JPH05133989A - Electromagnetic resistance testing device - Google Patents

Electromagnetic resistance testing device

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Publication number
JPH05133989A
JPH05133989A JP32380091A JP32380091A JPH05133989A JP H05133989 A JPH05133989 A JP H05133989A JP 32380091 A JP32380091 A JP 32380091A JP 32380091 A JP32380091 A JP 32380091A JP H05133989 A JPH05133989 A JP H05133989A
Authority
JP
Japan
Prior art keywords
antenna
arm
electromagnetic
specimen
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP32380091A
Other languages
Japanese (ja)
Other versions
JP2949981B2 (en
Inventor
Takashi Harada
高志 原田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP32380091A priority Critical patent/JP2949981B2/en
Publication of JPH05133989A publication Critical patent/JPH05133989A/en
Application granted granted Critical
Publication of JP2949981B2 publication Critical patent/JP2949981B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To enable a measurer to monitor a screen without movement at the time of testing the radiation filed resistance of a specimen which requires evaluation on a TV screen, CRT, etc. CONSTITUTION:The title device is constituted of a height-adjustable specimen fixing stage 2 for fixing a specimen, arm 3 extended in the horizontal direction from the center of the stage 2, and electromagnetic wave radiating antenna 4 fitted to the arm 3 directly or through an antenna support 5 extended in the vertical direction. The antenna 4 is fitted to the arm 3 or support 5 by means of an antenna fitting section 7. Since the arm 3 makes 360 deg. revolution in the horizontal direction around the center of the stage 2, the antenna 4 also makes a revolution at an angle of 360 deg. along the circumference of a circle with a radius equal to the distance between the center of the stage 2 and antenna 4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は情報機器,通信機器など
の電子機器,装置などの電磁耐性を評価するための試験
装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test apparatus for evaluating electromagnetic resistance of electronic equipment such as information equipment and communication equipment and equipment.

【0002】[0002]

【従来の技術】電磁耐性の試験法には、電源線や通信線
に妨害波電流や妨害波電圧を印加する方法(例えばIE
C 801−4)、先の尖った充電プローブを直接供試
体にあて、静電気放電を起こさせる方法(例えばIEC
801−2)、放射電磁界を供試体に照射する方法
(例えばMIL STD 461)などがある。
2. Description of the Related Art As a method for testing electromagnetic resistance, a method of applying an interfering wave current or an interfering wave voltage to a power supply line or a communication line (for example, IE
C 801-4), a method in which a sharp charging probe is directly applied to the specimen to cause electrostatic discharge (for example, IEC
801-2), a method of irradiating a specimen with a radiation electromagnetic field (for example, MIL STD 461) and the like.

【0003】このうち、放射電磁界を照射する方法は、
図6に示すように、供試体41から数m離れた位置に電
界放射用のアンテナ42を設置して強電磁界を発生さ
せ、これを前記供試体41に照射して供試体41が動作
異常,誤動作を起こすか否かを試験する。
Of these, the method of irradiating a radiation electromagnetic field is
As shown in FIG. 6, an antenna 42 for electric field emission is installed at a position several meters away from the test piece 41 to generate a strong electromagnetic field, which is irradiated to the test piece 41 to cause abnormal operation of the test piece 41. Test whether a malfunction occurs.

【0004】測定は、さまざまな方向から電磁波を照射
する必要があるため、通常は、ターンテーブル43の上
に供試体41を設置し、アンテナ42は、固定して供試
体を360°回転させることにより対応していた(「放
射イミュニティ試験における電磁界分布の均一性改善に
ついて」、電子情報通信学会第2種研究会,電子機器の
EMCとその対策ワークショップ,1990年11
月)。
Since it is necessary to irradiate electromagnetic waves from various directions for measurement, the test piece 41 is usually installed on the turntable 43, the antenna 42 is fixed, and the test piece is rotated 360 °. (“Improvement of uniformity of electromagnetic field distribution in radiated immunity test”, IEICE 2nd class workshop, EMC of electronic equipment and its countermeasure workshop, 1990, 11)
Month).

