JPH0513607A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH0513607A
JPH0513607A JP16798191A JP16798191A JPH0513607A JP H0513607 A JPH0513607 A JP H0513607A JP 16798191 A JP16798191 A JP 16798191A JP 16798191 A JP16798191 A JP 16798191A JP H0513607 A JPH0513607 A JP H0513607A
Authority
JP
Japan
Prior art keywords
semiconductor device
substrate
device body
back surface
lead frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16798191A
Other languages
Japanese (ja)
Inventor
Hiroyuki Fukuda
浩之 福田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16798191A priority Critical patent/JPH0513607A/en
Publication of JPH0513607A publication Critical patent/JPH0513607A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a semiconductor device which develops no deformation in the lead frame under loads. CONSTITUTION:Four corners in the rear of a semiconductor device body 10 are provided with projections 3. The device body 10 is packaged on a board 4 so that the rear of the former may face the latter. The device body 10 is supported by a lead frame 2 and the projections 3; therefore, the lead frame 2 is not deformed because of being relieved of loads.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、パッケージの裏面と
基板が対面するように実装される半導体装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device mounted so that a back surface of a package and a substrate face each other.

【0002】[0002]

【従来の技術】図5および図6は従来の半導体装置を示
す図であり、図5は半導体装置本体の裏面図、図6は図
5に示した半導体装置を基板に実装した際の側面図であ
る。これらの図において、10はSOP(Small Outlin
ePackage )型の半導体装置本体、1は半導体装置本体
10のモールド樹脂の外部をコーティングしているプラ
スチックパッケージ、2は外部リードフレーム、4は基
板、6は半導体装置本体10と基板4の間に存在するフ
ラックスや半田くずなどの異物である。
5 and 6 are views showing a conventional semiconductor device, FIG. 5 is a rear view of a semiconductor device body, and FIG. 6 is a side view when the semiconductor device shown in FIG. 5 is mounted on a substrate. Is. In these figures, 10 is SOP (Small Outlin
ePackage) type semiconductor device body, 1 is a plastic package coating the outside of the molding resin of the semiconductor device body 10, 2 is an external lead frame, 4 is a substrate, and 6 is between the semiconductor device body 10 and the substrate 4. Foreign substances such as flux and solder scrap.

【0003】図7および図8はさらに他の半導体装置を
示す図であり、図7は該半導体装置本体10の裏面図、
図8は図7に示した半導体装置本体10を基板に実装し
た際の側面図であり、リードフレーム2を整形し、図
5,図6に示した半導体装置本体10と基板4との間隔
が大きくなるようにしている。
7 and 8 are views showing still another semiconductor device. FIG. 7 is a rear view of the semiconductor device main body 10,
FIG. 8 is a side view when the semiconductor device body 10 shown in FIG. 7 is mounted on a substrate. The lead frame 2 is shaped so that the gap between the semiconductor device body 10 and the substrate 4 shown in FIGS. I am trying to grow.

【0004】図5に示した従来の半導体装置において
は、図6に示すように半導体装置本体10を基板4に実
装した場合、基板4と半導体装置本体10の裏面との間
隔は0.1mm程度になる。この場合、基板4と半導体
装置本体10の裏面との僅かの隙間に図6に示すように
フラックスや半田くずなどの異物が入り込むと、ファン
で送風しても異物が除去されにくい。また、基板4と半
導体装置本体10の裏面との隙間が僅かであるため、半
導体装置本体10の裏面からの放熱が少なくなり半導体
装置の熱抵抗が大きくなるという問題がある。
In the conventional semiconductor device shown in FIG. 5, when the semiconductor device body 10 is mounted on the substrate 4 as shown in FIG. 6, the distance between the substrate 4 and the back surface of the semiconductor device body 10 is about 0.1 mm. become. In this case, if foreign matter such as flux or solder scraps enters the slight gap between the substrate 4 and the back surface of the semiconductor device body 10 as shown in FIG. 6, the foreign matter is not easily removed even if blown by a fan. Further, since the gap between the substrate 4 and the back surface of the semiconductor device body 10 is small, there is a problem that heat radiation from the back surface of the semiconductor device body 10 is reduced and the thermal resistance of the semiconductor device is increased.

【0005】これらの問題を解決するために、リードフ
レーム2を長く形成して図8に示すように基板4と半導
体装置本体10との間隔を大きくすることが従来から行
われている。このようにすると基板4と半導体装置本体
10の裏面との間隔が大きくなり、基板4と半導体装置
本体10との間にフラックスや半田くずなどの異物がた
まった場合取り出しやすくなる。
In order to solve these problems, it has been conventionally practiced to lengthen the lead frame 2 to increase the distance between the substrate 4 and the semiconductor device body 10 as shown in FIG. In this way, the distance between the substrate 4 and the back surface of the semiconductor device body 10 becomes large, and if foreign matter such as flux or solder debris accumulates between the substrate 4 and the semiconductor device body 10, it is easy to remove.

