JPH05180788A - Method for measuring adherence value of paint film - Google Patents

Method for measuring adherence value of paint film

Info

Publication number
JPH05180788A
JPH05180788A JP3358717A JP35871791A JPH05180788A JP H05180788 A JPH05180788 A JP H05180788A JP 3358717 A JP3358717 A JP 3358717A JP 35871791 A JP35871791 A JP 35871791A JP H05180788 A JPH05180788 A JP H05180788A
Authority
JP
Japan
Prior art keywords
coating film
measured
calibration curve
radiation
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3358717A
Other languages
Japanese (ja)
Other versions
JP2521607B2 (en
Inventor
Naoki Matsuura
直樹 松浦
Seiya Shibata
誠也 柴田
Tatsuo Fukuzaki
達雄 福崎
Akira Tanaka
明 田中
Shigeo Fukuda
重雄 福田
Hiroki Nishiyama
博樹 西山
Mitsuru Tanaka
満 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IGETA KOUBAN KK
TAIYO SEIKO KK
Kawatetsu Galvanizing Co Ltd
Rigaku Corp
Yodogawa Steel Works Ltd
Original Assignee
IGETA KOUBAN KK
TAIYO SEIKO KK
Kawatetsu Galvanizing Co Ltd
Rigaku Industrial Corp
Yodogawa Steel Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IGETA KOUBAN KK, TAIYO SEIKO KK, Kawatetsu Galvanizing Co Ltd, Rigaku Industrial Corp, Yodogawa Steel Works Ltd filed Critical IGETA KOUBAN KK
Priority to JP3358717A priority Critical patent/JP2521607B2/en
Priority to GB9211639A priority patent/GB2260403B/en
Priority to DE4219565A priority patent/DE4219565A1/en
Publication of JPH05180788A publication Critical patent/JPH05180788A/en
Priority to US08/576,853 priority patent/US5579362A/en
Application granted granted Critical
Publication of JP2521607B2 publication Critical patent/JP2521607B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To measure an adherence value of a paint film accurately by a Compton scattering beam without stopping a painting line by determining a calibration curve with high reliability using a reference sample for a sample to be measured which has the wet painted film on a ground substrate continuing in the direction of flowing. CONSTITUTION:In a process of determining a calibration curve, first, the weight of a ground substrate 2 is measured before the coating of a reference sample 2Pw. After the measurement, the weight of the reference sample 2Pw wet after the coating is measured while the intensity of a Compton scattering beam BC is measured. After the measurement, a deposit quantity of the paint film Pw of the reference sample 2Pw wet is determined from both the weights to obtain a calibration curve based on the deposit quantity and the intensity of the Compton scattering beam Bc.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、塗膜の付着量の測定
方法に関し、特に、流れ方向に連続した下地基板上に、
揮発成分を含有する塗料を塗布したウェット状態の塗膜
を有する被測定試料の表面に、放射線を照射して塗膜の
付着量を測定する測定方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring the amount of coating film adhered, and more particularly, to a base substrate continuous in the flow direction,
The present invention relates to a measuring method of irradiating a surface of a sample to be measured having a coating film in a wet state coated with a coating material containing a volatile component with radiation to measure the amount of the coating film attached.

【0002】[0002]

【従来の技術】塗膜の付着量は、その色調や密着強度を
決定する要素として重要であり、したがって、従来か
ら、塗膜付着量を放射線を利用した測定方法により管理
している。この測定方法の一例を図5および図6を用い
て説明する。
2. Description of the Related Art The adhesion amount of a coating film is important as a factor for determining the color tone and adhesion strength of the coating film. Therefore, conventionally, the coating film adhesion amount is controlled by a measuring method using radiation. An example of this measuring method will be described with reference to FIGS.

【0003】図5において、たとえばめっき鋼板のよう
な流れ方向Yに連続した下地基板1上には、塗布機7に
よって、揮発成分を有する塗料が塗布される。この塗布
直後の、つまりウェット状態の塗膜PW をする被測定試
料1PW には、その表面に、X線管のような放射線源3
から、一次X線(放射線)Bが照射される。照射された
一次X線Bは、塗膜PW において、そのエネルギの一部
を失ってコンプトン散乱線BC となり、X線検出器4に
入射する。コンプトン散乱線BC は、X線検出器4によ
って検出され、図示しない計数回路部において、このコ
ンプトン散乱線BC の第1強度IC1が測定される。この
第1強度IC1と、予め求めておいた検量線に基づいて、
ウェット状態の塗膜PW の付着量TPWが求められる。こ
うして、塗布直後の塗膜PW の付着量TPWを測定するこ
とで、塗布機7をリアルタイムで制御して、付着量TPW
を管理する。
In FIG. 5, a coating material having a volatile component is applied by an applicator 7 onto a base substrate 1 which is continuous in the flow direction Y, such as a plated steel plate. Immediately after the coating, i.e. the measured sample 1P W to the coating film P W wet state, on its surface, the radiation source 3, such as X-ray tube
Then, the primary X-ray (radiation) B is emitted. The irradiated primary X-rays B lose some of their energy in the coating film P W to become Compton scattered rays B C and enter the X-ray detector 4. The Compton scattered ray B C is detected by the X-ray detector 4, and the first intensity I C1 of this Compton scattered ray B C is measured in a counting circuit section (not shown). Based on the first intensity I C1 and the calibration curve obtained in advance,
The adhesion amount T PW of the coating film P W in the wet state is obtained. In this way, by measuring the adhesion amount T PW of the coating film P W immediately after coating, the coating machine 7 is controlled in real time, and the adhesion amount T PW is controlled.
Manage.

【0004】なお、被測定試料1PW は、乾燥機5を通
過することで、塗料が乾燥する。また、上記放射線源3
およびX線検出器4などを有する分析装置は、塗布機7
の直ぐ下流に設けられている。
The sample 1P W to be measured is dried by passing through the dryer 5. In addition, the radiation source 3
The analyzer including the X-ray detector 4 and the like is a coating machine 7
It is provided immediately downstream of.

