JPH0486534A - Photometer for multi-wavelength simultaneous photometry - Google Patents

Abstract

PURPOSE:To carry out stable multiwavelength simultaneous photometry by allowing the optical axes of luminous fluxes going to optical systems on a sample side and a reference side from light sources A, B having different wavelength regions to cross each other and providing a half mirror at the intersecting point of the optical axes at an angle bisecting the angle of the optical axes. CONSTITUTION:The light emitted from a deuterium lamp 1 and transmitted through a half mirror 5 and the light emitted from a tungsten lamp 2 and reflected from the mirror 5 go toward a sample photometric system C and further go toward a prism 14 through the sample cell 10, slit 11, mirror 12 and collimator mirror 13 in a sample cell holder 9. The light advancing into the prism 14 is reflected from the rear reflecting surface of the prism 14 to be dispersed at every wavelength to be detected by the multichannel photodetector 15 on a sample side through the mirror 13. The light emitted from the lamp 1 to be reflected by the mirror 5 and the light emitted from the lamp 2 to be transmitted through the mirror enter the optical system D on a reference side through the slit 22 on the reference side and detected by the multichannel photodetector 20 in the same way as the photodetector 15 through a mirror 17 and a collimator mirror 18.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a multi-wavelength simultaneous photometer that can instantly obtain spectral information of a sample.

[Conventional technology]

FIG. 8 shows an example of a conventional multi-wavelength simultaneous photometry photometer (known as known example 1), in which light emitted from a light source 50 is split into two beams by a beam splitter 51, and each beam is separated by a diffraction grating 52. After being spectrally dispersed (wavelength dispersion), the light is returned to one beam by a mixing mirror 53 and received by one photodiode array detector (multi-channel photodetector) 54.

55 is a sample cell, and 56 is a reference cell.

When obtaining a sample side signal and a reference side signal, the optical path between the sample side optical system and the reference side optical system is alternately interrupted by the chopper 57, and each signal is detected by the photodiode array detector 54. I was letting it happen. The reason why the reference side optical system is provided in addition to the sample side optical system is to correct optical fluctuations at each wavelength (light source fluctuation, detector drift, etc.) from the signal ratio or difference between the two.

In addition, Fig. 9 shows another conventional example of a multi-wavelength simultaneous photometry photometer (
60 is a light source, 61 is a beam splitter, 62 is a spherical mirror, 63 is a sample cell, 64 is a reference side slit, 65 is a diffraction grating, 66 is a reference side photodiode array, and 67 is a sample side. It is a photodiode array.

In this example, a beam splitter 61 is used as shown in the figure.
The light beams separated into two beams are not integrated, but these beams (light beams on the sample side and the reference side) are simultaneously separated by a diffraction grating 65 and then detected by separate photodiode arrays 66 and 67.

Furthermore, Japanese Utility Model Application Publication No. 59-135532 (hereinafter referred to as Publication Example 3) discloses a technique for conducting multi-wavelength simultaneous photometry after guiding light from two types of light sources with different wavelength ranges to a sample part in a time-sharing manner. has been done.

[Problem to be solved by the invention]

Among the above-mentioned conventional techniques, Known Examples 1 and 2 split the light from one light source into a sample-side optical system and a reference-side optical system, and therefore provide a wide range of spectral information spanning from the ultraviolet region to the visible region. can't get it.

In other words, in order to expand the measurement range of a multi-wavelength simultaneous photometer, it is desirable to instantly capture a large amount of spectral information. light sources cannot meet this need.

In addition, in the case of known example 1, the light split into two light beams is interrupted by a chopper to select the light from the sample-side optical system and the light from the reference-side optical system to reach the photodiode array. However, in this type of system, half of the light energy is wasted in the chopper section. Sacrificing half of the optical energy in this way causes not only energy loss but also a reduction in the intensity of the detection signal.