【0005】[0005]

【発明が解決しようとする課題】ところで、テレビ,C
RTなどの電磁耐性の評価項目の一つに画面の乱れがあ
るが、前述の評価装置では、ターンテーブルの回転にし
たがって供試体41の画面の向きが変わるため、測定者
は、常に移動して画面を監視する必要があった。
By the way, the television, C
The screen disorder is one of the evaluation items of the electromagnetic immunity such as RT. However, in the above-described evaluation device, the orientation of the screen of the sample 41 changes according to the rotation of the turntable, so that the measurer constantly moves. I needed to monitor the screen.

【0006】また、放射電磁界の耐性試験は、強い電磁
界を放射して行うため、通常はシールド室,電波半無響
室などの電磁的に外部と遮断された空間で行われる。
Further, since the radiation electromagnetic field resistance test is performed by radiating a strong electromagnetic field, it is usually performed in a space that is electromagnetically shielded from the outside, such as a shield room or a radio wave semi-anechoic room.

【0007】この際、画面を評価する測定者は、前記の
空間内に留まらなければならないため、アンテナの発す
る強電磁界に曝され危険であった。さらに、本試験で
は、供試体に照射される電磁界の強度は供試体全体にわ
たり一様でなければならない。
At this time, the measurer who evaluates the screen has to stay in the above space and is therefore exposed to the strong electromagnetic field generated by the antenna, which is dangerous. Furthermore, in this test, the strength of the electromagnetic field applied to the specimen must be uniform over the entire specimen.

【0008】ところが、従来の床面を金属,金網面など
のグランドプレーンとした半電波無響室における試験で
は、図5に示すようにアンテナ32から直接供試体31
に放射される直接波34と床面であるグランドプレーン
33での反射による間接波35との干渉により電磁界強
度が供試体の高さ方向,前後方向で大きく変動するとい
う欠点があった。
However, in a conventional test in a semi-anechoic chamber in which the floor surface is a ground plane such as a metal or wire mesh surface, the test piece 31 is directly fed from the antenna 32 as shown in FIG.
There is a drawback in that the electromagnetic field strength varies greatly in the height direction and the front-back direction of the test piece due to the interference between the direct wave 34 radiated to the ground and the indirect wave 35 reflected by the ground plane 33 which is the floor surface.

【0009】本発明の目的は、テレビ,CRTなどの画
面評価を必要とする供試体の放射電磁界耐性試験におい
て、測定者が移動することなく画面を監視できる電磁耐
性試験装置、及び電波半無響室内などのグランドプレー
ンを床面とする場所での試験に際しても、供試体に照射
される電磁界強度の変動が小さい電磁耐性試験装置を提
供することにある。
An object of the present invention is to provide an electromagnetic immunity test device capable of monitoring a screen without moving a measurer in a radiated electromagnetic field immunity test of a specimen requiring screen evaluation of a television, a CRT, etc. An object of the present invention is to provide an electromagnetic immunity test device in which fluctuations in the electromagnetic field intensity with which a test piece is irradiated are small even in a test in a place where a ground plane is a floor surface such as a sound room.

【0010】[0010]

【課題を解決するための手段】上記目的を達成するた
め、本発明の電磁耐性試験装置においては、供試体固定
台と、アームと、アンテナとを有する電磁耐性試験装置
であって、供試体固定台は、供試体を載せるためのもの
であり、アームは、固定台の軸心を中心として水平方向
に360°回転可能であり、アンテナは、アームに、直
接もしくはアンテナ支柱を介して間接的に取付けられ、
アームと一体回転して平面上の全方向から供試体に電磁
波を照射するものである。
In order to achieve the above object, in the electromagnetic resistance test apparatus of the present invention, there is provided an electromagnetic resistance test apparatus having a sample fixing base, an arm and an antenna, wherein the sample fixing The table is for mounting a sample, and the arm can rotate 360 ° in the horizontal direction about the axis of the fixed table. The antenna is directly attached to the arm or indirectly through the antenna column. Installed,
The test piece is irradiated with electromagnetic waves from all directions on a plane by rotating integrally with the arm.

