JPH0475661B2 - - Google Patents
Info
- Publication number
- JPH0475661B2 JPH0475661B2 JP57194647A JP19464782A JPH0475661B2 JP H0475661 B2 JPH0475661 B2 JP H0475661B2 JP 57194647 A JP57194647 A JP 57194647A JP 19464782 A JP19464782 A JP 19464782A JP H0475661 B2 JPH0475661 B2 JP H0475661B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- cycle time
- cycle
- test
- clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
- F02B—INTERNAL-COMBUSTION PISTON ENGINES; COMBUSTION ENGINES IN GENERAL
- F02B75/00—Other engines
- F02B75/02—Engines characterised by their cycles, e.g. six-stroke
- F02B2075/022—Engines characterised by their cycles, e.g. six-stroke having less than six strokes per cycle
- F02B2075/025—Engines characterised by their cycles, e.g. six-stroke having less than six strokes per cycle two
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57194647A JPS5984537A (ja) | 1982-11-08 | 1982-11-08 | 集積回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57194647A JPS5984537A (ja) | 1982-11-08 | 1982-11-08 | 集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5984537A JPS5984537A (ja) | 1984-05-16 |
JPH0475661B2 true JPH0475661B2 (enrdf_load_stackoverflow) | 1992-12-01 |
Family
ID=16327984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57194647A Granted JPS5984537A (ja) | 1982-11-08 | 1982-11-08 | 集積回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5984537A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62265737A (ja) * | 1986-05-13 | 1987-11-18 | Nec Corp | 半導体集積回路 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4984793A (enrdf_load_stackoverflow) * | 1972-12-22 | 1974-08-14 | ||
JPS57111714A (en) * | 1980-12-29 | 1982-07-12 | Fujitsu Ltd | Integrated circuit |
-
1982
- 1982-11-08 JP JP57194647A patent/JPS5984537A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5984537A (ja) | 1984-05-16 |
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