JPH05173823A - Test system for data processor - Google Patents

Abstract

PURPOSE:To eliminate a need of data for test by using data used for essential data processing to test a data processor. CONSTITUTION:A data processor 4 which performs the data processing and performs the fault processing like degeneracy at the time of a fault uses data stored in a data buffer 900, where data used for essential data processing is held, to perform a series of tests of the data processor and reads out the result of the essential data processing from a data processing part. The execution result of the essential data processing is stored in a result read means 70, and the data processor 4 is tested by a test means 50 which compares the result of a series of tests and the execution result of the essential data processing with each other to perform the test.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test method for a data processing device in an information processing system, which is characterized in that the data used for the original data processing is used at the time of the test so that the test data becomes unnecessary. And the test method.

[0002]

2. Description of the Related Art Conventionally, in the case of testing a data processing device, since another data is manually prepared for the test, it is possible that a bug is created in the prepared data itself.
The high quality of the test data could not be guaranteed.

[0003]

Since the test data is manually created, it takes a considerable amount of time to create the test data, and a large number of bugs are created to manually create the test data. There was a problem of getting out.

The present invention has been made in view of the above-mentioned problems, and provides a test method for a data processing device, which does not require creation of test data by using data used in original data processing during a test. The purpose is to

[0005]

A test method for a data processing device according to the present invention performs data processing instructed by an instruction from a higher-level device, and returns a processing result to the higher-level device after completion of the process and In a data processing device that performs predetermined failure processing such as detailed failure information collection, degeneration, and failure reporting to a higher-level device when a failure is detected, a data buffer that temporarily holds data transmitted from the higher-level device,
A series of tests of the data processing device is performed using the data stored in the data buffer, and a test means for performing the failure processing when a failure is detected, and a receiving means for receiving an instruction from the host device are provided. The host device sends a test instruction to the data processing device, and when the data processing device receives the test instruction, the test means uses the data stored in the data buffer and used for the original data processing to perform the test. When the instruction is received from the upper-level device, the receiving means performs processing corresponding to the instruction received after the test is stopped, and when the test is not executing, performs processing corresponding to the instruction received immediately. Characterize.

In addition, in the test method of the data processing device, a function for holding the original execution result of the data processing is added to the result reading means in the data processing device for reading the data processing result from the data processing unit. By doing so, the test is performed by comparing the test result executed by the test means with the execution result of the original data processing.

[0007]

According to the above structure, when the receiving means of the data processing device receives the test instruction from the host device, the test means uses the data stored in the data buffer for the original data processing to perform the test. If the test is being executed when the instruction is received from the host device, after receiving the test, and if the test is not being executed, the receiving means performs a process for immediately responding to the instruction. As a result, the data processing device can be tested using the data used in the original data processing.

Alternatively, since the execution result of the original data processing is held in the result reading means in the data processing apparatus and the test result executed by the test means and the execution result of the original data processing are compared and tested. You can check the test results.

[0009]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

FIG. 1 is a block diagram of a data processing device in a test system of a data processing device according to an embodiment of the present invention.

In the figure, a data processing device 4 is a magnetic disk (hereinafter referred to as DSK) storing a data group 700 to be processed.
2), a control unit 4C that is connected through a line 3 and controls data processing, and a control unit 4P that processes data. The control unit 4C has a reading means 10 for reading the data of the DSK 2 into the data buffer 900, a receiving means 20 for receiving an instruction sent from the higher-level device 1 via the line 3, a data processing result in the data processing device 4, and a failure. The data processing device 4 (mainly the processing unit 4P) is configured to use the data in the data buffer 900, the data processing control means 40 for controlling the entire data processing, the transmission means 30 for sending information and the like to the host device 1 via the line 3. Test means to test 5
0, writing means 60 for writing the processing data of the data buffer 900 to the processing unit 4P and performing data processing, and
After the processing of the processing unit 4P is completed, the processing result is read from the processing unit 4P, converted into a predetermined format, and then sent to the host device by the transmission unit 30. The processing unit 4P includes a result reading unit 70. For processing and accumulate processing result 1
It includes 0 processing units 4P1 to 4P10.

