JPH05112775A - Grinding composition for metallic material - Google Patents

Grinding composition for metallic material

Info

Publication number
JPH05112775A
JPH05112775A JP3273001A JP27300191A JPH05112775A JP H05112775 A JPH05112775 A JP H05112775A JP 3273001 A JP3273001 A JP 3273001A JP 27300191 A JP27300191 A JP 27300191A JP H05112775 A JPH05112775 A JP H05112775A
Authority
JP
Japan
Prior art keywords
polishing
weight
composition
amino acid
grinding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3273001A
Other languages
Japanese (ja)
Inventor
Koji Yamamoto
浩二 山本
Yoshiaki Takeuchi
美明 竹内
Hiroshi Umezaki
博 梅崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP3273001A priority Critical patent/JPH05112775A/en
Publication of JPH05112775A publication Critical patent/JPH05112775A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a grinding composition which has grinding characteristics at least equivalent to those of conventional one, is used for grinding a metallic material such as a magnetic disc base material or a semiconductor substrate material, can perform excellent grinding having a low surface roughness and free from surface defects such as pits and nodules and is free from the problem of the corrosion of apparatuses, the chapping of hands, waste water disposal, etc. CONSTITUTION:The title composition comprises water and an alumina abrasive, wherein a fluorocarbon surfactant and an amino acid are further incorporated.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は金属材料の研磨用組成物
に関する。更に詳細には、アルミニウム、ニッケル基合
金等の磁気ディスク基板材料、シリコンやガリウムヒ素
等の半導体基板材料、その他の金属材料の精密研磨に用
いられる研磨用組成物に関する。
FIELD OF THE INVENTION The present invention relates to a polishing composition for metal materials. More specifically, the present invention relates to a polishing composition used for precision polishing of magnetic disk substrate materials such as aluminum and nickel-based alloys, semiconductor substrate materials such as silicon and gallium arsenide, and other metal materials.

【0002】[0002]

【従来技術の説明】エレクトロニクス、コンピュータ産
業の進展にともない、アルミニウムやニッケル基合金等
の磁気ディスク基板材料、シリコンやガリウムヒ素等の
半導体基板材料等の金属材料の精密研磨加工が非常に重
要な技術として位置づけられている。
Description of the Prior Art With the progress of electronics and computer industries, precision polishing of magnetic disk substrate materials such as aluminum and nickel-based alloys and metal materials such as semiconductor substrate materials such as silicon and gallium arsenide is very important technology. It is positioned as.

【0003】近年、磁気ディスクや半導体は、記録密度
や集積度が高密度化し、これらの基板材料の精密研磨加
工においても、加工面の表面平滑性や無欠陥性(スクラ
ッチ、オレンジピール、ピット、ノジュールがないこ
と)に対する要求水準が益々高度化している。それ故
に、その精密研磨技術水準の向上が以前にも増して重要
な課題となっている。
In recent years, recording density and integration density of magnetic disks and semiconductors have been increased, and even in precision polishing of these substrate materials, the surface smoothness and defect-free (scratch, orange peel, pit, The requirement level for (no nodules) is becoming more sophisticated. Therefore, the improvement of the precision polishing technology level has become a more important issue than ever before.

【0004】一般に金属材料の精密研磨加工に従来使用
されている研磨用組成物として、例えば、アルミナ、シ
リカ、酸化セリウム、酸化ジルコニウム、酸化鉄、酸化
クロム、炭化珪素、ダイヤモンド等を砥粒としたもの、
あるいは、それらを水に懸濁させてスラリー状にしたも
の等が知られている。 しかしながら、これらの研磨用
組成物を用いた場合、研磨面にピット、ノジュール等の
表面欠陥が発生しやすい。
As a polishing composition generally used for precision polishing of metal materials, for example, alumina, silica, cerium oxide, zirconium oxide, iron oxide, chromium oxide, silicon carbide, diamond, etc. are used as abrasive grains. thing,
Alternatively, those obtained by suspending them in water to form a slurry are known. However, when these polishing compositions are used, surface defects such as pits and nodules are likely to occur on the polished surface.