【0005】つぎに、上記検量線の求め方について説明
する。図6(a)において、まず、上記下地基板1と同
様な組成のめっき鋼板の切片2を用意し、その重量W2
を計量器6により計量する。ついで、図6(b)のよう
に、上記切片2からなる下地基板上に、塗料を塗布し、
切片2上にウェット状態の塗膜PW を有する標準試料2
W を作成する。この後、この標準試料2PW を、図6
(c)の放射線源3およびX線検出器4などを有する分
析装置10によって、コンプトン散乱線BC の第2強度
C2を測定する。この測定後、上記標準試料2PW を図
6(d)の乾燥機5A内に投入して、塗膜PW を乾燥さ
せて、図6(e)のドライ状態の塗膜PD を有する乾燥
標準試料2PD を得る。この乾燥後、乾燥標準試料2P
D の重量W2PD を計量する。
Next, how to obtain the calibration curve will be described. In FIG. 6A, first, a section 2 of a plated steel sheet having the same composition as that of the base substrate 1 is prepared, and its weight W 2
Is weighed by the weighing device 6. Then, as shown in FIG. 6 (b), a coating material is applied onto the base substrate composed of the above-mentioned section 2,
Standard sample 2 with wet coating P W on section 2
Create P W. After this, this standard sample 2P W
The second intensity I C2 of the Compton scattered ray B C is measured by the analyzer 10 having the radiation source 3 and the X-ray detector 4 in (c). After this measurement, the standard sample 2P W is put into the dryer 5A shown in FIG. 6D to dry the coating film P W, and the coating film P D in the dry state shown in FIG. 6E is dried. Obtain standard sample 2P D. After this drying, dry standard sample 2P
Weigh D 2 W PD .

【0006】ここで、塗料における顔料(揮発残分)と
溶剤(揮発成分)の比は一定である。したがって、乾燥
標準試料2PD の重量W2PD から、切片2の重量W2
減算して、乾燥した塗膜PD だけの重量WPDを求め、こ
の乾燥した塗膜の重量WPDを揮発残分比kで除して、ウ
ェット状態の塗膜PW の重量WPWを求めることができ
る。この重量WPWを切片2の面積で除して、ウェット状
態の付着量TPWを求め、この付着量TPWと上記コンプト
ン散乱線BC の第2強度IC2の関係を複数の標準試料2
W について求め、これにより、検量線を求めていた。
Here, the ratio of the pigment (volatile residue) to the solvent (volatile component) in the paint is constant. Thus, from the weight W 2PD dry standard sample 2P D, by subtracting the weight W 2 of section 2 obtains the weight W PD only dry coating film P D, the weight W PD of the dried coating film volatilized residue By dividing by the division ratio k, the weight W PW of the coating film P W in the wet state can be obtained. The weight W PW by dividing by the area of section 2 obtains the adhesion amount T PW of the wet state, the adhesion amount T PW and the Compton scattered X-ray plurality of standard samples 2 the relationship of the second intensity I C2 of B C
P W was obtained, and thereby a calibration curve was obtained.

【0007】[0007]

【発明が解決しようとする課題】ここで、上記検量線を
作成する場合には、塗布後、標準試料2PW を分析装置
10内に搬入するまでに、1分程度の時間が経過するの
は避けられない。ところが、この従来の方法では、図6
(b)の塗布直後から、図6(c)のコンプトン散乱線
C の測定までの経過時間が1分程度と差程長くないの
で、この間の揮発分量が微小であるとして、この揮発分
量を無視して検量線を作成している。
Here, when preparing the above calibration curve, it takes about 1 minute before the standard sample 2P W is carried into the analyzer 10 after coating. Inevitable. However, in this conventional method, as shown in FIG.
Since the elapsed time from immediately after the application of (b) to the measurement of Compton scattered radiation B C of FIG. 6 (c) is not so long as about 1 minute, it is assumed that the volatile content during this period is minute, The calibration curve is created by ignoring it.

【0008】しかし、この揮発分量は、図7に示すよう
に、塗布直後においては比較的大きく、そのため、塗布
直後の塗膜PW の付着量TPWと、コンプトン散乱線BC
の第2強度IC2の測定時の付着量TPWとは、若干異な
る。したがって、検量線が不正確になっているので、測
定誤差の生じる原因となる。その結果、分析精度が低下
し、塗料の種類によっては、3g/m2 〜4g/m
2 (付着量20g/m2 の場合)程度の誤差を生じる。
However, this volatile content is relatively large immediately after coating as shown in FIG. 7, and therefore, the amount of adhesion T PW of the coating film P W immediately after coating and the Compton scattered radiation B C
Is slightly different from the adhesion amount T PW when the second strength I C2 of the above is measured. Therefore, the calibration curve is inaccurate, which causes a measurement error. As a result, the accuracy of analysis is reduced, and depending on the type of paint, 3 g / m 2 to 4 g / m
An error of about 2 (for an adhesion amount of 20 g / m 2 ) occurs.

【0009】他方、図5のオンラインの装置を用いて、
前述の検量線を正確に求めることもできる。つまり、乾
燥機5で乾燥させたドライ状態の被測定試料1PD の一
部を切片として採り、この切片の付着量TPDを求め、こ
の値からウェット状態の付着量TPWを求める。その後、
測定しておいた第1強度IC1と上記付着量TPWから、フ
ァンダメンタルパラメータ法による回帰計算を行い、検
量線を求めることもできる。
On the other hand, using the online device of FIG.
It is also possible to accurately obtain the above-mentioned calibration curve. That is, a part of the measured sample 1P D in the dry state dried by the dryer 5 is taken as a slice, the adhesion amount T PD of this slice is obtained, and the adhesion amount T PW in the wet state is obtained from this value. afterwards,
It is also possible to obtain a calibration curve by performing regression calculation by the fundamental parameter method from the measured first strength I C1 and the adhered amount T PW .

【0010】しかし、この方法では、検量線を求めよう
とする塗装鋼板の種類ごとに、塗装ラインを止めて検量
線を作成せねばならず、そのため、生産性が著しく低下
する。
However, in this method, the coating line must be stopped to create a calibration curve for each type of coated steel sheet for which a calibration curve is to be obtained, and therefore productivity is significantly reduced.