Next, the operation procedure during normal processing will be described. The data processing device 4 is initialized by turning on the power,
The receiving means 20 waits for an instruction from the host device 1. Incidentally, the processing unit having a failure detected during the initialization is separated and disabled thereafter (hereinafter abbreviated as "degeneration"). The upper-level device 1 stores the processing target data group 700 in the DSK 2, and then transmits a data processing instruction including information indicating the storage position of the processing target data group 700 to the data processing device 4 via the line 3 to control the data processing. The processing is started by the means 40. The data processing control means 40 causes the reading means 10 to read the data of the processing target data group 700 from the DSK 2 into the data buffer 900 for 10 processing units 4P1 to 4P10, and the writing means 60 processes the data in the data buffer 900. The part 4P is caused to perform write data processing. In the processing unit 4P, data is written in the processing units that are normal and is being processed, and a maximum of 10 processing units perform data processing in parallel. Data processing control means 40
Repeats the above work until all the data in the processing target data group 700 is exhausted, waits for the completion of the processing of the processing unit 4P by the result reading means 70, and then reads the processing result accumulated in the normal processing unit, After being temporarily stored in the result reading means, it is converted into a predetermined format and transmitted to the host device 1. After that, the receiving means 20 waits for an instruction from the host means 1. Further, when a failure of the processing unit is detected during these processes, detailed information of the processing unit in which the failure has occurred, degeneration, failure report to the higher-level device 1, cancellation of the processing result of the normal unit of the processing unit 4P, Then, the same operation as described above for the data group 700 to be processed is performed again by the data processing control means 40.

After receiving the processing result, the host device 1
If there is another data to be processed, the data processing device 4 is caused to perform data processing in the same manner as described above, and if there is no data, the data processing device 4 is not used until there is data to be processed.

FIG. 2 is a flow chart of the processing of the receiving means of the data processing apparatus of FIG.

Next, the detailed operation of the receiving means 20 will be described with reference to the flowchart of FIG. First, the receiving means 20 is started by initialization by turning on the power source, resets the test execution flag (201), waits for instruction reception from the higher-level device 1 (202), receives a data processing instruction, and has received the instruction. The flag is set (203), and it is determined that the test is not being executed by the test in progress flag (20
4) The received instruction is not a test instruction (20
7), perform the series of data processing operations described above (20
8) The instruction received flag is reset (209), and the instruction is awaited again (202). Next, when the data processing instruction is received again, the same operation is performed. When the host device 1 determines that there is no data to be processed next, the test instruction is transmitted, and when the test instruction is received, the instruction has been received. The flag is reset (203), the test in progress flag determines that the test is not being executed (204), and since it is a test instruction (207), the test means 50 is activated (210) and the test in progress flag is set ( 211) The instruction received flag is reset (209), and the instruction reception standby is resumed (20).
2).

FIG. 3 is a flow chart of processing of the test means of FIG.

Next, the detailed operation of the test means 50 which is activated by the receiving means 20 and is executed as a child task of the receiving means 20 will be described with reference to the flowchart of FIG. It is specified that the test is performed using the data A used in the original data processing stored in the data buffer 900 (501), the data A is taken out from the data buffer 900 (502), and all the data A is retrieved. The writing process is started by the processing unit (503), and the processing unit 4P
Waits for completion of processing (504), confirms whether each processing unit has ended normally (505), and collects failure information (506) and degenerates processing unit (507) for units that did not operate normally. , And a failure report to the host device 1 (508), and the next data in the data buffer 900 is designated (509). Until the data is gone
A test is performed in the same manner as described above (502 to 510), and when there is no data, the reception means 20 sets and resets the instruction reception completion flag is checked (511). If the instruction reception has not been completed, it is stored in the data buffer 900. The test is carried out in the same manner as described above using all the data (501 to 5).
11) If the instruction has been received, the test cancellation is received by the receiving means 2
0 is notified (512), and the process ends. It should be noted that the test data is written to the processing unit 4P (503), and the processing end wait (5
Also in 04), when a failure of the processing unit 4P is detected, failure processing such as collecting failure information from the processing unit in which the failure has occurred, degrading the processing unit, and reporting a failure to the host device 1 is performed.

Next, after the host device 1 issues a test instruction, the data to be processed is completed, and the processing target data group 70
The operation of the receiving means 20 when a data processing instruction is received after writing 0 to the disc will be described with reference to the flowchart of FIG. A data processing instruction is received from the host device 1 (202), an instruction reception completion flag is set (203),
It is determined that the test is being executed according to the test-execution flag (20
4), waiting for the test cancellation notification from the test means 50 (20
5) When the test is completed and the test stop notification is received from the test means 50, the test in progress flag is reset (206), and since it is not a test instruction (207), a series of data processing work is performed (208), and an instruction is given. The reception wait flag is reset (209) and the instruction reception wait is resumed (202).

