JPH05110229A - Electrical connection element - Google Patents

Abstract

PURPOSE: To provide an electrical connecting element that can be manufactured without degrading structural unification of a package or the functions of a device. CONSTITUTION: An electric connecting element contains electrical connecting elements, having at least one first conductive island 12 and at least one second conductive island 31, at least one first and second islands having at least a third conductive island 32 between them. A substance for the third island is different from the substances for the first and second islands, and the third island and the part of first and second islands is surrounded by an inorganic insulating substance 39.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION The present invention generally relates to decals (d
ecal), in particular, a conductive decal filled with an inorganic insulating material. Hereinafter, in this specification, it is referred to as a conductive decal. Also disclosed herein are various methods and steps used to make these conductive decals filled with an inorganic insulating material.

[0002]

2. Description of the Related Art In the market there is an increasing demand for packaging circuits of increasing density. To meet these demands, new packaging concepts have been developed using manufacturing methods close to the level of device technology.

To this end, several new packaging methods have been developed, one of which is the use of decals.

Decal technology initially relied on the use of adhesives that could be used for two purposes. 1) Throughout the entire process
The purpose is to bond the metal foil and the finished image to the carrier, and 2) the purpose to completely peel off the polymer and foil when transferring to the substrate.

Early decals were made from three-part laminates. The process laminate is made of polymer with adhesive.
It consisted of a metal layer in the form of a thin metal or alloy foil adhered to a carrier. The adhesive was also a release material that could be separated from the carrier during transfer.
The reliability of conductor stripping is ensured by the fact that the surface energy of the polymer layer is much less than the conductor or substrate to which the decal is transferred. For example, U.S. Pat. No. 4,879,15
See Specification No. 6. These early solid conductors were formed by photolithography and etching processes.

Early research has shown that such decals
It was immediately shown that the system had limits to reliably achieving proper geometry. It was found that the image transfer was more pronounced than the glass artwork and resulted from the absorption and desorption of the process fluid. the film·
The carrier expanded in some cases and contracted in other cases, depending on its position on the absorption isotherm when exposed to the process environment.

Since research has recognized the limitations of inorganic polymers as carriers, they have focused on identifying materials that can maintain dimensional integrity throughout the process and can be used as carriers.

The material of choice for the labile polymer is a metal foil, which is less susceptible to absorption or deformation of the process fluid at elevated process temperatures.

It is readily apparent that the use of such metal foils in a laminated structure does not allow uniform metal stripping from the metal foil carrier. This was a result of the release adhesive uniformly adhering to both metal surfaces, ie the metal layer and the metal foil carrier.

To overcome this drawback, the surface energy of the metal carrier was reduced to a level much less than that of the decal metal and the substrate receiving the decal. This gives a reliable release of the conductor metal from the metal carrier. The desired adhesive properties are obtained by coating the surface of the carrier foil with a material such as polyimide, which restores the release properties of the original system. It has been found that the metal carrier with the two-layer exfoliation material works as good as the conductor transfer with the original material, giving an improved ability of shape placement accuracy.

The use of additional steps provides another method of forming conductors directly on the metal carrier. The use of plating or lift-off processes in conjunction with photolithography processes allows for additional conductor formation. This technique provides a means to achieve increased package density due to the superior imaging capabilities inherent in the additive process.

A simple decal structure has been developed to allow direct stripping of conductors from metal carriers without the use of stripping materials. This technique can be applied to conductor formation by both addition and removal steps, allowing a wide range of metals and alloys to be utilized as conductors. This is explained in US Pat. No. 4,879,156.

Another packaging method is the intaglio printing process. The image is crimped below the plate and the printing of the design forms the image of the relief. This is disclosed in U.S. Pat. No. 4,879,156. This technique etches the conductor pattern to the surface of the metal carrier, making its depth equal to the required thickness of the finished metal, followed by the deposition of the metal required to form the conductor. , Available for the packaging process. This technique allows the conductor to be formed into a shape defined by the intaglio image on the carrier.

