JP2544416B2 - Test data generation processing method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Overview] Regarding a test of a computer adapter and an adapter control module, an adapter and an adapter control module are provided for the purpose of a test data generation processing method for easily generating error-free test data. Control module, which exchanges control information with the adapter according to the required test data input, and an adapter tester that tests the adapter, and exchanges control information with the control module according to the required test data input, the control In a computer system having a control module tester for testing a module, the adapter tester collects the test data for the control module tester based on the control information exchanged during execution of the test of the adapter. Means for providing the control module tester with the adapter tester. The test data for, configured to provide a means to collect based on the control information exchanged in 該制 during the test run of your module.

[Industrial applications]

The present invention relates to a test data generation processing method when testing an adapter and an adapter control module in a computer.

When the adapter and the adapter control module are tested by the respective test modules, it is necessary to give the test module test data for designating required command or response information.

[Problems to be solved by conventional technology and invention]

FIG. 3 is a block diagram showing a configuration example of a computer system.

Under the control of a program of an adapter control module (hereinafter referred to as a control module) 4 executed by the computer 1, the adapter 2 connected to the computer 1 is connected to a required device 3 such as a printer, an input device, and a storage device. To
It controls the operation of so-called input / output processing such as data input / output between the device 3 and the computer 1.

To this end, the control module 4 prepares necessary commands and the like in the main storage area of the computer 1 in response to an input / output processing request from the application program 5 or the like, for example, at each step of the required input / output processing, and sets the adapter 2 to start.

At startup, the adapter 2 knows a storage address of a sequential command, control information related to the command, a buffer and the like (hereinafter collectively referred to as command information) from information set in a specific register of the computer 1, for example. , The main memory area is accessed and the specified control operation is executed by the command information.

When the adapter 2 finishes executing the processing based on the specified command, it passes various status information of the processing result to the control module 4 as completion information for the command, and the control module 4 notifies the application program 5 of the result or the result thereof. Then, the next command is issued, and the input / output processing is advanced by exchanging the command and the completion information in this way.

The adapter tester 6 and the control module tester 7 are used for testing the adapter and the control module.

The adapter tester 6 connects to the adapter 2 to be tested by the same interface so that it appears as a control module 4 and inputs and activates the appropriate test data 8.

Then, the adapter tester 6 prepares the command information according to the test data 8, starts the adapter 2, receives the completion information from the adapter 2 as described above, and prepares the next command information according to the test data 8. Control to pass to the adapter 2.

Such exchange of the command and the completion information is repeated only for the command specified in the test data 8. For example, the completion information (or the command and the completion information) transmitted and received during that time is held in the trace area of the adapter tester 6 in the order of time, and later tested By reading and examining the trace information,
The processing of the adapter 2 can be checked.

The control module tester 7 is connected to the control module 4 by the same interface so that it can be seen as the adapter 2, and the appropriate test data 9 is input and activated.
Further, the control module 4 to be tested issues an input / output processing request from an appropriate application program 5 to start control.

The control module 4 operates as described above to execute the start-up of the adapter, but the control module tester 7 receives the start-up instead of the adapter 2 and receives a command, etc., and is designated by the data sequentially fetched from the test data 9 there. The generated completion information is generated and returned to the control module 4.

When the control module 4 issues the next command according to the completion information, the control module tester 7 receives the command as described above, and returns the next completion information designated by the test data 9, The exchange of commands and completion information is repeated, and during this time, as in the case of the adapter tester 6, the exchanged information is held in the trace area,
Allows the examiner to check.

For the above, the test data 8 and 9 generate, for example, sequence information configured to instruct the areas of the data to be used in the order of use, and command information and completion information instructed by the sequence information or those information. For adapters that have the same logical interface for command information, one type of adapter tester and control module tester can be used to test various adapters and control modules. Can be adapted.

Of course, such test data must be set so that the correct command information, etc., is generated in the correct sequence, but it is often prone to errors in creation, in which case the correct test cannot be performed, and There is a problem in that it is difficult to identify an error in the test data and an error in the adapter or control module to be tested, and a large number of man-hours are required for correction.

The present invention has an object of a test data generation processing method for easily generating error-free test data in a test of a computer adapter and a control module.

[Means for solving problems]

 FIG. 1 is a block diagram showing the configuration of the present invention.

The figure shows the configuration of the computer system, 11 is executed by the computer 10, the test of the adapter 2 and the test data generation unit
An adapter tester that produces test data 13 by 12,
Reference numeral 14 is a control module tester for executing the test of the control module 4 and for generating the test data 16 by the test data generator 15.

[Work]

For the test data generation processing, the already completed adapter 2 and control module 4 are connected to the adapter tester 11 and the control module tester 14, and first, a required input / output processing request is sent from the appropriate application program 5 to the control module 4. Is issued to start the processing of the control module 4 to start the test operation of the control module tester 14.