【0005】そこで、かかる研磨面の表面平滑性の向上
という観点から、加工対象物に応じて特定の研磨促進剤
を配合するとの発明が提案されている。例えば、水とア
ルミナ研磨材と硫酸ニッケルの研磨促進剤からなるpH
4〜6の弱酸性のものや(特公昭64−436号公
報)、水とアルミナ研磨材と硝酸アルミニウムの研磨促
進剤からなるpH2〜4の強酸性のものが(特公平2−
23589号公報)開示されている。
Therefore, from the viewpoint of improving the surface smoothness of the polishing surface, an invention has been proposed in which a specific polishing accelerator is blended according to the object to be processed. For example, a pH consisting of water, an alumina abrasive, and a nickel sulfate polishing accelerator.
4 to 6 weakly acidic ones (Japanese Examined Patent Publication No. 64-436) and strongly acidic pH 2 to 4 consisting of water, an alumina abrasive and an aluminum nitrate polishing accelerator (Japanese Patent Publication No.
No. 23589).

【0006】このようなアルミニウム、ニッケル等の金
属と硝酸、硫酸等の無機酸との塩、いわゆる水溶性金属
塩の内、強酸性の研磨用組成物は弱酸性のものと比較し
て研磨速度が高く、且つ研磨面の表面平滑性が優れてい
るという長所がある反面、研磨機器等の装置が腐食しや
すいという欠点や、取扱作業者の皮膚や衣類に付着して
手荒れ等の薬害の危険性が高いという問題点を有してい
る。 また、環境問題等から硝酸塩を研磨促進剤に用い
ているものは排水中の溶存窒素の処理という難題が生じ
ている。
Among these salts of a metal such as aluminum or nickel and an inorganic acid such as nitric acid or sulfuric acid, that is, a water-soluble metal salt, a strongly acidic polishing composition has a polishing rate higher than that of a weakly acidic polishing composition. Has the advantage that the polishing surface is high and the surface smoothness of the polishing surface is excellent, but on the other hand, it has the drawback that the equipment such as polishing equipment is easily corroded, and the risk of chemical damage such as rough skin on the skin and clothes of the operator. There is a problem that the property is high. In addition, due to environmental issues and the like, those using nitrate as a polishing accelerator have a problem of treating dissolved nitrogen in waste water.

【0007】一方、弱酸性の研磨用組成物は、腐食性、
薬害等の問題は強酸性の研磨用組成物ほど有していない
が、研磨速度及び研磨面の表面平滑性が劣るという欠点
がある。加えて、研磨面の表面平滑性については、これ
らいずれの研磨促進剤を用いても、高度化する要求水準
に対応できないのが現状であり、従来からある強酸性の
研磨用組成物と同等以上の研磨特性を有し、より表面平
滑性に優れた研磨面が得られることはもちろん、装置の
腐食や手荒れが少なく、且つ排水処理の容易な研磨用組
成物が強く要望されている。
On the other hand, the weakly acidic polishing composition is corrosive,
Although it does not have such problems as chemical damage as the strongly acidic polishing composition, it has a drawback that the polishing rate and the surface smoothness of the polishing surface are poor. In addition, regarding the surface smoothness of the polishing surface, it is the current situation that even if any of these polishing accelerators is used, it is not possible to meet the demanding level of sophistication, and it is equal to or higher than the conventional strongly acidic polishing composition There is a strong demand for a polishing composition which has the above-mentioned polishing characteristics and is capable of obtaining a polished surface having more excellent surface smoothness, less corrosion of the equipment and rough hands, and easy drainage treatment.

【0008】[0008]

【発明が解決しようとする課題】かかる事情に鑑み、本
発明者らは、従来の研磨用組成物と同等以上の研磨特性
を有し、且つ面粗度が小さく、表面欠陥のない研磨面が
得られるのはもちろん、腐食、毒性、排水処理等の問題
のない金属材料の研磨用組成物を得るべく鋭意検討した
結果、従来の水・アルミナ研磨材・水溶性金属塩よりな
る研磨用組成物に水溶性金属塩に代えてフッ素系界面活
性剤を存在させる場合には上記目的を全て満足し得る金
属材料の研磨用組成物と成り得る事を見いだし先に特願
平3−188655号として出願した。しかして更に検
討の結果、該フッ素系界面活性剤にアミノ酸を同時に含
有、存在させた場合には、フッ素系界面活性剤の単独使
用に比較し研磨面の表面特性を低下することなく研磨速
度を向上し得ることを見いだし、本発明を完成するに至
った。
In view of such circumstances, the present inventors have found that a polishing surface which has polishing characteristics equal to or higher than those of conventional polishing compositions, has a small surface roughness, and has no surface defects. As a result of diligent studies to obtain a polishing composition for a metal material that can be obtained, of course, there is no problem of corrosion, toxicity, wastewater treatment, etc., a polishing composition comprising a conventional water / alumina abrasive / water-soluble metal salt In the case where a fluorine-based surfactant is present instead of the water-soluble metal salt, it was found that a polishing composition for a metal material that can satisfy all the above objects can be obtained, and the application was filed as Japanese Patent Application No. 3-188655. did. However, as a result of further study, when the amino acid was simultaneously contained in the fluorosurfactant and allowed to exist therein, the polishing rate was lowered without lowering the surface characteristics of the polishing surface as compared with the case where the fluorosurfactant was used alone. They have found that they can be improved, and completed the present invention.

