JPH0514217Y2 - - Google Patents

Info

Publication number
JPH0514217Y2
JPH0514217Y2 JP1988026753U JP2675388U JPH0514217Y2 JP H0514217 Y2 JPH0514217 Y2 JP H0514217Y2 JP 1988026753 U JP1988026753 U JP 1988026753U JP 2675388 U JP2675388 U JP 2675388U JP H0514217 Y2 JPH0514217 Y2 JP H0514217Y2
Authority
JP
Japan
Prior art keywords
plate
probe board
pin
board
mounting frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988026753U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01131178U (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988026753U priority Critical patent/JPH0514217Y2/ja
Publication of JPH01131178U publication Critical patent/JPH01131178U/ja
Application granted granted Critical
Publication of JPH0514217Y2 publication Critical patent/JPH0514217Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP1988026753U 1988-02-29 1988-02-29 Expired - Lifetime JPH0514217Y2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988026753U JPH0514217Y2 (en:Method) 1988-02-29 1988-02-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988026753U JPH0514217Y2 (en:Method) 1988-02-29 1988-02-29

Publications (2)

Publication Number Publication Date
JPH01131178U JPH01131178U (en:Method) 1989-09-06
JPH0514217Y2 true JPH0514217Y2 (en:Method) 1993-04-15

Family

ID=31248665

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988026753U Expired - Lifetime JPH0514217Y2 (en:Method) 1988-02-29 1988-02-29

Country Status (1)

Country Link
JP (1) JPH0514217Y2 (en:Method)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH048381Y2 (en:Method) * 1986-07-10 1992-03-03

Also Published As

Publication number Publication date
JPH01131178U (en:Method) 1989-09-06

Similar Documents

Publication Publication Date Title
JPH048381Y2 (en:Method)
US20190004087A1 (en) Electronic product test jig
TW201219807A (en) Testing auxiliary apparatus
CN109342020B (zh) 一种显示面板测试用承载装置
CN201145715Y (zh) 一种键盘测试装置
GB2086670A (en) Test fixture with translator
TW201020552A (en) Probe unit and inspection apparatus
JPH0514217Y2 (en:Method)
CN216484433U (zh) 一种电子元器件快速检测装置
CN106772011A (zh) 一种全自动微动开关功能测试机
CN219266307U (zh) 用于免疫检验的试纸测试装置
JPH0547420Y2 (en:Method)
CN216526159U (zh) 一种可快速更换检测面板的pcb板检测治具
CN107015138A (zh) 一种用于电路网络的自动测试治具
JP3803692B2 (ja) 水平保持機構及びそれを用いたプリント基板回路検査装置又は部品ハンダ付け装置
JPH0624783Y2 (ja) 回路基板検査装置
JPH0336197B2 (en:Method)
CN206848346U (zh) 一种用于开关电源的电压和/或电流测试的测试装置
CN115783737B (zh) 一种无动力延长推动距离的试管架传送装置
JP4490247B2 (ja) 回路基板試験装置
JPS63302377A (ja) 回路基板検査装置
CN219417651U (zh) 一种集成电路研发电路板的调试设备
JP6602640B2 (ja) 測定用治具
KR910007661B1 (ko) IC 팬 히터(Fan Heater)용 솔레노이드 밸브의 출력(Thrust) 및 행정(Stroke)시험장치
CN219065246U (zh) 显示器保护膜的剥离测试装置