【0011】この発明は上記従来の欠点を解決するため
になされたもので、下地基板上にウェット状態の塗膜を
有する被測定試料について、信頼性の高い検量線を標準
試料を用いて求めることにより、その放射線分析を正確
に行うことができる塗膜の付着量の測定方法を提供する
ことを目的とする。
The present invention has been made in order to solve the above-mentioned conventional drawbacks. For a sample to be measured having a coating film in a wet state on a base substrate, a highly reliable calibration curve is obtained using a standard sample. Accordingly, it is an object of the present invention to provide a method for measuring the amount of adhered coating film, which can accurately perform the radiation analysis.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するため
に、請求項1の発明は、上記検量線を求める工程におい
て、まず、上記標準試料における塗布前の下地基板の重
量を計量する。この計量後、塗布後のウェット状態の標
準試料の重量を計量すると同時に、標準試料から出射さ
れる放射線の強度を測定する。一方、上記両重量から上
記ウェット状態における標準試料の塗膜の付着量を求
め、この付着量および上記放射線の強度に基づいて上記
検量線を求める。
In order to achieve the above object, in the invention of claim 1, in the step of obtaining the calibration curve, first, the weight of the base substrate before coating in the standard sample is measured. After this measurement, the weight of the wet standard sample after coating is measured, and at the same time, the intensity of the radiation emitted from the standard sample is measured. On the other hand, the adhered amount of the coating film of the standard sample in the wet state is obtained from the both weights, and the calibration curve is obtained based on the adhered amount and the intensity of the radiation.

【0013】請求項2の発明は、上記検量線を求める工
程において、まず、予め、塗膜の揮発分量率の時間的推
移を求める。この後、標準試料について放射線の強度を
測定する。この測定後、上記標準試料の塗布から上記放
射線の強度の測定までの時間と上記揮発分量率に基づい
て揮発分量を求めて、この標準試料の塗布直後の塗膜付
着量から上記揮発分量を減算して上記放射線の強度測定
時の塗膜付着量を求める。この塗膜付着量および上記放
射線の強度に基づいて検量線を求める。
According to the second aspect of the present invention, in the step of obtaining the calibration curve, first, the temporal change of the volatile matter content rate of the coating film is first obtained. After this, the intensity of radiation is measured for the standard sample. After this measurement, the volatile content is obtained based on the time from the application of the standard sample to the measurement of the intensity of the radiation and the volatile content rate, and the volatile content is subtracted from the coating film adhesion amount immediately after application of the standard sample. Then, the coating film adhesion amount at the time of measuring the intensity of the radiation is obtained. A calibration curve is obtained based on the amount of coating film adhered and the intensity of the radiation.

【0014】請求項3の発明は、塗料の揮発成分につい
て測定して得られた揮発成分の検量線定数α1 と、乾燥
した塗膜について測定して得られた揮発残分の検量線定
数α2 と、揮発残分比kに基づいて、ウェット状態の塗
膜の付着量を定量する場合の検量定数αを求める。
According to the third aspect of the invention, the calibration curve constant α 1 of the volatile component obtained by measuring the volatile component of the coating material and the calibration curve constant α of the volatile residue obtained by measuring the dried coating film are obtained. Based on 2 and the volatilization residue ratio k, a calibration constant α for quantifying the adhesion amount of the wet coating film is obtained.

【0015】[0015]

【作用】請求項1または請求項2の発明によれば、標準
試料の放射線の強度を測定する際のウェット状態の正確
な塗膜付着量を求めるから、つまり、塗布後、放射線の
強度測定までの揮発成分を考慮しているので、塗膜付着
量と放射線の強度が対応している。したがって、正確な
検量線を求めることができる。
According to the invention of claim 1 or 2, the accurate amount of coating film in the wet state when the radiation intensity of the standard sample is measured is obtained, that is, after the application, until the radiation intensity measurement. Since the volatile components of are considered, the amount of coating film adhesion corresponds to the intensity of radiation. Therefore, an accurate calibration curve can be obtained.

【0016】また、請求項3の発明によれば、ウェット
状態の塗膜付着量を定量する場合の検量線定数αは、揮
発残分および揮発成分の検量線定数α1 ,α2 と揮発残
分比kに基づいて求められるから、揮発成分が揮発する
ことにより生じる誤差がなくなる。
According to the third aspect of the invention, the calibration curve constant α for quantifying the amount of coating film in the wet state is determined by the calibration curve constants α 1 and α 2 of the volatile residue and the volatile component and the volatilization residue. Since it is obtained based on the ratio k, there is no error caused by volatilization of the volatile component.

【0017】[0017]

【実施例】以下、この発明の実施例を図面に基づいて説
明する。なお、以下の説明では、検量線または検量線定
数の求め方について主に説明する。
Embodiments of the present invention will be described below with reference to the drawings. In the following description, a method of obtaining a calibration curve or a calibration curve constant will be mainly described.

【0018】図1は、この発明の第1実施例にかかる検
量線の求め方を示す。まず、図1(a)のように、標準
試料における塗布前の下地基板、つまり、切片2の重量
2 を計量器6により計量する。ついで、図1(b)の
ように、たとえばバーコータ(図示せず)などの手塗り
の塗布具により、切片2に塗料を塗布して、ウェット状
態の塗膜PW を有する標準試料2PW を得る。この図1
(b)の工程までは、図6(a),(b)の従来例と同
様である。
FIG. 1 shows how to obtain a calibration curve according to the first embodiment of the present invention. First, as shown in FIG. 1A, the weight W 2 of the base substrate before application in the standard sample, that is, the piece 2 is measured by the measuring device 6. Then, as shown in FIG. 1 (b), a paint is applied to the section 2 with a hand-painted applicator such as a bar coater (not shown) to form a standard sample 2P W having a wet coating film P W. obtain. This Figure 1
Up to the step of (b), it is similar to the conventional example of FIGS.

【0019】上記塗布後、図1(c)のように、標準試
料2PW を分析装置10A内に搬入する。この分析装置
10Aは、放射線源3、X線検出器4などの他に計量器
6Aを有している。
After the above coating, the standard sample 2P W is carried into the analyzer 10A as shown in FIG. 1 (c). The analyzer 10A has a weighing instrument 6A in addition to the radiation source 3, the X-ray detector 4, and the like.

【0020】上記搬入後、ウェット状態の標準試料2P
W の重量W2PW を計量器6Aで計量する。この計量と同
時に、放射線源3から、一次X線Bを標準試料2PW
照射する。照射された一次X線Bは、塗膜PW からコン
プトン散乱線BC を発生し、X線検出器4に入射する。
このコンプトン散乱線BC の第2強度IC2は、図示しな
い計数回路部で測定される。
After the above-mentioned loading, the standard sample 2P in a wet state
The weight W 2PW of W metered in meter 6A. Simultaneously with this measurement, the primary X-ray B is applied to the standard sample 2P W from the radiation source 3. The irradiated primary X-rays B generate Compton scattered rays B C from the coating film P W and enter the X-ray detector 4.
The second intensity I C2 of the Compton scattered ray B C is measured by a counting circuit unit (not shown).