【0009】[0009]

【課題を解決するための手段】すなわち本発明は、水と
アルミナ研磨材からなる金属材料の研磨用組成物に於い
て、該組成物中にフッ素系界面活性剤とアミノ酸を含有
させたことを特徴とする金属材料の研磨用組成物を提供
するにある。
[Means for Solving the Problems] That is, the present invention provides a polishing composition for a metal material comprising water and an alumina abrasive, wherein the composition contains a fluorosurfactant and an amino acid. Another object is to provide a polishing composition for a characteristic metal material.

【0010】以下、本発明を更に詳細に説明する。本発
明において使用するフッ素系界面活性剤とは、疎水性基
としてハイドロカーボンチェインではなく、完全にフッ
素化されたフルオロカーボンチェインをもつ界面活性剤
であればよく、例えばフルオロアルキル(C2 〜C20
カルボン酸、パーフルオロアルキルカルボン酸(C7
13)、パーフルオロアルキル(C 4 〜C12)カルボン
酸塩(Li,K,Na,NH4 )、パーフルオロアルキ
ル(C4 〜C12)スルホン酸塩(Li,K,Na,NH
4 )、パーフルオロオクタンスルホン酸ジエタノールア
ミド、パーフルオロアルキルポリオキシエチレンエタノ
ール、3−〔ω−フルオロアルキル(C6 〜C11)オキ
シ〕−1−アルキル(C3 〜C4 )スルホン酸ナトリウ
ム、3−〔ω−フルオロアルカノイル(C6 〜C8 )−
N−エチルアミノ〕−1−プロパンスルホン酸ナトリウ
ム、N−プロピル−N−(2−ヒドロキシエチル)パー
フルオロオクタンスルホン酸アミド、パーフルオロアル
キル(C6 〜C10)スルホンアミドプロピルトリメチル
アンモニウム塩、パーフルオロアルキル(C6 〜C10
−N−エチルスルホニルグリシン塩(K)等が挙げられ
る。
The present invention will be described in more detail below. Starting
The fluorosurfactant used in Ming is a hydrophobic group.
As a hydrocarbon chain, not a full
Surfactants with fluorinated carbon chains
As long as it is fluoroalkyl (C2~ C20)
Carboxylic acid, perfluoroalkylcarboxylic acid (C7~
C13), Perfluoroalkyl (C Four~ C12) Carvone
Acid salt (Li, K, Na, NHFour), Perfluoroalkyl
Le (CFour~ C12) Sulfonate (Li, K, Na, NH
Four), Perfluorooctane sulfonic acid diethanol
Mid, perfluoroalkyl polyoxyethylene ethano
, 3- [ω-fluoroalkyl (C6~ C11) Oki
Ci] -1-alkyl (C3~ CFour) Sodium sulfonate
3- [ω-fluoroalkanoyl (C6~ C8) −
N-Ethylamino] -1-propanesulfonic acid sodium salt
N-propyl-N- (2-hydroxyethyl) perm
Fluorooctane sulfonic acid amide, perfluoroal
Kill (C6~ CTen) Sulfonamidopropyltrimethyl
Ammonium salt, perfluoroalkyl (C6~ CTen)
—N-ethylsulfonylglycine salt (K) and the like can be mentioned.
It