【0011】また、前記アームとアンテナもしくはアン
テナ支柱には、前記アーム上を前記アンテナもしくは前
記アンテナ支柱が固定台を中心とする半径方向に移動可
能なスライド機構を有し、前記アンテナの回転半径を可
変としたものである。
Further, the arm and the antenna or the antenna column has a slide mechanism on the arm which is movable in the radial direction with the antenna or the antenna column centered on a fixed base, and the rotation radius of the antenna is It is variable.

【0012】また、アンテナ支柱には、アンテナを上下
方向に移動可能とするスライド機構を有し、前記アンテ
ナの床面からの高さを可変としたものである。
Further, the antenna column has a slide mechanism for moving the antenna vertically, and the height of the antenna from the floor is variable.

【0013】また、前記アームは、一定の形状と面積を
有し、かつ水平方向に広がりをもつ平面で構成され、該
平面の前記固定台とアンテナを結ぶ線に面した面上に
は、電波吸収体が装着されているものである。
Further, the arm is composed of a flat surface having a constant shape and area and extending in the horizontal direction, and a radio wave is formed on a surface of the flat surface facing the line connecting the fixed base and the antenna. The absorber is attached.

【0014】[0014]

【作用】本発明の電磁耐性試験装置は、電磁界を発生さ
せるアンテナを前記供試体を中心として一定の距離をお
いて回転する構造であるため、供試体を固定したままで
平面上の全方向から供試体に電磁波を照射することがで
きる。したがって、テレビ,CRTなどを供試体とした
ときには、画面の向きは、常に一定であり、シールド室
や電波無響室に設けられた特定の小窓を利用して、画面
を評価することが可能である。これにより、画面評価測
定者は、測定室外部にいたままで評価できるため、強電
磁界にさらされることはない。
Since the electromagnetic immunity testing device of the present invention has a structure in which the antenna for generating an electromagnetic field is rotated at a fixed distance around the sample, the sample is fixed in all directions on a plane. The specimen can be irradiated with electromagnetic waves. Therefore, when a TV, CRT, etc. is used as the sample, the orientation of the screen is always the same, and it is possible to evaluate the screen using a specific small window provided in a shielded room or an anechoic room. Is. As a result, the screen evaluation measurer can be evaluated while being outside the measurement room, and is not exposed to a strong electromagnetic field.

【0015】また、供試体を載せる台と電磁界放射用の
アンテナを結ぶアームの構造を水平方向に広がりをもつ
一定の面積と形状を有する平面とし、該平面上に電波吸
収体を装着すれば、間接波の原因となるグランドプレー
ンを前記の電波吸収体で覆うことができるため、供試体
に照射される電磁波は直接波のみとなり、間接波との干
渉により生ずる電磁界強度の不均一が解消される。
Further, if the structure of the arm connecting the table on which the sample is placed and the antenna for electromagnetic field emission is made a flat surface having a certain area and shape with a horizontal spread, and the electromagnetic wave absorber is mounted on the flat surface. Since the ground plane that causes indirect waves can be covered with the electromagnetic wave absorber described above, the electromagnetic waves applied to the test piece are only direct waves, eliminating the non-uniformity of electromagnetic field strength caused by interference with indirect waves. To be done.

【0016】平面及び電波吸収体を装着する面積は、な
るべく広い方がよく、最低でも供試体固定台とアンテナ
を結ぶ直線の第1フレネルゾーン(例えば、現代電磁波
工学,p219,雨宮著,オーム社,東京,昭和60年
1月)に含まれる領域より広くする。
The flat surface and the area for mounting the electromagnetic wave absorber should be as large as possible, and at least the first Fresnel zone of the straight line connecting the sample fixing base and the antenna (for example, Modern Electromagnetic Engineering, p219, Amemiya, Ohmsha) , Tokyo, January 1985).

【0017】[0017]

【実施例】以下に本発明の実施例を図面を参照しながら
具体的に説明する。図1は、本発明の第1の実施例によ
る放射電磁波に対する電磁耐性試験装置1を示した図で
ある。本試験装置1は、供試体を置くための供試体固定
台2,固定台2を中心として水平方向に延びたアーム
3、アーム3に直接、又は垂直方向に延びたアンテナ支
柱5を介して取り付けられた電磁波放射用アンテナ4か
ら構成される。
Embodiments of the present invention will be specifically described below with reference to the drawings. FIG. 1 is a diagram showing an electromagnetic resistance test apparatus 1 for a radiated electromagnetic wave according to a first embodiment of the present invention. The test apparatus 1 is attached to the sample fixing base 2 on which the sample is placed, the arm 3 extending horizontally with the fixing base 2 as a center, directly on the arm 3, or via an antenna support 5 extending vertically. The electromagnetic wave radiation antenna 4 is provided.