There are several other techniques used for package interconnection. For example, US Pat. No. 3,541,2
No. 22 discloses a connector screen for interconnecting adjacent surfaces of a board or module. The connector screen has conductive connector elements separated by a web of non-conductive material.

A connector assembly for a circuit board inspection system is disclosed in US Pat. No. 4,707,657. An electrically insulating material having circuit tracks of conductive material is disposed on the opposite surface. The inspection points are insulated from each other.

A process for forming a multi-layer ceramic (MLC) substrate having a solid metal conductor is disclosed in US Pat. No. 4,753,694. MLC
The substrate includes forming a solid, non-porous conductor pattern on a support sheet having a release layer and transferring the pattern to a ceramic green sheet.

US Pat. No. 4,926,549 discloses a method of forming electrical connection elements. A carrier is formed on the first conductive element and a hole is etched in the carrier portion to expose the first conductive element and provide a recess therein. The recess has a diameter larger than the diameter of the corresponding hole. The individual holes formed in the carrier are filled with a second conductive material, and subsequently the first conductive element is removed from the carrier, thereby removing the plurality of conductive materials protruding from the upper and lower surfaces of the carrier. Leave it with the carrier. A carrier having a plurality of conductive protrusions can be used to connect a semiconductor device to a circuit board.

IBM Technical Discl
Osure Bulletin, Vol. 27, N
o. 3, pp. 1404-1405 (August
1984) discloses a process of transferring a thin film conductor pattern to a multilayer ceramic substrate. The conductor pattern is formed on the carrier. The conductor pattern is completely surrounded by the insulator, and a hole is provided in the insulator to expose the upper surface of the conductive pattern. The holes are further filled with a conductive material, after fixing this assembly to the multilayer substrate,
The carrier is removed.

One of the problems encountered in earlier work is to create a gap at the junction of a via, such as a copper via, and an insulator sidewall, such as a ceramic sidewall. Gaps of this kind allow the penetration and trapping of fluids, especially during the subsequent steps of sintering. As a measure against this problem, the gap is backfilled with polyimide. This process has its own drawbacks: poor adhesion between the polyimide and copper vias, and difficulty in completely curing the polyimide that has penetrated inside the substrate. These inherent drawbacks result in defects in the thin film redistribution structure that is then deposited on top of the substrate.

Topside metallization geometries are limited by current processing technology. Moreover, via gaps that continue to create penetration problems in subsequent processing continue to form.

The present invention is a TFR (Thin Film Redistribution) with via studs for via registration.
Give decal structure. This structure is laminated to an MLC substrate and then fired to "hermetic".
y). The process herein does not crack the substrate like the previous top surface process. Fine line metallization is also done. Moreover, rapid alignment of the top features with the vias is achieved.

Disclosed herein is a technique that eliminates thin film processing on ceramic substrates, which uses a novel etching technique and decal structure to re-distribute thin films that are performed prior to sintering and survive the sintering cycle. TFR: thin film
It is used to construct the equivalent of redistribution).

The decal structure consists of redistribution lines, C4 pads (acting as electrical interconnects) on top of the solid metal via studs, and EC pads. In this process, the only required post-sintering treatment is
A kind of ball restriction structure for C4 with Ni plating or Au
I was plating.

The present invention focuses on efforts to form solid conductors that can be transferred to a substrate as a viable packaging technique.

The present specification discloses several unique processing methods for forming solid transferable electrical conductors.

[0026]

SUMMARY OF THE INVENTION In accordance with the present invention, the structural integrity of the package or device (s).
The conductive decal can be manufactured without compromising the functionality of the.

It is an object of the present invention to produce an improved conductive decal.

Another object of the invention is to provide electrical wiring, vias,
To produce an improved conductive decal having studs, stud caps, C4 pads, EC pads, etc.

Yet another object of the present invention is to manufacture a plurality of conductive decals that can be stacked and bonded together.

Another object of the invention is to produce a conductive decal that can be fixed to a substrate.

Another object of the present invention is to provide a package which is hermetically sealed after the conductive decal is firmly fixed to the substrate or module.

Another object of the present invention is to provide an insulating layer having electrical interconnections.

It is another object of the present invention to provide a conductive decal that can be tested for electrical conductivity or structural integrity after the decal has completed its sintering cycle.