【0011】これら入手の簡単なフッ素系界面活性剤と
しては住友スリーエム株式会社が販売するフロラード
(商品名)、旭硝子株式会社が販売するサーフロン(商
品名)、大日本インキ化学工業株式会社が販売するメガ
ファック(商品名)、ダイキン工業株式会社が販売する
ユニダイン(商品名)、デュポン・ジャパン株式会社が
販売するゾニール(商品名)の各種グレードが使用可能
である。
As these easily available fluorochemical surfactants, Fluorard (trade name) sold by Sumitomo 3M Ltd., Surflon (trade name) sold by Asahi Glass Co., Ltd., and Dainippon Ink and Chemicals Co., Ltd. are sold. Various grades of Megafac (trade name), Unidyne (trade name) sold by Daikin Industries, Ltd., and Zonir (trade name) sold by DuPont Japan Co., Ltd. can be used.

【0012】界面活性剤は衆知のごとく、親水基の水で
の解離状態よって4種類(陰イオン性、陽イオン性、両
イオン性、非イオン性)に分類されるが、本発明におい
ては何れの性状を示すフッ素系界面活性剤でも使用でき
る。研磨用組成物中のフッ素系界面活性剤の含有量は、
約0.01重量%〜約10重量%、好ましくは、約0.
05重量%〜約5重量%である。フッ素系界面活性剤の
含有量が、約0.01重量%未満の場合には、ピット、
ノジュール等の表面欠陥が発生しやすくなる。他方、フ
ッ素系界面活性剤の含有量が約10重量%を越えても、
含有量増加による研磨促進効果の向上は見られず、かつ
フッ素系界面活性剤は高価であるためにコスト高になる
等の不都合を生じる。
It is well known that surfactants are classified into four types (anionic, cationic, zwitterionic, nonionic) according to the dissociation state of hydrophilic groups in water. A fluorinated surfactant having the above property can also be used. The content of the fluorosurfactant in the polishing composition is
About 0.01% to about 10% by weight, preferably about 0.
05% to about 5% by weight. If the content of the fluorosurfactant is less than about 0.01% by weight, pits,
Surface defects such as nodules are likely to occur. On the other hand, even if the content of the fluorosurfactant exceeds about 10% by weight,
There is no improvement in the polishing promoting effect due to the increase in the content, and there are disadvantages such as an increase in cost because the fluorosurfactant is expensive.

【0013】本発明において用いる、アミノ酸は、天然
または合成アミノ酸のいずれも使用することができる
が、好ましくは、水に対する溶解度(25℃の純水10
0gに溶けるg数)が5以上であるアミノ酸(以下、水
溶性アミノ酸)である。例えば、アラニン、アルギニ
ン、グリシン、オキシプロリン、プロリン、セリン、バ
リン等が挙げられる。研磨用組成物中のアミノ酸の含有
量は、約1.0重量%〜約25.0重量%、好ましく
は、約1.0重量%〜約15重量%である。アミノ酸の
含有量が、約1.0重量%未満の場合には、アミノ酸に
よる研磨促進効果が見られない。他方、アミノ酸の含有
量が約25重量%を越えても、含有量増加による研磨促
進効果の向上は見られず、一部のアミノ酸においては、
溶解度の関係で完全に水に溶解しきらない。 これらを
用いた研磨用組成物は、従来の強酸性及び弱酸性の研磨
用組成物よりも表面平滑性に優れるものが得られる。
As the amino acid used in the present invention, either a natural or synthetic amino acid can be used, but preferably the solubility in water (pure water at 25 ° C. 10
An amino acid (hereinafter, referred to as water-soluble amino acid) having a solubility in 0 g of 5 or more. For example, alanine, arginine, glycine, oxyproline, proline, serine, valine and the like can be mentioned. The content of amino acid in the polishing composition is about 1.0% by weight to about 25.0% by weight, preferably about 1.0% by weight to about 15% by weight. When the content of amino acid is less than about 1.0% by weight, the polishing promoting effect of amino acid is not observed. On the other hand, even when the amino acid content exceeds about 25% by weight, no improvement in the polishing-promoting effect due to the increase in the content is observed, and for some amino acids,
It is not completely soluble in water due to its solubility. A polishing composition using these can be obtained with a surface smoothness superior to that of conventional strongly acidic and weakly acidic polishing compositions.