In addition, in known example 3, when light from two types of light sources with different wavelength ranges is taken into the measurement optical system in a time-sharing manner, when the light from one light source is taken in, the light from the other light source is Since the optical information is discarded, the utilization efficiency of optical information is low. In addition, no consideration was given to dealing with light source fluctuations (
In other words, optical systems on the sample side and reference side were not provided to stabilize photometry).

Here, known example 1. Known example 2. Although the idea of arbitrarily combining the techniques of Known Example 3 has arisen, simple combinations have the following problems.

(1) Light energy will always be discarded at some point.

(2) If a mechanism for taking in light from the two types of light sources as in Known Example 3 is placed in front of the sample side light flux and reference side light beam distribution in Known Example 1 or Known Example 2, the entire optical system becomes significantly larger. It becomes complicated.

In addition to the above-mentioned conventional technology, for example, Japanese Patent Application Laid-Open No. 53-1
Two-wavelength spectrophotometer disclosed in JP-A No. 5870 (known example 4), a spectrophotometer described in JP-A No. 59-135332 (example 5), a spectrophotometer disclosed in JP-A-63-182530 (example 6) discloses a technique for mixing light from two types of light sources using a half mirror.

However, in the case of the known example 4, although the mixed light is divided through a half mirror, each of the divided lights has a wavelength of λ1. This technology only extracts a single wavelength, λ2, for reference and measurement, and does not effectively utilize a wide range of wavelengths in mixed light; it is a technology that instantly obtains a large amount of spectral information like a multi-wavelength simultaneous photometer. No consideration has been given. Also, λ1. For one of the wavelengths of λ2, the light is interrupted by a rotating sector before passing through the sample cell, and when the light is blocked, the light is discarded, reducing the light utilization efficiency by that amount.

Known example 5. In the case of known example 6, although the light from two types of light sources is mixed through a half mirror, half of the light from one or both light sources passes through the half mirror without being used for photometry. Otherwise, it would be reflected, which would reduce the light utilization efficiency. Furthermore, there is no disclosure of the sample-side optical system or the reference-side optical system (there is no mention of a technique for dividing mixed light into these optical systems, or a technique for photodynamic correction for simultaneous multi-wavelength photometry).

The present invention has been made in view of the above points, and its purpose is to make it possible to instantly obtain photometric spectrum information over a wide range of wavelengths by utilizing the light energy of two types of light sources without wasting it. The object of the present invention is to provide a device that enables stable multi-wavelength simultaneous photometry without increasing the size of the optical system (and also dealing with photointensity fluctuations).

[Means to solve the problem]

In order to achieve the above object, the present invention basically proposes the following problem-solving means.

One of them (first problem solving means) is a photometer that includes two types of light sources A and B with different wavelength ranges, a sample side optical system, and a reference side optical system, in which the light source A is closer to the sample side. The optical axis of the light flux heading toward the optical system and the optical axis of the light flux heading from the light source B toward the reference side optical system are made to intersect, and the angle formed by these optical axes is divided into two at the intersection of these two optical axes. A partially transmitting/partially reflecting mirror is arranged at an angle, and the light from the light source A and the light source B is mixed by the partially transmitting/partially reflecting mirror and is divided into the sample side optical system and the reference side optical system and then proceeds. Set it like this,
The sample-side optical system includes a sample cell, an element that wavelength-disperses the light that passes through the sample cell, and a multi-channel photodetector that simultaneously detects the wavelength-dispersed light; The system includes an element that wavelength-disperses the light passing through the optical path of the reference-side optical system, and a multi-channel photodetector that simultaneously detects the wavelength-dispersed light; and calculation means for obtaining spectral information of the sample with photodynamic correction for each wavelength from multi-wavelength photometric data detected by the multi-channel photodetector.