[0034]

SUMMARY OF THE INVENTION An electrical connection element of the present invention has at least one first conductive island and at least one second conductive island, the first and second conductive islands.
At least one of the islands has at least one third conductive island therebetween and the material for the third island is different from the material for the first and second islands. Island and first and second
At least a portion of one of the islands is surrounded by an inorganic insulating material.

[0035]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT This specification discloses a structure of a conductive decal and a method of manufacturing the same.

The solid circuit pattern described herein is called a decal and is defined as a figure, design, or label printed on a material specially prepared for transfer to another material. It These conductive decals are also referred to as electrical connection elements.

The conductive decal is peeled off from the carrier to remove the multilayer ceramic (MLC).
a pattern formed in a metal system on a carrier having surface characteristics that allow conductors to be transferred to a suitable substrate or insulator such as a package. Permanent bonding is achieved by controlled sintering of an inorganic substrate, such as a ceramic substrate, following pattern transfer.

The present invention enables the fabrication of individual decals that can be fabricated for single or multiple layer multi-layer ceramic (MLC) packages and have been considered to replace the thick film conductors of MLC modules. To do.

Another important advantage of this technique is improved fine wire capability. Using this technique, conductors can be reduced in size and wiring density can be increased. This technique can provide a conductor in resolution that is close to that of the underlying artwork. This ability results in improved potential for increased circuit density.

Other advantages of the invention are: a) A self-aligned conductive connecting element in which the metal on both sides of the etch stop material is aligned and fixed. b) A novel decal structure with stud caps, via studs, and an etch barrier incorporated to define the fine lines of the etch. c) to prevent fluid penetration in the post-sintering process,
The via cap seals the substrate. d) No flattening after sintering is required. e) No polyimide backfill is needed to seal the vias in the glass-ceramic substrate. f) Decal via studs
Since only 50% of the stud area needs to be captured and there is no circuit wiring to the interface at this surface of the decal, pattern registration to the rest of the substrate is facilitated by the sprayed sheet. g) The double sided photolithography exposure step ensures alignment of the via studs to the TFR pattern.

FIG. 1 shows a workpiece or decal base 5
Shows a three-layer structure called. The decal base 5 has a three-layer structure, the intermediate layer is an etching barrier or an etching stop layer 11, and the periphery thereof is conductive metal layers 13 and 15. The etching barrier or etching stop layer 11 is
It is a conductive material and is an etching stop layer, that is, the third layer 11
The other two metal layers 13 and 1 covering or sandwiching
5 is any substance that allows preferential etching of 5. The purpose of the etching barrier 11 will be described later. The etch stop layer 11 should have sufficient thickness to prevent unwanted penetration of the etchant. Suitable materials for the etch stop layer are aluminum, chromium, copper, gold, molybdenum,
Selected from the group including palladium, platinum, silver, titanium, tungsten, or alloys thereof.

Two outer layers, conductive materials 13 and 1
5 can be the same or different material, depending on the desired end result. Suitable materials for the conductive materials 13 and 15 are materials selected from the group comprising aluminum, copper, gold, iron, molybdenum, nickel, tungsten, or alloys thereof. Similarly, the two outer layers 13 and 15 are of the same or different thickness, depending on how these layers are utilized in the final package. According to the figure, the metal layer 15 is made of a thin material and the metal layer 13 is made of a thicker material, but the upper and lower thicknesses can be varied to create the desired decal profile.

The workpiece or decal base 5 shown in FIG. 1 can be used in many conventional techniques, such as coating, coating,
It can be manufactured by vapor deposition, plating, sputtering, or any other suitable method. A combination of any of these processes is also employed when forming the decal base 5. Any of these methods can be used to obtain the required conductor thickness. One layer of decal base 5 is
It can be used as a starting layer (or carrier) so that the other two layers can be formed on it. The etching barrier 11 can be used as a starting layer and the outer layers 13 and 1
5 can be formed simultaneously or subsequently in the starting layer. This decal base 5 provides a dimensionally stable structure throughout the process.