【0014】本発明において用いる、アルミナ研磨材
は、α−アルミナであり、ベーマイト等のアルミナ水和
物を、約1100℃〜約1400℃で約2〜3時間仮焼
したものを、乾式あるいは湿式の振動ミル、ボールミ
ル、アトライター、ビーズミル等、または乾式の高速回
転ミルや気流粉砕機の公知の微粉砕機を用いて粉砕して
用いる。 また、必要に応じて、湿式の重力沈降、遠心
沈降、乾式の風力分級等の装置により、粗大粒子を分級
し、所望の粒度に整粒して用いてもよい。
The alumina abrasive used in the present invention is α-alumina, which is obtained by calcining alumina hydrate such as boehmite at about 1100 ° C. to about 1400 ° C. for about 2 to 3 hours, and then dry or wet. The vibration mill, ball mill, attritor, bead mill or the like, or a dry high-speed rotary mill or a known fine pulverizer such as an air flow pulverizer is used for pulverization. If necessary, coarse particles may be classified by a device such as wet gravity settling, centrifugal settling, dry air classification, and the particles may be sized to a desired particle size before use.

【0015】研磨用組成物中のアルミナ研磨材の含有量
は、約1重量%〜約30重量%、好ましくは、約2重量
%〜約25重量%である。アルミナ研磨材の含有量が、
約1重量%未満の場合には、研磨速度が低下し、他方約
30重量%を越えても、研磨速度の向上は認められず、
粘度が増大して作業性が悪化するのとの不都合を生じ
る。
The content of the alumina abrasive in the polishing composition is about 1% by weight to about 30% by weight, preferably about 2% by weight to about 25% by weight. The content of alumina abrasive is
When the amount is less than about 1% by weight, the polishing rate decreases, while when the amount exceeds about 30% by weight, the polishing rate is not improved.
There is an inconvenience that the viscosity increases and the workability deteriorates.

【0016】アルミナ研磨材の平均粒子径は、約0.2
〜約5μm、好ましくは約0.3〜3μmである。 平
均粒子径が約0.2μm未満であると、研磨速度が低く
なったり、微粒が凝集してオレンジピール等の欠陥を生
じやすくなり、約5μmを越えると研磨面の表面平滑性
が悪化する等の不都合を生じる。
The average particle size of the alumina abrasive is about 0.2.
To about 5 μm, preferably about 0.3 to 3 μm. If the average particle size is less than about 0.2 μm, the polishing rate becomes low, and fine particles tend to aggregate to cause defects such as orange peel. If it exceeds about 5 μm, the surface smoothness of the polished surface deteriorates. Causes inconvenience.

【0017】本発明の研磨用組成物には、必要に応じ
て、分散剤や沈降防止剤及び消泡剤等の添加剤を添加す
ることができる。
If necessary, additives such as a dispersant, an anti-settling agent and an antifoaming agent can be added to the polishing composition of the present invention.

【0018】本発明の作用機構については詳らかではな
いが、研磨用組成物中に存在するフッ素系界面活性剤に
より組成物の研磨面に対する濡れ性が向上するため組成
物が均一に研磨表面に対して作用するのと同時に、該組
成物中に存在する水溶性アミノ酸が解離しアルミナ研磨
材及び研磨屑に対してメカノケミカルに作用することに
より潤滑性等が向上し、前記フッ素系界面活性剤の作用
との相乗効果によって従来よりも研磨速度が高く表面平
滑性に優れた研磨面が得られると考えられる。さらに、
水溶性アミノ酸を存在させることにより、フッ素系界面
活性剤の含有量が低減でき、コスト面からも有利であ
る。
Although the mechanism of action of the present invention is not clear, the fluorine-based surfactant present in the polishing composition improves the wettability of the composition with respect to the polishing surface, so that the composition can be uniformly applied to the polishing surface. At the same time, the water-soluble amino acid present in the composition dissociates to act mechanochemically on the alumina abrasive and polishing debris, thereby improving the lubricity and the like. It is considered that a polishing surface having a higher polishing rate and excellent surface smoothness than the conventional one can be obtained by a synergistic effect with the action. further,
The presence of the water-soluble amino acid can reduce the content of the fluorosurfactant, which is advantageous in terms of cost.

【0019】本発明の研磨用組成物は、金属材料の精密
研磨に使用されるが、特に、ニッケル基合金をメッキし
た磁気ディスク基板の精密研磨に特に好適である。
The polishing composition of the present invention is used for precision polishing of metal materials, and is particularly suitable for precision polishing of magnetic disk substrates plated with nickel-based alloys.