【0006】[0006]

【発明が解決しようとする課題】従来の半導体装置は以
上のように構成されており、基板4上に実装した場合、
基板4と半導体装置本体10の裏面との間に異物が入り
込む。この場合、図6に示した構成の半導体装置だと基
板4と半導体装置本体10のの裏面との間隔が小さいた
め、異物を取り出しにくくなる。また、これを防止する
ために、リードフレーム2を長くすると、異物は取り出
しやすくなるが、半導体装置本体10からの応力がリー
ドフレーム2だけにかかり、リードフレーム2が変形す
るなどの問題点があった。
The conventional semiconductor device is configured as described above, and when mounted on the substrate 4,
Foreign matter enters between the substrate 4 and the back surface of the semiconductor device body 10. In this case, in the case of the semiconductor device having the configuration shown in FIG. 6, the distance between the substrate 4 and the back surface of the semiconductor device body 10 is small, so that it is difficult to take out foreign matter. In order to prevent this, if the lead frame 2 is elongated, foreign matter can be easily taken out, but there is a problem that the stress from the semiconductor device body 10 is applied only to the lead frame 2 and the lead frame 2 is deformed. It was

【0007】この発明は上記のような問題点を解決する
ためになされたもので、リードフレームが変形しない半
導体装置を得ることを目的とする。
The present invention has been made to solve the above problems, and an object thereof is to obtain a semiconductor device in which a lead frame is not deformed.

【0008】[0008]

【課題を解決するための手段】この発明に係る半導体装
置は、パッケージの裏面と基板が相向かい合うように実
装される半導体装置において、前記パッケージの裏面に
凸部を設け、基板上に実装した場合に前記凸部により前
記パッケージを支えるようにしたことを特徴とする。
According to another aspect of the present invention, there is provided a semiconductor device in which a back surface of a package is mounted on a substrate such that a back surface of the package and a substrate face each other. In addition, the convex portion supports the package.

【0009】[0009]

【作用】この発明においては、パッケージの裏面に凸部
を設け、基板上に実装した場合に凸部によりパッケージ
を支えるようにしたので、リードフレームへの加重が軽
減される。
In the present invention, since the convex portion is provided on the back surface of the package and the convex portion supports the package when mounted on the substrate, the load on the lead frame is reduced.

【0010】[0010]

【実施例】図1および図2はこの発明に係る半導体装置
の一実施例を示す図であり、図1は半導体装置本体の裏
面図、図2は該半導体装置を基板に実装した場合の側面
図である。これらの図において、図7,図8に示した従
来装置との相違点は半導体装置本体10の裏面の四隅に
凸部3を新たに設けたことである。凸部3は、例えばプ
ラスチックパッケージ1を整形して突出部を設けること
により形成する。その他の構成は従来装置と同様であ
る。
1 and 2 are views showing an embodiment of a semiconductor device according to the present invention. FIG. 1 is a rear view of a semiconductor device body, and FIG. 2 is a side view when the semiconductor device is mounted on a substrate. It is a figure. In these figures, the difference from the conventional device shown in FIGS. 7 and 8 is that convex portions 3 are newly provided at the four corners of the back surface of the semiconductor device body 10. The protrusion 3 is formed by shaping the plastic package 1 and providing a protrusion, for example. Other configurations are similar to those of the conventional device.

【0011】このように構成された半導体装置本体10
を基板4に実装すると図2に示すように半導体装置本体
10は凸部3により支えられる。そのため、基板4と半
導体装置本体10の裏面の間隔を大きくするためにリー
ドフレーム2を整形してもリードフレーム2が変形する
ことがない。なお、基板4と半導体装置本体10の裏面
の間隔が大きいので、基板4と半導体装置本体10との
間に溜まった異物はファンからの送風により容易に除去
できるとともに、半導体装置本体10の裏面からの放熱
も多くなり熱抵抗が増加することがない。
The semiconductor device main body 10 thus configured
2 is mounted on the substrate 4, the semiconductor device body 10 is supported by the convex portions 3 as shown in FIG. Therefore, even if the lead frame 2 is shaped in order to increase the distance between the substrate 4 and the back surface of the semiconductor device body 10, the lead frame 2 is not deformed. Since the distance between the substrate 4 and the back surface of the semiconductor device body 10 is large, foreign matter collected between the substrate 4 and the semiconductor device body 10 can be easily removed by blowing air from a fan, and the back surface of the semiconductor device body 10 can be removed. The amount of heat released is also increased and the thermal resistance does not increase.