FIG. 2 shows a decal base 5 having a resist pattern on both sides. When the decal base 5 is completed, photoresists 17 and 19 are provided on the exposed surfaces of the conductive materials 13 and 15. This photoresist 1
7 and 19 are formed by wet process, dry process
Depending on either process, eg immersion, electrophoresis,
Lamination, roller coating, spinning, spraying,
Alternatively, a combination of these processes can be used. Photoresists 17 and 19 can be negative or positive photoresist depending on the photomask used and the desired end result.

The two photomasks with the desired pattern are aligned with each other, the decal base 5 with the photoresists 17 and 19 is placed between the aligned photomasks, and the photoresists 17 and 19 are exposed. .. The photomask consists of circuit patterns, or through via patterns, or a combination of both, or other electrical features such as via studs and stud caps. Photoresists 17 and 19 can be exposed simultaneously or sequentially. Preferably, both sides of the decal base 5 are exposed at the same time to ensure positional alignment. Similarly, both sides can be developed simultaneously or sequentially with a combination of photoresists. Photoresist may be applied by any suitable technique, such as dipping,
Developed by spraying. The photoresist remaining after development defines the circuit pattern and / or the final image of the via studs and / or stud caps. As shown in FIG. 2, the photoresist patterns 17 and 19 have holes or open areas 1
6 and 18, respectively, from which the conductive materials 15 and 13 are removed in the next step.

FIG. 3 shows a partial etching of the decal base 5. The exposed conductive materials 13 and 15 are in the imaged decal base 5 and are removed by conventional etching processes such as electrolytic etching, chemical etching, or dry etching. By using dissimilar metals or metals having different thicknesses as the conductive materials 13 and 15, the etching stop layer 11 is exposed on one side after partial etching. This is usually the thinner conductive metal side that contains the circuit pattern and stud cap, or the conductive metal side that was originally etched. The side opposite to the side where the etching stop layer 11 is exposed is whether the entire process is etched toward the etching stop layer 11 or is partially etched. This is due to the thickness ratio of the two outer conductive layers. The etch stop layer 11 allows the two outer layers to be processed individually or simultaneously. The advantage of this is that one outer layer makes it possible to form patterns of varying density on both sides or to improve the aspect ratio (ratio of image dimension to thickness) of the image. The first etching of the conductive materials 13 and 15 ends after the top surface is etched through the opening 16 and the etch stop layer 11 is exposed. This is a stud cap 1
2 and the opening 21 that defines the circuit wiring 14 is formed.
This etched metal is called an island.
The etching material or etching process used should be an etching material or etching process suitable for etching only desired materials and features. In FIG. 3, the upper surface of the decal base 5 and
The defined circuit wiring 14 and the stud cap 12 are shown. The thin conductive metal layer 15 is etched by stud
Connect the cap 12 and the circuit wiring 14 to the conductive etching barrier 1
Everything else through 1 should continue until there is no material that electrically connects them to each other. Because the simultaneous etching was used, the underside of the decal base 5 was exposed only to define the opening 23.

FIG. 4 is a view in which the resist 17 is removed from the upper surface of the decal base 5. Photoresist 17 is removed from the top by any suitable stripping technique. Here, it should be considered to use only a suitable stripping process so as to etch only the photoresist 17 and not damage or remove the photoresist image 19.

FIG. 5 shows a partially etched decal base 5
The step of providing an adhesive peeling substance on the upper surface of FIG. The upper surface is
A suitable debonding material 25 such as PMMA (polymethylmethacrylate) can be sprayed. The debonding material 25 is applied to the top surface of the etched decal base 5 using roller coating, spinning, spraying, or a few other techniques selected. The debonding material 25 fills the openings 21 and forms the openings 27 to conform to the etched surface.

FIG. 6 shows a support member or carrier 29,
Adhesive peeling material 25 of partially etched decal base 5
It shows the state of fixing to. The carrier 29 is the adhesive release material 2
It can be any suitable polymer or metal, as long as it adheres to 5. For example, if a polymer is used for carrier 29, a polyester or polyimide material can be used for carrier 29. On the other hand, if a metal is used as the carrier 29, the carrier 29 should be coated on one or both sides with a polymer such as polyimide, or at least on the surface in contact with the debonding substance 25 already on the decal base. It should be coated, so that the peeling of the carrier 29 from the decal base 5 is guaranteed during the next step.