【0020】[0020]

【発明の効果】以上詳述した本発明の研磨用組成物は、
従来の水とアルミナ研磨材及び水溶性金属塩の研磨促進
剤よりなる研磨用組成物のうち、水溶性の金属塩に代え
フッ素系界面活性剤と水溶性アミノ酸を同時に添加存在
させることにより、従来からある研磨用組成物と同等以
上の研磨特性を有し、特により表面平滑性に優れる磁気
ディスク基板、半導体基板等の金属材料が得られる精密
研磨加工を可能ならしめたものであり、またフッ素系界
面活性剤単独使用のものに比較し研磨面の表面特性を低
下することなく研磨速度を向上し得るものでその工業的
価値は頗る大である。
The polishing composition of the present invention described in detail above is
Among conventional polishing compositions comprising water, an alumina abrasive and a polishing accelerator of a water-soluble metal salt, a fluorine-based surfactant and a water-soluble amino acid are simultaneously added and present instead of the water-soluble metal salt. It has a polishing property equal to or higher than that of the polishing composition, and is capable of performing precision polishing processing to obtain a metal material such as a magnetic disk substrate, a semiconductor substrate, etc., which is particularly excellent in surface smoothness, and fluorine. Compared to the case where only a surfactant is used, the polishing rate can be improved without deteriorating the surface characteristics of the polished surface, and its industrial value is extremely large.

【0021】[0021]

【実施例】以下に本発明を実施例を用いて更に具体的に
説明するが、本発明はこの実施例に限定されるものでは
ない。
EXAMPLES The present invention will be described more specifically below with reference to examples, but the present invention is not limited to these examples.

【0022】実施例1 研磨は4ウェイ式の両面ポリッシングマシン(定盤径φ
640mm)を使用して、両面研磨を行った。 研磨パ
ッドには、スウェードタイプのパッド(DOMITEX
25−3)を用い、工作物として無電解Ni−Pメッキ
を施した3.5インチのアルミニウム磁気ディスク基板
を用い、加工圧力;100g/cm2 、下定盤回転数;
40rpmの条件で研磨を行った。研磨用組成物は、純
水に平均粒子径0.6μmのアルミナ研磨材を8.6重
量%、フッ素系界面活性剤として非イオン性の旭硝子株
式会社販売「サーフロンS−141」を0.05重量
%、水溶性アミノ酸としてグリシンを5.0重量%の割
合で添加、懸濁し、研磨用組成物スラリーとして調整
し、スラリー供給量;40ml/minでディスクと研
磨パッドの間に供給しながら、5分間研磨を行った。
研磨後、工作物の重量減から研磨速度を求め、表面粗さ
を小坂研究所株式会社製のサーフコーダーET−30H
K(0.5μmR触針スタイラスを用いて、測定長さ
0.8mm、カットオフ80μm)で測定した。又、微
分干渉顕微鏡で表面観察を行い、スクラッチ、ピット、
ノジュール等の表面欠陥の有無を観察した。その結果を
表1に示す。
Embodiment 1 Polishing is a 4-way double-sided polishing machine (plate diameter φ
640 mm) was used for double-sided polishing. The polishing pad is a suede type pad (DOMITEX
25-3) and a 3.5-inch aluminum magnetic disk substrate plated with electroless Ni-P as a workpiece, processing pressure: 100 g / cm 2 , lower platen rotation speed;
Polishing was performed under the condition of 40 rpm. As the polishing composition, 8.6% by weight of an alumina abrasive having an average particle diameter of 0.6 μm in pure water and 0.05% of “surflon S-141” sold by Asahi Glass Co., Ltd., which is nonionic as a fluorine-based surfactant. %, Glycine as a water-soluble amino acid was added and suspended at a ratio of 5.0% by weight to prepare a polishing composition slurry, and the slurry was supplied at a rate of 40 ml / min between the disc and the polishing pad. Polishing was performed for 5 minutes.
After polishing, the polishing rate is calculated from the weight reduction of the workpiece, and the surface roughness is determined by the surf coder ET-30H manufactured by Kosaka Laboratory Ltd.
K (measured with a 0.5 μm R stylus stylus, measuring length 0.8 mm, cutoff 80 μm). Moreover, the surface is observed with a differential interference microscope, and scratches, pits,
The presence or absence of surface defects such as nodules was observed. The results are shown in Table 1.