【0021】この測定後、上記ウェット状態の標準試料
2PW の重量W2PW から切片2の重量W2 を減算するこ
とで、ウェット状態の塗膜PW の重量WPWを求め、この
重量WPWを切片2の面積で除して、ウェット状態の塗膜
付着量TPWを得る。この塗膜付着量TPWと、測定した第
2強度IC2との関係を複数の標準試料2PW について求
め検量線を得る。
[0021] After the measurement is subtracted the weight W 2 of section 2 from the weight W 2PW the standard sample 2P W of the wet state, obtains the weight W PW of coating P W wet state, the weight W PW Is divided by the area of the section 2 to obtain the wet film coating amount T PW . The relationship between the coating film adhesion amount T PW and the measured second strength I C2 is obtained for a plurality of standard samples 2P W to obtain a calibration curve.

【0022】この検量線を用いて、前述の図5のオンラ
イン状態での測定を行い、被測定試料1PW におけるウ
ェット状態の塗膜付着量TPWを求める。なお、その方法
は、前述の図5の従来例と同様であり、その説明を省略
する。
Using this calibration curve, the above-mentioned online measurement of FIG. 5 is carried out to obtain the wet film coating amount T PW of the sample 1P W to be measured. The method is similar to that of the conventional example shown in FIG. 5, and the description thereof is omitted.

【0023】ここで、図1の測定方法は、ウェット状態
の標準試料2PW を計量すると同時に、コンプトン散乱
線BC の第2強度IC2を測定する。したがって、ウェッ
ト状態の付着量TPWに正確に対応する第2強度IC2を測
定することができるから、オンラインの位置で測定しな
くても、切片2を下地基板とする標準試料2PW を用い
て、検量線を正確に求めることができる。つまり、従来
は、図1(d)の一点鎖線で示すような検量線であった
のに対し、この測定方法によれば、塗布からコンプトン
散乱線BC の測定までの揮発分量率ΔTを考慮した正確
な検量線が得られる。その結果、図5の被測定試料1P
W の塗膜付着量TPWを精度良く測定することができる。
In the measuring method of FIG. 1, the standard sample 2P W in a wet state is weighed, and at the same time, the second intensity I C2 of the Compton scattered ray B C is measured. Therefore, it is possible to measure the second strength I C2 that accurately corresponds to the adhesion amount T PW in the wet state. Therefore, even if the second strength I C2 is not measured at the online position, the standard sample 2P W having the section 2 as the base substrate is used. Therefore, the calibration curve can be accurately obtained. That is, in the past, the calibration curve shown by the one-dot chain line in FIG. 1 (d) was used, but according to this measurement method, the volatile content rate ΔT from coating to the measurement of the Compton scattering line B C is taken into consideration. An accurate calibration curve can be obtained. As a result, the measured sample 1P of FIG.
It is possible to accurately measure the coating film deposition amount T PW of W.

【0024】図2は、この発明の第2実施例にかかる検
量線の作成方法を示す。まず、図2(a)のように、計
量用試料となる切片8の重量W8 を計量器6により計量
する。ついで、切片8に塗料を塗布したウェット状態の
塗膜PW を有する計量用試料8PW を得る。この塗布後
直ちに、図2(b)に示すように、計量用試料8PW
計量器6上に載せ、計量用試料8PW について、塗布直
後からの経過時間に対する計量用試料8PW の重量W
8PW の変化(図3参照)を記録する。この重量W8PW
基づいて、塗布直後からの経過時間に対する揮発分量が
分かる。この計量を2分程度行った後、図2(c)のよ
うに計量用試料8PW を乾燥機5Aに投入して、乾燥さ
せる。この乾燥した計量用試料8PD を計量器6に載
せ、重量を計る。
FIG. 2 shows a method of preparing a calibration curve according to the second embodiment of the present invention. First, as shown in FIG. 2 (a), the weight W 8 of the section 8 serving as the sample for measurement is measured by the measuring device 6. Then, a measurement sample 8P W having a coating film P W in a wet state in which the paint is applied to the section 8 is obtained. After the coating immediately as shown in FIG. 2 (b), placing the metering sample 8P W on the weighing device 6, the metering sample 8P W, the weight W of the weighing sample 8P W with respect to the elapsed time from immediately after application
Record the change in 8PW (see Figure 3). Based on this weight W 8PW , the amount of volatile matter with respect to the elapsed time immediately after coating can be known. After this measurement is performed for about 2 minutes, the measurement sample 8P W is put into the dryer 5A and dried as shown in FIG. 2 (c). The dried weighing sample 8P D is placed on the weighing device 6 and weighed.

【0025】図2(d)および(a)の計量値から、前
述の従来例で述べたように、ドライ状態の塗膜PD の重
量WPDを求め、この重量WPDと揮発残分比kから、塗布
直後の塗膜PW の重量WPWを求める。一方、図2(b)
の連続的な計量から、揮発分量が分かっているので、上
記塗布直後の塗膜重量WPWに対する揮発分量の比、つま
り、揮発分量率ΔTが分かる。こうして、図3のよう
な、塗布後の経過時間に対する揮発分量率ΔTの変化を
求める。
As described in the above-mentioned conventional example, the weight W PD of the coating film P D in the dry state is obtained from the measured values shown in FIGS. 2D and 2A, and the weight W PD and the volatile residue ratio are obtained. The weight W PW of the coating film P W immediately after coating is determined from k. On the other hand, FIG. 2 (b)
Since the volatile content is known from the continuous measurement of, the ratio of the volatile content to the coating film weight W PW immediately after the application, that is, the volatile content rate ΔT can be found. In this way, the change in the volatile matter amount rate ΔT with respect to the elapsed time after coating is obtained as shown in FIG.

【0026】この後、上記計量用試料8PW とは別の標
準試料2PW について、前述の図5(a)ないし(e)
と同様に、図2(e)ないし(h)のように、切片2の
計量、塗布、コンプトン散乱線BC の第2強度IC2の測
定、乾燥および乾燥標準試料2PD の計量を行う。
After that, a standard sample 2P W different from the above-mentioned weighing sample 8P W is used for the above-mentioned FIGS. 5 (a) to 5 (e).
2E to 2H, the section 2 is weighed, applied, the second intensity I C2 of the Compton scattered ray B C is measured, and the dried and dried standard sample 2P D is weighed.