As described above, the data processor is
It is possible to carry out a test using the data used in the original data processing, there is no need to create test data, and there is no need to have a separate buffer for storing test data.

Next, a second embodiment of the present invention will be described.

FIG. 4 is a flow chart of the processing of the result reading means in the test system according to the second embodiment of the present invention. The configuration of the data processing device of the second embodiment is the same as that of the previous embodiment, and the normal operation of the data processing device and the operation of the receiving means 20 are the same as the operation shown in the previous embodiment.

The detailed operation of the result reading means 70 activated by the data processing control means will be described with reference to the flow chart of FIG. The processing result of the processing unit 4P that is performing data processing is awaited by the instruction of the data processing control means 40 (701), and the processing result accumulated in the normal processing unit is read (702). The result is stored in the result reading means 70 with addition of information as to whether it is present (703), converted into a predetermined format (704), and the result is passed to the transmitting means 30 (705).

FIG. 5 is a flow chart of the processing of the test means according to the second embodiment of the present invention.

Next, the detailed operation of the test means 50 will be described with reference to the flowchart of FIG. Data buffer 9
The data A used in the data processing of the processing unit 4Pn stored in 00 is taken out as the data for test (50
1), the execution result of the data A is taken out as an expected value of the test result by the reading means 70 (502), the writing process of the data A is started to all the processing units (503), and the processing of the processing unit 4P is completed. Wait for (504),
The processing results from all the normal processing units are read (513), it is checked that all the read results are equal to the expected value (514), the next data is specified from the data buffer 900 (509), 900
Repeat the above test until the data of
2 to 510) When there is no data in the data buffer 900, the instruction receiving flag set and reset by the receiving means 20 is checked (511). If no instruction has been received, all the data stored in the data buffer 900 is checked. Test as described above using
1) If the instruction has been received, the test cancellation is received by the receiving means 20.
(511), and the process ends. It should be noted that the test data is written to the processing unit 4P (503) and the process is awaited (50).
4), in the processing result read (513), the processing unit 4
When a P fault is detected, the fault information is collected from the faulty processing unit, the processing unit is degenerated, and the host device 1
Failure processing such as failure reporting to the next data, move to the next data specification (510), and if a discrepancy is found in the expected value and the check (514), degenerate the processing unit and report the failure to the host device 1. I do.

As described above, the data processing device can be tested by using the data used in the original data processing, and the test result can be checked by using the result of the original data processing.

[0026]

As described above, the data processing device can be easily tested using the data used in the original data processing, there is no need to create test data, and the test data can be used. There is no need to have a separate buffer for storing, and there is an effect that the test result can be checked by using the result of the original data processing.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a data processing device in a test system of a data processing device according to an embodiment of the present invention.

FIG. 2 is a flow chart of a process of a receiving unit of the data processing device shown in FIG.

FIG. 3 is a flow chart of processing of the test means shown in FIG.

FIG. 4 is a flow chart of processing of a result reading means according to a second embodiment of the present invention.

FIG. 5 is a flow chart of processing of a test means according to a second embodiment of the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Host device 2 Magnetic disk device 3 Line 4 Data processing device 4C Data processing device control unit 4P Data processing device processing unit 4P1 to 4P10 Processing unit 10 Reading means 20 Receiving means 30 Sending means 40 Data processing instructing means 50 Testing means 60 Writing means 70 result reading means 900 data buffer

Claims (2)

[Claims] 1. Data processing instructed by a higher-level device is performed, and after the processing is completed, a processing result is returned to the higher-level device, and when a failure is detected during data processing, detailed error information is collected, degeneration, and a higher-level device In a data processing device that performs a predetermined fault process such as a fault report, a data buffer that temporarily holds data transmitted from a higher-level device,
It has a test means for performing a series of tests of the data processing device using the data stored in the data buffer and performing the failure processing when a failure is detected, and a receiving means for receiving an instruction from a higher-level device. The device sends a test instruction to the data processing device, and when the data processing device receives the test instruction, the data processing device performs the test by using the data stored in the data buffer and used for the original data processing. When the instruction is being received from the host device, the receiving means performs processing corresponding to the instruction received after the test is stopped, and when the test is not executing, performs processing corresponding to the instruction received immediately. Test method for data processing equipment. 2. The test method for a data processing device according to claim 1, wherein the result reading means in the data processing device for reading the result of the data processing from the data processing unit holds the execution result of the original data processing. A test method for a data processing device, wherein a test is performed by comparing a test result executed by the test means with an execution result of original data processing by adding a function for storing the data.