【0018】アーム3とアンテナ4、又はアンテナ支柱
5とアンテナ4は、アンテナ取付け部7を介して取り付
けられている。アーム3は、固定台2を中心として水平
方向に360°回転するため、アンテナ4は固定台2の
中心からアンテナ4までの長さを半径とした円周上を3
60°回転する。
The arm 3 and the antenna 4 or the antenna column 5 and the antenna 4 are attached via an antenna attaching portion 7. Since the arm 3 rotates 360 ° in the horizontal direction around the fixed base 2, the antenna 4 has a radius of 3 mm from the center of the fixed base 2 to the antenna 4.
Rotate 60 °.

【0019】アンテナ4は、その指向性が回転の中心を
向くように設定するため、円周上のどの位置にあっても
常に供試体に放射電磁界を照射する。
Since the directivity of the antenna 4 is set to face the center of rotation, the radiated electromagnetic field is always radiated to the sample regardless of its position on the circumference.

【0020】固定台2は、高さが可変であり、供試体を
設置する高さを変えることができる。アンテナは、測定
周波数帯域,指向性など測定条件を考慮して選択する。
The height of the fixed base 2 is variable, and the height at which the specimen is installed can be changed. The antenna is selected in consideration of measurement conditions such as measurement frequency band and directivity.

【0021】アンテナ支柱5とアーム3には、アンテナ
支柱5がアーム3上を長さ方向に沿って水平方向にスラ
イドできる機構6を設けることにより、アンテナ4の回
転半径を可変とすることができる。またアンテナ取付け
部7とアンテナ支柱5に上下方向のスライド機構8を設
けることによりアンテナ4の高さを可変とすることがで
きる。
The antenna support column 5 and the arm 3 are provided with a mechanism 6 capable of sliding the antenna support column 5 on the arm 3 in the horizontal direction along the lengthwise direction, whereby the turning radius of the antenna 4 can be made variable. .. Further, the height of the antenna 4 can be made variable by providing a vertical sliding mechanism 8 on the antenna mounting portion 7 and the antenna support column 5.

【0022】アーム3と床面の間には、一つ以上の円周
方向を向いたキャスター9又はベアリングが付いてお
り、アーム3の回転を滑らかにするとともに、アーム3
の撓みを防いでいる。
Between the arm 3 and the floor surface, one or more casters 9 or bearings oriented in the circumferential direction are provided to smooth the rotation of the arm 3 and at the same time.
It prevents the bending of.

【0023】また、アーム3は、必ずしも床面側にある
必要はなく、図2の断面図に示すように固定台2を中心
に360°回転するポスト11を上方に立上らせ、ポス
ト11の上端より水平に張り出したアーム3に支柱5を
垂下し、アンテナ4を釣り下げる構造としてもよく、図
3の断面図に示すように、測定室天井13に固定台2の
中心と同一軸心に設けた軸12を中心に回転するアーム
3を水平に取り付けた構造としてもよい。
The arm 3 does not necessarily have to be on the floor side, and as shown in the sectional view of FIG. The strut 5 may be suspended from the upper end of the arm 3 extending horizontally from the upper end of the antenna 3, and the antenna 4 may be hung down. As shown in the sectional view of FIG. The arm 3 that rotates around the shaft 12 provided in the above may be horizontally attached.

【0024】いずれの場合にも装置の構成には、電磁界
への影響の少ない高分子材をできる限り使用する。
In any case, a polymer material which has little influence on the electromagnetic field is used for the construction of the device.