【0027】この際、図2(f)の塗布から図2(g)
のコンプトン散乱線BC の第2強度IC2の測定までの経
過時間tを計測しておく。この経過時間tにおける揮発
分量率ΔTを図3のグラフから求め、一方、塗布直後の
標準試料2PW の塗膜付着量TPWから揮発分量を減算し
て、コンプトン散乱線BC の第2強度IC2の測定時の塗
膜付着量TPW(1−ΔT)を求める。このコンプトン散
乱線BC の第2強度IC2と塗膜付着量TPW(1−ΔT)
との関係を塗膜付着量TPWの異なる複数の標準試料2P
W について求め、検量線を得る。
At this time, from the coating of FIG. 2 (f) to the coating of FIG. 2 (g).
The elapsed time t up to the measurement of the second intensity I C2 of the Compton scattered ray B C is measured. The volatile content rate ΔT at this elapsed time t is obtained from the graph of FIG. 3, while the volatile content is subtracted from the coating film deposition quantity T PW of the standard sample 2P W immediately after coating to obtain the second intensity of the Compton scattered ray B C. The coating film adhesion amount T PW (1-ΔT) at the time of measuring I C2 is determined. The second intensity I C2 of this Compton scattered ray B C and the coating film deposition amount T PW (1-ΔT)
The relationship with the two or more standard samples 2P with different coating amount T PW
Obtain W and obtain a calibration curve.

【0028】上記検量線を求めた後、前述の図5のオン
ライン状態での測定を行い、被測定試料1PW における
ウェット状態の塗膜付着量WPWを上記検量線を用いて求
める。なお、その方法は、前述の図5の従来例と同様で
あり、その説明を省略する。
After obtaining the above calibration curve, the above-mentioned measurement in the online state of FIG. 5 is carried out, and the coating amount W PW in the wet state of the sample 1P W to be measured is determined using the above calibration curve. The method is similar to that of the conventional example shown in FIG. 5, and the description thereof is omitted.

【0029】このように、図2の測定方法は、予め、塗
布後の経過時間に対する揮発分量率ΔTを求め、標準試
料2PW におけるコンプトン散乱線BC の第2強度IC2
と、この第2強度IC2の測定時の塗膜付着量TPW(1−
ΔT)とに基づいて検量線を求めるから、塗布から第2
強度IC2の測定までに揮発した揮発分量による誤差が生
じない。したがって、検量線を正確に求めることができ
るので、図5の被測定試料1PW の塗膜付着量TPWを精
度良く測定することができる。
As described above, in the measuring method of FIG. 2, the volatile content rate ΔT with respect to the elapsed time after coating is obtained in advance, and the second intensity I C2 of the Compton scattered ray B C in the standard sample 2P W is obtained.
When this coating adhesion amount at the time of measurement of the second intensity I C2 T PW (1-
Since the calibration curve is calculated based on ΔT),
No error occurs due to the amount of volatile matter that has volatilized until the measurement of the intensity I C2 . Therefore, since the calibration curve can be accurately obtained, the coating film deposition amount T PW of the measured sample 1P W in FIG. 5 can be accurately measured.

【0030】図4は、この発明の第3実施例にかかる検
量線の求め方を示す。まず、図4(a)のように、塗料
のうちの溶剤のみからなる揮発成分PV を容器9内に封
入して、揮発しないようにする。この後、揮発成分PV
について、放射線源3およびX線検出器4などからなる
分析装置10を用いて、コンプトン散乱線BC の強度I
V を測定する。この測定を揮発成分PV の深さが異なる
複数のものについて行い、揮発成分PV についての検量
線定数α1 を得る。なお、塗料中の顔料(揮発残分)P
D の成分が変わっても、揮発成分PV は変わらないの
で、この検量線定数α1 は一定である。
FIG. 4 shows how to obtain a calibration curve according to the third embodiment of the present invention. First, as shown in FIG. 4A, the volatile component P V of the paint, which is composed only of the solvent, is sealed in the container 9 so as not to volatilize. After this, the volatile component P V
About the intensity I of the Compton scattered ray B C using the analyzer 10 including the radiation source 3 and the X-ray detector 4.
Measure V. This measurement is performed for a plurality of volatile components P V having different depths to obtain a calibration curve constant α 1 for the volatile components P V. The pigment (volatile residue) P in the paint
This calibration curve constant α 1 is constant because the volatile component P V does not change even if the component of D changes.

【0031】一方、図4(b)ないし(f)の工程によ
り、以下に説明するように、揮発残分PD の検量線定数
α2 を得る。この検量線定数α2 を得るには、まず、図
4(b)で切片2の重量W2 を計量し、図4(c)のよ
うに切片2に塗料を塗布して、標準試料2PW を得る。
この標準試料2PW を図4(d)の乾燥機5A内に投入
して、揮発成分を飛ばし、図4(e)の乾燥状態の標準
試料2PD を得る。この乾燥状態の標準試料2PD を分
析装置10に投入し、ドライ状態の塗膜PD からのコン
プトン散乱線BC の強度ID を測定する。この測定後、
ドライ状態の標準試料2PD の重量W2PD から、上記切
片2の重量W2 を減算し、これを切片2の面積aで除し
て、ドライ状態の塗膜付着量TD =(W2PD −W2 )/
aを得る。このドライ状態の塗膜付着量TD と、これか
ら発生したコンプトン散乱線BC の強度ID を複数の標
準試料2PD について測定し、回帰計算により、ドライ
状態の塗膜PD つまり揮発残分PD の検量線定数α2
得る。
On the other hand, the calibration curve constant α 2 of the volatile residue P D is obtained through the steps shown in FIGS. 4B to 4F, as described below. In order to obtain this calibration curve constant α 2 , first, the weight W 2 of the section 2 is weighed in FIG. 4 (b), the coating material is applied to the section 2 as shown in FIG. 4 (c), and the standard sample 2P W To get
This standard sample 2P W is put into the dryer 5A of FIG. 4 (d) to remove the volatile components, and the dry standard sample 2P D of FIG. 4 (e) is obtained. This dry standard sample 2P D is put into the analyzer 10 and the intensity I D of the Compton scattered ray B C from the coating film P D in the dry state is measured. After this measurement,
From the weight W 2PD the standard sample 2P D of the dry state, by subtracting the weight W 2 of the section 2, which was divided by the area of section 2 a, the coating deposition amount of the dry state T D = (W 2PD - W 2 ) /
get a. The coating amount T D in the dry state and the intensity I D of the Compton scattered ray B C generated therefrom were measured for a plurality of standard samples 2P D , and by regression calculation, the coating film P D in the dry state, that is, the volatile residue A calibration curve constant α 2 of P D is obtained.