Another second problem-solving means is, instead of the partially reflecting/partially transmitting mirror used in the first problem-solving means,
A motor-driven rotating body is arranged so as to rotate through the intersection of the optical axis from the light source A toward the sample-side optical system and the optical axis of the optical system from the light source B toward the reference-side optical system. Reflecting mirrors are provided on the front and back surfaces of the body at an angle that bisects the two optical axes, and a light transmitting portion is formed in line with the reflective mirror in the rotational direction. The light beams of the light source A and the light source B are set to be switched and guided to the sample side optical system and the reference side optical system by rotational displacement of the part, and the other configuration is the same as the first problem solving means.

[Effect]

Effect of the first problem-solving means: At the intersection of the optical axis from light source A toward the sample-side optical system and the optical axis from light source B toward the reference-side optical system, the angle formed by these optical axes is divided into two. Since a partially transmitting/partially reflecting mirror is installed at an angle of Head to.

On the other hand, the light incident on the mirror from the light source B is partially transmitted and directed toward the reference side optical system, and at the same time is partially reflected and directed toward the sample side optical system. As a result, two light sources A and B
mixing of light from the sample side and the reference side optical system.
The light beam can be split into the optical axis at one position with almost no loss of light quantity.

One of the split beams of mixed light enters the sample-side optical system and the other enters the reference-side optical system, where each wavelength is dispersed (spectrumed) by each wavelength dispersion element, and these wavelength-dispersed lights are are simultaneously detected by each multichannel photodetector. Then, the calculation means calculates the ratio or difference for each wavelength between the sample-side measurement data and the reference-side measurement data detected by these multi-channel photodetectors, and calculates the ratio or difference for each wavelength, and calculates the ratio or difference for each wavelength, and calculates the ratio or difference for each wavelength, and calculates it according to the purpose, such as identification of sample components, quantitative analysis, etc. Spectral information can be obtained instantly.

In this case, in the present invention, since the wavelength ranges of the two types of light sources are combined to perform simultaneous photometry of a large number of wavelengths, wavelength spectrum information over a wide range can be obtained and the measurement range for the sample can be expanded.

Operation of the second problem-solving means: In this problem-solving means, when the rotating body is rotationally displaced by motor drive, the light transmitting portion and the reflecting mirror formed on the rotating body sequentially pass through the intersection of the two optical axes. do. and.

When the light transmitting portion is located at the intersection, the light from light source A is transmitted toward the sample-side optical system, and the light from light source B is transmitted toward the reference-side optical system.

Furthermore, if the reflecting mirrors provided on the front and back surfaces of the rotating body are located at the intersection, depending on the angle setting of those reflecting mirrors, the reflecting mirror on one side directs the light from light source A toward the reference side optical system. light source B, and the reflecting mirror on the other side is the light source B.
The light is reflected toward the sample-side optical system.

That is, the reflecting mirror and the light transmitting section of the rotating body switch and guide the light beams from the light source A and the light source B to the sample-side optical system and the reference-side optical system. In this case as well, the light from light source A and light source B can be guided to the sample-side optical system and the reference-side optical system without waste.
Light amount loss can be minimized. Moreover, the multi-wavelength simultaneous photometry of the present problem-solving means is performed in the same manner as the first problem-solving means, except for the above-mentioned introduction of the luminous flux.

〔Example〕

Embodiments of the present invention will be described based on the drawings.

FIG. 1 is a configuration diagram of an optical system of a multi-wavelength simultaneous photometry device according to a first embodiment of the present invention.

In FIG. 1, 1 is a deuterium lamp that has a lot of light energy in the ultraviolet region, and 2 is a tungsten lamp that has a lot of light energy in the visible region.

The light emitted from the deuterium lamp 1 is focused by a toroid mirror 3, passes through a mirror 4, and then passes through a partially transmitting/partially reflecting mirror 5.
Head to. The partially transmitting/partially reflecting mirror 5 is generally referred to as a half mirror, and is most typically made by depositing a thin layer of metal on quartz.

Hereinafter, in the embodiment, the partially transmitting/partially reflecting mirror 5 will be referred to as a half mirror.