【0023】実施例2,3 実施例1の方法において、フッ素系界面活性剤を以下に
示す添加量に替えた研磨用組成物を用いた他は、実施例
1と同様に、無電解Ni−Pメッキを施した3.5イン
チのアルミニウム磁気ディスク基板の研磨を行った。そ
の結果を表1に示す。
Examples 2 and 3 In the same manner as in Example 1, except that the polishing composition in which the amount of the fluorine-containing surfactant was changed to the following amount was used in the method of Example 1, electroless Ni- A P-plated 3.5 inch aluminum magnetic disk substrate was polished. The results are shown in Table 1.

【0024】実施例4,5 実施例1の方法に於いて、フッ素系界面活性剤とグリシ
ンを以下に示す添加量に替えた他は、同様に、無電解N
i−Pメッキを施した3.5インチのアルミニウム磁気
ディスク基板の研磨を行った。 その結果を表1に示
す。
Examples 4 and 5 In the same manner as in Example 1, except that the amounts of the fluorosurfactant and glycine were changed to those shown below, electroless N was similarly used.
An i-P plated 3.5 inch aluminum magnetic disk substrate was polished. The results are shown in Table 1.

【0025】比較例1,2 実施例1の方法に於いて、グリシンを添加せず、フッ素
系界面活性剤のみで以下に示す添加量に替えた他は、実
施例1と同様に、無電解Ni−Pメッキを施した3.5
インチのアルミニウム磁気ディスク基板の研磨を行っ
た。その結果を表1に示す。
Comparative Examples 1 and 2 In the same manner as in Example 1, except that in the method of Example 1, glycine was not added and only the fluorine-based surfactant was used instead of the amount shown below, 3.5 plated with Ni-P
An inch aluminum magnetic disk substrate was polished. The results are shown in Table 1.

【0026】比較例3,4 実施例1の方法に於いて、フッ素系界面活性剤及び水溶
性アミノ酸の代わりに硝酸アルミニウム (III)(比較例
4)及び、硫酸ニッケル(II)(比較例5)をそれぞれ
1.0重量%添加した他は、実施例1と同様に、無電解
Ni−Pメッキを施した3.5インチのアルミニウム磁
気ディスク基板の研磨を行った。 その結果を表1に示
す。
Comparative Examples 3 and 4 In the method of Example 1, aluminum (III) nitrate (Comparative Example 4) and nickel (II) sulfate (Comparative Example 5) were used in place of the fluorosurfactant and the water-soluble amino acid. ) Was added in the same manner as in Example 1 except that the electroless Ni-P plated 3.5 inch aluminum magnetic disk substrate was polished in the same manner as in Example 1. The results are shown in Table 1.

【0027】〔各実施例、比較例で使用した研磨促進剤
及びフッ素系界面活性剤の種類と添加量(重量%)〕 実施例2; 非イオン性フッ素系 0.01 グリシン 5.0 実施例3; 非イオン性フッ素系 0.1 グリシン 5.0 実施例4; 非イオン性フッ素系 0.1 グリシン 1.0 実施例5; 非イオン性フッ素系 0.05 グリシン 10.0 比較例1; 非イオン性フッ素系 0.1 グリシン 無し 比較例2; 非イオン性フッ素系 0.01 グリシン 無し 比較例3; Al(NO3)3・ 9H2O 1.0 比較例4; NiSO4 ・ 6H2O 1.0
[Types and Addition Amounts (% by Weight) of Polishing Accelerator and Fluorine Surfactant Used in Each Example and Comparative Example] Example 2; Nonionic Fluorine 0.01 Glycine 5.0 Example 3; Nonionic Fluorine-based 0.1 Glycine 5.0 Example 4; Nonionic Fluorine-based 0.1 Glycine 1.0 Example 5; Nonionic Fluorine-based 0.05 Glycine 10.0 Comparative Example 1; Nonionic Fluorine 0.1 Without Glycine Comparative Example 2; Nonionic Fluorine 0.01 Without Glycine Comparative Example 3; Al (NO 3 ) 3 9H 2 O 1.0 Comparative Example 4; NiSO 4 6H 2 O 1.0

