2又は13に載置する円柱体と同径の円14と斜面との
接点近傍であるC′からD′という範囲だけ測定すれば
よい。
The scanning direction for measuring the surface profile is as shown in FIG. 1 (B), and is A to B and C to D. And
In this embodiment, the measurement data of A to B and the measurement data of C to D are approximated by a quadratic curve to grasp the shape of each slope. At this time, for example, in C to D, as shown in FIG.
It suffices to measure only in the range from C ′ to D ′, which is near the contact point between the circle 14 having the same diameter as the columnar body mounted on 2 or 13 and the slope.

【0016】このように測定データを二次曲線で近似し
てその形状を把握するのは、V型状砥石で研削加工した
V型溝の斜面が実際には殆んどすべて曲線状になってい
るからであり、1μm以下の高精度加工を行う場合には
この曲線性が無視できないからである。なお、本実施例
では簡易に取扱い易い二次曲線としているが、場合によ
って実際の形状に近い曲線式を採用するのが好ましい。
In this way, the shape of the measured data is approximated by a quadratic curve in order to grasp its shape. In fact, the slope of the V-shaped groove ground by the V-shaped grindstone is actually almost curved. This is because this curve cannot be ignored when high-precision processing of 1 μm or less is performed. Although the quadratic curve is easy to handle in this embodiment, it is preferable to adopt a curve formula close to the actual shape in some cases.

【0017】図2はCからDについてほぼ連続的に測定
した結果をグラフとしたものであり、横軸はA側からの
距離(μm)、縦軸は直線CDを原点とする上下方向の
位置を示す。同図より、AからBは中央部が凹となる二
次曲線に近い形状をしている。
FIG. 2 is a graph showing the results of almost continuous measurement from C to D, where the horizontal axis is the distance (μm) from the A side, and the vertical axis is the vertical position with the straight line CD as the origin. Indicates. As shown in the figure, A to B have a shape close to a quadratic curve having a concave central portion.

【0018】図3にはこのデータに基づいて上記円14
の中心Oの座標を計算したものである。なお、図3の横
軸は、実際にデータを使用した接点近傍C′D′の距離
L(図1(C)参照)を示している。また、図3には同
じデータを用いて直線近似をして形状を把握し、円14
の中心Oの座標を求めた結果も併せて示す。
FIG. 3 shows the circle 14 based on this data.
The coordinates of the center O of are calculated. The horizontal axis of FIG. 3 shows the distance L (see FIG. 1C) in the vicinity of the contact C′D ′ where the data is actually used. In addition, in FIG. 3, the same data is used to perform linear approximation to grasp the shape,
The results of obtaining the coordinates of the center O of are also shown.

【0019】図3に示す結果より、二次曲線近似した本
実施例においては、測定範囲Lを変化させても常に中心
Oの位置は変化なかった。これは、斜面の形状が正確に
把握されていることを意味している。これに対し、直線
近似した比較例では、正確な形状が把握されていないの
で、測定範囲Lを変化させると中心Oの位置が変化して
しまった。
From the results shown in FIG. 3, in the present example in which the quadratic curve was approximated, the position of the center O did not always change even if the measurement range L was changed. This means that the shape of the slope is accurately known. On the other hand, in the comparative example in which the linear approximation is performed, since the accurate shape is not grasped, the position of the center O changes when the measurement range L is changed.

【0020】このように本実施例ではV型溝の斜面形状
が正確に把握でき、載置する円柱体の中心位置を正確に
求めることができるので、このような検査を行いなが
ら、その結果をV型状砥石のV型溝長手方向と直交する
方向への送り距離やV型溝の深さ方向への送り距離など
の加工条件へフィードバックすることにより、より高精
度な加工が実現できることになる。
As described above, in the present embodiment, the slope shape of the V-shaped groove can be accurately grasped and the center position of the columnar body to be mounted can be accurately obtained. By feeding back to the processing conditions such as the feed distance in the direction orthogonal to the V-shaped groove longitudinal direction of the V-shaped grindstone and the feed distance in the depth direction of the V-shaped groove, more accurate processing can be realized. ..

【0021】[0021]

【発明の効果】以上説明したように、本発明によると、
例えば光コネクタに用いるV型溝を極めて高精度に検
査、加工することができるという効果を奏する。
As described above, according to the present invention,
For example, the V-shaped groove used for the optical connector can be inspected and processed with extremely high accuracy.

【図面の簡単な説明】[Brief description of drawings]

【図1】一実施例を説明する説明図である。FIG. 1 is an explanatory diagram illustrating an example.

【図2】一実施例の測定結果を示すグラフである。FIG. 2 is a graph showing the measurement results of one example.

【図3】一実施例及び比較例の結果を示すグラフであ
る。
FIG. 3 is a graph showing the results of one example and a comparative example.

【図4】光コネクタの一例を示す斜視図である。FIG. 4 is a perspective view showing an example of an optical connector.

【図5】V型溝の検査を示す説明図である。FIG. 5 is an explanatory diagram showing inspection of a V-shaped groove.

【符号の説明】[Explanation of symbols]

11 基板 12 光ファイバ用のV型溝 13 ガイドピン用のV型溝 14 V型溝 15 円 11 substrate 12 V-shaped groove for optical fiber 13 V-shaped groove for guide pin 14 V-shaped groove 15 yen

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 円柱体を載置するV型溝の形状を検査す
るに際し、接触式形状測定機又は非接触式測定機を用い
てV型溝の内面に沿った位置を測定し、少なくとも前記
円柱体との接触点近傍の測定値を用いてその形状を曲線
として近似し、V型溝形状を検査することを特徴とする
V型溝の検査方法。
1. When inspecting the shape of a V-shaped groove on which a cylindrical body is mounted, the position along the inner surface of the V-shaped groove is measured using a contact type shape measuring device or a non-contact type measuring device, and at least the above A method of inspecting a V-shaped groove, which comprises inspecting a V-shaped groove shape by approximating the shape as a curve using measured values in the vicinity of a contact point with a cylindrical body.
【請求項2】 請求項1において、測定値を用いて近似
する曲線が二次曲線であることを特徴とするV型溝の検
査方法。
2. The method for inspecting a V-shaped groove according to claim 1, wherein the curve approximated by using the measured value is a quadratic curve.
【請求項3】 円柱体を載置するV型溝を加工するに際
し、請求項1又は2の方法により検査しながら、その検
査結果により加工条件をフィードバック制御することを
特徴とするV型溝の加工方法。
3. When machining a V-shaped groove on which a cylindrical body is mounted, while inspecting by the method of claim 1 or 2, the machining condition is feedback-controlled according to the inspection result. Processing method.
JP1481092A 1992-01-30 1992-01-30 Inspecting method and machining method for v-shaped groove Withdrawn JPH05209742A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1481092A JPH05209742A (en) 1992-01-30 1992-01-30 Inspecting method and machining method for v-shaped groove

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1481092A JPH05209742A (en) 1992-01-30 1992-01-30 Inspecting method and machining method for v-shaped groove

Publications (1)

Publication Number Publication Date
JPH05209742A true JPH05209742A (en) 1993-08-20

Family

ID=11871400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1481092A Withdrawn JPH05209742A (en) 1992-01-30 1992-01-30 Inspecting method and machining method for v-shaped groove

Country Status (1)

Country Link
JP (1) JPH05209742A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015042953A (en) * 2013-08-26 2015-03-05 株式会社ミツトヨ Shape measurement device and v-groove centripetal measurement method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015042953A (en) * 2013-08-26 2015-03-05 株式会社ミツトヨ Shape measurement device and v-groove centripetal measurement method

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