The light emitted from the tungsten lamp 2 is reflected by a mirror 6, passes through a color adjustment optical filter 7, is condensed by a lens 8, and then heads toward a half mirror 5. The reason for using the color adjustment optical filter 7 will be described later.

Of the optical axes of the above two types of light sources 1 and 2 (corresponding to light sources A and H), the optical axis goes from the deuterium lamp 1 to the sample-side optical system C, and the optical axis goes from the tungsten lamp 2 to the reference-side optical system. The reflective surface of the half mirror 5 is installed at this intersection point at an angle that bisects the angle formed by the two optical axes, that is, at an angle of 45 degrees with respect to each optical axis. Note that the angle at which the two optical axes intersect and the angle that divides the two into two may be arbitrary.

The sample-side optical system C includes a sample cell holder 9 having a sample cell 10 and a slit 11, a mirror 12, a collimator mirror 13, a prism 14, a multichannel photodetector 15, a printed circuit board 16, and the like.

On the other hand, the reference side optical system includes a slit 22, a mirror 17,
It is composed of a collimator mirror 18, a prism 19, a multi-channel photodetector 20, a printed circuit board 21, and the like.

In the above configuration, the light emitted from the deuterium lamp 1 that passes through the half mirror 5 and the light emitted from the tungsten lamp 2 that is reflected by the half mirror 5 are as follows:
It heads toward the sample-side optical system C, passes through the sample cell 1o in the sample cell holder 9 and the slit 11, is reflected by the mirror 12, becomes an f-parallel beam at the collimator mirror 13, and heads toward the prism 14. The light that has traveled through the prism 14 is reflected by the reflective surface on the back side of the prism 14 and passes through the prism again to be emitted, but at this time it is dispersed for each wavelength. The dispersed light passes through the collimator mirror 13 again and is received by the sample-side multichannel photodetector 15.

On the other hand, half mirror 5 is illuminated by the light emitted from the deuterium lamp.
The light reflected by the tungsten lamp 2 and the light transmitted by the half mirror 5 pass through the reference side slit 2.
The light enters the reference side optical system via 2, passes through the mirror 17 and the collimator mirror 18 in the same way as the sample side, and is then received by the reference side multi-channel photodetector 21.

Here, the significance of mixing the light from the deuterium lamp 1 and the light from the tungsten lamp 2 will be explained with reference to FIG. Multi-wavelength simultaneous photometry photometers require light energy over as wide a wavelength range as possible because they aim to instantly capture a large amount of wavelength spectral information. A single light source is unable to meet this need. On the other hand, 2
By mixing the types of light sources 1.2, the total light energy can be maintained sufficiently from the ultraviolet region to the visible region, as shown in FIG.

FIG. 4 is an explanatory diagram in which a color adjustment optical filter 7 is used to solve the problems when a prism is used as a wavelength dispersion element.

Prisms have the advantage of not causing the problem of secondary dispersion light being superimposed on primary dispersion light. However, since the wavelength energy of the dispersed light differs depending on the wavelength, the optical energy per element of a multichannel photodetector differs significantly depending on the wavelength range, as shown by the solid line in FIG. Therefore, the light from the tungsten lamp 2 is guided (a color adjustment filter 7 is inserted into the optical system), and the wavelength energy distribution is converted to be flat as shown by the dotted line in FIG.

Next, the signal processing system in the first embodiment will be explained with reference to FIG.

The spectrum signal detected by the sample-side multichannel photodetector 15 is held by a spectrum holding circuit 26 and sent to a calculation section 28 . On the other hand, the spectrum signal detected by the reference side multi-channel photodetector 20 is held by the spectrum holding circuit 29 and sent to the calculation unit 28.