【0032】つぎに、こうして得られた揮発成分PV
よび揮発残分PD の検量線定数α1 ,α2 と、揮発残分
比kに基づいて、ウェット状態の塗膜付着量TPWを定量
する場合の検量線定数αの求め方の一例について説明す
る。
Next, based on the calibration curve constants α 1 and α 2 of the volatile component P V and the volatile residue P D thus obtained and the volatile residue ratio k, the coating amount T PW in the wet state is calculated. An example of how to obtain the calibration curve constant α in the case of quantification will be described.

【0033】コンプトン散乱線BC の上記強度IV およ
びID は、それぞれ下記の(1),(2)式で表され
る。 IV =A1 {1−exp(−B1 V )} …(1) ID =A2 {1−exp(−B2 D )} …(2) 但し、 A1 ,A2 :定数 B1 :揮発成分によるX線の質量吸収係数 B2 :揮発残分によるX線の質量吸収係数 TV :揮発成分の付着量 TD :揮発残分の付着量 ここで、B1 V <<1,B2 D <<1であるから、
(1)式および(2)式は、それぞれ、近似的に下記の
(11)式および(12)式のようになる。 IV =A1 1 V …(11) ID =A2 2 D …(12) A1 1 =1/α1 ,A2 2 =1/α2 と置くと、上
記(11)式および(12)式は、それぞれ、(21)
式および(22)式のように表される。 TV =α1 V …(21) TD =α2 D …(22)
The intensities I V and I D of the Compton scattered ray B C are expressed by the following equations (1) and (2), respectively. I V = A 1 {1-exp (-B 1 T V )} (1) I D = A 2 {1-exp (-B 2 T D )} (2) where A 1 , A 2 : constant B 1: the mass absorption coefficient of X-rays by volatile components B 2: mass absorption coefficient of X-rays by volatile residue T V: deposition amount T D of the volatile component: wherein deposition amount of the volatile residue, B 1 T V << 1, B 2 T D <<< 1, so
The equations (1) and (2) are approximately represented by the following equations (11) and (12), respectively. I V = A 1 B 1 T V (11) I D = A 2 B 2 T D (12) A 1 B 1 = 1 / α 1 and A 2 B 2 = 1 / α 2 Expressions (11) and (12) are respectively expressed by (21)
It is expressed as in equation (22) and equation (22). T V = α 1 I V (21) T D = α 2 I D (22)

【0034】一方、ウェット状態の塗膜付着量TPWおよ
びそのコンプトン散乱線の強度IC は、それぞれ、下記
の(3)式および(4)式で表される。 TPW=TV +TD …(3) IC =IV +ID …(4) また、揮発残分比kより、 TD =kTPW …(5) また、塗膜付着量TPWと、そのコンプトン散乱線IW
の関係は、 TPW=αIC …(6) 上記(21),(22),(3),(4),(5)およ
び(6)式を解いて、ウェット状態の塗膜付着量TPW
定量する場合の検量線定数αは、下記の(7)式により
得られる。 α=α1 α2 /{α2 (1−k)+α1 k)}…(7)
On the other hand, the coating amount T PW in the wet state and the intensity I C of the Compton scattered ray thereof are expressed by the following equations (3) and (4), respectively. T PW = T V + T D (3) I C = I V + I D (4) Further, from the volatilization residue ratio k, T D = kT PW (5) Further, the coating film deposition amount T PW , The relationship with the Compton scattered ray I W is as follows: T PW = αI C (6) The above equations (21), (22), (3), (4), (5) and (6) are solved to obtain a wet condition. The calibration curve constant α in the case of quantifying the coating film deposition amount T PW in the state is obtained by the following equation (7). α = α 1 α 2 / {α 2 (1-k) + α 1 k)} (7)

【0035】こうして、得られた検量線定数αと、図5
のオンライン状態で測定したコンプトン散乱線Bcの強
度IC1から上記(6)式に基づいて、塗膜付着量TPW
求める。
The calibration curve constant α thus obtained is shown in FIG.
From the intensity I C1 of the Compton scattered ray Bc measured in the online state, the coating film adhesion amount T PW is obtained based on the above equation (6).

【0036】このように、この実施例では、ウェット状
態の塗膜付着量TPWを定量する場合の検量線定数αは、
揮発残分PD および揮発成分PV の検量線定数α1 ,α
2 と揮発残分比kに基づいて求められるから、揮発成分
V が揮発することにより生じる誤差がなくなる。した
がって、分析精度が向上する。
As described above, in this embodiment, the calibration curve constant α for quantifying the coating amount T PW in the wet state is
Calibration curve constants for volatile residue P D and volatile component P V α 1 , α
Since it is obtained based on 2 and the volatilization residue ratio k, the error caused by volatilization of the volatile component P V is eliminated. Therefore, analysis accuracy is improved.

【0037】なお、この検量線定数αを用いて、付着量
PWを測定したところ、塗布量20g/m2 に対して、
従来3g/m2 〜4g/m2 程度の大きな測定誤差があ
ったのに対し、測定誤差が、0.6g/m2 程度まで小
さくなった。
The adhesion amount T PW was measured using this calibration curve constant α, and when the coating amount was 20 g / m 2 ,
While there has been conventionally 3g / m 2 ~4g / m 2 about a large measurement error of the measurement error was reduced to about 0.6 g / m 2.

【0038】ところで、上記各実施例では、被測定試料
1PW および標準試料2PW から発生した放射線として
コンプトン散乱線BC の強度IC1,IC2を測定したが、
この発明では、β線の後方散乱線の強度を測定してもよ
い。
By the way, in each of the above examples, the intensities I C1 and I C2 of the Compton scattered rays B C were measured as the radiation generated from the sample to be measured 1P W and the standard sample 2P W.
In the present invention, the intensity of β-ray backscattered rays may be measured.