A suitable material for the metal carrier 29 is copper. The initial function of the debonding material or layer 25 is to attach the carrier 29 to the partially etched decal base 5 so that the carrier 29 can be removed from the decal base 5 in the next step. The carrier 29 serves two purposes. One is the mechanical support of the etched decal base 5, and the other is as an etching barrier for one side of the decal base 5, allowing the other side of the decal base 5 to be further processed. The only case where the carrier 29 is needed as an etching barrier is when the same metal is used as the conductive materials 13 and 15. The carrier 29 can be secured to the etched workpiece or decal base 5 on the side where the debonding material 25 is provided by any suitable means such as lamination, heat treatment, or compression.

The complete etching process of the lower part of the decal base 5 is shown in FIG. Decal base 5 is etched until photoresist 19 and carrier 29 protect the desired image and the bottom surface of etch stop layer 11 is exposed. This second etching process is performed in the opening 33
To form via studs or interconnects 31. The etched metal is called an island. This etching of the bottom of the decal base 5 is done by conventional means such as chemical etching, electrolytic etching, or dry etching.

FIG. 8 is a view showing a state where the photoresist 19 is removed from the decal base 5. This is typically
This can be done by wet techniques such as re-exposure, development or chemical stripping or dry techniques such as RIE or ashing.

FIG. 9 shows the final etch of decal base 5 by etching away the exposed etch stop layer 11 to form etch stop interconnects or islands 32 called conductive islands. In some cases, etch stop material 11 need not be removed from the decal base, as described below. If the etch stop layer 11 has to be removed, it can be done by chemical etching, electrolytic etching or dry etching. The etch stop interconnect 32 electrically connects the stud cap 12 to the via stud 31. This etching also expands opening 33 to form opening 35. Removal of the etch stop layer 11 isolates all formed electrical interconnects and prevents shorts between the via studs 31 and circuit wiring 14.

In some cases, the exposed etch stop material 11 need not be removed from the decal base 5 as indicated by the dashed line 36 in FIG. This depends on what happens next to the exposed etch stop material 11. For example, some etch stop materials interact with insulating materials to form insulating oxides and act as insulators during the sintering process. A good example of this is the use of chromium as the etch stop material 11. During the sintering process, the exposed etch stop material forms the insulator chromium oxide.

FIG. 10 is a view showing a state in which the opening 35 in the completely etched decal base 5 is filled with a slurry 39 of an inorganic insulating material. The inorganic insulating material 39 must completely surround the etch stop interconnect or island 32 and surround at least a portion of either the stud cap 12 or the via stud 31, or both, to provide electrical connection between adjacent electrical elements. You should prevent short circuits. The inorganic insulator or material 39 is typically selected from aluminum oxide or ceramic or glass-ceramic materials. The filling of the opening 35 can be performed by roller coating, spraying, spinning, or the like. The thickness of the insulating material 39 is no greater than the height of the via stud 31. During the spray, the slurry builds up, then flows over the via studs and “self-cleans”. Inorganic contamination of the upper surface 41 of the via stud 31 will be minimal. The ends of the via studs 31 either project above the surface 42 of the insulating material 39 or remain after flushing the surface 42 of the insulating material 39. This is done by a suitable coating technique, planarization or by a dry etching process.

As mentioned previously, the exposed etch stop layer 11 need not be removed. If the etch stop layer 11 remains on the pattern, the exposed etch stop layer 11 should consist of a material that forms an insulating oxide during the sintering process. The unexposed etch stop layer 11 between the stud cap 12 and the via stud 31, as well as the etch stop interconnect 32,
Form conductive islands. This is due to the fact that the conductive material for the stud cap 12 and the via stud 31 diffuses into the etch stop layer 11 and forms an electrical connection at the interface boundary. The exposed etch stop layer 11 converts the etched metal stud cap 12 and the circuit trace 14 when converted to oxide.
And promotes adhesion between the insulating material 39 and the insulating material 39, such as a ceramic insulating material.