The calculation unit 28 performs a ratio calculation of both spectrum signals and a LOG conversion calculation of the ratio calculation result, and the absorption spectrum holding circuit 29 holds the result. The horizontal axis conversion circuit 30 converts the absorption spectrum whose horizontal axis is the element number of the multi-channel detector into an absorption spectrum whose horizontal axis is the wavelength axis, and holds the result in the wavelength pace absorption spectrum holding circuit 31. . A large amount of this signal is stored in the storage unit 32 and transferred in batches to the external computer 34 via the interface 33 at an appropriate time.

According to this embodiment, the following effects are achieved.

When analyzing samples by simultaneous multi-wavelength photometry,
Two types of light S<deuterium lamp, tungsten lamp) 1
. Therefore, a lot of spectral information can be instantaneously detected through each wavelength dispersive element and multi-channel detector. As a result, the measurement range of multi-channel sample analysis can be expanded.

Since each wavelength spectrum is determined from the detection data of the sample-side optical system and the reference-side optical system with light source fluctuation correction, reliable sample analysis is possible.

Furthermore, since the mixing and division of light into the sample-side optical system and the reference-side optical system can be achieved by rationally arranging one half mirror, space can be simplified and the equipment (optical unit 23) It can contribute to downsizing.

FIG. 2 is a configuration diagram showing an optical system of a multi-wavelength simultaneous photometry photometer according to a second embodiment of the present invention, and in the figure, the same reference numerals as in the first embodiment indicate the same or common elements. .

This embodiment differs from the first embodiment in that a rotating body 24 is used instead of the half mirror 5, and a motor 2 that drives the rotating body 24 is used instead of the half mirror 5.
The point is that it uses a rotating mirror mechanism consisting of 5 mag.

The rotating body 24 has reflective mirrors 38a and 38b provided on its front and back surfaces, and a light transmitting section 40 (see FIG. 7) is formed in line with the rotating direction. Or, as shown in Figure 7 (7
(The figure is a front view showing another example of the rotating body 24), reflective mirrors 38a and 38b are provided on the front and back surfaces, and a non-transmissive/non-reflective part 39 for dark current measurement is provided next to it, and further,
A light-transmitting cutout space (hereinafter referred to as a light-transmitting portion) 40 is formed in line with the reflecting mirrors 38a, 38b and the non-transmitting/non-reflecting portion 39 in the rotation direction. Reflection mirror 38a, 3
8b is one in which aluminum is vapor-deposited on a transparent quartz plate.

The rotating body 24 having the above configuration is configured such that the reflecting mirrors 38 a, 38 b, the light transmitting part 40, etc. rotate through the intersection of the optical axis of the deuterium lamp 1 and the optical axis of the tungsten lamp 2 in order. Placed. Reflection mirrors 38a, 38b
is set at an angle that bisects the two optical axes.

By installing such a rotating mirror mechanism, the motor 2
When the rotating body 24 is rotationally driven using the mirror 5, the mirrors 38a and 38b are intermittently inserted at the intersection of the optical axis of the light from the deuterium lamp 1 and the optical axis of the light from the tungsten lamp 2.

Then, at a timing when the mirrors 38a and 38b are not pushed in, for example, when the light transmission section 40 is at the intersection of the optical axes, the ultraviolet light emitted by the deuterium lamp 1 is directed toward the sample-side optical system C, and the tungsten Light in the visible range emitted by the lamp 2 is directed toward the reference side optical system. Mirrors 38a, 38b
is at the intersection of the optical axes, the ultraviolet light emitted by the deuterium lamp 1 is reflected by the mirror 38a and directed toward the reference side optical system, and at the same time, the light emitted by the tungsten lamp 2 is reflected by the mirror 38b. and head toward the sample-side optical system C.

Multi-wavelength spectral information can be instantaneously obtained via a prism 14.19, a multi-channel photodetector 15.20, etc. similar to the first embodiment. Further, when a non-transmitting/non-reflecting portion 39 of the rotating body 24 is provided as shown in FIG. 7, when this portion is located at the intersection of the optical axes, light is blocked, and at this timing, the multi-channel detector 15. Twenty dark current measurements are taken, which are also incorporated as a correction factor in the spectrum.