【0039】[0039]

【発明の効果】以上説明したように、この発明によれ
ば、流れ方向に連続した下地基板上にウェット状態の塗
膜を有する被測定試料について、信頼性の高い検量線を
標準試料を用いて求めることができるから、塗料の種類
ごとに塗装ラインを止めることなく、塗膜付着量を正確
に放射線により測定することができる。
As described above, according to the present invention, a highly reliable calibration curve is obtained by using a standard sample for a sample to be measured having a wet coating film on a base substrate continuous in the flow direction. Since it can be determined, the amount of coating film can be accurately measured by radiation without stopping the coating line for each type of coating material.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)ないし(c)は、この発明の第1実施例
にかかる検量線を求める方法を示す工程図、(d)は検
量線を示す特性図である。
1A to 1C are process diagrams showing a method for obtaining a calibration curve according to a first embodiment of the present invention, and FIG. 1D is a characteristic diagram showing the calibration curve.

【図2】この発明の第2実施例にかかる検量線を求める
方法を示す工程図である。
FIG. 2 is a process drawing showing a method for obtaining a calibration curve according to a second embodiment of the present invention.

【図3】揮発分量率の時間的推移を示す特性図である。FIG. 3 is a characteristic diagram showing a temporal transition of a volatile content rate.

【図4】(a)ないし(f)は、この発明の第3実施例
にかかる検量線定数α1 ,α2 を求める方法を示す工程
図である。
4 (a) to 4 (f) are process diagrams showing a method for obtaining calibration curve constants α 1 and α 2 according to the third embodiment of the present invention.

【図5】塗装ラインにおけるコンプトン散乱線の測定方
法を示す概略構成図である。
FIG. 5 is a schematic configuration diagram showing a method for measuring Compton scattered radiation in a coating line.

【図6】従来の検量線の求め方を示す工程図である。FIG. 6 is a process chart showing how to obtain a conventional calibration curve.

【図7】揮発分量の時間的推移を示す特性図である。FIG. 7 is a characteristic diagram showing a temporal transition of the volatile content.

【符号の説明】[Explanation of symbols]

1…流れ方向に連続した下地基板、1PW …被測定試
料、2…切片(下地基板)、2PW …ウェット状態の標
準試料、B…放射線(一次X線)、Bc…放射線(コン
プトン散乱線)、PW …ウェット状態の塗膜、PD …乾
燥した塗膜。
1 ... Base substrate continuous in the flow direction, 1P W ... Measured sample, 2 ... Section (base substrate), 2P W ... Wet standard sample, B ... Radiation (primary X-ray), Bc ... Radiation (Compton scattered ray) ), P W ... wet coating, P D ... dried coating.

───────────────────────────────────────────────────── フロントページの続き (71)出願人 000006910 株式会社淀川製鋼所 大阪府大阪市中央区南本町4丁目1番1号 (72)発明者 松浦 直樹 大阪府高槻市赤大路町14番8号 理学電機 工業株式会社内 (72)発明者 柴田 誠也 大阪府高槻市赤大路町14番8号 理学電機 工業株式会社内 (72)発明者 福崎 達雄 大阪府高槻市赤大路町14番8号 理学電機 工業株式会社内 (72)発明者 田中 明 大阪府堺市出島西町2番地 イゲタ鋼板株 式会社内 (72)発明者 福田 重雄 東京都港区芝公園2丁目4番1号 川鉄鋼 板株式会社内 (72)発明者 西山 博樹 千葉県船橋市金杉町883番地 大洋製鋼金 杉社宅2−231 (72)発明者 田中 満 大阪府大阪市中央区南本町4丁目1番1号 株式会社淀川製鋼所内 ─────────────────────────────────────────────────── ─── Continued Front Page (71) Applicant 000006910 Yodogawa Steel Works, Ltd. 4-1-1 Minamihonmachi, Chuo-ku, Osaka-shi, Osaka (72) Inventor Naoki Matsuura 14-8 Akaoji-machi, Takatsuki-shi, Osaka Rigaku Denki Kogyo Co., Ltd. (72) Inventor Seiya Shibata 14-8 Akaoji-cho, Takatsuki-shi, Osaka Rigaku Denki Kogyo Co., Ltd. (72) Inventor Tatsuo Fukusaki 14-8 Akaoji-cho, Takatsuki-shi, Osaka Rigaku Denki Industrial Co., Ltd. (72) Inventor Akira Tanaka, 2 Dejima Nishimachi, Sakai City, Osaka Prefecture Igeta Steel Plate Co., Ltd. (72) Inventor Shigeo Fukuda 2-4-1, Shiba Koen, Minato-ku, Tokyo Kawakawa Steel Plate Co., Ltd. (72) Inventor Hiroki Nishiyama 883 Kanesugi-cho, Funabashi-shi, Chiba Taiyo Steel Co., Ltd. 2-231, Sugisha House (72) Inventor Mitsuru Tanaka 4-1-1 Minamihonmachi, Chuo-ku, Osaka-shi, Osaka Inside the Yodogawa Steel Works