The completed decal with the exposed etch stop layer 11 removed and ready for transfer to the desired substrate is shown in FIG. The finished decal is ready to be transferred to an unfired inorganic substrate, such as a ceramic substrate, and the finished structure will provide the substrate with the necessary metals and interconnects.

FIG. 11 shows the decal shown in FIG.
5 is a view showing a state of being bonded to 5 or another layer 45. Conductive decals or electrical connection elements are stacked or bonded to unfired inorganic substrates or other conductive decals, laminated and sintered. The image or shape of the decal is aligned with the image or shape of the substrate 45 or the next layer 45 and combined by applying heat and / or compression. This conductive decal must be bonded to the unfired inorganic layer or substrate 45. The carrier 29 is stripped and removed from the decal prior to the sintering cycle after the insulator 39 has been bonded to the layer or insulator 43 of the substrate 45. The debonding material 25 that remains on the decal after the carrier 29 has been peeled or removed is burned off and removed during the sintering process to form the surface 52. During this bonding process, the stud connections 44 of the layer or substrate 45 bond with the ends 41 of the decal stud 31 and fuse together during the sintering process. After the decal has been transferred through the sintering cycle, electrical continuity or structural integrity can be easily inspected to reduce defects in the final product.

FIG. 12 illustrates further processing of the conductive decal of the present invention. The structure of FIG. 11 with the decal bonded to a layer or substrate 45 is an alternative structure 5 formed in the same manner.
5, or bonded to the unsintered stack layer 55. If the insulator in structure 55 is an inorganic material, such as ceramic, structure 55 must be bonded to the unsintered structure of FIG. 11 and, after bonding, the entire stack is sintered. During the sintering process, the stud connection 51 melts into the stud cap 12 and the insulator 59 adheres to the insulator 39 at the boundary 52. The typical pattern also includes circuit wiring 54. If the insulator in structure 55 is an organic material such as a polymer, structure 55 should adhere to the fired structure formed in FIG. This sealing must be done by a heating and compression laminating process, where the stud connection 51 is bonded to the stud cap 12 and the insulator 59 is bonded to the insulator 39 at the boundary 52. As shown in FIG.
The substrate 55 can also include circuit wiring 54.

FIG. 13 is another embodiment of the completed conductive decal or electrical connection element of the present invention. The process described above concentrates on the conductive decal, where two conductive metal layers 1
The thicknesses of 3 and 15 are not equal, ie one side is thin due to the circuit pattern 14 and the stud cap 12 and the other side is thick due to the through via stud 31. As mentioned above, the method of the present invention comprises:
It can be used in situations where the two conductive metal layers 13 and 15 have equal thickness. The manufacturing process is basically
It is the same as the above-mentioned outline, and the only difference is the final use form of the product. The product can only be used with via studs as a through via layer and there is no circuit pattern on one side of the finished product. Figure 1
Insulator 39 and via stud 61 as shown in FIG.
Are separated from each other. Via studs 31 and 61 may be the same material or different materials. Further, they may have the same height and thickness or may have different heights. FIG. 13 shows a cross section of a completed unfired conductive decal with both outer metal layers being of equal thickness. This product serves as a typical interconnect for bonding unbaked circuit patterns to unbaked inorganic substrates and unbaked inorganic substrates to other unbaked inorganic substrates. Can be used.
After full bonding, the complete package is sintered to form the final product.

FIG. 14 illustrates an embodiment of coupling the completed electrical connection element of the present invention to a set of substrates or electrical devices 65 and 75. Substrates 65 and 75 can have stud connections 62 and 72, respectively. Similarly, the substrate 65 can also have circuit wiring 64,
The substrate 75 can have circuit wiring (not shown). During the bonding process, insulator 39 adheres to insulator 69 at surface 52 and insulator 79 at surface 42. A complete decal can be used to bond two circuit layers together, an unsintered substrate and a circuit layer together, or two unsintered layers together, on opposite sides of this completed decal. Can be used.

