JPH0477241U - - Google Patents
Info
- Publication number
- JPH0477241U JPH0477241U JP12134090U JP12134090U JPH0477241U JP H0477241 U JPH0477241 U JP H0477241U JP 12134090 U JP12134090 U JP 12134090U JP 12134090 U JP12134090 U JP 12134090U JP H0477241 U JPH0477241 U JP H0477241U
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- lot
- average processing
- test
- processing time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 235000012431 wafers Nutrition 0.000 claims 9
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12134090U JPH0477241U (da) | 1990-11-19 | 1990-11-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12134090U JPH0477241U (da) | 1990-11-19 | 1990-11-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0477241U true JPH0477241U (da) | 1992-07-06 |
Family
ID=31869199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12134090U Pending JPH0477241U (da) | 1990-11-19 | 1990-11-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0477241U (da) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011142197A (ja) * | 2010-01-07 | 2011-07-21 | Hitachi High-Technologies Corp | 検査装置および検査方法 |
-
1990
- 1990-11-19 JP JP12134090U patent/JPH0477241U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011142197A (ja) * | 2010-01-07 | 2011-07-21 | Hitachi High-Technologies Corp | 検査装置および検査方法 |