【0012】図3および図4はこの発明の他の実施例を
示す図であり、図3は裏面図、図4は図3に示した半導
体装置を基板に実装した際の側面図である。この実施例
においては凸部3を半導体装置本体10の裏面の四隅に
設けるのではなく、図3に示すようにリードフレーム2
が形成されていない辺に沿って形成している。凸部3を
このような形状にしても上記実施例と同様の効果があ
る。
FIGS. 3 and 4 are views showing another embodiment of the present invention. FIG. 3 is a rear view and FIG. 4 is a side view when the semiconductor device shown in FIG. 3 is mounted on a substrate. In this embodiment, the protrusions 3 are not provided at the four corners of the back surface of the semiconductor device body 10, but as shown in FIG.
Are formed along the side where no is formed. Even if the convex portion 3 has such a shape, the same effect as that of the above embodiment can be obtained.

【0013】なお、上記実施例ではSOPパッケージに
ついて説明したが、パッケージの裏面と基板が対面する
ように実装される半導体装置、例えばDIP(Dual Inl
inePackage )型、Shrink DIP型、T(Thin)SO
P型、Shrink SOP型、SOJ(Small Outline with
J-leads)型、QFP(Quad Flat Packege )型、PL
CC(Plastic Leaded Chip Carrier )型の半導体装置
すべてにこの発明は適用できる。
Although the SOP package has been described in the above embodiment, a semiconductor device, such as a DIP (Dual Inl), mounted so that the back surface of the package and the substrate face each other.
inePackage) type, Shrink DIP type, T (Thin) SO
P type, Shrink SOP type, SOJ (Small Outline with
J-leads) type, QFP (Quad Flat Packege) type, PL
The present invention can be applied to all CC (Plastic Leaded Chip Carrier) type semiconductor devices.

【0014】[0014]

【発明の効果】以上のようにこの発明によれば、パッケ
ージの裏面に凸部を設け、基板上に実装した場合に凸部
によりパッケージを支えるようにしたので、リードフレ
ームへの加重が軽減される。その結果、リードフレーム
を整形して基板とパッケージの裏面との間隔を大きくし
てもリードフレームが加重により変形しなくなるという
効果がある。
As described above, according to the present invention, since the convex portion is provided on the back surface of the package and the convex portion supports the package when mounted on the substrate, the load on the lead frame is reduced. It As a result, even if the lead frame is shaped to increase the distance between the substrate and the back surface of the package, the lead frame is prevented from being deformed by the weight.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明に係る半導体装置の一実施例の裏面図
である。
FIG. 1 is a back view of an embodiment of a semiconductor device according to the present invention.

【図2】図1に示した装置を基板に実装した際の側面図
である。
FIG. 2 is a side view when the device shown in FIG. 1 is mounted on a substrate.

【図3】この発明の他の実施例である半導体装置の裏面
図である。
FIG. 3 is a rear view of a semiconductor device according to another embodiment of the present invention.

【図4】図3に示した装置を基板に実装した際の側面図
である。
4 is a side view when the device shown in FIG. 3 is mounted on a substrate.

【図5】従来の半導体装置の裏面図である。FIG. 5 is a back view of a conventional semiconductor device.

【図6】図5に示した装置を基板に実装した際の側面図
である。
6 is a side view of the device shown in FIG. 5 mounted on a substrate.

【図7】従来の他の半導体装置の裏面図である。FIG. 7 is a rear view of another conventional semiconductor device.

【図8】図7に示した装置を基板に実装した際の側面図
である。
8 is a side view of the device shown in FIG. 7 mounted on a substrate.

【符号の説明】[Explanation of symbols]

3 凸部 4 基板 10 半導体装置本体 3 convex part 4 substrate 10 semiconductor device main body

Claims (1)

【特許請求の範囲】 【請求項1】 パッケージの裏面と基板が対面するよう
に実装される半導体装置において、前記パッケージの裏
面に凸部を設け、基板上に実装した場合に前記凸部によ
り前記パッケージを支えるようにしたことを特徴とする
半導体装置。
Claim: What is claimed is: 1. A semiconductor device which is mounted so that a back surface of a package and a substrate face each other. When a convex portion is provided on the back surface of the package and the convex portion is mounted on a substrate, A semiconductor device characterized by supporting a package.
JP16798191A 1991-07-09 1991-07-09 Semiconductor device Pending JPH0513607A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16798191A JPH0513607A (en) 1991-07-09 1991-07-09 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16798191A JPH0513607A (en) 1991-07-09 1991-07-09 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH0513607A true JPH0513607A (en) 1993-01-22

Family

ID=15859601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16798191A Pending JPH0513607A (en) 1991-07-09 1991-07-09 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH0513607A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010192848A (en) * 2009-02-20 2010-09-02 Yamaha Corp Semiconductor package and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010192848A (en) * 2009-02-20 2010-09-02 Yamaha Corp Semiconductor package and method of manufacturing the same

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