【0028】[0028]

【表1】 * 表面粗さの単位はオングストロームであり、Raは
中心線平均粗さを示す。 尚、表中の表面観察の欄にお
ける“欠陥無し”の表現は微分干渉顕微鏡による表面観
察において、研磨面に欠陥はないものの“良好”と記載
したものに比較し平滑性等において劣ると判断されるも
のである。
[Table 1] * The unit of surface roughness is angstrom, and Ra represents the center line average roughness. In the surface observation column of the table, the expression "no defect" was judged to be inferior in smoothness, etc., to the surface observed by a differential interference microscope, although it had no defects on the polished surface, but was "good". It is something.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 水とアルミナ研磨材からなる金属材料の
研磨用組成物に於いて、該組成物中にフッ素系界面活性
剤とアミノ酸を含有させたことを特徴とする金属材料の
研磨用組成物。
1. A polishing composition for a metal material, which comprises water and an alumina abrasive, wherein the composition contains a fluorine-based surfactant and an amino acid. object.
【請求項2】 フッ素系界面活性剤の含有量が0.01
重量%〜10重量%である請求項1記載の金属材料の研
磨用組成物。
2. The content of the fluorine-based surfactant is 0.01.
The composition for polishing a metal material according to claim 1, which is 10% by weight to 10% by weight.
【請求項3】 アミノ酸の含有量が1.0重量%〜25
重量%である請求項1記載の金属材料の研磨用組成物。
3. The content of amino acid is 1.0% by weight to 25.
The composition for polishing a metal material according to claim 1, which is contained in a weight percentage.
【請求項4】 アルミナ研磨材の含有量が、1重量%〜
30重量%である請求項1記載の金属材料の研磨用組成
物。
4. The content of the alumina abrasive is from 1% by weight to.
The composition for polishing a metal material according to claim 1, which is 30% by weight.
JP3273001A 1991-10-22 1991-10-22 Grinding composition for metallic material Pending JPH05112775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3273001A JPH05112775A (en) 1991-10-22 1991-10-22 Grinding composition for metallic material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3273001A JPH05112775A (en) 1991-10-22 1991-10-22 Grinding composition for metallic material

Publications (1)

Publication Number Publication Date
JPH05112775A true JPH05112775A (en) 1993-05-07

Family

ID=17521768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3273001A Pending JPH05112775A (en) 1991-10-22 1991-10-22 Grinding composition for metallic material

Country Status (1)

Country Link
JP (1) JPH05112775A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511843B1 (en) * 1995-09-20 2005-10-26 소니 가부시끼 가이샤 Polishing slurry and polishing method using the polishing slurry
JP2007130728A (en) * 2005-11-11 2007-05-31 Kao Corp Polishing solution composition
JP2008199036A (en) * 2001-10-31 2008-08-28 Hitachi Chem Co Ltd Polishing solution and polishing method
US8591764B2 (en) 2006-12-20 2013-11-26 3M Innovative Properties Company Chemical mechanical planarization composition, system, and method of use
US8956430B2 (en) 2005-08-30 2015-02-17 Kao Corporation Polishing composition

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511843B1 (en) * 1995-09-20 2005-10-26 소니 가부시끼 가이샤 Polishing slurry and polishing method using the polishing slurry
JP2008199036A (en) * 2001-10-31 2008-08-28 Hitachi Chem Co Ltd Polishing solution and polishing method
US8084362B2 (en) 2001-10-31 2011-12-27 Hitachi Chemical Co., Ltd. Polishing slurry and polishing method
US8084363B2 (en) 2001-10-31 2011-12-27 Hitachi Chemical Co., Ltd. Polishing slurry and polishing method
US8481428B2 (en) 2001-10-31 2013-07-09 Hitachi Chemical Co., Ltd. Polishing slurry and polishing method
US8956430B2 (en) 2005-08-30 2015-02-17 Kao Corporation Polishing composition
JP2007130728A (en) * 2005-11-11 2007-05-31 Kao Corp Polishing solution composition
JP4637003B2 (en) * 2005-11-11 2011-02-23 花王株式会社 Manufacturing method of hard disk substrate
US8591764B2 (en) 2006-12-20 2013-11-26 3M Innovative Properties Company Chemical mechanical planarization composition, system, and method of use

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