Although the present invention has been described with respect to particular embodiments, it will be apparent to those skilled in the art from the foregoing that modifications and changes can be made without departing from the scope of the present invention.

[0063]

The present invention allows the fabrication of individual decals that can be fabricated for single or multiple layer multi-layer ceramic (MLC) packages and have been considered to replace the thick film conductors of MLC modules. to enable.

[Brief description of drawings]

FIG. 1 illustrates a decal base having a conductive etch stop layer.

FIG. 2 shows a decal base having resist patterns on both sides.

FIG. 3 shows a partial etch of the decal base to expose the etch stop layer on the side of the thin electrical conductor.

FIG. 4 illustrates removal of resist from the top surface of a thin electrical conductor.

FIG. 5 is a diagram showing application of a debonding material to the upper surface of a partially etched decal base.

FIG. 6 illustrates placement of a carrier on a debond material on a partially etched decal base.

FIG. 7 shows a complete etching of the thick electrical conductor side of the decal base.

FIG. 8 illustrates removal of photoresist from the surface of a thick electrical conductor.

FIG. 9 is a diagram showing etching removal of an exposed etching stop layer.

FIG. 10 shows the filling of the regions between the thick electrical conductors of the decal base with an inorganic insulating material.

FIG. 11 illustrates the attachment of a decal to a substrate or other layer.

FIG. 12 illustrates further processing for the decal of the present invention.

FIG. 13 is a view showing another embodiment of the completed conductive decal of the present invention.

FIG. 14: 1 of the embodiment of the completed conductive decal of the present invention
FIG. 7 is a diagram showing coupling to a set of electrical devices.

[Explanation of symbols]

 5 Decal Base 13 First Conductive Material 15 Second Conductive Material 11 Third Conductive Material (Etching Stop Layer) 12 Stud Cap 14 Circuit Wiring 16, 21, 23, 33, 35 Opening 17, 19 Photoresist 25 Adhesion Stripping material 29 Carrier 31 Via stud 39 Insulating material (slurry)

─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. ⁵ Identification number Internal reference number FI Technical display location // H01L 21/90 B 7353-4M (72) Inventor Zyon Acosera Hope Well Jiyankyon Alpine, New York, USA Drive 5 (72) Inventor Lester Win Heron Hope Well Jianxion Insbrutk Boulevard, New York, United States 12 (72) Inventor Mark Richard Codas United States New York, Present Valley Earl 1 Boxes 313 (72) Inventor Lewis Harry Worts United States New York Highland Smith Terrace 17

Claims (10)

[Claims] 1. A conductive element comprising at least one first conductive island and at least one second conductive island, wherein at least one of said first and said second island is at least in between. Having a third conductive island, the material for the third island is different than the material for the first and second islands, and the third island and the first island Second
An electrical connection element in which at least a portion of one of the islands of is surrounded by an inorganic insulating material. 2. At least one of the third conductive islands.
The electrical connection element of claim 1, wherein one comprises an etch stop material. 3. At least one of the third conductive islands.
The electrical connection element of claim 1, wherein one is selected from the group comprising aluminum, chromium, copper, gold, molybdenum, nickel, palladium, platinum, silver, titanium, tungsten, or alloys thereof. 4. The first conductive island and the second conductive island.
Materials for the conductive islands of aluminum, copper,
The selected from the group including gold, iron, molybdenum, nickel, tungsten, or alloys thereof.
The electrical connection element described. 5. The electrical connecting element according to claim 1, wherein the inorganic insulating material is selected from the group comprising aluminum oxide or ceramics or glass ceramics. 6. At least one of said first islands,
Or the electrical connection element of claim 1, wherein at least one of the second islands forms a conductive wire. 7. At least one of said first islands,
Or the electrical connection element of claim 1, wherein at least one of the second islands forms a conductive via stud. 8. The electrical connection element according to claim 1, wherein the thickness of the first conductive island is different from the thickness of the second conductive island. 9. The electrical connecting element of claim 1, wherein the thickness of the first conductive island is the same as the thickness of the second conductive island. 10. The first island is a conductive stud cap and the second island opposite the first island is a conductive via stud.
Electrical connection element.