FIG. 6 is a block diagram of the signal processing system used in the second embodiment, and the same reference numerals as in FIG. 5 indicate the same or common elements. 637 is a synchronization signal that generates a synchronization signal in conjunction with the rotation of the rotating mirror mechanism. It is a generator.

A synchronization signal is sent from a synchronization signal generator 37 to a spectrum holding circuit 35 located after the sample-side multichannel photodetector 15 in conjunction with the rotation of the rotating mirror mechanism. As a result, the spectrum holding circuit 35 of the sample-side optical system continuously receives the spectrum signal based on ultraviolet light and the spectrum signal based on visible light, and sends the summed spectrum signal to the calculation unit 28 . In the spectrum holding circuit 36 of the reference side spectrum optical system, the reference signal is similarly sent to the calculation unit 28. The calculation unit 28 and subsequent parts are the same as those in the first embodiment.

Therefore, in this embodiment as well, the energy loss of the two types of light sources is almost eliminated, making it possible to perform multi-wavelength simultaneous photometry, widening the measurement range for the sample, and making it possible to downsize the apparatus.

Furthermore, when performing dark current measurement, measurement accuracy can be further improved.

In addition, in each of the above embodiments, the ultraviolet region and the visible region are used as the light source, but the type of light source is not limited thereto.

Although a prism is used as a wavelength dispersion element, a diffraction grating may also be used.Furthermore, the measured spectrum is plotted in three-dimensional chromatography, with time plotted on one horizontal axis and wavelength plotted on the other horizontal axis. By adding a means for displaying gram spectra, the display of analysis contents can be further improved.

〔Effect of the invention〕

As described above, according to the present invention, the first. In both of the second problem-solving means, it is possible to instantly obtain photometric spectrum information over a wide range of wavelengths by utilizing the light energy of the Class 211 light source without wasting it, expand the measurement range and increase the sensitivity. It is possible to provide a stable and reliable multi-wavelength simultaneous photometry photometer that can cope with photometric fluctuations without increasing the size of the optical system.

[Brief explanation of the drawing]

FIG. 1 is a configuration diagram showing an optical system of a multi-wavelength simultaneous photometry photometer according to a first embodiment of the present invention, and FIG. 2 is a diagram showing the optical system of a multi-wavelength simultaneous photometry photometer according to a second embodiment of the present invention. FIG. 3 is an explanatory diagram showing the necessity of mixing light from two types of light sources, which is one of the objects of the present invention, and FIG. 4 is a configuration diagram showing the present invention in a prism type optical system. An explanatory diagram showing the problems and their solutions when adopted, FIG. 5 is a block diagram showing the signal processing system of the first embodiment, and FIG. 6 is a block diagram showing the signal processing system of the second embodiment. , FIG. 7 is an explanatory diagram showing an example of a rotating body used in the second embodiment, and FIGS. 8 and 9 are explanatory diagrams showing a conventional example of a multi-wavelength simultaneous photometry photometer. 1.2... Light sources A, B (deuterium lamp, tungsten lamp), 5... Partial transmission/partial reflection mirror 7... Color adjustment optical filter, 9... Sample cell holder, 10...
・Sample cell, 14... Prism (wavelength dispersion element), 1
5... Sample side multi-channel photodetector, 19... Prism (wavelength dispersion element), 20... Reference side multi-channel photodetector, 23... Optical unit, 24... Rotating body, 25 ...Motor, 26.27...Spectrum holding circuit, 28...Calculating unit, 29...Absorption spectrum holding circuit, 30...Horizontal axis conversion unit, 31...Wavelength-based absorption spectrum holding circuit, 32...Storage section, 33...
Interface, 34...External computer, 35
．． 36... Spectrum holding circuit, 37... Synchronization signal generator, 38a, 38b... Reflection mirror, 39...
Non-transmitting/non-reflecting part, 40... Light transmitting part, C... Sample side optical system, D... Reference side optical system. Fig. Fig. Fig. ataμ and (+111 Fig. External conoveater Fig. 39...Non-transmissive/non-reflective part 40...Light transmitting part