The control module tester 14 executes the test operation, and the completion information returned at that time is generated by the latest data added to the test data 13. At the same time, the test data generator
Notify 15 to generate test data for the command information at that time and add it to test data 16.

The adapter tester 11 prepares command information according to the latest data of the test data 16 and activates the adapter 2, and when the completion information is received from the adapter 2, the test data generation unit 12
To the test data 13 to generate the test data for the completion information.

By repeating the above operation until the control module 4 finishes the instructed input / output processing, the test data 13
Test data is completed by sequentially adding data to 16 and 16.

With the above processing method, correct test data can be automatically generated.

〔Example〕

The adapter tester 11 shown in FIG. 1 has a function of receiving the test data 16 as an input and testing the adapter 2 in the same manner as the conventional adapter tester 6 described above.
Has a function of performing the test of the control module 4 in the same manner as the conventional control module tester 7 with the test data 13 as an input, provided that, for example, a test mode and a test data generation mode are provided, and in the case of the test data generation mode, Is configured to generate test data as described below in parallel with the test operation similar to the conventional one.

When generating test data, the adapter 2 for controlling the device 3 and the control module 4 for controlling the adapter 2 are connected to the adapter tester 11 and the control module tester 14, respectively, which are already completed. Start processing.

Description will be given below with reference to the flow chart of the processing shown in FIG. In the following description, the collection of trace information will be omitted.

First, the appropriate application program 5 causes the control module 4 to issue a required input / output processing request. As described above, the control module 4 prepares the command information and executes the activation of the adapter, so that the control module tester 14 receives the activation and receives the command and the like in place of the adapter 2 (processing step 20 in FIG. 2). ).

Therefore, if it is identified in processing step 21 and is a normal test mode, the processing proceeds to processing step 24 to generate completion information designated by the data sequentially extracted from the test data 13 and return it to the control module 4, but not. In that case, the process proceeds to processing step 22 to generate test data.

Therefore, in processing step 22, the test data generation unit
The test data generation unit 15 acquires the command information at that time, generates data including the sequence information and the command information, and adds the data to the test data 16.

In the next processing step 23, it is checked whether or not the test data 13 has the previous next data (the first data in this case) in the sequence, and if there is not, it waits for addition.

When the data of the required sequence is added, in step 24, the completion information is generated by the data of the required sequence (in this case, the latest added data), the completion information is returned to the control module 4, and the process returns to step 20. Wait for the next start.

When the control module 4 issues the next command according to the completion information, the control module tester 14 repeats the above-mentioned processing.

The adapter tester 11 extracts the command information data from the test data 16 in the sequence order and processes it. However, it is checked in processing step 25 whether there is data in the required sequence order, and if there is not, wait and generate the test data as described above. When the data is added by the unit 15, the process proceeds to the processing step 26, the command information is prepared, and the adapter 2 is activated.

Then, the adapter 2 executes the command and returns the completion information. Therefore, the adapter tester 11 receives the completion information in the processing step 27, identifies it in the processing step 28, and in the normal test mode, in order to issue the next command. Processing step
Return to 25.

However, if it is test data generation, in process step 29, the completion information is passed to the test data generation unit 12, and the test data generation unit 12 adds the data designating the completion information to the test data 13 together with the sequence information. Return to 25.

By repeating the above operation until the control module 4 finishes the instructed input / output processing, the test data 13
And 16 are sequentially added with the data to complete the test data, and this test data is effectively used for testing the improved version of the adapter 2 and the control module 4, for example.

〔The invention's effect〕

As is apparent from the above description, according to the present invention, in the test of the adapter and the adapter control module of the computer, error-free test data can be easily automatically generated, so that the reliability of the test is improved and the test man-hour is reduced. There is a remarkable industrial effect of doing.

[Brief description of drawings]

 FIG. 1 is a block diagram showing the configuration of the present invention, FIG. 2 is a process flow chart of the present invention, and FIG. 3 is a block diagram showing a conventional configuration example. In the figure, 1 and 10 are computers, 2 are adapters, 3 are devices, 4 are control modules, 5 is an application program, 6 and 11 are adapter testers, 7 and 14 are control module testers, and 8, 9, 13 and 16 are Test data, 12 and 15 are test data generators, and 19 to 29 are processing steps.

Claims (1)

(57) [Claims] 1. An adapter tester (11) for exchanging control information with an adapter (2), a control module (4) for controlling the adapter, and the adapter according to required test data input to test the adapter. And a control module tester (14) for exchanging control information with the control module according to required test data input to test the control module, the adapter tester (11) is provided with the control module. Means (12) for collecting the test data for the module tester based on the control information transmitted and received during the test of the adapter.
The control module tester (14) is provided with means (15) for collecting the test data for the adapter tester based on the control information exchanged during the test of the control module. A test data generation processing method characterized by the above.