【0025】図4は、本発明の第2の実施例による電磁
耐性試験装置21を示した図である。本試験装置21
は、供試体を置くための供試体固定台22、固定台22
を中心として水平方向に延びた板状アーム23、板状ア
ーム23に直接、又はアンテナ支柱25を介して取り付
けられた電磁波放射用アンテナ24から構成される。
FIG. 4 is a diagram showing an electromagnetic immunity test device 21 according to a second embodiment of the present invention. Main test equipment 21
Is a specimen holder 22 for holding the specimen, and the holder 22.
Is composed of a plate-shaped arm 23 extending horizontally with respect to the center, and an electromagnetic wave radiation antenna 24 attached directly to the plate-shaped arm 23 or via an antenna support 25.

【0026】板状アーム23は、供試体固定台22を中
心として360°回転可能であり、アンテナ24と固定
台22とを結ぶ線の作る第1フレネルゾーンを含むよう
な楕円形状である。板状アーム23の上部平面には、広
帯域電波吸収体26を装着して放射電磁波のアーム23
及び測定室の床面27における反射を抑制することがで
きる。
The plate-like arm 23 is rotatable about the sample base 22 by 360 ° and has an elliptical shape including a first Fresnel zone formed by a line connecting the antenna 24 and the base 22. A broadband electromagnetic wave absorber 26 is attached to the upper plane of the plate-like arm 23 to radiate an electromagnetic wave arm 23.
Also, reflection on the floor surface 27 of the measurement room can be suppressed.

【0027】[0027]

【発明の効果】本発明の電磁耐性試験装置によればテレ
ビ,CRTなどの放射電磁界に対する耐性評価試験にお
いて、画面評価測定者が移動することなく画面を監視で
きるため、測定に要する手間,時間が短縮されるととも
に、測定室外部からの監視が可能となるため、測定者が
強電磁界に暴露されることがなく、安全な電磁耐性試験
が行える効果を有する。
According to the electromagnetic resistance test apparatus of the present invention, in a resistance evaluation test against a radiated electromagnetic field such as a television and a CRT, the screen evaluation measurer can monitor the screen without moving. In addition to shortening the measurement time, it is possible to monitor from the outside of the measurement room, so that the measurer is not exposed to a strong electromagnetic field, and a safe electromagnetic resistance test can be performed.

【0028】また、本発明の電磁耐性試験装置によれ
ば、電波半無響室のように床面がグランドプレーンで構
成された測定場所においても、床面での反射波の影響が
除去できるため、供試体を設置した空間での電磁界強度
が均一になり、精度のよい電磁耐性試験を行える効果を
有する。
Further, according to the electromagnetic immunity test apparatus of the present invention, the influence of the reflected wave on the floor can be removed even in a measurement place where the floor is composed of a ground plane such as a semi-anechoic chamber. In addition, the strength of the electromagnetic field in the space where the test piece is installed becomes uniform, which has the effect of enabling an accurate electromagnetic resistance test.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による放射電磁耐性試験装置の基本形を
示す図である。
FIG. 1 is a diagram showing a basic form of a radiation electromagnetic immunity test apparatus according to the present invention.

【図2】本発明による放射電磁耐性試験装置を示す断面
図である。
FIG. 2 is a sectional view showing a radiation electromagnetic immunity test apparatus according to the present invention.

【図3】本発明による放射電磁耐性試験装置の他の実施
例を示す断面図である。
FIG. 3 is a sectional view showing another embodiment of the radiated electromagnetic immunity test apparatus according to the present invention.

【図4】本発明による照射電磁界強度が均一になるため
の構造を有する電磁耐性試験装置の実施例を示す図であ
る。
FIG. 4 is a diagram showing an example of an electromagnetic immunity test apparatus having a structure for making the irradiation electromagnetic field strength uniform according to the present invention.

【図5】電磁耐性試験において、照射電磁界強度が不均
一となることを示す原理図である。
FIG. 5 is a principle view showing that the irradiation electromagnetic field strength becomes non-uniform in the electromagnetic resistance test.

【図6】従来技術による放射電磁耐性試験装置を示す図
である。
FIG. 6 is a diagram showing a radiated electromagnetic immunity test apparatus according to the prior art.