Claims (1)

[Claims] 1. In a photometer comprising two types of light sources A and B having different wavelength ranges, a sample-side optical system, and a reference-side optical system, a light beam directed from the light source A toward the sample-side optical system The optical axis of the light source B intersects with the optical axis of the light beam directed from the light source B toward the reference side optical system, and a partial transmission beam is formed at the intersection of these two optical axes at an angle that bisects the angle formed by these optical axes. A partially reflecting mirror is arranged, and the partially transmitting/partially reflecting mirror is configured so that the light from the light source A and the light source B is mixed and divided into the sample-side optical system and the reference-side optical system and then proceeds; The sample-side optical system includes a sample cell, an element that wavelength-disperses the light that passes through the sample cell, and a multi-channel photodetector that simultaneously detects the wavelength-dispersed light; The system includes an element that wavelength-disperses the light passing through the optical path of the reference-side optical system, and a multi-channel photodetector that simultaneously detects the wavelength-dispersed light; 1. A multi-wavelength simultaneous photometry photometer, comprising: calculation means for obtaining spectral information of a sample with optical fluctuation correction for each wavelength from multi-wavelength photometric data detected by a multi-channel photodetector. 2. In a photometer comprising two types of light sources A and B with different wavelength ranges, a sample-side optical system, and a reference-side optical system, the optical axis of the light flux from the light source A toward the sample-side optical system, and the A motor-driven rotating body is disposed so as to intersect with the optical axis of the light beam from the light source B toward the reference side optical system, and to rotate through the intersection of these two optical axes, and this rotating body includes:
A reflecting mirror is provided on the front and back surfaces at an angle that bisects the two optical axes, and a light transmitting part is formed in line with the reflecting mirror in the rotational direction, so that rotational displacement of these reflecting mirrors and the light transmitting part is controlled. The light beams of the light source A and the light source B are set to be switched and guided to the sample-side optical system and the reference-side optical system, and the sample-side optical system wavelength-disperses the sample cell and the light that passes through the sample cell. The reference-side optical system includes an element that wavelength-disperses the light passing through the optical path of the reference-side optical system, and a multi-channel photodetector that simultaneously detects the wavelength-dispersed light. It has a multi-channel photodetector that simultaneously detects light from the sample side and the reference side optical system, and performs light fluctuation correction for each wavelength from multi-wavelength photometric data detected by the multi-channel photodetector of the sample-side optical system and the reference-side optical system. 1. A multi-wavelength simultaneous photometry photometer, comprising: calculation means for obtaining spectral information of an accompanying sample. 3. In the second aspect, a non-transmissive and non-reflective portion is arranged in the rotating body in line with the reflecting mirror and the light transmitting portion in the rotation direction, and the non-transmissive and non-reflective portion blocks light. a multi-wavelength simultaneous photometric photometer configured to perform dark current measurements of both of the multi-channel photodetectors during a time period during which 4. In any one of the first to third claims, the two types of light sources include an ultraviolet light source and a visible light source to perform simultaneous multi-wavelength photometry spanning from the ultraviolet to the visible range. A photometer that enables simultaneous multi-wavelength photometry. 5. The multi-wavelength simultaneous photometry photometer according to any one of claims 1 to 4, wherein the wavelength dispersion element is a prism. 6. The multi-wavelength simultaneous photometry photometer according to any one of claims 1 to 5, comprising means for displaying the spectral information of the sample with the optical fluctuation correction as a three-dimensional chromatogram spectrum. 7. According to any one of claims 1 to 6, a multi-color filter including a color adjustment filter inserted on the optical path to attenuate light of a specific wavelength among the light emitted from the light source A and the light source B. Simultaneous wavelength photometry photometer.