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 流れ方向に連続した下地基板上に揮発成
分を含有する塗料を塗布したウェット状態の塗膜を有す
る被測定試料の表面に、塗装直後に、放射線を照射し
て、この放射線を受けた上記被測定試料から出射される
放射線の第1強度を測定し、 一方、切片からなるウェット状態の標準試料に放射線を
照射して、この放射線を受けた上記標準試料から出射さ
れる放射線の第2強度を測定することで、この第2強度
とウェット状態の塗膜の付着量との関係からなる検量線
を予め求めておき、 上記放射線の第1強度および検量線に基づいて、上記被
測定試料におけるウェット状態の塗膜の付着量を求める
測定方法であって、 上記検量線を求める工程において、 上記標準試料における塗布前の下地基板の重量を計量
し、この計量後、塗布後のウェット状態の標準試料の重
量を計量すると同時に上記第2強度を測定し、上記両重
量から上記ウェット状態における標準試料の塗膜の付着
量を求め、この付着量および上記第2強度に基づいて上
記検量線を求める塗膜の付着量の測定方法。
1. The surface of a sample to be measured having a coating film in a wet state in which a paint containing a volatile component is applied on a base substrate continuous in the flow direction is irradiated with radiation immediately after coating, and this radiation is irradiated. The first intensity of the radiation emitted from the sample to be measured that has been received is measured, and on the other hand, the standard sample in a wet state composed of a slice is irradiated with the radiation, and the radiation emitted from the standard sample that has received this radiation is measured. By measuring the second intensity, a calibration curve consisting of the relationship between the second intensity and the amount of the coating film in the wet state is obtained in advance, and based on the first intensity and the calibration curve of the radiation, A method for measuring the amount of coating film in a wet state on a measurement sample, wherein in the step of determining the calibration curve, the weight of the base substrate before coating in the standard sample is weighed, and after this weighing, after coating The second strength is measured at the same time as the weight of the standard sample in the wet state is measured, and the coating amount of the coating film of the standard sample in the wet state is obtained from the both weights. Based on the coating amount and the second strength, A method for measuring the amount of coating film adhered to obtain a calibration curve.
【請求項2】 流れ方向に連続した下地基板上に揮発成
分を含有する塗料を塗布したウェット状態の塗膜を有す
る被測定試料の表面に、塗装直後に、放射線を照射し
て、この放射線を受けた上記被測定試料から出射される
放射線の第1強度を測定し、 一方、切片からなるウェット状態の標準試料に放射線を
照射して、この放射線を受けた上記標準試料から出射さ
れる放射線の第2強度を測定することで、この第2強度
とウェット状態の塗膜の付着量との関係からなる検量線
を予め求めておき、 上記放射線の第1強度および検量線に基づいて、上記被
測定試料におけるウェット状態の塗膜の付着量を求める
測定方法であって、 上記検量線を求める工程において、 予め、塗膜の揮発分量率の時間的推移を求め、 この後、標準試料について上記第2強度を測定し、上記
標準試料の塗布から上記第2強度の測定までの時間と上
記揮発分量率に基づいて揮発分量を求めて、この標準試
料の塗布直後の塗膜付着量から上記揮発分量を減算して
上記第2強度測定時の塗膜付着量を求め、この塗膜付着
量および上記第2強度に基づいて上記検量線を求める塗
膜の付着量の測定方法。
2. The surface of a sample to be measured having a coating film in a wet state in which a coating material containing a volatile component is applied on a base substrate continuous in the flow direction is irradiated with radiation immediately after coating, and this radiation is irradiated. The first intensity of the radiation emitted from the sample to be measured that has been received is measured, and on the other hand, the standard sample in a wet state composed of a slice is irradiated with the radiation, and the radiation emitted from the standard sample that has received this radiation is measured. By measuring the second intensity, a calibration curve consisting of the relationship between the second intensity and the amount of the coating film in the wet state is obtained in advance, and based on the first intensity and the calibration curve of the radiation, A measuring method for determining the amount of a coating film in a wet state on a measurement sample, wherein in the step of determining the above calibration curve, a temporal transition of the volatile matter content rate of the coating film is determined in advance, and then the standard sample The strength is measured, the volatile content is obtained based on the time from the application of the standard sample to the measurement of the second strength and the volatile content rate, and the volatile content is calculated from the amount of coating film immediately after application of the standard sample. A method for measuring the amount of coating film adhered by subtracting the amount of coating film adhered during the second strength measurement to obtain the calibration curve based on the amount of coating film adhesion and the second strength.
【請求項3】 流れ方向に連続した下地基板上に揮発成
分を含有する塗料を塗布したウェット状態の塗膜を有す
る被測定試料の表面に、塗装直後に、放射線を照射し
て、この放射線を受けた上記被測定試料から出射される
放射線の強度を測定し、 上記ウェット状態の塗膜の付着量を定量する場合の検量
線定数αと上記放射線強度に基づいて、上記被測定試料
におけるウェット状態の塗膜の付着量を求める測定方法
であって、 塗料の揮発成分について測定して得られた揮発成分の検
量線定数α1 と、乾燥した塗膜について測定して得られ
た揮発残分の検量線定数α2 と、揮発残分比kに基づい
て上記検量線定数αを求める塗膜の付着量の測定方法。
3. The surface of a sample to be measured having a coating film in a wet state in which a paint containing a volatile component is applied on a base substrate continuous in the flow direction is irradiated with radiation immediately after coating, and this radiation is irradiated. Based on the calibration curve constant α and the radiation intensity when measuring the intensity of the radiation emitted from the received sample to be measured and quantifying the amount of the coating film in the wet state, the wet state in the sample to be measured A method for determining the amount of adhered coating film, wherein the calibration curve constant α 1 of the volatile component obtained by measuring the volatile component of the coating and the volatile residue obtained by measuring the dried coating film A method for measuring the adhered amount of a coating film, wherein the calibration curve constant α is obtained based on the calibration curve constant α 2 and the volatile residue ratio k.
JP3358717A 1991-09-19 1991-12-27 How to measure the amount of coating film Expired - Fee Related JP2521607B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP3358717A JP2521607B2 (en) 1991-12-27 1991-12-27 How to measure the amount of coating film
GB9211639A GB2260403B (en) 1991-09-19 1992-06-02 Method of and apparatus for the quantitative measurement of paint coating
DE4219565A DE4219565A1 (en) 1991-09-19 1992-06-15 METHOD AND DEVICE FOR THE QUANTITATIVE MEASUREMENT OF A COLOR COATING
US08/576,853 US5579362A (en) 1991-09-19 1995-12-22 Method of and apparatus for the quantitative measurement of paint coating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3358717A JP2521607B2 (en) 1991-12-27 1991-12-27 How to measure the amount of coating film

Publications (2)

Publication Number Publication Date
JPH05180788A true JPH05180788A (en) 1993-07-23
JP2521607B2 JP2521607B2 (en) 1996-08-07

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ID=18460752

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2521607B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001272360A (en) * 2000-01-20 2001-10-05 Kawasaki Steel Corp Method and device for measuring oxygen amount per unit area of steel band amount in internal oxidized layer formed in steel band
EP1526376A1 (en) * 2003-10-21 2005-04-27 Mahlo GmbH & Co. KG Method and apparatus for determining a basis weight and/or a chemical composition of a conveyed material specimen

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001272360A (en) * 2000-01-20 2001-10-05 Kawasaki Steel Corp Method and device for measuring oxygen amount per unit area of steel band amount in internal oxidized layer formed in steel band
EP1526376A1 (en) * 2003-10-21 2005-04-27 Mahlo GmbH & Co. KG Method and apparatus for determining a basis weight and/or a chemical composition of a conveyed material specimen

Also Published As

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