【符号の説明】[Explanation of symbols]

1 電磁耐性試験装置 2 供試体固定台 3 アーム 4 電磁波放射用アンテナ 5 アンテナ支柱 6 アンテナ支柱スライド機構 7 アンテナ取付け部 8 アンテナスライド機構 9 キャスター 11 ポスト 12 軸 13 測定室天井 21 電磁耐性試験装置 22 供試体固定台 23 板状アーム 24 電磁波放射用アンテナ 25 アンテナ支柱 26 電波吸収体 27 測定室床面 1 Electromagnetic Immunity Test Device 2 Specimen Fixture Base 3 Arm 4 Electromagnetic Wave Emission Antenna 5 Antenna Prop 6 Antenna Prop Slide Mechanism 7 Antenna Mounting Part 8 Antenna Sliding Mechanism 9 Caster 11 Post 12 Axis 13 Measurement Room Ceiling 21 Electromagnetic Resistance Test Device 22 Providing Specimen fixing base 23 Plate-like arm 24 Electromagnetic radiation antenna 25 Antenna support 26 Electromagnetic wave absorber 27 Measurement room floor

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 供試体固定台と、アームと、アンテナと
を有する電磁耐性試験装置であって、 供試体固定台は、供試体を載せるためのものであり、 アームは、固定台の軸心を中心として水平方向に360
°回転可能であり、 アンテナは、アームに、直接もしくはアンテナ支柱を介
して間接的に取付けられ、アームと一体回転して平面上
の全方向から供試体に電磁波を照射するものであること
を特徴とする電磁耐性試験装置。
1. An electromagnetic immunity test device having a specimen fixing base, an arm, and an antenna, wherein the specimen fixing base is for mounting a specimen, and the arm is an axial center of the fixing base. 360 around the center
° It is rotatable, and the antenna is attached directly to the arm or indirectly through the antenna support, and rotates integrally with the arm to irradiate the sample with electromagnetic waves from all directions on the plane. Electromagnetic immunity test equipment.
【請求項2】 前記アームとアンテナもしくはアンテナ
支柱には、前記アーム上を前記アンテナもしくは前記ア
ンテナ支柱が固定台を中心とする半径方向に移動可能な
スライド機構を有し、前記アンテナの回転半径を可変と
したものであることを特徴とする請求項1に記載の電磁
耐性試験装置。
2. The arm and the antenna or the antenna column has a slide mechanism on the arm, which is movable in the radial direction around the fixed base of the antenna or the antenna column, and has a rotation radius of the antenna. The electromagnetic immunity test apparatus according to claim 1, wherein the electromagnetic resistance test apparatus is variable.
【請求項3】 アンテナ支柱には、アンテナを上下方向
に移動可能とするスライド機構を有し、前記アンテナの
床面からの高さを可変としたものであることを特徴とす
る請求項1もしくは2に記載の電磁耐性試験装置。
3. The antenna column has a slide mechanism for moving the antenna vertically, and the height of the antenna from the floor is variable. 2. The electromagnetic resistance test apparatus according to 2.
【請求項4】 前記アームは、一定の形状と面積を有
し、かつ水平方向に広がりをもつ平面で構成され、該平
面の前記固定台とアンテナを結ぶ線に面した面上には、
電波吸収体が装着されていることを特徴とする請求項1
に記載の電磁耐性試験装置。
4. The arm is formed of a flat surface having a constant shape and area and extending in the horizontal direction, and on the surface of the flat surface facing the line connecting the fixed base and the antenna,
A radio wave absorber is attached to the radio wave absorber.
Electromagnetic immunity test device according to.
JP32380091A 1991-11-12 1991-11-12 Electromagnetic immunity test equipment Expired - Fee Related JP2949981B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32380091A JP2949981B2 (en) 1991-11-12 1991-11-12 Electromagnetic immunity test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32380091A JP2949981B2 (en) 1991-11-12 1991-11-12 Electromagnetic immunity test equipment

Publications (2)

Publication Number Publication Date
JPH05133989A true JPH05133989A (en) 1993-05-28
JP2949981B2 JP2949981B2 (en) 1999-09-20

Family

ID=18158755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32380091A Expired - Fee Related JP2949981B2 (en) 1991-11-12 1991-11-12 Electromagnetic immunity test equipment

Country Status (1)

Country Link
JP (1) JP2949981B2 (en)

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